Temperature monitoring system and method for charging gun

Abstract

The invention is suitable for the technical field of charging gun temperature monitoring of a conversion gun line, and provides a temperature monitoring system and method for a charging gun, and the system comprises an obtaining calculation module, a data optimization module, a data comparison module, a marking module, and a channel control module. The acquisition and calculation module is used for acquiring voltage data in a plurality of groups of corresponding acquisition channels in a plurality of temperature detection chips and converting the voltage data into general data so as to determine corresponding range data; the data optimization module is used for establishing a temperature curve according to the general data corresponding to the acquisition channels and in combination with a time factor so as to determine qualified channels and count; and the data comparison module is used for comparing the acquired general data or temperature curves for multiple times and switching corresponding monitoring modes. According to the device, the problems that the temperature cannot be accurately monitored, the temperature error is large and a chip is easy to damage in a conversion gun line product are solved, and the effects of improving the acquisition and monitoring precision and improving the monitoring stability are achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of temperature monitoring of conversion gun line charging guns, and more specifically, to a temperature monitoring system and method for a charging gun. Background Art

[0002] A charging gun is generally connected to a charging pile. With the gradual increase in the market of electric vehicles, there are already some charging guns directly connected to household electricity through an adapter. However, such conversion gun line products generally do not adopt a temperature detection function. Even if some products adopt a temperature detection function, their temperature detection functions are not accurate.

[0003] Currently, it mainly relies on single-channel or dual-channel detection chips. During the actual charging process, the heating conditions in different areas inside the charging gun are complex and variable. Single-channel or dual-channel detection chips cannot comprehensively perceive these subtle temperature differences, thus easily generating temperature errors. Such errors not only affect the judgment of the true temperature of the charging gun but may also lead to a series of serious consequences. More troublesome is that the stability of such detection chips is poor and they are extremely easy to damage. In the case of frequent use of the charging gun and complex and variable charging environments, the chips may malfunction due to factors such as being unable to withstand high temperatures, humid environments, or instantaneous current surges. Once the chips are damaged, the temperature monitoring function of the charging gun will be paralyzed. This will not only cause the charging to suddenly stop during charging due to misjudging abnormal temperatures, bringing great inconvenience to users, but more seriously, it may cause the charging gun to be directly unusable, thereby affecting the entire charging process and even threatening the safety of the charging equipment and the surrounding environment.

[0004] Therefore, a temperature monitoring system and method for a charging gun are proposed to solve the above problems. Summary of the Invention

[0005] Aiming at the deficiencies of the existing technology, the purpose of the present invention is to provide a temperature monitoring method for a charging gun that improves the accuracy of acquisition and monitoring and the stability of monitoring.

[0006] To achieve the above purpose, the present invention provides the following technical solutions: A temperature monitoring system and method for a charging gun, including:

[0007] An acquisition and calculation module, configured to acquire voltage data in multiple acquisition channels corresponding to a plurality of temperature detection chips, convert it into general data, and determine corresponding range data;

[0008] A data optimization module, configured to establish a temperature curve based on the general data corresponding to the acquisition channels and in combination with time factors to determine qualified channels and count;

[0009] A data comparison module, which is used to compare the acquired general data or temperature curves multiple times and switch the corresponding monitoring methods;

[0010] A marking module, which is used to mark the acquisition channels as abnormal channels, qualified channels, invalid channels, and adjacent comparison channels;

[0011] A channel control module, which is used to control the data transmission channel or the acquisition channel to be connected or disconnected;

[0012] The present invention is further configured as:

[0013] The acquisition and calculation module includes an acquisition unit, a conversion unit, and a calculation unit;

[0014] The acquisition unit acquires the voltage data of the thermistor through multiple groups of acquisition channels;

[0015] The conversion unit is used to convert multiple groups of voltage data into multiple groups of general data;

[0016] The calculation unit calculates the range data through multiple groups of general data;

[0017] The present invention is further configured as:

[0018] The data optimization module includes a curve generation unit and a counting unit;

[0019] The curve generation unit is used to monitor the acquisition channels and generate a temperature curve according to time and general data;

[0020] The counting unit is used to record the number of qualified channels, denoted as the qualified count x;

[0021] The present invention is further configured as:

[0022] The data comparison module includes a primary comparison unit, a secondary comparison unit, a tertiary comparison unit, and a quaternary comparison unit;

[0023] The primary comparison unit is used to compare whether the general data of multiple acquisition channels in the temperature detection chip are all within the range data;

[0024] The secondary comparison unit is used to compare whether the temperature curves of the temperature detection chip are consistent in trend in the case of general data outside the range data after the primary comparison unit executes;

[0025] The tertiary comparison unit is used to compare whether the trend of the temperature curve of the abnormal channel is consistent with the trend of the temperature curves of multiple adjacent comparison channels in the case of inconsistent temperature curves after the secondary comparison unit executes;

[0026] The fourth comparison unit is used to compare whether the qualified count x is greater than 1 for the phenomenon of inconsistent temperature curves after the third comparison unit is executed.

[0027] The present invention is further configured as:

[0028] S1. Obtain voltage data in multiple acquisition channels corresponding to a number of temperature detection chips, and convert it into general data;

[0029] S2. Calculate range data from multiple general data;

[0030] S3. Compare whether multiple general data in each temperature detection chip are all within the range data;

[0031] If multiple general data are all within the range data, jump to S11;

[0032] If there is one general data outside the range data, jump to S4;

[0033] S4. For the case where there is general data outside the range data, monitor multiple acquisition channels in the corresponding temperature detection chip, and establish a temperature curve based on the general data of the corresponding acquisition channels and time factors;

[0034] S5. Compare whether the temperature curves in the same temperature detection chip have the same trend;

[0035] If the trends of multiple temperature curves are all the same, jump to S11;

[0036] If there is one temperature curve with an inconsistent trend, mark the acquisition channel corresponding to the inconsistent temperature curve trend as an abnormal channel, and mark the acquisition channels with consistent temperature curve trends of the remaining temperature detection chips as qualified channels; then mark multiple acquisition channels in at least one adjacent set of temperature detection chips of the temperature detection chip where the abnormal channel is located as adjacent comparison channels, and jump to S6;

[0037] S6. Monitor the abnormal channel and multiple adjacent comparison channels through an integrated chip, and generate multiple temperature curves again respectively;

[0038] S7. Compare whether the trend of the temperature curve of the abnormal channel is the same as the trends of the temperature curves of multiple adjacent comparison channels;

[0039] If the temperature curve corresponding to the abnormal channel is the same as the temperature curve corresponding to at least one adjacent comparison channel, jump to S11;

[0040] If the temperature curve corresponding to the abnormal channel is different from the temperature curves corresponding to multiple adjacent comparison channels, jump to S8;

[0041] S8. Mark the anomaly channels with consistent trends as qualified channels again, and mark the anomaly channels with inconsistent trends as invalid channels;

[0042] S9. Record the number of qualified channels to obtain the qualified count x;

[0043] S10. Compare whether the qualified count x is greater than 1;

[0044] If the number of the qualified count x is not greater than 1, then jump to S12;

[0045] If the number of the qualified count x is greater than 1, then disconnect the invalid channels, and keep the remaining acquisition channels and the qualified channels connected;

[0046] S11. Keep the data transmission channel connected;

[0047] S12. The monitoring ends, and the data transmission channel is disconnected.

[0048] By adopting the above technical solution, through the comparison of the acquired data or the curves formed by the data, the data transmission channels of the thermistors that may be damaged are eliminated, avoiding the problem of temperature distortion in the obtained results caused by the damage of the thermistors, thereby improving the accuracy of temperature monitoring.

[0049] The present invention is further configured that: the calculation formula of the general data is:

[0050] T = Vk

[0051] Wherein, T is the general data, V is the voltage data, k is the magnification factor, and k > 0;

[0052] By adopting the above technical solution, by using the general data, on the one hand, the speed and efficiency of internal operations can be improved, and on the other hand, by testing to obtain the optimal value of k, the accuracy of the general data is improved, making the subsequent monitoring accuracy higher.

[0053] The present invention is further configured that: the calculation formula of the range data is:

[0054] p - (j × i - u) ≤ G ≤ p + (j × i - u)

[0055] Wherein, G is the range data, p is the average value, i is the magnification factor of the temperature value, u is the deviation value, and j is the allowable deviation temperature value.

[0056] The present invention is further configured that: the monitoring time in S4 is 1 s.

[0057] The present invention is further configured that: the monitoring time in S6 is 2 s.

[0058] The present invention is further configured that: the temperature curve is a trend graph of time and general data.

[0059] In summary, the present application includes at least one of the following beneficial technical effects:

[0060] 1. By comparing the collected data or the curves formed by the data, the data transmission channels of the thermistors that may be damaged are eliminated, avoiding the problem of temperature distortion in the obtained results caused by thermistor damage, thereby improving the accuracy of temperature monitoring.

[0061] 2. Through the general data, on the one hand, the speed and efficiency of internal operations can be improved, and on the other hand, by testing, the optimal value of k can be obtained to improve the accuracy of the general data, making the subsequent monitoring accuracy higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0062] Figure 1 It is a schematic diagram of the relationship of the temperature monitoring system of the charging gun of the present invention;

[0063] Figure 2 It is a schematic diagram of the relationship of the integrated chip, temperature detection chip and thermistor of the present invention;

[0064] Figure 3 It is a specific connection schematic diagram of the integrated chip, temperature detection chip and thermistor of the present invention;

[0065] Figure 4 It is a schematic diagram of the trend of the temperature curve of the charging gun of the present invention;

[0066] Figure 5 It is a schematic diagram of the steps of the temperature monitoring method S1 - S4 of the charging gun of the present invention;

[0067] Figure 6 It is a schematic diagram of the steps of the temperature monitoring method S4 - S8 of the charging gun of the present invention;

[0068] Figure 7 It is a schematic diagram of the steps of the temperature monitoring method S8 - S10 of the charging gun of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0069] It should be noted that, without conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the drawings and in combination with the embodiments.

[0070] It should be pointed out that unless otherwise specified, all technical and scientific terms used in the present application have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present application belongs.

[0071] Please refer to Figures 1-7 , the present invention provides the following technical solutions:

[0072] Embodiment 1, a temperature monitoring system for a charging gun, refer toFigure 1 , including:

[0073] An acquisition and calculation module, configured to acquire voltage data in multiple acquisition channels corresponding to several temperature detection chips, and convert it into general data to determine corresponding range data;

[0074] A data optimization module, configured to establish a temperature curve based on the general data corresponding to the acquisition channels and in combination with time factors to determine qualified channels and count;

[0075] A data comparison module, configured to compare the acquired general data or temperature curves multiple times and switch the corresponding monitoring method, for example, disconnect a certain acquisition channel that does not meet the requirements;

[0076] A marking module, configured to mark the acquisition channels as abnormal channels, qualified channels, invalid channels, and adjacent comparison channels according to the results obtained by the data comparison module; An abnormal channel is an acquisition channel with inconsistent temperature curve trends within the same temperature detection chip, a qualified channel is an acquisition channel with consistent temperature curve trends within the same temperature detection chip, an adjacent comparison channel is multiple acquisition channels within at least one adjacent set of temperature detection chips of the temperature detection chip where the abnormal channel is located, and an invalid channel is an acquisition channel whose corresponding temperature curve has inconsistent trends with the temperature curves of multiple adjacent comparison channels;

[0077] A channel control module, configured to control the data transmission channel or the acquisition channel to be connected or disconnected;

[0078] The acquisition and calculation module includes an acquisition unit, a conversion unit, and a calculation unit;

[0079] The acquisition unit acquires voltage data of the thermistor through multiple acquisition channels;

[0080] The conversion unit is configured to convert multiple sets of voltage data into multiple sets of general data;

[0081] The calculation unit calculates range data through multiple sets of general data;

[0082] The data optimization module includes a curve generation unit and a counting unit;

[0083] The curve generation unit is configured to monitor the acquisition channels and generate a temperature curve based on time and general data;

[0084] The counting unit is configured to record the number of qualified channels, denoted as qualified count x;

[0085] The data comparison module includes a primary comparison unit, a secondary comparison unit, a tertiary comparison unit, and a quaternary comparison unit;

[0086] The primary comparison unit is configured to compare whether the general data of multiple acquisition channels within the temperature detection chip are all within the range data;

[0087] The secondary comparison unit is used to compare whether the trends of multiple temperature curves of the temperature detection chip are consistent after the primary comparison unit is executed for the phenomenon that there is common data outside the range data;

[0088] The tertiary comparison unit is used to compare whether the trends of the temperature curve of the abnormal channel and the temperature curves of multiple adjacent comparison channels are consistent after the secondary comparison unit is executed for the phenomenon that the temperature curves are inconsistent;

[0089] The quaternary comparison unit is used to compare whether the qualified count x is greater than 1 after the tertiary comparison unit is executed for the phenomenon that the temperature curves are inconsistent.

[0090] Embodiment 2, refer to Figures 2-7 , a temperature monitoring method for a charging gun, comprising the following steps:

[0091] S1. Obtain voltage data in multiple acquisition channels corresponding to several temperature detection chips through an acquisition unit, and convert it into common data through a conversion unit;

[0092] Among them, the calculation formula of the common data is:

[0093] T = Vk

[0094] T is the common data, V is the voltage data, k is the magnification factor, k > 0; in an ideal state, when the temperature reaches the upper limit of the thermistor, the voltage data V is 3.3V. For the convenience of internal calculation of the chip, the common data T is usually set to 65535. At this time, the magnification factor k is about 19859;

[0095] Using the common data for calculation can, on the one hand, improve the speed and efficiency of internal operations. On the other hand, the change rates of each thermistor are inconsistent, and the voltage upper limits are high and low. It is necessary to obtain an ideal magnification factor k through certain tests. The common data calculated through different values of k is more accurate, and the subsequent monitoring accuracy is higher.

[0096] Refer to Figures 2-3, the integrated chip has multiple data transmission channels, namely D1, D2, D3...Dn, the integrated chip is connected to multiple temperature detection chips, the data transmission channels are connected to the temperature detection chips in a one-to-one correspondence, that is, the data transmission channel D1 is connected to the temperature detection chip R1, and so on, there are n temperature detection chips in total, R1, R2, R3...Rn; the temperature detection chip has multiple acquisition channels, and one temperature detection chip is connected to multiple thermistors. For example, in the temperature detection chip R1, there are acquisition channels D1 a1, D1 a2, D1 a3...D1 an, and there are m thermistors connected to one temperature detection chip in total, and the acquisition channels are connected to the thermistors in a one-to-one correspondence, that is, the temperature detection chip R1 has R1 r1, R1 r2, R1r3...R1 rm, the acquisition channel D1 a1 is connected to the thermistor R1 r1, and the remaining acquisition channels and thermistors of the temperature detection chip are analogous;

[0097] By connecting the temperature detection chip to the integrated chip for temperature monitoring, the pins of the integrated chip can be reduced, thereby effectively controlling the cost of the integrated chip. The collected data can then be sent to the integrated chip for overall calculation. In addition, the temperature detection chip can have a reserved pin to increase the redundancy of the charging gun temperature monitoring. After a pin fails, the operator can quickly repair it by replacing the thermistor from the damaged pin to the reserved pin.

[0098] S2, calculating the range data by using a calculation unit to calculate the multiple common data;

[0099] The calculation formula for range data is:

[0100] p-(j×iu)≤G≤p+(j×iu)

[0101] G is the range data, p is the general average value, i is the temperature value magnification, u is the deviation value, and j is the allowable deviation temperature value, which is generally set to 1°C; for example, when p is 20000, j is 1, i is 10000, and u is 8000, 18000≤G≤22000;

[0102] S3, comparing multiple common data in each temperature detection chip by a primary comparison unit to see whether they are all within the range data;

[0103] If multiple common data are within the range data, jump to S11;

[0104] If there is a common data outside the range data, jump to S4;

[0105] For example, after multiple acquisition channels in the temperature detection chip R1 respectively acquire and calculate general data, compare each general data with the range data. If all the general data are within the range data, jump to S11; if more than one general data is outside the range data, jump to S4.

[0106] S4. For the case where there is general data outside the range data, monitor multiple acquisition channels in the corresponding temperature detection chip for 1 s, and use the curve generation unit to establish a temperature curve based on the general data of the corresponding acquisition channels and time factors.

[0107] Among them, refer to Figure 4 , the temperature curve is the trend of time and general data.

[0108] S5. Use the secondary comparison unit to compare whether the temperature curves in the same temperature detection chip have the same trend.

[0109] If the trends of multiple temperature curves are all the same, jump to S11.

[0110] If there is a temperature curve with a different trend, use the marking module to mark the acquisition channels corresponding to the inconsistent temperature curve trend as abnormal channels, and mark the acquisition channels with the same temperature curve trend as qualified channels; then mark multiple acquisition channels in at least one adjacent set of temperature detection chips of the temperature detection chip where the abnormal channel is located as adjacent comparison channels, and jump to S6.

[0111] For example, when the multiple temperature curves generated in the temperature detection chip R2 are all the same, jump to S11. When there are temperature curves D2a2 and D2a3 in the multiple temperature curves generated in the temperature detection chip R2 that are inconsistent with other temperature curves, mark the acquisition channels D2a2 and D2a3 with inconsistent temperature curve trends as abnormal channels, mark the acquisition channels with the same temperature curve trend as qualified channels, mark all the acquisition channels in the two adjacent temperature detection chips R1 and R3 of the temperature detection chip R2 as adjacent comparison channels, and jump to S6.

[0112] Because there are also certain differences between the thermistors of the same model of finished products, there are errors in accuracy, but they are still qualified thermistors. Their trends within a certain period of time are the same as those of other thermistors, and they can still be used as the basis for temperature monitoring. Through the above steps, the possibility of misjudgment is avoided, the acquisition accuracy is further improved, and the risk of economic losses caused by misjudgment is reduced.

[0113] S6. Use the integrated chip to monitor the abnormal channels and multiple adjacent comparison channels for 2 s, and use the curve generation unit to generate multiple temperature curves again.

[0114] According to the above example, by integrating the chip to monitor the abnormal channels D2a2 and D2a3 in the temperature detection chip R2 and all the acquisition channels of the adjacent temperature detection chips R1 and R3, that is, the adjacent comparison channels, monitor for 2s, and generate temperature curves respectively.

[0115] S7. Compare whether the trends of the temperature curves of the abnormal channels and the temperature curves of multiple adjacent comparison channels are consistent through the three - comparison unit;

[0116] If the trend of the temperature curve corresponding to the abnormal channel is consistent with the trend of the temperature curve corresponding to at least one adjacent comparison channel, then jump to S11;

[0117] If the trend of the temperature curve corresponding to the abnormal channel is inconsistent with the trends of the temperature curves corresponding to multiple adjacent comparison channels, then jump to S8;

[0118] According to the above example, if the temperature curves of the two abnormal channels D2a2 and D2a3 can find temperature curves with consistent trends in the temperature curves of the acquisition channels in the temperature detection chips R1 and R3, then jump to S11; if the temperature curve of any one of the abnormal channels D2a2 and D2a3 cannot find a temperature curve with a consistent trend among all the temperature curves of the temperature detection chips R1 and R3, then jump to S8;

[0119] By comparing the temperature curve of the abnormal channel with the temperature curves of the adjacent temperature detection chips, the possibility of misjudgment is further avoided, and the data accuracy is improved.

[0120] S8. Mark the abnormal channels with consistent trends as qualified channels again through the marking module, and mark the abnormal channels with inconsistent trends as invalid channels;

[0121] According to the above example, among the abnormal channels D2a2 and D2a3, if the temperature curve of the abnormal channel D2a2 is consistent with the trend of any one of the temperature curves in the temperature detection chips R1 and R3, it is marked as a qualified channel, and if the temperature curve of the abnormal channel D2a3 is inconsistent with all the temperature curves in the temperature detection chips R1 and R3, it is marked as an invalid channel.

[0122] S9. Record the number of qualified channels through the counting unit to obtain the qualified count x;

[0123] S10. Compare whether the qualified count x is greater than 1 through the four - comparison unit;

[0124] If the number of the qualified count x is not greater than 1, then jump to S12;

[0125] If the number of the qualified count x is greater than 1, then disconnect the invalid channels through the channel control module, and keep the remaining acquisition channels and qualified channels connected;

[0126] When only one data transmission channel can be used, the temperature detection chip corresponding to this group cannot calculate and judge the average value. Therefore, only when there are more than one data transmission channels can the temperature detection chip corresponding to this group work properly, avoiding the situation of incomparability, improving the stability of monitoring, and ensuring the accuracy of temperature monitoring.

[0127] S11. Keep the data transmission channel connected through the channel control module;

[0128] S12. After the monitoring ends, disconnect the data transmission channel through the channel control module.

[0129] Obviously, the above-described embodiments are only a part of the embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

Claims

1. A temperature monitoring system for a charging gun, characterized in that: include: An acquisition calculation module is used to acquire voltage data in multiple groups of acquisition channels corresponding to a plurality of temperature detection chips and convert the voltage data into general data to determine corresponding range data; Data optimization module, used to establish temperature curve according to the general data corresponding to the acquisition channel and combined with time factors to determine qualified channels and count them; Data comparison module, used to compare the acquired general data or temperature curves multiple times and switch the corresponding monitoring mode; A marking module is used to mark the acquisition channels as abnormal channels, qualified channels, invalid channels and adjacent channels; The channel control module is used to control the data transmission channel or the acquisition channel to be turned on or off.

2. A temperature monitoring system for a charging gun according to claim 1, characterized in that: The acquisition and calculation module includes an acquisition unit, a conversion unit, and a calculation unit; The acquisition unit acquires voltage data of the thermistor through multiple groups of acquisition channels; The conversion unit is used to convert multiple groups of voltage data into multiple groups of general data; The calculation unit calculates the range data through multiple sets of general data.

3. A temperature monitoring system for a charging gun according to claim 2, characterized in that: The data optimization module includes a curve generation unit and a counting unit; The curve generating unit is used to monitor the acquisition channel and generate a temperature curve according to time and general data; The counting unit is used to record the number of qualified channels, which is recorded as qualified count x.

4. A temperature monitoring system for a charging gun according to claim 3, characterized in that: The data comparison module includes a primary comparison unit, a secondary comparison unit, a tertiary comparison unit, and a quaternary comparison unit; The primary comparison unit is used to compare whether the common data of multiple acquisition channels in the temperature detection chip are all within the range data; The secondary comparison unit is used to compare whether the trends of multiple temperature curves of the temperature detection chip are consistent after the execution of the primary comparison unit in view of the phenomenon that the common data is outside the range data; The tertiary comparison unit is used to compare the trend of the temperature curve of the abnormal channel with the temperature curves of multiple adjacent channels to see whether they are consistent after the secondary comparison unit is executed in response to the phenomenon of inconsistent temperature curves; The four-time comparison unit is used to compare whether the qualified count x is greater than 1 after the three-time comparison unit is executed for the phenomenon of inconsistent temperature curves.

5. A method for monitoring the temperature of a charging gun, using a temperature monitoring system for a charging gun as claimed in claim 4, characterized in that: The following steps are involved: S1, obtaining voltage data in multiple groups of acquisition channels corresponding to a number of temperature detection chips, and converting them into general data; S2, calculating multiple common data to obtain range data; S3, comparing whether the plurality of common data in each temperature detection chip are all within the range data; If multiple common data are within the range data, jump to S11; If there is a common data outside the range data, jump to S4; S4. If there is a situation where the general data is outside the range data, monitor multiple acquisition channels in the corresponding temperature detection chip, and establish a temperature curve according to the general data of the corresponding acquisition channel and the time factor; S5, comparing whether the temperature curves in the same temperature detection chip have the same trend; If the trends of multiple temperature curves are consistent, jump to S11; If there is a temperature curve with inconsistent trend, the acquisition channel corresponding to the inconsistent temperature curve trend is marked as an abnormal channel, and the other acquisition channels with consistent temperature curve trends are marked as qualified channels; Then, multiple acquisition channels in at least one group of temperature detection chips adjacent to the temperature detection chip where the abnormal channel is located are marked as adjacent channels, and the process jumps to S6; S6, monitoring the abnormal channel and multiple adjacent channels through the integrated chip, and generating multiple temperature curves again; S7, comparing the trends of the temperature curve of the abnormal channel and the temperature curves of multiple adjacent channels to see whether they are consistent; If the temperature curve corresponding to the abnormal channel is consistent with the trend of the temperature curve corresponding to at least one adjacent channel, jump to S11; If the temperature curve corresponding to the abnormal channel is inconsistent with the trend of the temperature curves corresponding to multiple adjacent channels, jump to S8; S8, marking the abnormal channels with consistent trends as qualified channels again, and marking the abnormal channels with inconsistent trends as invalid channels; S9, record the number of qualified channels and obtain the qualified count x; S10, comparing whether the qualified count x is greater than 1; If the number of qualified counts x is not greater than 1, jump to S12; If the number of qualified counts x is greater than 1, the invalid channel is disconnected, and the remaining acquisition channels and the qualified channel remain connected; S11, keep the data transmission channel connected; S12: Monitoring is completed and the data transmission channel is disconnected.

6. A temperature monitoring method for a charging gun according to claim 5, characterized in that: The calculation formula of the general data in S2 is: T=Vk Wherein, T is general data, V is voltage data, k is amplification factor, and k>0.

7. The temperature monitoring method of a charging gun according to claim 5, characterized in that: The calculation formula for the range data in S3 is: p-(j×iu)≤G≤p+(j×iu) Wherein, G is the range data, p is the average value of multiple groups of the general data, i is the temperature value magnification, u is the deviation value, and j is the allowable deviation temperature value.

8. The temperature monitoring method of a charging gun according to claim 5, characterized in that: The monitoring time in S4 is 1 second.

9. The temperature monitoring method of a charging gun according to claim 5, characterized in that: The monitoring time in S6 is 2 seconds.

10. The temperature monitoring method of a charging gun according to claim 5, characterized in that: The temperature curve is a trend diagram of time and general data.

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