Power change detection equipment for transistor at different temperatures
By designing a transistor detection device including a sliding mechanism, a mobile station, a gantry hanger and a engaging seat, the problem of difficulty in detecting transistors in the temperature-changing environment in the prior art is solved, and the transistor installation process is simplified, thereby realizing efficient power-on detection of small transistors.
Patent Information
- Application Number
- CN202510252594.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-05
- Publication Date
- 2025-05-27
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
The prior art is difficult to detect transistors under a temperature change environment, and the installation process of transistors is inconvenient, especially small transistors are not easy to turn on during installation, making it difficult to easily conduct power-on detection.
A power change detection device for transistors under different temperatures is designed. The combination of sliding mechanism and mobile station is used to drive the detection mechanism through the gantry hanger and driving cylinder to realize the heating and cooling detection of the transistor, and multiple groups of transistors are fixed and limited through the engaging seat and the carrier stage.
The detection of transistors in a temperature-changing environment is realized, the installation process of transistors is simplified, and the power-on detection of small transistors is facilitated, which improves detection efficiency and accuracy.
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Figure CN120044373A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field, specifically to a power change detection device for transistors at different temperatures. Background Art
[0002] A transistor is a semiconductor device widely used in electronic devices, mainly for amplifying signals or switching control. It is made of semiconductor materials (such as silicon or germanium) and usually has three main parts: an emitter, a base, and a collector. The working principle of a transistor is based on current control. When an input current is applied to the base, it can regulate the current flow between the emitter and the collector. The performance and working state of a transistor are significantly affected by temperature changes. At different temperatures, the electrical characteristics and behaviors of a transistor may change. Therefore, during the transistor production process, a detection device is needed to test the power change of a transistor at different temperatures.
[0003] The prior art, such as a detection device for testing the high-temperature resistance performance of a transistor disclosed in Chinese Patent Publication No. CN215219044U, includes:
[0004] An outer box body, placed on a horizontal operation platform by a base below, and the inside of the outer box body is provided with materials with good heat insulation effect;
[0005] An upper cover, detachably arranged above the outer box body, and the upper cover can prevent the heat inside the outer box body from dissipating;
[0006] A control panel, fixedly installed on the outer surface of the left side of the outer box body, and the control panel is connected to internal components through wires;
[0007] A heating device, movably installed on the lower surface inside the outer box body, the heating device is integrally circular in structure, and a driven gear for driving it to rotate is arranged below the heating device;
[0008] A heat conducting plate, movably installed inside the outer box body, the heat conducting plate is made of a metal material with good heat conducting performance, and a longitudinal lead screw for driving it to move up and down is arranged through the right side of the heat conducting plate;
[0009] A fixed clamping block, fixedly arranged on the upper surface of the heat conducting plate;
[0010] A movable clamping block, movably installed on the side of the fixed clamping block, the positions of the movable clamping block and the fixed clamping block correspond to each other, and the side of the movable clamping block is fixedly connected to a movable extrusion block;
[0011] A placement groove, opened on the inner sides of the movable clamping block and the fixed clamping block, and the placement groove is used for placing the transistor to be detected.
[0012] Although the prior art can heat a transistor to operate it in a high-temperature environment and test the transistor in the high-temperature environment through a detection device, the ambient temperature during the use of the transistor usually changes. During the startup process of the device, the ambient temperature around the transistor changes from low to high. Therefore, the transistor also needs to operate normally during the temperature change process. The existing detection devices do not detect the transistor in a variable-temperature environment. Secondly, during the detection of the transistor, although a clamping device is used to limit the position of the transistor, the transistor has a small volume, and the installation process is very inconvenient. Some transistors are not easy to connect during installation, and it is very difficult to conveniently conduct a power-on test on the transistor. Summary of the Invention
[0013] Based on this, the purpose of the present invention is to provide a detection device for the power change of a transistor at different temperatures to solve the technical problems of inconvenient variable-temperature detection of the transistor and inconvenient installation of the transistor.
[0014] To achieve the above object, the present invention provides the following technical solution: A detection device for the power change of a transistor at different temperatures, including a device housing. A sliding mechanism and a moving table are installed inside the device housing. The sliding mechanism drives the moving table to move. A driving mechanism is installed on the side of the device housing. The output end of the driving mechanism is connected to a first driving screw. A gantry hanger is sleeved outside the first driving screw. The bottom end of the gantry hanger is connected to a detection mechanism. A sealing head and a detection table are installed at the bottom end of the detection mechanism. A controller, an air intake mechanism, and a heater are installed inside the detection mechanism. Multiple sets of clamping seats are installed at the top end of the moving table. Multiple sets of carrier tables and clamping plates are installed at the top end of each set of clamping seats. The clamping plates are inserted into the clamping seats. The carrier tables are clamped and connected to the clamping seats through the clamping plates. Air inlet pipes are opened on both sides of the clamping seats, and the air inlet pipes are connected to the sealing head.
[0015] By adopting the above technical solution, the transistor can be conveniently detected, and during the detection process, the transistor is heated through a heating structure, thereby realizing the variable-temperature detection of the transistor.
[0016] The present invention is further provided that a sealing door is installed on the side of the device housing. A closing cylinder is installed at the top end of the device housing. The output of the closing cylinder is connected to the sealing door. A ventilation structure is also installed at the top end of the device housing.
[0017] Preferably, the clamping seats can be conveniently installed inside the device.
[0018] The present invention is further provided that a guide rod is also installed on the side of the device housing. The guide rod is parallel to the first driving screw, and the gantry hanger is sleeved outside the first driving screw and the guide rod.
[0019] Preferably, it is convenient to move the position of the detection mechanism, so as to facilitate the detection of transistors on different stages.
[0020] The present invention is further configured such that an electric slide rail is installed at the top end of the sliding mechanism, a sliding groove matching the electric slide rail is opened at the bottom end of the moving table, and the electric slide rail drives the moving table to move on the sliding mechanism.
[0021] Preferably, it is convenient to move the moving table, so as to drive the engaging seat to move.
[0022] The present invention is further configured such that a driving cylinder is installed above the gantry hanger, the output end of the driving cylinder faces downward, and the output end of the driving cylinder is connected to a movable frame. A fixed frame is installed on the side surface of the movable frame, a motor is installed inside the fixed frame, a second driving screw connected to the motor is connected to the side surface of the fixed frame, and the detection mechanism is sleeved outside the second driving screw.
[0023] Preferably, it is convenient to move the position of the detection mechanism.
[0024] The present invention is further configured such that a moving sleeve is installed on the inner wall of the detection mechanism, the moving sleeve is in transmission connection with the first driving screw, the controller is fixed at the middle position of the detection mechanism, and one side of the controller extends to the outside of the detection mechanism. Heaters are installed on both sides of the controller inside the detection mechanism, and a power connection structure is installed between the heaters and the controller. The heaters are connected to the controller through the power connection structure. An air intake mechanism is fixed on the side surface of the heaters, and an inflation head is connected to the bottom end of the heaters and extends into the inside of the sealing head. A detection probe is installed at the bottom end of the detection table.
[0025] Preferably, it is convenient to heat the air flow, and spray the hot air flow through the inflation head, and it is convenient to detect the transistors through the detection probe.
[0026] The present invention is further configured such that a plug rod is installed at the bottom end of the stage, and a vent hole is opened in the inner wall of the plug rod. An installation groove is installed at the top end of the stage, and the transistor is installed inside the installation groove. A heating hole is opened at the middle position of the installation groove, diversion grooves are opened on both sides of the inner wall of the installation groove, plug slots are symmetrically opened on the inner wall of the installation groove with respect to the heating hole, and a power connection head is connected to the side surface of each group of plug slots.
[0027] Preferably, it is convenient to limit the stage and at the same time convenient for the air flow to enter the stage.
[0028] The present invention is further configured such that connection pipes are provided on both sides of the engaging plate, the connection pipes are aligned with the intake pipes, a sealing structure is installed between the intake pipes and the connection pipes, and a return spring is connected to the bottom end of the sealing structure.
[0029] Preferably, it is convenient to seal the slot to prevent impurities from entering the slot when not in use, which may affect the fixation.
[0030] The present invention is further configured such that a jet groove is provided at the top end of the engaging plate, the jet groove is aligned with the heating holes, and the jet groove protrudes outside the engaging seat. The carrier table is snap-connected to the engaging plate through the jet groove.
[0031] Preferably, it is convenient for air flow to enter the interior of the carrier table.
[0032] In summary, the present invention mainly has the following beneficial effects:
[0033] 1. By providing the moving table, the engaging seat and the carrier table, the present invention can fix multiple groups of transistors through the carrier table, then install the carrier table on the engaging seat, and then move the engaging seat into the device through the moving table, which is convenient for synchronously detecting multiple groups of transistors.
[0034] 2. By providing the detection mechanism, the engaging seat, the carrier table and the engaging plate, during the detection process, a heated air flow can be formed through the intake mechanism and the heating mechanism in the detection mechanism, and the hot air flow is injected into the engaging plate. A jet groove is provided at the top end of the engaging plate, which can inject the hot air flow into the interior of the carrier table and send it to the outside of the transistors through multiple heating holes, thereby heating the transistors. At the same time of heating, the power of the transistors is detected for temperature rise detection. Then, the heater is turned off, and the intake mechanism operates to inject normal temperature air flow into the carrier table, thereby cooling the transistors for detection and cooling detection, realizing variable temperature detection of the transistors.
[0035] 3. The present invention also provides the engaging seat and the carrier table, which can push the sealing mechanism to move through the insertion rod, so that the insertion rod is snap-connected to the engaging seat. At the same time, the engaging plate is inserted into the interior of the carrier table to further fix the carrier table and seal the air flow path, improving the efficiency of air flow. BRIEF DESCRIPTION OF THE DRAWINGS
[0036] Figure 1 is a schematic structural diagram of the present invention;
[0037] Figure 2 is a schematic structural diagram of the interior of the device of the present invention;
[0038] Figure 3 is a schematic structural diagram of the gantry hanger of the present invention;
[0039] Figure 4 Schematic structural diagram of the detection mechanism of the present invention when installed on the gantry hanger;
[0040] Figure 5 Schematic structural diagram of the detection mechanism of the present invention;
[0041] Figure 6 Schematic structural diagram of the interior of the detection mechanism of the present invention;
[0042] Figure 7 Schematic structural diagram of the mobile platform of the present invention when installed on the sliding mechanism;
[0043] Figure 8 Schematic structural diagram of the cross-section of the clamping seat of the present invention;
[0044] Figure 9 Schematic structural diagram of the installation of the clamping plate of the present invention;
[0045] Figure 10 Schematic structural diagram of the interior of the load platform of the present invention;
[0046] Figure 11 Schematic structural diagram of the clamping plate of the present invention.
[0047] Explanation of reference numerals in the drawings:
[0048] 1. Equipment housing; 101. Sealing door; 102. Closing cylinder; 103. Ventilation structure; 2. Driving mechanism; 201. First driving screw; 202. Guide rod; 3. Sliding mechanism; 301. Electric slide rail; 4. Mobile platform; 5. Gantry hanger; 501. Driving cylinder; 502. Movable frame; 503. Fixed frame; 504. Second driving screw; 6. Detection mechanism; 601. Moving sleeve; 602. Controller; 603. Intake mechanism; 604. Sealing head; 605. Inflating head; 606. Detection table; 607. Detection probe; 608. Power connection structure; 609. Heater; 7. Clamping seat; 701. Installation groove; 8. Load platform; 801. Insertion rod; 8011. Air guide hole; 802. Installation groove; 803. Heating hole; 804. Flow guide groove; 805. Plug-in slot; 806. Power connection head; 9. Clamping plate; 901. Connecting pipe; 902. Jet groove; 10. Intake pipe; 11. Sealing structure; 1101. Return spring. Detailed implementation manners
[0049] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention and should not be construed as limiting the present invention.
[0050] The following describes an embodiment of the present invention based on its overall structure.
[0051] First embodiment:
[0052] See also Figures 1 to 3 A power change detection device for a transistor at different temperatures includes a device housing 1, a sliding mechanism 3 and a moving platform 4 are installed inside the device housing 1, an electric slide rail 301 is installed at the top of the sliding mechanism 3, and a slide groove matching the electric slide rail 301 is opened at the bottom of the moving platform 4, and the electric slide rail 301 drives the moving platform 4 to move on the sliding mechanism 3, a driving mechanism 2 is installed on the side of the device housing 1, and the output end of the driving mechanism 2 is connected to a first driving screw 201, and a gantry hanger 5 is sleeved on the outer side of the first driving screw 201, and a guide rod 202 is also installed on the side of the device housing 1, the guide rod 202 is parallel to the first driving screw 201, and the gantry hanger 5 is sleeved on the outer sides of the first driving screw 201 and the guide rod 202, so as to facilitate the installation of the loading platform 8, and the detection mechanism 6 is driven by the gantry hanger to move above the loading platform 8.
[0053] See also Figures 4 to 7 A driving cylinder 501 is installed above the gantry hanger 5, and the output end of the driving cylinder 501 faces downward, and the output end of the driving cylinder 501 is connected to a movable frame 502, a fixed frame 503 is installed on the side of the movable frame 502, a motor is installed inside the fixed frame 503, and a second driving screw 504 connected to the motor is connected to the side of the fixed frame 503, the detection mechanism 6 is sleeved on the outside of the second driving screw 504, and a movable sleeve 601 is installed on the inner wall of the detection mechanism 6, and the movable sleeve 601 is transmission-connected to the first driving screw 201, which is convenient for the movement of the detection mechanism 6 and can detect transistors in different positions.
[0054] See also Figures 3 to 11, a controller 602, an air intake mechanism 603 and a heater 609 are installed inside the detection mechanism 6. The controller 602 is fixed at the middle position of the detection mechanism 6, and one side of the controller 602 extends to the outside of the detection mechanism 6. Heaters 609 are installed on both sides of the controller 602 inside the detection mechanism 6. A power connection structure 608 is installed between the heater 609 and the controller 602. The heater 609 is connected to the controller 602 through the power connection structure 608. The air intake mechanism 603 is fixed on the side of the heater 609. The bottom end of the heater 609 is connected to an inflation head 605, and the inflation head 605 extends into the inside of the sealing head 604. A detection probe 607 is installed at the bottom end of the detection table 606. A sealing head 604 and a detection table 606 are installed at the bottom end of the detection mechanism 6. Multiple sets of engaging seats 7 are installed at the top end of the moving table 4. Multiple sets of loading platforms 8 and engaging plates 9 are installed at the top end of each set of engaging seats 7. The engaging plate 9 is inserted into the installation groove 701 inside the engaging seat 7. The loading platform 8 is snap-connected to the engaging seat 7 through the engaging plate 9. Air inlet pipes 10 are provided on both sides of the engaging seat 7. The air inlet pipes 10 are connected to the sealing head 604, which is convenient for changing the temperature of the transistor and detecting the transistor during the temperature change process.
[0055] In the above embodiment, specifically, please refer to Figure 1 , a sealing door 101 is installed on the side of the equipment housing 1. A closing cylinder 102 is installed at the top end of the equipment housing 1. The output of the closing cylinder 102 is connected to the sealing door 101. A ventilation structure 103 is also installed at the top end of the equipment housing 1, which is convenient for opening the equipment and installing the transistor inside the equipment.
[0056] In the above embodiment, specifically, please refer to Figures 8 to 11, a plug rod 801 is installed at the bottom end of the stage 8, and an air guide hole 8011 is provided in the inner wall of the plug rod 801. Connecting pipes 901 are provided on both sides of the clamping plate 9. The connecting pipes 901 are aligned with the air inlet pipe 10. A sealing structure 11 is installed between the air inlet pipe 10 and the connecting pipe 901. A return spring 1101 is connected to the bottom end of the sealing structure 11. An air jet groove 902 is provided at the top end of the clamping plate 9. The air jet groove 902 is aligned with the heating hole 803, and the air jet groove 902 protrudes outside the clamping seat 7. The stage 8 is clamped and connected to the clamping plate 9 through the air jet groove 902. An installation groove 802 is installed at the top end of the stage 8. The transistor is installed inside the installation groove 802. A heating hole 803 is provided at the middle position of the installation groove 802. Flow guide grooves 804 are provided on both sides of the inner wall of the installation groove 802. The flow guide grooves 804 can facilitate the discharge of air flow from both sides of the transistor, avoiding loosening of the transistor caused by excessive air pressure. Plug-in slots 805 are symmetrically provided on the inner wall of the installation groove 802 with respect to the heating hole 803, and an electric connection head 806 is connected to the side of each group of plug-in slots 805, which can facilitate the heating of the transistor. And during the detection of the transistor, the stage 8 is limited by the plug rod 801 and the clamping plate 9.
[0057] When the transistor needs to be detected, first, the transistors are sequentially installed into the installation grooves 802 in the stage 8 in sequence, and the pins of the transistors are inserted into the plug-in slots 805. Then, the stage 8 with the transistors is installed on the clamping seat 7. The clamping plate 9 is inserted into the stage 8. The plug rod 801 at the bottom end of the stage 8 is inserted into the sealing structure 11 inside the clamping seat 7 and pushes the sealing structure 11 to open. Then, after multiple groups of stages 8 are installed in the clamping seat 7, the clamping seat 7 is installed on the moving platform 4. The electric slide rail 301 is started, and the moving platform 4 is moved inside the device. The closing cylinder 102 is started, and the closing cylinder 102 drives the closing door 101 to close;
[0058] When performing detection, first start the drive mechanism 2 to drive the first drive screw 201 to rotate. The first drive screw 201 drives the gantry hanger 5 to move. The gantry hanger 5 moves above the engagement seat 7. Subsequently, start the drive cylinder 501. The drive cylinder 501 pushes the movable frame 502 to move downward, so that the detection mechanism 6 approaches the carrier table 8. Then, drive the second drive screw 504 to rotate through the power structure to adjust the position of the detection mechanism 6, so that the detection mechanism 6 is aligned with a group of carrier tables 8. Subsequently, continue to start the drive cylinder 501 to push the sealing head 604 of the detection mechanism 6 to fit on the top of the engagement seat 7, and the inflation head 605 is aligned with the intake pipe 10. The detection table 606 fits above multiple groups of transistors, and the detection probe 607 fits with the power connection head 806. At this time, the transistor is powered on through the detection probe 607, thereby detecting the transistor. At the same time, start the intake mechanism 603 and the heater 609. The intake mechanism 603 pumps external air into the heater 609. The heater 609 heats the air. The heated air enters the intake pipe 10 through the inflation head 605. The hot air flow enters the clamping plate 9 through the intake pipe 10, the air guide hole 8011, and the connecting pipe 901, and finally enters the carrier table 8 through the air jet groove 902. The transistors are heated through multiple heating holes opened at the bottom of the carrier table 8, so that the temperature of the transistors continuously rises. At this time, the detection probe 607 detects the transistors with rising temperature, realizing the temperature-rising detection of the transistors;
[0059] When the temperature reaches the appropriate temperature, continuously detect the transistors. After the detection duration reaches the standard, turn off the heater 609. At this time, the intake mechanism 603 continues to operate, and the temperature of the air sent in is lower than the temperature of the transistors at this time, thereby cooling the transistors. At this time, the transistors are detected through the detection probe 607, realizing the temperature-lowering detection of the transistors;
[0060] After the transistors on a group of carrier tables 8 are detected, start the drive cylinder 501 to drive the detection mechanism 6 to move upward, and drive the detection mechanism 6 to move above another group of carrier tables 8 through the second drive screw 504, so as to detect the subsequent transistors.
[0061] Although the embodiments of the present invention have been shown and described, the specific embodiments are only explanations of the present invention and are not limitations to the invention. The specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples. After reading this specification, those skilled in the art can make modifications, substitutions, and variations without creative contributions to the embodiments according to needs, but as long as they are within the scope of the claims of the present invention, they are protected by the patent law.
Claims
1. A device for detecting power changes of a transistor at different temperatures, comprising a device housing (1), characterized in that: A sliding mechanism (3) and a moving platform (4) are installed inside the device housing (1), and the sliding mechanism (3) drives the moving platform (4) to move. A driving mechanism (2) is installed on the side of the device housing (1), and the output end of the driving mechanism (2) is connected to a first driving screw (201), and the outer side of the first driving screw (201) is sleeved with a gantry hanger (5), and the bottom end of the gantry hanger (5) is connected to a detection mechanism (6), and the bottom end of the detection mechanism (6) is installed with a sealing head (604) and a detection platform (606). The detection mechanism (6) is internally installed with a controller (602), an air intake mechanism (603) and a heater (609); a plurality of groups of snap-fit seats (7) are installed on the top of the movable platform (4); a plurality of groups of loading platforms (8) and snap-fit plates (9) are installed on the top of each group of snap-fit seats (7); the snap-fit plates (9) are inserted into the inside of the snap-fit seats (7); the loading platforms (8) are snap-fitted and connected to the snap-fit seats (7) through the snap-fit plates (9); air intake pipes (10) are provided on both sides of the snap-fit seats (7); and the air intake pipes (10) are connected to the sealing head (604).
2. The device for detecting power changes of transistors at different temperatures according to claim 1, characterized in that: A sealing door (101) is installed on the side of the device housing (1), a closing cylinder (102) is installed on the top of the device housing (1), the output of the closing cylinder (102) is connected to the sealing door (101), and a ventilation structure (103) is also installed on the top of the device housing (1).
3. The device for detecting power changes of transistors at different temperatures according to claim 1, characterized in that: A guide rod (202) is also installed on the side of the equipment housing (1), and the guide rod (202) is parallel to the first driving screw rod (201), and the gantry hanger (5) is sleeved on the outside of the first driving screw rod (201) and the guide rod (202).
4. The device for detecting power variation of transistors at different temperatures according to claim 1, characterized in that: An electric slide rail (301) is installed at the top end of the sliding mechanism (3), and a slide groove matching the electric slide rail (301) is provided at the bottom end of the moving platform (4). The electric slide rail (301) drives the moving platform (4) to move on the sliding mechanism (3).
5. The device for detecting power changes of transistors at different temperatures according to claim 1, characterized in that: A driving cylinder (501) is installed above the gantry hanger (5), the output end of the driving cylinder (501) faces downward, and the output end of the driving cylinder (501) is connected to a movable frame (502), a fixed frame (503) is installed on the side of the movable frame (502), a motor is installed inside the fixed frame (503), a second driving screw (504) connected to the motor is connected to the side of the fixed frame (503), and the detection mechanism (6) is sleeved on the outer side of the second driving screw (504).
6. The device for detecting power variation of transistors at different temperatures according to claim 1, characterized in that: A movable sleeve (601) is installed on the inner wall of the detection mechanism (6), and the movable sleeve (601) is drivingly connected to the first driving screw (201). The controller (602) is fixed at the middle position of the detection mechanism (6), and one side of the controller (602) extends to the outside of the detection mechanism (6). Heaters (609) are installed on both sides of the controller (602) inside the detection mechanism (6), and an electrical connection structure (608) is installed between the heater (609) and the controller (602). The heater (609) is connected to the controller (602) through the electrical connection structure (608). The air intake mechanism (603) is fixed on the side of the heater (609), and the bottom end of the heater (609) is connected to an inflation head (605), and the inflation head (605) extends to the inside of the sealing head (604). A detection probe (607) is installed at the bottom end of the detection platform (606).
7. The device for detecting power changes of transistors at different temperatures according to claim 1, characterized in that: A plug rod (801) is installed at the bottom end of the loading platform (8), and an air guide hole (8011) is provided on the inner wall of the plug rod (801). A mounting groove (802) is installed at the top end of the loading platform (8), and a transistor is installed inside the mounting groove (802). A heating hole (803) is provided in the middle of the mounting groove (802). Guide grooves (804) are provided on both sides of the inner wall of the mounting groove (802). Power plug grooves (805) are symmetrically provided on the inner wall of the mounting groove (802) with respect to the heating hole (803), and the sides of each group of power plug grooves (805) are connected to power connectors (806).
8. The device for detecting power variation of transistors at different temperatures according to claim 7, characterized in that: Connecting pipes (901) are provided on both sides of the clamping plate (9), the connecting pipes (901) are aligned with the air intake pipe (10), a sealing structure (11) is installed between the air intake pipe (10) and the connecting pipe (901), and a return spring (1101) is connected to the bottom end of the sealing structure (11).
9. The device for detecting power variation of transistors at different temperatures according to claim 7, characterized in that: The top of the clamping plate (9) is provided with an air jet groove (902), the air jet groove (902) is aligned with the heating hole (803), and the air jet groove (902) protrudes from the outside of the clamping seat (7), and the loading platform (8) is clamped and connected with the clamping plate (9) through the air jet groove (902).
Citation Information
Patent Citations
Detection device for testing high temperature resistance of transistor
CN215219044U
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