Rapid analog simulation method for breakage and falling faults of circuit breaker resistor disc

Abstract

The invention provides a rapid simulation method for breaker resistor disc breakage and falling faults, and relates to the technical field of breaker fault diagnosis, and the method comprises the steps: obtaining the material parameters of a breaker resistor disc, and building a multi-physical field model of the breaker resistor disc through an MIT floating diffusion model; performing coupling simulation calculation on the multi-physical field model of the circuit breaker resistor disc by using a computational fluid mechanics numerical method to obtain a simulation result; according to the material parameters of the circuit breaker resistor disc and a damage criterion defined in the MIT floating diffusion model, performing post-processing on the simulation result to judge the damage condition of the resistor disc; a simulation result is extracted in real time, optimization of a resistor disc material and a geometric structure is carried out on the simulation result according to the damage condition of the resistor disc, and an optimal analog simulation scheme is obtained through multiple simulation iterations; according to the invention, the phenomenon that the resistor disc is damaged and falls in the operation process of the circuit breaker can be accurately simulated, and a scientific basis is provided for the design and fault diagnosis of the circuit breaker.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit breaker fault diagnosis, and in particular to a method for rapid simulation of a circuit breaker resistor breakage and drop fault. Background Art

[0002] During the operation of the circuit breaker equipment, the resistor plays an important role in current diversion and heat distribution. However, due to long-term current load or accumulation of mechanical stress, the resistor may be damaged or fall off, which will affect the normal operation of the circuit breaker and may even cause equipment failure. Therefore, how to accurately simulate the process of resistor damage and falling is of great significance for circuit breaker design and performance evaluation. In the prior art, the electrostatic field analysis of resistor damage usually relies on a simple model, which is a single method and has poor judgment on whether the circuit breaker is discharged. Summary of the invention

[0003] The purpose of the present invention is to provide a method for rapid simulation of a circuit breaker resistor breakage and falling fault, which can accurately simulate the phenomenon of resistor breakage and falling during circuit breaker operation, and provide a scientific basis for circuit breaker design and fault diagnosis.

[0004] The technical solution of the present invention is:

[0005] In a first aspect, the present application provides a method for rapid simulation of a circuit breaker resistor breakage and fall fault, which comprises the following steps:

[0006] S1. Obtaining material parameters of the circuit breaker resistor to establish a multi-physics field model of the circuit breaker resistor through the MIT drift diffusion model;

[0007] S2. Using computational fluid dynamics numerical method to perform coupled simulation calculation on the multi-physics field model of the circuit breaker resistor to obtain simulation results;

[0008] S3, post-processing the simulation results according to the material parameters of the circuit breaker resistor and the damage criterion defined in the MIT drift diffusion model to determine the damage condition of the resistor;

[0009] S4. Extract simulation results in real time, and optimize the resistor material and geometric structure according to the damage condition of the resistor. Get the optimal simulation solution through multiple simulation iterations.

[0010] Furthermore, in step S1, the calculation process of establishing the multi-physics field model of the circuit breaker resistor includes:

[0011] Establish the electric field and charge distribution equations:

[0012]

[0013] Establish the current continuity equation:

[0014]

[0015] Establish the charge conservation equation:

[0016]

[0017] Establish the current density equation:

[0018] J=σE

[0019] Establish the heat transfer equation:

[0020]

[0021] Q=E·J

[0022] In the formula, is the gradient operator, ε is the dielectric constant, E is the electric field, ρ is the net charge density, is the potential, J is the current density, S is the charge generation and recombination source, t is the discharge time, ρ f is the free charge density, ρ b is the bound charge density, σ is the conductivity, J f is the current density corresponding to the free charge, ρ c is the specific heat capacity, T is the heat generated by the dielectric discharge, k is the thermal conductivity, and Q is the Joule heat.

[0023] Furthermore, in step S2, the computational fluid dynamics numerical method includes: finite element analysis, finite difference method, boundary element method and finite volume method.

[0024] Further, in step S3, the post-processing includes: performing breakdown determination according to the simulation results, and performing material determination when it is determined that breakdown occurs;

[0025] The breakdown determination includes determining whether the local electric field exceeds the breakdown electric field of the insulating material. If so, it indicates that a breakdown has occurred; if not, it indicates that no breakdown has occurred.

[0026] The material determination includes analyzing the effect of temperature increase on the material using a thermodynamic model or a thermal expansion model of the material to determine whether the material is damaged.

[0027] Furthermore, in step S3, the above-mentioned damage condition includes the damage condition of the resistor under specific working conditions, the specific location of the damage, and the way it falls.

[0028] In a second aspect, the present application provides an electronic device, including:

[0029] A memory for storing one or more programs;

[0030] processor;

[0031] When the one or more programs are executed by the processor, a method for rapid simulation of a circuit breaker resistor breakage and falling fault as described in any one of the first aspects is implemented.

[0032] In a third aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements a method for rapid simulation of a circuit breaker resistor breakage and falling fault as described in any one of the first aspects above.

[0033] Compared with the prior art, the present invention has at least the following advantages or beneficial effects:

[0034] (1) The present invention provides a method for rapid simulation of a circuit breaker resistor breakage and drop fault. By combining the MIT diffusion model and multi-physics field simulation technology, the method can more comprehensively simulate the working state of the resistor in the circuit breaker, significantly improve the accuracy and reliability of the simulation results, and provide a scientific basis for circuit breaker design and fault diagnosis.

[0035] (2) The present invention can accurately simulate the phenomenon of resistor breakage and falling during circuit breaker operation, comprehensively consider the impact of the interaction of multiple factors such as current, heat, stress, etc. on the performance of the resistor, and effectively predict the resistor breakage and falling process. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0037] Figure 1 A diagram showing the steps of a method for rapid simulation of a circuit breaker resistor breakage and drop fault according to the present invention;

[0038] Figure 2 The figure is a schematic structural block diagram of an electronic device according to an embodiment of the present invention.

[0039] Icon: 101, memory; 102, processor; 103, communication interface. DETAILED DESCRIPTION

[0040] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0041] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0042] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0043] It should be noted that, in this article, the term "comprises" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprises..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0044] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0045] Example 1

[0046] See also Figure 1 , Figure 1 The figure shows a step diagram of a method for rapid simulation of a circuit breaker resistor breakage and falling fault provided in an embodiment of the present application.

[0047] The present application provides a method for rapid simulation of a circuit breaker resistor breakage and fall fault, which comprises the following steps:

[0048] S1. Obtaining material parameters of the circuit breaker resistor to establish a multi-physics field model of the circuit breaker resistor through the MIT drift diffusion model;

[0049] S2. Using computational fluid dynamics numerical method to perform coupled simulation calculation on the multi-physics field model of the circuit breaker resistor to obtain simulation results;

[0050] S3, post-processing the simulation results according to the material parameters of the circuit breaker resistor and the damage criterion defined in the MIT drift diffusion model to determine the damage condition of the resistor;

[0051] S4. Extract simulation results in real time, and optimize the resistor material and geometric structure according to the damage condition of the resistor. Get the optimal simulation solution through multiple simulation iterations.

[0052] Among them, the material parameters of circuit breaker resistor include thermal conductivity, electrical conductivity and thermal expansion coefficient.

[0053] As a preferred implementation, in step S1, the calculation process of establishing the multi-physics field model of the circuit breaker resistor includes:

[0054] Establish the electric field and charge distribution equations:

[0055]

[0056] Establish the current continuity equation:

[0057]

[0058] Establish the charge conservation equation:

[0059]

[0060] Establish the current density equation:

[0061] J=σE

[0062] Establish the heat transfer equation:

[0063]

[0064] Q=E·J

[0065] In the formula, is the gradient operator, ε is the dielectric constant, E is the electric field, ρ is the net charge density, is the potential, J is the current density, S is the charge generation and recombination source, t is the discharge time, ρ f is the free charge density, ρ b is the bound charge density, σ is the conductivity, J f is the current density corresponding to the free charge, ρ c is the specific heat capacity, T is the heat generated by the dielectric discharge, k is the thermal conductivity, and Q is the Joule heat.

[0066] It should be noted that the electric field and charge distribution equations mainly describe the relationship between the electric field and charge density in the insulating medium; the current continuity equation is mainly used to show that the generation, movement, recombination and adsorption of charges satisfy the conservation law; the current density equation mainly indicates the current density generated by the movement of charges; the heat transfer equation mainly describes the temperature change during the discharge process of the medium; combining the above equations, a multi-physical field model of the circuit breaker resistor is established, which describes the temperature distribution, stress distribution and damage process of the resistor under the action of the arc.

[0067] Therefore, by establishing a multi-physics field coupling model of the circuit breaker resistor through the MIT drift diffusion model, the changes in heat, stress, material fatigue, etc. inside the resistor can be simulated, so as to predict its breakage and falling behavior under different working conditions. While ensuring the accuracy of the simulation, the amount of calculation is reduced by simplifying the model, the circuit breaker fault discharge process is effectively simulated, and the consumption of computing resources is reduced through model optimization.

[0068] As a preferred implementation, in step S2, the computational fluid dynamics numerical method includes: finite element analysis, finite difference method, boundary element method and finite volume method.

[0069] It should be noted that when performing simulation calculations, the resistor is also divided into three-dimensional grids to ensure a high grid density in the arc action area and the edge of the resistor. At the same time, the initial temperature of the resistor and the boundary conditions of the arc action, including heat flux density and electric field strength, are set.

[0070] As a preferred implementation, in step S3, post-processing includes: performing breakdown determination according to the simulation results, and performing material determination when breakdown is determined to have occurred;

[0071] The breakdown determination includes determining whether the local electric field exceeds the breakdown electric field of the insulating material. If so, it indicates that a breakdown has occurred; if not, it indicates that no breakdown has occurred.

[0072] Material determination involves analyzing the effect of temperature rise on the material using a thermodynamic model or thermal expansion model of the material to determine whether the material is damaged.

[0073] It should be noted that, in this embodiment, insulation breakdown can be analyzed through AI data based on the fault database, and valuable information can be extracted from historical fault data through artificial intelligence technology to predict and diagnose potential faults of circuit breakers and their insulation systems. Through reasonable data preprocessing, feature engineering, model selection and evaluation, AI can help improve the reliability of circuit breakers, detect potential insulation breakdown problems in advance, reduce failure rates, and optimize maintenance strategies.

[0074] As a preferred implementation, in step S3, the damage condition includes the damage condition of the resistor under specific working conditions, the specific location of the damage, and the way it falls.

[0075] Example 2

[0076] See also Figure 2 , Figure 2 A schematic structural block diagram of an electronic device provided in an embodiment of the present application.

[0077] An electronic device includes a memory 101, a processor 102 and a communication interface 103, wherein the memory 101, the processor 102 and the communication interface 103 are electrically connected to each other directly or indirectly to realize data transmission or interaction. For example, these components can be electrically connected to each other through one or more communication buses or signal lines. The memory 101 can be used to store software programs and modules, and the processor 102 executes various functional applications and data processing by executing the software programs and modules stored in the memory 101. The communication interface 103 can be used to communicate signaling or data with other node devices.

[0078] Among them, the memory 101 can be, but is not limited to, a random access memory (RAM), a read only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable read-only memory (EEPROM), etc.

[0079] The processor 102 may be an integrated circuit chip with signal processing capability. The processor 102 may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0080] It is understood that the structure shown in the figure is only for illustration, and a method for rapid simulation of a circuit breaker resistor chip damage and drop fault may also include more or fewer components than those shown in the figure, or have a different configuration than that shown in the figure. Each component shown in the figure may be implemented by hardware, software or a combination thereof.

[0081] In the embodiments provided in the present application, it should be understood that the disclosed method can also be implemented in other ways. The embodiments described above are merely schematic, for example, the flowchart or block diagram in the accompanying drawings shows the possible implementation architecture, functions and operations of the method and computer program product according to multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of a code, and the module, a program segment or a part of a code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or the flowchart, and the combination of the boxes in the block diagram and / or the flowchart can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0082] In addition, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0083] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0084] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

[0085] It will be apparent to those skilled in the art that the present application is not limited to the details of the exemplary embodiments described above, and that the present application can be implemented in other specific forms without departing from the spirit or essential features of the present application. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the present application is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present application. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

Claims

1. A method for rapid simulation of a circuit breaker resistor breakage and fall fault, characterized in that: The following steps are involved: S1. Obtaining material parameters of the circuit breaker resistor to establish a multi-physics field model of the circuit breaker resistor through the MIT drift diffusion model; S2. Using computational fluid dynamics numerical method to perform coupled simulation calculation on the multi-physics field model of the circuit breaker resistor to obtain simulation results; S3, post-processing the simulation results according to the material parameters of the circuit breaker resistor and the damage criterion defined in the MIT drift diffusion model to determine the damage condition of the resistor; S4. Extract simulation results in real time, and optimize the resistor material and geometric structure according to the damage condition of the resistor. Get the optimal simulation solution through multiple simulation iterations.

2. A method for rapid simulation of a circuit breaker resistor breakage and drop fault as claimed in claim 1, characterized in that: In step S1, the calculation process of establishing the multi-physics field model of the circuit breaker resistor includes: Establish the electric field and charge distribution equations: Establish the current continuity equation: Establish the charge conservation equation: Establish the current density equation: J=σE Establish the heat transfer equation: Q=E·J In the formula, is the gradient operator, ε is the dielectric constant, E is the electric field, ρ is the net charge density, is the potential, J is the current density, S is the charge generation and recombination source, t is the discharge time, ρ f is the free charge density, ρ b is the bound charge density, σ is the conductivity, J f is the current density corresponding to the free charge, ρ c is the specific heat capacity, T is the heat generated by the dielectric discharge, k is the thermal conductivity, and Q is the Joule heat.

3. A method for rapid simulation of a circuit breaker resistor breakage and drop fault as claimed in claim 1, characterized in that: In step S2, the computational fluid dynamics numerical method includes: finite element analysis, finite difference method, boundary element method and finite volume method.

4. A method for rapid simulation of a circuit breaker resistor breakage and drop fault as claimed in claim 1, characterized in that: In step S3, the post-processing includes: performing breakdown determination according to the simulation results, and performing material determination when it is determined that breakdown occurs; Wherein, the breakdown determination includes determining whether the local electric field exceeds the breakdown electric field of the insulating material, if so, it indicates that breakdown has occurred, if not, it indicates that no breakdown has occurred; The material determination includes analyzing the influence of temperature increase on the material using a thermodynamic model or a thermal expansion model of the material to determine whether the material is damaged.

5. A method for rapid simulation of a circuit breaker resistor breakage and drop fault as claimed in claim 1, characterized in that: In step S3, the damage condition includes the damage condition of the resistor under specific working conditions, the specific location of the damage, and the way it falls.

6. An electronic device, characterized in that: include: A memory for storing one or more programs; processor; When the one or more programs are executed by the processor, a method for rapid simulation of a circuit breaker resistor breakage and falling fault as described in any one of claims 1 to 5 is implemented.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, a method for rapid simulation of a circuit breaker resistor breakage and falling fault is implemented as described in any one of claims 1 to 5.

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