An integrated test probe suitable for small size
The test probes made by integrated molded concave hexagonal unit structure and 3D printing process solve the problem of excessive size of existing probes, achieving smaller size and higher applicability.
Patent Information
- Application Number
- CN202510143754.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-10
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2045-02-10
AI Technical Summary
Due to the complex structure of existing spring-type probes, their length and diameter are large, making it impossible to produce particularly small probes, which cannot meet the needs of small-sized electronic products.
An integrated molded test probe is designed, including a needle head, mounting part and elastic part. It adopts a multi-row concave hexagonal unit structure and is manufactured through 3D printing or powder metallurgy process to ensure the reduction of size while ensuring elasticity and strength.
A smaller size test probe is achieved, which can be suitable for small size electronics and maintain sufficient elasticity and strength.
Smart Images

Figure CN119959586B_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the field of testing technology, and in particular relates to a small-sized integrally formed testing probe. Background Art
[0002] Test probes are used to evaluate the electrical characteristics of semiconductor components such as integrated circuits and flat panel displays, specifically to perform power-on and insulation checks.
[0003] Probes in the prior art are typically spring-loaded, consisting of a needle shaft, a spring, a rear cover, and a needle tube with a receiving chamber. For example, Publication No. CN208820098U discloses a spring-loaded probe comprising a needle shaft, a spring, a rear cover, and a needle tube with a receiving chamber. The receiving chamber extends forward through the needle tube and forms a first opening. The needle shaft slides within the receiving chamber and has at least an initial position and a compressed position relative to the needle tube. The spring is located within the receiving chamber, with its front end elastically abutting against the needle shaft.
[0004] Because current spring-loaded probes are composed of multiple components, their structure is relatively complex. This complexity results in long lengths and large diameters, making it difficult to manufacture very small probes. However, with technological advancements, the size of electronic products such as circuit boards and chips is shrinking, necessitating smaller probes. However, current probes are complex, often assembled from multiple components, making it difficult to reduce their size, particularly their diameter and length. Summary of the Invention
[0005] In view of this, the present invention provides an integrally formed test probe suitable for small sizes to solve the above technical problems, thereby obtaining a probe with a smaller size.
[0006] A one-piece molded test probe suitable for small sizes, wherein the length of the test probe is between 3 mm and 10 mm. The test probe includes a needle head, a mounting portion, and an elastic portion located between the needle head and the mounting portion. The needle head, the mounting portion, and the elastic portion are integrally molded. Along the arrangement direction of the needle head and the mounting portion, the elastic portion includes multiple columns of concave hexagonal units, each of which includes two spaced cross bars, four elastic rods located between two of the cross bars, and two connecting rods respectively connected to the intersection of the two elastic rods. In the cross section along the arrangement direction of the mounting portion and the needle head, in each column of concave hexagonal units, a plurality of the concave hexagonal units are superimposed, and the cross bars of any two adjacent concave hexagonal units overlap. In two adjacent rows of the concave hexagonal columns, the two adjacent concave hexagonal units are staggered and connected, the connecting rod of one concave hexagonal unit coincides with the cross rod of the adjacent concave hexagonal unit, and the two elastic rods of the two connected concave hexagonal units coincide with each other.
[0007] Furthermore, each cross bar is perpendicular to the arrangement direction of the mounting portion and the needle head, a plurality of cross bars are arranged along the axial direction of the test probe, and an angle between each cross bar and the elastic rod is an acute angle.
[0008] Furthermore, in one of the concave hexagonal units, the four elastic rods are connected in pairs, and a symmetrical structure is formed with a line connecting two intersection points of the two-paired elastic rods as a symmetry axis.
[0009] Furthermore, the connecting rods of the concave hexagonal units in a row on the outer side wall of the elastic portion are omitted. Furthermore, one concave hexagonal unit in a row is connected to two concave hexagonal units in another row, and the two elastic rods on one side of one concave hexagonal unit in a row overlap with the two elastic rods of two adjacent concave hexagonal units.
[0010] Furthermore, when the inwardly concave hexagonal row is subjected to stress, the angle between the two elastic rods and the angle between the elastic rod and the crossbar decrease, and when the stress is released, the angle between the two elastic rods and the angle between the elastic rod and the crossbar return to their original angles.
[0011] Furthermore, the length h of the crossbar is 0.1 mm ≤ h ≤ 4 mm.
[0012] Furthermore, the length l of the elastic rod is 0.1 mm≤l≤4 mm.
[0013] Furthermore, the angle θ between the elastic rod and the cross rod is 30°≤θ≤50°, and the wall thickness t of the cross rod and the elastic rod is 0.1 mm≤t≤1 mm.
[0014] Compared with the prior art, the present invention provides an integrally formed test probe suitable for small sizes, which includes an integrally formed needle head, a mounting portion, and an elastic portion located between the needle head and the mounting portion. Since the needle head, the mounting portion, and the elastic portion are integrally formed, compared with the probe in the prior art, which is composed of multiple parts such as a needle shaft, a spring, a back cover, and a needle tube, the size of the test probe in the axial direction can be significantly reduced while ensuring the same elastic force. At the same time, the elastic portion is formed by multiple rows of concave hexagonal units, and in two adjacent rows of concave hexagonal units, two adjacent concave hexagonal units are staggered and connected. Specifically, the connecting rod of one concave hexagonal unit coincides with the cross rod of the adjacent concave hexagonal unit, and the two elastic rods of the two connected concave hexagonal units coincide, so that on the basis of ensuring the strength of the elastic portion, it has sufficient elasticity, thereby meeting the requirements of a very small-sized test probe. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 A schematic diagram of the cross-sectional structure of a small-sized integrally formed test probe provided by the present invention.
[0016] Figure 2 for Figure 1 A partial enlarged view of point A of the one-piece molded test probe suitable for small size.
[0017] Figure 3 Schematic diagram of the structure of a concave hexagonal unit. The specific embodiments of the present invention are further described in detail below. DETAILED DESCRIPTION
[0018] It should be understood that the description of the embodiments of the present invention herein is not intended to limit the scope of protection of the present invention.
[0019] like Figures 1 to 3 , which is a schematic diagram of the structure of a small-sized one-piece molded test probe provided by the present invention. The small-sized one-piece molded test probe includes a mounting portion 10, a needle head 20, and an elastic portion 30 disposed between the mounting portion 10 and the needle head 20. It is understood that the small-sized one-piece molded test probe also includes other functional structures, such as a threaded or clamping structure provided on the mounting portion 10 for installation, an abutment structure provided on the needle head 20, etc. These are well known to those skilled in the art and will not be described in detail here.
[0020] First, it should be noted that small-sized probes are typically between 3 mm and 10 mm in length and less than 5 mm in diameter, making them unsuitable for assembly from multiple components. The mounting portion 10 is used to mount the test probe on a machine or device, and thus can be provided with a threaded structure or a clamping structure, both of which are known in the art and will not be further described here.
[0021] The needle head 20 can be a current probe or a voltage probe, and its active end surface can be provided with multiple current contact spikes, thereby effectively piercing the oxide layer on the surface of the object to be detected, reducing the detection resistance of both, and facilitating transmission. Specifically, the contact spikes are arranged in a conical structure, but this is not limited to this. All contact spikes can be arranged together in a circular ring to achieve multi-point effective contact with the object to be detected, but this is not limited to this.
[0022] The elastic portion 30 is composed of a plurality of rows of concave hexagonal columns 31, each row of the concave hexagonal columns 31 includes a plurality of concave hexagonal units 32. In order to facilitate the description of the structure of the concave hexagonal columns, Figure 3 A simplified representation of the concave hexagonal unit 32 is shown. Each concave hexagonal unit 32 comprises two spaced crossbars 321, four elastic rods 322 positioned between the two crossbars 321, and two connecting rods 323 connected at the intersection of the two elastic rods 322. Each crossbar 321 is positioned perpendicular to the arrangement of the mounting portion 10 and the needle head 20, i.e., multiple crossbars 321 are arranged along the axial direction of the test probe. The angle between each crossbar 321 and the elastic rod 322 is acute. Two of the four elastic rods 322 are connected to one crossbar 321, and the other two are connected to another crossbar 321. Each of the four elastic rods 322 is connected to form a symmetrical structure, with the line connecting the two intersections of the two connected elastic rods 322 as the axis of symmetry. Two elastic rods 322 located on one side of the concave hexagonal unit 32 also form an acute angle between them. One end of the two connecting rods 323 is connected to the two intersection points of the elastic rod 322 respectively.
[0023] The length h of the cross bar 321 is 0.1mm≤h≤4mm. If the length of the cross bar is not within this range, poor mechanical properties will result. The length of the elastic rod 322 is 0.1mm≤l≤4mm. If the elastic rod is not within this range, poor elastic properties will result, and the elastic rod will not be able to bend and break when under pressure. The angle θ between the elastic rod 322 and the cross bar 321 is 30°≤θ≤50°. If the angle is not within this range, poor elastic properties will result when subjected to force, and easy breakage will occur. The wall thickness t of the cross bar 321 and the elastic rod 322 is 0.1mm≤t≤1mm. If the wall thickness is less than 0.1mm, it will be easy to break when subjected to force, and if it is greater than 1mm, it will result in insufficient elasticity.
[0024] like Figure 1 As shown, in the cross section along the arrangement direction of the mounting portion 10 and the needle head 20, in each column of the concave hexagonal columns 31, a plurality of the concave hexagonal units 32 are stacked, and the cross bars 321 of any two adjacent concave hexagonal units 32 overlap. The connecting rod 323 of the concave hexagonal units 32 in the outermost column of the elastic portion 30 is omitted because it does not act on the elastic portion 30. In two adjacent columns of the concave hexagonal columns 31, two adjacent concave hexagonal units 32 are staggered and connected. Specifically, the connecting rod 323 of one concave hexagonal unit 32 overlaps with the cross bar 321 of the adjacent concave hexagonal unit 32, and the two elastic rods 322 of the two connected concave hexagonal units 32 overlap. Specifically, the two parallel elastic rods 322 of two adjacent concave hexagonal units 32 overlap. As shown Figure 1 As shown, one concave hexagonal unit 32 in one row is connected to two concave hexagonal units 32 in another row. That is, the two elastic rods 322 on one side of one concave hexagonal unit 32 in one row overlap with the two elastic rods 322 of two adjacent concave hexagonal units 32. This also causes the connecting rod 323 of one concave hexagonal unit 32 in one row to overlap with the cross rod 321 of one concave hexagonal unit 32 in another row. In this application, the elastic portion 30 has three concave hexagonal rows 31.
[0025] The elastic portion 30 is a rotating body, so in a radial cross section of the elastic portion 30, in a layer of the concave hexagonal units 32, the cross bars 321 of the concave hexagonal units 32 in the central row are pie-shaped, while the cross bars 321 of the concave hexagonal units 32 outside the central concave hexagonal units 32 are ring-shaped.
[0026] During use, the needle head 20 is subjected to pressure, which is transmitted to the elastic portion 30 and then to the multiple rows of concave hexagonal rows 31. When the concave hexagonal rows 31 are subjected to force, the angle between the two elastic rods 322 and the angle between the elastic rod 322 and the cross bar 321 become smaller. After the pressure is released, the angle between the two elastic rods 322 and the angle between the elastic rod 322 and the cross bar 321 return to their original angles, thereby making the elastic portion 30 elastic.
[0027] Furthermore, because the three rows of indented hexagonal units 32 are staggered, the connecting rods 323 of one row of indented hexagonal units 32 overlap with the cross rods 321 of an adjacent row of indented hexagonal units 32. This not only makes the structure of the elastic portion 30 compact, but also ensures uniform and constant elasticity across the three rows of indented hexagonal units 32. Furthermore, the connecting rods 323 of one row of indented hexagonal units 32 overlap with the cross rods 321 of an adjacent row of indented hexagonal units 32, and the elastic rods 322 of two adjacent indented hexagonal units 32 overlap. This ensures that the elastic portion 30 is sufficiently strong to prevent one or more of the cross rods 321 or elastic rods 322 from breaking under pressure.
[0028] The structure of the test probe is relatively complex, especially the structure of the elastic part 30 is relatively complex, which is difficult to complete through ordinary machining. Therefore, it can be made through 3D printing or powder metallurgy process. The 3D printing and powder metallurgy themselves are existing technologies and will not be repeated here.
[0029] Compared to existing technologies, the present invention provides a small-sized, integrally molded test probe, comprising an integrally molded needle head 20, a mounting portion 10, and an elastic portion 30 positioned between the needle head 20 and the mounting portion 10. Because the needle head 20, the mounting portion 10, and the elastic portion 30 are integrally molded, compared to existing probes consisting of multiple components, such as a needle shaft, a spring, a rear cover, and a needle tube, the test probe can be significantly reduced in both axial and radial dimensions while maintaining the same elastic force. At the same time, the elastic part 30 is formed by multiple columns of the concave hexagonal units 32. In two adjacent columns of the concave hexagonal columns 31, two adjacent concave hexagonal units 32 are staggered and connected. Specifically, the connecting rod 323 of one concave hexagonal unit 32 coincides with the cross rod 321 of the adjacent concave hexagonal unit 32, and the two elastic rods 322 of the two connected concave hexagonal units 32 coincide with each other. Therefore, while ensuring the strength of the elastic part 30, it has sufficient elasticity, thereby meeting the requirements of very small-sized test probes.
[0030] The above are only preferred embodiments of the present invention and are not intended to limit the scope of protection of the present invention. Any modifications, equivalent replacements or improvements within the spirit of the present invention are included in the scope of the claims of the present invention.
Claims
1. A small-sized integrally molded test probe having a length between 3 mm and 10 mm, characterized in that: The test probe includes a needle head, a mounting portion, and an elastic portion located between the needle head and the mounting portion, the needle head, the mounting portion, and the elastic portion being integrally formed, and the elastic portion including multiple rows of concave hexagonal units along the arrangement direction of the needle head and the mounting portion, each concave hexagonal unit including two spaced cross bars, four elastic rods located between two of the cross bars, and two connecting rods respectively connected to the intersection of the two elastic rods, and in a cross section along the arrangement direction of the mounting portion and the needle head, in each row of concave hexagonal columns, a plurality of the concave hexagonal units are superimposed, the cross bars of any two adjacent concave hexagonal units overlap, and in two adjacent rows of the concave hexagonal columns, two adjacent concave hexagonal units are staggered and connected, the connecting rod of one of the concave hexagonal units overlaps with the cross bar of the adjacent concave hexagonal unit, and the two elastic rods of the two connected concave hexagonal units overlap.
2. The small-sized integrally molded test probe according to claim 1, characterized in that: Each cross bar is perpendicular to the arrangement direction of the mounting portion and the needle head, a plurality of cross bars are arranged along the axial direction of the test probe, and an angle between each cross bar and the elastic rod is an acute angle.
3. The small-sized integrally molded test probe according to claim 1, characterized in that: In one of the concave hexagonal units, the four elastic rods are connected in pairs, and a symmetrical structure is formed with a line connecting two intersection points of the two-paired elastic rods as a symmetry axis.
4. The small-sized integrally molded test probe according to claim 1, wherein: The connecting rods of the concave hexagonal units in a row on the outer side wall of the elastic portion are omitted.
5. The small-sized integrally molded test probe according to claim 1, characterized in that: One concave hexagonal unit in one column is connected to two concave hexagonal units in another column, and two elastic rods on one side of one concave hexagonal unit in one column coincide with two elastic rods of two adjacent concave hexagonal units.
6. The small-sized integrally molded test probe according to claim 1, characterized in that: When the indented hexagonal row is subjected to stress, the angle between the two elastic rods and the angle between the elastic rod and the crossbar decrease. When the stress is released, the angle between the two elastic rods and the angle between the elastic rod and the crossbar return to their original angles.
7. The small-sized integrally molded test probe according to claim 1, characterized in that: The length h of the crossbar is 0.1 mm ≤ h ≤ 4 mm.
8. The small-sized integrally molded test probe according to claim 1, characterized in that: The length l of the elastic rod is 0.1 mm≤l≤4 mm.
9. The small-sized integrally molded test probe according to claim 1, characterized in that: The angle θ between the elastic rod and the cross rod is 30°≤θ≤50°, and the wall thickness t of the cross rod and the elastic rod is 0.1 mm≤t≤1 mm.
Citation Information
Patent Citations
Spring type probe
CN208820098U
Probe card for semiconductor test
CN101346814A
Circuit board test probe and manufacturing method thereof
CN111044763A