Micrometer for detecting thickness of glass substrate

Abstract

The invention discloses a micrometer for detecting the thickness of a glass substrate, which comprises a micrometer body, an edge distance measuring ruler, an induction measuring unit, a control unit, a storage unit and a digital display unit, and is characterized in that the edge distance measuring ruler is fixedly arranged on a ruler frame, close to a measuring anvil, of the micrometer body and can measure the horizontal distance between the measuring anvil and the edge of the glass substrate; the induction measurement unit comprises a first sensor capable of measuring the thickness of a glass substrate, the first sensor is located at the head of a micrometric screw of the micrometer body, the first sensor can transmit a measured thickness value signal to the storage unit, and the storage unit can transmit the thickness value signal to the control unit. The control unit can transmit a processed thickness value signal to the digital display unit, the edge distance measuring ruler omits the process that an operator marks a test point and further measures the test point through a ruler, the storage unit can store the tested thickness value, the process of detecting the thickness of the glass substrate is simplified, the detection time is saved, and the detection efficiency is improved.

Description

Technical Field

[0001] The invention relates to the technical field of glass substrate production, and in particular to a micrometer for detecting the thickness of a glass substrate. Background Art

[0002] As an indispensable part of the development of global displays, the quality of glass substrates is one of the key factors restricting the development of displays. The thickness of glass substrates is an important indicator to measure the quality of glass, and is also a key factor in the yield rate of subsequent panel factory processing and application. When the thickness of liquid crystal glass substrates is too different, laser alarms or poor coating may occur during the processing and application of the product after the user puts it into use, thereby reducing the yield rate of the glass substrate and the user's satisfaction with the product quality. The edge thickness of the glass substrate, especially the edge thickness quality of the glass substrate cut from the motherboard, is an indirect reflection of the quality state of the glass substrate thickness, and is also a compass for optimizing the thickness grade of the substrate glass.

[0003] Traditionally, ordinary micrometers are used to detect the thickness of glass plate edges. During the test, the distance between the test point and the edge of the glass plate cannot be known. The test point needs to be marked before the test and further measured with a ruler to measure the distance between the test point and the edge of the glass plate. During the test, the tester needs to report the test data to the recorder. The process is cumbersome, time-consuming, and inefficient. Summary of the invention

[0004] In order to solve the technical problems existing in the background technology, the present invention provides a micrometer for detecting the thickness of a glass substrate.

[0005] A micrometer for detecting the thickness of a glass substrate comprises: a micrometer body, a margin measuring ruler, an inductive measuring unit, a control unit, a storage unit, and a digital display unit. The margin measuring ruler is installed and fixed on a ruler frame of the micrometer body near the anvil. When the anvil and the micrometer screw of the micrometer clamp the glass substrate to measure its thickness, the margin measuring ruler can measure the horizontal distance between the anvil and the edge of the glass substrate. The inductive measuring unit, the storage unit, and the digital display unit are all electrically connected to the control unit. The control unit, the storage unit, and the digital display unit are installed on the ruler frame of the micrometer body. The inductive measuring unit comprises a first sensor for measuring the thickness of the glass substrate. The first sensor is located at the head of the micrometer screw of the micrometer body. The first sensor can transmit a measured thickness value signal to the storage unit. The storage unit can transmit the thickness value signal to the control unit. The control unit can transmit the processed thickness value signal to the digital display unit and display the thickness value on the display screen of the digital display unit.

[0006] Preferably, the micrometer also includes a margin measurement auxiliary block, which is slidably connected to the margin measuring scale, and has a vertical auxiliary surface. When the micrometer anvil and the micrometer screw of the micrometer body clamp the glass substrate to measure its thickness, the top end of the auxiliary surface is located in the scale line area of ​​the margin measuring scale, and the bottom end of the auxiliary surface can be attached to the outer peripheral surface of the glass substrate.

[0007] Preferably, the micrometer also includes an alarm unit electrically connected to the control unit, and the control unit also includes a data processing module. The data processing module can compare the thickness value received from the storage unit with the target value to generate a difference between the two. If the difference does not fall within a preset error range, the control unit controls the alarm unit to send a first alarm signal.

[0008] Preferably, the micrometer also includes a force measuring unit, which is electrically connected to the control unit. The force measuring unit includes a second sensor, which is connected between the micrometer screw and the knob of the micrometer body. The second sensor can measure the force applied by the knob to the micrometer screw and transmit the force signal to the control unit. When the force signal reaches a preset target force value, the control unit controls the alarm unit to send a second alarm signal.

[0009] Preferably, the micrometer also includes a data interface unit electrically connected to the storage unit, and the data interface unit and an external device can be connected via a data line to transmit the thickness value and difference value in the storage unit to the external device and display them in the external device.

[0010] Preferably, the micrometer further comprises a locking assembly, and when the micrometer screw is moved by the knob until the head of the micrometer screw contacts the surface of the glass substrate, the micrometer screw can be locked at this position by the locking assembly.

[0011] Compared with the prior art, the present invention has the following beneficial effects:

[0012] The margin measuring ruler eliminates the need for operators to mark test points and further measure with a ruler. The storage unit can save the tested thickness value, eliminating the need for testers to report test data to recorders. This simplifies the process of detecting the thickness of the glass substrate, saves detection time, and improves detection efficiency. Compared with manual recording, it has the advantage of being less prone to errors.

[0013] The margin measurement auxiliary block can not only help the operator to more quickly and accurately identify the distance between the test point and the edge of the glass substrate when detecting the thickness of the glass substrate, but also play an auxiliary positioning role to ensure that the micrometer is clamped vertically on the glass substrate and ensure the consistency of the distance between each test point and the edge of the glass substrate. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1The present invention provides a schematic diagram of the overall structure of a micrometer for detecting the thickness of a glass substrate.

[0015] Figure 2 The present invention provides a flow chart of a micrometer for detecting the thickness of a glass substrate, including a control unit. DETAILED DESCRIPTION

[0016] The specific implementation of the present invention will be described in detail below with reference to the accompanying drawings.

[0017] Reference Figure 1 , Figure 2 , a micrometer for detecting the thickness of a glass substrate comprises: a micrometer body, a margin measuring ruler 1, an inductive measuring unit 2, a control unit 4, a storage unit 3, and a digital display unit 5. The margin measuring ruler 1 is installed and fixed on a ruler frame 7 of the micrometer body near an anvil 6. When the anvil 6 and the micrometer screw 8 of the micrometer clamp a glass substrate to measure its thickness, the margin measuring ruler 1 can measure the horizontal distance between the anvil 6 and the edge of the glass substrate. The inductive measuring unit 2, the storage unit 3, and the digital display unit 5 are all electrically connected to the control unit 4. The control unit 4, the storage unit 3, and the digital display unit 5 are installed on the ruler frame 7 of the micrometer body. The inductive measuring unit 2 comprises a first sensor for measuring the thickness of a glass substrate. The first sensor is located at the head of the micrometer screw 8 of the micrometer body. The first sensor can transmit a measured thickness value signal to the storage unit 3. The storage unit 3 can transmit the thickness value signal to the control unit 4. The control unit 4 can transmit the processed thickness value signal to the digital display unit 5 and display the thickness value on the display screen of the digital display unit 5.

[0018] The working principle of the micrometer for detecting the thickness of the glass substrate is as follows: the operator first rotates the distance measuring screw 8 to a position where the distance between the distance measuring screw 8 and the fixed anvil 6 is greater than the thickness of the glass substrate through the coarse adjustment knob 141, and then places the anvil 6 against the upper surface of the glass substrate. At this time, it can be judged according to the margin measuring ruler 1 whether the distance between the measuring point and the edge of the glass substrate meets the requirements, and the micrometer is adjusted to the correct measuring point position. At this time, the coarse adjustment knob 141 is rotated first and then the fine adjustment knob 142 is rotated until the head of the distance measuring screw 8 is against the lower surface of the glass substrate. At this time, the first sensor will test the thickness of the glass substrate and transmit the thickness value signal to the storage unit 3. The storage unit 3 can transmit the thickness value signal to the control unit 4. The control unit 4 can transmit the processed thickness value signal to the digital display unit 5 and display the thickness value on the display screen of the digital display unit 5.

[0019] The margin measuring ruler 1 eliminates the need for the operator to mark the test points and further measure them with a ruler. The storage unit 3 can save the tested thickness value, eliminating the need for the tester to report the test data to the recorder, thereby simplifying the process of detecting the thickness of the glass substrate, saving detection time, and improving detection efficiency. At the same time, compared with manual recording, it has the advantage of being less prone to errors.

[0020] Reference Figure 1 The micrometer also includes a margin measurement auxiliary block 9, which is slidably connected to the margin measuring ruler 1. The margin measurement auxiliary block 9 has a vertical auxiliary surface 91. When the micrometer anvil 6 and the micrometer screw 8 of the micrometer body clamp the glass substrate to measure its thickness, the top of the auxiliary surface 91 is located in the scale line area of ​​the margin measuring ruler 1, and the bottom of the auxiliary surface 91 can be attached to the outer peripheral surface of the glass substrate. The margin measurement auxiliary block 9 can not only help the operator to more quickly and accurately identify the distance between the test point and the edge of the glass substrate when detecting the thickness of the glass substrate, but also play a role in auxiliary positioning, ensuring that the micrometer is vertically clamped on the glass substrate, and ensuring the consistency of the distance between each test point and the edge of the glass substrate.

[0021] The micrometer also includes an alarm unit 10 electrically connected to the control unit 4. The control unit 4 also includes a data processing module. The data processing module can compare the thickness value received from the storage unit 3 with the target value to generate a difference between the two. If the difference does not fall within the preset error range, the control unit 4 controls the alarm unit 10 to send a first alarm signal. After hearing or observing the first alarm signal, the operator can re-measure the thickness at this position. If the first alarm signal is still issued after the re-measurement, it can be determined that the thickness here does not meet the requirements and the glass substrate is a defective product.

[0022] The micrometer also includes a force measuring unit 13, which is electrically connected to the control unit 4. The force measuring unit 13 includes a second sensor, which is connected between the micrometer screw 8 and the knob 14 of the micrometer body. The second sensor can measure the force applied by the knob 14 to the micrometer screw 8 and transmit the force signal to the control unit 4. When the force signal reaches the preset target force, the control unit 4 controls the alarm unit 10 to send a second alarm signal. After hearing the second alarm signal, the operator can stop rotating the knob 14. The force measuring unit 13 can ensure that a constant pressure is applied at each test point, ensure the consistency of the detected thickness value, and reduce data errors caused by human operation.

[0023] The micrometer also includes a data interface unit 11 electrically connected to the storage unit 3. The data interface unit 11 and the external device 12 can be connected via a data line, and the thickness value and the difference value in the storage unit 3 can be transmitted to the external device 12 and displayed in the external device 12. In practical applications, the external device 12 can be a device with a display function such as a computer, and in order to more intuitively and conveniently observe and judge the thickness of the glass substrate, software that can draw similar waveform graphs can be installed in the computer, and the thickness value in the storage unit can be imported into the drawing software to generate a waveform graph of the thickness of the glass substrate.

[0024] Reference Figure 1 The micrometer also includes a locking assembly 15. When the micrometer screw 8 is moved by the knob 14 until the head of the micrometer screw 8 contacts the surface of the glass substrate, the micrometer screw 8 can be locked in this position by the locking assembly 15 to ensure the working reliability of the micrometer.

[0025] Reference Figure 1 In practical applications, in order to use the micrometer more conveniently, a switch, a zeroing button, etc. 16 may be provided on the micrometer.

[0026] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A micrometer for detecting the thickness of a glass substrate, characterized in that: The invention comprises: a micrometer body, a margin measuring ruler (1), an inductive measuring unit (2), a control unit (4), a storage unit (3), and a digital display unit (5); the margin measuring ruler (1) is mounted and fixed on a ruler frame (7) near a measuring anvil (6) of the micrometer body; when the measuring anvil (6) and a micrometer screw (8) of the micrometer clamp a glass substrate to measure its thickness, the margin measuring ruler (1) can measure the horizontal distance between the measuring anvil (6) and the edge of the glass substrate; the inductive measuring unit (2), the storage unit (3), and the digital display unit (5) are all electrically connected to the control unit (4); The control unit (4), the storage unit (3) and the digital display unit (5) are mounted on a scale frame (7) of the micrometer body. The inductive measurement unit (2) comprises a first sensor capable of measuring the thickness of a glass substrate. The first sensor is located at the head of a micrometer screw (8) of the micrometer body. The first sensor can transmit a measured thickness value signal to the storage unit (3). The storage unit (3) can transmit the thickness value signal to the control unit (4). The control unit (4) can transmit the processed thickness value signal to the digital display unit (5) and display the thickness value on a display screen of the digital display unit (5).

2. The micrometer for detecting the thickness of a glass substrate according to claim 1, characterized in that: The invention also comprises a margin measurement auxiliary block (9), which is slidably connected to the margin measurement ruler (1), and has a vertical auxiliary surface (91). When the micrometer anvil (6) and the micrometer screw (8) of the micrometer body clamp a glass substrate to measure its thickness, the top end of the auxiliary surface (91) is located in the scale line area of ​​the margin measurement ruler (1), and the bottom end of the auxiliary surface (91) can be attached to the outer peripheral surface of the glass substrate.

3. The micrometer for detecting the thickness of a glass substrate according to claim 1, characterized in that: It also includes an alarm unit (10) electrically connected to the control unit (4), and the control unit (4) also includes a data processing module, which can compare the thickness value received from the storage unit (3) with the target value to generate a difference between the two. If the difference does not fall within a preset error range, the control unit (4) controls the alarm unit (10) to send a first alarm signal.

4. The micrometer for detecting the thickness of a glass substrate according to claim 3, characterized in that: The device also comprises a force measuring unit (13), which is electrically connected to the control unit (4). The force measuring unit (13) comprises a second sensor, which is connected between the micrometer screw (8) and the knob (14) of the micrometer body and can measure the force value applied by the knob (14) to the micrometer screw (8), and transmit the force value signal to the control unit (4). When the force value signal reaches a preset target force value, the control unit (4) controls the alarm unit (10) to send out a second alarm signal.

5. The micrometer for detecting the thickness of a glass substrate according to claim 1, characterized in that: It also includes a data interface unit (11) electrically connected to the storage unit (3), and the data interface unit (11) and the external device (12) can be connected via a data line to transmit the thickness value and the difference value in the storage unit (3) to the external device (12) and display them in the external device (12).

6. The micrometer for detecting the thickness of a glass substrate according to claim 1, characterized in that: It also includes a locking assembly (15). When the micrometer screw (8) is moved by the knob (14) until the head of the micrometer screw (8) contacts the surface of the glass substrate, the micrometer screw (8) can be locked at this position by the locking assembly (15).

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