Single-photon detector performance testing methods and apparatus

Abstract

This application relates to a method and apparatus for testing the performance of a single-photon detector. The method includes: selecting a target performance testing system from candidate performance testing systems based on the performance type of the detector under test; wherein the detector under test is a single-photon detector; placing the detector under test in the target performance testing system to construct a testing environment for the detector under test; applying a preset optical signal to the detector under test placed in the testing environment according to the performance testing requirements of the detector under test, and acquiring pulse detection information generated during the detection of the preset optical signal by the detector under test; and determining the test result of the detector under test's performance based on the pulse detection information. This method can reduce the testing cost in the single-photon detector performance testing process and ensure the stability of the testing process and the accuracy of the test results.

Description

Technical Field

[0001] This application relates to the field of detector technology, and in particular to a method and apparatus for testing the performance of a single-photon detector. Background Technology

[0002] A single-photon detector is a highly sensitive detector capable of detecting only a single photon even under extremely weak light signals. It plays a crucial role in encryption and decryption in quantum communication, providing physical guarantees for absolute information security; furthermore, it facilitates the precise manipulation and measurement of qubits in quantum computing, driving a revolutionary leap in computing power. Therefore, testing the performance of single-photon detectors is a necessary process.

[0003] Currently, there is no unified standard for testing single-photon detectors. Two main, simplified testing methods exist: using a single-photon source as the light source and using a multi-stage attenuation method. However, the single-photon source method is costly, and the multi-stage attenuation method may be affected by environmental factors over long-term use, leading to changes in attenuation levels, which can affect the stability and accuracy of the test. Summary of the Invention

[0004] Therefore, it is necessary to provide a method and apparatus for testing the performance of single-photon detectors to address the aforementioned technical problems. This method and apparatus can reduce the testing cost during the single-photon detector performance testing process and ensure the stability of the testing process and the accuracy of the test results.

[0005] Firstly, this application provides a method for testing the performance of a single-photon detector, including:

[0006] Based on the performance type of the detector under test, a target performance test system corresponding to the performance under test is selected from the candidate performance test systems; wherein, the detector under test is a single-photon detector;

[0007] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0008] According to the performance test requirements of the test target, a preset light signal is applied to the detector under test placed in the test environment, and pulse detection information generated by the detector under test during the detection of the preset light signal is acquired.

[0009] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0010] In one embodiment, selecting the target performance test system corresponding to the performance under test from the candidate performance test systems based on the performance type of the detector under test includes:

[0011] If the performance type of the detector under test is time delay performance, then the time delay test system is taken as the target performance system.

[0012] If the performance type of the detector under test is floodlight performance, then the floodlight performance test system is taken as the target performance system.

[0013] If the performance type of the detector under test is focusing performance, then the focusing performance test system will be used as the target performance system.

[0014] In one embodiment, the time delay testing system includes: a waveform generator, an active pulse light source, a digital delay unit, an optical fiber delay line, an optical system, a reflector, and a focusing optical element;

[0015] The output of the waveform generator is connected to the input of the digital delay unit; the output of the digital delay unit is connected to the input of the active pulse light source; the output of the active pulse light source is connected to one end of the fiber delay line; the other end of the fiber delay line is connected to the input of the optical system; the reflector is placed in a first preset orientation with respect to the output of the optical system; a focusing optical element is placed vertically above the reflector.

[0016] Placing the detector under test in the target performance testing system includes:

[0017] The detector under test is placed vertically above the focusing optical element.

[0018] In one embodiment, when the target performance system is the time delay test system, applying a preset optical signal to the target performance test system, which includes the detector under test, according to the performance test requirements of the performance under test includes:

[0019] According to the performance test requirements of the performance to be tested, the first delay parameter of the digital delay unit and the second delay parameter of the optical fiber delay line are configured;

[0020] According to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset light signal after passing through a configured digital delay unit. The preset light signal then passes through the configured fiber delay line and the optical system in sequence, is reflected by the mirror, reaches the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0021] Accordingly, determining the test result of the performance of the detector under test based on the pulse detection information includes:

[0022] Based on the pulse arrival time, the first delay parameter, and the second delay parameter in the pulse detection information, the test result of the performance of the detector under test is determined.

[0023] In one embodiment, the floodlight performance testing system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineered diffuser;

[0024] The output of the waveform generator is connected to the input of the pulse light source; an attenuator is placed between the output of the pulse light source and the input of the collimator; the reflector is placed at a second preset orientation with respect to the output of the collimator; an engineering scattering sheet is placed vertically above the reflector.

[0025] Accordingly, placing the detector under test in the target performance testing system includes:

[0026] The detector under test is placed vertically above the engineering scattering sheet.

[0027] In one embodiment, when the target performance testing system is a floodlight performance testing system, the step of applying a preset optical signal to the target performance testing system, which includes the detector under test, according to the performance testing requirements of the performance under test, and acquiring pulse detection information generated by the detector under test during the detection of the preset optical signal, includes:

[0028] According to the performance test requirements of the test object, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the collimator in sequence, is reflected by the mirror and reaches the engineering scattering sheet, and is scattered by the engineering scattering sheet and reaches the detector under test.

[0029] In one embodiment, the pulse detection information includes intensity information and time information of the output signal of each pixel;

[0030] The step of determining the test result of the performance of the detector under test based on the pulse detection information includes:

[0031] Based on the intensity and time information of each pixel, determine the maximum deviation of each pixel;

[0032] The test results of the detector under test are determined based on the maximum deviation, intensity information and time information of each pixel.

[0033] In one embodiment, the focusing performance testing system includes: a waveform generator, a pulse light source, an attenuator, a beam expander, a mirror, and focusing optical elements;

[0034] The output of the waveform generator is connected to the input of the pulse light source; an attenuator is placed between the output of the pulse light source and the input of the beam expander; the reflector is placed at a third preset position relative to the output of the beam expander; a focusing optical element is placed vertically above the reflector.

[0035] Accordingly, placing the detector under test in the target performance testing system includes:

[0036] The detector under test is placed vertically above the engineering scattering sheet.

[0037] In one embodiment, when the target performance testing system is a focusing performance testing system, applying a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test includes:

[0038] According to the performance test requirements of the test performance, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test;

[0039] Accordingly, the pulse detection information includes the output signal of each pixel, and the step of determining the test result of the performance of the detector under test based on the pulse detection information includes:

[0040] For each pixel, crosstalk information of the pixel is determined based on the output signal of the pixel and the output signals of the neighboring pixels of the pixel.

[0041] Based on the crosstalk information of each pixel, the test results of the performance of the detector under test are determined.

[0042] Secondly, this application also provides a single-photon detector performance testing device, comprising:

[0043] The system selection module is used to select a target performance test system corresponding to the performance under test from the candidate performance test systems based on the performance type of the detector under test; wherein the detector under test is a single-photon detector;

[0044] An environment setup module is used to place the detector under test in the target performance testing system to construct a test environment for the detector under test.

[0045] The information acquisition module is used to apply a preset light signal to the detector under test placed in the test environment according to the performance test requirements of the performance under test, and to acquire the pulse detection information generated by the detector under test during the detection of the preset light signal.

[0046] The performance testing module is used to determine the test results of the performance of the detector under test based on the pulse detection information.

[0047] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0048] Based on the performance type of the detector under test, a target performance test system corresponding to the performance under test is selected from the candidate performance test systems; wherein, the detector under test is a single-photon detector;

[0049] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0050] According to the performance test requirements of the test target, a preset light signal is applied to the detector under test placed in the test environment, and pulse detection information generated by the detector under test during the detection of the preset light signal is acquired.

[0051] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0052] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, performs the following steps:

[0053] Based on the performance type of the detector under test, a target performance test system corresponding to the performance under test is selected from the candidate performance test systems; wherein, the detector under test is a single-photon detector;

[0054] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0055] According to the performance test requirements of the test target, a preset light signal is applied to the detector under test placed in the test environment, and pulse detection information generated by the detector under test during the detection of the preset light signal is acquired.

[0056] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0057] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, performs the following steps: wherein the detector under test is a single-photon detector;

[0058] Based on the performance type of the detector under test, select the target performance test system corresponding to the performance under test from the candidate performance test systems;

[0059] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0060] According to the performance test requirements of the test target, a preset light signal is applied to the detector under test placed in the test environment, and pulse detection information generated by the detector under test during the detection of the preset light signal is acquired.

[0061] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0062] The aforementioned single-photon detector performance testing method and apparatus, by constructing multiple candidate performance testing systems and selecting a target performance testing system corresponding to the performance to be tested from among the candidate systems according to the performance type of the detector under test, ensures the adaptability and accuracy of the determined target performance testing system. Furthermore, the detector under test is placed in the target performance testing system to construct a test environment for the detector under test, and a preset optical signal is applied to the detector under test placed in the test environment according to the performance testing requirements of the performance to be tested, ensuring the accuracy of the simulation process of the detector under test and further ensuring the accuracy of the pulse detection information generated during the detection of the preset optical signal by the detector under test. Finally, based on the pulse detection information, the test result of the performance to be tested of the detector under test is determined, further ensuring the accuracy of the test result and the stability of the test process. In addition, the above scheme reduces the testing cost by pre-constructing candidate performance testing systems. Attached Figure Description

[0063] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0064] Figure 1 This is a diagram illustrating the application environment of a single-photon detector performance testing method in one embodiment.

[0065] Figure 2 This is a flowchart illustrating a single-photon detector performance testing method in one embodiment;

[0066] Figure 3 This is a flowchart illustrating the test environment of a time-delay-based test system in one embodiment.

[0067] Figure 4 This is a flowchart illustrating the test environment of a floodlight performance testing system in one embodiment.

[0068] Figure 5 This is a flowchart illustrating the test results for determining the performance of a detector under test in one embodiment.

[0069] Figure 6 This is a flowchart illustrating a test environment based on a focused performance testing system in one embodiment.

[0070] Figure 7 This is a schematic diagram of the test result process for determining the performance of the detector under test in another embodiment;

[0071] Figure 8 This is a flowchart illustrating a single-photon detector performance testing method in another embodiment;

[0072] Figure 9 This is a structural block diagram of a single-photon detector performance testing device in one embodiment;

[0073] Figure 10 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0074] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0075] The single-photon detector performance testing method provided in this application embodiment can be applied to, for example... Figure 1The application environment is shown. The detector under test (DUT) 101 is the detector to be tested for performance. In this embodiment, the DUT may be a single-photon detector. The target performance testing system 102 is a system used to test the performance of the DUT. The control device 103 is used to execute the single-photon detector performance testing method provided in this embodiment, i.e., to control the DUT and the target performance testing system. Optionally, the control device 103 selects the target performance testing system 102 corresponding to the performance under test from the candidate performance testing systems according to the performance type of the DUT's performance under test; wherein the DUT is a single-photon detector; the DUT 101 is placed in the target performance testing system 102 to construct a testing environment for the DUT; according to the performance testing requirements of the DUT, a preset optical signal is applied to the DUT placed in the testing environment, and pulse detection information generated during the DUT's detection of the preset optical signal is obtained; based on the pulse detection information, the test result of the DUT's performance under test is determined.

[0076] In one embodiment, such as Figure 2 As shown, a method for testing the performance of a single-photon detector is provided, and this method is applied to... Figure 1 Taking the control device 103 as an example, the following steps are specifically included:

[0077] S201, Select the target performance test system corresponding to the performance to be tested from the candidate performance test systems according to the performance type of the detector under test.

[0078] In this application embodiment, the detector under test is a single-photon detector that needs to be tested; the performance to be tested is the performance of the detector under test that needs to be tested, and the performance types include, but are not limited to, time delay performance, floodlight performance, and focusing performance; the candidate performance testing system is a pre-built system for testing the performance of the detector under test, and in this application embodiment, the candidate performance testing system includes, but is not limited to, a time delay performance testing system, a floodlight performance testing system, and a focusing performance testing system.

[0079] The time delay performance test aims to verify the time resolution capability of the detector under test (DUT), that is, to accurately distinguish the time intervals between consecutively arriving photons. The floodlight performance test aims to evaluate the DUT's response uniformity, sensitivity, and signal-to-noise ratio over a wide field of view. The focusing performance test aims to measure the DUT's ability to recognize the spatial resolution of photon positions and the shape of the light spot.

[0080] It should be noted that the performance type of the detector under test is different, and the corresponding test environment is also different. That is to say, each performance type of the detector under test can correspond to a performance test system for building the test environment, and all performance test systems corresponding to all performance types are used as candidate performance test systems.

[0081] Based on this, if it is necessary to test the performance of the detector under test, the target performance test system corresponding to the performance under test can be selected from the candidate performance test systems according to the performance type of the performance under test and the correspondence between the performance type and the performance test system.

[0082] For example, if the performance type of the detector under test is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the detector under test is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the detector under test is focusing performance, then the focusing performance test system is used as the target performance system. It is understandable that selecting the corresponding target performance system based on the performance type of the detector under test ensures the accuracy and suitability of the determined target performance system.

[0083] S202, Place the detector under test in the target performance test system to build a test environment for the detector under test.

[0084] Optionally, based on the design layout of the target performance testing system, the detector under test can be placed in the appropriate position and connected to other devices in the target performance testing system to build a test environment for the detector under test.

[0085] S203, according to the performance test requirements of the test device, apply a preset light signal to the test device placed in the test environment, and acquire the pulse detection information generated by the test device during the detection of the preset light signal.

[0086] Among them, the performance test requirements characterize the test standards for the performance under test, namely, the type of light source required during the performance test, the processing requirements during the transmission of the optical signal, etc. Pulse detection information is the information generated by the detector under test during the detection of a preset optical signal.

[0087] Generally, a specified optical signal is generated as a preset optical signal according to the performance test requirements of the target performance. The preset optical signal is then processed by various optical components in the target performance test system and irradiated onto the detector under test. Furthermore, the detector under test detects the preset optical signal and generates pulse detection information.

[0088] S204. Based on the pulse detection information, determine the test results of the performance of the detector under test.

[0089] Optionally, parameter information reflecting the degree of degradation of the performance under test can be extracted from the pulse detection information; further, the extracted parameter information is analyzed and compared with the parameter information of the preset optical signal to evaluate whether the performance of the detector under test has degraded.

[0090] In the aforementioned single-photon detector performance testing method, multiple candidate performance testing systems are constructed, and a target performance testing system corresponding to the performance to be tested is selected from the candidate systems based on the performance type of the detector under test. This ensures the adaptability and accuracy of the selected target performance testing system. Furthermore, the detector under test is placed within the target performance testing system to construct a testing environment specific to the detector. A preset optical signal is applied to the detector under test within this testing environment according to the performance testing requirements, ensuring the accuracy of the simulation process and further guaranteeing the accuracy of the pulse detection information generated during the detector's detection of the preset optical signal. Finally, the test results of the detector's performance under test are determined based on the pulse detection information, further ensuring the accuracy of the test results and the stability of the testing process. In addition, the above scheme reduces the testing cost by pre-constructing candidate performance testing systems.

[0091] As can be seen from the above embodiments, different performance types of the device under test require different target performance testing systems. In this application embodiment, a time delay testing system, a floodlight performance testing system, and a focusing performance testing system are used as examples to describe in detail the process of placing the detector under test in the target performance testing system, and the process of applying a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the device under test.

[0092] Optionally, if the target performance testing system is a time delay testing system, such as Figure 3 The diagram illustrates a test environment for a detector under test. The time delay test system includes a waveform generator, an active pulsed light source, a digital delay unit, a fiber optic delay line, an optical system, a mirror, and a focusing optical element. The output of the waveform generator is connected to the input of the digital delay unit; the output of the digital delay unit is connected to the input of the active pulsed light source; the output of the active pulsed light source is connected to one end of the fiber optic delay line; the other end of the fiber optic delay line is connected to the input of the optical system; the mirror is positioned at a first preset orientation relative to the output of the optical system; and the focusing optical element is placed vertically above the mirror. Furthermore, the detector under test can be placed vertically above the focusing optical element. Figure 3The avalanche photodiodes (APDs) in the image are placed on a focal plane array (FPA), and for ease of subsequent calculations, a coordinate system can be constructed based on the focal plane, such as... Figure 3 The X / Y and Z axes in the diagram represent the X, Y, and Z directions of the coordinate system, respectively. The avalanche photodiode is the detector under test.

[0093] Among them, the active pulsed light source has high stability and high repeatability, and can be a laser to generate optical signals; the digital delay unit and fiber delay line are used to achieve precise delay function; the detector under test can be an avalanche focal plane detector.

[0094] Based on this, according to the performance test requirements of the performance under test, the application of a preset optical signal to the target performance test system containing the detector under test can be achieved in the following way: According to the performance test requirements of the performance under test, the first delay parameter of the digital delay unit and the second delay parameter of the fiber delay line are configured; according to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay unit, and the preset optical signal passes through the configured fiber delay line and optical system in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0095] The first delay parameter is a parameter used by the digital delayer to simulate the delay of the preset optical signal; the second delay parameter is a parameter used by the fiber optic delay line to simulate the delay of the preset optical signal.

[0096] Optional, such as Figure 3 As shown, the waveform signal required for the test process can be determined based on the performance test requirements of the target performance, serving as the preset waveform signal. The parameters of the waveform generator can then be adjusted to enable the waveform generator to interpret the preset waveform signal. Furthermore, after being delayed by a digital delay unit, the preset waveform signal triggers an active pulsed light source to generate a preset optical signal. The preset optical signal generated by the active pulsed light source passes sequentially through a configured fiber delay line and optical system before reaching the focusing optical element. After being focused by the focusing optical element, it reaches the detector under test.

[0097] Furthermore, the detector under test (DUT) detects the preset optical signal after a series of processing steps and generates pulse detection information. In this embodiment, the pulse detection information includes, but is not limited to, the pulse arrival time. Based on this, the test result of the DUT's performance can be determined according to the pulse detection information in the following way: the test result of the DUT's performance is determined according to the pulse arrival time, the first delay parameter, and the second delay parameter in the pulse detection information.

[0098] For example, the pulse arrival time can be converted into corresponding actual time information or actual distance information, and the desired time information or desired distance information can be determined based on the first time delay parameter and the second time delay parameter. Furthermore, the test results of the detector under test's performance can be determined based on the comparison between the actual time information and the desired time information, or based on the comparison between the actual distance information and the desired distance information.

[0099] Optionally, if the target performance testing system is a floodlight performance testing system, such as Figure 4 The diagram illustrates a test environment for a detector under test. The floodlight performance testing system includes a waveform generator, a pulsed light source, an attenuator, a collimator (e.g., a large-aperture collimator), a mirror, and an engineered diffuser. The output of the waveform generator is connected to the input of the pulsed light source; an attenuator is placed between the output of the pulsed light source and the input of the collimator; the mirror is positioned at a second predetermined orientation relative to the output of the collimator; and an engineered diffuser is placed vertically above the mirror. The detector under test is then placed vertically above the engineered diffuser.

[0100] Among them, the pulsed light source can be a pulsed surface light source or a shaped laser light source, which can provide flood illumination to the detector array under test.

[0101] Based on this, according to the performance test requirements of the target performance, the application of a preset optical signal to the target performance test system containing the detector under test can be achieved in the following way: according to the performance test requirements of the target performance, the waveform generator is controlled to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and collimator in sequence, is reflected by the reflector to reach the engineering scattering sheet, and is scattered by the engineering scattering sheet to reach the detector under test.

[0102] Optional, such as Figure 4 As shown, after setting up the performance testing environment, initial calibration can be performed. Calibration parameters include, but are not limited to, light source intensity, light source uniformity, and detector array response characteristics. The pulsed surface source or shaped laser source can be adjusted according to the performance testing requirements to ensure collimated and uniform laser radiation flux floodlighting the detector array under test. Good alignment between the light source and the detector array is crucial to avoid the influence of optical errors on the test results. In the floodlight performance testing system, the detector under test is placed in a uniformly distributed photon environment.

[0103] After calibration, the waveform generator can be controlled to generate a preset waveform signal according to the performance test requirements of the test object. The preset waveform signal triggers the pulse light source to generate a preset light signal. Furthermore, the preset light signal passes through the attenuator and collimator in sequence, is reflected by the reflector to the engineering scattering sheet, and is then scattered by the engineering scattering sheet to the detector under test.

[0104] Furthermore, the detector under test detects the preset optical signal after a series of processing steps and generates pulse detection information. For example, the output signal of each pixel can be acquired, including intensity information and time information. In this embodiment, the pulse detection information includes, but is not limited to, the intensity information and time information of the output signal of each pixel. Based on this, such as... Figure 5 As shown, a method for determining the test results of the performance of a detector under test is provided, specifically including the following steps:

[0105] S501, based on the intensity information and time information of each pixel, determine the maximum deviation of each pixel.

[0106] The intensity information represents the signal strength of the preset optical signal received by the detector under test (DUT); the time information represents the time it takes for the DUT to receive the preset optical signal. It should be noted that the intensity and time information output by the DUT vary with the output optical power or delay time of the preset optical signal, and the linearity is calculated from the deviation of the relationship curve from the fitted straight line.

[0107] Optionally, based on the intensity and time information of each pixel, and using statistical theory, the output of each pixel can be statistically analyzed, and the maximum deviation of each pixel can be calculated.

[0108] S502, based on the maximum deviation, intensity information and time information of each pixel, determine the test results of the performance of the detector under test.

[0109] Optionally, parameters such as minimum detectable power, photon detection efficiency and its uniformity, and intra-frame time jitter can be calculated based on the maximum deviation, intensity information, and time information of each pixel; furthermore, the test results of the performance of the detector under test can be determined based on the calculated values ​​of each parameter.

[0110] In this embodiment, by introducing the intensity information and time information of each pixel, the accuracy of the determined maximum deviation of each pixel is ensured; furthermore, based on the introduced maximum deviation, the test results of the performance of the detector under test can be accurately determined.

[0111] Optionally, if the target performance testing system is a focused performance testing system, such as Figure 6The diagram illustrates a test environment for a detector under test. The focusing performance test system includes a waveform generator, a pulsed light source, an attenuator, a beam expander (or collimator), a mirror, and focusing optical elements. The output of the waveform generator is connected to the input of the pulsed light source. An attenuator is placed between the output of the pulsed light source and the input of the beam expander. The mirror is positioned at a third predetermined orientation relative to the output of the beam expander. The focusing optical elements are placed vertically above the mirror. Furthermore, the detector under test can be placed vertically above an engineering scattering sheet. The pulsed light source can be a high-precision focusing source, such as a laser beam.

[0112] Based on this, according to the performance test requirements of the performance to be tested, the application of a preset optical signal to the target performance test system containing the detector to be tested can be achieved in the following way: according to the performance test requirements of the performance to be tested, the waveform generator is controlled to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector to be tested.

[0113] For example, such as Figure 6 As shown, a mathematical model can be used to describe the optical system consisting of a laser beam, collimator, and focusing optics. By analyzing the optical system, the optimal spot size and position can be determined to ensure that the spot can be accurately focused on the pixel center. In-depth research is conducted on key optical components to evaluate potential aberrations and distortions, as well as the final focusing performance. Furthermore, the performance testing environment is initially calibrated, including the light source intensity, the position and angle of the optical components, etc. Using a microscope or similar equipment, it is ensured that the laser beam can be accurately focused on a single pixel of the detector under test. A pixel is selected as the test object, and the laser beam is adjusted to focus on that pixel.

[0114] Furthermore, the detector under test detects the preset optical signal after a series of processing steps and generates pulse detection information. For example, the output signal of the focused pixel can be acquired, while simultaneously monitoring the signals of neighboring pixels. In this embodiment, the pulse detection information includes, but is not limited to, the output signal of each pixel. Based on this, such as... Figure 7 As shown, a method for determining the test results of the performance of a detector under test is provided, specifically including the following steps:

[0115] S701, for each pixel, determine the crosstalk information of the pixel based on the output signal of the pixel and the output signals of the neighboring pixels of the pixel.

[0116] Crosstalk information represents a measure of the signal from neighboring pixels when the pixel is illuminated by a focused spot.

[0117] Optionally, for each pixel, the output signal of that pixel and the output signals of its neighboring pixels can be extracted; further, the crosstalk level of that pixel can be evaluated based on the output signal of that pixel and the output signals of its neighboring pixels, and crosstalk information of that pixel can be generated.

[0118] S702 determines the test results of the detector under test's performance based on the crosstalk information of each pixel.

[0119] Optionally, the crosstalk information of each pixel can be combined to comprehensively and statistically evaluate the crosstalk situation of the detector under test and determine the test results of the detector under test performance.

[0120] It should be noted that the xy-axis scanning range can also be controlled to allow the focused light spot to perform a two-dimensional scan on the detector surface. During the scan, the signal intensity at each location is continuously recorded to plot the light fill factor map. The light fill factor map is analyzed to determine the effective photosensitive area and calculate the light fill factor value. Throughout the test, all relevant data, including pixel signals, light spot positions, and laser intensity, are continuously acquired and recorded. Furthermore, by combining the crosstalk information of each pixel, the performance of the detector under test is comprehensively evaluated to determine the test results.

[0121] In this embodiment, crosstalk information is introduced, and the crosstalk level of the detector under test is evaluated based on the crosstalk information of each pixel. Since the crosstalk level reflects the floodlight capability of the detector under test, the test results of the performance of the detector under test can be accurately determined.

[0122] Figure 8 This is a flowchart illustrating a single-photon detector performance testing method in another embodiment. Based on the above embodiments, this embodiment provides an optional example of a single-photon detector performance testing method. (Combined with...) Figure 8 The specific implementation process is as follows:

[0123] S801, determine the performance type of the detector under test; if the performance type of the detector under test is time delay performance, then use the time delay test system as the target performance system and execute S802; if the performance type of the detector under test is floodlight performance, then use the floodlight performance test system as the target performance system and execute S807; if the performance type of the detector under test is focusing performance, then use the focusing performance test system as the target performance system and execute S811.

[0124] The detector under test is a single-photon detector.

[0125] S802, the detector under test is placed vertically above the focusing optics in the time delay test system to create a test environment for the detector under test.

[0126] S803 configures the first delay parameter of the digital delay unit and the second delay parameter of the fiber delay line according to the performance test requirements of the device under test.

[0127] S804, according to performance test requirements, controls the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay unit, and the preset optical signal passes through the configured fiber delay line and optical system in sequence, and is reflected by the reflector to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0128] S805, acquire pulse detection information generated during the detection of a preset optical signal by the detector under test.

[0129] S806, based on the first delay parameter, the second delay parameter and the pulse arrival time in the pulse detection information, determine the test result of the performance of the detector under test.

[0130] S807 places the detector under test vertically above the engineered scattering sheet in the floodlight performance test system to create a test environment for the detector under test.

[0131] S808 controls the waveform generator to generate a preset waveform signal according to the performance test requirements of the test object. The preset waveform signal triggers the pulse light source to generate a preset light signal. The preset light signal passes through the attenuator and collimator in sequence, is reflected by the reflector, and reaches the engineering scattering sheet. After being scattered by the engineering scattering sheet, it reaches the detector under test.

[0132] S809 determines the maximum deviation of each pixel based on the intensity and time information of each pixel in the pulse detection information.

[0133] S810 determines the test results of the detector under test based on the maximum deviation, intensity information and time information of each pixel.

[0134] S811 places the detector under test vertically above the engineering scattering sheet of the focusing performance test system to create a test environment for the detector under test.

[0135] S812 controls the waveform generator to generate a preset waveform signal according to the performance test requirements of the test object. The waveform signal triggers the pulse light source to generate a preset light signal. The preset light signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror, reaches the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0136] S813 determines the crosstalk information of each pixel based on the output signal of each pixel in the pulse detection information and the output signal of each pixel's neighboring pixels.

[0137] S814 determines the test results of the detector under test's performance based on the crosstalk information of each pixel.

[0138] The specific processes of S801-S814 described above can be found in the description of the above method embodiments. Their implementation principles and technical effects are similar, and will not be repeated here.

[0139] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0140] Based on the same inventive concept, this application also provides a single-photon detector performance testing device for implementing the single-photon detector performance testing method described above. The solution provided by this device is similar to the solution described in the above method; therefore, the specific limitations in one or more embodiments of the single-photon detector performance testing device provided below can be found in the limitations of the single-photon detector performance testing method described above, and will not be repeated here.

[0141] In one exemplary embodiment, such as Figure 9 As shown, a single-photon detector performance testing device 900 is provided, comprising: a system selection module 910, an environment setup module 920, an information acquisition module 930, and a performance testing module 940, wherein:

[0142] The system selection module 910 is used to select the target performance test system corresponding to the performance under test from the candidate performance test systems according to the performance type of the performance under test of the detector under test; wherein, the detector under test is a single-photon detector.

[0143] Environment setup module 920 is used to place the detector under test in the target performance test system to build a test environment for the detector under test.

[0144] The information acquisition module 930 is used to apply a preset light signal to the detector under test placed in the test environment according to the performance test requirements of the performance under test, and to acquire the pulse detection information generated by the detector under test during the detection of the preset light signal.

[0145] The performance testing module 940 is used to determine the test results of the performance of the detector under test based on the pulse detection information.

[0146] The aforementioned single-photon detector performance testing device constructs multiple candidate performance testing systems and selects the target performance testing system corresponding to the performance under test from among the candidate systems based on the performance type of the detector under test, ensuring the adaptability and accuracy of the selected target performance testing system. Furthermore, the detector under test is placed in the target performance testing system to construct a test environment specific to the detector. A preset optical signal is applied to the detector under test in the test environment according to the performance testing requirements, ensuring the accuracy of the simulation process and further guaranteeing the accuracy of the pulse detection information generated during the detector's detection of the preset optical signal. Finally, the test result of the detector's performance under test is determined based on the pulse detection information, further ensuring the accuracy of the test results and the stability of the test process. In addition, the above scheme reduces the testing cost by pre-constructing candidate performance testing systems.

[0147] In one embodiment, the system selection module 910 is specifically used for:

[0148] If the performance type of the detector under test is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the detector under test is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the detector under test is focusing performance, then the focusing performance test system is used as the target performance system.

[0149] In one embodiment, the time delay testing system includes: a waveform generator, an active pulsed light source, a digital delay unit, an optical fiber delay line, an optical system, a reflector, and a focusing optical element; the output of the waveform generator is connected to the input of the digital delay unit; the output of the digital delay unit is connected to the input of the active pulsed light source; the output of the active pulsed light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input of the optical system; the reflector is positioned at a first preset orientation relative to the output of the optical system; and a focusing optical element is placed vertically above the reflector.

[0150] Accordingly, the environment setup module 920 is specifically used for:

[0151] The detector under test is placed vertically above the focusing optics.

[0152] In one embodiment, the information acquisition module 930 can be used for:

[0153] According to the performance test requirements of the device under test, the first delay parameter of the digital delay unit and the second delay parameter of the fiber delay line are configured. According to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay unit. The preset optical signal then passes through the configured fiber delay line and optical system in sequence, is reflected by the mirror, reaches the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0154] Accordingly, the performance testing module 940 is specifically used for:

[0155] Based on the first delay parameter, the second delay parameter, and the pulse arrival time in the pulse detection information, the test results of the performance of the detector under test are determined.

[0156] In one embodiment, the floodlight performance testing system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineered diffuser; the output of the waveform generator is connected to the input of the pulsed light source; an attenuator is placed between the output of the pulsed light source and the input of the collimator; the reflector is placed at a second preset orientation with respect to the output of the collimator; and an engineered diffuser is placed vertically above the reflector.

[0157] Accordingly, the environment setup module 920 can be used for:

[0158] Place the detector under test vertically above the engineering scattering sheet.

[0159] In one embodiment, the information acquisition module 930 can be used for:

[0160] According to the performance test requirements of the test object, the control waveform generator generates a preset waveform signal, which triggers the pulse light source to generate a preset light signal. The preset light signal passes through the attenuator and collimator in sequence, is reflected by the reflector, and reaches the engineering scattering sheet. After being scattered by the engineering scattering sheet, it reaches the detector under test.

[0161] In one embodiment, the performance testing module 940 can be used for:

[0162] Based on the intensity and time information of each pixel, the maximum deviation of each pixel is determined; based on the maximum deviation, intensity, and time information of each pixel, the test results of the performance of the detector under test are determined.

[0163] In one embodiment, the focusing performance testing system includes: a waveform generator, a pulse light source, an attenuator, a beam expander, a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulse light source; an attenuator is placed between the output end of the pulse light source and the input end of the beam expander; the mirror is placed at a third predetermined position relative to the output end of the beam expander; and a focusing optical element is placed vertically above the mirror.

[0164] Accordingly, the environment setup module 920 can be used for:

[0165] Place the detector under test vertically above the engineering scattering sheet.

[0166] In one embodiment, the information acquisition module 930 can be used for:

[0167] According to the performance test requirements of the test object, the waveform generator is controlled to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0168] Accordingly, the pulse detection information includes the output signal of each pixel, and the performance test module 940 can be used for:

[0169] For each pixel, the crosstalk information of the pixel is determined based on the output signal of the pixel and the output signals of the neighboring pixels; based on the crosstalk information of each pixel, the test results of the performance of the detector under test are determined.

[0170] Each module in the aforementioned single-photon detector performance testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0171] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 10As shown, the computer device includes a processor, memory, communication interface, display screen, and input device connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a method for testing the performance of a single-photon detector.

[0172] Those skilled in the art will understand that Figure 10 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0173] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0174] Based on the performance type of the detector under test, a target performance test system corresponding to the performance under test is selected from the candidate performance test systems; wherein, the detector under test is a single-photon detector.

[0175] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0176] According to the performance test requirements of the device under test, a preset optical signal is applied to the detector under test placed in the test environment, and the pulse detection information generated by the detector under test during the detection of the preset optical signal is acquired.

[0177] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0178] In one embodiment, when the processor executes a computer program to select a target performance test system corresponding to the performance to be tested from candidate performance test systems based on the performance type of the performance to be tested of the detector under test, the following steps are also performed:

[0179] If the performance type of the detector under test is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the detector under test is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the detector under test is focusing performance, then the focusing performance test system is used as the target performance system.

[0180] In one embodiment, the time delay testing system includes: a waveform generator, an active pulsed light source, a digital delay unit, an optical fiber delay line, an optical system, a reflector, and a focusing optical element; the output of the waveform generator is connected to the input of the digital delay unit; the output of the digital delay unit is connected to the input of the active pulsed light source; the output of the active pulsed light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input of the optical system; the reflector is placed at a first preset orientation relative to the output of the optical system; a focusing optical element is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance testing system, the following steps are also performed:

[0181] The detector under test is placed vertically above the focusing optics.

[0182] In one embodiment, when the target performance system is a time delay testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0183] According to the performance test requirements of the device under test, the first delay parameter of the digital delay unit and the second delay parameter of the fiber delay line are configured. According to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay unit. The preset optical signal then passes through the configured fiber delay line and optical system in sequence, is reflected by the mirror, reaches the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0184] Accordingly, when the processor executes the computer program to determine the test results of the detector under test based on the pulse detection information, it also performs the following steps:

[0185] Based on the first delay parameter, the second delay parameter, and the pulse arrival time in the pulse detection information, the test results of the performance of the detector under test are determined.

[0186] In one embodiment, the floodlight performance testing system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineered scattering sheet; the output of the waveform generator is connected to the input of the pulsed light source; an attenuator is placed between the output of the pulsed light source and the input of the collimator; the reflector is placed at a second preset orientation with respect to the output of the collimator; an engineered scattering sheet is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance testing system, it also performs the following steps:

[0187] Place the detector under test vertically above the engineering scattering sheet.

[0188] In one embodiment, when the target performance testing system is a floodlight performance testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0189] According to the performance test requirements of the test object, the control waveform generator generates a preset waveform signal, which triggers the pulse light source to generate a preset light signal. The preset light signal passes through the attenuator and collimator in sequence, is reflected by the reflector, and reaches the engineering scattering sheet. After being scattered by the engineering scattering sheet, it reaches the detector under test.

[0190] In one embodiment, the pulse detection information includes the intensity and timing information of the output signal of each pixel; when the processor executes the computer program to determine the test result of the performance of the detector under test based on the pulse detection information, it also performs the following steps:

[0191] Based on the intensity and time information of each pixel, the maximum deviation of each pixel is determined; based on the maximum deviation, intensity, and time information of each pixel, the test results of the performance of the detector under test are determined.

[0192] In one embodiment, the focusing performance testing system includes: a waveform generator, a pulse light source, an attenuator, a beam expander, a mirror, and a focusing optical element; the output of the waveform generator is connected to the input of the pulse light source; an attenuator is placed between the output of the pulse light source and the input of the beam expander; the mirror is placed at a third predetermined orientation relative to the output of the beam expander; a focusing optical element is placed vertically above the mirror; when the processor executes a computer program to place the detector under test in the target performance testing system, it also performs the following steps:

[0193] Place the detector under test vertically above the engineering scattering sheet.

[0194] In one embodiment, when the target performance testing system is a focusing performance testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0195] According to the performance test requirements of the test object, the waveform generator is controlled to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0196] Accordingly, the pulse detection information includes the output signal of each pixel. When the processor executes the computer program to determine the test result of the detector under test based on the pulse detection information, it also performs the following steps:

[0197] For each pixel, the crosstalk information of the pixel is determined based on the output signal of the pixel and the output signals of the neighboring pixels; based on the crosstalk information of each pixel, the test results of the performance of the detector under test are determined.

[0198] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:

[0199] Based on the performance type of the detector under test, a target performance test system corresponding to the performance under test is selected from the candidate performance test systems; wherein, the detector under test is a single-photon detector.

[0200] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0201] According to the performance test requirements of the device under test, a preset optical signal is applied to the detector under test placed in the test environment, and the pulse detection information generated by the detector under test during the detection of the preset optical signal is acquired.

[0202] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0203] In one embodiment, when the processor executes a computer program to select a target performance test system corresponding to the performance to be tested from candidate performance test systems based on the performance type of the performance to be tested of the detector under test, the following steps are also performed:

[0204] If the performance type of the detector under test is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the detector under test is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the detector under test is focusing performance, then the focusing performance test system is used as the target performance system.

[0205] In one embodiment, the time delay testing system includes: a waveform generator, an active pulsed light source, a digital delay unit, an optical fiber delay line, an optical system, a reflector, and a focusing optical element; the output of the waveform generator is connected to the input of the digital delay unit; the output of the digital delay unit is connected to the input of the active pulsed light source; the output of the active pulsed light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input of the optical system; the reflector is placed at a first preset orientation relative to the output of the optical system; a focusing optical element is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance testing system, the following steps are also performed:

[0206] The detector under test is placed vertically above the focusing optics.

[0207] In one embodiment, when the target performance system is a time delay testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0208] According to the performance test requirements of the device under test, the first delay parameter of the digital delay unit and the second delay parameter of the fiber delay line are configured. According to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay unit. The preset optical signal then passes through the configured fiber delay line and optical system in sequence, is reflected by the mirror, reaches the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0209] Accordingly, when the processor executes the computer program to determine the test results of the detector under test based on the pulse detection information, it also performs the following steps:

[0210] Based on the first delay parameter, the second delay parameter, and the pulse arrival time in the pulse detection information, the test results of the performance of the detector under test are determined.

[0211] In one embodiment, the floodlight performance testing system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineered scattering sheet; the output of the waveform generator is connected to the input of the pulsed light source; an attenuator is placed between the output of the pulsed light source and the input of the collimator; the reflector is placed at a second preset orientation with respect to the output of the collimator; an engineered scattering sheet is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance testing system, it also performs the following steps:

[0212] Place the detector under test vertically above the engineering scattering sheet.

[0213] In one embodiment, when the target performance testing system is a floodlight performance testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0214] According to the performance test requirements of the test object, the control waveform generator generates a preset waveform signal, which triggers the pulse light source to generate a preset light signal. The preset light signal passes through the attenuator and collimator in sequence, is reflected by the reflector, and reaches the engineering scattering sheet. After being scattered by the engineering scattering sheet, it reaches the detector under test.

[0215] In one embodiment, the pulse detection information includes the intensity and timing information of the output signal of each pixel; when the processor executes the computer program to determine the test result of the performance of the detector under test based on the pulse detection information, it also performs the following steps:

[0216] Based on the intensity and time information of each pixel, the maximum deviation of each pixel is determined; based on the maximum deviation, intensity, and time information of each pixel, the test results of the performance of the detector under test are determined.

[0217] In one embodiment, the focusing performance testing system includes: a waveform generator, a pulse light source, an attenuator, a beam expander, a mirror, and a focusing optical element; the output of the waveform generator is connected to the input of the pulse light source; an attenuator is placed between the output of the pulse light source and the input of the beam expander; the mirror is placed at a third predetermined orientation relative to the output of the beam expander; a focusing optical element is placed vertically above the mirror; when the processor executes a computer program to place the detector under test in the target performance testing system, it also performs the following steps:

[0218] Place the detector under test vertically above the engineering scattering sheet.

[0219] In one embodiment, when the target performance testing system is a focusing performance testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0220] According to the performance test requirements of the test object, the waveform generator is controlled to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0221] Accordingly, the pulse detection information includes the output signal of each pixel. When the processor executes the computer program to determine the test result of the detector under test based on the pulse detection information, it also performs the following steps:

[0222] For each pixel, the crosstalk information of the pixel is determined based on the output signal of the pixel and the output signals of the neighboring pixels; based on the crosstalk information of each pixel, the test results of the performance of the detector under test are determined.

[0223] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the following steps:

[0224] Based on the performance type of the detector under test, a target performance test system corresponding to the performance under test is selected from the candidate performance test systems; wherein, the detector under test is a single-photon detector.

[0225] The detector under test is placed in the target performance testing system to construct a test environment for the detector under test;

[0226] According to the performance test requirements of the device under test, a preset optical signal is applied to the detector under test placed in the test environment, and the pulse detection information generated by the detector under test during the detection of the preset optical signal is acquired.

[0227] Based on the pulse detection information, the test results of the performance of the detector under test are determined.

[0228] In one embodiment, when the processor executes a computer program to select a target performance test system corresponding to the performance to be tested from candidate performance test systems based on the performance type of the performance to be tested of the detector under test, the following steps are also performed:

[0229] If the performance type of the detector under test is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the detector under test is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the detector under test is focusing performance, then the focusing performance test system is used as the target performance system.

[0230] In one embodiment, the time delay testing system includes: a waveform generator, an active pulsed light source, a digital delay unit, an optical fiber delay line, an optical system, a reflector, and a focusing optical element; the output of the waveform generator is connected to the input of the digital delay unit; the output of the digital delay unit is connected to the input of the active pulsed light source; the output of the active pulsed light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input of the optical system; the reflector is placed at a first preset orientation relative to the output of the optical system; a focusing optical element is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance testing system, the following steps are also performed:

[0231] The detector under test is placed vertically above the focusing optics.

[0232] In one embodiment, when the target performance system is a time delay testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0233] According to the performance test requirements of the device under test, the first delay parameter of the digital delay unit and the second delay parameter of the fiber delay line are configured. According to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay unit. The preset optical signal then passes through the configured fiber delay line and optical system in sequence, is reflected by the mirror, reaches the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0234] Accordingly, when the processor executes the computer program to determine the test results of the detector under test based on the pulse detection information, it also performs the following steps:

[0235] Based on the first delay parameter, the second delay parameter, and the pulse arrival time in the pulse detection information, the test results of the performance of the detector under test are determined.

[0236] In one embodiment, the floodlight performance testing system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineered scattering sheet; the output of the waveform generator is connected to the input of the pulsed light source; an attenuator is placed between the output of the pulsed light source and the input of the collimator; the reflector is placed at a second preset orientation with respect to the output of the collimator; an engineered scattering sheet is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance testing system, it also performs the following steps:

[0237] Place the detector under test vertically above the engineering scattering sheet.

[0238] In one embodiment, when the target performance testing system is a floodlight performance testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0239] According to the performance test requirements of the test object, the control waveform generator generates a preset waveform signal, which triggers the pulse light source to generate a preset light signal. The preset light signal passes through the attenuator and collimator in sequence, is reflected by the reflector, and reaches the engineering scattering sheet. After being scattered by the engineering scattering sheet, it reaches the detector under test.

[0240] In one embodiment, the pulse detection information includes the intensity and timing information of the output signal of each pixel; when the processor executes the computer program to determine the test result of the performance of the detector under test based on the pulse detection information, it also performs the following steps:

[0241] Based on the intensity and time information of each pixel, the maximum deviation of each pixel is determined; based on the maximum deviation, intensity, and time information of each pixel, the test results of the performance of the detector under test are determined.

[0242] In one embodiment, the focusing performance testing system includes: a waveform generator, a pulse light source, an attenuator, a beam expander, a mirror, and a focusing optical element; the output of the waveform generator is connected to the input of the pulse light source; an attenuator is placed between the output of the pulse light source and the input of the beam expander; the mirror is placed at a third predetermined orientation relative to the output of the beam expander; a focusing optical element is placed vertically above the mirror; when the processor executes a computer program to place the detector under test in the target performance testing system, it also performs the following steps:

[0243] Place the detector under test vertically above the engineering scattering sheet.

[0244] In one embodiment, when the target performance testing system is a focusing performance testing system, when the processor executes a computer program to apply a preset optical signal to the target performance testing system containing the detector under test according to the performance testing requirements of the performance under test, the following steps are also performed:

[0245] According to the performance test requirements of the test object, the waveform generator is controlled to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expander in sequence, is reflected by the mirror to reach the focusing optical element, and is focused by the focusing optical element to reach the detector under test.

[0246] Accordingly, the pulse detection information includes the output signal of each pixel. When the processor executes the computer program to determine the test result of the detector under test based on the pulse detection information, it also performs the following steps:

[0247] For each pixel, the crosstalk information of the pixel is determined based on the output signal of the pixel and the output signals of the neighboring pixels; based on the crosstalk information of each pixel, the test results of the performance of the detector under test are determined.

[0248] It should be noted that the data involved in this application (including but not limited to data used for analysis, data stored, data displayed, etc.) are all information and data that have been fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0249] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0250] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0251] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method of testing performance of a single photon detector, characterized by, The method comprises: selecting a target performance test system corresponding to the to-be-tested performance of the to-be-tested detector from candidate performance test systems according to a performance type of the to-be-tested performance of the to-be-tested detector; wherein the to-be-tested detector is a single-photon detector; the candidate performance test systems comprise a time delay test system, a floodlight performance test system, and a focusing performance test system; placing the to-be-tested detector in the target performance test system to construct a test environment for the to-be-tested detector; applying a preset light signal to the to-be-tested detector placed in the test environment according to a performance test requirement of the to-be-tested performance, and acquiring pulse detection information generated in a process in which the to-be-tested detector detects the preset light signal; determining a test result of the to-be-tested performance of the to-be-tested detector according to the pulse detection information; wherein the selecting a target performance test system corresponding to the to-be-tested performance of the to-be-tested detector from candidate performance test systems according to a performance type of the to-be-tested performance of the to-be-tested detector comprises: if the performance type of the to-be-tested performance of the to-be-tested detector is a floodlight performance, taking the floodlight performance test system as the target performance system; the floodlight performance test system comprises a waveform generator, a pulse light source, an attenuator, a collimator, a mirror, and an engineering scattering sheet; an output end of the waveform generator is connected to an input end of the pulse light source; an output end of the pulse light source and an input end of the collimator are provided with the attenuator therebetween; the mirror is placed in a second preset orientation with an output end of the collimator; the engineering scattering sheet is placed vertically above the mirror.

2. The method of claim 1, wherein, the selecting a target performance test system corresponding to the to-be-tested performance of the to-be-tested detector from candidate performance test systems according to a performance type of the to-be-tested performance of the to-be-tested detector comprises: if the performance type of the to-be-tested performance of the to-be-tested detector is a time delay performance, taking the time delay test system as the target performance system; if the performance type of the to-be-tested performance of the to-be-tested detector is a focusing performance, taking the focusing performance test system as the target performance system.

3. The method of claim 2, wherein, the time delay test system comprises a waveform generator, an active pulse light source, a digital delay, an optical fiber delay line, an optical system, a mirror, and a focusing optical element; an output end of the waveform generator is connected to an input end of the digital delay; an output end of the digital delay is connected to an input end of the active pulse light source; an output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to an input end of the optical system; the mirror is placed in a first preset orientation with an output end of the optical system; the focusing optical element is placed vertically above the mirror; the placing the to-be-tested detector in the target performance test system comprises: placing the to-be-tested detector vertically above the focusing optical element.

4. The method of claim 3, wherein, in the case where the target performance system is the time delay test system, the applying a preset light signal to the target performance test system containing the to-be-tested detector according to a performance test requirement of the to-be-tested performance comprises: configuring the first time delay parameter of the digital delay and the second time delay parameter of the fiber delay line according to the performance test requirement of the to-be-tested performance; controlling the waveform generator to generate a preset waveform signal according to the performance test requirement, so that the preset waveform signal triggers the active pulse light source to generate a preset light signal through the configured digital delay, and the preset light signal reaches the to-be-tested detector after being reflected by the mirror and focused by the focusing optical element; correspondingly, the determining the test result of the to-be-tested performance of the to-be-tested detector according to the pulse detection information comprises: determining the test result of the to-be-tested performance of the to-be-tested detector according to the first time delay parameter, the second time delay parameter and the pulse arrival time in the pulse detection information.

5. The method of claim 1, wherein, placing the to-be-tested detector in the target performance test system comprises: placing the to-be-tested detector vertically above the engineering scattering sheet.

6. The method of claim 5, wherein, in the case that the target performance test system is a floodlight performance test system, the applying a preset light signal to the target performance test system containing the to-be-tested detector according to the performance test requirement of the to-be-tested performance comprises: controlling the waveform generator to generate a preset waveform signal according to the performance test requirement of the to-be-tested performance, so that the preset waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal reaches the to-be-tested detector after passing through the attenuator, the collimator and the engineering scattering sheet in sequence and being scattered by the engineering scattering sheet.

7. The method of claim 6, wherein, the pulse detection information comprises intensity information and time information of the output signal of each pixel; the determining the test result of the to-be-tested performance of the to-be-tested detector according to the pulse detection information comprises: determining the maximum deviation of each pixel according to the intensity information and the time information of each pixel; determining the test result of the to-be-tested performance of the to-be-tested detector according to the maximum deviation, the intensity information and the time information of each pixel.

8. The method of claim 2, wherein, the focusing performance test system comprises a waveform generator, a pulse light source, an attenuator, a beam expander, a mirror and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulse light source; the attenuator is placed between the output end of the pulse light source and the input end of the beam expander; the mirror is placed at a third preset orientation with the output end of the beam expander; the focusing optical element is placed vertically above the mirror; correspondingly, the placing the to-be-tested detector in the target performance test system comprises: placing the to-be-tested detector vertically above the focusing optical element.

9. The method of claim 8, wherein, in the case that the target performance test system is a focusing performance test system, the applying a preset light signal to the target performance test system containing the to-be-tested detector according to the performance test requirement of the to-be-tested performance comprises: According to a performance test requirement of the to-be-tested performance, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the pulsed light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expander in turn, is reflected by the reflector to the focusing optical element, and is focused by the focusing optical element to reach the to-be-tested detector; Correspondingly, the pulse detection information includes output signals of each pixel, and the test result of the to-be-tested performance of the to-be-tested detector is determined according to the pulse detection information, including: For each pixel, the crosstalk information of the pixel is determined according to the output signal of the pixel and the output signal of the adjacent pixel of the pixel. The test result of the to-be-tested performance of the to-be-tested detector is determined according to the crosstalk information of each pixel.

10. A device for testing the performance of a single photon detector, characterized in that The device comprises: The system selection module is configured to select a target performance test system corresponding to the to-be-tested performance from candidate performance test systems according to a performance type of the to-be-tested performance of the to-be-tested detector; the to-be-tested detector is a single-photon detector; the candidate performance test systems include a time delay test system, a floodlight performance test system and a focusing performance test system; The environment construction module is configured to place the to-be-tested detector in the target performance test system to construct a test environment for the to-be-tested detector; The information acquisition module is configured to apply a preset light signal to the to-be-tested detector placed in the test environment according to a performance test requirement of the to-be-tested performance, and acquire pulse detection information generated in a detection process of the to-be-tested detector on the preset light signal; The performance test module is configured to determine a test result of the to-be-tested performance of the to-be-tested detector according to the pulse detection information. The system selection module is further configured to: If the performance type of the to-be-tested performance of the to-be-tested detector is a floodlight performance, the floodlight performance test system is selected as the target performance system; the floodlight performance test system comprises a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector and an engineering scattering sheet; an output end of the waveform generator is connected to an input end of the pulsed light source; an output end of the pulsed light source and an input end of the collimator are placed with the attenuator therebetween; the reflector is placed at a second preset orientation with an output end of the collimator; the engineering scattering sheet is placed vertically above the reflector.

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