Elevator operation test method, device, controller and system

Abstract

The application relates to an elevator operation test method, device, controller and system. The method steps comprise the following: in response to a test failure of a current function test item of an elevator, performing a function test failure analysis process, and taking the obtained analysis result as a test result of the current function test item; the function test failure analysis process is used for checking whether each function signal in a function signal sequence corresponding to the current function test item is established one by one; wherein the function signal sequence is obtained in the manner that function signals related to the current function test item are divided step by step by an elevator control logic until the function signals are divided into multiple levels of sub-signals; the application can check fault causes from multiple angles without manual intervention, reduces the heavy work of manual checking, and effectively solves the problems that, in the traditional technology, a fault point cannot be locked in a short time and the intelligent level is low when elevator functions are tested and checked one by one by manual work.

Description

TECHNICAL FIELD

[0001] The present application relates to the elevator technical field, and in particular to an elevator operation test method, device, controller and system. BACKGROUND

[0002] The normal operation of the elevator is directly related to the safety of the public's life and property, which makes people's requirements for the safety of the elevator become higher and higher; since the operation of the elevator is related to multiple component mechanisms, the traditional elevator operation detection method mostly relies on manual testing and checking of elevator functions one by one in daily elevator maintenance or when the elevator function is abnormal, and the intelligent level is low. SUMMARY

[0003] Therefore, it is necessary to provide an elevator operation test method, device, controller and system aiming at the above technical problems.

[0004] In a first aspect, the present application provides an elevator operation test method, which comprises:

[0005] In response to a test failure of a current function test item of the elevator, a function test failure analysis process is performed, and the obtained analysis result is taken as a test result of the current function test item; the function test failure analysis process is used to check whether each function signal in a function signal sequence corresponding to the current function test item is established one by one; wherein the function signal sequence is obtained in a manner that function signals related to the current function test item are divided step by step by the elevator control logic until the function signals are divided into multiple sub-signals;

[0006] According to the next function test item, the elevator is tested, the test result is recorded, and the test report is output based on the test results until the function test is finished.

[0007] In one of the embodiments, the analysis result includes a signal list for indicating function signal abnormalities; the function test failure analysis process comprises:

[0008] In the case that the function signal is not established, it is confirmed whether the multiple sub-signals are consistent with the system preset value step by step, and the multiple sub-signals inconsistent with the system preset value are recorded as the signal list;

[0009] In the case that the function signal is established, the analysis result indicates that the function signal is normal.

[0010] In one of the embodiments, the multiple sub-signals at least include a first sub-signal and a second sub-signal.

[0011] In one of the embodiments, the method further comprises:

[0012] In response to receiving the test instruction transmitted by the test device, it is determined to enter an automatic test mode, and a test sequence corresponding to the automatic test mode is obtained based on the test instruction;

[0013] The elevator is tested according to the test order of each functional test item in the test sequence until the functional test is completed, and a test report is transmitted to the test device.

[0014] In one of the embodiments, the method further comprises:

[0015] In response to receiving an input signal from the input device, it is determined to enter a manual test mode, and the elevator is tested according to the functional test item corresponding to the test instruction.

[0016] In one of the embodiments, the method further comprises:

[0017] When the analysis result indicates that the fault point cannot be confirmed, a functional self-test process is performed; the functional self-test process comprises transmitting a fault test instruction to the input processing device, and the fault test instruction is used to instruct the input processing device to feed back a simulated input signal;

[0018] If the simulated input signal is received, the elevator is tested according to the current functional test item, and the functional test is exited if a test result is obtained; the test result indicates that the input device is faulty;

[0019] If the simulated input signal is not received, the test result indicates that the input processing device is faulty, and the functional test is exited.

[0020] In a second aspect, the application further provides an elevator operation test device, comprising:

[0021] A failure analysis module is configured to, in response to a test failure of a current functional test item of the elevator, perform a functional test failure analysis process, and use an obtained analysis result as a test result of the current functional test item; the functional test failure analysis process is configured to check whether each functional signal in a functional signal sequence corresponding to the current functional test item is established one by one; wherein the functional signal sequence is obtained by dividing functional signals related to the current functional test item into multiple levels of sub-signals through the elevator control logic step by step;

[0022] A recording module is configured to test the elevator according to a next functional test item, record a test result until the functional test is completed, and output a test report based on each test result.

[0023] In a third aspect, the application further provides an elevator controller, comprising a memory and a processor, the memory stores a computer program, and the computer program is executed by the processor to make the processor execute the steps of the method provided in the first aspect of the application.

[0024] In a fourth aspect, the application provides an elevator operation test system, the elevator comprising an input device, an input processing device and an elevator controller connected in sequence; the operation test system comprising a test device connected to the elevator controller;

[0025] The elevator controller is configured to execute the steps of the method provided in the first aspect of the application.

[0026] In one embodiment, the input device is an elevator door opening button, the input processing device is a car communication board, and the elevator controller is an MPU board.

[0027] The elevator operation test method, device, controller and system described above automatically execute a failure analysis process when a current function test item of the elevator fails, check each function signal in a function signal sequence corresponding to the test function one by one, and check the function signals one by one and level by level to determine which signals are abnormal, and then generate a test report. In addition, the judgment of the signals through the test failure analysis process can be connected with other test methods to further determine the problem, and the next function can be tested after the current function item test is completed, so that the fault reason can be investigated from multiple angles without manual intervention, the heavy work of manual investigation is reduced, and the problem that the traditional technology cannot lock the fault point in a short time and has low intelligence level when testing and investigating the elevator function one by one by relying on manual work is effectively solved. BRIEF DESCRIPTION OF DRAWINGS

[0028] Figure 1 A schematic diagram of the steps of the elevator operation test method in one embodiment;

[0029] Figure 2 A schematic diagram of the function test failure analysis steps in one embodiment;

[0030] Figure 3 A schematic diagram of the signal logic in one embodiment;

[0031] Figure 4 A schematic diagram of the automatic test steps in one embodiment;

[0032] Figure 5 A schematic diagram of the manual test steps in one embodiment;

[0033] Figure 6 A schematic diagram of the flow of the automatic test mode in one embodiment;

[0034] Figure 7 A schematic diagram of the flow of the manual test mode in one embodiment;

[0035] Figure 8 A schematic diagram of the flow of the failure analysis process in one embodiment;

[0036] Figure 9 Fig. 1 is a schematic diagram of the structure of an elevator operation test device according to an embodiment of the present application;

[0037] Figure 10 Fig. 2 is a schematic diagram of the connection relationship of an elevator operation test system according to an embodiment of the present application. DETAILED DESCRIPTION

[0038] In order to make the above objectives, features and advantages of the present application more apparent, specific embodiments of the present application will be described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. However, the present application can be practiced in a number of different ways beyond the specific details disclosed herein. Thus, the present application is not intended to be limited to the embodiments described herein and illustrated in the drawings.

[0039] In addition, the terms "first", "second", etc. are used only for the purpose of description and should not be understood as indicating or implying relative importance or implying the number of the technical features indicated. Therefore, the features defined with "first", "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, such as two, three, etc., unless otherwise explicitly specified and limited.

[0040] In the present application, unless otherwise explicitly specified and limited, the terms "connected", "connected", and the like should be understood in a broad sense, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0041] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to another element, or connected to another element through a central element. In addition, in the following embodiments, "connected" between the objects connected should be understood as "electrically connected", "communication connection" and the like if there is transmission of electrical signals or data between the connected objects.

[0042] As one of the most common transportation tools in daily life, the elevator provides a lot of convenience for people's life; since the elevator takes people and things as the carrying object, it is closely related to people's life and property safety, when the elevator fails, it may affect the convenience of life, or even cause an accident; in recent years, with the increase of the number of elevator installations, the incidence of elevator failure is also increasing; therefore, it is very important to test the elevator before leaving the factory and during the subsequent maintenance work.

[0043] In this application, as shown in Figure 1 An elevator operation test method is provided, which is applied to an elevator controller as an example for illustration, including the following steps 22 to 24. Among them:

[0044] Step 22: In response to the test failure of the current function test item of the elevator, a function test failure analysis process is performed, and the obtained analysis result is taken as the test result of the current function test item; the function test failure analysis process is used to check whether each function signal in the function signal sequence corresponding to the current function test item is established one by one; wherein the function signal sequence is obtained by dividing the function signal related to the current function test item into multiple levels of sub-signals through the elevator control logic.

[0045] Specifically, the test failure of the current function item can be that the control signal output to the execution end such as the traction system is identified as incorrect, and then it is judged that the test of the current function test item of the elevator fails; it can also be that the control system identifies the action posture of the elevator according to the sensor installed on the elevator, and when the action posture of the elevator does not match the instruction issued by the control system of the elevator, it is judged that the test of the current function item of the elevator fails.

[0046] Exemplarily, the function signal can refer to a plurality of control signals related to the elevator control, and the function signal sequence includes a plurality of levels of sub-signals corresponding to the function signal.

[0047] Further, the control system can check the function signal sequence by checking whether each function signal is established one by one, if a certain function signal is not established, then find its first level of sub-signals, compare the first level of sub-signals with the system preset value, find the first level of sub-signals that do not match the system preset value, and record them; then further find the second level of sub-signals of the first level of sub-signals that do not match the system preset value, continue to compare the second level of sub-signals with the system preset value, find and record the second level of sub-signals that do not match the system preset value... until each level of sub-signals of the function signal that does not match the system preset value is found and recorded, and finally the analysis result is obtained, and the analysis result is output as the test result of the current function item.

[0048] Further, when the test of the current function test item of the elevator is successful, the test result of the current function test item is output, i.e., a test OK flag is generated.

[0049] Specifically, the test scheme for testing the function of the elevator can include manual testing and automatic testing, wherein the manual testing can be a test scheme requiring manual operation of the elevator to test the elevator, and the automatic testing can be a test scheme for testing the automatic function of the elevator; but the above two schemes cannot be separated from the transmission of signals. When one of the function test items is investigated, if other methods cannot find the fault, the function test failure analysis process can be performed to investigate the problem of the function signal.

[0050] Step 24: According to the next function test item, the elevator is tested, and the test result is recorded until the function test is completed. Based on the test results, a test report is output.

[0051] Specifically, in the case of successful current function test, the test result of the successful test (a test OK flag is generated) is recorded for the current function item. In the case of failed current function test, the test failure analysis process is performed, and the analysis result obtained is taken as the test result of the current function item. In the case where the control system obtains the test result of the current function test item, the next function test item can be tested. When all the function test items are tested, a test report is output based on the test results.

[0052] The test personnel can maintain the elevator according to the fault problem of the elevator indicated by the test report.

[0053] The above elevator operation test method, when the current function test item of the elevator fails, automatically performs the failure analysis process, checks each function signal in the function signal sequence corresponding to the test function one by one, and checks the function signal one by one and level by level to determine which signals are abnormal, and then generates a test report. In addition, the test failure analysis process can be connected with other test methods to further determine the problem, and in the case where the current function item test is completed, the next function test is continued, so that the fault reason can be investigated from multiple angles without manual intervention, the heavy work of manual investigation is reduced, and the problem that the traditional technology cannot lock the fault point in a short time and the intelligent level is low is effectively solved.

[0054] In one example embodiment, as shown in Figure 2 the analysis result includes a signal list for indicating function signal abnormalities; and step 22 includes steps 222 to 224. Wherein:

[0055] Step 222: In the case that the function signal is not established, it is confirmed whether the multi-level sub-signals are consistent with the system preset values, and the multi-level sub-signals inconsistent with the system preset values are recorded as a signal list.

[0056] The system preset values can include the values of each level of sub-signals of the function signals in the control system database that match the elevator functions.

[0057] Specifically, for the function signal sequence of the current function test item, if the sub-signals of the function signal are inconsistent with the sub-signals of the function signal in the control system database, it can be recorded as a signal anomaly.

[0058] Further, the sub-signals of the function signal can correspond to multiple different preset values according to specific functions. In the case that the function signal and its sub-signals in the function signal sequence of the current function test item are consistent with one of the preset values but inconsistent with the other, it is recorded as a signal possible anomaly.

[0059] Step 224: In the case that the function signal is established, the analysis result indicates that the function signal is normal.

[0060] Specifically, the function signal is established, i.e., the function signal can achieve normal indication of elevator action.

[0061] In one exemplary embodiment, the multi-level sub-signals include at least one level of sub-signals and two levels of sub-signals.

[0062] Specifically, taking function signal A as an example, if the function signal A is determined by signals B and C together, and the signal B is determined by signals D and E together, then the signals B and C are one level of sub-signals of the function signal A, and the signals D and E are two levels of sub-signals of the function signal A.

[0063] For example, when an elevator function is implemented by function signal G being ON, and the preset of the signal G in the database of the control system is established by one level of sub-signals E = ON and one level of sub-signals F = OFF;

[0064] Further, the first preset value of the one level of sub-signals E in the database of the control system presets the established condition as two levels of sub-signals A = ON, two levels of sub-signals B = OFF, two levels of sub-signals C = ON, and two levels of sub-signals D = any value;

[0065] In addition, the second preset value of the one level of sub-signals E in the database of the control system presets the established condition as two levels of sub-signals A = any value, two levels of sub-signals B = any value, two levels of sub-signals C = ON, and two levels of sub-signals D = ON.

[0066] In the actual situation, the function signal G of the current function test item is OFF, and it can be determined that the current function signal G is not established, and further determine the first level sub-signal. After comparison and judgment, the first level sub-signal E is OFF, and the first level sub-signal F is OFF. It can be determined that the first level sub-signal E is not established, so it is recorded and the next level sub-signal is searched. The second level sub-signal of the first level sub-signal E is specifically the second level sub-signal A=OFF, the second level sub-signal B=OFF, the second level sub-signal C=ON, and the second level sub-signal D=OFF. It can be determined that the second level sub-signal A and the second level sub-signal D may be abnormal, and the result is recorded.

[0067] Exemplarily, when the second level sub-signal A and the second level sub-signal D are confirmed to be inconsistent, the third level sub-signal of the second level sub-signal A and the second level sub-signal D is further searched and recorded, and so on. The logic diagram of the function signal G and the first level sub-signal E can be as shown in Figure 3

[0068] The analysis result in the embodiment of the application can be as shown in Table 1 and Table 2:

[0069] Table 1 Analysis result comparison table (first level sub-signal comparison)

[0070] Signal Signal E Signal F System default value ON OFF Actual test value OFF OFF Test result Abnormal Normal

[0071] Table 2 Analysis result comparison table (second level sub-signal comparison)

[0072] Signal Signal A Signal B Signal C Signal D System default value 1 ON OFF ON Arbitrary value System default value 2 Arbitrary value Arbitrary value ON ON Actual test value OFF OFF ON OFF Test result Possible abnormality Normal Normal Possible abnormality

[0073] In an exemplary embodiment, as shown in Figure 4 , the elevator operation test method further includes the following steps 32 to 34; wherein:

[0074] Step 32: in response to receiving the test instruction transmitted by the test device, determine to enter the automatic test mode, and obtain the test sequence of the corresponding automatic test mode based on the test instruction.

[0075] Specifically, the test device can be an external test device, or a test module embedded in the control system.

[0076] Specifically, the test device can include a human-computer interaction interface, and the worker selects the test item corresponding to different elevator functions through the human-computer interaction interface, and then generates a test instruction according to the test item. After the control system receives the test instruction, the test item is obtained according to the test instruction, and the test sequence of the corresponding automatic test mode is obtained.

[0077] ​Exemplarily, the functional test items can be functional items corresponding to automatic functions of the elevator, such as a parking function, i.e., the elevator automatically parks at a designated parking landing when no service is required; an overload protection function, i.e., the elevator does not allow the door to be closed and run when overloaded; and a non-stop floor function, i.e., the elevator does not respond to the in-car or hall call instructions of a preset specific floor, respectively or simultaneously.

[0078] Step 34: Testing the elevator according to the test order of the functional test items in the test sequence until the functional test is completed, and transmitting the test report to the test device.

[0079] Specifically, the automatic test mode in the embodiment of the application can be specifically used for testing the control system of the elevator.

[0080] Specifically, in the automatic test mode, after the control system receives the test instruction sent by the test device, the control system automatically completes the test according to the test sequence, generates a test report after the test is completed, and transmits the test report to the test device, and the test report can be displayed through a man-machine interaction interface or the like.

[0081] In an exemplary embodiment, the elevator operation test method further includes the following step 42; wherein:

[0082] Step 42: In response to receiving an input signal from the input device, determining to enter the manual test mode, and testing the elevator according to the functional test item corresponding to the test instruction.

[0083] Specifically, the manual test mode can be that a worker tests a certain function of the elevator through the input device, and the input device generates an input signal according to the test instruction input by the worker and corresponding to the current elevator function to be tested, and sends the input signal to the control system (the input signal can be transmitted to the control system through an input processing device), so as to instruct the control system to complete the test according to the instruction.

[0084] Exemplarily, the functional test items of the manual test can be test items that need to be pressed, such as an extended door opening function, i.e., whether the elevator remains in the door opening state without closing the door after pressing the elevator button for a period of time; and a bell alarm function, i.e., whether the alarm function can normally operate after pressing the bell button.

[0085] Specifically, compared with the automatic test mode, the manual test mode can further check whether the input device, such as the elevator button, is normal.

[0086] In an exemplary embodiment, as shown in Figure 5 The elevator operation test method further includes the following steps 52 to 56; wherein:

[0087] Step 52: when the analysis result indicates that the fault point cannot be confirmed, a function self-test procedure is performed; the function self-test procedure includes transmitting a fault test instruction to the input processing device, the fault test instruction being used to instruct the input processing device to feed back a simulated input signal.

[0088] Specifically, the input processing device is used to transmit the input signal to the control system after receiving the input signal from the input device; when the test fails and the fault point cannot be found through the function test failure analysis procedure, the control system performs a function self-test procedure (referred to as function self-test); in the case where the control system performs the function self-test procedure, the input processing device receives a fault test instruction from the control system, and if the input processing device is not faulty, the input processing device feeds back a simulated input signal to the control system.

[0089] If the input processing device is faulty, the input processing device cannot feed back the simulated input signal to the control system.

[0090] Step 54: if the simulated input signal is received, the elevator is tested according to the current function test item, and the function test is exited when the test result is obtained; the test result indicates that the input device is faulty.

[0091] Specifically, the control system receives the simulated input signal, confirms that the input processing device is not faulty, and then continues to test the elevator; when the test fails, the function test failure analysis procedure is performed; when the test succeeds, a test OK flag is generated, indicating that the input device is abnormal (i.e., the test result indicates that the input device is faulty), and then the function test is exited.

[0092] The input device fault can include a broken key, a key fault, and a problem with the input or output signal.

[0093] Step 56: if the simulated input signal is not received, the test result indicates that the input processing device is faulty, and the function test is exited.

[0094] Specifically, when the control system does not receive the simulated input signal fed back by the input processing device, it indicates that the input processing device is faulty.

[0095] In order to further illustrate the scheme of the present application, a specific example is described below, and the elevator operation test method can specifically include the following scheme:

[0096] The elevator operation test method provided by the embodiment of the present application can include an automatic test mode and a manual test mode.

[0097] In the automatic test mode, the test device automatically reads the preset functions of the control system, generates a function test menu and displays it to the staff through the man-machine interface; in the test menu, the test personnel (staff) can select a single, multiple or all (elevator) functions for testing; when multiple or all functions are selected (for testing) and confirmed, the test device sends a test instruction; the control system generates a test sequence according to the test instruction and tests in order (the staff selects the test items corresponding to different elevator functions through the man-machine interface, and then generates a test instruction according to the test items; after the control system receives the test instruction, it obtains the test items according to the test instruction and then obtains the test sequence corresponding to the automatic test mode), if a function test fails, a function test failure analysis program (process) is executed, and the next function is tested; after all function tests are completed, a test report is generated, which lists whether each function is successfully detected, and for the functions that fail the test, lists the abnormal signals.

[0098] Specifically, as shown in Figure 6 the automatic test mode does not require manual operation of the functions, automatically completes the function test, and can be set to complete the function test in a fixed time period, and the specific process can include: through the man-machine interface, automatically reading the system preset functions and generating a function test menu; in the test menu, the test personnel can select a single, multiple or all functions for testing; when multiple or all functions are selected and confirmed, a test sequence is generated and tested in order, if a function test fails, a function test failure analysis program is executed, and the next function is tested; after all function tests are completed, a test report is generated, which lists whether each function is successfully detected, and for the functions that fail the test, lists the abnormal signals.

[0099] In the manual test mode, a test instruction can be sent to the control system through the input device; after entering the (manual) test mode, the elevator is put into operation of the corresponding function (corresponding to the test instruction), if the function test fails, a function test failure analysis program (process) is executed; if the fault point can be determined through the function test failure analysis program, the function test can be exited, if the fault point cannot be determined through the function test failure analysis program, a function self-test (process) is manually (or automatically) started; after entering the self-test, the control system sends a (fault) test instruction to the input processing device, if the control system receives an input signal (analog input signal), the function test is continued, if the test fails, the function test failure analysis program is executed, if the test is successful, a test OK flag is generated, prompting the input device to be abnormal, and then the function test is exited; if the control system does not receive the input signal, the input processing device fault is recorded and the operation is exited.

[0100] Specifically, as shown in Figure 7As shown, in the specific process of manual test mode, the input device signal is input (input test command), and the elevator starts to operate the corresponding function; it is determined whether the function test has failed. If yes, the function test failure analysis program is executed; otherwise, a test OK flag is generated; further, it is determined whether to start the function self-test; if yes, the control system sends a test command to the input processing device and determines whether the analog input signal from the input processing device is received. If yes, the function test continues; otherwise, the input processing device fault is recorded until the function test is exited and the test result is output.

[0101] The test failure analysis process in this application embodiment may include: the control system pre-stores the affected variables corresponding to each function (pre-stores the preset values ​​corresponding to each function signal and its sub-signals at each level in the database); during the test, each function signal is checked one by one to see if it is valid; if a function signal is invalid, its first-level sub-signal is searched, the first-level sub-signal is compared with the system preset value, the first-level sub-signal that does not match the system preset value is found and recorded; further, the second-level sub-signal (of the first-level sub-signal that does not match the system preset value) is searched, the second-level sub-signal is compared with the system preset value, the second-level sub-signal that does not match the system preset value is found and recorded; until the final list of abnormal signals is output and the test ends.

[0102] Specifically, such as Figure 8 As shown, in the specific flow of the functional test failure analysis program, the functional signal i can be initialized to 1, and then it can be determined whether the functional signal i is valid. If the functional signal i is not valid, its first-level sub-signals are searched and compared with the preset values ​​stored in the system (control system database); the first-level sub-signals that do not conform to the system preset conditions (preset values) are found and recorded; the second-level sub-signals (the sub-signals that do not conform to the preset conditions among the first-level sub-signals) are further searched and compared with the system preset values; the second-level sub-signals that do not conform to the system preset conditions are found and recorded; until the nth-level sub-signals that do not conform to the system preset conditions are found and recorded.

[0103] In an exemplary embodiment, for the extended door opening function of the elevator (that is, the function of extending the opening time of the elevator car door and hall door), first press the extended door opening button (input device), or press and hold the elevator door opening button. If the elevator cannot engage the extended door opening function, then the function test failure analysis program is executed. If the fault point can be identified through the function test failure analysis program, then the function test can be exited. If the fault point cannot be identified through the function test failure analysis program, then the function self-test (process) is started manually (or automatically).

[0104] After starting the function self-test, the control cabinet MPU (Mirco Controller Unit, micro controller unit) board (control system) sends a test instruction to the car communication board (input processing device), at this time if the MPU board (control system) cannot receive the analog extended door opening input signal of the input device, the car communication board (input processing device) fault is recorded and the test is exited;

[0105] If the MPU board (control system) has received the input signal of the car communication board (input processing device), the function test is continued, if an abnormality occurs in the test process, the function test failure analysis program is executed, if no abnormality occurs in the test process, a test OK flag is generated, prompting that the extended door opening button or its wiring, IO signal may have a problem, and the function test is exited.

[0106] Based on the same inventive concept, the embodiments of the present application also provide an elevator operation test device for implementing the above-mentioned elevator operation test method. The implementation scheme of the device for solving the problem is similar to the implementation scheme described in the above method, so the specific limitations in one or more elevator operation test device embodiments provided below can refer to the limitations of the elevator operation test method in the foregoing, which will not be described here.

[0107] In an exemplary embodiment, as shown in Figure 9 An elevator operation test device 900 is provided, comprising:

[0108] A failure analysis module 902 is configured to execute a function test failure analysis process in response to a test failure of a current function test item of the elevator, and analyze a result as a test result of the current function test item; the function test failure analysis process is configured to check whether each function signal in a function signal sequence corresponding to the current function test item is established one by one; wherein the function signal sequence is obtained by dividing the function signal related to the current function test item into multiple levels of sub-signals through the elevator control logic step by step;

[0109] A recording module 904 is configured to test the elevator according to a next function test item, record a test result until the function test is ended, and output a test report based on the test results.

[0110] In an exemplary embodiment, the analysis result includes a signal list for indicating a function signal abnormality; the failure analysis module 902 is further configured to, in a case where the function signal is not established, confirm whether the multiple levels of sub-signals are consistent with system preset values step by step, and record the multiple levels of sub-signals that are not consistent with the system preset values as the signal list;

[0111] In a case where the function signal is established, the analysis result indicates that the function signal is normal.

[0112] In an example embodiment, the elevator operation test device further comprises:

[0113] The acquisition module 1002 is configured to determine to enter the automatic test mode in response to receiving the test instruction transmitted by the test device, and acquire a test sequence corresponding to the automatic test mode based on the test instruction.

[0114] The automatic test module 1004 is configured to test the elevator according to the test order of each functional test item in the test sequence until the functional test ends, and transmit a test report to the test device.

[0115] In an example embodiment, the elevator operation test device further comprises:

[0116] The manual test module 1102 is configured to determine to enter the manual test mode in response to receiving an input signal from the input device, and test the elevator according to the functional test item corresponding to the test instruction.

[0117] In an example embodiment, the elevator operation test device further comprises:

[0118] The self-test module 1202 is configured to execute a functional self-test process when the analysis result indicates that the fault point cannot be confirmed, and the functional self-test process comprises transmitting a fault test instruction to the input processing device, and the fault test instruction is used to instruct the input processing device to feed back a simulated input signal.

[0119] The judgment module 1204 is configured to test the elevator according to the current functional test item if the simulated input signal is received, and exit the functional test if a test result is acquired, and the test result indicates that the input device is faulty; and if the simulated input signal is not received, the test result indicates that the input processing device is faulty, and the functional test is exited.

[0120] The above-mentioned various modules in the elevator operation test device can be realized by software, hardware and combinations thereof in whole or in part. The above-mentioned various modules can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory in the computer device in software form, so as to be called and executed by the processor to perform the operations corresponding to the above-mentioned various modules.

[0121] In an embodiment, an elevator controller is provided, comprising a memory and a processor, the memory stores a computer program, and the computer program is executed by the processor to make the processor execute the steps of the elevator operation test method in the embodiments of the present application. The elevator controller can be an MPU board.

[0122] In an embodiment, an elevator operation test system is provided, as shown in Figure 10As shown, the elevator comprises an input device, an input processing device and an elevator controller connected in sequence; the operation test system comprises a test device connected to the elevator controller.

[0123] The elevator controller is configured to perform the steps of the elevator operation test method.

[0124] Specifically, the controller is configured with a control system, which can include the elevator controller.

[0125] In one exemplary embodiment, the input device is an elevator door opening button; the input processing device is a car communication board; and the elevator controller is an MPU board.

[0126] In one embodiment, a computer readable storage medium is provided, which stores a computer program, and the computer program is executed by a processor to implement the steps of the above-mentioned elevator operation test method.

[0127] In one embodiment, a computer program product is provided, which includes a computer program, and the computer program is executed by a processor to implement the steps of the above-mentioned elevator operation test method.

[0128] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (Read-Only Memory, ROM), magnetic tape, floppy disk, flash memory, optical storage, high-density embedded non-volatile memory, resistive memory (ReRAM), magnetoresistive random access memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric memory (Ferroelectric Random Access Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, etc. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc. The database involved in the embodiments provided in the present application can include at least one of a relational database and a non-relational database. The non-relational database can include a distributed database based on a block chain, etc., without being limited thereto. The processor involved in the embodiments provided in the present application can be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., without being limited thereto.

[0129] Any combination of the technical features of the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combination of the technical features does not exist contradictory, it should be considered as the scope of the present application.

[0130] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are within the scope of protection of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A method for testing elevator operation, characterized in that, The method includes: In response to a test failure for the current functional test item of the elevator, a functional test failure analysis process is executed, and the analysis result is used as the test result of the current functional test item. The functional test failure analysis process is used to check whether each functional signal in the functional signal sequence corresponding to the current functional test item is valid. The functional signal sequence is obtained by dividing the functional signals related to the current functional test item level by level through the elevator control logic until the functional signals are divided into multi-level sub-signals. The elevator is tested according to the next functional test item, and the test results are recorded until the functional test is completed. A test report is then output based on the test results.

2. The elevator operation testing method according to claim 1, characterized in that, The analysis results include a list of signals used to indicate functional signal anomalies; the functional test failure analysis process includes: If the function signal is not valid, check whether the multi-level sub-signals match the system preset value step by step, and record the multi-level sub-signals that do not match the system preset value as the signal list; When the functional signal is active, the analysis results indicate that the functional signal is normal.

3. The elevator operation testing method according to claim 2, characterized in that, The multi-level sub-signals include at least a first-level sub-signal and a second-level sub-signal.

4. The elevator operation test method according to any one of claims 1 to 3, characterized in that, The method further includes: In response to receiving a test instruction transmitted by the test device, the system determines to enter the automatic test mode and obtains the test sequence corresponding to the automatic test mode based on the test instruction. The elevator is tested according to the test order of each functional test item in the test sequence until the functional test is completed, and the test report is transmitted to the test device.

5. The elevator operation test method according to any one of claims 1 to 3, characterized in that, The method further includes: In response to receiving an input signal from the input device, the system determines to enter manual testing mode and tests the elevator according to the functional test items corresponding to the test instructions.

6. The elevator operation test method according to claim 5, characterized in that, The method further includes: If the analysis results indicate that the fault point cannot be identified, a functional self-test process is executed; the functional self-test process includes transmitting a fault test command to the input processing device, the fault test command being used to instruct the input processing device to provide a simulated input signal. If the simulated input signal is received, the elevator is tested according to the current functional test item, and the functional test is exited upon obtaining the test result; the test result indicates that the input device has malfunctioned. If the simulated input signal is not received, the test result indicates that the input processing device has malfunctioned and the functional test is terminated.

7. An elevator operation testing device, characterized in that, include: The failure analysis module is used to respond to the failure of the current functional test item for the elevator, execute the functional test failure analysis process, and use the analysis result as the test result of the current functional test item. The functional test failure analysis process is used to check whether each functional signal in the functional signal sequence corresponding to the current functional test item is valid; The functional signal sequence is obtained by dividing the functional signals related to the current functional test item through elevator control logic step by step until the functional signals are divided into multi-level sub-signals. The recording module is used to test the elevator according to the next functional test item, record the test results until the functional test is completed, and output a test report based on each test result.

8. An elevator controller, characterized in that, The method includes a memory and a processor, wherein the memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method as described in any one of claims 1 to 6.

9. An elevator operation testing system, characterized in that, The elevator includes an input device, an input processing device, and an elevator controller connected in sequence; the operation testing system includes a testing device connected to the elevator controller; The elevator controller is used to perform the steps of the method as described in any one of claims 1 to 6.

10. The elevator operation testing system according to claim 9, characterized in that, The input device is the elevator door opening button; the input processing device is the car communication board; and the elevator controller is an MPU board.

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