Cleaning equipment data analysis method for sapphire processing

Abstract

The invention discloses a cleaning equipment data analysis method for sapphire processing, and relates to the technical field of cleaning equipment data analysis, and the method comprises the steps: obtaining a sapphire picture before cleaning by a cleaning agent, and carrying out the dirty state evaluation of the sapphire before cleaning according to the sapphire picture before cleaning by the cleaning agent, and according to the evaluation result of the dirty state of the sapphire before cleaning, the spraying amount of the cleaning agent and the optimal temperature during spraying of the cleaning agent are determined, a picture of the sapphire cleaned by the cleaning agent is obtained, and the dirty state of the cleaned sapphire is evaluated according to the picture of the cleaned sapphire. Analyzing whether the sapphire achieves an expected cleaning effect or not according to the dirty state of the sapphire before and after cleaning; the spraying amount and temperature of the cleaning agent of the cleaning equipment are optimized according to the dirty state, the sapphire cleaning efficiency is improved by controlling the cleaning equipment, and standardization of cleaning steps in the sapphire machining process is achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of cleaning equipment data analysis, and in particular to a cleaning equipment data analysis method for sapphire processing. Background Art

[0002] Sapphire processing cleaning equipment is usually used to remove surface contaminants such as abrasives, grease, dust and other residues after sapphire cutting, polishing or other processing; Regarding the analysis of the amount and temperature of cleaning agents for cleaning equipment in the related art, it is impossible to first analyze the turbidity based on the sapphire picture, and then optimize the spraying amount and temperature of the cleaning agent for the cleaning equipment based on the turbidity status of the sapphire. As a result, it is impossible to analyze whether the sapphire has achieved the expected cleaning effect based on the turbidity status of the sapphire before and after cleaning, resulting in low cleaning efficiency during sapphire processing. No effective solution has been proposed yet. In summary, there is currently a lack of a data analysis method for cleaning equipment for sapphire processing. Summary of the invention

[0003] The main purpose of the present invention is to provide a data analysis method for cleaning equipment used in sapphire processing. The present invention analyzes whether the sapphire has achieved the expected cleaning effect according to the contamination state of the sapphire before and after cleaning. The present invention can accurately control the contamination state of the sapphire by analyzing the sapphire before and after cleaning, and optimize the spraying amount and temperature of the cleaning agent of the cleaning equipment according to the contamination state. The cleaning efficiency of the sapphire is improved by controlling the cleaning equipment, and the standardization of the cleaning steps in the sapphire processing process is achieved.

[0004] To achieve the above purpose, according to one aspect of the present application, the following technical solution is provided: A method for analyzing cleaning equipment data for sapphire processing, the method comprising: S1. Obtain a picture of the sapphire before cleaning with a detergent, and evaluate the contamination state of the sapphire before cleaning based on the picture of the sapphire before cleaning with the detergent; S2. Determine the amount of cleaning agent to be sprayed and the optimal temperature for spraying the cleaning agent according to the evaluation result of the sapphire contamination state before cleaning; S3, obtaining a picture of the sapphire after cleaning with a cleaning agent, and evaluating the contamination state of the cleaned sapphire according to the picture of the cleaned sapphire; S4. Analyze whether the sapphire has achieved the expected cleaning effect based on the dirtiness of the sapphire before and after cleaning.

[0005] Optionally, S1 includes the following specific steps: S101. Obtain a picture of the sapphire before cleaning with the cleaning agent, separate the dirty areas before cleaning according to the picture of the sapphire before cleaning with the cleaning agent, and extract the dirty adsorption data and spot data before cleaning according to the dirty areas before cleaning. The dirty adsorption data includes the dirty type and the dirty adsorption degree, and the spot data before cleaning includes the spot area before cleaning, the spot interval before cleaning, and the spot chromaticity before cleaning; S102. Obtain the comprehensive dirtiness of the sapphire before cleaning according to the dirty adsorption data and spot data before cleaning. The comprehensive dirtiness of the sapphire before cleaning is obtained through a comprehensive dirtiness calculation formula. The comprehensive dirtiness calculation formula is: ; where, is the dirtiness of the sapphire before cleaning, is the total number of spots, is the area of the i-th spot in the j-th dirty area, is the spot area hazard value, is the interval between the i-th spot in the j-th dirty area and the spot closest to it, is the spot interval hazard value, is the brightness value of the i-th spot in the j-th dirty area, is the standard brightness value of the sapphire, is the dirty adsorption degree of the j-th dirty area.

[0006] Optionally, the S2 includes the following specific steps: S201. Obtain the spraying amount of the cleaning agent according to the comprehensive dirtiness of the sapphire before cleaning. The spraying amount of the cleaning agent is obtained through a spraying amount calculation formula. The spraying amount calculation formula is: ; where, is the spraying amount of the cleaning agent, is the cleaning ratio constant, is the dirtiness influence coefficient, , is the logarithmic function with base 10; S202. Obtain the optimal temperature when spraying the cleaning agent according to the dirty type.

[0007] Optionally, the S3 includes the following specific steps: S301. Obtain a picture of the sapphire after cleaning with the cleaning agent, separate the dirty areas after cleaning according to the picture of the sapphire after cleaning with the cleaning agent, and extract the dirty adsorption data and spot data after cleaning according to the dirty areas after cleaning. The dirty adsorption data after cleaning includes the dirty type and the dirty adsorption degree, and the spot data after cleaning includes the spot area after cleaning, the spot interval after cleaning, and the spot chromaticity after cleaning; S302, obtaining the comprehensive contamination degree of the sapphire after cleaning according to the contamination adsorption data and the spot data after cleaning.

[0008] Optionally, S4 includes the following specific steps: S401. The cleaning efficiency of the cleaning device is obtained according to the comprehensive turbidity of the sapphire before cleaning and the comprehensive turbidity of the sapphire after cleaning. The cleaning efficiency is obtained by a cleaning efficiency calculation formula, which is: ;in, For the cleaning efficiency of sapphire, It is the comprehensive turbidity of the sapphire after cleaning; S402, comparing the cleaning efficiency with the preset cleaning efficiency. If the cleaning efficiency is greater than or equal to the preset cleaning efficiency, it is determined that the sapphire has achieved the expected cleaning effect. If the cleaning efficiency is less than the preset cleaning efficiency, it is determined that the sapphire has not achieved the expected cleaning effect.

[0009] To achieve the above-mentioned purpose, according to another aspect of the present application, a cleaning equipment data analysis system for sapphire processing is provided, which is used to implement a cleaning equipment data analysis method for sapphire processing, including a control module, an image processing module, a contamination assessment module, a detergent dosage analysis module, a cleaning equipment temperature analysis module and a cleaning effect judgment module; Optionally, the control module is used to control the operation of the image processing module, the contamination assessment module, the detergent dosage analysis module, the cleaning equipment temperature analysis module and the cleaning effect judgment module; The image processing module is used to obtain a sapphire image, separate the dirty area according to the sapphire image, and extract the dirt adsorption data and spot data according to the dirty area, the dirt adsorption data includes the dirt type and the dirt adsorption degree, and the spot data includes the spot area, the spot interval and the spot chromaticity; The contamination assessment module is used to obtain the contamination degree of the sapphire according to the contamination adsorption data and the spot data; The cleaning agent dosage analysis module is used to obtain the cleaning agent spray dosage according to the comprehensive turbidity of the sapphire before cleaning; The cleaning equipment temperature analysis module is used to obtain the optimal temperature when the cleaning agent is sprayed according to the type of dirt; The cleaning effect judgment module is used to obtain the cleaning efficiency of the cleaning equipment according to the comprehensive turbidity of the sapphire before cleaning and the comprehensive turbidity of the sapphire after cleaning, and compare the cleaning efficiency with the preset cleaning efficiency. If the cleaning efficiency is greater than or equal to the preset cleaning efficiency, it is judged that the sapphire has achieved the expected cleaning effect. If the cleaning efficiency is less than the preset cleaning efficiency, it is judged that the sapphire has not achieved the expected cleaning effect.

[0010] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the storage medium is used to store a program, wherein the program executes any one of the above-mentioned methods for analyzing cleaning equipment data for sapphire processing.

[0011] According to another aspect of the present invention, there is also provided an electronic device, comprising one or more processors and a memory, wherein the memory is used to store one or more programs, wherein when the one or more programs are executed by the one or more processors, the one or more processors implement any one of the above-mentioned methods for analyzing cleaning equipment data for sapphire processing.

[0012] The present invention adopts the following steps: obtaining a picture of the sapphire before cleaning with a detergent, evaluating the contamination state of the sapphire before cleaning according to the picture of the sapphire before cleaning with the detergent, determining the amount of detergent to be sprayed and the optimal temperature when the detergent is sprayed according to the evaluation result of the contamination state of the sapphire before cleaning, obtaining a picture of the sapphire after cleaning with a detergent, evaluating the contamination state of the sapphire after cleaning according to the picture of the sapphire after cleaning, and analyzing whether the sapphire achieves the expected cleaning effect according to the contamination state of the sapphire before and after cleaning; the present invention can achieve precise control of the contamination state of the sapphire by analyzing the sapphire before and after cleaning, optimize the spraying amount and temperature of the detergent of the cleaning equipment according to the contamination state, improve the cleaning efficiency of the sapphire by controlling the cleaning equipment, and achieve standardization of the cleaning steps in the sapphire processing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings: Figure 1 This is a flow chart of a data analysis method for cleaning equipment used in sapphire processing according to the present invention; Figure 2 This is a schematic diagram of the overall framework of a cleaning equipment data analysis system for sapphire processing according to the present invention; Figure 3 The figure is a schematic diagram of an electronic device according to the present invention. DETAILED DESCRIPTION

[0014] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments may be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0015] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work should fall within the scope of protection of the present invention.

[0016] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so as to describe the embodiments of the present invention described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0017] The present invention is described below in conjunction with preferred implementation steps. Figure 1 is a flow chart of a method for analyzing data of a cleaning device for sapphire processing according to an embodiment of the present invention. Figure 1 As shown, the method comprises the following steps: It comprises the following specific steps: S1. Obtain a picture of the sapphire before cleaning with a detergent, and evaluate the contamination state of the sapphire before cleaning based on the picture of the sapphire before cleaning with the detergent; In this embodiment, S1 includes the following specific steps: S101, obtaining a sapphire image before cleaning with a detergent, separating the dirty area before cleaning according to the sapphire image before cleaning with a detergent, and extracting dirt adsorption data and spot data before cleaning according to the dirty area before cleaning, wherein the dirt adsorption data includes dirt type and dirt adsorption degree, and the spot data before cleaning includes spot area before cleaning, spot interval before cleaning, and spot chromaticity before cleaning; During the specific implementation, a suitable light source is adjusted, a photographic device is used to take a picture of the sapphire, the sapphire image is segmented, the dirty area containing spots is separated, and the dirt type of the dirty area is identified, so as to facilitate determining a suitable temperature according to the thermal stability of the dirt type. For example, if the dirt type is grease, dust, metal oxide, organic residue, etc., the suitable temperature for removing grease and organic residue is 60°C-100°C, the suitable temperature for removing dust and particulate matter is the standard temperature of the cleaning agent or cleaning equipment at room temperature, and the suitable temperature for removing metal oxides and other inorganic dirt is 150°C-200°C; The dirt type of the dirty area is identified by screening the sapphire pictures of different dirt types during historical cleaning, and by importing the historical sapphire pictures and the dirty areas of the sapphire pictures obtained in this embodiment into the image processing software for similarity identification, and the dirt type with the highest similarity is taken as the dirt type of the sapphire; Use image processing software to measure the area of ​​the spots, measure the distance between the center points of two adjacent spots, use the color selection tool to sample the spot area, obtain the RGB value of the spot and convert it into a chromaticity value, identify the characteristic points or lines on the sapphire surface through image processing software, select a series of characteristic points for least squares fitting, obtain a reference plane, calculate the vertical distance from each characteristic point to the reference plane, obtain quantitative data of flatness, calculate the average deviation to evaluate the flatness of the whole or part of the area, use three-dimensional imaging technology to estimate the thickness or volume of the contaminant based on the flatness, and determine the degree of contamination adsorption by analyzing the adsorption amount per unit area.

[0018] S102, obtaining the comprehensive turbidity of the sapphire before cleaning according to the turbidity adsorption data and spot data before cleaning, and the comprehensive turbidity of the sapphire before cleaning is obtained by a comprehensive turbidity calculation formula, which is: ;in, To remove the dirt from the sapphire before cleaning, is the total number of spots, is the area of ​​the i-th spot in the j-th dirty area, is the spot area risk value, is the distance between the ith spot in the jth dirty area and its nearest spot, is the spot interval risk value, is the brightness value of the i-th spot in the j-th dirty area, is the standard brightness value of sapphire, is the pollution adsorption degree of the jth pollution area. The pollution area represents the specific degree of pollution adsorption through the pollution adsorption degree, so the pollution adsorption degree is dimensionless. In this embodiment, the pollution degree of sapphire is calculated through the pollution adsorption degree, spot area, spot interval and spot chromaticity. When the spot area of ​​sapphire is larger, the spot interval is closer, the brightness value in the spot chromaticity is lower and the pollution adsorption degree is higher, the comprehensive pollution degree of the sapphire is higher.

[0019] During the specific implementation, the spot data and cleaning process data of the historical sapphire are obtained, the cleaned sapphire is divided into two categories: clean and uncleaned, the chromaticity corresponding to the cleaned sapphire is obtained, the average brightness value in the chromaticity is taken as the standard brightness value of the sapphire, the original spot area and original spot interval corresponding to the uncleaned area of ​​the uncleaned sapphire are obtained, the minimum value in the original spot area is screened as the spot area hidden danger value, and the maximum value in the original spot interval is screened as the spot interval hidden danger value.

[0020] S2. Determine the amount of cleaning agent to be sprayed and the optimal temperature for spraying the cleaning agent according to the evaluation result of the sapphire contamination state before cleaning; In this embodiment, S2 includes the following specific steps: S201. Obtain the amount of cleaning agent to be sprayed according to the comprehensive turbidity of the sapphire before cleaning. The amount of cleaning agent to be sprayed is obtained by a spraying amount calculation formula. The spraying amount calculation formula is: ;in, The amount of cleaning agent to be sprayed. is the cleaning proportional constant, which is usually related to the properties of the cleaning agent and the characteristics of the cleaning spray equipment. is the turbidity influence coefficient, The turbidity influence coefficient reflects the influence of turbidity on the spraying amount. The higher the turbidity, the more cleaning amount is required. is a logarithmic function with base 10; In the specific implementation, sapphire samples with different turbidity are screened and divided into several turbidity intervals. Different amounts of detergent are sprayed on the sapphire samples in each turbidity interval. The optimal detergent spraying amount corresponding to each turbidity interval is determined according to the cleaning effect, and the optimal cleaning proportion constant and turbidity influence coefficient are analyzed.

[0021] S202: Obtain the optimal temperature for spraying the detergent according to the type of dirt.

[0022] During the specific implementation, sapphire samples are screened, different temperatures are configured for sapphire samples with the same turbidity, the optimal temperature corresponding to each turbidity is determined according to the cleaning effect, and the value of the temperature conversion coefficient is analyzed; the cleaning agent spraying amount and temperature set in the initial state of the cleaning equipment are obtained as the standard cleaning agent spraying amount and standard temperature of the cleaning equipment during cleaning.

[0023] S3, obtaining a picture of the sapphire after cleaning with a cleaning agent, and evaluating the contamination state of the cleaned sapphire according to the picture of the cleaned sapphire; In this embodiment, S3 includes the following specific steps: S301, obtaining a sapphire image after cleaning with a detergent, separating the cleaned dirty area according to the sapphire image after cleaning with a detergent, and extracting the cleaned dirt adsorption data and spot data according to the cleaned dirty area, wherein the cleaned dirt adsorption data includes the dirt type and the dirt adsorption degree, and the cleaned spot data includes the cleaned spot area, the cleaned spot interval and the cleaned spot chromaticity; S302, obtaining the comprehensive contamination degree of the sapphire after cleaning according to the contamination adsorption data and the spot data after cleaning.

[0024] S4. Analyze whether the sapphire has achieved the expected cleaning effect based on the dirtiness of the sapphire before and after cleaning.

[0025] In this embodiment, S4 includes the following specific steps: S401. The cleaning efficiency of the cleaning equipment is obtained according to the comprehensive turbidity of the sapphire before cleaning and the comprehensive turbidity of the sapphire after cleaning. The cleaning efficiency is obtained by a cleaning efficiency calculation formula. The cleaning efficiency calculation formula is: ;in, For the cleaning efficiency of sapphire, It is the comprehensive turbidity of the sapphire after cleaning; S402, comparing the cleaning efficiency with the preset cleaning efficiency. If the cleaning efficiency is greater than or equal to the preset cleaning efficiency, it is determined that the sapphire has achieved the expected cleaning effect. If the cleaning efficiency is less than the preset cleaning efficiency, it is determined that the sapphire has not achieved the expected cleaning effect.

[0026] During specific implementation, the preset cleaning efficiency is set according to the cleaning requirements before cleaning.

[0027] This embodiment can achieve precise control of the contamination state of sapphire by analyzing sapphire before and after cleaning, and optimize the spraying amount and temperature of the cleaning agent of the cleaning equipment according to the contamination state. By controlling the cleaning equipment, the cleaning efficiency of sapphire is improved, and the standardization of the cleaning steps in the sapphire processing process is achieved.

[0028] Figure 2 FIG. 1 is a schematic diagram of the overall framework of a cleaning equipment data analysis system for sapphire processing provided according to an embodiment of the present invention. Figure 2 As shown, a cleaning equipment data analysis system for sapphire processing is used to implement a cleaning equipment data analysis method for sapphire processing, including a control module, an image processing module, a contamination assessment module, a detergent dosage analysis module, a cleaning equipment temperature analysis module and a cleaning effect judgment module; In this embodiment, the control module is used to control the operation of the image processing module, the contamination assessment module, the detergent usage analysis module, the cleaning equipment temperature analysis module and the cleaning effect judgment module; The image processing module is used to obtain a sapphire image, separate the dirty area according to the sapphire image, and extract the dirt adsorption data and spot data according to the dirty area. The dirt adsorption data includes the dirt type and the dirt adsorption degree, and the spot data includes the spot area, the spot interval and the spot chromaticity. The contamination evaluation module is used to obtain the comprehensive contamination degree of sapphire according to the contamination adsorption data and spot data; The cleaning agent dosage analysis module is used to obtain the cleaning agent spray dosage according to the comprehensive contamination degree of the sapphire before cleaning; The cleaning equipment temperature analysis module is used to obtain the optimal temperature when spraying the detergent according to the type of dirt; The cleaning effect judgment module is used to obtain the cleaning efficiency of the cleaning equipment according to the comprehensive turbidity of the sapphire before cleaning and the comprehensive turbidity of the sapphire after cleaning, and compare the cleaning efficiency with the preset cleaning efficiency. If the cleaning efficiency is greater than or equal to the preset cleaning efficiency, it is judged that the sapphire has achieved the expected cleaning effect. If the cleaning efficiency is less than the preset cleaning efficiency, it is judged that the sapphire has not achieved the expected cleaning effect.

[0029] An embodiment of the present invention provides a computer-readable storage medium having a program stored thereon, and when the program is executed by a processor, the above-mentioned cleaning equipment data analysis method for sapphire processing is implemented.

[0030] An embodiment of the present invention provides a processor, which is used to run a program, wherein the program executes the above-mentioned cleaning equipment data analysis method for sapphire processing when it is running.

[0031] Figure 3 is a schematic diagram of an electronic device provided according to an embodiment of the present invention, such as Figure 3 As shown, an embodiment of the present invention provides an electronic device, the device includes a processor, a memory, and a program stored in the memory and executable on the processor, and the processor implements the following steps when executing the program: Obtain a picture of the sapphire before cleaning with a detergent, evaluate the contamination state of the sapphire before cleaning based on the picture of the sapphire before cleaning, determine the amount of detergent to be sprayed and the optimal temperature for spraying the detergent based on the evaluation result of the contamination state of the sapphire before cleaning, obtain a picture of the sapphire after cleaning with a detergent, evaluate the contamination state of the sapphire after cleaning based on the picture of the sapphire after cleaning, and analyze whether the sapphire has achieved the expected cleaning effect based on the contamination state of the sapphire before and after cleaning.

[0032] Those skilled in the art should understand that the embodiments of the present invention may provide methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0033] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems) and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram and the combination of the processes and / or blocks in the flowchart and / or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0034] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0035] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0036] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0037] The memory may include non-permanent memory in a computer-readable medium, in the form of random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory is an example of a computer-readable medium.

[0038] Computer-readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. The information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device.

[0039] It should also be noted that the terms "comprises", "includes" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, product or apparatus that includes a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, product or apparatus. In the absence of further restrictions, the elements defined by the sentence "comprises one..." do not exclude the presence of other identical elements in the process, method, product or apparatus that includes the elements.

[0040] The above are merely embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and changes. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of the claims of the present invention.

Claims

1. A cleaning equipment data analysis method for sapphire processing, characterized in that: The specific steps include: S1. Obtain a picture of the sapphire before cleaning with a detergent, and evaluate the contamination state of the sapphire before cleaning based on the picture of the sapphire before cleaning with the detergent; S2. Determine the amount of cleaning agent to be sprayed and the optimal temperature for spraying the cleaning agent according to the evaluation result of the sapphire contamination state before cleaning; S3, obtaining a picture of the sapphire after cleaning with a cleaning agent, and evaluating the contamination state of the cleaned sapphire according to the picture of the cleaned sapphire; S4. Analyze whether the sapphire has achieved the expected cleaning effect based on the dirtiness of the sapphire before and after cleaning.

2. A cleaning equipment data analysis method for sapphire processing as claimed in claim 1, characterized in that: The S1 comprises the following specific steps: S101, obtaining a sapphire image before cleaning with a detergent, separating a dirty area before cleaning according to the sapphire image before cleaning with a detergent, and extracting dirt adsorption data and spot data before cleaning according to the dirty area before cleaning, wherein the dirt adsorption data includes a dirt type and a dirt adsorption degree, and the spot data before cleaning includes a spot area before cleaning, a spot interval before cleaning, and a spot chromaticity before cleaning; S102, obtaining the comprehensive turbidity of the sapphire before cleaning according to the turbidity adsorption data and spot data before cleaning, wherein the comprehensive turbidity of the sapphire before cleaning is obtained by a comprehensive turbidity calculation formula, which is: ;in, To remove the dirt from the sapphire before cleaning, is the total number of spots, is the area of ​​the i-th spot in the j-th dirty area, is the spot area risk value, is the distance between the ith spot in the jth dirty area and its nearest spot, is the spot interval risk value, is the brightness value of the i-th spot in the j-th dirty area, is the standard brightness value of sapphire, is the pollution adsorption degree of the jth pollution area.

3. A cleaning equipment data analysis method for sapphire processing as claimed in claim 2, characterized in that: The S2 comprises the following specific steps: S201. Obtain the amount of detergent to be sprayed according to the comprehensive turbidity of the sapphire before cleaning. The amount of detergent to be sprayed is obtained by a spraying amount calculation formula, which is: ;in, The amount of cleaning agent to be sprayed. is the cleaning proportional constant, is the turbidity influence coefficient, , is a logarithmic function with base 10; S202: Obtain the optimal temperature for spraying the detergent according to the type of dirt.

4. A cleaning equipment data analysis method for sapphire processing as claimed in claim 3, characterized in that: The S3 includes the following specific steps: S301, obtaining a sapphire image after cleaning with a detergent, separating the cleaned dirty area according to the sapphire image after cleaning with a detergent, and extracting the cleaned dirt adsorption data and spot data according to the cleaned dirty area, wherein the cleaned dirt adsorption data includes the dirt type and the dirt adsorption degree, and the cleaned spot data includes the cleaned spot area, the cleaned spot interval and the cleaned spot chromaticity; S302, obtaining the comprehensive contamination degree of the sapphire after cleaning according to the contamination adsorption data and the spot data after cleaning.

5. A cleaning equipment data analysis method for sapphire processing as claimed in claim 4, characterized in that: The S4 comprises the following specific steps: S401. The cleaning efficiency of the cleaning device is obtained according to the comprehensive turbidity of the sapphire before cleaning and the comprehensive turbidity of the sapphire after cleaning. The cleaning efficiency is obtained by a cleaning efficiency calculation formula, which is: ;in, For the cleaning efficiency of sapphire, It is the comprehensive turbidity of the sapphire after cleaning; S402, comparing the cleaning efficiency with the preset cleaning efficiency. If the cleaning efficiency is greater than or equal to the preset cleaning efficiency, it is determined that the sapphire has achieved the expected cleaning effect. If the cleaning efficiency is less than the preset cleaning efficiency, it is determined that the sapphire has not achieved the expected cleaning effect.

6. A cleaning equipment data analysis system for sapphire processing, used to implement a cleaning equipment data analysis method for sapphire processing as claimed in any one of claims 1 to 5, characterized in that: It includes a control module, an image processing module, a contamination assessment module, a detergent dosage analysis module, a cleaning equipment temperature analysis module and a cleaning effect judgment module; The control module is used to control the operation of the image processing module, the contamination assessment module, the detergent dosage analysis module, the cleaning equipment temperature analysis module and the cleaning effect judgment module; The image processing module is used to obtain a sapphire image, separate a dirty area according to the sapphire image, and extract spot data according to the dirty area, wherein the spot data includes spot area, spot interval and spot chromaticity; The contamination assessment module is used to obtain the contamination degree of the sapphire according to the spot area, spot interval and spot chromaticity; The cleaning agent dosage analysis module is used to obtain the cleaning agent spray dosage according to the turbidity of the sapphire before cleaning; The cleaning equipment temperature analysis module is used to obtain the optimal temperature when the cleaning agent is sprayed according to the amount of cleaning agent sprayed; The cleaning effect judgment module is used to obtain the cleaning efficiency of the cleaning equipment according to the turbidity of the sapphire before cleaning and the turbidity of the sapphire after cleaning, and compare the cleaning efficiency with the preset cleaning efficiency. If the cleaning efficiency is greater than or equal to the preset cleaning efficiency, it is judged that the sapphire has achieved the expected cleaning effect. If the cleaning efficiency is less than the preset cleaning efficiency, it is judged that the sapphire has not achieved the expected cleaning effect.

7. A computer-readable storage medium, characterized in that: The storage medium is used to store a program, wherein the program executes a cleaning equipment data analysis method for sapphire processing as described in any one of claims 1 to 5.

8. An electronic device, characterized in that: It includes one or more processors and a memory, wherein the memory is used to store one or more programs, wherein when the one or more programs are executed by the one or more processors, the one or more processors implement a cleaning equipment data analysis method for sapphire processing as described in any one of claims 1 to 5.

Images