Optical scanning module automatic switching device, optical scanning system and switching method

Abstract

The present application relates to an optical scanning module automatic switching device, an optical scanning system and a switching method, which are composed of a material with elasticity, and realize switching of different scanning modules under the condition of no change of an optical path and introduction of more devices through combination of an electrically controlled displacement device and a dual-axis galvanometer module. The core technical features are electrically controlled displacement and switching of multiple scanning modules, which solve the problems of change of an optical path and increase of optical path loss caused by switching of scanning modules.

Description

Technical Field

[0001] This specification relates to the field of optics, and in particular to an automatic switching device for optical scanning modules, an optical scanning system, and a switching method. Background Technology

[0002] In biomedical imaging, lasers are frequently used to perform gridded scanning of sample surfaces. Typically, an XY scanning system (referred to as a slow scanning module) is composed of two galvanometer mirrors. To improve scanning speed, a fast scanning module consisting of a resonant mirror and a galvanometer mirror can be used. The slow and fast scanning modules cater to different application needs, and users must switch between the two modules according to their current requirements.

[0003] Existing technical solutions achieve switching by using a reflector to change the optical path and guide light to the two modules. For example... Figure 1 As shown, the system includes a fast scanning module 100, a slow scanning module 300, and two rotatable devices 200 with reflectors. One rotatable device 200 is located in the incident light path, and the other is located in the exit light path. Each rotatable device may include a reflector 201 and a motor 202. When the fast scanning module 100 scans a sample, the rotatable device 200 located in the incident light path flips downwards, so that the reflector on the rotatable device 200 does not interfere with the light path. The incident light enters the fast scanning module 100 from the incident light path 401 and then exits. The rotatable device 200 located in the exit light path flips downwards, so that the reflector on the rotatable device 200 does not interfere with the light path, and the exit light directly illuminates the sample surface to scan the sample. When the slow scanning module 300 is used, the flip-up device 200 located in the incident light path flips upward, so that the reflector on the flip-up device 200 enters the light path. The incident light enters the slow scanning module 100 from the incident light path 402 and then exits. The flip-up device 200 located in the exit light path flips upward, so that the reflector on the flip-up device 200 enters the light path. After reflection, the exit light illuminates the sample surface and scans the sample.

[0004] In existing technology, switching scanning modules relies on manually operating the flip-up device 200 to switch the reflector. Furthermore, the optical paths of the fast scanning module 100 and the slow scanning module 300 are significantly different. The incident light path 402 of the slow scanning module 300 passes through one more reflector than the incident light path 401 of the fast scanning module 100, and the outgoing light path of the slow scanning module 300 also passes through one more reflector than the outgoing light path of the fast scanning module 100. Due to the different optical path losses, the optical path of the slow scanning module 300 is more complex. If there are differences in the dual-axis design of the scanning modules, it may be necessary to add more reflectors to correct the optical path, which will further increase the optical path loss and complexity. Summary of the Invention

[0005] To address the problems in existing technologies, this embodiment provides an automatic optical scanning module switching device, an optical scanning system, and a switching method. By combining an electrically controlled displacement device and a dual-axis galvanometer module, different scanning modules can be switched without changing the optical path or introducing more components. The core technical features are the electrically controlled displacement and multi-scanning module switching, which solves the problems of optical path changes and increased optical path loss caused by switching scanning modules.

[0006] On one hand, embodiments of this specification provide an automatic switching device for optical scanning modules, including:

[0007] Fast scanning module, slow scanning module, electric displacement stage, stage and controller;

[0008] The fast scanning module and the slow scanning module are arranged and mounted on the stage along the Z-axis. The incident light path of the fast scanning module and the incident light path of the slow scanning module are both parallel to the incident direction of the incident light, and the line connecting the first optical center point of the fast scanning module and the second optical center point of the slow scanning module is parallel to the Z-axis. The Z-axis is perpendicular to the incident light path and the exit light path of the fast scanning module, or perpendicular to the incident light path and the exit light path of the slow scanning module.

[0009] The stage is mounted on the electric displacement stage;

[0010] The controller is used to select the fast scanning module or slow scanning module corresponding to the scanning requirement as the target scanning module, and control the stage on the electric displacement stage to move along the Z-axis direction according to the predetermined position of the incident light and the current position of the target scanning module, so that the incident light enters the target scanning module and performs raster scanning on the sample surface in the direction of the outgoing light path of the target scanning module.

[0011] Furthermore, it also includes a beam analysis module, which is mounted on the stage;

[0012] The beam analysis module is used to analyze the current position of the incident light;

[0013] The controller is further configured to, after controlling the stage on the electric displacement stage to move along the Z-axis so that the incident light enters the target scanning module, calculate the position change and direction of the incident light based on the current position and the predetermined position, and control the movement of the stage on the electric displacement stage based on the position change and direction of the incident light.

[0014] Furthermore, the optical axis of the beam analysis module is parallel to the X-axis, and the beam analysis module is used to analyze the current position of the incident light on a plane perpendicular to the X-axis, wherein the X-axis is parallel to the incident light path of the fast scanning module or the slow scanning module.

[0015] Furthermore, the controller controlling the movement of the stage on the electric displacement stage according to the positional change of the incident light includes:

[0016] Calculate the position change and direction of change of the current position of the incident light relative to the predetermined position on a plane perpendicular to the X-axis;

[0017] The platform on the electric displacement stage is controlled to move the position change distance according to the direction of change.

[0018] Furthermore, the beam analysis module is also used to analyze the incident direction of the incident light;

[0019] The controller is further configured to calculate the angle between the incident direction of the incident light and the direction of the current incident light axis of the target scanning module, and control the stage on the electric displacement stage to rotate around an axis perpendicular to the X-axis and Z-axis according to the angle.

[0020] Furthermore, the beam analysis module is located between the fast scanning module and the slow scanning module, and the optical axis of the beam analysis module, the incident optical axis of the fast scanning module, and the incident optical axis of the slow scanning module are in the same plane.

[0021] Furthermore, during the process of the controller controlling the stage on the electric displacement stage to move along the Z-axis, the incident light can enter the beam analysis module. The controller is further used to calculate the latest moving distance and latest moving direction of the stage based on the position change of the incident light, the direction of change of the incident light, and the predetermined moving distance and predetermined moving direction of the stage, and control the stage on the electric displacement stage to move according to the latest moving distance and latest moving direction. The predetermined moving distance is the distance the stage moves when the target scanning module is moved to the predetermined position of the incident light, and the predetermined moving direction is the direction the stage moves when the target scanning module is moved to the predetermined position of the incident light.

[0022] On the other hand, embodiments of this specification also provide an optical scanning system, including a light generator, a polarizing beam splitter prism, a detector, and the aforementioned automatic switching device for optical scanning modules;

[0023] The light generator is used to generate a light beam;

[0024] The polarizing beam splitter is located in the optical path of the beam and is used to modulate the beam into a P-polarization state to obtain incident light.

[0025] The optical scanning module automatic switching device is located on the optical path of the incident light. It is used to move the fast scanning module or the slow scanning module to the optical path of the incident light according to the scanning requirements, so that the incident light enters the fast scanning module or the slow scanning module to perform a gridded scan on the sample surface in the direction of the outgoing light path. The reflected light in the S-polarization state, carrying the tissue information of the sample surface, enters the fast scanning module or the slow scanning module along the outgoing light path and is emitted from the incident light path of the fast scanning module or the slow scanning module to the polarization beam splitter. The polarization beam splitter reflects the reflected light to the detection end.

[0026] The detection end is used to image the tissue information of the sample surface based on the reflected light.

[0027] On the other hand, embodiments of this specification also provide an automatic switching method for optical scanning modules, applied to the aforementioned automatic switching device for optical scanning modules, the method comprising:

[0028] Select the fast scanning module or slow scanning module corresponding to the scanning requirements as the target scanning module;

[0029] The stage on the electric displacement stage is controlled to move along the Z-axis according to the predetermined position of the incident light and the current position of the target scanning module, so that the incident light enters the target scanning module and performs raster scanning on the sample surface in the direction of the outgoing light path of the target scanning module. The Z-axis is perpendicular to the incident light path and outgoing light path of the fast scanning module, or perpendicular to the incident light path and outgoing light path of the slow scanning module.

[0030] Finally, embodiments of this specification also provide a computer device, including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the above-described method.

[0031] Compared to methods that use flip mirrors to adjust the optical path and switch functional modules, the automatic switching device for optical scanning modules provided in this specification uses an electric displacement stage to control the entry of the fast or slow scanning module into the optical path. This does not modify the optical path itself, and no other components besides the scanning module being switched are altered, resulting in a more stable and reliable optical path. Furthermore, this specification's embodiment does not require additional mirrors, thus avoiding increased light intensity loss. Attached Figure Description

[0032] To more clearly illustrate the technical solutions in the embodiments or prior art described herein, the accompanying drawings used in the description of the embodiments or prior art will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this article. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0033] Figure 1 This is a schematic diagram of the switching scheme for optical scanning modules in the prior art;

[0034] Figure 2 This is a schematic diagram of the structure of the automatic switching device for the optical scanning module in the embodiments of this specification;

[0035] Figure 3 This is a schematic diagram of the optical scanning system in the embodiments of this specification;

[0036] Figure 4 This is a schematic diagram of the structure of the automatic switching device for the optical scanning module, which includes a beam analysis module, in the embodiments of this specification.

[0037] Figure 5 This is a flowchart illustrating the automatic switching method of the optical scanning module in the embodiments of this specification;

[0038] Figure 6 The diagram shown is a structural schematic of the computer device in an embodiment of this specification.

[0039] [Explanation of Markings in the Attached Images]

[0040] 1. Light generator;

[0041] 2. Polarizing beam splitter prism;

[0042] 3. Detector end;

[0043] 100. Fast scanning module;

[0044] 200. Tilting device;

[0045] 201. Reflector;

[0046] 202. Electric motor;

[0047] 300. Slow scan module;

[0048] 401. Incident light path;

[0049] 402. Incident light path;

[0050] 500. Electric displacement stage;

[0051] 600. Stage;

[0052] 800. Beam Analysis Module;

[0053] 602. Computer equipment;

[0054] 604, Processor;

[0055] 606. Memory;

[0056] 608. Drive mechanism;

[0057] 610. Input / output module;

[0058] 612. Input devices;

[0059] 614. Output devices;

[0060] 616. Presentation equipment;

[0061] 618. Graphical User Interface;

[0062] 620. Network interface;

[0063] 622. Communication link;

[0064] 624. Communication bus. Detailed Implementation

[0065] The technical solutions in the embodiments described below will be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments described herein, and not all of the embodiments. Based on the embodiments described herein, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this document.

[0066] To address the problems existing in the prior art, this specification provides an automatic switching device for optical scanning modules, such as... Figure 2 As shown, it includes: a fast scanning module 100, a slow scanning module 300, an electric displacement stage 500, a loading stage 600, and a controller.

[0067] The fast scanning module 100 and the slow scanning module 300 are arranged and mounted on the stage 600 along the Z-axis. The incident light path of the fast scanning module 100 and the incident light path of the slow scanning module 300 are both parallel to the incident direction of the incident light, and the line connecting the first optical center point of the fast scanning module 100 and the second optical center point of the slow scanning module 300 is parallel to the Z-axis. The Z-axis is perpendicular to the incident light path and the exit light path of the fast scanning module 100, or perpendicular to the incident light path and the exit light path of the slow scanning module 300.

[0068] The stage 600 is mounted on the electric displacement stage 500;

[0069] The controller is used to select the fast scanning module 100 or slow scanning module 300 corresponding to the scanning requirement as the target scanning module, and control the stage 600 on the electric displacement stage 500 to move along the Z-axis direction according to the predetermined position of the incident light and the current position of the target scanning module, so that the incident light enters the target scanning module and performs raster scanning on the sample surface in the direction of the outgoing light path of the target scanning module.

[0070] In the embodiments of this specification, both the fast scanning module 100 and the slow scanning module 300 have two lenses. The first lens is used to receive incident light, and the second lens is used to illuminate the sample surface with outgoing light and receive the reflected light from the sample surface, and then emit the reflected light out from the first lens. Usually, the optical axis (incident optical axis) of the first lens and the optical axis (outgoing optical axis) of the second lens are perpendicular, but there are also some scanning modules where the incident optical axis and the outgoing optical axis are not perpendicular. The automatic switching device of the optical scanning module in the embodiments of this specification is applicable to all of them.

[0071] It should be noted that both the fast scanning module 100 and the slow scanning module 300 are mature optical components in this field, and their scanning principles will not be described in detail here.

[0072] In the embodiments of this specification, the first optical center point is the intersection of the incident optical axis and the outgoing optical axis of the fast scanning module 100, and the second optical center point is the intersection of the incident optical axis and the outgoing optical axis of the slow scanning module 300. The Z-axis is parallel to the line connecting the first optical center point and the second optical center point, and the stage 600 moves along the Z-axis. Therefore, the line connecting the optical axes of the fast scanning module 100 and the slow scanning module 300 is also parallel to the Z-axis movement direction. Therefore, when the position of the incident light remains unchanged, if fast scanning is currently used, that is, the incident optical axis of the fast scanning module 100 corresponds to the position of the incident light, then when it is necessary to switch to slow scanning, it is only necessary to move the stage 600 along the Z-axis direction, and the incident optical axis of the slow scanning module 300 can correspond to the position of the incident light without any offset.

[0073] Therefore, the optical paths of the fast scanning module 100 and the slow scanning module 300 in this embodiment are the same, thereby eliminating the traditional scheme that requires mirrors to adjust the optical path and reducing optical path loss and complexity.

[0074] In the embodiments of this specification, the fast scanning module 100 can be fixed on the stage 600 by bolts. The slow scanning module 300 and the fast scanning module 100 can be connected and fixed by bolts. The threaded hole is machined on the top cover of the outer shell of the lower fast scanning module 100, and the position is located at the center of the optical axis of the two scanning modules to ensure that the optical axis is parallel and aligned in the Z-axis direction after the two scanning modules are connected.

[0075] The electric displacement stage can consist of a stepper motor, a lead screw, and a guide rail, with the stage 600 mounted on the guide rail. The electric displacement stage 500 can communicate with the controller via an RS232 serial port. The controller sends commands to control the operation of the stepper motor in the electric displacement stage 500, which drives the lead screw to rotate, thereby controlling the movement of the stage 600.

[0076] Based on such Figure 2 The optical scanning module automatic switching device shown in this specification also provides an optical scanning system, such as... Figure 3 As shown, it includes a light generator 1, a polarizing beam splitter 2, a detector 3, and as shown in the figure. Figure 2 The optical scanning module automatic switching device shown;

[0077] The light generator 1 is used to generate a light beam;

[0078] The polarizing beam splitter 2 is located in the optical path of the beam and is used to modulate the beam into a P-polarization state to obtain incident light.

[0079] The automatic switching device for the optical scanning module is located on the optical path of the incident light. It is used to move the fast scanning module 100 or the slow scanning module 300 to the optical path of the incident light according to the scanning requirements, so that the incident light enters the fast scanning module 100 or the slow scanning module 300 to perform a raster scan on the sample surface in the direction of the outgoing light path. The reflected light in the S-polarization state, carrying the tissue information of the sample surface, enters the fast scanning module 100 or the slow scanning module 300 along the outgoing light path and is emitted from the incident light path of the fast scanning module 100 or the slow scanning module 300 to the polarization beam splitter 2. The polarization beam splitter 2 reflects the reflected light to the detector end 3.

[0080] The detector 3 is used to image the tissue information of the sample surface based on the reflected light.

[0081] In the embodiments described in this specification, the imaging method of the detector 3 is common knowledge in the art and will not be described in detail here.

[0082] In the embodiments of this specification, when it is necessary to switch scanning modules, the relative positions between the light generator 1 and the automatic switching device for optical scanning modules are known, as are the positions of the slow scanning module 300 and the fast scanning module 100 on the automatic switching device for optical scanning modules. Therefore, the distance required for the scanning module to move to the optical path of the incident light can be calculated based on the current position of any scanning module relative to the automatic switching device for optical scanning modules and the predetermined position of the light generator 1 relative to the automatic switching device for optical scanning modules. Then, the switching of scanning modules can be achieved by controlling the electric displacement stage 500 according to the distance.

[0083] In some other embodiments of this specification, since the position of the light generator 1 may change, its position relative to the automatic switching device of the optical scanning module will also change after the position of the light generator 1 changes. If the movement of the stage 600 is still controlled according to its predetermined position, the incident optical axis of the fast scanning module 100 or the slow scanning module 300 after the movement may not correspond to the position of the incident light, resulting in the incident light not being able to effectively enter the fast scanning module 100 or the slow scanning module 300.

[0084] In response to this situation, the embodiments in this specification use a beam analysis module to calibrate the moving position.

[0085] Specifically, such as Figure 4 As shown, the automated switching device for optical scanning modules also includes a beam analysis module 800, which is mounted on the stage 600.

[0086] The beam analysis module 800 is used to analyze the current position of the incident light;

[0087] The controller is further configured to, after controlling the stage 600 on the electric displacement stage 500 to move along the Z-axis so that the incident light enters the target scanning module, calculate the position change and direction of the incident light based on the current position and the predetermined position, and control the movement of the stage 600 on the electric displacement stage 500 based on the position change and direction of the incident light.

[0088] In the embodiments of this specification, the beam analysis module 800 can be a beam analyzer, which can capture two-dimensional images of the beam through a CCD or CMOS sensor and detect the position, shape, intensity distribution and propagation direction of the beam.

[0089] Furthermore, the optical axis of the beam analysis module 800 is parallel to the X-axis, and the beam analysis module 800 is used to analyze the current position of the incident light on a plane perpendicular to the X-axis, wherein the X-axis is parallel to the incident light path of the fast scanning module 100 or the slow scanning module 300.

[0090] The controller controls the movement of the stage 600 on the electric displacement stage 500 according to the position change of the incident light, including:

[0091] Calculate the position change and direction of change of the current position of the incident light relative to the predetermined position on a plane perpendicular to the X-axis;

[0092] The platform 600 on the electric displacement stage 500 is controlled to move the distance corresponding to the position change in the direction of change.

[0093] In this embodiment, the current position of the incident light is the position of the light generator 1 on a plane perpendicular to the beam emission direction. When this position changes (this does not involve changes in the position of the light generator along the beam emission direction, because changes in the position of the light generator along the beam emission direction only affect the distance between the beam emission point and the scanning module, and do not cause the incident optical axis of the scanning module to be out of sync with the position of the incident light), the controller calculates the position change and direction of the incident light based on the current position and a predetermined position, and controls the movement of the stage 600 on the electric displacement stage 500 based on the position change and direction of the incident light, thereby adjusting the position of the incident optical axis of the scanning module on the plane perpendicular to the beam emission direction. After adjustment, the incident light can accurately enter the scanning module, avoiding the incident light from being unable to enter the scanning module or the effective part of the incident light (e.g., the part whose light intensity does not meet the specified value requirement) from being unable to enter the scanning module, thereby avoiding a decrease in scanning accuracy.

[0094] In some other embodiments of this specification, in addition to changes in position, the direction of the emitted light from the light generator 1 may also change due to accidental touches by operators. This will result in the incident light not entering the scanning module perpendicularly, which will also affect the scanning accuracy.

[0095] In response to this situation, the beam analysis module 800 described in this embodiment of the specification is also used to analyze the incident direction of the incident light;

[0096] The controller is further used to calculate the angle between the incident direction of the incident light and the direction of the current incident light axis of the target scanning module, and control the stage 600 on the electric displacement stage 500 to rotate around an axis perpendicular to the X-axis and Z-axis according to the angle, so that the incident light axis of the scanning module after rotation is parallel to the incident direction of the incident light, and avoids the incident light from entering the scanning module at an angle.

[0097] In this scheme, a rotatable motor can be installed on the electric displacement stage 500, and the stage 600 is mounted on the rotatable motor, thereby rotating the stage 600 so that the scanning module rotates around an axis perpendicular to the X-axis and Z-axis.

[0098] In the embodiments of this specification, if the output optical axis of the fast scanning module 100 and the slow scanning module 300 are perpendicular to the incident optical axis, then the direction of the perpendicular axis of the X-axis and Z-axis ( Figure 4 The Y-axis direction in the X-axis is parallel to the output optical axis direction of the two scanning modules. Conversely, if the output optical axis of the fast scanning module 100 or the slow scanning module 300 is not perpendicular to the incident optical axis, then the direction of the perpendicular axis of the X-axis and Z-axis is not parallel to the output optical axis direction of the two scanning modules.

[0099] If the output optical axis of the fast scanning module 100 and the slow scanning module 300 is perpendicular to the incident optical axis, then when the scanning modules rotate around the axis perpendicular to the X and Z axes (that is, the direction parallel to the incident optical axis), only the direction of the incident optical axis will change, and the direction of the output optical axis will not change. Conversely, if the output optical axis of the fast scanning module 100 or the slow scanning module 300 is not perpendicular to the incident optical axis, then when the scanning modules rotate around the axis perpendicular to the X and Z axes, the directions of both the incident and output optical axes will change. The change in the output optical axis direction affects the illumination position of the output light on the sample surface; in this case, the operator only needs to manually adjust the sample position.

[0100] In some other embodiments of this specification, the optical axis position can also be calibrated in real time during the switching of scanning modules. For example... Figure 4 As shown, at this time, the beam analysis module 800 is located between the fast scanning module 100 and the slow scanning module 300, and the optical axis of the beam analysis module 800, the incident optical axis of the fast scanning module 100 and the incident optical axis of the slow scanning module 300 are in the same plane.

[0101] Therefore, during the process of the controller controlling the stage 600 on the electric displacement stage 500 to move along the Z-axis, the incident light can enter the beam analysis module 800. The controller is further used to calculate the latest moving distance and latest moving direction of the stage based on the position change of the incident light, the direction of change of the incident light, and the predetermined moving distance and predetermined moving direction of the stage, and control the stage 600 on the electric displacement stage 500 to move according to the latest moving distance and latest moving direction. The predetermined moving distance is the distance the stage moves when the target scanning module is moved to the predetermined position of the incident light, and the predetermined moving direction is the direction the stage moves when the target scanning module is moved to the predetermined position of the incident light.

[0102] Based on the same inventive concept, embodiments of this specification also provide a method for automatic switching of optical scanning modules, such as... Figure 5 As shown, the method includes:

[0103] Step 501: Select the fast scanning module or slow scanning module corresponding to the scanning requirements as the target scanning module;

[0104] Step 502: Based on the predetermined position of the incident light and the current position of the target scanning module, control the stage on the electric displacement stage to move along the Z-axis, so that the incident light enters the target scanning module and performs raster scanning on the sample surface in the direction of the outgoing light path of the target scanning module. The Z-axis is perpendicular to the incident light path and outgoing light path of the fast scanning module, or perpendicular to the incident light path and outgoing light path of the slow scanning module.

[0105] like Figure 6 The diagram shown is a structural schematic of a computer device according to an embodiment of this specification. The methods described in this specification can be applied to the computer device of this embodiment.

[0106] Computer device 602 may include one or more processors 604, such as one or more central processing units (CPUs), each of which may implement one or more hardware threads. Computer device 602 may also include any memory 606 for storing information of any kind, such as code, settings, data, etc. Non-limitingly, for example, memory 606 may include any type of RAM, any type of ROM, flash memory, hard disk, optical disk, etc. More generally, any storage resource can be used to store information using any technology.

[0107] Furthermore, any storage resource can provide volatile or non-volatile retention of information.

[0108] Furthermore, any storage resource can represent a fixed or removable component of the computer device 602. In one case, when the processor 604 executes associated instructions stored in any storage resource or combination of storage resources, the computer device 602 can perform any operation of the associated instructions. The computer device 602 also includes one or more drive mechanisms 608 for interacting with any storage resource, such as a hard disk drive system, an optical disk drive system, etc.

[0109] Computer device 602 may also include an input / output module 610 (I / O) for receiving various inputs (via input device 612) and providing various outputs (via output device 614). A specific output mechanism may include a presentation device 616 and an associated graphical user interface (GUI) 618. In other embodiments, the input / output module 610 (I / O), input device 612, and output device 614 may be omitted, and the device may function solely as a computer device within a network. Computer device 602 may also include one or more network interfaces 620 for exchanging data with other devices via one or more communication links 622. One or more communication buses 624 couple the components described above together.

[0110] Communication link 622 can be implemented in any way, such as via a local area network, a wide area network (e.g., the Internet), a point-to-point connection, or any combination thereof. Communication link 622 may include any combination of hardwired links, wireless links, routers, gateway functions, name servers, etc., governed by any protocol or combination of protocols.

[0111] It should be understood that in the various embodiments of this document, the sequence number of each process does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this document.

[0112] It should also be understood that, in the embodiments herein, the term "and / or" is merely a description of the relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following associated objects have an "or" relationship.

[0113] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this document.

[0114] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0115] In the embodiments provided herein, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the couplings or direct couplings or communication connections shown or discussed may be indirect couplings or communication connections through some interfaces, devices, or units, or they may be electrical, mechanical, or other forms of connection.

[0116] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of the embodiments described herein, depending on actual needs.

[0117] Furthermore, the functional units in the various embodiments of this document can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0118] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this paper, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this paper. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0119] This document uses specific embodiments to illustrate the principles and implementation methods of this document. The descriptions of the embodiments above are only for the purpose of helping to understand the methods and core ideas of this document. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this document. Therefore, the content of this specification should not be construed as a limitation of this document.

Claims

1. An automatic switching device for optical scanning modules, characterized in that, include: The fast scanning module (100), the slow scanning module (300), the electric displacement stage (500), the stage (600), and the controller; The fast scanning module (100) and the slow scanning module (300) are arranged and mounted on the stage (600) along the Z-axis. The incident light path of the fast scanning module (100) and the incident light path of the slow scanning module (300) are both parallel to the incident direction of the incident light. The line connecting the first optical center point of the fast scanning module (100) and the second optical center point of the slow scanning module (300) is parallel to the Z-axis. The Z-axis is perpendicular to the incident light path and the exit light path of the fast scanning module (100), or perpendicular to the incident light path and the exit light path of the slow scanning module (300). The stage (600) is mounted on the electric displacement stage (500); The controller is used to select the fast scanning module (100) or slow scanning module (300) corresponding to the scanning requirement as the target scanning module, and control the stage (600) on the electric displacement stage (500) to move along the Z-axis direction according to the predetermined position of the incident light and the current position of the target scanning module, so that the incident light enters the target scanning module and performs raster scanning on the sample surface in the direction of the outgoing light path of the target scanning module. It also includes a beam analysis module (800) mounted on the stage (600); The beam analysis module (800) is used to analyze the current position of the incident light; The controller is further configured to, after controlling the stage (600) on the electric displacement stage (500) to move along the Z-axis so that the incident light enters the target scanning module, calculate the position change and direction of the incident light based on the current position and the predetermined position, and control the movement of the stage (600) on the electric displacement stage (500) based on the position change and direction of the incident light.

2. The automatic switching device for optical scanning modules according to claim 1, characterized in that, The optical axis of the beam analysis module (800) is parallel to the X-axis. The beam analysis module (800) is used to analyze the current position of the incident light on a plane perpendicular to the X-axis. The X-axis is parallel to the incident light path of the fast scanning module (100) or the slow scanning module (300).

3. The automatic switching device for optical scanning modules according to claim 2, characterized in that, The controller controls the movement of the stage (600) on the electric displacement stage (500) according to the position change of the incident light, including: Calculate the position change and direction of change of the current position of the incident light relative to the predetermined position on a plane perpendicular to the X-axis; The stage (600) on the electric displacement stage (500) is controlled to move the position change distance in the direction of change.

4. The automatic switching device for optical scanning modules according to claim 2, characterized in that, The beam analysis module (800) is also used to analyze the incident direction of the incident light; The controller is further configured to calculate the angle between the incident direction of the incident light and the direction of the current incident light axis of the target scanning module, and control the stage (600) on the electric displacement stage (500) to rotate about an axis perpendicular to the X-axis and Z-axis according to the angle.

5. The automatic switching device for optical scanning modules according to claim 2, characterized in that, The beam analysis module (800) is located between the fast scanning module (100) and the slow scanning module (300), and the optical axis of the beam analysis module (800), the incident optical axis of the fast scanning module (100), and the incident optical axis of the slow scanning module (300) are in the same plane.

6. The automatic switching device for optical scanning modules according to claim 5, characterized in that, During the process of the stage (600) on the electric displacement stage (500) being moved along the Z-axis direction by the controller, the incident light can enter the beam analysis module (800). The controller is further used to calculate the latest moving distance and latest moving direction of the stage based on the position change of the incident light, the direction of change of the incident light, and the predetermined moving distance and predetermined moving direction of the stage, and control the stage (600) on the electric displacement stage (500) to move according to the latest moving distance and latest moving direction. The predetermined moving distance is the distance the stage moves when the target scanning module is moved to the predetermined position of the incident light, and the predetermined moving direction is the direction the stage moves when the target scanning module is moved to the predetermined position of the incident light.

7. An optical scanning system, characterized in that, It includes a light generator (1), a polarizing beam splitter (2), a detector (3), and an automatic switching device for optical scanning modules as described in any one of claims 1-6; The light generator (1) is used to generate a light beam; The polarizing beam splitter (2) is located in the optical path of the beam and is used to modulate the beam into a P-polarization state to obtain incident light. The optical scanning module automatic switching device is located on the optical path of the incident light. It is used to move the fast scanning module (100) or the slow scanning module (300) to the optical path of the incident light according to the scanning requirements, so that the incident light enters the fast scanning module (100) or the slow scanning module (300) to perform gridding scanning on the sample surface in the direction of the outgoing light path. The reflected light in the S-polarization state carrying the tissue information of the sample surface enters the fast scanning module (100) or the slow scanning module (300) along the outgoing light path, and is emitted from the incident light path of the fast scanning module (100) or the slow scanning module (300) to the polarization beam splitter (2). The polarization beam splitter (2) reflects the reflected light to the detector end (3). The probe end (3) is used to image the tissue information of the sample surface based on the reflected light.

8. An automatic switching method for optical scanning modules, applied to the automatic switching device for optical scanning modules according to any one of claims 1-6, characterized in that, The method includes: Select the fast scanning module or slow scanning module corresponding to the scanning requirements as the target scanning module; The stage on the electric displacement stage is controlled to move along the Z-axis according to the predetermined position of the incident light and the current position of the target scanning module, so that the incident light enters the target scanning module and performs raster scanning on the sample surface in the direction of the outgoing light path of the target scanning module. The Z-axis is perpendicular to the incident light path and outgoing light path of the fast scanning module, or perpendicular to the incident light path and outgoing light path of the slow scanning module.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory, characterized in that, When the processor executes the computer program, it implements the method of claim 8.

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