Test circuit, test tool, open-circuit voltage measurement system and method

Abstract

The invention relates to a test circuit, a test tool, and an open-circuit voltage measurement system and method. The test circuit comprises a resistor, a switch assembly and a connecting end; the switch assembly comprises a first switch group and a second switch group; the connecting end is connected with the resistor through the first switch group to form a resistor test circuit, and the resistor test circuit is used for forming a resistor test loop; and the connecting end is also connected with the second switch group to form a zero clearing test circuit, and the zero clearing test circuit is used for forming a zero clearing test loop. By adopting the method, the timeliness of calibrating the open-circuit voltage measuring device can be improved.

Description

Technical Field

[0001] The present application relates to the field of new energy technologies, and in particular, to a test circuit, a test tooling, an open-circuit voltage measurement system, and a method. Background Art

[0002] After the battery is produced, it is necessary to use an open-circuit voltage (OCV) measurement device to measure the battery to obtain the internal resistance value, the open-circuit voltage value, etc. In related technologies, in order to improve the accuracy of the open-circuit voltage measurement device for battery measurement, after a period of time, it is necessary to test the open-circuit voltage measurement device through a test tooling to perform calibration of the open-circuit voltage measurement device.

[0003] However, when using the test tooling in related technologies to test the open-circuit voltage measurement device, there is a problem of long time consumption, resulting in low test efficiency of the open-circuit voltage measurement device and inability to calibrate the open-circuit voltage measurement device in time. Summary of the Invention

[0004] Based on this, the present application provides a test circuit, a test tooling, an open-circuit voltage measurement system, and a method, which can improve the timeliness of calibrating the open-circuit voltage measurement device.

[0005] In a first aspect, the present application provides a test circuit. The test circuit includes a resistor, a switch assembly, and a connection terminal; the switch assembly includes a first switch group and a second switch group; the connection terminal is connected to the resistor through the first switch group to form a resistor test circuit, and the resistor test circuit is used to form a resistor test loop; the connection terminal is also connected to the second switch group to form a zero-clearing test circuit, and the zero-clearing test circuit is used to form a zero-clearing test loop.

[0006] In the technical solution provided by the embodiment of the present application, the test circuit not only includes a resistance test circuit, but also includes a zero clearing test circuit, so that not only a resistance test loop can be formed, but also a zero clearing test loop can be formed. Furthermore, not only can the calibration of the open-circuit voltage measuring device be realized through the resistance test loop, but also the calibration of the open-circuit voltage measuring device can be realized through the zero clearing test loop, enabling the realization of the resistance test function and the zero clearing test function with a single movement of the test circuit, without the need to separately move the resistance test tooling and the zero clearing test tooling. This not only avoids the delay in calibration caused by multiple movements of the test tooling, but also, when the test circuit is moved to the measurement area of the open-circuit voltage measuring device, there is no need to clear the occupancy of other positions, avoiding the long time consumed in clearing the occupancy and further delaying the calibration of the open-circuit voltage measuring device. Therefore, the embodiment of the present application improves the timeliness of calibrating the open-circuit voltage measuring device; in addition, the test circuit in the embodiment of the present application can realize the function of zero clearing test without setting a zero clearing block, thus reducing the cost of the test circuit.

[0007] In some embodiments, the switch assembly is used to switch between a first working state and a second working state; when the switch assembly is in the first working state, the first switch group is turned on and the second switch group is turned off to make the resistance test loop conductive and the zero clearing test loop non-conductive; when the switch assembly is in the second working state, the first switch group is turned off and the second switch group is turned on to make the resistance test loop non-conductive and the zero clearing test loop conductive.

[0008] In the technical solution provided by the embodiment of the present application, by using the switch assembly to switch between a first working state and a second working state, the conduction of the resistance test loop or the zero clearing test loop is realized, and there will be no situation where both loops are conductive or both loops are non-conductive at the same time, improving the effectiveness of loop switching; moreover, different loops can be flexibly conducted as needed, effectively avoiding mutual interference between different measurement loops, and further improving the accuracy of calibration of the open-circuit voltage measuring device.

[0009] In some embodiments, when the control terminals of the first switch group and the second switch group are both powered on, the first switch group is turned on and the second switch group is turned off; when the control terminals of the first switch group and the second switch group are both powered off, the first switch group is turned off and the second switch group is turned on; or, when the control terminals of the first switch group and the second switch group are both powered on, the first switch group is turned off and the second switch group is turned on; when the control terminals of the first switch group and the second switch group are both powered off, the first switch group is turned on and the second switch group is turned off.

[0010] In the technical solution provided by the embodiment of the present application, the change of the working states of the first switch group and the second switch group is controlled by powering on and powering off the power supply terminal, without the need for an additional control circuit to control the working states of the first switch group and the second switch group, which simplifies the circuit design of the test circuit and reduces the complexity of the test circuit.

[0011] In some embodiments, the switches in the first switch group are normally closed switches, and the switches in the second switch group are normally open switches; or, the switches in the first switch group are normally open switches, and the switches in the second switch group are normally closed switches.

[0012] In the technical solution provided by the embodiment of the present application, since the first switch group is a normally closed switch and the second switch group is a normally open switch, the conduction of the resistance test circuit can be achieved without powering on the first switch group and the second switch group. The usage frequency of the resistance test circuit is much higher than that of the zero clearing test circuit. Therefore, the conduction of the resistance test circuit can be avoided by powering on the test circuit additionally, which not only improves the conduction efficiency of the resistance test circuit but also reduces the test power consumption.

[0013] In some embodiments, the connection terminals include a positive voltage connection terminal, a positive current connection terminal, a negative voltage connection terminal, and a negative current connection terminal; both the positive voltage connection terminal and the negative voltage connection terminal are connected to the resistor through the first switch group to form a voltage test circuit in the resistance test circuit; both the positive current connection terminal and the negative current connection terminal are connected to the resistor through the first switch group to form a current test circuit in the resistance test circuit; the positive voltage connection terminal is also connected to the negative voltage connection terminal through the second switch group to form a voltage test circuit in the zero clearing test circuit; the positive current connection terminal is also connected to the negative current connection terminal through the second switch group to form a current test circuit in the zero clearing test circuit.

[0014] In the technical solution provided by the embodiment of the present application, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal are respectively connected to the four test probes of the open circuit voltage measuring device, which can not only form a voltage test circuit and a current test circuit in the resistance test circuit but also form a voltage test circuit and a current test circuit in the zero clearing test circuit. Through the voltage test circuit and the current test circuit in the resistance test circuit, the accuracy of the open circuit voltage measuring device for resistance measurement is improved. Through the voltage test circuit and the current test circuit in the zero clearing test circuit, the accuracy of the open circuit voltage measuring device for zero clearing is improved, thereby improving the accuracy of the calibration and calibration of the open circuit voltage measuring device.

[0015] In some embodiments, the first switch group includes a first switch, a second switch, and a third switch; the second switch group includes a fourth switch and a fifth switch; the positive voltage connection terminal is connected to the first end of a resistor through the first switch, and the second end of the resistor is connected to the negative voltage connection terminal through the second switch; the positive current connection terminal is connected to the first end of the resistor through the third switch, and the second end of the resistor is connected to the negative current connection terminal through the second switch; the positive current connection terminal is connected to the negative current connection terminal through the fourth switch, the negative current connection terminal is connected to the negative voltage connection terminal through the second switch, and the negative voltage connection terminal is connected to the positive voltage connection terminal through the fifth switch.

[0016] In the technical solution provided by the embodiments of the present application, the positive voltage connection terminal and the positive current connection terminal are connected to the negative voltage connection terminal and the negative current connection terminal through the first switch, the second switch, the third switch, and the resistor. The positive voltage connection terminal and the positive current connection terminal are also connected to the negative voltage connection terminal and the negative current connection terminal through the fourth switch and the fifth switch. Therefore, by controlling the on / off of the first switch to the fifth switch, the resistance test circuit can be turned on or the zero-clear test circuit can be turned on, improving the effectiveness of control. Moreover, each two components are isolated by a switch, so that interference between the resistance test circuit and the zero-clear test circuit can be avoided, improving the accuracy of the test.

[0017] In some embodiments, the second switch includes a first relay and a second relay; the normally open terminal of the first relay is connected to the normally open terminal of the second relay; the common terminal and the normally closed terminal of the first relay are respectively connected to the negative voltage connection terminal and the second end of the resistor; the common terminal and the normally closed terminal of the second relay are respectively connected to the negative current connection terminal and the second end of the resistor.

[0018] In the technical solution provided by the embodiments of the present application, by connecting the normally open terminal of the first relay to the normally open terminal of the second relay, when the first relay and the second relay are in the off state, the negative voltage connection terminal and the negative current connection terminal form a path through the normally open terminals of the first relay and the second relay. Furthermore, when the first relay and the second relay are in the on state, the resistance test circuit is turned on, and when the first relay and the second relay are in the off state, the zero-clear test circuit is turned on. In this way, the first relay and the second relay can be reused in the resistance test circuit and the zero-clear test circuit, improving the utilization efficiency of the first relay and the second relay.

[0019] In some embodiments, the second switch includes a third relay and a fourth relay, and the second switch group further includes a fifth relay; the third relay is connected between the second end of the resistor and the negative voltage connection terminal; the fourth relay is connected between the second end of the resistor and the negative current connection terminal; the fifth relay is connected between the negative voltage connection terminal and the negative current connection terminal.

[0020] In the technical solution provided by the embodiment of the present application, the conduction or disconnection of the resistance test circuit is controlled by the third relay and the fourth relay, and the conduction or disconnection of the zero-clearing test circuit is controlled by the fifth relay. Therefore, the on-off of each relay only determines the on-off of one of the resistance test circuit and the zero-clearing test circuit, and has nothing to do with the on-off of the other circuit, avoiding the mutual interference between the resistance test circuit and the zero-clearing test circuit, and improving the reliability of circuit control.

[0021] In some embodiments, the connection end includes a first connection end and a second connection end; the relative position between the first connection end and the second connection end is the same as the relative position between the positive parameter connection terminal and the negative parameter connection terminal in the battery tray; wherein, the positive parameter connection terminal and the negative parameter connection terminal are respectively connected to the positive electrode and the negative electrode of the battery to be tested in the battery tray.

[0022] In the technical solution provided by the embodiment of the present application, the relative position between the first connection end and the second connection end is the same as the relative position between the positive parameter connection terminal and the negative parameter connection terminal in the battery tray. Therefore, the connection manner of the test probe of the open-circuit voltage measuring device to the first connection end and the second connection end is the first manner, and the connection manner of the test probe of the open-circuit voltage measuring device to the positive parameter connection terminal and the negative parameter connection terminal is the second manner. The first manner and the second manner are the same, thereby simplifying the connection manner of the test probe, and there is no need for additional adaptation or adjustment during the test of the open-circuit voltage measuring device, improving the versatility of the open-circuit voltage measuring device.

[0023] In a second aspect, the present application provides a test tooling, which includes a base and a bottom plate disposed on the base, and at least one test circuit as described in any item of the first aspect is provided on the bottom plate.

[0024] In the technical solution provided by the embodiment of the present application, by integrating multiple test circuits on the bottom plate, it is possible to test multiple test circuits through one test tooling, improving the test efficiency; in addition, by sharing a base and a bottom plate for the resistance test circuit and the zero-clearing test circuit, the reuse of the base and the bottom plate is realized, reducing the cost of the test tooling.

[0025] In some embodiments, a power-on interface is further provided on the bottom plate, and the power-on interface is connected to the control end of the switch component in each test circuit; by switching the power-on and power-off through the power-on interface, the working state of the switch component in each test circuit is controlled to switch.

[0026] In the technical solution provided by the embodiment of the present application, all the switch components of the test circuits are controlled by one power-on interface, without separately configuring control signals for each test circuit, simplifying the circuit design on the bottom plate, and through the power-on and power-off switching of the power-on interface, the unified switching of the working states of all the switch components in the test circuits can be realized, improving the switching efficiency of the switch components.

[0027] In a third aspect, the present application provides an open-circuit voltage measurement system, which includes a test tooling as described in any item of the second aspect, an open-circuit voltage measurement device, and a battery tray for carrying a battery under test; the open-circuit voltage measurement device is configured to measure the battery under test in the battery tray when the calibration by the test tooling is successful.

[0028] In the technical solution provided by the embodiment of the present application, when the calibration by the test tooling is successful, it indicates that the measurement accuracy of the open-circuit voltage measurement device meets the requirements. Furthermore, the open-circuit voltage measurement device with qualified measurement accuracy is used to measure the battery under test in the battery tray, avoiding the problem that the battery under test is measured inaccurately when the measurement accuracy of the open-circuit voltage measurement device does not meet the requirements. Therefore, the embodiment of the present application can improve the accuracy of measuring the battery under test.

[0029] In some embodiments, the open-circuit voltage measurement system further includes a transfer device; the transfer device is configured to move the test tooling to the measurement area of the open-circuit voltage measurement device; the transfer device is further configured to move the test tooling out of the measurement area and move the battery tray to the measurement area when the calibration of the open-circuit voltage measurement device is successful, so that the open-circuit voltage measurement device can measure the battery under test in the battery tray.

[0030] In the technical solution provided by the embodiment of the present application, through the cooperation of the transfer device and the open-circuit voltage measurement device, the test of the open-circuit voltage measurement device and the measurement of the battery under test are automatically completed without manual intervention, improving the measurement efficiency of the open-circuit voltage measurement device.

[0031] In some embodiments, the open-circuit voltage measurement device includes a measuring instrument and at least one set of test probes connected to the measuring instrument; each set of test probes is respectively configured to connect to the connection ends of each test circuit in the test tooling.

[0032] In the technical solution provided by the embodiment of the present application, each set of test probes connected to the measuring instrument is respectively configured to connect to the connection ends of each test circuit in the test tooling, so that each resistance test loop and each zero-clearing test loop can be formed through each test circuit, improving the effectiveness of testing the open-circuit voltage measurement device.

[0033] In some embodiments, the open-circuit voltage measurement device further includes a power supply interface; the open-circuit voltage measurement device is further configured to connect the power supply interface to the power-on interface in the test tooling and power on the power-on interface through the power supply interface to perform the state switching of the switch component in the test tooling.

[0034] In the technical solution provided by the embodiment of the present application, power is supplied to the power-on interface in the test fixture through the power supply interface of the open-circuit voltage measurement device, without introducing other additional power supply devices, avoiding the increase in cost caused by the need to set up additional power supply devices, thereby being able to reduce the layout cost of the open-circuit voltage measurement system. Moreover, the open-circuit voltage measurement device can provide a stable power supply to each test circuit in the test fixture, avoiding test errors caused by power fluctuations or instability, and improving the accuracy of testing the open-circuit voltage measurement device.

[0035] In some embodiments, the open-circuit voltage measurement device is further configured to, in response to a test signal, determine that the open-circuit voltage measurement device is successfully calibrated when the calibration results obtained through each resistance test loop are all successful; wherein, the resistance test loop is a closed path formed by connecting the open-circuit voltage measurement device to the resistance test circuit in the test fixture.

[0036] In the technical solution provided by the embodiment of the present application, each resistance test loop in the test fixture is used to calibrate the open-circuit voltage measurement device respectively, and the open-circuit voltage measurement device is determined to be successfully calibrated only when the calibration results obtained through each resistance test loop are all successful, thereby being able to improve the comprehensiveness and accuracy of calibrating the open-circuit voltage measurement circuit.

[0037] In some embodiments, the open-circuit voltage measurement device is further configured to, in response to a test signal, when the calibration result obtained through any one of the resistance test loops is a calibration failure, after calibrating the open-circuit voltage measurement device through each zero-clear test loop, determine that the open-circuit voltage measurement device is successfully calibrated when the calibration results obtained through each resistance test loop are all successful; wherein, the resistance test loop is a closed path formed by connecting the open-circuit voltage measurement device to the resistance test circuit in the test fixture, and the zero-clear test loop is a closed path formed by connecting the open-circuit voltage measurement device to the zero-clear test circuit in the test fixture.

[0038] In the technical solution provided by the embodiment of the present application, by introducing a zero-clear test loop calibration mechanism, when the open-circuit voltage measurement device fails in calibration, the open-circuit voltage measurement device can also solve the problem through self-calibration, avoiding the situation where the voltage measurement device cannot be calibrated and only the open-circuit voltage measurement device with a calibration failure can be used to measure the battery under test, and improving the reliability of the open-circuit voltage measurement device to measure the battery under test.

[0039] Fourthly, the present application provides an open-circuit voltage measurement method, which is applied to an open-circuit voltage measurement device. The method includes: detecting that the test tooling moves to the measurement area of the open-circuit voltage measurement device, and controlling each group of test probes of the open-circuit voltage measurement device to be respectively connected to the connection ends of each test circuit in the test tooling; calibrating the open-circuit voltage measurement device by controlling the conduction of each zero-clearing test loop, where the zero-clearing test loop is a closed path formed by connecting the open-circuit voltage measurement device to the zero-clearing test circuit in the test tooling; calibrating the open-circuit voltage measurement device by controlling the conduction of each resistance test loop, where the resistance test loop is a closed path formed by connecting the open-circuit voltage measurement device to the resistance test circuit in the test tooling; and when the calibration of the open-circuit voltage measurement device is successful, detecting that the battery tray moves to the measurement area and measuring the battery to be tested in the battery tray.

[0040] In the technical solution provided by the embodiment of the present application, the open-circuit voltage measurement device first controls the conduction of each zero-clearing test loop, and then controls the conduction of each resistance test loop. Thus, the open-circuit voltage measurement device can automatically perform the steps of calibration and calibration, improving the efficiency of calibration and calibration of the open-circuit voltage measurement device. Description of the Drawings

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required to be used in the description of the embodiments of the present application or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0042] Figure 1 Schematic diagram of the resistance test loop provided for some embodiments;

[0043] Figure 2 Schematic diagram of the zero-clearing test loop provided for some embodiments;

[0044] Figure 3 Schematic diagram of the connection between the internal resistance meter and the resistor in the open-circuit voltage measurement device provided for some embodiments;

[0045] Figure 4 Schematic diagram of the open-circuit voltage measurement system provided for some embodiments;

[0046] Figure 5 Schematic diagram of the structure of the test circuit provided for the first embodiment;

[0047] Figure 6 Schematic diagram of the structure of the test circuit provided for the second embodiment;

[0048] Figure 7Schematic diagram of the test circuit provided for the third embodiment;

[0049] Figure 8 Schematic diagram of the test circuit provided for the fourth embodiment;

[0050] Figure 9 Schematic diagram of the test circuit provided for the fifth embodiment;

[0051] Figure 10 Schematic diagram of the test tooling provided for some embodiments;

[0052] Figure 11 Schematic diagram of the open-circuit voltage measurement system provided for some embodiments;

[0053] Figure 12 Flow schematic diagram of the open-circuit voltage measurement method provided for some embodiments.

[0054] The reference numerals in the detailed implementation are as follows:

[0055] Test tooling 100; Test circuit 110; Base 120; Bottom plate 130. Detailed implementation

[0056] The embodiments of the technical solutions of the present application will be described in detail below with reference to the accompanying drawings. The following embodiments are only used to illustrate the technical solutions of the present application more clearly, so they are only examples and cannot be used to limit the protection scope of the present application.

[0057] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above accompanying drawings are intended to cover non-exclusive inclusion.

[0058] In the description of the embodiments of this application, technical terms such as "first" and "second" are only used to distinguish different objects and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity, specific order or primary-secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "a plurality" is more than two unless otherwise specifically defined. In the description of the embodiments of this application, "each" means each or every one of a plurality unless otherwise specifically defined.

[0059] References to "embodiments" in this specification mean that specific features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive of other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0060] In the description of the embodiments of the present application, the term "and / or" is merely a description of the associated relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent three situations: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this text generally represents an "or" relationship between the associated objects before and after.

[0061] In the description of the embodiments of the present application, the term "plurality" refers to two or more (including two). Similarly, "multiple groups" refers to two or more groups (including two groups), and "multiple pieces" refers to two or more pieces (including two pieces).

[0062] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installation", "connection", "connection", and "fixation" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can also be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0063] An open-circuit voltage measurement device (also known as an OCV machine, OCV equipment, or OCV device, etc.) is a measurement device widely used in the battery industry. It is mainly used to measure batteries to detect key parameters such as the open-circuit voltage and internal resistance of the batteries, so as to evaluate the state of health (SOH) and performance of the batteries. In actual applications, before measuring the battery or when the detection results of the battery are inaccurate, it is necessary to test the open-circuit voltage measurement device to calibrate the open-circuit voltage measurement device.

[0064] In any embodiment of the present application, calibration refers to the process of using a standard measuring instrument (such as an internal resistance meter of an open-circuit voltage measuring device) to detect whether the accuracy of the instrument used is qualified during measurement. In some embodiments, calibrating the open-circuit voltage measuring device can determine whether the measurement accuracy of the open-circuit voltage measuring device meets the requirements. For example, when the calibration of the open-circuit voltage measuring device is successful, it is determined that the measurement accuracy of the open-circuit voltage measuring device meets the requirements. Another example is that when the calibration of the open-circuit voltage measuring device fails, it is determined that the measurement accuracy of the open-circuit voltage measuring device does not meet the requirements.

[0065] In any embodiment of the present application, calibration is a set of operations for determining the relationship between the indication of a measuring instrument or measuring system (or the nominal value of a physical measuring instrument) and the quantity value reproduced by the standard under specified conditions. In some embodiments, calibrating the open-circuit voltage measuring device may include zeroing the return line resistance of the open-circuit voltage measuring device. By zeroing the return line resistance of the open-circuit voltage measuring device, the influence of the return line resistance on the measurement of the internal resistance value of the battery under test can be avoided. Exemplarily, for the internal resistance meter of the open-circuit voltage measuring device and the test probe connected to the internal resistance meter, the return line resistance refers to the line resistance of the test loop between the internal resistance meter and the test probe when the test probe is short-circuited, or the line resistance of the test loop between the internal resistance meter and the zeroing block or between the internal resistance meter and the zeroing test circuit described below when the test probe is connected to the zeroing block or the test probe is connected to the zeroing test circuit. In some implementation scenarios, since the line connection part in the test loop is deformed or damaged, it will affect the line resistance of the test loop. If the line resistance of the test loop changes, it is necessary to calibrate the open-circuit voltage measuring device to zero the line resistance and avoid the influence of the line resistance in the test loop on the measurement result of the battery under test.

[0066] The resistor in the embodiment of the present application may be a standard resistor. Among them, the standard resistor is used to measure other resistors or resistor devices and serves as a reference or comparison for a standard resistance value. The standard resistor is a resistor with a high-precision and high-stability resistance value, usually made of materials with a low temperature coefficient and high resistivity. Its resistance value has been accurately calibrated and determined, and can be used as a standard measuring tool for resistance measurement or to provide a stable resistance value in precision electronic circuits.

[0067] Among them, testing the open-circuit voltage measuring device is actually to calibrate the open-circuit voltage measuring device through the resistance test loop formed between the internal resistance meter in the open-circuit voltage measuring device and the resistor, and to calibrate the open-circuit voltage measuring device through the zeroing test loop formed between the internal resistance meter in the open-circuit voltage measuring device and the short-circuited test probe, zeroing block or zeroing test circuit.

[0068] When the open-circuit voltage measuring device is commissioned for the first time, it is necessary to first use a zero-clearing block to zero the line resistance of the open-circuit voltage measuring device to calibrate the open-circuit voltage measuring device. When the calibration of the line resistance of the open-circuit voltage measuring device is completed, the open-circuit voltage measuring device measures the resistance to calibrate the open-circuit voltage measuring device.

[0069] Figure 1 Schematic diagram of a resistance test circuit provided for some embodiments, as Figure 1 shown, the first end of the resistor (master) is connected to the positive voltage terminal (V+) and the positive current terminal (I+) of the internal resistance meter, and the second end of the resistor is connected to the negative voltage terminal (V-) and the negative current terminal (I-) of the internal resistance meter, so as to form a resistance test circuit between the resistor and the internal resistance meter.

[0070] Figure 2 Schematic diagram of a zero-clearing test circuit provided for some embodiments, as Figure 2 shown, the first end of the first zero-clearing block is connected to the positive voltage terminal (V+) of the internal resistance meter, the second end of the first zero-clearing block is connected to the negative voltage terminal (V-) of the internal resistance meter, the first end of the second zero-clearing block is connected to the positive current terminal (I+) of the internal resistance meter, the second end of the second zero-clearing block is connected to the negative current terminal (I-) of the internal resistance meter, and the second end of the first zero-clearing block is also connected to the second end of the second zero-clearing block. In this way, a zero-clearing test circuit is formed among the first zero-clearing block, the second zero-clearing block and the internal resistance meter.

[0071] Figure 3 Schematic diagram of the connection between the internal resistance meter and the resistor in the open-circuit voltage measuring device provided for some embodiments, as Figure 3 shown, the open-circuit voltage measuring device includes an internal resistance meter, 4 switching boards, N groups of relays and N groups of test probes. Each group of relays includes 4 relays, and each group of test probes includes 4 test probes. Among them, the positive voltage terminal (V+), the positive current terminal (I+), the negative voltage terminal (V-) and the negative current terminal (I-) of the internal resistance meter are respectively connected to 4 switching boards, and these four switching boards are respectively connected to 4 relays in each group. The 4 relays in each group are correspondingly connected to 4 test probes in each group. The 4 test probes in each group are used to connect a resistor, and the test probes in different groups are used to connect different resistors. The resistance values of different resistors can be the same or at least partially different. For example, the 4 relays in the first group are connected to the first resistor (resistor 1) through the 4 test probes in the first group, and the 4 relays in the Nth group are connected to the Nth resistor (resistor N) through the 4 test probes in the Nth group.

[0072] Among them, 4 switching boards are used to conduct the connection between the internal resistance meter and each group of relays. For example, one switching board is equivalent to the function of a single-pole N-throw switch. Among them, 4 relays in each group are used to conduct the corresponding resistance test circuit. For example, 4 relays in the first group are used to conduct the resistance test circuit corresponding to the first resistor (resistor 1).

[0073] Figure 4 Schematic diagram of an open-circuit voltage measurement system provided for some embodiments, such as Figure 4 , the open-circuit voltage measurement system includes an open-circuit voltage measurement device, a processor (not shown in the figure), a transfer device (not shown in the figure), a resistance test tooling, a zeroing test tooling, and a battery tray in the production line. There is a battery to be tested on the battery tray.

[0074] Exemplarily, the resistance test tooling includes a base, a bottom plate provided on the base, and a resistor provided on the bottom plate. By measuring the resistor with the open-circuit voltage measurement device, the calibration of the open-circuit voltage measurement device is realized. Exemplarily, the zeroing test tooling includes a base, a bottom plate provided on the base, and a zeroing block provided on the bottom plate. By measuring the zeroing block with the open-circuit voltage measurement device, the calibration of the open-circuit voltage measurement device is realized.

[0075] In the case where it is determined that the open-circuit voltage measurement device needs to be tested, for example, the processor can respond to the test signal and control the transfer device to operate, so that the transfer device moves the resistance test tooling from position 1, position 2, and position 3 to position 4 (the position where the open-circuit voltage measurement device is located, that is, the measurement area of the open-circuit voltage measurement device) in sequence. The processor sends a test signal to the open-circuit voltage measurement device, so that the open-circuit voltage measurement device responds to the test signal and uses the resistance test tooling for calibration. In the case of successful calibration, the open-circuit voltage measurement device sends a calibration success signal to the processor. The processor controls the transfer device to operate, so that the transfer device moves the resistance test tooling from position 4 through position 3 to position 5, and continuously controls the resistance test tooling to move forward, and controls a battery tray (such as battery tray 1) on the first production line to move from position 3 to position 4, so that the open-circuit voltage measurement device measures the battery to be tested in the battery tray. After the measurement is completed, control the battery tray to move from position 4 through position 3 to position 5, and continuously control the battery tray to move forward, and control the battery tray (such as battery tray 2) on the second production line to move through position 2 and position 3 to position 4, so that the open-circuit voltage measurement device measures the battery to be tested in the battery tray. In this way, the transfer device continuously transfers the battery trays on the two production lines to the measurement area of the open-circuit voltage measurement device in an interleaved manner. For example, then control battery tray 3 and battery tray 4 to enter the measurement area of the open-circuit voltage measurement device, so that the open-circuit voltage measurement device detects the batteries in the battery trays in the measurement area.

[0076] When the calibration result of the open-circuit voltage measuring device using the resistance test tooling for calibration fails, the open-circuit voltage measuring device sends a calibration failure signal to the processor. In response to this calibration failure signal, the processor controls the zero-clearing test tooling to move to position 4 through positions 1, 2, and 3, and sends a calibration signal to the open-circuit voltage measuring device so that the open-circuit voltage measuring device uses the zero-clearing test tooling for calibration. After the calibration is completed, the open-circuit voltage measuring device sends a calibration completion signal to the processor, and the processor controls the transfer device to operate so that the transfer device moves the resistance test tooling located at position 5 or after position 5 to position 4 through positions 1, 2, and 3, enabling the open-circuit voltage measuring device to use the resistance test tooling for re-calibration.

[0077] However, since the movement routes of both the resistance test tooling and the zero-clearing test tooling are from position 1, 2, 3 to position 4, when the calibration result of the open-circuit voltage measuring device using the resistance test tooling for calibration fails, the moving device needs to move the resistance test tooling to position 5 or after position 5 in order to vacate positions 3 and 4. If position 5 is occupied by the battery tray, it will cause the transfer device to be unable to move the zero-clearing test tooling to position 4. Or if the resistance test tooling is moved to position 5 or after position 5 and at least one of positions 2 and 3 is occupied (such as being occupied by the battery tray), it will also cause the transfer device to be unable to move the zero-clearing test tooling to position 4, thus preventing the calibration of the open-circuit voltage measuring device. Only after positions 2, 3, and 4 are all cleared can the zero-clearing test tooling be moved to position 4 for the calibration of the open-circuit voltage measuring device.

[0078] Therefore, Figure 4 in the technical solution, when the calibration using the resistance test tooling fails, it is necessary to empty all the positions from position 2 to 4 before the calibration and re-calibration of the open-circuit voltage measuring device can be carried out. If the positions from position 2 to 4 are occupied, the calibration and re-calibration of the open-circuit voltage measuring device cannot be performed, resulting in the inability to calibrate the open-circuit voltage measurement system in a timely manner.

[0079] Based on this, through research, it is found that if there is a test circuit that can not only implement the functions of a resistance test tooling but also the functions of a zero-clearing test tooling, then as long as this test circuit is moved to the measurement area of the open-circuit voltage measuring device, through this test circuit, not only can the calibration of the open-circuit voltage measuring device be achieved, but also the calibration of the open-circuit voltage measuring device can be realized, without separately moving the resistance test tooling and the zero-clearing test tooling. This not only avoids the delay in calibration caused by multiple movements of the test tooling, but also makes it unnecessary to clear the occupancy of other positions when the test circuit is moved to the measurement area of the open-circuit voltage measuring device, avoiding the long time consumed by clearing the occupancy and further causing the delay in the calibration of the open-circuit voltage measuring device. Therefore, the embodiments of the present application improve the timeliness of calibrating the open-circuit voltage measuring device; in addition, the test circuit in the embodiments of the present application can achieve the function of zero-clearing test without setting a zero-clearing block, thereby reducing the cost of the test circuit.

[0080] Based on the above considerations, the present application provides a test circuit. The test circuit includes a resistor, a switch component, and a connection terminal; the switch component includes a first switch group and a second switch group; the connection terminal is connected to the resistor through the first switch group to form a resistance test circuit, and the resistance test circuit is used to form a resistance test loop; the connection terminal is also connected to the second switch group to form a zero-clearing test circuit, and the zero-clearing test circuit is used to form a zero-clearing test loop. In this way, the test circuit can not only include a resistance test circuit but also a zero-clearing test circuit, so that not only can a resistance test loop be formed, but also a zero-clearing test loop can be formed. Furthermore, not only can the calibration of the open-circuit voltage measuring device be achieved through the resistance test loop, but also the calibration of the open-circuit voltage measuring device can be realized through the zero-clearing test loop, enabling the resistance test function and the zero-clearing test function to be achieved by moving the test circuit once, without separately moving the resistance test tooling and the zero-clearing test tooling. This not only avoids the delay in calibration caused by multiple movements of the test tooling, but also makes it unnecessary to clear the occupancy of other positions when the test circuit is moved to the measurement area of the open-circuit voltage measuring device, avoiding the long time consumed by clearing the occupancy and further causing the delay in the calibration of the open-circuit voltage measuring device. Therefore, the embodiments of the present application improve the timeliness of calibrating the open-circuit voltage measuring device; in addition, the test circuit in the embodiments of the present application can achieve the function of zero-clearing test without setting a zero-clearing block, thereby reducing the cost of the test circuit.

[0081] Figure 5 Schematic diagram of the structure of the test circuit provided in the first embodiment, as Figure 5 shown, the test circuit includes a resistor, a switch component, and a connection terminal; the switch component includes a first switch group and a second switch group.

[0082] The connection terminal is connected to a resistor through a first switch group to form a resistance test circuit, and the resistance test circuit is used to form a resistance test loop; the connection terminal is also connected to a second switch group to form a zero-clearing test circuit, and the zero-clearing test circuit is used to form a zero-clearing test loop.

[0083] Exemplarily, the resistance test loop is a closed path formed by connecting an open-circuit voltage measuring device to the resistance test circuit in the test fixture. For example, connecting an open-circuit voltage measuring device to the resistance test circuit in the test fixture may include connecting an internal resistance meter of the open-circuit voltage measuring device to a test probe, and the test probe is connected to the resistance test circuit. For example, the positive voltage terminal (V+), positive current terminal (I+), negative voltage terminal (V-), and negative current terminal (I-) of the internal resistance meter are respectively connected to the positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal of the resistance test circuit through four test probes, and the first switch group in the resistance test circuit is turned on and the second switch group is turned off.

[0084] Exemplarily, the zero-clearing test loop is a closed path formed by connecting an open-circuit voltage measuring device to the zero-clearing test circuit in the test fixture. For example, connecting an open-circuit voltage measuring device to the resistance test circuit in the test fixture may include connecting an internal resistance meter of the open-circuit voltage measuring device to a test probe, and the test probe is connected to the resistance test circuit. For example, the positive voltage terminal (V+), positive current terminal (I+), negative voltage terminal (V-), and negative current terminal (I-) of the internal resistance meter are respectively connected to the positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal of the resistance test circuit through four test probes, and the first switch group in the resistance test circuit is turned off and the second switch group is turned on.

[0085] Wherein, the conducting end of the first switch group is used to connect the resistor and the connection terminal, and the conducting end of the second switch is used to connect the connection terminal.

[0086] Exemplarily, by controlling the working state of the switch component, when the resistance test circuit is turned on, the test circuit is used to perform the resistance test function; when switched to the zero-clearing test circuit being turned on, the test circuit is used to perform the zero-clearing test function.

[0087] By switching the working states of the switches in the switch component, controlling the conduction or closing of each switch to achieve a change in the working state of the switch component. Exemplarily, when the first switch group is closed (also referred to as turned on or switched on), the second switch group is open (also referred to as switched off), and when the first switch group is open, the second switch group is closed.

[0088] In some embodiments, the connection terminals include a first connection terminal and a second connection terminal. In some embodiments, the first connection terminal includes a positive voltage connection terminal and a positive current connection terminal, and the second connection terminal includes a negative voltage connection terminal and a negative current connection terminal. In other embodiments, the first connection terminal includes a positive voltage connection terminal, and the second connection terminal includes a negative voltage connection terminal. In still other embodiments, the first connection terminal includes a positive current connection terminal, and the second connection terminal includes a negative current connection terminal. Exemplarily, the first connection terminal and the second connection terminal may not need to distinguish between positive and negative. For example, any one of the first connection terminal and the second connection terminal may be a positive electrical parameter connection terminal, and the other may be a negative electrical parameter connection terminal. Another example is that the first connection terminal and the second connection terminal need to distinguish between positive and negative. For example, the first connection terminal is designated as a positive electrical parameter connection terminal, and the second connection terminal is designated as a negative electrical parameter connection terminal.

[0089] In some embodiments, in the scenario where the first connection terminal includes a positive voltage connection terminal and a positive current connection terminal, and the second connection terminal includes a negative voltage connection terminal and a negative current connection terminal, the positive voltage connection terminal, the negative voltage connection terminal, the positive current connection terminal, and the negative current connection terminal are all connected to a resistor through a first switch group. The positive voltage connection terminal is connected to the negative voltage connection terminal through a second switch group, and the positive current connection terminal is connected to the negative current connection terminal through a second switch group.

[0090] Exemplarily, both the first connection terminal and the second connection terminal are connected to a resistor through a first switch group to form a resistance test circuit. The first connection terminal is also connected to the second connection terminal through a second switch group to form a zero-clearing test circuit. The resistance test circuit and the zero-clearing test circuit are different circuits, and the zero-clearing test circuit does not pass through the resistor. The resistance measurement circuit and the zero-clearing test circuit share the first connection terminal and the second connection terminal.

[0091] Exemplarily, when the working state of the control switch assembly is the first working state, the resistance test circuit is turned on, and the zero-clearing test circuit is turned off. When the working state of the control switch assembly is the second working state, the resistance test circuit is turned off, and the zero-clearing test circuit is turned on. The working state of the switch assembly being the first working state may include the state where the first switch group is closed and the second switch group is open. The working state of the switch assembly being the second working state may include the state where the first switch group is open and the second switch group is closed.

[0092] When the resistance test circuit in the test circuit is turned on, the open-circuit voltage measuring device can measure the resistance using the test circuit to calibrate the open-circuit voltage measuring device. When the zero-clearing test circuit in the test circuit is turned on, the open-circuit voltage measuring device can use the test circuit to perform the operation of zero-clearing the loop resistance to calibrate the open-circuit voltage measuring device. Among them, the loop resistance includes the line resistance between the internal resistance meter in the open-circuit voltage measuring device and the loop where the zero-clearing test circuit is located.

[0093] By turning on the resistance test circuit in the test circuit and turning off the zero-clearing test circuit in the test circuit, the test circuit is used to implement the function of the resistance test tooling. By turning off the resistance test circuit in the test circuit and turning on the zero-clearing test circuit in the test circuit, the test circuit is used to implement the function of the zero-clearing test tooling.

[0094] In the technical solution provided by the embodiment of the present application, the test circuit not only includes a resistance test circuit, but also includes a zero-clearing test circuit, so that not only can a resistance test loop be formed, but also a zero-clearing test loop can be formed. Furthermore, not only can the calibration of the open-circuit voltage measuring device be realized through the resistance test loop, but also the calibration of the open-circuit voltage measuring device can be realized through the zero-clearing test loop, so that the resistance test function and the zero-clearing test function can be realized by moving the test circuit once, without separately moving the resistance test tooling and the zero-clearing test tooling. This not only avoids the delay in calibration caused by moving the test tooling multiple times, but also when the test circuit is moved to the measurement area of the open-circuit voltage measuring device, there is no need to clear the occupancy of other positions, avoiding the long time consumed by clearing the occupancy and further delaying the calibration of the open-circuit voltage measuring device. Therefore, the embodiment of the present application improves the timeliness of calibrating the open-circuit voltage measuring device; in addition, the test circuit in the embodiment of the present application can realize the function of zero-clearing test without setting a zero-clearing block, thus reducing the cost of the test circuit.

[0095] In some embodiments, the switch assembly is used to switch between a first working state and a second working state; when the switch assembly is in the first working state, the first switch group is turned on and the second switch group is turned off to make the resistance test loop conductive and the zero-clearing test loop non-conductive; when the switch assembly is in the second working state, the first switch group is turned off and the second switch group is turned on to make the resistance test loop non-conductive and the zero-clearing test loop conductive.

[0096] In the technical solution provided by the embodiment of the present application, by using the switch assembly to switch between the first working state and the second working state, the conduction of the resistance test loop or the zero-clearing test loop is realized, and there will be no situation where both loops are conductive or both loops are non-conductive, improving the effectiveness of loop switching; moreover, different loops can be flexibly turned on according to needs, effectively avoiding the mutual interference between different measurement loops, and further improving the accuracy of calibration and calibration of the open-circuit voltage measuring device.

[0097] In some embodiments, when the control terminals of the first switch group and the second switch group are both powered on, the first switch group is turned on and the second switch group is turned off; when the control terminals of the first switch group and the second switch group are both powered off, the first switch group is turned off and the second switch group is turned on; or, when the control terminals of the first switch group and the second switch group are both powered on, the first switch group is turned off and the second switch group is turned on; when the control terminals of the first switch group and the second switch group are both powered off, the first switch group is turned on and the second switch group is turned off.

[0098] In the technical solution provided by the embodiments of the present application, the change of the working states of the first switch group and the second switch group is controlled by powering on and off the power supply terminal, without an additional control circuit to control the working states of the first switch group and the second switch group, which simplifies the circuit design of the test circuit and reduces the complexity of the test circuit.

[0099] Figure 6 The structural schematic diagram of the test circuit provided for the second embodiment is as Figure 6 shown Figure 6 The difference between this embodiment and Figure 5 the other embodiment is that the test circuit further includes a power supply terminal, and the control terminals of the first switch group and the second switch group are both connected to the power supply terminal.

[0100] In some embodiments, when the power supply terminal is powered on, the first switch group is turned on and the second switch group is turned off; when the power supply terminal is powered off, the first switch group is turned off and the second switch group is turned on.

[0101] In some other embodiments, when the power supply terminal is powered on, the first switch group is turned off and the second switch group is turned on; when the power supply terminal is powered off, the first switch group is turned on and the second switch group is turned off.

[0102] Powering on in any embodiment of the present application can be understood as getting powered.

[0103] Wherein, when the first switch group includes at least two switches, the control terminals of at least two switches in the first switch group are both connected to the power supply terminal. When the second switch group includes at least two switches, the control terminals of at least two switches in the second switch group are both connected to the power supply terminal.

[0104] In some embodiments, the switches in the first switch group are normally closed switches, and the switches in the second switch group are normally open switches. In some other embodiments, the switches in the first switch group are normally open switches, and the switches in the second switch group are normally closed switches.

[0105] A normally closed switch refers to a switch that is in a closed state under normal conditions. A normally open switch refers to a switch that is in an open state under normal conditions.

[0106] Exemplarily, a normally-closed switch refers to a switch that is in a closed state when not powered on or affected by external forces, and a normally-open switch refers to a switch that is in an open state when not powered on or affected by external forces.

[0107] Exemplarily, the normally-closed switch may include a normally-closed relay, and the normally-open switch may include a normally-open relay. Also exemplarily, the normally-closed switch may include a P-type Metal-Oxide-Semiconductor (MOS) switch, and the normally-open switch may include an N-type MOS switch.

[0108] In the technical solution provided by the embodiments of the present application, since the first switch group is a normally-closed switch and the second switch group is a normally-open switch, the conduction of the resistance test circuit can be achieved without powering on the first switch group and the second switch group. Moreover, the usage frequency of the resistance test circuit is much higher than that of the zero-clearing test circuit. Therefore, it is possible to avoid the way of powering on the test circuit additionally to conduct the resistance test circuit, which not only improves the conduction efficiency of the resistance test circuit but also reduces the test power consumption.

[0109] Figure 7 FIG. is a schematic structural diagram of the test circuit provided for the third embodiment, as Figure 7 shown, Figure 7 The difference between this embodiment and Figure 5 the embodiment is that the connection terminals include a positive voltage connection terminal, a positive current connection terminal, a negative voltage connection terminal, and a negative current connection terminal; both the positive voltage connection terminal and the negative voltage connection terminal are connected to the resistor through the first switch group to form a voltage test circuit in the resistance test circuit; both the positive current connection terminal and the negative current connection terminal are connected to the resistor through the first switch group to form a current test circuit in the resistance test circuit; the positive voltage connection terminal is also connected to the negative voltage connection terminal through the second switch group to form a voltage test circuit in the zero-clearing test circuit; the positive current connection terminal is also connected to the negative current connection terminal through the second switch group to form a current test circuit in the zero-clearing test circuit.

[0110] Exemplarily, the voltage test circuit in the resistance test circuit is used to form a voltage test loop in the resistance test circuit, the current test circuit in the resistance test circuit is used to form a current test loop in the resistance test circuit, the voltage test circuit in the zero-clearing test circuit is used to form a voltage test loop in the zero-clearing test circuit, and the current test circuit in the zero-clearing test circuit is used to form a current test loop in the zero-clearing test circuit.

[0111] In the technical solution provided by the embodiments of the present application, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal are respectively connected to the four test probes of the open-circuit voltage measuring device, which can not only form the voltage test circuit and the current test circuit in the resistance test circuit, but also form the voltage test circuit and the current test circuit in the zero-clear test circuit. By the voltage test circuit and the current test circuit in the resistance test circuit, the accuracy of the open-circuit voltage measuring device for resistance measurement is improved. By the voltage test circuit and the current test circuit in the zero-clear test circuit, the accuracy of the zero-clear of the open-circuit voltage measuring device is improved, thereby improving the accuracy of the calibration and calibration of the open-circuit voltage measuring device.

[0112] Figure 7 The embodiment compared with Figure 5 The difference between the embodiments is further that the first switch group includes a first switch, a second switch, and a third switch; the second switch group includes a fourth switch and a fifth switch.

[0113] The positive voltage connection terminal is connected to the first end of the resistor through the first switch, and the second end of the resistor is connected to the negative voltage connection terminal through the second switch, thereby forming a voltage test circuit in the resistance test circuit.

[0114] The positive current connection terminal is connected to the first end of the resistor through the third switch, and the second end of the resistor is connected to the negative current connection terminal through the second switch, thereby forming a current test circuit in the resistance test circuit.

[0115] The positive current connection terminal is connected to the negative current connection terminal through the fourth switch, thereby forming a voltage test circuit in the zero-clear test circuit. The negative current connection terminal is connected to the negative voltage connection terminal through the second switch, thereby forming a current test circuit in the zero-clear test circuit. The negative voltage connection terminal is connected to the positive voltage connection terminal through the fifth switch.

[0116] In some embodiments, the negative voltage connection terminal and the negative current connection terminal can also be short-circuited through the second switch.

[0117] In some embodiments, the first switch, the second switch, and the third switch are all normally closed relays, and the fourth switch and the fifth switch are all normally open relays. In other embodiments, the first switch, the second switch, and the third switch are all normally open relays, and the fourth switch and the fifth switch are all normally closed relays.

[0118] Among them, the positive voltage connection terminal and the positive current connection terminal are respectively used to connect the positive voltage terminal and the positive current terminal of the internal resistance meter, and the negative voltage connection terminal and the negative current connection terminal are respectively used to connect the negative voltage terminal and the negative current terminal of the internal resistance meter.

[0119] In any embodiment of the present application, the positive voltage can be understood as the high voltage, and the negative voltage can be understood as the low voltage.

[0120] Exemplarily, both the first switch group and the second switch group are single-pole double-throw switches. Each switch in the first switch group and the second switch group includes a common terminal, a normally open terminal, and a normally closed terminal. Among them, in the case of power failure of the switch, the normally closed terminals and the common terminals of each switch in the normally closed switch are connected, and the normally open terminals and the common terminals of each switch in the normally open switch are connected. Conversely, in the case of power-on of the switch, the normally open terminals and the common terminals of each switch in the normally closed switch are connected, and the normally closed terminals and the common terminals of each switch in the normally open switch are connected. Among them, each switch in the first switch group and the second switch group further includes a power connection terminal, and the power connection terminal is connected to the power-on terminal.

[0121] Taking the first switch as the first normally closed relay, the second switch as the second normally closed relay, the third switch as the third normally closed relay, the fourth switch as the first normally open relay, and the fifth switch as the second normally open relay as an example, the connection of the first switch to the fifth switch is described as follows:

[0122] The normally closed contact of the first normally closed relay is connected to the positive voltage connection terminal, and the common contact of the first normally closed relay is connected to the first end of the resistor. Or, the common contact of the first normally closed relay is connected to the positive voltage connection terminal, and the normally closed contact of the first normally closed relay is connected to the first end of the resistor.

[0123] The common contact of the second normally closed relay is connected to the negative voltage connection terminal and the negative current connection terminal, and the normally closed contact of the second normally closed relay is connected to the second end of the resistor. Or, the normally closed contact of the second normally closed relay is connected to the negative voltage connection terminal and the negative current connection terminal, and the common contact of the second normally closed relay is connected to the second end of the resistor.

[0124] The normally closed contact of the third normally closed relay is connected to the positive current connection terminal, and the common contact of the first normally closed relay is connected to the first end of the resistor. Or, the common contact of the first normally closed relay is connected to the positive current connection terminal, and the normally closed contact of the first normally closed relay is connected to the first end of the resistor.

[0125] The normally open contact of the first normally open relay is connected to the positive current connection terminal, and the common contact of the first normally open relay is connected to the negative current connection terminal. Or, the common contact of the first normally open relay is connected to the positive current connection terminal, and the normally open contact of the first normally open relay is connected to the negative current connection terminal.

[0126] The normally open contact of the second normally open relay is connected to the positive voltage connection terminal, and the common contact of the second normally open relay is connected to the negative voltage connection terminal. Or, the common contact of the second normally open relay is connected to the positive voltage connection terminal, and the normally open contact of the second normally open relay is connected to the negative voltage connection terminal.

[0127] The power connection terminals of the first normally closed relay, the second normally closed relay, the third normally closed relay, the first normally open relay, and the second normally open relay are all connected to the power-on terminal.

[0128] In the technical solution provided by the embodiment of the present application, the positive voltage connection terminal and the positive current connection terminal are connected to the negative voltage connection terminal and the negative current connection terminal through the first switch, the second switch, the third switch, and the resistor. The positive voltage connection terminal and the positive current connection terminal are also connected to the negative voltage connection terminal and the negative current connection terminal through the fourth switch and the fifth switch. Thus, by controlling the on / off of the first switch to the fifth switch, the resistance test circuit is turned on or the zero-clear test circuit is turned on, improving the effectiveness of control. Moreover, each two components are isolated by a switch, so that interference between the resistance test circuit and the zero-clear test circuit can be avoided, improving the accuracy of the test.

[0129] Figure 8 FIG. is a schematic structural diagram of the test circuit provided for the fourth embodiment, as Figure 8 shown, Figure 8 The difference between the embodiment and Figure 7 the embodiment is that the second switch includes a first relay K1 and a second relay K2.

[0130] The normally open terminal (also called the normally open contact) of the first relay K1 is connected to the normally open terminal (also called the normally open contact) of the second relay K2; the common terminal (also called the common contact) and the normally closed terminal (also called the normally closed contact) of the first relay K1 are respectively connected to the negative voltage connection terminal and the second end of the resistor; the common terminal and the normally closed terminal of the second relay K2 are respectively connected to the negative current connection terminal and the second end of the resistor.

[0131] Exemplarily, the power connection terminals of the first relay K1 and the second relay K2 are both connected to the power-on terminal.

[0132] Wherein, when the first relay K1 and the second relay K2 are closed, the normally open contacts of the first relay K1 and the second relay K2 no longer connect to the negative voltage connection terminal and the negative current connection terminal, and thus the zero-clear test circuit cannot be turned on either.

[0133] Exemplarily, the first relay K1 is a first sub-normally closed relay, the second relay K2 is a second sub-normally closed relay, the normally open contact of the first sub-normally closed relay is connected to the normally open contact of the second sub-normally closed relay; the common terminal and the normally closed contact of the first sub-normally closed relay are respectively connected to the negative voltage connection terminal and the second end of the resistor; the common terminal and the normally closed contact of the second sub-normally closed relay are respectively connected to the negative current connection terminal and the second end of the resistor.

[0134] In the technical solution provided by the embodiments of the present application, the normally open end of the first relay is connected to the normally open end of the second relay, so that when the first relay and the second relay are in the off state, the negative voltage connection end and the negative current connection end form a path through the normally open end of the first relay and the normally open end of the second relay. Furthermore, when the first relay and the second relay are closed, the resistance test circuit is turned on, and when the first relay and the second relay are off, the zero-clearing test circuit is turned on. In this way, the first relay and the second relay can be reused in the resistance test circuit and the zero-clearing test circuit, improving the utilization efficiency of the first relay and the second relay.

[0135] Figure 9 FIG. is a schematic structural diagram of the test circuit provided for the fifth embodiment, as Figure 9 shown, Figure 9 The difference between this embodiment and Figure 7 the embodiment is that the second switch includes a third relay K3 and a fourth relay K4, and the second switch group further includes a fifth relay K5.

[0136] The third relay K3 is connected between the second end of the resistor and the negative voltage connection end; the fourth relay K4 is connected between the second end of the resistor and the negative current connection end; the fifth relay K5 is connected between the negative voltage connection end and the negative current connection end.

[0137] Exemplarily, the power connection ends of the third relay K3, the fourth relay K4, and the fifth relay K5 are all connected to the power-on end.

[0138] Exemplarily, the third relay K3 is a third sub-normally closed relay, the fourth relay K4 is a third sub-normally closed relay, and the fifth relay K5 is a third normally open relay.

[0139] The common contact of the third sub-normally closed relay is connected to the negative voltage connection end, and the normally closed contact of the third sub-normally closed relay is connected to the second end of the resistor, or the normally closed contact of the third sub-normally closed relay is connected to the negative voltage connection end, and the common contact of the third sub-normally closed relay is connected to the second end of the resistor.

[0140] The common contact of the fourth sub-normally closed relay is connected to the negative current connection end, and the normally closed contact of the fourth sub-normally closed relay is connected to the second end of the resistor, or the normally closed contact of the fourth sub-normally closed relay is connected to the negative current connection end, and the common contact of the fourth sub-normally closed relay is connected to the second end of the resistor.

[0141] The common contact of the third normally open relay is connected to the negative voltage connection end, and the normally closed contact of the fourth sub-normally closed relay is connected to the negative current connection end, or the normally closed contact of the third normally open relay is connected to the negative voltage connection end, and the common contact of the fourth sub-normally closed relay is connected to the negative current connection end.

[0142] In the technical solution provided by the embodiment of the present application, the conduction or disconnection of the resistance test circuit is controlled by the third relay and the fourth relay, and the conduction or disconnection of the zero-clearing test circuit is controlled by the fifth relay. Thus, the on / off of each relay only determines the on / off of one of the resistance test circuit and the zero-clearing test circuit, and has nothing to do with the on / off of the other circuit, avoiding the mutual interference between the resistance test circuit and the zero-clearing test circuit, and providing the reliability of circuit control.

[0143] In some embodiments, the connection terminals include a first connection terminal and a second connection terminal; the relative positions between the first connection terminal and the second connection terminal are the same as the relative positions between the positive electrical parameter connection terminal and the negative electrical parameter connection terminal in the battery tray. Among them, the positive electrical parameter connection terminal and the negative electrical parameter connection terminal are respectively connected to the positive electrode and the negative electrode of the battery to be tested in the battery tray.

[0144] Exemplarily, the first connection terminal includes a positive voltage connection terminal and a positive current connection terminal, the second connection terminal includes a negative voltage connection terminal and a negative current connection terminal, the positive electrical parameter connection terminal includes a positive voltage connection terminal and a positive current connection terminal, and the negative electrical parameter connection terminal includes a negative voltage connection terminal and a negative current connection terminal. Among them, the relative positions between every two of the four terminals of the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal are the same as the relative positions between every two of the four terminals of the corresponding positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal.

[0145] For example, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal are the four vertices of a first rectangle, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal are the four vertices of a second rectangle, and the length and width of the first rectangle are the same as the length and width of the second rectangle.

[0146] In the technical solution provided by the embodiment of the present application, the relative positions between the first connection terminal and the second connection terminal are the same as the relative positions between the positive electrical parameter connection terminal and the negative electrical parameter connection terminal in the battery tray. Thus, the connection mode of the test probe of the open-circuit voltage measuring device to the first connection terminal and the second connection terminal is the first mode, and the connection mode of the test probe of the open-circuit voltage measuring device to the positive electrical parameter connection terminal and the negative electrical parameter connection terminal is the second mode. The first mode and the second mode are the same. Furthermore, the connection mode of the test probe is simplified, and no additional adaptation or adjustment is required during the test of the open-circuit voltage measuring device, improving the versatility of the open-circuit voltage measuring device.

[0147] In the test circuit of the embodiments of the present application, the resistor test tooling and the zero-clearing test tooling in the existing open-circuit voltage measurement system are combined and designed. Without externally modifying the open-circuit voltage measurement system to add mechanical structures, a switching circuit board that can automatically switch between the resistor test circuit and the zero-clearing test circuit is designed.

[0148] Exemplarily, the resistor test tooling and the zero-clearing test tooling can be combined into one through the switch in the automatic switching circuit board.

[0149] When the resistor test tooling and the zero-clearing test tooling in the open-circuit voltage measurement system are integrated into one, it becomes a combined resistor and zero-clearing test circuit, which can solve the problem that two separate toolings are likely to block the automatic logistics line.

[0150] By changing the state of the switch through the internal switching board of the tooling, the requirements of keeping the external structure unchanged (i.e., the size of the test tooling and the size of the bottom plate remain unchanged) while the test circuit on the bottom plate changes (for example, switching between the resistor test circuit and the zero-clearing test circuit) can be achieved. Through the integrated test tooling formed by the above test circuit, the requirement of switching between the resistor test function and the zero-clearing test function by changing the tooling can be solved with one integrated test tooling.

[0151] In any embodiment of the present application, the tooling refers to tools, jigs, and equipment used for manufacturing, testing, debugging, or maintaining circuits.

[0152] The measured current provided by the embodiments of the present application can solve the problem that the open-circuit voltage measurement device cannot be repaired (or calibrated) in time when the resistor test loop test fails, compared with the separate resistor test tooling and zero-clearing test tooling in the related art.

[0153] Figure 10 For the structural schematic diagram of the test tooling provided in some embodiments, as Figure 10 shown, the test tooling 100 includes N test circuits 110 provided in any of the above embodiments. The test tooling 100 further includes a base 120 and a bottom plate 130 disposed on the base. The N test circuits 110 are provided on the bottom plate 130.

[0154] Exemplarily, N is an integer greater than or equal to 1. For example, the value range of N can be from 1 to 50. Exemplarily, the value of N can be 1, 5, 10, 20, or 50, etc. The embodiments of the present application do not limit this.

[0155] In Figure 10 the embodiments, N is an integer greater than 1. In Figure 10 another embodiment other than

[0156] In some embodiments, the value of N may be the same as the maximum number of batteries to be tested that can be placed in the battery tray. Please refer to Figure 3 together, the number of test circuits 110 in a test fixture may be the same as Figure 3 the number of relay groups or the number of test probe groups in

[0157] In the technical solution provided by the embodiments of the present application, by integrating multiple test circuits on the bottom plate, it is possible to test multiple test circuits through one test fixture, improving the test efficiency; in addition, by sharing a base and a bottom plate for the resistance test circuit and the zero-clearing test circuit, the reuse of the base and the bottom plate is realized, reducing the cost of the test fixture.

[0158] In some embodiments, as Figure 10 shown, a power-on interface 140 is further provided on 130, and the power-on interface 140 is connected to the control end of the switch component in each test circuit 110; by switching the power-on and power-off through the power-on interface 140, the working state of the switch component in each test circuit 110 is controlled to be switched.

[0159] In the technical solution provided by the embodiments of the present application, by controlling the switch components of all test circuits through one power-on interface, there is no need to separately configure control signals for each test circuit, simplifying the circuit design on the bottom plate, and through the power-on and power-off switching of the power-on interface, the unified switching of the working states of the switch components in all test circuits can be realized, improving the switching efficiency of the switch components.

[0160] Please refer to Figure 7 and Figure 10 to illustrate the working principle of the open-circuit voltage measuring device:

[0161] For example, when starting work every day (or when the production line starts to run), the open-circuit voltage measuring device enters the test mode. The test mode selected by the open-circuit voltage measuring device to enter is the zero-clearing test mode or the resistance test mode.

[0162] When the open-circuit voltage measuring device enters the zero-clearing test mode, the power supply port (also called the power supply interface) in the open-circuit voltage measuring device starts to supply power to the power-on interface (also called the power-taking port) of the integrated test fixture (i.e., Figure 10 the corresponding test fixture).

[0163] When the power supply interface of the integrated test tooling is powered on, the first switch, the second switch, and the third switch inside the integrated test tooling are powered on and enter the off state, and the fourth switch and the fifth switch are powered on and enter the on state. As a result, the test loop current starts from the current loop (SOURCE) high (corresponding to the positive current connection end mentioned above) and flows through the fourth switch. Since the fourth switch is powered on, it will connect the current loop high to the current loop low (corresponding to the negative current connection end), causing the current in the test loop to flow from the current loop high to the current loop low.

[0164] When the second switch is powered on, it will connect the current loop low to the voltage loop (SENSE) low (corresponding to the negative voltage connection end), causing the current in the test loop to flow from the current loop low to the voltage loop low.

[0165] When the fifth switch is powered on, it will connect the voltage loop low to the voltage loop high, causing the current in the test loop to flow from the voltage loop low to the voltage loop high (corresponding to the positive voltage connection end mentioned above).

[0166] Finally, the current in the test loop returns to the inside of the meter (i.e., the internal resistance meter mentioned above, also known as the internal resistance test instrument) through the voltage loop high. The software of the open-circuit voltage measuring device controls the internal resistance meter to perform a zeroing operation.

[0167] When the open-circuit voltage measuring device enters the resistance test mode, the power supply port in the open-circuit voltage measuring device stops supplying power to the power supply interface of the integrated test tooling.

[0168] When the power supply interface of the integrated test tooling is powered off (or de-energized), the first switch, the second switch, and the third switch inside the integrated test tooling are de-energized and enter the on state, and the fourth switch and the fifth switch enter the off state. As a result, the test loop current starts from the current loop high and flows through the third switch into the resistor. When the first switch is de-energized, it will connect the voltage loop high to the resistor and the voltage loop low. When the second switch is de-energized, it will connect the current loop high to the resistor and the current loop low. When the fourth switch is de-energized, the current loop high and the current loop low are not directly connected. When the fifth switch is de-energized, the voltage loop high and the voltage loop low are not directly connected. Finally, it is realized that the current in the test loop flows from the resistor to the current loop low, and the voltage loop in the test loop causes the voltage loop high to reach the voltage loop low through the resistor.

[0169] Figure 11 The structural schematic diagram of the open-circuit voltage measurement system provided for some embodiments is as Figure 11 shown. The open-circuit voltage measurement system includes the test tooling, the open-circuit voltage measurement device, and the battery tray carrying the battery under test in any of the above embodiments;

[0170] The open-circuit voltage measurement device is used to measure the battery under test in the battery tray when the calibration is successfully performed through the test tooling.

[0171] In some embodiments, when the resistance test loop in at least one test circuit in the test fixture is successfully calibrated, the open-circuit voltage measuring device is used to measure the battery under test in the battery tray. Among them, when there is one test circuit in the test fixture, if the open-circuit voltage measuring device is used to successfully calibrate the resistance test loop in this one test circuit, it is determined that the open-circuit voltage measuring device is successfully calibrated. When there are at least two test circuits in the test fixture, if the open-circuit voltage measuring device is used to successfully calibrate the resistance test loop in each of these test circuits, it is determined that the open-circuit voltage measuring device is successfully calibrated.

[0172] In some embodiments, at least one battery under test can be placed in the battery tray. The positive and negative electrodes of each battery under test are respectively connected to the positive electrical parameter connection terminal and the negative electrical parameter connection terminal. The open-circuit voltage measuring device is connected to each positive electrical parameter connection terminal and each negative electrical parameter connection terminal through each group of test probes to realize the measurement of each battery under test in the battery tray.

[0173] In the technical solution provided by the embodiments of the present application, when the open-circuit voltage measuring device is successfully calibrated through the test fixture, it indicates that the measurement accuracy of the open-circuit voltage measuring device meets the requirements. Furthermore, the open-circuit voltage measuring device with the measurement accuracy meeting the requirements is used to measure the battery under test in the battery tray, avoiding the problem that the battery under test is measured inaccurately when the measurement accuracy of the open-circuit voltage measuring device does not meet the requirements. Therefore, the embodiments of the present application can improve the accuracy of measuring the battery under test.

[0174] In some embodiments, as Figure 11 shown, the open-circuit voltage measurement system further includes a transfer device;

[0175] The transfer device is used to move the test fixture to the measurement area of the open-circuit voltage measuring device; the transfer device is also used to move the test fixture out of the measurement area and move the battery tray to the measurement area when the open-circuit voltage measuring device is successfully calibrated, so that the open-circuit voltage measuring device can measure the battery under test in the battery tray.

[0176] Among them, the transfer device is a device used for transferring the test fixture and the battery tray. Exemplarily, the test fixture and the battery tray are placed on the moving component, and the open-circuit voltage measurement system may further include a processor. The processor controls the transfer device to move, so that the test fixture and the battery tray move accordingly.

[0177] In some embodiments, the processor may control the transfer device to operate in response to a test signal, so that the transfer device moves the test tooling to the measurement area of the open-circuit voltage measuring device. The test signal may be sent by the host computer to the processor. Exemplarily, the test signal may be generated by the host computer connected to the processor according to the user's operation and sent to the processor, or the test signal may be sent by the host computer when it is determined that the detection result of the open-circuit voltage measuring device for the battery under test differs from the preset result by more than a preset threshold. Exemplarily, the test signal may include a start signal.

[0178] In some embodiments, when the transfer device moves the test tooling to the measurement area of the open-circuit voltage measuring device, the processor may send a test signal to the open-circuit voltage measuring device, and the open-circuit voltage measuring device calibrates itself through the test tooling in response to the test signal.

[0179] In some embodiments, the open-circuit voltage measuring device is further configured to send a calibration success signal to the processor when the calibration of the open-circuit voltage measuring device is successful. The processor controls the transfer device to operate in response to the calibration success signal, so that the transfer device moves the test tooling out of the measurement area and moves the battery tray to the measurement area. The processor sends a battery measurement signal to the open-circuit voltage measuring device, and the open-circuit voltage measuring device measures the battery under test in the battery tray in response to the battery measurement signal.

[0180] Exemplarily, the number of test circuits in the test tooling is the same as the maximum number of batteries under test that can be placed in the battery tray.

[0181] In the technical solution provided by the embodiments of the present application, through the cooperation of the transfer device and the open-circuit voltage measuring device, the testing of the open-circuit voltage measuring device and the measurement of the battery under test are automatically completed without manual intervention, improving the measurement efficiency of the open-circuit voltage measuring device.

[0182] In some embodiments, the open-circuit voltage measuring device includes a measuring instrument and at least one set of test probes connected to the measuring instrument; each set of test probes is respectively used to connect to the connection ends of the respective test circuits in the test tooling.

[0183] Exemplarily, please refer to Figure 11 and Figure 3, the measuring instrument may include an internal resistance meter. Exemplarily, the measuring instrument may be connected to N groups of test probes. Each group of test probes includes a first test probe and a second test probe. The first test probe may include a positive voltage test probe and a positive current test probe for respectively connecting the positive voltage terminal and the positive current terminal of the internal resistance meter. The second test probe may include a negative voltage test probe and a negative current test probe for respectively connecting the negative voltage terminal and the negative current terminal of the internal resistance meter. The first connection end of each test circuit includes a positive voltage connection end and a positive current connection end. The second connection end of each test circuit includes a negative voltage connection end and a negative current connection end. The positive voltage test probe, the positive current test probe, the negative voltage test probe, and the negative current test probe in each group of test probes are respectively used to connect the positive voltage connection end, the positive current connection end, the negative voltage connection end, and the negative current connection end in each corresponding test circuit. Through the positive voltage test probe, the positive current test probe, the negative voltage test probe, and the negative current test probe in each group of test probes, which are respectively used to connect the positive voltage connection end, the positive current connection end, the negative voltage connection end, and the negative current connection end in each corresponding test circuit, a resistance test loop and a zero-clearing test loop of each group are formed, and the open-circuit voltage measuring device is tested through the resistance test loop and the zero-clearing test loop of each group.

[0184] In the technical solution provided by the embodiment of the present application, each group of test probes connected to the measuring instrument are respectively used to connect the connection ends of each test circuit in the test tooling, so that each resistance test loop and each zero-clearing test loop can be formed through each test circuit, improving the effectiveness of testing the open-circuit voltage measuring device.

[0185] In some embodiments, the open-circuit voltage measuring device further includes a power supply interface; the open-circuit voltage measuring device is further used to connect the power supply interface to the power-on interface in the test tooling, and power on the power-on interface through the power supply interface to perform the state switching of the switch component in the test tooling.

[0186] In some embodiments, when the test tooling moves to the measurement area of the open-circuit voltage measuring device, the open-circuit voltage measuring device controls the first test probe and the second test probe of each group of test probes to respectively connect the first connection end and the second connection end of each test circuit. The open-circuit voltage measuring device may be used to, when it is determined that the open-circuit voltage measuring device is successfully calibrated, not control the power supply interface to be connected to the power-on interface. In some embodiments, the open-circuit voltage measuring device may be used to, when it is determined that the open-circuit voltage measuring device is calibrated failed, control the power supply interface to be connected to the power-on interface to power on the power-on interface through the power supply interface, so that the test circuit in the test tooling is switched from the resistance test loop to the zero-clearing test loop.

[0187] In some other embodiments, when the open-circuit voltage measurement device moves the test fixture to the measurement area of the open-circuit voltage measurement device, the open-circuit voltage measurement device controls the first test probe and the second test probe of each group of test probes to be respectively connected to the first connection end and the second connection end of each test circuit, and controls the power supply interface to be connected to the power-on interface, and then performs the calibration step of the open-circuit voltage measurement device.

[0188] In the technical solution provided by the embodiments of the present application, power is supplied to the power-on interface in the test fixture through the power supply interface of the open-circuit voltage measurement device, without introducing other additional power supply devices, avoiding the increase in cost caused by the need to set up additional power supply devices, thereby being able to reduce the layout cost of the open-circuit voltage measurement system, and the open-circuit voltage measurement device can provide a stable power supply to each test circuit in the test fixture, avoiding test errors caused by power fluctuations or instability, and improving the accuracy of testing the open-circuit voltage measurement device.

[0189] In some embodiments, the open-circuit voltage measurement device is further configured to determine that the open-circuit voltage measurement device is calibrated successfully in response to a test signal when the calibration results of calibrating through each resistance test loop are all calibration successes; wherein, the resistance test loop is a closed path formed by the open-circuit voltage measurement device connecting to the resistance test circuit in the test fixture.

[0190] Exemplarily, when there is one test circuit in the test fixture, if the open-circuit voltage measurement device is calibrated successfully using this one test circuit, it is determined that the open-circuit voltage measurement device is calibrated successfully. Another example is that when there are at least two test circuits in the test fixture, if the open-circuit voltage measurement device is calibrated successfully using each of these test circuits, it is determined that the open-circuit voltage measurement device is calibrated successfully.

[0191] In the technical solution provided by the embodiments of the present application, each resistance test loop in the test fixture is used to calibrate the open-circuit voltage measurement device respectively, and only when the calibration results of calibrating through each resistance test loop are all calibration successes, it is determined that the open-circuit voltage measurement device is calibrated successfully, thereby being able to improve the comprehensiveness and accuracy of calibrating the open-circuit voltage measurement circuit.

[0192] In some embodiments, the open-circuit voltage measurement device is further configured to, in response to a test signal, when the calibration result obtained by calibrating through any one of the resistance test circuits (hereinafter referred to as the target resistance test circuit) fails, after calibrating the open-circuit voltage measurement device through each zero-clear test circuit, determine that the open-circuit voltage measurement device is successfully calibrated when the calibration results obtained by calibrating through each resistance test circuit are all successful; wherein, the resistance test circuit is a closed path formed by connecting the open-circuit voltage measurement device to the resistance test circuit in the test fixture, and the zero-clear test circuit is a closed path formed by connecting the open-circuit voltage measurement device to the zero-clear test circuit in the test fixture.

[0193] In some embodiments, calibrating the open-circuit voltage measurement device through each zero-clear test circuit may include: calibrating the open-circuit voltage measurement device through the target zero-clear test circuit; wherein, the target zero-clear test circuit is the zero-clear test circuit with the same connection end as the target resistance test circuit.

[0194] In the technical solution provided by the embodiments of the present application, by introducing the zero-clear test circuit calibration mechanism, when the open-circuit voltage measurement device fails in calibration, the open-circuit voltage measurement device can also solve the problem through self-calibration, avoiding the situation where the voltage measurement device cannot be calibrated and only the open-circuit voltage measurement device with a failed calibration can be used to measure the battery under test, and improving the reliability of the open-circuit voltage measurement device for measuring the battery under test.

[0195] The following describes the implementation manner of the open-circuit voltage measurement device in the open-circuit voltage measurement system using the test fixture for testing: First, when the test fixture moves to the measurement area of the open-circuit voltage measurement device, the open-circuit voltage measurement device controls the positive voltage test probe, positive current test probe, negative voltage test probe, and negative current test probe in each group of test probes to be respectively connected to the positive voltage connection end, positive current connection end, negative voltage connection end, and negative current connection end in the corresponding each test circuit. In this way, each resistance test circuit is formed by connecting the resistance meter to the resistance measurement circuit in each test circuit; then the internal resistance meter detects the resistance values of each resistance test circuit. If the detected resistance values are the same as the resistance values of the resistors in each test circuit, or the difference value is less than the preset threshold, the calibration results obtained by calibrating through each resistance test circuit are all successful.

[0196] However, if the resistance value corresponding to the target resistance test loop is different from the resistance value of the resistor in the corresponding target test circuit, or the difference value is greater than or equal to the preset threshold, the calibration result obtained by calibrating through the target resistance test loop is a calibration failure. In this case, the open-circuit voltage measuring device controls the power supply interface to be connected to the power-on interface and powers on the power-on interface through the power supply interface. In this way, by connecting the ohmmeter to the zero-clear measurement circuits in each test circuit, each zero-clear test loop formed can have the ohmmeter detect the resistance value of the zero-clear test loop in the target test circuit and zero the detected resistance value, thereby achieving the calibration of the open-circuit voltage measuring device through the target zero-clear test loop. Then, the open-circuit voltage measuring device controls the power supply interface to be disconnected from the power-on interface and repeats the operation of calibrating through each resistance test loop. When the calibration results obtained by calibrating through each resistance test loop are all successful, it is determined that the open-circuit voltage measuring device is successfully calibrated.

[0197] Figure 12 Schematic diagram of the process of the open-circuit voltage measurement method provided for some embodiments, as Figure 12 shown. This method is applied to an open-circuit voltage measuring device, and the method includes:

[0198] S1201. Detect that the test tooling has moved to the measurement area of the open-circuit voltage measuring device, and control each group of test probes of the open-circuit voltage measuring device to be connected to the connection ends of each test circuit in the test tooling respectively.

[0199] S1202. Calibrate the open-circuit voltage measuring device by controlling each zero-clear test loop to conduct.

[0200] Among them, the zero-clear test loop is a closed path formed by the open-circuit voltage measuring device connecting to the zero-clear test circuit in the test tooling.

[0201] In some embodiments, before S1202, the method further includes: the calibration result obtained by the open-circuit voltage measuring device calibrating through the target resistance test loop is a calibration failure.

[0202] In some embodiments, S1202 may include: the open-circuit voltage measuring device controls the power supply interface to be connected to the power-on interface and powers on the power-on interface through the power supply interface to make each zero-clear test loop conduct.

[0203] S1203. Calibrate the open-circuit voltage measuring device by controlling each resistance test loop to conduct.

[0204] Among them, the resistance test loop is a closed path formed by the open-circuit voltage measuring device connecting to the resistance test circuit in the test tooling.

[0205] In some embodiments, S1203 may include: the open-circuit voltage measurement device controls the power supply interface to disconnect from the power-on interface, so that each test circuit switches to the conduction of each resistance test loop.

[0206] S1204. When the calibration of the open-circuit voltage measurement device is successful, it is detected that the battery tray moves to the measurement area, and the battery to be tested in the battery tray is measured.

[0207] In the technical solution provided by the embodiments of the present application, the open-circuit voltage measurement device first controls the conduction of each zero-clearing test loop, and then controls the conduction of each resistance test loop. Thus, the open-circuit voltage measurement device can automatically perform the steps of calibration and calibration, improving the efficiency of calibration and calibration of the open-circuit voltage measurement device.

[0208] In an exemplary embodiment, some embodiments of the present application are implemented through an open-circuit voltage measurement device, which includes a connection control module, a calibration module, a calibration module, and a measurement module. The connection control module is used to detect that the test tooling moves to the measurement area of the open-circuit voltage measurement device, and control each group of test probes of the open-circuit voltage measurement device to be connected to the connection ends of each test circuit in the test tooling; the calibration module is used to calibrate the open-circuit voltage measurement device by controlling the conduction of each zero-clearing test loop; the zero-clearing test loop is a closed path formed by the open-circuit voltage measurement device connecting to the zero-clearing test circuit in the test tooling; the calibration module is used to calibrate the open-circuit voltage measurement device by controlling the conduction of each resistance test loop; the resistance test loop is a closed path formed by the open-circuit voltage measurement device connecting to the resistance test circuit in the test tooling; the measurement module is used to detect that the battery tray moves to the measurement area when the calibration of the open-circuit voltage measurement device is successful, and measure the battery to be tested in the battery tray.

[0209] In some embodiments, the open-circuit voltage measurement device includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the steps of the method in any of the above embodiments are implemented.

[0210] In one embodiment, a computer-readable storage medium is provided. When a computer program is executed by a processor, the steps of the method provided in any of the above embodiments are implemented.

[0211] In one embodiment, a computer program product is provided, including a computer program. When the computer program is executed by a processor, the steps of the method provided in any of the above embodiments are implemented.

[0212] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in the present application.

[0213] The above embodiments only represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation to the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several deformations and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims

1. A test circuit, characterized in that: The test circuit includes a resistor, a switch component and a connection terminal; the switch component includes a first switch group and a second switch group; The connection end is connected to the resistor through the first switch group to form a resistance test circuit, and the resistance test circuit is used to form a resistance test loop; The connection end is also connected to the second switch group to form a zeroing test circuit, and the zeroing test circuit is used to form a zeroing test loop.

2. The test circuit according to claim 1, characterized in that: The switch assembly is used to switch between a first working state and a second working state; When the switch assembly is in the first working state, the first switch group is turned on and the second switch group is turned off, so that the resistance test loop is turned on and the zeroing test loop is turned off; When the switch assembly is in the second working state, the first switch group is disconnected and the second switch group is turned on, so that the resistance test loop is disconnected and the zeroing test loop is turned on.

3. The test circuit according to claim 2, characterized in that: When the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is turned on and the second switch group is turned off; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned off and the second switch group is turned on; or, When the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is disconnected and the second switch group is turned on; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned on and the second switch group is disconnected.

4. The test circuit according to claim 2, characterized in that: The switches in the first switch group are normally closed switches, and the switches in the second switch group are normally open switches; or, The switches in the first switch group are normally open switches, and the switches in the second switch group are normally closed switches.

5. The test circuit according to any one of claims 1 to 4, characterized in that: The connection terminals include a positive voltage connection terminal, a positive current connection terminal, a negative voltage connection terminal and a negative current connection terminal; The positive voltage connection terminal and the negative voltage connection terminal are both connected to the resistor through the first switch group to form a voltage test circuit in the resistor test circuit; The positive current connection terminal and the negative current connection terminal are both connected to the resistor through the first switch group to form a current test circuit in the resistor test circuit; The positive voltage connection terminal is also connected to the negative voltage connection terminal through the second switch group to form a voltage test circuit in the zeroing test circuit; The positive current connection end is also connected to the negative current connection end through the second switch group to form a current test circuit in the zeroing test circuit.

6. The test circuit according to claim 5, characterized in that: The first switch group includes a first switch, a second switch and a third switch; the second switch group includes a fourth switch and a fifth switch; The positive voltage connection terminal is connected to the first end of the resistor through the first switch, and the second end of the resistor is connected to the negative voltage connection terminal through the second switch; the positive current connection terminal is connected to the first end of the resistor through the third switch, and the second end of the resistor is connected to the negative current connection terminal through the second switch; The positive current connection terminal is connected to the negative current connection terminal through the fourth switch, the negative current connection terminal is connected to the negative voltage connection terminal through the second switch, and the negative voltage connection terminal is connected to the positive voltage connection terminal through the fifth switch.

7. The test circuit according to claim 6, characterized in that: The second switch includes a first relay and a second relay; The normally open end of the first relay is connected to the normally open end of the second relay; The common terminal and the normally closed terminal of the first relay are connected to the negative voltage connection terminal and the second terminal of the resistor respectively; The common terminal and the normally closed terminal of the second relay are connected to the negative current connection terminal and the second end of the resistor respectively.

8. The test circuit according to claim 6, characterized in that: The second switch includes a third relay and a fourth relay, and the second switch group also includes a fifth relay; The third relay is connected between the second end of the resistor and the negative voltage connection end; The fourth relay is connected between the second end of the resistor and the negative current connection end; The fifth relay is connected between the negative voltage connection terminal and the negative current connection terminal.

9. The test circuit according to any one of claims 1 to 4, characterized in that: The connection end includes a first connection end and a second connection end; the relative position between the first connection end and the second connection end is the same as the relative position between the positive electrical parameter terminal and the negative electrical parameter terminal in the battery tray; Wherein, the positive electrical parameter terminal and the negative electrical parameter terminal are respectively connected to the positive electrode and the negative electrode of the battery to be tested in the battery tray.

10. A test tool, characterized in that: The test fixture comprises a base and a bottom plate arranged on the base, and at least one test circuit according to any one of claims 1 to 9 is arranged on the bottom plate.

11. The test tool according to claim 10, characterized in that: The base plate is also provided with a power-on interface, which is connected to the control end of the switch component in each of the test circuits; the switching of the working state of the switch component in each of the test circuits is controlled by switching the power on and off of the power on interface.

12. An open circuit voltage measurement system, characterized in that: The open circuit voltage measurement system comprises the test fixture as claimed in claim 10 or 11, an open circuit voltage measurement device and a battery tray carrying a battery to be tested; The open circuit voltage measuring device is used to measure the battery to be tested in the battery tray when the test fixture is successfully calibrated.

13. The open circuit voltage measurement system according to claim 12, characterized in that: The open circuit voltage measurement system also includes a transport device; The transfer device is used to move the test tool to the measurement area of ​​the open circuit voltage measurement device; The transfer device is also used to move the test fixture out of the measurement area and move the battery tray to the measurement area when the open circuit voltage measurement device is calibrated successfully, so that the open circuit voltage measurement device can measure the battery to be tested in the battery tray.

14. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device comprises a measuring instrument and at least one set of test probes connected to the measuring instrument; Each group of the test probes is used to connect to the connection ends of each test circuit in the test fixture.

15. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device also includes a power supply interface; the open circuit voltage measuring device is also used to connect the power supply interface to the power-on interface in the test tooling, and to power on the power-on interface through the power supply interface to switch the state of the switch component in the test tooling.

16. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device is also used to respond to the test signal and determine that the calibration of the open circuit voltage measuring device is successful when the calibration results of the calibration through each resistance test loop are all successful; The resistance test loop is a closed path formed by connecting the open circuit voltage measuring device to the resistance test circuit in the test fixture.

17. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device is also used to respond to the test signal, and when the calibration result of calibration through any resistance test circuit is calibration failure, after calibrating the open circuit voltage measuring device through each zeroing test circuit, when the calibration results of calibration through each resistance test circuit are all calibration success, determine that the open circuit voltage measuring device is calibrated successfully; Among them, the resistance test loop is a closed path formed by connecting the open circuit voltage measuring device to the resistance test circuit in the test fixture, and the zeroing test loop is a closed path formed by connecting the open circuit voltage measuring device to the zeroing test circuit in the test fixture.

18. A method for measuring open circuit voltage, characterized in that: The method is applied to an open circuit voltage measuring device, and the method comprises: Upon detecting that the test fixture has moved to the measuring area of ​​the open circuit voltage measuring device, controlling each group of test probes of the open circuit voltage measuring device to be connected to the connection ends of each test circuit in the test fixture respectively; The open circuit voltage measuring device is calibrated by controlling each zeroing test circuit to be turned on; the zeroing test circuit is a closed path formed by connecting the open circuit voltage measuring device to the zeroing test circuit in the test fixture; The open circuit voltage measuring device is calibrated by controlling each resistance test loop to be turned on; the resistance test loop is a closed path formed by connecting the open circuit voltage measuring device to the resistance test circuit in the test fixture; When the open circuit voltage measuring device is calibrated successfully, it is detected that the battery tray moves to the measuring area, and the batteries to be tested in the battery tray are measured.

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