Acoustic emission detection device and fixing method
By using the contact surface adapter and the probe contact force adjustment mechanism in the acoustic emission detection device, the problem of the traditional fixing method being unreliable and affecting the mechanical characteristics of the specimen is solved, and the stable fixation between the acoustic emission probe and the specimen and the protection of the native characteristics of the specimen is achieved.
Patent Information
- Application Number
- CN202510177865.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-18
- Publication Date
- 2025-05-13
AI Technical Summary
The fixing method of traditional acoustic emission probes has problems such as unreliable fixing, complicated operation, and difficult to control the dosage of coupling agent, and will have an impact on the mechanical properties of the specimen.
An acoustic emission detection device including a support, a bracket, a support member, a probe contact force adjustment mechanism, a contact surface adapter and an acoustic emission probe are adopted. By cooperating with the outer contour of the contact surface adapter and the specimen, the contact force between the acoustic emission probe and the specimen is adjusted by using the probe contact force adjustment mechanism.
The firm fixation between the acoustic emission probe and the specimen is achieved, which avoids the influence of gravity on the specimen, reduces the contact area and constraints, and ensures the original mechanical characteristics and rupture form of the specimen.
Smart Images

Figure CN119985720A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of acoustic emission detection, in particular to an acoustic emission detection device and a fixing method. Background Art
[0002] Acoustic emission detection technology is widely used in the fields of materials engineering and non-destructive testing. It can be used to monitor the microscopic deformation of structures or materials under load and the dynamic information of crack occurrence and development, which involves many contents such as acoustic emission sources and wave propagation. The application process of acoustic emission detection technology mainly includes two parts: the acquisition and processing and analysis of acoustic emission signals. Among them, when collecting acoustic emission signals, the fixation effect of the acoustic emission probe and the specimen is one of the important reasons affecting the quality of signal acquisition. The traditional fixing methods of acoustic emission probes mainly include mechanical fixation, adhesive fixation, magnetic adsorption fixation, etc. The above methods have their own advantages, but also have certain disadvantages. The difficulties faced are mainly unreliable fixation, cumbersome operation, and difficult to control the amount of coupling agent. In addition, the traditional fixing method of acoustic emission probes will affect the mechanical properties of the specimen. The reason is that the monitoring equipment is attached to the surface of the specimen, and the gravity and restraint of the monitoring equipment change the force and fracture morphology of the specimen. Summary of the invention
[0003] The object of the present invention is to provide an acoustic emission detection device and a fixing method to improve the fixing effect of the acoustic emission probe and the test piece.
[0004] In order to achieve the above object, the technical solutions adopted by the present invention are as follows:
[0005] An acoustic emission detection device, comprising:
[0006] Support;
[0007] A bracket, one end of which is connected to the support, and the other end of which can pitch and swing to a set angle relative to the one end;
[0008] A support member, one end of which is connected to the other end of the bracket via a first universal bead, and the first universal bead can be locked by a first locking member;
[0009] A probe contact force adjustment mechanism, one end of which is connected to the other end of the support member;
[0010] A contact surface adapter is arranged at the other end of the probe contact force adjustment mechanism, and the end surface of the contact surface adapter is used to match the outer contour of the test piece;
[0011] The acoustic emission probe is arranged inside the contact surface adapter and acts on the probe contact force adjustment mechanism. The probe contact force adjustment mechanism generates a contact force of a set magnitude on the acoustic emission probe toward the test piece.
[0012] Furthermore, the probe contact force adjustment mechanism includes a first sleeve, a pusher, a spring and a position adjustment member;
[0013] One end of the first sleeve is connected to the other end of the support member, and the other end of the first sleeve is connected to the contact surface adapter;
[0014] The pusher is located inside the first sleeve, and the pusher is connected to the acoustic emission probe;
[0015] The positioning member can move along the axial direction of the first sleeve. The first sleeve is provided with a plurality of positioning grooves spaced apart along the axial direction. The positioning member can be embedded in any of the positioning grooves.
[0016] The spring is located inside the first sleeve, and two ends of the spring are respectively connected to the pushing member and the adjusting member.
[0017] Further, the contact surface adapter is configured as a second sleeve, the other end of the first sleeve is connected to one end of the second sleeve, and the other end surface of the second sleeve is used to match the outer contour of the test piece;
[0018] The acoustic emission probe is arranged inside the second sleeve.
[0019] Furthermore, at least one opening is provided on the side surface of the second sleeve for the coupling agent to overflow.
[0020] Further, the support member is configured as a cylindrical specimen support member, and the cylindrical specimen support member includes a first support seat and a plurality of adapter seats, the plurality of adapter seats are arranged at equal intervals along the circumference of the first support seat, and each of the adapter seats is connected to the probe contact force adjustment mechanism.
[0021] Furthermore, the cylindrical specimen support also includes a threaded sleeve and a screw rod;
[0022] The screw sleeve is slidably matched with the adapter seat, the screw rod is arranged on the adapter seat, and the screw rod is threadedly matched with one end of the screw sleeve, and the other end of the screw sleeve is connected to the probe contact force adjustment mechanism.
[0023] Further, the support member is configured as a surface test piece support member, and the surface test piece support member comprises a second support seat, a second universal bead, a sliding seat, and a second locking member;
[0024] A hollow cavity is provided in the second support seat along the extension direction, a slide groove communicating with the hollow cavity is provided at one end of the second support seat along the extension direction of the second support seat, and a swing groove communicating with the hollow cavity is provided at the other end of the second support seat along the extension direction of the second support seat;
[0025] The second universal ball is located inside the hollow cavity, and the second universal ball can move in the hollow cavity along the extension direction of the second support seat;
[0026] The sliding seat is slidably matched with the sliding groove, and the second locking member is provided on the sliding seat;
[0027] The second universal bead is connected to the probe contact force adjustment mechanism via a transition column, and the transition column passes through the swing slot;
[0028] The sliding seat can move to a position corresponding to the second universal bead, and the second universal bead can be locked by the second locking member.
[0029] Further, the bracket includes a fixed frame, a first swing frame, a second swing frame, a first self-locking hinge and a second self-locking hinge;
[0030] The lower end of the fixed frame is connected to the support, the upper end of the fixed frame is hinged to one end of the first swing frame via a first self-locking hinge, the other end of the first swing frame is hinged to one end of the second swing frame via a second self-locking hinge, and the other end of the second swing frame is connected to the support.
[0031] Furthermore, the support is configured as a magnetic support.
[0032] An acoustic emission detection and fixing method, using the above-mentioned acoustic emission detection device, the method selectively performs acoustic emission detection and fixing on a cylindrical test piece or a surface test piece:
[0033] 1. Acoustic emission detection and fixation of cylindrical specimens
[0034] The other end of the bracket is pitched and swung relative to one end to a set angle, the cylindrical specimen support is placed at the position of the cylindrical specimen, a plurality of contact surface adapters surround the cylindrical specimen, the end faces of the plurality of contact surface adapters are matched with the circumferential outer contour of the cylindrical specimen, and the probe contact force adjustment mechanism generates a contact force of a set magnitude toward the specimen on the acoustic emission probe;
[0035] 2. Acoustic emission detection and fixation of surface specimens
[0036] The other end of the bracket pitches and swings relative to one end to a set angle, the surface specimen support is placed at the position of the surface specimen, the end face of at least one contact surface adapter cooperates with the outer contour of the surface specimen, and the probe contact force adjustment mechanism generates a contact force of a set size toward the specimen on the acoustic emission probe.
[0037] The beneficial technical effects of the present invention are:
[0038] The acoustic emission detection device and fixing method of the present invention cooperate with the outer contour of a cylindrical test piece or a surface test piece (a flat test piece, a curved test piece) through a contact surface adapter, and a probe contact force adjustment mechanism generates a contact force of a set size toward the test piece on the acoustic emission probe, so that the acoustic emission probe and the test piece can be firmly fixed; the gravity of the overall structure of the device is borne by the support and the bracket, and the gravity does not act on the test piece. The overall structure of the device only has the contact surface adapter and the acoustic emission probe contacting the test piece, and the contact area is small, and the deformation of the test piece is not constrained. The contact force between the acoustic emission probe and the test piece is adjusted to the set size required for the test by the probe contact force adjustment mechanism, and the deformation of the test piece is not constrained, so the stress and fracture morphology of the test piece are not changed, and the mechanical properties of the test piece are not affected. BRIEF DESCRIPTION OF THE DRAWINGS
[0039] Figure 1 It is a structural schematic diagram of an acoustic emission detection device according to an embodiment of the present invention;
[0040] Figure 2 This is a partial structural schematic diagram of an acoustic emission detection device according to an embodiment of the present invention, in which the supporting member is a cylindrical specimen supporting member;
[0041] Figure 3 It is a structural schematic diagram of a cylindrical specimen support part and a probe contact force adjustment mechanism, a contact surface adapter and an acoustic emission probe according to an embodiment of the present invention;
[0042] Figure 4 It is a schematic diagram of the structure of the probe contact force adjustment mechanism, the contact surface adapter and the acoustic emission probe according to an embodiment of the present invention;
[0043] Figure 5 This is a partial structural schematic diagram of the acoustic emission detection device support member of the embodiment of the present invention being a surface specimen support member;
[0044] Figure 6 It is a schematic structural diagram of a second support seat, a second universal ball, a sliding seat and a second locking member according to an embodiment of the present invention;
[0045] Figure 7 This is a schematic diagram of the structure of the position adjusting member according to an embodiment of the present invention;
[0046] Figure 8 A top view of the adjustment member and the first sleeve in cooperation with each other according to an embodiment of the present invention;
[0047] Fig. 9 This is a schematic diagram of the structure in which the end surface of the second sleeve of the embodiment of the present invention is a curved surface;
[0048] Fig.10 This is a schematic structural diagram of an embodiment of the present invention in which the end surface of the second sleeve is a plane;
[0049] Reference numerals:
[0050] 1. Support, 11. Magnetic switch, 21. Fixed frame, 22. First swing frame, 23. Second swing frame, 24. First self-locking hinge, 25. Second self-locking hinge, 311. First universal ball, 312. Second universal ball, 321. First locking member, 322. Second locking member, 33. Support sleeve, 34. Assembly bolt, 41. First support seat, 42. Adapter seat, 421. Slide hole, 43. Screw sleeve, 44. Screw, 5. Acoustic emission probe, 61. Second support seat, 611. Hollow cavity, 612. Slide groove, 613. Swing groove, 62. Slide seat, 71. First sleeve, 711. Adjustment groove, 712. Guide groove, 72. Push piece, 73. Spring, 74. Adjustment member, 741. Limit block, 75. Second sleeve, 751. Opening. DETAILED DESCRIPTION
[0051] In order to make the purpose, technical scheme and beneficial effects of the present invention more clearly understood, the present invention is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. Certain embodiments of the present invention will be described more comprehensively with reference to the accompanying drawings, in which some but not all embodiments will be shown. In fact, the various embodiments of the present invention can be implemented in many different forms and should not be construed as being limited to the embodiments described herein; rather, these embodiments are provided so that the present invention meets applicable legal requirements.
[0052] In the description of the present invention, it should be noted that the terms "inside", "outside", "upper", "lower", "front", "back" and the like indicate directions or positional relationships based on directions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.
[0053] In an embodiment of the present invention, an acoustic emission detection device and a fixing method are provided. Please refer to Figures 1 to 10 shown.
[0054] An acoustic emission detection device comprises a support 1, a bracket, a support member, a probe contact force adjustment mechanism, a contact surface adapter and an acoustic emission probe 5.
[0055] The support 1 is configured as a magnetic support, on which a magnetic switch 11 is provided, and the magnetic function of the magnetic support is activated or deactivated, which is controlled by the magnetic switch 11. The support 1 is placed on a test bench made of magnetic material (such as iron, etc.), and the magnetic switch 11 activates the magnetic absorption function of the magnetic support, so that the magnetic support is firmly absorbed on the test bench.
[0056] One end of the bracket is connected to the support 1, and the other end of the bracket can be pitched and swung to a set angle relative to the one end.
[0057] The bracket includes a fixed frame 21, a first swing frame 22, a second swing frame 23, a first self-locking hinge 24 and a second self-locking hinge 25. The lower end of the fixed frame 21 is fixedly connected to the support 1, the upper end of the fixed frame 21 is hinged to one end of the first swing frame 22 via the first self-locking hinge 24, the other end of the first swing frame 22 is hinged to one end of the second swing frame 23 via the second self-locking hinge 25, and the other end of the second swing frame 23 is connected to the support member.
[0058] The first swing frame 22 swings to a set angle relative to the fixed frame 21 via the first self-locking hinge 24, and can be locked by the first self-locking hinge 24 so that the first swing frame 22 and the fixed frame 21 maintain a set angle. The second swing frame 23 swings to a set angle relative to the first swing frame 22 via the second self-locking hinge 25, and can be locked by the second self-locking hinge 25 so that the second swing frame 23 and the first swing frame 22 maintain a set angle. In this way, the other end of the bracket can be pitched and swung to a set angle relative to one end.
[0059] One end of the support member is connected to the other end of the bracket via a first universal bead 311 , and the first universal bead 311 can be locked by a first locking member 321 .
[0060] Specifically, a support sleeve 33 is provided between the support member and the bracket, and the support sleeve 33 is detachably connected to the end of the second swing frame 23 via an assembly bolt 34, so as to realize a detachable connection between the support member and the bracket, and facilitate the assembly and disassembly of the device. One end of the support member is fixedly connected to the first universal bead 311, and the first universal bead 311 is located in the support sleeve 33. The first locking member 321 is provided as a locking bolt, and the first locking member 321 is provided on the support sleeve 33. After the first universal bead 311 is rotated to a set angle relative to the support sleeve 33 so that the support member has an initial angle orientation, the first locking member 321 is rotated so that the first locking member 321 abuts against the first universal bead 311 to lock the first universal bead 311.
[0061] The support members in this embodiment include cylindrical specimen support members for cylindrical specimens and surface specimen support members for surface specimens (flat specimens, curved specimens).
[0062] When the support is set as a cylindrical specimen support, the cylindrical specimen support includes a first support seat 41 and six adapter seats 42. The six adapter seats 42 are arranged at equal intervals along the circumference of the first support seat 41, and each adapter seat 42 is connected to a probe contact force adjustment mechanism.
[0063] The cylindrical specimen support also includes a screw sleeve 43 and a screw rod 44. A cylindrical sliding hole 421 is provided on the adapter 42. The screw sleeve 43 slides in cooperation with the sliding hole 421. The screw rod 44 is arranged on the adapter 42. The screw sleeve 44 is threadedly engaged with one end of the screw sleeve 43. The other end of the screw sleeve 43 is connected to the probe contact force adjustment mechanism. The screw sleeve 43, the probe contact force adjustment mechanism and the acoustic emission probe 5 are driven away from or close to the adapter 42 by rotating the screw rod 44, and the initial contact force between the acoustic emission probe 5 and the specimen is adjusted after the support posture is determined.
[0064] When the support member is configured as a surface test piece support member, the surface test piece support member includes a second support seat 61 , a second universal bead 312 , a sliding seat 62 and a second locking member 322 .
[0065] A hollow cavity 611 is provided in the second support seat 61 along the extension direction, a slide groove 612 communicating with the hollow cavity 611 is provided at one end of the second support seat 61 along the extension direction of the second support seat 61, and a swing groove 613 communicating with the hollow cavity 611 is provided at the other end of the second support seat 61 along the extension direction of the second support seat 61; the second universal ball 312 is located inside the hollow cavity 611, and the second universal ball 312 can move in the hollow cavity 611 along the extension direction of the second support seat 61; the slide seat 62 slidably cooperates with the slide groove 612, and a second locking member 322 is provided on the slide seat 62, wherein the second locking member 322 is configured as a locking bolt; the second universal ball 312 is connected to the probe contact force adjustment mechanism via the transition column 34, and the transition column 34 passes through the swing groove 613; the slide seat 62 can move to a position corresponding to the second universal ball 312, and the second universal ball 312 can be locked by the second locking member 322.
[0066] When in use, first push the probe contact force adjustment mechanism to drive the second universal bead 312 to move along the hollow cavity 611, so that the acoustic emission probe 5 is close to the test piece, and then change the rotation angle of the second universal bead 312, so that the second universal bead 312 rotates to a set angle relative to the hollow cavity 611, and the transition column 34 swings the set angle accordingly, so that the support has an initial angle orientation, so that the end face of the contact surface adapter cooperates with the outer contour of the test piece, and the end of the acoustic emission probe 5 faces the contact test piece, and then the slide seat 62 is moved along the slide groove 612 to the position of the second universal bead 312, and the second locking member 322 is rotated to abut against the second universal bead 312 to lock the second universal bead 312.
[0067] One end of the probe contact force adjustment mechanism is connected to the other end of the support member to finely adjust the contact force between the transmitting probe 5 and the test piece.
[0068] The probe contact force adjustment mechanism includes a first sleeve 71, a pusher 72, a spring 73 and an adjustment member 74. One end of the first sleeve 71 is connected to the other end of the support member (screw sleeve 43 or transition column 34), and the other end of the first sleeve 71 is connected to the contact surface adapter. The pusher 72 is located inside the first sleeve 71, and the pusher 72 is connected to the acoustic emission probe 5. The spring 73 is located inside the first sleeve 71, and the two ends of the spring 73 are respectively connected to the pusher 72 and the adjustment member 74. The adjustment member 74 can move along the axial direction of the first sleeve 71, and a plurality of adjustment grooves 711 are arranged on the first sleeve 71 along the axial interval, and the adjustment member 74 can be embedded in any one of the adjustment grooves 711. Among them, the circumferential side surface of the first sleeve 71 is provided with a guide groove 712 along the axial direction, and the guide groove 712 is connected to each adjustment groove 711. A limit block 741 is arranged on the adjustment member 74, and the limit block 741 is slidably matched in the guide groove 712. The limit block 741 moves along the guide groove 712 to adjust the compression degree of the spring 73. When the compression amount of the spring 73 reaches the set standard, the contact force between the transmitting probe 5 and the test piece reaches the set value. The adjustment member 74 is rotated to a set angle so that the limit block 741 is embedded in the adjustment groove 711 for limiting, so that the spring 73 maintains the set compression amount and the contact force between the transmitting probe 5 and the test piece is kept stable.
[0069] The contact surface adapter is arranged at the other end of the probe contact force adjustment mechanism, and the end surface of the contact surface adapter is used to match the outer contour of the test piece.
[0070] Specifically, the contact surface adapter is configured as a second sleeve 75, and the other end of the first sleeve 71 is connected to one end of the second sleeve 75 via an assembly bolt 34, so as to realize a detachable connection between the probe contact force adjustment mechanism and the contact surface adapter, and facilitate the assembly and disassembly of the device. The other end surface of the second sleeve 75 is used to match the outer contour of the specimen. Fig. 9 As shown, the other end surface of the second sleeve 75 is a curved surface to match the curved outer contour of the test piece. Fig.10 As shown, the other end surface of the second sleeve 75 is a plane to match the plane outer contour of the test piece. The acoustic emission probe 5 is arranged inside the second sleeve 75 , and the acoustic emission probe 5 can move along the second sleeve 75 driven by the pusher 72 .
[0071] At least one opening 751 for the coupling agent to overflow is provided on the side of the second sleeve 75. When the coupling agent completely fills the gap between the contact surface of the acoustic emission probe 5 and the specimen, the coupling agent can overflow from the opening 751 to monitor whether the amount of coupling agent meets the requirement.
[0072] The acoustic emission probe 5 is disposed inside the contact surface adapter (the second sleeve 75 ) and interacts with the probe contact force adjustment mechanism, which generates a contact force of a set magnitude on the acoustic emission probe 5 toward the test piece.
[0073] An acoustic emission detection and fixing method, using the acoustic emission detection device described above in this embodiment, the method selectively performs acoustic emission detection and fixing on a cylindrical test piece or a surface test piece:
[0074] 1. Acoustic emission detection and fixation of cylindrical specimens
[0075] The other end of the bracket is pitched and swung relative to one end to a set angle, the cylindrical specimen support is placed at the position of the cylindrical specimen, a number of contact surface adapters surround the cylindrical specimen, the end faces of the several contact surface adapters cooperate with the circumferential outer contour of the cylindrical specimen, and the probe contact force adjustment mechanism generates a contact force of a set size toward the specimen on the acoustic emission probe 5.
[0076] 2. Acoustic emission detection and fixation of surface specimens
[0077] The other end of the bracket pitches and swings relative to one end to a set angle, the surface specimen support is placed at the position of the surface specimen, the end face of at least one contact surface adapter cooperates with the outer contour of the surface specimen, and the probe contact force adjustment mechanism generates a contact force of a set size toward the specimen on the acoustic emission probe 5.
[0078] So far, the present embodiment has been described in detail in conjunction with the accompanying drawings. Based on the above description, those skilled in the art should have a clear understanding of the acoustic emission detection device and fixing method of the present invention. The acoustic emission detection device and fixing method of the present invention, through the contact surface adapter and the outer contour of the cylindrical test piece or the surface test piece (plane test piece, curved test piece), the probe contact force adjustment mechanism generates a contact force of a set size toward the test piece on the acoustic emission probe 5, which can make the acoustic emission probe 5 and the test piece firmly fixed; the gravity of the overall structure of the device is borne by the support and the bracket, and the gravity does not act on the test piece. The overall structure of the device only contacts the test piece with the contact surface adapter and the acoustic emission probe 5, and the contact area is small, which does not constrain the deformation of the test piece. The contact force between the acoustic emission probe 5 and the test piece is adjusted by the probe contact force adjustment mechanism to the set size required for the test, and does not constrain the deformation of the test piece, so that the stress and fracture morphology of the test piece are not changed, and the mechanical properties of the test piece are not affected.
[0079] Of course, the specific embodiments described above further illustrate the purpose, technical solutions and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. An acoustic emission detection device, characterized in that: include: Support; A bracket, one end of which is connected to the support, and the other end of which can pitch and swing relative to the one end to a set angle; A support member, one end of which is connected to the other end of the bracket via a first universal bead, and the first universal bead can be locked by a first locking member; A probe contact force adjustment mechanism, one end of which is connected to the other end of the support member; A contact surface adapter is arranged at the other end of the probe contact force adjustment mechanism, and the end surface of the contact surface adapter is used to match the outer contour of the test piece; The acoustic emission probe is arranged inside the contact surface adapter and acts on the probe contact force adjustment mechanism. The probe contact force adjustment mechanism generates a contact force of a set magnitude on the acoustic emission probe toward the test piece.
2. An acoustic emission detection device according to claim 1, characterized in that: The probe contact force adjustment mechanism comprises a first sleeve, a pusher, a spring and a position adjustment member; One end of the first sleeve is connected to the other end of the support member, and the other end of the first sleeve is connected to the contact surface adapter; The pusher is located inside the first sleeve, and the pusher is connected to the acoustic emission probe; The positioning member can move along the axial direction of the first sleeve. The first sleeve is provided with a plurality of positioning grooves spaced apart along the axial direction. The positioning member can be embedded in any one of the positioning grooves. The spring is located inside the first sleeve, and two ends of the spring are respectively connected to the pushing member and the adjusting member.
3. An acoustic emission detection device according to claim 2, characterized in that: The contact surface adapter is configured as a second sleeve, the other end of the first sleeve is connected to one end of the second sleeve, and the other end surface of the second sleeve is used to match the outer contour of the test piece; The acoustic emission probe is arranged inside the second sleeve.
4. An acoustic emission detection device according to claim 3, characterized in that: At least one opening is formed on the side surface of the second sleeve for the coupling agent to overflow.
5. An acoustic emission detection device according to any one of claims 1 to 4, characterized in that: The support member is configured as a cylindrical specimen support member, and the cylindrical specimen support member comprises a first support seat and a plurality of adapter seats, the plurality of adapter seats are arranged at equal intervals along the circumference of the first support seat, and each of the adapter seats is connected to the probe contact force adjustment mechanism.
6. An acoustic emission detection device according to claim 5, characterized in that: The cylindrical specimen support also includes a threaded sleeve and a screw rod; The screw sleeve is slidably matched with the adapter seat, the screw rod is arranged on the adapter seat, and the screw rod is threadedly matched with one end of the screw sleeve, and the other end of the screw sleeve is connected to the probe contact force adjustment mechanism.
7. An acoustic emission detection device according to any one of claims 1 to 4, characterized in that: The support member is configured as a surface test piece support member, and the surface test piece support member comprises a second support seat, a second universal bead, a sliding seat, and a second locking member; A hollow cavity is provided in the second support seat along the extension direction, a slide groove communicating with the hollow cavity is provided at one end of the second support seat along the extension direction of the second support seat, and a swing groove communicating with the hollow cavity is provided at the other end of the second support seat along the extension direction of the second support seat; The second universal ball is located inside the hollow cavity, and the second universal ball can move in the hollow cavity along the extension direction of the second support seat; The sliding seat is slidably matched with the sliding groove, and the second locking member is provided on the sliding seat; The second universal bead is connected to the probe contact force adjustment mechanism via a transition column, and the transition column passes through the swing slot; The sliding seat can move to a position corresponding to the second universal bead, and the second universal bead can be locked by the second locking member.
8. An acoustic emission detection device according to claim 1, characterized in that: The bracket includes a fixed frame, a first swing frame, a second swing frame, a first self-locking hinge and a second self-locking hinge; The lower end of the fixed frame is connected to the support, the upper end of the fixed frame is hinged to one end of the first swing frame via a first self-locking hinge, the other end of the first swing frame is hinged to one end of the second swing frame via a second self-locking hinge, and the other end of the second swing frame is connected to the support.
9. An acoustic emission detection device according to claim 1, characterized in that: The support is configured as a magnetic support.
10. An acoustic emission detection fixing method, using the acoustic emission detection device according to any one of claims 1 to 9, characterized in that: The method selectively performs acoustic emission detection and fixation on a cylindrical test piece or a surface test piece:
1. Acoustic emission detection and fixation of cylindrical specimens The other end of the bracket is pitched and swung relative to one end to a set angle, the cylindrical specimen support is placed at the position of the cylindrical specimen, a plurality of contact surface adapters surround the cylindrical specimen, the end faces of the plurality of contact surface adapters are matched with the circumferential outer contour of the cylindrical specimen, and the probe contact force adjustment mechanism generates a contact force of a set magnitude toward the specimen on the acoustic emission probe; 2. Acoustic emission detection and fixation of surface specimens The other end of the bracket pitches and swings relative to one end to a set angle, the surface specimen support is placed at the position of the surface specimen, the end face of at least one contact surface adapter cooperates with the outer contour of the surface specimen, and the probe contact force adjustment mechanism generates a contact force of a set size toward the specimen on the acoustic emission probe.