Refractive index correction method and device of electro-optical effect voltage sensor

Abstract

The invention provides a refractive index correction method and device of an electro-optical effect voltage sensor, and belongs to the field of electro-optical effect voltage sensors. The method comprises the following steps: constructing a basic refractive index model for representing the relationship that the refractive index of a standard electro-optical crystal in any electro-optical effect voltage sensor changes along with the temperature in the heat transfer process; obtaining standard physical characteristic data and standard optical characteristic data corresponding to the standard electro-optical crystal and target physical characteristic data and target optical characteristic data corresponding to a target electro-optical crystal in the target electro-optical effect voltage sensor; calculating the similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical characteristic data, the target physical characteristic data, the standard optical characteristic data and the target optical characteristic data; and correcting the basic refractive index model according to the similarity to obtain a refractive index correction value of the target electro-optical crystal. According to the invention, the output correction effect of the target electro-optical effect voltage sensor can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electro-optic effect voltage sensors, and in particular, to a refractive index correction method and device for an electro-optic effect voltage sensor. Background Art

[0002] As a new generation of power system, the smart grid aims to improve the operation efficiency and reliability of the power grid, which is an important direction for the development of the power system. Advanced sensing and measurement technologies are important guarantees for the stable and efficient operation of the smart grid. Therefore, due to characteristics such as simple structure, large dynamic range, wide measurement bandwidth, and strong anti-interference ability, the electro-optic effect voltage sensor has good application prospects in applications such as voltage measurement and on-line monitoring of the smart grid.

[0003] As Figure 1 shown, an electro-optic effect voltage sensor generally includes a polarizer, a λ / 4 wave plate, an electro-optic crystal (such as a BGO crystal), an analyzer, etc. During the working process, natural light or unpolarized light emitted by a light source passes through the polarizer, selectively passing polarized light in a certain specific direction to generate linearly polarized light. The linearly polarized light can be split into two mutually perpendicular polarized lights by a beam splitter, and then pass through the λ / 4 wave plate to make the phase difference between the two mutually perpendicular polarized lights 90 degrees (i.e., 1 / 4 wavelength), thereby forming circularly polarized light. Then the circularly polarized light passes through the electro-optic crystal. Due to the Pockels effect, the refractive index of the electro-optic crystal changes with the change of the applied electric field, resulting in a change in the phase difference of the circularly polarized light. The circularly polarized light with a changed phase difference can pass through the λ / 4 wave plate and the analyzer again and be detected by a photodetector, converted into a change in light intensity. And because the change in phase difference is proportional to the applied voltage, the voltage value can be determined by the change in light intensity reflecting the change in phase difference.

[0004] However, in the actual application process, the refractive index and electro-optic coefficient of the electro-optic crystal in the electro-optic effect voltage sensor change with temperature, and the sizes and shapes of optical elements such as optical fibers and collimating lenses also change with temperature, affecting the alignment of the optical path and the light intensity distribution, and further causing the output signal of the sensor to change accordingly, resulting in deviation of the measurement result and affecting the accuracy and stability of the sensor. To overcome this problem, currently, a mathematical model for quantitatively describing the relationship between the sensor output and the temperature of the electro-optic crystal of the sensor has been established through multiple temperature experiments, and at the same time, the temperature of the electro-optic crystal is collected in real time by a temperature sensor, and the sensor output is corrected according to the mathematical model and the real-time collected temperature. However, due to problems such as large dispersion, poor repeatability, and certain differences in the results of each measurement in the relationship between the refractive index of the electro-optic crystal and temperature, the output correction effect of the electro-optic effect voltage sensor is poor. Summary of the Invention

[0005] An embodiment of the present invention provides a refractive index correction method and device for an electro-optic effect voltage sensor to solve the problem of poor output correction effect of the electro-optic effect voltage sensor at present.

[0006] In a first aspect, an embodiment of the present invention provides a refractive index correction method for an electro-optic effect voltage sensor, including:

[0007] Construct a basic refractive index model, where the basic refractive index model characterizes the relationship between the refractive index and temperature of a standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process;

[0008] Obtain the standard physical property data and standard optical property data corresponding to the standard electro-optic crystal, and the target physical property data and target optical property data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor;

[0009] Calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data;

[0010] Correct the basic refractive index model according to the similarity to obtain the refractive index correction value of the target electro-optic crystal.

[0011] In a possible implementation manner, calculating the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data includes:

[0012] Calculate the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data;

[0013] Calculate the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard optical property data and the target optical property data;

[0014] Calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the physical property similarity and the optical property similarity.

[0015] In a possible implementation manner, the standard physical property data includes a standard component vector and standard physical dimension data, and the target physical property data includes a target component vector and target physical dimension data;

[0016] Calculating the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data includes:

[0017] Calculate the cosine similarity between the standard component vector and the target component vector, denoted as the first physical property similarity;

[0018] Calculate the Euclidean distance between the standard physical size data and the target physical size data, denoted as the second physical property similarity;

[0019] Perform a weighted sum of the first physical property similarity and the second physical property similarity to obtain the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0020] In a possible implementation, the standard optical property data includes the standard electro-optic coefficient and the standard production process data, and the target optical property data includes the target electro-optic coefficient and the target production process data;

[0021] Calculate the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard optical property data and the target optical property data, including:

[0022] Calculate the Euclidean distance between the standard electro-optic coefficient and the target electro-optic coefficient, denoted as the basic optical property similarity;

[0023] Perform convolution extraction on the standard production process data and the target production process data to obtain the local optical property similarity of each time window in the production process between the target electro-optic crystal and the standard electro-optic crystal;

[0024] Correct the basic optical property similarity according to each local optical property similarity to obtain the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0025] In a possible implementation, correcting the basic optical property similarity according to each local optical property similarity to obtain the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal includes:

[0026] Perform a weighted sum of each local optical property similarity, and denote the weighted sum result as the overall optical property similarity between the target electro-optic crystal and the standard electro-optic crystal;

[0027] Compare the overall optical property similarity and the basic optical property similarity, and determine the smaller value of the overall optical property similarity and the basic optical property similarity as the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0028] In a possible implementation, calculating the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the physical property similarity and the optical property similarity includes:

[0029] Performing a weighted sum on the physical property similarity and the optical property similarity to obtain the similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0030] In a possible implementation, constructing a basic refractive index model includes:

[0031] Obtaining the refractive index of the standard electro-optic crystal in any electro-optic effect voltage sensor from the initial temperature to the target temperature during the heat transfer process as the training set;

[0032] Fitting the relationship between the refractive index and different temperatures based on the training set to obtain a basic refractive index model.

[0033] In a possible implementation, correcting the basic refractive index model according to the similarity to obtain the refractive index correction value of the target electro-optic crystal includes:

[0034] Obtaining the temperature change rate of the target electro-optic crystal in the target electro-optic effect voltage sensor from the preset initial temperature to the preset target temperature during the heat transfer process;

[0035] Correcting the basic refractive index model according to the similarity and the temperature change rate to obtain the refractive index correction value of the target electro-optic crystal.

[0036] In a second aspect, an embodiment of the present invention provides a refractive index correction device for an electro-optic effect voltage sensor, including:

[0037] A construction module, configured to construct a basic refractive index model, where the basic refractive index model characterizes the relationship between the refractive index and temperature of the standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process;

[0038] An acquisition module, configured to acquire the standard physical property data and standard optical property data corresponding to the standard electro-optic crystal, and the target physical property data and target optical property data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor;

[0039] A calculation module, configured to calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data;

[0040] A correction module, configured to correct the basic refractive index model according to the similarity to obtain the refractive index correction value of the target electro-optic crystal.

[0041] In a possible implementation manner, the calculation module is specifically configured to:

[0042] Calculate the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data;

[0043] Calculate the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard optical property data and the target optical property data;

[0044] Calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the physical property similarity and the optical property similarity.

[0045] The embodiment of the present invention provides a refractive index correction method and device for an electro-optic effect voltage sensor. First, a basic refractive index model is constructed, and the basic refractive index model characterizes the relationship between the refractive index and temperature change of the standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process; then, the standard physical property data and standard optical property data corresponding to the standard electro-optic crystal, and the target physical property data and target optical property data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor are obtained; furthermore, according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data, the similarity between the target electro-optic crystal and the standard electro-optic crystal is calculated; thus, the basic refractive index model is corrected according to the similarity to obtain the refractive index correction value of the target electro-optic crystal. Thus, through the physical properties and optical properties of the target electro-optic crystal and the standard electro-optic crystal, the similarity between the target electro-optic crystal and the standard electro-optic crystal is measured, so as to more accurately obtain the refractive index correction value of the target electro-optic crystal, and further improve the output correction effect of the target electro-optic effect voltage sensor through the refractive index correction value, which helps to promote the practical application of the electro-optic effect voltage sensor. Description of the Drawings

[0046] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0047] Figure 1 is a schematic structural diagram of an electro-optic effect voltage sensor provided by an embodiment of the present invention;

[0048] Figure 2 is a flowchart of the implementation of the refractive index correction method for an electro-optic effect voltage sensor provided by an embodiment of the present invention;

[0049] Figure 3 It is a schematic structural diagram of the refractive index correction device of the electro-optic effect voltage sensor provided by an embodiment of the present invention. Detailed implementation manners

[0050] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. However, those skilled in the art should clearly understand that the present invention can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present invention.

[0051] To make the objectives, technical solutions, and advantages of the present invention clearer, the following will be described through specific embodiments in conjunction with the accompanying drawings.

[0052] Figure 2 It is a flowchart for implementing the refractive index correction method of the electro-optic effect voltage sensor provided by an embodiment of the present invention, which is described in detail as follows:

[0053] Step 201, construct a basic refractive index model.

[0054] Among them, the basic refractive index model characterizes the relationship between the refractive index and temperature of the standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process.

[0055] Exemplarily, the process of constructing the basic refractive index model can be:

[0056] Obtain the refractive index of the standard electro-optic crystal in any electro-optic effect voltage sensor from the initial temperature to the target temperature during the heat transfer process as the training set; based on the training set, fit the relationship between the refractive index and different temperatures to obtain the basic refractive index model.

[0057] Among them, during the heat transfer process, the change from the initial temperature to the target temperature can be a temperature rising trend or a temperature falling trend. Or, a basic refractive index model can also be constructed for the temperature rising trend from the initial temperature to the target temperature, and a basic refractive index model can be constructed for the temperature falling trend from the initial temperature to the target temperature.

[0058] In this embodiment, considering problems such as large dispersion and poor repeatability of the relationship between the refractive index of the electro-optic crystal and temperature, it is not necessary to obtain too much data to construct the basic refractive index model. Only one set or several sets of data for a certain electro-optic effect voltage sensor need to be obtained, so as to construct the basic refractive index model as a reference through a small amount of data, and improve the output correction effect of the electro-optic effect voltage sensor by subsequent correction of the basic refractive index model.

[0059] Step 202: Obtain the standard physical characteristic data and standard optical characteristic data corresponding to the standard electro-optic crystal, as well as the target physical characteristic data and target optical characteristic data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor.

[0060] In this embodiment, in order to perform targeted correction on the basic refractive index model for the target electro-optic effect voltage sensor, obtain the standard physical characteristic data and standard optical characteristic data corresponding to the standard electro-optic crystal, as well as the target physical characteristic data and target optical characteristic data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor, so as to measure the difference between the two from the physical and optical characteristics of the standard electro-optic crystal in a certain electro-optic effect voltage sensor and the target electro-optic crystal in the target electro-optic effect voltage sensor, for use in subsequent correction of the basic refractive index model.

[0061] Step 203: Calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical characteristic data and the target physical characteristic data, as well as the standard optical characteristic data and the target optical characteristic data.

[0062] Exemplarily, the physical characteristic data may include the composition vector and physical dimension data of the electro-optic crystal, corresponding to the standard physical characteristic data, i.e., the standard composition vector and standard physical dimension data of the standard electro-optic crystal. Corresponding to the target physical characteristic data, i.e., the target composition vector and target physical dimension data of the target electro-optic crystal.

[0063] Similarly, the optical characteristic data may include the electro-optic coefficient and production process data of the electro-optic crystal, corresponding to the standard optical characteristic data, i.e., the standard electro-optic coefficient and standard production process data of the standard electro-optic crystal. Corresponding to the target optical characteristic data, i.e., the target electro-optic coefficient and target production process data of the target electro-optic crystal.

[0064] In this embodiment, by calculating the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical characteristic data and the target physical characteristic data, as well as the standard optical characteristic data and the target optical characteristic data, the similarity degree between the target electro-optic crystal and the standard electro-optic crystal can be measured more accurately, which helps to correct the basic refractive index model more accurately subsequently and obtain the refractive index correction value of the target electro-optic crystal.

[0065] Step 204: Correct the basic refractive index model according to the similarity to obtain the refractive index correction value of the target electro-optic crystal.

[0066] In this embodiment, the basic refractive index model is corrected according to the similarity to obtain the refractive index correction value of the target electro-optic crystal, so as to determine the measured voltage of the target electro-optic effect voltage sensor according to the refractive index correction value, thereby improving the output correction effect of the target electro-optic effect voltage sensor and promoting the practical application of the electro-optic effect voltage sensor.

[0067] In an embodiment of the present invention, first, a basic refractive index model is constructed. The basic refractive index model characterizes the relationship between the refractive index and temperature of the standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process. Then, the standard physical property data and standard optical property data corresponding to the standard electro-optic crystal, as well as the target physical property data and target optical property data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor, are obtained. Furthermore, according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data, the similarity between the target electro-optic crystal and the standard electro-optic crystal is calculated. Thus, the basic refractive index model is corrected according to the similarity to obtain the refractive index correction value of the target electro-optic crystal. Therefore, through the physical and optical properties of the target electro-optic crystal and the standard electro-optic crystal, the similarity between the target electro-optic crystal and the standard electro-optic crystal is measured, so as to more accurately obtain the refractive index correction value of the target electro-optic crystal. Furthermore, the output correction effect of the target electro-optic effect voltage sensor is improved through the refractive index correction value, which helps to promote the practical application of the electro-optic effect voltage sensor.

[0068] In one embodiment, calculating the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data may include:

[0069] Calculate the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data.

[0070] Calculate the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard optical property data and the target optical property data.

[0071] Calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the physical property similarity and the optical property similarity.

[0072] Exemplarily, calculating the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the physical property similarity and the optical property similarity may include:

[0073] Perform a weighted sum of the physical property similarity and the optical property similarity to obtain the similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0074] Among them, the weights of the physical property similarity and the optical property similarity can be determined through training.

[0075] Exemplarily, the standard physical property data may include a standard component vector and standard physical dimension data, and the target physical property data may include a target component vector and target physical dimension data.

[0076] Correspondingly, according to the standard physical property data and the target physical property data, calculating the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal may include:

[0077] Calculating the cosine similarity between the standard component vector and the target component vector, denoted as the first physical property similarity.

[0078] Calculating the Euclidean distance between the standard physical dimension data and the target physical dimension data, denoted as the second physical property similarity.

[0079] Performing weighted summation on the first physical property similarity and the second physical property similarity to obtain the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0080] In this embodiment, considering that small differences in the composition, component content, and physical dimensions of the electro-optic crystal may all lead to refractive index deviations of the electro-optic crystal, therefore, based on the composition of the electro-optic crystal, a component vector characterizing the composition difference and component content difference of the electro-optic crystal is constructed to obtain the first physical property similarity using the cosine similarity between the standard component vector and the target component vector, obtain the second physical property similarity using the Euclidean distance between the standard physical dimension data and the target physical dimension data, and comprehensively measure the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal through the first physical property similarity and the second physical property similarity.

[0081] Exemplarily, the standard optical property data may include a standard electro-optic coefficient and standard production process data, and the target optical property data may include a target electro-optic coefficient and target production process data.

[0082] Correspondingly, according to the standard optical property data and the target optical property data, calculating the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal may include:

[0083] Calculating the Euclidean distance between the standard electro-optic coefficient and the target electro-optic coefficient, denoted as the basic optical property similarity.

[0084] Performing convolutional extraction on the standard production process data and the target production process data to obtain the local optical property similarity of each time window in the production process between the target electro-optic crystal and the standard electro-optic crystal.

[0085] The basic optical property similarity is corrected according to each local optical property similarity to obtain the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0086] In this embodiment, considering that the electro-optic coefficient of the electro-optic crystal is the main factor leading to the refractive index difference, and the differences between the production process parameters of each electro-optic crystal result in the dispersion of the refractive indices of electro-optic crystals in different production batches under the same production process. Therefore, on the one hand, the Euclidean distance between the standard electro-optic coefficient and the target electro-optic coefficient is used to obtain the basic optical property similarity between the target electro-optic crystal and the standard electro-optic crystal. On the other hand, the standard production process data and the target production process data are also subjected to convolution extraction to obtain the local optical property similarity of the target electro-optic crystal and the standard electro-optic crystal in each time window during the production process, so as to more accurately measure the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal through the mutual verification between each local optical property similarity and the basic optical property similarity.

[0087] Exemplarily, correcting the basic optical property similarity according to each local optical property similarity to obtain the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal may include:

[0088] The weighted sum of each local optical property similarity is calculated, and the result of the weighted sum is recorded as the overall optical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0089] The overall optical property similarity and the basic optical property similarity are compared, and the smaller value between the overall optical property similarity and the basic optical property similarity is determined as the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0090] In this embodiment, by calculating the weighted sum of each local optical property similarity, recording the result of the weighted sum as the overall optical property similarity between the target electro-optic crystal and the standard electro-optic crystal, and determining the smaller value between the overall optical property similarity and the basic optical property similarity as the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal, the differences between the target electro-optic crystal and the standard electro-optic crystal can be considered as much as possible, and sufficient correction can be performed on the target electro-optic effect voltage sensor.

[0091] In one embodiment, correcting the basic refractive index model according to the similarity to obtain the refractive index correction value of the target electro-optic crystal may include:

[0092] Obtain the temperature change rate of the target electro-optic crystal in the target electro-optic effect voltage sensor from the preset initial temperature to the preset target temperature during the heat transfer process.

[0093] The basic refractive index model is corrected according to the similarity and the temperature change rate to obtain the refractive index correction value of the target electro-optic crystal.

[0094] Among them, the preset initial temperature can be the measured value of the initial temperature of the target electro-optic crystal in the target electro-optic effect voltage sensor during the heat transfer process, and the preset target temperature can be the predicted value of the temperature change of the target electro-optic crystal in the target electro-optic effect voltage sensor during the heat transfer process. The temperature change rate is obtained through the preset initial temperature and the preset target temperature. The basic refractive index model can be expanded or compressed as soon as possible based on the temperature change rate corresponding to the basic refractive index model, and then corrected according to the similarity on this basis, so as to adaptively obtain the refractive index correction value of the target electro-optic crystal.

[0095] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not mean the order of execution. The order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.

[0096] The following is an apparatus embodiment of the present invention. For the details not described in detail therein, reference may be made to the corresponding method embodiments above.

[0097] Figure 3 The structural schematic diagram of the refractive index correction apparatus of the electro-optic effect voltage sensor provided by the embodiment of the present invention is shown. For the convenience of description, only the parts related to the embodiment of the present invention are shown and are described in detail as follows:

[0098] As Figure 3 shown, the refractive index correction apparatus of the electro-optic effect voltage sensor includes: a construction module 31, an acquisition module 32, a calculation module 33, and a correction module 34.

[0099] The construction module 31 is used to construct a basic refractive index model, and the basic refractive index model characterizes the relationship between the refractive index and temperature change of the standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process;

[0100] The acquisition module 32 is used to acquire the standard physical characteristic data and standard optical characteristic data corresponding to the standard electro-optic crystal, as well as the target physical characteristic data and target optical characteristic data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor;

[0101] The calculation module 33 is used to calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical characteristic data and the target physical characteristic data, as well as the standard optical characteristic data and the target optical characteristic data;

[0102] The correction module 34 is used to correct the basic refractive index model according to the similarity to obtain the refractive index correction value of the target electro-optic crystal.

[0103] In an embodiment of the present invention, a basic refractive index model is first constructed. The basic refractive index model characterizes the relationship between the refractive index and temperature of a standard electro-optic crystal in any electro-optic effect voltage sensor during the heat transfer process. Then, the standard physical property data and standard optical property data corresponding to the standard electro-optic crystal, as well as the target physical property data and target optical property data corresponding to the target electro-optic crystal in the target electro-optic effect voltage sensor, are obtained. Furthermore, according to the standard physical property data and the target physical property data, as well as the standard optical property data and the target optical property data, the similarity between the target electro-optic crystal and the standard electro-optic crystal is calculated. Thus, the basic refractive index model is corrected according to the similarity to obtain the refractive index correction value of the target electro-optic crystal. Therefore, by the physical properties and optical properties of the target electro-optic crystal and the standard electro-optic crystal, the similarity between the target electro-optic crystal and the standard electro-optic crystal is measured, so as to more accurately obtain the refractive index correction value of the target electro-optic crystal. Furthermore, the output correction effect of the target electro-optic effect voltage sensor is improved through the refractive index correction value, which helps to promote the practical application of the electro-optic effect voltage sensor.

[0104] In a possible implementation manner, the calculation module 33 can be used to calculate the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard physical property data and the target physical property data; calculate the optical property similarity between the target electro-optic crystal and the standard electro-optic crystal according to the standard optical property data and the target optical property data; and calculate the similarity between the target electro-optic crystal and the standard electro-optic crystal according to the physical property similarity and the optical property similarity.

[0105] In a possible implementation manner, the standard physical property data includes a standard component vector and standard physical dimension data, and the target physical property data includes a target component vector and target physical dimension data. The calculation module 33 can be used to calculate the cosine similarity between the standard component vector and the target component vector, denoted as the first physical property similarity; calculate the Euclidean distance between the standard physical dimension data and the target physical dimension data, denoted as the second physical property similarity; and perform a weighted sum of the first physical property similarity and the second physical property similarity to obtain the physical property similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0106] In a possible implementation, the standard optical characteristic data includes a standard electro-optic coefficient and standard production process data, and the target optical characteristic data includes a target electro-optic coefficient and target production process data; the calculation module 33 can be used to calculate the Euclidean distance between the standard electro-optic coefficient and the target electro-optic coefficient, denoted as the basic optical characteristic similarity; perform convolution extraction on the standard production process data and the target production process data to obtain the local optical characteristic similarity of the target electro-optic crystal and the standard electro-optic crystal in each time window during the production process; correct the basic optical characteristic similarity according to each local optical characteristic similarity to obtain the optical characteristic similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0107] In a possible implementation, the calculation module 33 can be used to perform weighted summation on each local optical characteristic similarity, and denote the weighted summation result as the overall optical characteristic similarity between the target electro-optic crystal and the standard electro-optic crystal; compare the overall optical characteristic similarity and the basic optical characteristic similarity, and determine the smaller value of the overall optical characteristic similarity and the basic optical characteristic similarity as the optical characteristic similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0108] In a possible implementation, the calculation module 33 can be used to perform weighted summation on the physical characteristic similarity and the optical characteristic similarity to obtain the similarity between the target electro-optic crystal and the standard electro-optic crystal.

[0109] In a possible implementation, constructing a basic refractive index model can include: obtaining the refractive index of the standard electro-optic crystal in any electro-optic effect voltage sensor from the initial temperature to the target temperature during the heat transfer process as the training set; fitting the relationship between the refractive index and different temperatures based on the training set to obtain the basic refractive index model.

[0110] In a possible implementation, the correction module 34 can be used to obtain the temperature change rate of the target electro-optic crystal in the target electro-optic effect voltage sensor from the preset initial temperature to the preset target temperature during the heat transfer process; correct the basic refractive index model according to the similarity and the temperature change rate to obtain the refractive index correction value of the target electro-optic crystal.

[0111] In the above embodiments, the descriptions of the various embodiments have their own focuses. For parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0112] Those of ordinary skill in the art will realize that the templates, units, and algorithm steps of the examples described in combination with the embodiments disclosed herein can be implemented in electronic hardware, or in a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of the present invention.

[0113] If the module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above-described embodiment methods of the present invention, it can also be completed by a computer program instructing relevant hardware. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, it can implement the steps of the above-described refractive index correction method embodiments of each electro-optic effect voltage sensor. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory, random access memory, electrical carrier signal, telecommunication signal, and software distribution medium, etc.

[0114] The above-described embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A refractive index correction method for an electro-optical effect voltage sensor, characterized in that: include: Constructing a basic refractive index model, wherein the basic refractive index model characterizes the relationship between the refractive index of a standard electro-optical crystal in any electro-optical effect voltage sensor and the temperature during the heat transfer process; Acquire standard physical property data and standard optical property data corresponding to the standard electro-optical crystal, and target physical property data and target optical property data corresponding to the target electro-optical crystal in the target electro-optical effect voltage sensor; Calculating the similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data; The basic refractive index model is corrected according to the similarity to obtain a refractive index correction value of the target electro-optical crystal.

2. The refractive index calibration method of the electro-optical effect voltage sensor according to claim 1, characterized in that: Calculating the similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data, comprising: Calculating the physical property similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical property data and the target physical property data; Calculating the optical property similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard optical property data and the target optical property data; The similarity between the target electro-optical crystal and the standard electro-optical crystal is calculated according to the physical property similarity and the optical property similarity.

3. The refractive index correction method of the electro-optical effect voltage sensor according to claim 2, characterized in that: The standard physical property data includes a standard component vector and a standard physical size data, and the target physical property data includes a target component vector and a target physical size data; Calculating the physical property similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical property data and the target physical property data, comprising: Calculating the cosine similarity between the standard component vector and the target component vector, recorded as the first physical characteristic similarity; Calculating the Euclidean distance between the standard physical size data and the target physical size data, and recording it as the second physical characteristic similarity; The first physical property similarity and the second physical property similarity are weightedly summed to obtain the physical property similarity between the target electro-optical crystal and the standard electro-optical crystal.

4. The refractive index calibration method of the electro-optical effect voltage sensor according to claim 2, characterized in that: The standard optical characteristic data includes a standard electro-optic coefficient and a standard production process data, and the target optical characteristic data includes a target electro-optic coefficient and a target production process data; Calculating the optical property similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard optical property data and the target optical property data, comprising: Calculating the Euclidean distance between the standard electro-optic coefficient and the target electro-optic coefficient, and recording it as the basic optical characteristic similarity; Performing convolution extraction on the standard production process data and the target production process data to obtain the similarity of local optical properties of the target electro-optical crystal and the standard electro-optical crystal in each time window during the production process; The basic optical property similarity is corrected according to each of the local optical property similarities to obtain the optical property similarity between the target electro-optical crystal and the standard electro-optical crystal.

5. The refractive index calibration method of the electro-optical effect voltage sensor according to claim 4, characterized in that: The basic optical property similarity is corrected according to each of the local optical property similarities to obtain the optical property similarity between the target electro-optical crystal and the standard electro-optical crystal, including: Performing a weighted summation on each of the local optical characteristic similarities, and recording the weighted summation result as the overall optical characteristic similarity between the target electro-optical crystal and the standard electro-optical crystal; The overall optical property similarity and the basic optical property similarity are compared, and a smaller value between the overall optical property similarity and the basic optical property similarity is determined as the optical property similarity between the target electro-optical crystal and the standard electro-optical crystal.

6. The refractive index calibration method of the electro-optical effect voltage sensor according to claim 2, characterized in that: Calculating the similarity between the target electro-optical crystal and the standard electro-optical crystal according to the physical property similarity and the optical property similarity, comprising: The physical property similarity and the optical property similarity are weightedly summed to obtain the similarity between the target electro-optical crystal and the standard electro-optical crystal.

7. The refractive index calibration method of the electro-optical effect voltage sensor according to claim 1, characterized in that: Construct a basic refractive index model, including: Obtain the refractive index of a standard electro-optical crystal in any electro-optical effect voltage sensor from an initial temperature to a target temperature during a heat transfer process as a training set; The relationship between the refractive index and different temperatures is fitted based on the training set to obtain a basic refractive index model.

8. The refractive index calibration method of the electro-optical effect voltage sensor according to claim 1, characterized in that: Correcting the basic refractive index model according to the similarity to obtain a refractive index correction value of the target electro-optical crystal includes: Acquire the temperature change rate of the target electro-optical crystal in the target electro-optical effect voltage sensor from a preset initial temperature to a preset target temperature during the heat transfer process; The basic refractive index model is corrected according to the similarity and the temperature change rate to obtain a refractive index correction value of the target electro-optical crystal.

9. A refractive index correction device for an electro-optical effect voltage sensor, characterized in that: include: A construction module is used to construct a basic refractive index model, wherein the basic refractive index model characterizes the relationship between the refractive index of a standard electro-optical crystal in any electro-optical effect voltage sensor and the temperature during the heat transfer process; An acquisition module, used for acquiring standard physical property data and standard optical property data corresponding to the standard electro-optical crystal, and target physical property data and target optical property data corresponding to the target electro-optical crystal in the target electro-optical effect voltage sensor; A calculation module, used for calculating the similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical property data and the target physical property data, and the standard optical property data and the target optical property data; A correction module is used to correct the basic refractive index model according to the similarity to obtain a refractive index correction value of the target electro-optical crystal.

10. The refractive index correction device for the electro-optical effect voltage sensor according to claim 9, characterized in that: The computing module is specifically used for: Calculating the physical property similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard physical property data and the target physical property data; Calculating the optical property similarity between the target electro-optical crystal and the standard electro-optical crystal according to the standard optical property data and the target optical property data; The similarity between the target electro-optical crystal and the standard electro-optical crystal is calculated according to the physical property similarity and the optical property similarity.

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