High and low temperature test equipment
By using the design of positioning components and conveying robots in high and low temperature testing equipment, the process of introducing the test position of the switch is simplified, and the switch is energized through the rolling contact of the conductive wheel, solving the problems of cumbersome operation and high position requirements in the prior art, and improving the testing efficiency.
Patent Information
- Application Number
- CN202510113649.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-24
- Publication Date
- 2025-05-13
AI Technical Summary
The existing high and low temperature testing equipment is complicated to operate during the switch power-on process, and has high requirements for the switch position, which affects the testing efficiency.
A high and low temperature testing equipment was designed, using positioning components and conveying robots to simplify the process of introducing the test position of the switch. The switch is energized through the rolling contact of the conductive wheel, reducing plug-in operation.
The power-on method with low requirements for the position accuracy of the switch carrier is realized, which simplifies the power-on process, improves the testing efficiency, and reduces the movement complexity of the conveying robot.
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Figure CN119996245A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of detection equipment, and in particular to a high and low temperature testing equipment. Background Art
[0002] During the high and low temperature test of the switch, the switch needs to be powered on. When the switch to be tested reaches the test position, the current test equipment is plugged into the switch through a plug to power on the switch, but the plugging process has high requirements for the position of the switch and the operation process is cumbersome. Summary of the invention
[0003] The present application aims to solve at least one of the technical problems existing in the prior art. To this end, the present application proposes a high and low temperature test device, which can simplify the process of introducing the switch into the test position by cooperating with a conveying manipulator through a positioning component.
[0004] According to the high and low temperature testing equipment of the first aspect embodiment of the present application, the high and low temperature testing equipment includes a test box and a conveying mechanism, the test box is provided with a test chamber, the interior of the test chamber is provided with a conductive wheel, the conductive wheel energizes the switch by rolling contact with the switch carrier; the conveying mechanism includes a conveying manipulator and a positioning component, the positioning component is used to lock the position of the switch carrier, the conveying manipulator is provided with a connecting component, the connecting component is used to match the connecting structure of the switch carrier, and the conveying manipulator drives the connecting component to match different connecting structures of the switch carrier through movement.
[0005] The high and low temperature testing equipment according to the embodiment of the present application has at least the following beneficial effects: the conductive wheel energizes the switch by rolling contact, and there is no need to adopt a plug-in power-on method. The position accuracy requirement for the switch carrier is low, which simplifies the power-on process. After the positioning component locks the position of the switch carrier, the movement of the conveying robot will not affect the switch carrier, which facilitates the replacement of the matching connection structure by the connection component. The conveying robot does not need to push the switch carrier back and forth multiple times, and a single push can guide the switch carrier into the test position.
[0006] According to some embodiments of the present application, the conductive wheel includes a conductive base, a conductive bracket and a conductive wheel body, the conductive base is fixedly arranged in the test chamber, the conductive bracket is hinged to the conductive base, an elastic component is provided between the conductive bracket and the conductive base, and the conductive wheel body is rotatably connected to the conductive bracket to roll in contact with the switch carrier.
[0007] According to some embodiments of the present application, the conductive bracket is provided with a rotating shaft and a metal sleeve sleeved on the rotating shaft, and the conductive wheel body is sleeved on the outer side of the metal sleeve.
[0008] According to some embodiments of the present application, the conveying mechanism includes a conveying support and a conveying platform, and the conveying platform is movably disposed on the conveying support up and down to correspond to the position of the test chamber.
[0009] According to some embodiments of the present application, the conveying robot includes a mobile base and a support arm, the mobile base is movably disposed on the conveying platform, the support arm adjusts its height by moving relative to the mobile base, and the connecting component is disposed on the support arm.
[0010] According to some embodiments of the present application, the connecting component is formed as a connecting column, the connecting structure is formed as a connecting hole, and the connecting column is matched with the connecting hole by being inserted into the connecting hole.
[0011] According to some embodiments of the present application, the conveying platform is provided with a supporting side frame, the supporting side frame is used to support the exchange carrier, and the positioning component is arranged on the supporting side frame.
[0012] According to some embodiments of the present application, the positioning component is formed as a telescopic rod, and the switch carrier is provided with a positioning hole. The telescopic rod can be inserted into the positioning hole by changing its length to lock the position of the switch carrier.
[0013] According to some embodiments of the present application, the conveying mechanism includes a guiding structure, the conveying support is connected to the guiding structure, and the conveying support is capable of moving along the guiding structure.
[0014] According to some embodiments of the present application, the test box is provided with a temperature regulating component, and the temperature regulating component is used to increase the temperature in the test chamber, or reduce the temperature in the test chamber.
[0015] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] The present application is further illustrated below in conjunction with the accompanying drawings and embodiments. It should be noted that the embodiments embodied in the following drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.
[0017] Figure 1 It is a structural schematic diagram of a high and low temperature testing device according to an embodiment of the present application;
[0018] Figure 2 It is a structural schematic diagram of a test box in a high and low temperature test device in an embodiment of the present application;
[0019] Figure 3It is a structural schematic diagram of a test box in a high and low temperature test device in an embodiment of the present application;
[0020] Figure 4 It is a structural schematic diagram of a conductive wheel in a high and low temperature testing device in an embodiment of the present application;
[0021] Figure 5 It is a structural schematic diagram of the conveying mechanism in the high and low temperature testing equipment of the embodiment of the present application;
[0022] Figure 6 It is a front view of the conveying support, conveying platform and conveying manipulator in the high and low temperature testing equipment of the embodiment of the present application;
[0023] Figure 7 It is a structural schematic diagram of a conveying bracket, a conveying platform and a conveying manipulator in the high and low temperature testing equipment of an embodiment of the present application;
[0024] Figure 8 This is the high and low temperature test equipment in the embodiment of the present application. Figure 7 A partial enlarged view of part A.
[0025] Reference numerals:
[0026] Test box 100; test chamber 101; conductive wheel 102;
[0027] Conductive base 201; conductive bracket 202; conductive wheel body 203;
[0028] Conveying mechanism 300; conveying bracket 301; conveying platform 302; supporting side frame 303; positioning component 304; guiding structure 305; synchronous belt 306; moving base 307; supporting arm 308; connecting component 309. DETAILED DESCRIPTION
[0029] The embodiments of the present application are described in detail below in conjunction with the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.
[0030] In the description of the present application, it should be understood that the terms "center", "middle", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, which are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.
[0031] In the description of this application, "several" means more than one, "more" means more than two, "greater than", "less than", "exceed", etc. are understood to exclude the number itself, and "above", "below", "within", etc. are understood to include the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.
[0032] In the description of this application, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example: it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0033] In the description of the present application, if there is a description with reference to the terms "one embodiment", "some embodiments", "an embodiment", "some examples", "some embodiments", "illustrative embodiment", "example", "specific example", "some examples", etc., it means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
[0034] like Figure 1As shown, an embodiment of the present application provides a high and low temperature testing device, which includes a test box 100 and a conveying mechanism 300. Among them, the test box 100 is used to perform high and low temperature tests on the switch, and the conveying mechanism 300 is used to convey the switch to the test position of the test box 100. It can be understood that the switch is placed on a switch carrier, and a single switch carrier can carry several switches. Specifically, the switches in the switch carrier are arranged longitudinally on the switch carrier. When the conveying mechanism 300 conveys the switch carrier to the test position, multiple switches are subjected to high and low temperature tests at the same time, thereby improving the test efficiency.
[0035] It is worth noting that the conveying mechanism 300 includes a conveying robot and a positioning component 304. The conveying robot can only apply force to the switch carrier when it is connected to the switch carrier, thereby completing the conveying process of the switch carrier. However, the installation space of the high and low temperature test equipment is limited, which limits the movement range of the conveying robot, making it difficult for the conveying robot to completely send the switch carrier to the test position during a single movement. The conveying robot needs to frequently change the connection position with the switch carrier, and gradually send the switch carrier to the test position after multiple movements.
[0036] To solve the above problems, the present application uses a positioning component 304 to lock the position of the switch carrier and temporarily release the connection between the conveying robot and the switch carrier, so that the conveying robot can change the connection position with the switch carrier, indirectly increase the stroke length of the conveying robot, and facilitate the conveying robot to send the switch carrier to the test position during a single movement, thereby improving the conveying efficiency.
[0037] In some examples, the test box 100 is provided with a test chamber 101, and it can be understood that the test position is set in the test chamber 101. Specifically, multiple test boxes 100 are arranged in parallel, and each test box 100 has a plurality of test chambers 101 arranged vertically, so the number of test chambers 101 is increased, thereby increasing the number of switches that can be tested by the device.
[0038] In some examples, such as Figure 2 and Figure 3 As shown, the test box 100 is provided with a temperature regulating component, and the temperature regulating component is used to adjust the temperature in the test chamber 101, so as to achieve high and low temperature testing of the switch.
[0039] In some examples, such as Figure 4 As shown, a conductive wheel 102 is disposed inside the test chamber 101 , and the conductive wheel 102 energizes the switch by rolling contact with the switch carrier.
[0040] The conductive wheel 102 is located at a test position in the test chamber 101, and a plurality of conductive wheels 102 are provided. When the switch carrier rolls and contacts each conductive wheel 102, the switch carrier accurately reaches the test position and completes the power-on of the switch.
[0041] Further, the conductive wheel 102 includes a conductive base 201, a conductive bracket 202 and a conductive wheel body 203, wherein the conductive base 201 is fixedly connected to the bottom of the test chamber 101, the conductive bracket 202 is hinged to the conductive base 201, and an elastic component is provided between the conductive bracket 202 and the conductive base 201. Meanwhile, the conductive wheel body 203 is rotatably connected to the conductive bracket 202.
[0042] Specifically, the elastic component drives the conductive bracket 202 to form a certain angle with the conductive base 201 in a natural state, and the conductive wheel body 203 is in a high position at this time. When the switch carrier reaches the top of each conductive wheel 102, the gravity of the switch carrier is applied to the conductive wheel body 203, driving the conductive bracket 202 to rotate relative to the conductive base 201, the height of the conductive wheel body 203 decreases, and the elastic component is in a compressed state. At this time, the conductive wheel body 203 is tightly connected to the switch carrier through the elastic force of the elastic component. When the switch carrier moves out of the test position, the elastic component drives the conductive wheel body 203 to reset to a high position.
[0043] In some examples, the conductive bracket 202 is provided with a rotating shaft, and the conductive wheel body 203 is rotatably connected to the conductive bracket 202 via the rotating shaft.
[0044] Furthermore, the shaft sleeve is provided with a metal sleeve, specifically, the metal sleeve is a copper sleeve, and the conductive wheel body 203 is sleeved on the copper sleeve. The conductive wheel 102 energizes the switch by rolling contact, simplifying the power-on process. At the same time, the conductive wheel 102 has strong high and low temperature resistance, and is adapted to temperature changes in high and low temperature tests.
[0045] In some examples, such as Figure 5 As shown, the conveying mechanism 300 includes a conveying robot and a positioning component 304, and the positioning component 304 is used to lock the position of the switch carrier. At the same time, the conveying robot is provided with a connecting component 309, and the connecting component 309 is used to match the connecting structure of the switch carrier.
[0046] Specifically, the switch carrier is provided with several groups of connection structures. When the switch carrier is directly above the conveying robot, the connection component 309 matches a specific connection structure to ensure the stability of the switch carrier during large-scale movement. However, due to the limitation of the movement range of the conveying robot, the connection component 309 always matches the current connection structure, making it difficult to push the switch carrier to the test position in a single movement. Therefore, the conveying robot needs to frequently match different connection structures, so as to deliver the switch carrier to the position by pushing it in place one by one. In this process, the conveying robot needs to continuously reciprocate, which makes the implementation process complicated and affects the conveying efficiency.
[0047] The conveying mechanism 300 of the present application includes a positioning component 304, and the positioning component 304 is used to lock the position of the switch carrier. When the switch carrier moves significantly, the switch carrier is positioned by the positioning component 304, and there is no need for the connecting component 309 to ensure the stability of the position of the switch carrier. Under the premise that the positioning component 304 locks the position of the switch carrier, the connecting component 309 of the conveying manipulator can be detached from the connecting structure and connected to the outermost connecting structure of the switch carrier. When the switch carrier arrives near the test position, the conveying manipulator has completed the above-mentioned hand-changing action. At this time, the positioning component 304 releases the position lock of the switch carrier, and the conveying manipulator can directly convey the switch carrier to the test position through a single movement, reducing the movement complexity of the conveying manipulator and improving the conveying efficiency.
[0048] In some examples, such as Figure 6 and Figure 7 As shown, the conveying mechanism 300 includes a conveying support 301 and a conveying platform 302 , and the conveying platform 302 is disposed on the conveying support 301 so as to be movable up and down.
[0049] The middle of the conveying bracket 301 is hollowed out, and the conveying platform 302 is located in the middle of the conveying bracket 301. The conveying platform 302 is used to support structures such as conveying robots and positioning components 304. Specifically, two conveying robots are arranged side by side on the top of the conveying platform 302, and each conveying robot is equipped with a positioning component 304.
[0050] Furthermore, the conveying support 301 is provided with a longitudinally extending screw rod, and the conveying platform 302 is provided with a nut component engaged with the screw rod. The screw rod rotates under the action of a corresponding driver, thereby driving the height of the conveying platform 302 to be raised or lowered.
[0051] In addition, two screw rods are provided here, which are respectively located on opposite sides of the conveying platform 302, and jointly drive the conveying platform 302 to adjust the height. Both screw rods are provided with a synchronous belt 306 wheel, and a synchronous belt 306 is provided between the two synchronous belt 306 wheels, so only one screw rod equipped with a driver can complete the synchronous rotation of the two screw rods, ensuring that the conveying platform 302 moves stably.
[0052] It is understandable that the transport platform 302 can be adjusted in height to allow the exchanger carrier to reach the test chambers 101 at different heights.
[0053] In some examples, such as Figure 8 As shown, the conveying robot includes a mobile base 307 and a support arm 308 , and the mobile base 307 is movably disposed on the conveying platform 302 .
[0054] The conveying platform 302 is provided with a screw rod extending horizontally, and the conveying base is provided with a nut component meshed with the screw rod, the screw rod drives the conveying base to move horizontally by rotation, and the conveying base is connected to the support arm 308. During the horizontal movement of the conveying base, the support arm 308 carrying the switch carrier approaches or moves away from the test chamber 101, thereby completing the conveying process of the switch carrier.
[0055] It can be understood that the conveying base and the conveying platform 302 are guided in motion by corresponding guide rails.
[0056] In addition, the support arm 308 adjusts its height by moving relative to the mobile base 307, and the connecting component 309 is arranged on the support arm 308. As the height of the support arm 308 increases, the connecting component 309 gradually approaches and matches the connecting structure of the switch carrier; as the height of the support arm 308 decreases, the connecting component 309 gradually moves away from the connecting structure of the switch carrier, thereby releasing the connection relationship between the two, making it easier for the connecting component 309 to match other connecting structures.
[0057] Specifically, the driver for driving the height adjustment of the support arm 308 can be any structure that outputs linear motion, such as a push rod, and a guide rail extending in the vertical direction is provided between the support arm 308 and the movable base 307 to guide the motion.
[0058] In some examples, the connection component 309 is formed as a connection column, and the connection structure is formed as a connection hole, and the connection column is inserted into the connection hole to match the two.
[0059] Specifically, two connection columns are provided, and each group of connection structures of the switch carrier includes two connection holes.
[0060] In some examples, such as Figure 8As shown, the conveying platform 302 is provided with a supporting side frame 303, and the supporting side frame 303 corresponds to the conveying robot. Specifically, each conveying robot is equipped with two supporting side frames 303, which are located on opposite sides of the conveying robot, and the two supporting side frames 303 are supported on the edge of the switch carrier. When the height of the support arm 308 is raised, the connecting component 309 matches the connecting structure, and the support arm 308 and the two supporting side frames 303 jointly support the switch carrier; when the height of the support arm 308 is lowered, the connecting component 309 is disconnected from the connection, and the switch carrier is only supported by the two supporting side frames 303.
[0061] Specifically, a plurality of rollers arranged at intervals are provided on the supporting side frame 303, and the rollers are rollingly connected to the switch carrier, so as to facilitate the smooth movement of the switch carrier.
[0062] Furthermore, the positioning component 304 is disposed on the supporting side frame 303 . Specifically, the positioning component 304 is located outside the switch carrier, so that the positioning component 304 can lock the position of the switch carrier.
[0063] In some examples, the positioning component 304 is formed as a telescopic rod. Correspondingly, the switch carrier is provided with a positioning hole. The telescopic rod can be inserted into or detached from the positioning hole by changing its length to control the positioning state of the switch carrier.
[0064] It can be understood that when the length of the telescopic rod increases, the telescopic rod is inserted into the positioning hole, thereby locking the position of the switch carrier; when the length of the telescopic rod decreases, the telescopic rod is disengaged from the positioning hole, thereby releasing the position lock of the switch carrier and facilitating the movement of the switch carrier.
[0065] In some examples, the conveying mechanism 300 includes a guide structure 305, which includes guide rails at the top and bottom of the conveying bracket 301. Since the conveying bracket 301 has a certain height, the double guide rails at the top and bottom can prevent the conveying bracket 301 from tilting and other abnormal situations.
[0066] Specifically, the guide rail at the bottom of the conveying bracket 301 is formed as a rack, and the conveying bracket 301 is provided with a gear, and the gear is equipped with a corresponding driver. As the gear rotates, the conveying bracket 301 can move in the horizontal direction. It can be understood that the moving direction of the conveying bracket 301 is perpendicular to the moving direction of the conveying manipulator, and combined with the height adjustment of the conveying base, the conveying mechanism 300 as a whole forms a three-degree-of-freedom conveying process, which can match the position of the test chamber 101 of different positions and different test boxes 100.
[0067] In some examples, the test chamber 101 is provided with a stop structure, and the conveying platform 302 is provided with a corresponding unlocking structure. When the switch carrier reaches the test position, the stop structure can prevent the switch carrier from moving out of the test position by itself, thereby realizing the stop function. When the switch carrier needs to be taken out of the test position, the unlocking structure touches the stop structure to avoid the passage for the switch carrier to move out. After the switch carrier moves out of the test position, the unlocking structure is separated from the stop structure, and the stop structure resets itself.
[0068] In the actual implementation process, the conveying mechanism 300 conveys the switch carrier to the outside of the test chamber 101. During this process, the positioning component 304 locks the position of the switch carrier, which facilitates the movement and height adjustment of the connecting component 309 on the support arm 308, so that the connecting component 309 matches the outermost connection structure. When the switch carrier reaches the outside of the test chamber 101, the support arm 308 can push the switch carrier to the test position through a single movement, simplifying the movement process of the conveying manipulator and improving the conveying efficiency. When the switch carrier reaches the test position, the conductive wheel 102 contacts the switch carrier through rolling connection, thereby energizing the switch, simplifying the electrical connection process, and improving the accuracy and efficiency of the test. The test box 100 can increase or decrease the temperature of the test chamber 101, thereby completing the high and low temperature test of the switch carrier.
[0069] The above is a detailed description of the implementation methods of the present application in conjunction with the accompanying drawings, but the present application is not limited to the above implementation methods. Various changes can be made within the knowledge of ordinary technicians in the technical field without departing from the purpose of the present application. In addition, the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.
Claims
1. A high and low temperature testing device, characterized in that: include: A test box, wherein the test box is provided with a test chamber, wherein a conductive wheel is provided inside the test chamber, and the conductive wheel energizes the switch by rolling contact with the switch carrier; The conveying mechanism includes a conveying robot and a positioning component, the positioning component is used to lock the position of the switch carrier, the conveying robot is provided with a connecting component, the connecting component is used to match the connecting structure of the switch carrier, and the conveying robot drives the connecting component to match the different connecting structures of the switch carrier through movement.
2. The high and low temperature testing equipment according to claim 1, characterized in that: The conductive wheel includes a conductive base, a conductive bracket and a conductive wheel body. The conductive base is fixedly arranged in the test chamber. The conductive bracket is hinged to the conductive base. An elastic component is provided between the conductive bracket and the conductive base. The conductive wheel body is rotatably connected to the conductive bracket to roll in contact with the switch carrier.
3. The high and low temperature testing equipment according to claim 2, characterized in that: The conductive bracket is provided with a rotating shaft and a metal sleeve sleeved on the rotating shaft, and the conductive wheel body is sleeved on the outer side of the metal sleeve.
4. The high and low temperature testing equipment according to claim 1, characterized in that: The conveying mechanism comprises a conveying support and a conveying platform. The conveying platform is movably arranged on the conveying support to correspond to the position of the test chamber.
5. The high and low temperature testing equipment according to claim 4, characterized in that: The conveying robot comprises a movable base and a support arm. The movable base is movably arranged on the conveying platform. The support arm adjusts its height by moving relative to the movable base. The connecting component is arranged on the support arm.
6. The high and low temperature testing equipment according to claim 5, characterized in that: The connecting component is formed as a connecting column, the connecting structure is formed as a connecting hole, and the connecting column is matched with the connecting hole by being inserted into the connecting hole.
7. The high and low temperature testing equipment according to claim 4, characterized in that: The conveying platform is provided with a supporting side frame, and the supporting side frame is used to support the exchange carrier, and the positioning component is arranged on the supporting side frame.
8. The high and low temperature testing equipment according to claim 7, characterized in that: The positioning component is formed as a telescopic rod, and the switch carrier is provided with a positioning hole. The telescopic rod can be inserted into the positioning hole by changing its length to lock the position of the switch carrier.
9. The high and low temperature testing equipment according to claim 4, characterized in that: The conveying mechanism comprises a guide structure, the conveying support is connected to the guide structure, and the conveying support can move along the guide structure.
10. The high and low temperature testing equipment according to claim 1, characterized in that: The test box is provided with a temperature regulating component, and the temperature regulating component is used to increase the temperature in the test chamber or reduce the temperature in the test chamber.
Citation Information
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