A Temperature Control Method and System for a Rapid Temperature Change Test Chamber

Abstract

The present invention relates to the field of data processing, and specifically relates to a temperature control method and system for a rapid temperature change test chamber. The method includes: collecting the internal temperature and external temperature of the test chamber in real time; calculating the consistency of the internal and external temperature changes in a local time period at the current moment; calculating a correction value of the internal temperature at the current moment by using the consistency of the internal and external temperature changes; presetting a gain parameter vector, calculating an adjustment value of the gain parameter vector at the current moment, inputting the adjustment value of the gain parameter vector at the current moment, the error between the corresponding correction value of the internal temperature and the internal target temperature of the test chamber into a PID controller, outputting a control signal, and performing temperature control on the test chamber according to the control signal. By adaptively adjusting the gain parameters, the present invention can effectively avoid the excessive overshoot caused by too fast system response speed and the resulting oscillation phenomenon, make the temperature change in the test chamber more stable, and ensure the stability of the temperature control process.

Description

Technical Field

[0001] The present invention relates to the field of data processing. More specifically, the present invention relates to a temperature control method and system for a rapid temperature change test chamber. Background Art

[0002] A rapid temperature change test chamber is a device used to test the performance and reliability of products in a rapidly changing temperature environment. A rapid temperature change test chamber, also known as a fast temperature change test chamber, plays a crucial role in multiple fields such as materials science, electronic products, the automotive industry, aerospace, and communication equipment. It features high precision, high stability, and high efficiency, and can simulate various rapidly changing temperature environments to evaluate the performance and durability of products under these conditions.

[0003] The prior art, such as the patent application document with the publication number CN110716592A, discloses a temperature control method and related equipment. The temperature control method includes: obtaining the current temperature and the preset temperature corresponding to the target position of the electronic device; based on the preset temperature and the current temperature, determining the temperature difference corresponding to the target position, and then according to the mapping relationship between the preset temperature difference and the preset temperature difference function, determining the function e(t) of the temperature difference with respect to time corresponding to the temperature difference, that is, the target temperature difference function; according to the mapping relationship between the preset application mode and the preset PID control parameters, determining the target PID control parameters corresponding to the target application mode; adjusting the temperature and power consumption based on PID control.

[0004] However, the above patent application document adjusts the temperature based on the PID control parameters mainly relying on the preset PID parameters and the target temperature difference function, and cannot adapt to the rapid change of environmental conditions or the change of device states, resulting in the decline of PID control performance and poor control effect. Summary of the Invention

[0005] To solve the above technical problem of the limitations of PID control, the present invention provides solutions in the following aspects.

[0006] In a first aspect, a temperature control method for a rapid temperature change test chamber includes:

[0007] Real-time collecting the internal temperature and the external temperature of the test chamber; taking the current moment as the starting point, intercepting a set number of moments forward to construct a local time period of the current moment, and calculating the consistency of the internal and external temperature changes in the local time period; using the consistency of the internal and external temperature changes to calculate the correction value of the internal temperature at the current moment;

[0008] Presetting a gain parameter vector, the gain parameter vector includes a proportional gain, an integral gain, and a derivative gain, and calculating the adjustment value of the gain parameter vector at the current moment. The adjustment value of the gain parameter vector satisfies the relationship:

[0009] ; wherein, is the adjustment value of the gain parameter vector at the current moment , is the preset gain parameter vector, is the current moment corresponding adjustment factor, represents normalization processing; the adjustment factor is positively correlated with the change rate of the internal temperature corresponding to the current moment, the correction value of the internal temperature at the current moment, and the difference between the internal target temperature of the test chamber;

[0010] Input the adjustment value of the gain parameter vector at the current moment, the error between the corresponding correction value of the internal temperature and the internal target temperature of the test chamber into the PID controller, output a control signal, and control the temperature of the test chamber according to the control signal.

[0011] By calculating the consistency of the external temperature change within a local time period, and then obtaining the correction value of the internal temperature, the present invention can more accurately reflect the actual temperature situation inside the test chamber, reduce the internal temperature measurement error caused by factors such as the external environment, and make the temperature control more precise;

[0012] At the same time, the adjustment value of the gain parameter vector takes into account the change rate of the internal temperature, the correction value, and the difference from the target temperature, and can dynamically adjust the proportional gain, integral gain, and derivative gain according to the specific situation at the current moment, making the parameters of the PID controller more in line with the actual needs, and further improving the temperature control accuracy. Reasonable adjustment of the gain parameters can effectively avoid excessive overshoot caused by too fast system response speed and the resulting oscillation phenomenon, make the temperature change inside the test chamber more stable, and ensure the stability of the temperature control process.

[0013] Preferably, the consistency of the internal and external temperature changes in the local time period satisfies the relational expression:

[0014] ; wherein, is the consistency of the internal and external temperature changes in the local time period at the current moment , is the maximum value of the difference between the internal temperature and the external temperature in the local time period at the current moment , is the difference between the internal temperature and the external temperature at the th moment in the local time period, is the number of moments in the local time period, represents the exponential function with the natural constant e as the base.

[0015] When the calculated Values, when showing abnormal fluctuations or continuous decreases, may indicate a decline in the heat preservation performance of the test chamber, a drastic change in the external environmental temperature, or other potential abnormal conditions. By monitoring the values in real time, these problems can be detected in advance, and corresponding measures can be taken in a timely manner to avoid test failures or equipment damages caused by temperature runaway, thereby improving the reliability of temperature control.

[0016] Preferably, the correction value of the internal temperature at the current moment satisfies the relational expression:

[0017] ; in the formula, is the correction value of the internal temperature corresponding to the current moment , is the internal temperature corresponding to the current moment , is the first external temperature within the local time period corresponding to the current moment , is the last external temperature within the local time period corresponding to the current moment , is the consistency of the external temperature change within the local time period corresponding to the current moment .

[0018] By correcting the internal temperature, the internal temperature fluctuations caused by external temperature changes can be reduced, making the internal temperature more stable. This correction relational expression can adapt to different external environmental conditions. Even when the external temperature changes greatly, the internal temperature can be kept stable by correcting the internal temperature, thereby improving the robustness of the temperature control system.

[0019] Preferably, the adjustment factor satisfies the relational expression:

[0020] ; in the formula, is the adjustment factor corresponding to the current moment , is the change rate of the internal temperature corresponding to the current moment , is the correction value of the internal temperature corresponding to the current moment , is the preset internal target temperature.

[0021] Dynamically adjust the control strength according to the change rate and deviation magnitude of the internal temperature. When the change rate is large or the deviation is large, the value of the adjustment factor will increase accordingly, thereby enhancing the output of the control signal, enabling the temperature control system to more powerfully adjust the internal temperature and quickly eliminate the deviation; conversely, when the change rate and deviation are small, the value of the adjustment factor is small, and the control strength is correspondingly weakened to avoid temperature fluctuations caused by over-adjustment; when the external environmental temperature changes greatly or the internal temperature is disturbed, the adjustment factor can timely adjust the control parameters, reduce temperature mutations and oscillations, make the internal temperature change more smoothly, and improve the stability of temperature control.

[0022] Preferably, at the current moment The change rate of the corresponding internal temperature satisfies the relational expression:

[0023] ; In the formula, is the change rate of the internal temperature at the current moment , is the time change amount, is the correction value of the internal temperature at the current moment , is the correction value of the internal temperature at the previous moment .

[0024] Preferably, temperature control of the test chamber according to the control signal includes:

[0025] When the control signal is positive, increase the heating power of the test chamber to raise the internal temperature of the test chamber;

[0026] When the control signal is negative, activate the cooling power of the test chamber to lower the internal temperature of the test chamber.

[0027] Through precise temperature control and timely adjustment, the heating or cooling equipment can operate in a more reasonable working state, avoiding overheating or overcooling phenomena caused by inaccurate temperature control, thereby reducing energy waste and lowering energy consumption.

[0028] Preferably, the adjustment factor satisfies the relational expression:

[0029] ; In the formula, is the adjustment factor corresponding to the current moment , is a constant, is the change rate of the internal temperature corresponding to the current moment , is the correction value of the internal temperature corresponding to the current moment , is the preset internal target temperature.

[0030] In a second aspect, a temperature control system for a rapid temperature change test chamber includes: a processor and a memory. The memory stores computer program instructions, and when the computer program instructions are executed by the processor, the above-mentioned temperature control method for the rapid temperature change test chamber is implemented.

[0031] The beneficial effects of the present invention are as follows:

[0032] By collecting and analyzing the internal and external temperature data of the test chamber in real time, and combining dynamic gain parameter adjustment and internal temperature correction strategies, the present invention significantly improves the accuracy, response speed, and stability of temperature control. By considering multiple factors such as the influence of external temperature, the rate of change of internal temperature, and the target temperature difference, the present invention can flexibly adapt to different test environments and requirements, ensuring that the internal temperature of the test chamber can quickly and accurately reach and maintain within the preset target range. This not only improves the reliability and accuracy of the test, but also reduces the test error and failure risk caused by temperature fluctuations. Description of the Drawings

[0033] By reading the following detailed description with reference to the drawings, the above and other objects, features, and advantages of the exemplary embodiments of the present invention will become easily understood. In the drawings, several embodiments of the present invention are shown in an exemplary rather than restrictive manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein:

[0034] Figure 1 is a flowchart of the method from step S1 to step S5 in a temperature control method for a rapid temperature change test chamber according to an embodiment of the present invention. Detailed Embodiments

[0035] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention.

[0036] An embodiment of the present invention discloses a temperature control method for a rapid temperature change test chamber. Referring to Figure 1 , it includes steps S1 to S5, specifically as follows:

[0037] S1: Real-time collect the internal temperature and external temperature of the test chamber.

[0038] High-precision temperature sensors, such as thermocouples and thermal resistors, are respectively installed at key positions inside the rapid temperature change test chamber and outside the test chamber. These sensors can monitor the internal temperature of the test chamber and the external environment temperature in real time.

[0039] The frequency of data collection is set to once every 5 seconds, and the total collection duration is 1 hour.

[0040] S2: Starting from the current moment, intercept a set number of moments forward to construct the local time period of the current moment, and calculate the consistency of the internal and external temperature changes in the local time period.

[0041] The test chamber maintains a stable internal temperature through its insulation layer and outer shell to simulate a specific test environment. The temperature inside the test chamber is maintained by its own heating or cooling system, which is relatively independent of the external environmental temperature. That is to say, under ideal conditions, the change of the external environmental temperature will not interfere with the internal temperature environment of the test chamber.

[0042] However, when the insulation layer or outer shell of the test chamber is affected by the outside, it may cause heat to escape from the inside of the test chamber or external heat to enter the test chamber, increasing the heat load and resulting in a deviation between the internally monitored temperature data and the temperature of the actual test product. For example, when the test chamber is close to other heat-generating devices (such as air conditioners, etc.), the heat sources generated by these devices may cause additional heat load to the test chamber, resulting in an excessively high external environmental temperature.

[0043] Therefore, the insulation performance of the test chamber and the influence of external environmental factors on the test results are initially judged by observing the consistency between the internal temperature and the external temperature.

[0044] Specifically, select a specific point in the above S1 time series as the starting point, and then trace back from the starting point to several previous fixed time points, and then construct a time interval including the starting point and several previous moments as the local time period of the starting point.

[0045] Further calculate the difference between the internal temperature and the external temperature at each moment in this local time period, and calculate the average value of the differences between the internal temperature and the external temperature at all moments in this local time period, and then calculate the consistency of the external temperature change in the local time period.

[0046] Exemplarily, starting from the current moment, obtain the internal temperature and the external temperature including the current moment and some previous moments (the first 9 moments) before the current moment, construct the local time period of the current moment, and the consistency of the external temperature change in this local time period satisfies the relational expression:

[0047]

[0048] In the formula, is the consistency of the external temperature change in the local time period of the current moment , is the maximum value of the difference between the internal temperature and the external temperature in the local time period of the current moment , is the difference between the internal temperature and the external temperature at the -th moment within the local time period, is the number of moments within the local time period, represents the exponential function with the natural constant e as the base.

[0049] If is close to 1, it indicates that within this local time period, the changes in the internal temperature and the external temperature are relatively consistent, meaning that the thermal conductivity of the outer shell material of the test chamber is relatively high, or the insulation layer may be damaged, resulting in a significant impact of the external temperature on the change of the internal temperature; if has a low value (close to 0), it indicates that the changes in the internal temperature and the external temperature are not very consistent, which may be due to the good insulation performance of the test chamber, making the internal temperature relatively stable and not affected by the change of the external temperature.

[0050] S3: Calculate the correction value of the internal temperature at the current moment by using the consistency of the internal and external temperature changes.

[0051] It should be noted that when the external temperature of the local time period in S2 above increases as a whole, it means that the external environmental temperature is rising. Due to the limited insulation performance of the test chamber, it is impossible to completely isolate the influence of the external temperature change on the inside. The increase in the external temperature will transfer a part of the heat to the inside through the insulation layer of the test chamber, thereby causing the internal temperature of the test chamber to rise accordingly.

[0052] In this case, the internal temperature collected by the temperature sensor may be higher than the actual temperature. Because the temperature measured by the temperature sensor is the temperature affected by the increase in the external temperature, while the actual temperature should be the temperature when not affected by the increase in the external temperature. In order to eliminate this measurement deviation caused by the external environment to a certain extent, it is necessary to correct the collected internal temperature to make it closer to the actual temperature.

[0053] Specifically, obtain the first external temperature and the last external temperature within the local time period corresponding to the current moment respectively, calculate the temperature difference between the first external temperature and the last external temperature, and calculate the correction value of the internal temperature corresponding to the current moment by combining the consistency of the internal and external temperature changes obtained in S2 above.

[0054] Then the correction value of the internal temperature corresponding to the current moment satisfies the relational expression as:

[0055]

[0056] In the formula, is the correction value of the internal temperature corresponding to the current moment , is the internal temperature corresponding to the current moment The corresponding internal temperature is the current moment of the first external temperature within the local time period is the current moment of the last external temperature within the local time period is the current moment of the consistency of the external temperature change within the local time period

[0057] When the external temperature rises and the consistency of the internal and external temperature changes is large, it indicates that the internal temperature at the current moment is greatly interfered by external factors. Therefore, it is necessary to reduce the internal temperature at the current moment; conversely, if the external temperature drops or the consistency of the internal and external temperature changes is small, then there is no need or less need to adjust the internal temperature

[0058] According to the calculation processes of S2 and S3 above, the correction values of the internal temperature corresponding to each moment of real-time acquisition are calculated in the same way

[0059] S4: Preset the gain parameter vector. The gain parameter vector includes proportional gain, integral gain, and derivative gain, and calculate the adjustment value of the gain parameter vector at the current moment

[0060] In the rapid temperature change test, the system needs to quickly and stably adjust the internal temperature to the preset target temperature. This process requires the system to have a high response speed and stability to ensure that the temperature can reach the target value quickly and accurately

[0061] The traditional PID control algorithm adjusts the control device to reach the target value through fixed empirical gain parameters (i.e., proportional, integral, and derivative gains) and real-time errors. However, these parameters are set based on past experience and may not be able to adapt to the temperature changes at each moment. In different temperature stages, the system's demand for control gain is different. Therefore, it is necessary to adaptively adjust the gain parameters according to the real-time temperature changes so that the test chamber can respond faster at the beginning of temperature control and quickly approach the target temperature; at the same time, when the temperature is close to the target value, avoid the situation of exceeding the target temperature too much (overshoot) or the temperature fluctuating up and down repeatedly near the target value (oscillation), so as to ensure that the temperature inside the test chamber can quickly and stably reach the set target temperature

[0062] Specifically, first, calculate the change amount of the correction value of the internal temperature corresponding to the current moment and its previous moment and the time change amount, and take the ratio of the change amount of the temperature correction value to the time change amount as the change rate of the internal temperature at the current moment, that is, the relational expression is satisfied as

[0063]

[0064] In the formula is the current moment The rate of change of the internal temperature at the current moment and the previous moment is the change in the corrected value of the internal temperature is the time change amount at the current moment is the corrected value of the internal temperature at the previous moment is the corrected value of the internal temperature

[0065] Then, calculate the error between the corrected value of the internal temperature of the current temperature and the target temperature (i.e., the specific temperature value that is to be achieved and maintained inside the test chamber as set by the user. This temperature value is determined according to the specific requirements, standards or specifications of the test or measurement to ensure the accuracy and comparability of the test or measurement results).

[0066] Next, set the gain parameter vector , including the proportional gain, integral gain and derivative gain, and calculate the adjustment value of the gain parameter vector which satisfies the relationship:[[]]

[0067]

[0068] In the formula,[[]] is the adjustment value of the gain parameter vector at the current moment is the preset gain parameter vector is the adjustment factor corresponding to the current moment represents the normalization process

[0069]

[0069] Among them,[[]] satisfies the relationship:[[]]

[0070]

[0071] In the formula,[[]] is the adjustment factor corresponding to the current moment is the rate of change of the internal temperature corresponding to the current moment is the corrected value of the internal temperature corresponding to the current moment is the preset internal target temperature

[0072] ​​​When the rate of temperature change is small and the error is also small, it means that the system has approached the target temperature. At this time, the gain parameter needs to be reduced to avoid instability caused by over-adjustment. On the contrary, when the rate of temperature change is large or the error is large, it means that the system may still be far from the target temperature. At this time, the gain parameter needs to be increased to accelerate the system response speed.

[0073] In another embodiment, the above adjustment factor further satisfies the relational expression:

[0074]

[0075] In the formula, is the adjustment factor corresponding to the current moment , is a constant, is the rate of change of the internal temperature corresponding to the current moment , is the correction value of the internal temperature corresponding to the current moment , is the preset internal target temperature.

[0076] Exemplarily, updating the proportional gain parameter satisfies the relational expression:

[0077]

[0078] In the formula, is the adjustment value of the proportional gain parameter .

[0079] According to the above update of the proportional gain parameter similarly, the adjustment values corresponding to the integral gain and the derivative gain are obtained.

[0080] S5: Input the adjustment value of the gain parameter vector at the current moment, the correction value of the corresponding internal temperature, and the error between the internal target temperature of the test chamber into the PID controller, output a control signal, and control the temperature of the test chamber according to the control signal.

[0081] Input the adjustment value of the gain parameter vector at the current moment obtained in S4 above, the correction value of the corresponding internal temperature, and the error of the target temperature into the PID controller, and calculate and output a control signal according to the internal control algorithm thereof.

[0082] When the control signal is positive, increase the heating power of the test chamber to increase the internal temperature of the test chamber; when the control signal is negative, activate the cooling power of the test chamber to reduce the internal temperature of the test chamber.

[0083] According to the calculation processes of S2 - S5 above, the adjustment values of each parameter in the gain parameter vector obtained in real time at each moment, and the error between the corrected value of the internal temperature of the system at this moment and the set target temperature can be used as input signals and sent into the PID controller together.

[0084] The whole process is a dynamic closed - loop control process. By continuously obtaining the gain parameter vector and temperature error in real time, calculating the control signal, and adjusting the working state of the heating or cooling equipment accordingly, the precise control of the system temperature can be achieved, making it stable near the target temperature.

[0085] An embodiment of the present invention also discloses a temperature control system for a rapid temperature change test chamber, including a processor and a memory. The memory stores computer program instructions, and when the computer program instructions are executed by the processor, the temperature control method for the rapid temperature change test chamber according to the present invention is implemented.

[0086] The system also includes other components well - known to those skilled in the art such as a communication bus and a communication interface. Their settings and functions are known in the art, so they will not be described in detail here.

[0087] In the present invention, the aforementioned memory can be any tangible medium that contains or stores a program, and this program can be used by or in combination with an instruction execution system, device, or component. For example, the computer - readable storage medium can be any suitable magnetic storage medium or magneto - optical storage medium. For example, resistive random - access memory (RRAM), dynamic random - access memory (DRAM), static random - access memory (SRAM), enhanced dynamic random - access memory (EDRAM), high - bandwidth memory (HBM), hybrid memory cube (HMC), etc., or any other medium that can be used to store the required information and can be accessed by an application program, module, or both. Any such computer storage medium can be a part of the device or accessible or connectable to the device.

[0088] In the description of this specification, the meanings of "a plurality of" and "several" are at least two, such as two, three, or more, unless otherwise clearly and specifically defined.

[0089] Although this specification has shown and described several embodiments of the present invention, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Many variations, modifications, and alternative means will occur to those skilled in the art without departing from the spirit and scope of the present invention. It should be understood that various alternatives to the embodiments of the present invention described herein may be employed in practicing the present invention.

Claims

1. A temperature control method for a rapid temperature change test chamber, characterized in that, Including: Collect the internal temperature and external temperature of the test chamber in real time; starting from the current moment, intercept a set number of moments forward to construct a local time period of the current moment, and calculate the consistency of the internal and external temperature changes in the local time period; use the consistency of the internal and external temperature changes to calculate the correction value of the internal temperature at the current moment; the consistency of the internal and external temperature changes in the local time period satisfies the relational expression: ; wherein, is the consistency of the external temperature change within the local time period at the current moment , is the maximum value of the difference between the internal temperature and the external temperature within the local time period at the current moment , is the difference between the internal temperature and the external temperature at the th moment within the local time period, is the number of moments within the local time period, represents the exponential function with the natural constant e as the base; A preset gain parameter vector, the gain parameter vector includes a proportional gain, an integral gain, and a derivative gain, calculate the adjustment value of the gain parameter vector at the current moment, and the adjustment value of the gain parameter vector satisfies the relational expression: ; wherein, is the adjustment value of the gain parameter vector at the current moment , is the preset gain parameter vector, is the adjustment factor corresponding to the current moment ; represents normalization processing; the adjustment factor is positively correlated with the change rate of the internal temperature corresponding to the current moment, the correction value of the internal temperature at the current moment, and the difference between the internal target temperature of the test chamber; Input the adjustment value of the gain parameter vector at the current moment, the error between the corresponding correction value of the internal temperature and the internal target temperature of the test chamber into a PID controller, output a control signal, and perform temperature control on the test chamber according to the control signal.

2. The temperature control method of a rapid temperature change test chamber according to claim 1, characterized in that, The correction value of the internal temperature at the current moment satisfies the relational expression: ; wherein, is the correction value of the internal temperature corresponding to the current moment , is the internal temperature corresponding to the current moment , is the first external temperature within the local time period of the current moment , is the last external temperature within the local time period of the current moment , is the consistency of the external temperature change within the local time period of the current moment .

3. A temperature control method for a rapid temperature change test chamber according to claim 2, characterized in that, The adjustment factor satisfies the relational expression: ; wherein, is the adjustment factor corresponding to the current moment ; is the change rate of the internal temperature corresponding to the current moment ; is the corrected value of the internal temperature corresponding to the current moment ; is the preset internal target temperature.

4. A temperature control method for a rapid temperature change test chamber according to claim 3, characterized in that Current moment The change rate of the corresponding internal temperature satisfies the relation as follows: ; wherein, is the change rate of the internal temperature at the current moment , is the time variation, is the correction value of the internal temperature at the current moment , is the correction value of the internal temperature at the previous moment .

5. A temperature control method for a rapid temperature change test chamber according to claim 4, characterized in that, Performing temperature control on the test chamber according to the control signal includes: When the control signal is positive, increase the heating power of the test chamber to increase the internal temperature of the test chamber; When the control signal is negative, activate the cooling power of the test chamber to reduce the internal temperature of the test chamber.

6. A temperature control method for a rapid temperature change test chamber according to claim 2, characterized in that, The adjustment factor satisfies the relational expression: ; wherein, is the adjustment factor corresponding to the current moment , is a constant, is the change rate of the internal temperature corresponding to the current moment , is the correction value of the internal temperature corresponding to the current moment , is the preset internal target temperature.

7. A temperature control system for a rapid temperature change test chamber, characterized in that, Including: A processor and a memory, the memory stores computer program instructions, and when the computer program instructions are executed by the processor, the temperature control method of the rapid temperature change test chamber according to any one of claims 1-6 is implemented.

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