Calibration method and device for thermal imaging telescope and thermal imaging telescope

By generating multiple landing points and acquiring thermal imaging images on the launch platform, the target marker points of the thermal imaging telescope are automatically calibrated, solving the problems of low calibration efficiency and accuracy in existing technologies and achieving efficient and accurate calibration results.

CN120020506BActive Publication Date: 2025-11-21ZHEJIANG PIXFRA TECH CO LTD
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Patent Information

Application Number
CN202311550916.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-11-17
Publication Date
2025-11-21
Estimated Expiration
2043-11-17

AI Technical Summary

Technical Problem

The calibration efficiency and accuracy of existing thermal imaging telescopes are low, and manual calibration is usually used, which leads to low efficiency and insufficient accuracy.

Method used

By mounting a thermal imaging telescope on the launch platform, multiple landing points are generated on a preset solid surface using the launched solid projectile, thermal imaging images are acquired, the position offset is determined based on the images, and the target marker points are automatically calibrated, achieving efficient and accurate calibration without the need for additional feature points.

Benefits of technology

This improved the calibration efficiency and accuracy of thermal imaging telescopes, enabling a highly efficient and precise calibration method and reducing errors caused by manual operation.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application relates to a calibration method and device of a thermal imaging telescope and the thermal imaging telescope; the thermal imaging telescope is carried on a launching platform; the calibration method comprises the following steps: instructing the launching platform to launch a solid projectile to a preset entity surface and generating a first landing point; in the case that the thermal imaging telescope is controlled to move to a target mark point of the thermal imaging telescope and aims at a position where the first landing point is located, instructing the launching platform to launch the solid projectile to the preset entity surface based on the target mark point, and generating a second landing point; acquiring thermal imaging images collected by the thermal imaging telescope for the first landing point and the second landing point; based on the thermal imaging images, the position offset between the first landing point and the second landing point is determined, and the target mark point of the thermal imaging telescope is calibrated based on the position offset. Through the application, the problems of low calibration efficiency and precision of the thermal imaging telescope are solved.
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Description

Technical Field

[0001] This application relates to the field of thermal imaging telescope technology, and in particular to calibration methods, apparatus and thermal imaging telescopes. Background Technology

[0002] Thermal imaging telescopes typically have an initial target marker centered on the image. Ignoring other deviations, the actual position of the target marker in the image is the final focal point. However, due to assembly and other reasons, the target marker and the actual focal point may not match. Therefore, it is necessary to manually adjust the target marker to the actual focal point to ensure consistency between the observation point and the focal point. However, in related technologies, thermal imaging telescopes are usually calibrated manually, resulting in low calibration efficiency and accuracy.

[0003] Currently, no effective solution has been proposed to address the low calibration efficiency and accuracy of thermal imaging telescopes in related technologies. Summary of the Invention

[0004] This application provides a calibration method, apparatus, and thermal imaging telescope to at least address the problems of low calibration accuracy and efficiency of thermal imaging telescopes in related technologies.

[0005] In a first aspect, embodiments of this application provide a calibration method for a thermal imaging telescope, the thermal imaging telescope being mounted on a launch platform; the method includes:

[0006] The launch platform is instructed to launch a solid projectile toward a preset solid surface and generate a first impact point;

[0007] When the thermal imaging telescope is moved to a position where the target marker of the thermal imaging telescope coincides with the location of the first landing point, the launch platform is instructed to launch the solid projectile toward the preset solid surface based on the target marker, and a second landing point is generated;

[0008] Acquire thermal imaging images of the first and second impact points captured by the thermal imaging telescope;

[0009] Based on the thermal imaging image, the positional offset between the first impact point and the second impact point is determined, and the target marker point of the thermal imaging telescope is calibrated based on the positional offset.

[0010] In some embodiments, based on the thermal imaging image, determining the positional offset between the first impact point and the second impact point, and calibrating the thermal imaging telescope based on the positional offset, includes:

[0011] Based on the thermal imaging image, first temperature information of the first landing point and second temperature information of the second landing point are obtained;

[0012] Based on the comparison results of the first temperature information and the second temperature information, the low-temperature landing point among the first landing point and the high-temperature landing point among the first landing point and the second landing point are determined;

[0013] The position offset is determined, and the target marker point is moved from the low temperature landing point to the high temperature landing point based on the position offset to obtain the calibration marker point position.

[0014] In some embodiments, determining the position offset and controlling the target marker point to move from the low-temperature landing point to the high-temperature landing point based on the position offset to obtain the calibration marker point position includes:

[0015] Based on the thermal imaging image, the first horizontal position information and the first vertical position information of the low-temperature landing point, as well as the second horizontal position information and the second vertical position information of the high-temperature landing point are obtained.

[0016] The horizontal offset is calculated based on the first horizontal position information and the second horizontal position information, and the vertical offset is determined based on the first vertical position information and the second vertical position information; wherein, the position offset includes the horizontal offset and the vertical offset;

[0017] Based on the horizontal offset, the target marker point is controlled to move horizontally from the low-temperature landing point to the high-temperature landing point, and based on the vertical offset, the target marker point is controlled to move from the low-temperature landing point to the high-temperature landing point, thereby obtaining the position of the calibration marker point.

[0018] In some embodiments, the thermal imaging telescope includes an orientation sensing device; acquiring thermal imaging images of the first impact point and the second impact point captured by the thermal imaging telescope includes:

[0019] The vibration signal detected in real time by the orientation sensing device is acquired.

[0020] If the vibration signal is detected to be less than a preset first signal threshold, the thermal imaging image is acquired.

[0021] In some embodiments, the thermal imaging image includes at least one frame; after acquiring the thermal imaging image, the method further includes:

[0022] If the vibration signal is detected to be less than a preset second signal threshold, a freeze command is generated for the current frame image in the thermal imaging image; wherein the second signal threshold is less than the first signal threshold;

[0023] In response to the freeze command, the current frame image is frozen to obtain a current frozen image, and the current frozen image is sent to the display interface for display.

[0024] In some embodiments, the preset solid surface is a wall or a mound of earth.

[0025] Secondly, embodiments of this application provide a calibration device for a thermal imaging telescope, the thermal imaging telescope being mounted on a launch platform; the device includes: a first launch module, a second launch module, an imaging module, and a calibration module;

[0026] The first launch module is used to instruct the launch platform to launch a solid projectile toward a preset solid surface and generate a first landing point;

[0027] The second launch module is used to, when controlling the thermal imaging telescope to move to a position where the target marker point of the thermal imaging telescope coincides with the location of the first landing point, instruct the launch platform to launch the solid projectile towards the preset solid surface based on the target marker point, and generate a second landing point;

[0028] The imaging module is used to acquire thermal imaging images of the first landing point and the second landing point collected by the thermal imaging telescope.

[0029] The calibration module is used to determine the positional offset between the first landing point and the second landing point based on the thermal imaging image, and to calibrate the target marker point of the thermal imaging telescope based on the positional offset.

[0030] Thirdly, embodiments of this application provide a thermal imaging telescope, which includes a telescope body and a main control device; wherein the telescope body is mounted on a launch platform;

[0031] The main control device is connected to the telescope body and the launch platform, and is used to perform the calibration method of the thermal imaging telescope as described in the first aspect above.

[0032] Fourthly, embodiments of this application provide an electronic device including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the calibration method for a thermal imaging telescope as described in the first aspect above.

[0033] Fifthly, embodiments of this application provide a storage medium storing a computer program that, when executed by a processor, implements the calibration method for a thermal imaging telescope as described in the first aspect above.

[0034] Compared to related technologies, the thermal imaging telescope calibration method, apparatus, and thermal imaging telescope provided in this application embodiment are mounted on a launch platform. The method involves instructing the launch platform to launch a solid projectile towards a preset solid surface and generate a first impact point. While controlling the thermal imaging telescope to move to the location of the first impact point with its target marker, the launch platform is instructed to launch the solid projectile towards the preset solid surface based on the target marker, generating a second impact point. Thermal imaging images of the first and second impact points are acquired by the thermal imaging telescope. Based on these thermal imaging images, the positional offset between the first and second impact points is determined, and the target marker of the thermal imaging telescope is calibrated based on this positional offset. This method solves the problems of low calibration efficiency and accuracy of thermal imaging telescopes, achieving a highly efficient and accurate calibration method for thermal imaging telescopes.

[0035] Details of one or more embodiments of this application are set forth in the following drawings and description to make other features, objects and advantages of this application more readily apparent. Attached Figure Description

[0036] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0037] Figure 1 This is a hardware structure block diagram of a terminal for a calibration method of a thermal imaging telescope according to an embodiment of this application;

[0038] Figure 2 This is a flowchart of a calibration method for a thermal imaging telescope according to an embodiment of this application;

[0039] Figure 3 This is a schematic diagram of a low-temperature landing point and a high-temperature landing point according to an embodiment of this application;

[0040] Figure 4 This is a schematic diagram of a vibration signal according to an embodiment of this application;

[0041] Figure 5 This is a flowchart of an image acquisition triggering method according to an embodiment of this application;

[0042] Figure 6 This is a flowchart of another calibration method for a thermal imaging telescope according to an embodiment of this application;

[0043] Figure 7 This is a structural block diagram of a calibration device for a thermal imaging telescope according to an embodiment of this application. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this application clearer, the application is described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the application. All other embodiments obtained by those skilled in the art based on the embodiments provided in this application without inventive effort are within the scope of protection of this application. Furthermore, it is understood that although the efforts made in such a development process may be complex and lengthy, for those skilled in the art related to the content disclosed in this application, modifications to design, manufacturing, or production based on the technical content disclosed in this application are merely conventional technical means and should not be construed as insufficient disclosure of the content of this application.

[0045] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment that is mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described in this application may be combined with other embodiments without conflict.

[0046] Unless otherwise defined, the technical or scientific terms used in this application shall have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms “a,” “an,” “an,” “the,” and similar words used in this application do not indicate quantity limitation and may indicate singular or plural. The terms “comprising,” “including,” “having,” and any variations thereof used in this application are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or device that includes a series of steps or modules (units) is not limited to the listed steps or units, but may also include steps or units not listed, or may include other steps or units inherent to these processes, methods, products, or devices. The terms “connected,” “linked,” “coupled,” and similar words used in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. “Multiple” used in this application means two or more. “And / or” describes the relationship between related objects, indicating that three relationships may exist; for example, “A and / or B” can represent: A alone, A and B simultaneously, and B alone. The terms “first,” “second,” “third,” etc., used in this application are merely to distinguish similar objects and do not represent a specific ordering of the objects.

[0047] The method embodiments provided in this example can be executed on a terminal, computer, or similar computing device. Taking running on a terminal as an example, Figure 1 This is a hardware structure block diagram of a terminal for a calibration method of a thermal imaging telescope according to an embodiment of this application. For example... Figure 1 As shown, a terminal may include one or more ( Figure 1 Only one is shown in the diagram. A processor 102 (which may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data are also shown. Optionally, the terminal may further include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that... Figure 1 The structure shown is for illustrative purposes only and does not limit the structure of the terminal described above. For example, the terminal may also include components that are more... Figure 1 The more or fewer components shown, or having the same Figure 1 The different configurations shown.

[0048] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to a calibration method for a thermal imaging telescope in this embodiment. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, thus implementing the aforementioned method. The memory 104 may include high-speed random access memory and non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to the terminal via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0049] The transmission device 106 is used to receive or send data via a network. Specific examples of the network described above may include a wireless network provided by the terminal's communication provider. In one example, the transmission device 106 includes a Network Interface Controller (NIC), which can connect to other network devices via a base station to communicate with the Internet. In another example, the transmission device 106 may be a Radio Frequency (RF) module used for wireless communication with the Internet.

[0050] This embodiment provides a calibration method for a thermal imaging telescope mounted on a launch platform. Figure 2 This is a flowchart of a calibration method for a thermal imaging telescope according to an embodiment of this application, such as... Figure 2 As shown, the process includes the following steps:

[0051] Step S210: Instruct the launch platform to launch a solid projectile toward a preset solid surface and generate a first impact point.

[0052] It should be noted that the aforementioned launch platform equipped with a thermal imaging telescope can launch solid projectiles at the target. For example, the solid projectile can be a projectile, and the launch platform can be a projectile launching device. When observing the target using the thermal imaging telescope, the projectile launching device launches the projectile towards the target based on the aiming point of the thermal imaging telescope. The aforementioned pre-defined solid surface refers to any uniform surface with a solid structure deployed near the calibration site of the thermal imaging telescope and facing the field of view of the thermal imaging telescope. For example, the pre-defined solid surface can be a wall or a mound of earth.

[0053] Specifically, before calibrating the thermal imaging telescope, the launch platform first aims at any point on the pre-defined solid surface using the thermal imaging telescope and launches a solid projectile. The solid projectile eventually lands at a certain point on the pre-defined solid surface. Understandably, during the high-speed motion of the solid projectile towards the pre-defined solid surface, factors such as gravity and wind direction will cause it to deviate from its intended trajectory, resulting in a certain distance between the first landing point of the solid projectile on the pre-defined solid surface and the pre-aimed point.

[0054] In step S220, while controlling the thermal imaging telescope to move to the location where the target marker of the thermal imaging telescope is aimed at the first landing point, the launch platform is instructed to launch the solid projectile towards the preset solid surface based on the target marker, and a second landing point is generated.

[0055] The aforementioned target marker point refers to the initial target marker point located at the center of the image on the thermal imaging telescope. Specifically, after launching a solid projectile from the launch platform to any point on the preset solid surface and generating a first landing point through step S210, the launch platform and its mounted thermal imaging telescope can be controlled to move, so that the target marker point of the thermal imaging telescope is aimed at the location of the first landing point. This allows the launch platform to launch a solid projectile again to the location of the first landing point on the preset solid surface. Similarly, due to the influence of factors such as gravity and wind direction, the landing point of the solid projectile on the preset solid surface will not completely coincide with the first landing point. At this time, a second landing point that is a certain distance away from the first landing point can be detected.

[0056] Step S230: Obtain thermal imaging images of the first and second impact points captured by the thermal imaging telescope.

[0057] After the launch platform launches solid projectiles twice at any point on a preset solid surface, the thermal imaging telescope can capture images of the impact points generated by the two launches, thus obtaining the aforementioned thermal imaging images. It should be noted that in related technologies, optical telescopes are typically used to aim at the target object. This necessitates setting specific feature points on the solid surface beforehand during telescope calibration, and then using the optical telescope to acquire images containing these feature points. However, in this embodiment, after the launch platform launches twice and generates two impact points, thermal imaging images containing both impact points are acquired for automatic calibration, avoiding the problem of the optical telescope being unable to observe the impact points when there are no feature points on the preset solid surface. Specifically, after the calibration personnel observe the completion of the two launches, they can manually control the thermal imaging telescope to begin acquiring the aforementioned thermal imaging images through interactive operations such as pressing the acquisition button or inputting acquisition commands. In another embodiment, the program can also automatically trigger an image acquisition command after detecting the completion of the two launches, and the thermal imaging telescope will respond to the detected image acquisition command and begin acquiring images, thereby improving the intelligence level of the adaptive calibration method.

[0058] Step S240: Based on the thermal imaging image, determine the positional offset between the first landing point and the second landing point, and calibrate the target marker point of the thermal imaging telescope based on the positional offset.

[0059] In the second launch of the solid-propellant from the launch platform, the target marker of the thermal imaging telescope is moved to the location of the impact point generated during the first launch, and aiming and launching are performed based on the moved target marker position. Therefore, the positional offset between the two impact points is the actual offset of the target marker of the thermal imaging telescope. In other words, this positional offset can be used as a calibration value for the thermal imaging telescope, thereby achieving adaptive calibration of the target marker of the thermal imaging telescope.

[0060] Through steps S210 to S240, a thermal imaging telescope acquires thermal imaging images containing the impact points of two solid projectiles launched from the launch platform onto a preset solid surface. Based on the positional offset between the two impact points in the thermal imaging images, the target marker points of the thermal imaging telescope are calibrated. By generating an impact point on the solid surface first to create a reference point for the solid surface, the universality of the calibration scheme is increased. There is no need to set additional obvious feature points on the preset solid surface. This method can realize automatic and accurate calibration of the thermal imaging telescope based on the secondary generation of actual impact points and the acquisition of thermal imaging images. This solves the problem of low calibration efficiency and accuracy of thermal imaging telescopes and realizes an efficient and accurate calibration method for thermal imaging telescopes.

[0061] In some embodiments, determining the positional offset between the first impact point and the second impact point based on the thermal imaging image, and calibrating the thermal imaging telescope based on the positional offset, includes the following steps:

[0062] Step S241: Based on the thermal imaging image, obtain the first temperature information of the first landing point and the second temperature information of the second landing point.

[0063] Understandably, the aforementioned thermal imaging telescope acquires images after two launches of solid objects. Furthermore, the high-speed motion of the launched solid objects as they land on the predetermined surface generates heat at the impact points, making these impact points on the surface hotter than other areas. Therefore, for two impact points in the same image frame, their positions must first be determined using the grayscale values ​​in the thermal imaging image to facilitate subsequent calibration processing.

[0064] The first temperature information includes the pixel grayscale value of the first landing point in the thermal imaging image; the second temperature information includes the pixel grayscale value of the second landing point in the thermal imaging image. Specifically, the thermal imaging telescope can acquire consecutive frames of thermal imaging images of the two landing points of a solid projectile launched from the launch platform on a preset solid surface. Based on the pixel grayscale values ​​of each frame of the thermal imaging image, it determines two relatively high-temperature points in each frame, thus obtaining the first and second temperature information. The average temperature information of each frame is then calculated to determine the two landing points in the image. In another embodiment, a single frame can be determined from consecutive frames of thermal imaging images, or a single frame can be acquired by the thermal imaging telescope for the two landing points on the preset solid surface. The two relatively high-temperature points are then determined using the pixel grayscale values ​​in that frame, thereby determining the two landing points.

[0065] Step S242: Based on the comparison result of the first temperature information and the second temperature information, determine the low-temperature landing point of the first landing point and the high-temperature landing point of the second landing point.

[0066] In this embodiment, the thermal imaging telescope acquires thermal images of the same landing point after two launches from the launch platform, with no additional feature points or reference points set on the preset solid surface. To implement the automatic calibration method, it is necessary to distinguish between the two landing points in the thermal imaging image. It is understood that in the above steps, the launch platform launches solid projectiles onto the preset solid surface twice, generating two landing points. There is a time difference between the two landing points, causing the temperature of the second landing point from the second launch to be higher than the temperature of the first landing point from the first launch. Therefore, in this embodiment, the temperature between the two landing points can be compared based on the first and second temperature information to determine the landing point with the lower relative temperature and its position in the thermal imaging image, i.e., the low-temperature landing point, which is the first landing point generated by the first launch of the solid projectile from the launch platform; simultaneously, the landing point with the higher relative temperature and its position in the thermal imaging image, i.e., the high-temperature landing point, which is the second landing point generated by the second launch of the solid projectile from the launch platform, is determined. Thus, the program can adaptively determine the first and second landing points based on the temperature information detected by the thermal imaging image.

[0067] Step S243: Determine the position offset, and based on the position offset, control the target marker to move from the low temperature landing point to the high temperature landing point to obtain the calibration marker position.

[0068] Please see Figure 3 After determining the low-temperature and high-temperature impact points as described above, the positional offset is calculated based on the two impact points in the acquired thermal imaging images. Since the target marker of the thermal imaging telescope is moved to the location of the impact point from the first launch during the second launch, and aiming and launching are based on the moved target marker position, the positional offset between these two impact points is the calibration amount for the thermal imaging telescope. Specifically, during calibration, the initial target marker position of the thermal imaging telescope is adjusted according to the direction from the low-temperature impact point to the high-temperature impact point based on the aforementioned positional offset, resulting in the calibrated target marker position of the thermal imaging telescope, i.e., the aforementioned calibration marker position.

[0069] Through steps S241 to S243, the two landing points and their positions generated before and after the two launches of the launch platform are distinguished by the pixel grayscale values ​​of the thermal imaging image. Then, the precise calibration amount is determined by the positional offset between the two landing points. This eliminates the need for the target marker point of the thermal imaging telescope to have obvious feature points on the preset entity surface, or to re-align the thermal imaging telescope with the feature points after the landing points are generated, thereby effectively improving the calibration accuracy and efficiency of the thermal imaging telescope.

[0070] In some embodiments, determining the position offset and controlling the target marker to move from the low-temperature landing point to the high-temperature landing point based on the position offset to obtain the calibration marker position includes the following steps:

[0071] Based on the thermal imaging image, first horizontal and first vertical position information of the low-temperature landing point, and second horizontal and second vertical position information of the high-temperature landing point are obtained. The horizontal position information refers to the position of the corresponding landing point along the X-axis in the thermal imaging image, and the vertical position information refers to the position of the corresponding landing point along the Y-axis in the thermal imaging image. Please refer to [link to relevant documentation]. Figure 3 The first horizontal and first vertical positions of the low-temperature landing point can be represented as (x1, y1), and the second horizontal and second vertical positions of the high-temperature landing point can be represented as (x2, y2).

[0072] Next, the horizontal offset is calculated based on the first horizontal position information and the second horizontal position information, and the vertical offset is determined based on the first vertical position information and the second vertical position information; wherein, the position offset includes the horizontal offset and the vertical offset. Specifically, with Figure 3 For example, the horizontal offset is Δx = x2 - x1, and the vertical offset is Δy = y2 - y1.

[0073] Then, based on the horizontal offset, the target marker is controlled to move horizontally from the low-temperature landing point to the high-temperature landing point, and based on the vertical offset, the target marker is controlled to move horizontally from the low-temperature landing point to the high-temperature landing point, thus obtaining the position of the calibration marker. The initial position of the target marker is O0(x0, y0). After adjusting the position of the target marker based on the above horizontal and vertical offsets, the obtained calibration marker position is (xt, yt), where xt = x0 + Δx, yt = y0 + Δy.

[0074] Through the above embodiments, the target markers of the thermal imaging telescope are calibrated according to the determined horizontal and vertical offsets, thereby enabling accurate and rapid determination of the adjustment distance of the target markers.

[0075] In some embodiments, the thermal imaging telescope includes an orientation sensing device; acquiring the thermal imaging images of the first and second impact points by the thermal imaging telescope includes the following steps:

[0076] Step S231: Obtain the vibration signal detected in real time by the orientation sensing device.

[0077] The aforementioned orientation sensing device can be installed inside the thermal imaging telescope or mounted on it; this orientation sensing device includes, but is not limited to, various gyroscopes, direction sensors, or other hardware devices used to detect orientation sensing signals. Specifically, after the aforementioned launch platform launches solid projectiles twice, the vibration generated by the launch platform can be detected in real time by the aforementioned orientation sensing device, i.e., the aforementioned vibration signal is obtained. For example, please refer to... Figure 4 Where the horizontal axis represents the time when the orientation sensor collects the signal, and the vertical axis represents the detected vibration offset distance, then... Figure 4 The signal in question is the series of vibration signals acquired in real time as described above.

[0078] Step S232: If the vibration signal is detected to be less than a preset first signal threshold, acquire the thermal imaging image.

[0079] The aforementioned first signal threshold can be preset and stored by calibration personnel based on actual conditions. When the detected vibration signal at the current moment is less than the first signal threshold, it indicates that the vibration of the launch platform has essentially ended, and the launch platform and its onboard thermal imaging telescope have stabilized again, with the image no longer jittering. Therefore, an image acquisition command can be automatically triggered, and the thermal imaging telescope will adaptively acquire the thermal imaging image in response to this command. Figure 4 For example, if the amplitude of the vibration signal collected at 97ms is less than the first signal threshold, then this moment is the trigger point for automatic image acquisition, and the thermal imaging telescope automatically acquires the thermal imaging image at this moment.

[0080] Through steps S231 to S232, the vibration signal detected in real time by the orientation sensing device adaptively triggers the image acquisition action, thereby eliminating the need for manual operation by calibration personnel. This effectively reduces the image offset error caused by manual operation, thereby reducing the calibration error of the thermal imaging telescope and further improving the calibration efficiency and accuracy of the thermal imaging telescope.

[0081] The embodiments of this application will be described in detail below with reference to practical application scenarios. Figure 5 This is a flowchart of an image acquisition triggering method according to an embodiment of this application, such as... Figure 5 As shown, the process includes the following steps:

[0082] Step S501: Start the automatic triggering of the detection process; collect the vibration signal of the launching platform through the above-mentioned orientation sensing device.

[0083] Step S502: Detect whether the current vibration signal is less than the first signal threshold. If the result is negative, return to step S501 above, and continue to have the orientation sensing device collect vibration signals in real time.

[0084] Step S503: If the judgment result of step S502 is yes, then the acquisition of thermal imaging images is automatically triggered; the automatic trigger detection process ends.

[0085] In some embodiments, the thermal imaging image includes at least one frame; after acquiring the thermal imaging image, the calibration method for the thermal imaging telescope further includes the following steps:

[0086] Step S251: If the vibration signal is detected to be less than a preset second signal threshold, a freeze command is generated for the current frame image in the thermal imaging image; wherein the second signal threshold is less than the first signal threshold.

[0087] The aforementioned second signal threshold can be preset and stored by calibration personnel based on actual conditions. It should be noted that, to avoid a certain distance shift in the launch platform and its onboard thermal imaging telescope after two generated landing points, leading to significant calibration errors in the thermal imaging telescope, in this embodiment, after the thermal imaging telescope continuously acquires multiple frames of thermal imaging images, when the vibration signal at the current moment is detected to gradually weaken to below the second signal threshold, it indicates that the stability of the launch platform at this time is better than the stability of the launch platform when image acquisition was triggered. Therefore, the current frame of thermal imaging image acquired by the thermal imaging telescope can be frozen, i.e., the aforementioned freeze command is automatically generated. In another embodiment, the value of the aforementioned second signal threshold can be set to the same value as the aforementioned first signal threshold, i.e., simultaneously triggering image acquisition and image freeze commands.

[0088] Step S252: In response to the freeze command, perform image freeze processing on the current frame image to obtain the current frozen image, and send the current frozen image to the display interface for display.

[0089] It is understandable that after freezing the thermal imaging image of the current frame based on the above-mentioned freeze command and displaying it on the display interface, the launch platform and its onboard thermal imaging telescope can move, thus eliminating the need to keep the launch platform and thermal imaging telescope in the same position after generating the landing point. This simplifies the calibration operation and avoids calibration errors.

[0090] Through steps S251 to S252, after the vibration of the launch platform is detected to be basically over, the current frame image is automatically frozen and displayed on the display interface. Therefore, it is not necessary to keep the direction of the thermal imaging telescope unchanged after the launch platform on which the thermal imaging telescope is mounted generates the landing point. This avoids the problems that are extremely difficult to achieve in actual operation and are prone to introducing deviations caused by the need to continuously maintain the direction of the thermal imaging telescope. At the same time, it also avoids the problem that the thermal imaging telescope and its launch platform will have a large actual offset after moving a certain distance, resulting in a large error in the calibration data. Thus, it effectively improves the simplicity and accuracy of thermal imaging telescope calibration.

[0091] The following section provides a detailed explanation of this application in conjunction with practical application scenarios. Figure 6 This is a flowchart of another calibration method for a thermal imaging telescope according to an embodiment of this application, such as... Figure 6 As shown, the process includes the following steps:

[0092] Step S601: Start the process; launch a solid projectile from the launch platform toward a preset solid surface, generating a landing point on the preset solid surface.

[0093] In step S602, the target marker of the thermal imaging telescope is aligned with the landing point, and the launch platform is triggered again to generate the landing point.

[0094] Step S603: Determine whether the vibration of the launch platform has ended. If not, continue with the determination.

[0095] Step S604: If the judgment result of step S603 is yes, then freeze the thermal imaging image of the current frame.

[0096] Step S605: Based on the thermal imaging image, calculate the calibration value of the target marker point of the thermal imaging telescope, adjust the position of the target marker point, and end the process.

[0097] It should be noted that the steps shown in the above process or in the flowchart of the accompanying figures can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases the steps shown or described may be executed in a different order than that shown here.

[0098] This embodiment also provides a calibration device for a thermal imaging telescope, which is used to implement the above embodiments and preferred embodiments, and will not be repeated as already described. As used below, the terms "module," "unit," "subunit," etc., can refer to a combination of software and / or hardware that performs a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0099] Figure 7 This is a structural block diagram of a calibration device for a thermal imaging telescope according to an embodiment of this application, as shown below. Figure 7 As shown, the device includes: a first launch module 72, a second launch module 74, an imaging module 76, and a calibration module 78; the first launch module 72 is used to instruct the launch platform to launch a solid projectile toward a preset solid surface and generate a first impact point; the second launch module 74 is used to instruct the launch platform to launch the solid projectile toward the preset solid surface based on the target marker point, and generate a second impact point, when the thermal imaging telescope is moved to the position where the target marker point of the thermal imaging telescope is aimed at the first impact point; the imaging module 76 is used to acquire thermal imaging images of the first impact point and the second impact point captured by the thermal imaging telescope; the calibration module 78 is used to determine the positional offset between the first impact point and the second impact point based on the thermal imaging images, and to calibrate the target marker point of the thermal imaging telescope based on the positional offset.

[0100] Through the above embodiments, the imaging module 76 acquires thermal imaging images containing the landing points formed by two solid projectiles launched from the launch platform onto a preset solid surface via a thermal imaging telescope. The calibration module 78 calibrates the target marker point of the thermal imaging telescope based on the positional offset between the two landing points in the thermal imaging image. By generating a landing point on the solid surface first to create a reference point for the solid surface, the universality of the calibration scheme is increased. It is not necessary to set additional obvious feature points on the preset solid surface. It can achieve adaptive and accurate calibration of the thermal imaging telescope based on the secondary generation of the actual landing point and the acquisition of thermal imaging images. This solves the problem of low calibration efficiency and accuracy of thermal imaging telescopes and realizes a high-efficiency and accurate calibration device for thermal imaging telescopes.

[0101] It should be noted that the above modules can be functional modules or program modules, and can be implemented through software or hardware. For modules implemented through hardware, the above modules can reside in the same processor; or the above modules can be located in different processors in any combination.

[0102] This embodiment also provides a thermal imaging telescope, which includes a thermal imaging body and a main control device; wherein the telescope body is mounted on a launch platform. The main control device, connected to the telescope body and the launch platform, is used to execute the steps described in any of the above method embodiments. The main control device includes, but is not limited to, various microcontrollers, main control chips, computers, or servers, and other hardware devices used to control the calibration process of the thermal imaging telescope. The main control device can be installed on the telescope body or the launch platform, or it can be installed independently and communicate with the telescope body and the launch platform.

[0103] In some embodiments, the thermal imaging telescope further includes an orientation sensing device. The main control device is also used to acquire vibration signals detected in real time by the orientation sensing device; when the main control device detects that the vibration signal is less than a preset first signal threshold, it acquires the thermal imaging image. The orientation sensing device can be mounted on the telescope body.

[0104] In some embodiments, the aforementioned thermal imaging telescope further includes a display terminal. The main control device is further configured to generate a freeze command for the current frame image in the thermal imaging image when the detected vibration signal is less than a preset second signal threshold; wherein the second signal threshold range is within the range of the first signal threshold; the main control device, in response to the freeze command, performs image freezing processing on the current frame image to obtain a currently frozen image, and sends the currently frozen image to the display interface of the display terminal for display. The display terminal can be mounted on the telescope body.

[0105] This embodiment also provides an electronic device, including a memory and a processor, wherein the memory stores a computer program and the processor is configured to run the computer program to perform the steps in any of the above method embodiments.

[0106] Optionally, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor and the input / output device is connected to the processor.

[0107] Optionally, in this embodiment, the processor can be configured to perform the following steps via a computer program:

[0108] S1 instructs the launch platform to launch a solid projectile toward a preset solid surface and generate the first impact point.

[0109] S2, while controlling the thermal imaging telescope to move to the location where the target marker of the thermal imaging telescope is aimed at the first landing point, instructing the launch platform to launch a second landing point generated by a solid generator towards the preset solid surface based on the target marker.

[0110] S3, based on the thermal imaging images of the first and second impact points acquired by the thermal imaging telescope.

[0111] S4. Based on the thermal imaging image, determine the positional offset between the first landing point and the second landing point, and calibrate the target marker point of the thermal imaging telescope based on the positional offset.

[0112] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementations, and will not be repeated here.

[0113] Furthermore, in conjunction with the calibration methods for thermal imaging telescopes described in the above embodiments, this application embodiment can provide a storage medium for implementation. This storage medium stores a computer program; when executed by a processor, the computer program implements any of the calibration methods for thermal imaging telescopes described in the above embodiments.

[0114] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0115] Those skilled in the art should understand that the technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments have been described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0116] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A calibration method for a thermal imaging telescope, characterized in that, The thermal imaging telescope is mounted on a launch platform; the method includes: The launch platform is instructed to launch a solid projectile toward a preset solid surface and generate a first impact point; When the thermal imaging telescope is moved to the location where the target marker point of the thermal imaging telescope is aimed at the first impact point, the launch platform is instructed to launch the solid projectile towards the preset solid surface based on the target marker point, and generate a second impact point; Acquire thermal imaging images of the first and second impact points captured by the thermal imaging telescope; Based on the thermal imaging image, the positional offset between the first impact point and the second impact point is determined, and the target marker point of the thermal imaging telescope is calibrated based on the positional offset.

2. The calibration method according to claim 1, characterized in that, Based on the thermal imaging image, determining the positional offset between the first impact point and the second impact point, and calibrating the thermal imaging telescope based on the positional offset, includes: Based on the thermal imaging image, first temperature information of the first landing point and second temperature information of the second landing point are obtained; Based on the comparison results of the first temperature information and the second temperature information, the low-temperature landing point among the first landing point and the high-temperature landing point among the first landing point and the second landing point are determined; The position offset is determined, and the target marker point is moved from the low temperature landing point to the high temperature landing point based on the position offset to obtain the calibration marker point position.

3. The calibration method according to claim 2, characterized in that, The step of determining the position offset and controlling the target marker point to move from the low-temperature landing point to the high-temperature landing point based on the position offset to obtain the calibration marker point position includes: Based on the thermal imaging image, the first horizontal position information and the first vertical position information of the low-temperature landing point, as well as the second horizontal position information and the second vertical position information of the high-temperature landing point are obtained. The horizontal offset is calculated based on the first horizontal position information and the second horizontal position information, and the vertical offset is determined based on the first vertical position information and the second vertical position information; wherein, the position offset includes the horizontal offset and the vertical offset; Based on the horizontal offset, the target marker point is controlled to move horizontally from the low-temperature landing point to the high-temperature landing point, and based on the vertical offset, the target marker point is controlled to move from the low-temperature landing point to the high-temperature landing point, thereby obtaining the position of the calibration marker point.

4. The calibration method according to claim 1, characterized in that, The thermal imaging telescope includes an orientation sensing device; acquiring thermal imaging images of the first impact point and the second impact point captured by the thermal imaging telescope includes: The vibration signal detected in real time by the orientation sensing device is acquired. If the vibration signal is detected to be less than a preset first signal threshold, the thermal imaging image is acquired.

5. The calibration method according to claim 4, characterized in that, The thermal imaging image includes at least one frame; after acquiring the thermal imaging image, the method further includes: If the vibration signal is detected to be less than a preset second signal threshold, a freeze command is generated for the current frame image in the thermal imaging image; wherein the second signal threshold is less than the first signal threshold; In response to the freeze command, the current frame image is frozen to obtain a current frozen image, and the current frozen image is sent to the display interface for display.

6. The calibration method according to any one of claims 1 to 5, characterized in that, The preset solid surface is a wall or a mound of earth.

7. A calibration device for a thermal imaging telescope, characterized in that, The thermal imaging telescope is mounted on a launch platform; the device includes: a first launch module, a second launch module, an imaging module, and a calibration module; The first launch module is used to instruct the launch platform to launch a solid projectile toward a preset solid surface and generate a first landing point; The second launch module is used to, when controlling the thermal imaging telescope to move to the location where the target marker of the thermal imaging telescope is aimed at the first landing point, instruct the launch platform to launch the solid projectile towards the preset solid surface based on the target marker point, and generate a second landing point; The imaging module is used to acquire thermal imaging images of the first landing point and the second landing point collected by the thermal imaging telescope. The calibration module is used to determine the positional offset between the first landing point and the second landing point based on the thermal imaging image, and to calibrate the target marker point of the thermal imaging telescope based on the positional offset.

8. A thermal imaging telescope, characterized in that, The thermal imaging telescope includes a telescope body and a main control device; wherein the telescope body is mounted on a launch platform; The main control device is connected to the telescope body and the launch platform, and is used to perform the calibration method of the thermal imaging telescope as described in any one of claims 1 to 6.

9. An electronic device comprising a memory and a processor, characterized in that, The memory stores a computer program, and the processor is configured to run the computer program to perform the calibration method for the thermal imaging telescope according to any one of claims 1 to 6.

10. A storage medium, characterized in that, The storage medium stores a computer program, wherein the computer program is configured to execute the calibration method of the thermal imaging telescope according to any one of claims 1 to 6 when it is run.

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