System and method for measuring discharge ultraviolet band and optical basic parameters of insulator

Abstract

The invention discloses a system for measuring insulator discharge ultraviolet band light source characteristics and optical basic parameters. The system comprises an insulator discharge ultraviolet band light source characteristic measuring device and an insulator discharge ultraviolet band optical basic parameter measuring device, the insulator discharge ultraviolet band light source characteristic measuring device is used for measuring solar blind ultraviolet band light quantum characteristics generated in the insulator discharge process. The insulator discharge ultraviolet band optical basic parameter measuring device is used for measuring the energy distribution characteristic, the optical power characteristic and the directivity characteristic of ultraviolet light quantum generated in the discharge process of an insulator. According to the invention, the accuracy of testing the characteristics of the insulator discharge ultraviolet band light source is effectively improved, the testing process is simplified, and accurate optical parameters can be provided for state monitoring and fault diagnosis of the insulator.

Description

Technical Field

[0001] The present invention belongs to the technical field of power equipment condition monitoring, and particularly relates to a measurement system and method for the ultraviolet band and optical basic parameters of insulator discharge. Background Art

[0002] In the power transmission and transformation system, as a key electrical insulation component, the operating state of the insulator is directly related to the safe and stable operation of the power system. Insulator discharge is one of the main reasons for the performance degradation of the insulator, and the light source characteristics in the ultraviolet band are important indicators of insulator discharge. In the prior art, the measurement of the light source characteristics in the ultraviolet band of insulator discharge mostly uses traditional ultraviolet imagers for detection, which has problems such as low measurement accuracy, high cost, and large volume, and it is difficult to meet the on-site detection requirements. Summary of the Invention

[0003] Aiming at the deficiencies in the prior art, the purpose of the present invention is to provide a measurement system and method for the ultraviolet band and optical basic parameters of insulator discharge.

[0004] To achieve the above purpose, the present invention provides the following technical solutions:

[0005] A measurement system for the light source characteristics and optical basic parameters in the ultraviolet band of insulator discharge, comprising: an insulator abnormal discharge simulation device and a measurement device;

[0006] Among them, the insulator abnormal discharge simulation device is used to simulate various discharge situations that the insulator may encounter during actual operation;

[0007] The measurement device is used to capture and analyze the ultraviolet light quantum characteristics generated during the discharge process.

[0008] Preferably, the insulator abnormal discharge simulation device can: simulate foreign objects on the surface of insulator components, shedding of metal parts, and insulation damage defects.

[0009] Preferably, the measurement device includes: a measurement device for the light source characteristics in the ultraviolet band of insulator discharge, which is used to measure the solar-blind ultraviolet light quantum characteristics generated during the insulator discharge process.

[0010] Preferably, the measurement device further includes: a measurement device for the optical basic parameters in the ultraviolet band of insulator discharge, which is used to measure the ultraviolet light quantum energy distribution characteristics, light power characteristics, and directivity characteristics generated during the insulator discharge process.

[0011] Preferably, the measurement device for the light source characteristics in the ultraviolet band of insulator discharge includes: a broadband grating spectrometer.

[0012] Preferably, the measuring device for the optical basic parameters in the ultraviolet band of insulator discharge includes: an insulator discharge optical radiation power measuring device and an insulator discharge optical radiation direction measuring device.

[0013] Preferably, the insulator discharge optical radiation power measuring device includes: an optical integrating sphere, a photomultiplier tube, and a high-frequency current sensor.

[0014] Preferably, the insulator discharge optical radiation direction measuring device includes: an optical integrating sphere, a rotating base, and an avalanche diode.

[0015] The present invention also provides a method for measuring the characteristics of an insulator discharge ultraviolet band light source and its optical basic parameters, including the following steps:

[0016] S1. Build a simulation platform for abnormal insulator discharge to simulate various discharge situations that insulators may encounter during actual operation;

[0017] S2. Design an optical signal measurement system to capture the ultraviolet light quantum characteristics generated during the discharge process and obtain experimental data;

[0018] S3. By analyzing the experimental data, calibrate the light quantum energy distribution characteristics, light power characteristics, and directivity characteristics of the discharge light source.

[0019] Preferably, S2 further includes:

[0020] S21. Use an airtight optical integrating sphere to form a uniform light field, and accurately measure the discharge optical radiation power through a vacuum photomultiplier tube;

[0021] S22. Adopt the step-by-step voltage boosting method to synchronously measure the relationship between the discharge optical power and the discharge quantity and discharge energy, and determine the dynamic range of the discharge optical radiation power.

[0022] Compared with the prior art, the beneficial effects brought by the present invention are:

[0023] The present invention effectively improves the accuracy of testing the characteristics of the insulator discharge ultraviolet band light source, simplifies the testing process, and can provide accurate optical parameters for the condition monitoring and fault diagnosis of insulators. Description of the Drawings

[0024] Figure 1 is a system block diagram of a measuring device for the characteristics of an insulator discharge ultraviolet band light source provided by an embodiment of the present invention;

[0025] Figure 2 is a structural schematic diagram of an insulator discharge optical radiation power measuring device provided by another embodiment of the present invention;

[0026] Figure 3It is a schematic structural diagram of an insulator discharge optical radiation direction measuring device provided by another embodiment of the present invention;

[0027] Figure 4 It is a schematic flow diagram of the simulation analysis of the propagation characteristics of insulator discharge optical radiation provided by another embodiment of the present invention;

[0028] Figure 5 It is a system block diagram of a measuring system for the characteristics and optical basic parameters of an insulator discharge ultraviolet band light source provided by another embodiment of the present invention. Detailed implementation manners

[0029] Next, the specific embodiments of the present invention will be described in detail with reference to the appended Figures 1 to 5 Although specific embodiments of the present invention are shown in the drawings, it should be understood that the present invention can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present invention and to fully convey the scope of the present invention to those skilled in the art.

[0030] It should be noted that certain terms are used in the specification and claims to refer to specific components. Those skilled in the art should understand that technicians may use different terms to refer to the same component. The specification and claims do not use the difference in terms as a way to distinguish components, but use the difference in the functions of components as the criterion for distinction. As used throughout the specification and claims, the term "comprising" or "including" is an open-ended term and should be interpreted as "including but not limited to". The following description of the embodiments is for the purpose of implementing the preferred embodiments of the present invention, but the description is for the general purpose of the specification and is not intended to limit the scope of the present invention. The scope of protection of the present invention shall be defined by the appended claims.

[0031] For the convenience of understanding the embodiments of the present invention, the following will further explain with specific embodiments as examples in conjunction with the drawings, and each drawing does not constitute a limitation to the embodiments of the present invention.

[0032] In one embodiment, as Figure 1 shown, the present invention provides a measuring device for the characteristics of an insulator discharge ultraviolet band light source, including an insulator abnormal discharge simulation device and a broadband grating spectrometer.

[0033] The present invention simulates typical defects such as foreign objects on the outer insulation surface, shedding of metal fittings, and insulation damage by means of artificial application of contamination, disassembly of insulator connection metal fittings, and artificial manufacturing of insulator petticoat damage, and analyzes the optical quantum characteristics of the discharge based on a broadband grating spectrometer. For example:

[0034] In another embodiment, taking the simulation of foreign objects on the outer insulation surface as an example:

[0035] Step 1: Prepare a clean insulator and apply contamination (such as dust, salt, etc.) on its surface;

[0036] Step 2: Install the insulator coated with contamination in the abnormal discharge simulation device;

[0037] Step 3: Apply a high voltage to cause abnormal discharge of the insulator;

[0038] Step 4: Use a broadband grating spectrometer to record the ultraviolet spectrum generated during the discharge process;

[0039] Step 5: Analyze the spectral data to determine the main emission lines and spectral characteristics. For example, the change in spectral intensity at a specific wavelength can be observed.

[0040] In another embodiment, taking the simulation of gold part detachment as an example:

[0041] Step 1: Select an insulator with a gold part connection and disassemble one of the gold parts;

[0042] Step 2: Install the insulator with the missing gold part in the abnormal discharge simulation device;

[0043] Step 3: Apply a high voltage to cause abnormal discharge of the insulator;

[0044] Step 4: Use a broadband grating spectrometer to record the ultraviolet spectrum generated during the discharge process;

[0045] Step 5: Analyze the spectral data to determine the main emission lines and spectral characteristics. For example, the change in spectral intensity at a specific wavelength can be observed.

[0046] In another embodiment, taking the simulation of insulation damage as an example:

[0047] Step 1: Select a sound insulator and artificially create damage to the umbrella skirt (such as scratches, cracks, etc.);

[0048] Step 2: Install the damaged insulator in the abnormal discharge simulation device;

[0049] Step 3: Apply a high voltage to cause abnormal discharge of the insulator;

[0050] Step 4: Use a broadband grating spectrometer to record the ultraviolet spectrum generated during the discharge process;

[0051] Step 5: Analyze the spectral data to determine the main emission lines and spectral characteristics. For example, the change in spectral intensity at a specific wavelength can be observed.

[0052] In another embodiment, the present invention provides a device for measuring the optical basic parameters in the ultraviolet band of insulator discharge, comprising: a device for measuring the optical radiation power of insulator discharge and a device for measuring the optical radiation direction of insulator discharge.

[0053] In another embodiment, the present invention provides a device for measuring the optical radiation power of insulator discharge, comprising: an optical integrating sphere, a vacuum photomultiplier tube, and a high-frequency current sensor.

[0054] As Figure 2 shown, in this embodiment, the optical integrating sphere is an airtight optical integrating sphere, the inner surface of which is coated with a total reflection optical coating, and a typical defect discharge model of the insulator is built in. A high-voltage source is introduced into the electrode through an insulating sleeve to generate discharge, so that the discharge optical radiation forms a uniform light field in the optical integrating sphere, and an optical fiber is used to conduct the optical signal into the vacuum photomultiplier tube to measure the optical radiation power within a known light-receiving area.

[0055] Thus, the present invention can calculate the absolute optical power within the radiation spherical surface. For example, in another embodiment, the calculation method of the absolute optical power within the radiation spherical surface includes the following steps:

[0056] Step 1: Prepare an airtight optical integrating sphere, the inner surface of which is coated with a total reflection optical coating;

[0057] Step 2: Build a typical defect discharge model of the insulator in the optical integrating sphere;

[0058] Step 3: Introduce a high-voltage source into the electrode through an insulating sleeve to generate discharge;

[0059] Step 4: The discharge optical radiation forms a uniform light field in the optical integrating sphere;

[0060] Step 5: Use an optical fiber to conduct the optical signal into the vacuum photomultiplier tube;

[0061] Step 6: Measure the optical radiation power P within a known light-receiving area measured ;

[0062] Step 7: Calculate the absolute optical power P within the spherical surface according to the geometric parameters (such as radius R) of the optical integrating sphere total :

[0063] ,

[0064] where A is the effective light-receiving area of the photomultiplier tube.

[0065] In addition, by using a high-frequency current sensor to measure current pulses, the present invention can also obtain the relationship between the discharge optical power, discharge quantity, and discharge energy through a step-by-step voltage boosting method, thereby determining the dynamic range of the discharge optical radiation power. For example, in another embodiment, obtaining the relationship between the discharge optical power, discharge quantity, and discharge energy through a step-by-step voltage boosting method includes the following steps:

[0066] Step 1: Set the initial voltage V 0 , and gradually increase the voltage to V 1 , V 2 , ……, V n ;

[0067] Step 2: At each voltage level, record the discharge optical radiation power P i and the current pulse I i measured by the high-frequency current sensor;

[0068] Step 3: Calculate the discharge quantity Q i and the discharge energy E i at each voltage level;

[0069] ,

[0070] ,

[0071] where V i (t) and I i (t) are the expressions of the voltage and current varying with time at the i-th voltage level respectively;

[0072] Step 4: Plot the relationship diagram of the discharge optical radiation power P i versus the discharge quantity Q i and the discharge energy E i ;

[0073] Step 5: Determine the relationship between the discharge optical power, discharge quantity, and discharge energy by fitting the above relationship diagram.

[0074] Furthermore, in addition to obtaining the relationship between the discharge optical power, discharge quantity, and discharge energy through a step-by-step voltage boosting method, the present invention further determines the dynamic range of the discharge optical radiation power. For example, through the following steps:

[0075] First, find the maximum value P i and the minimum value P max of the discharge optical radiation power P min , where P max represents the maximum discharge optical power measured at the highest voltage level, and P min represents the minimum discharge optical power measured at the lowest voltage level;

[0076] Secondly, calculate the dynamic range D of the discharge optical radiation power:

[0077] .

[0078] Furthermore, in another embodiment, the present invention also verifies and adjusts the dynamic range through the following steps:

[0079] Verify whether the dynamic range is reasonable: If the dynamic range is too large or too small, it may be necessary to recheck the data acquisition and processing process to ensure that there are no omissions or errors;

[0080] Adjust the dynamic range by increasing or decreasing the number of voltage levels to ensure that all discharge phenomena of interest are covered.

[0081] In another embodiment, the present invention provides a device for measuring the direction of insulator discharge optical radiation, including: an optical integrating sphere, a rotating base, and an avalanche diode. As Figure 3 shown, in this embodiment, an airtight total reflection discharge light source simulation cavity is used, which is connected interchangeably through an insulating sleeve and an optical opening, and through a 45° rotating base, the optical signal measurement in the horizontal and pitch directions is completed to calibrate the directivity of the discharge optical radiation.

[0082] In another embodiment, the present invention provides a method for simulating and analyzing the propagation characteristics of insulator discharge optical radiation.

[0083] As Figure 4 shown, in this embodiment, the statistical probability of the light beam is defined based on the bidirectional scattering distribution function (BSDF), and the pulsed light beam is set according to the discharge light source attributes and optical parameters obtained by experimental measurement, and the spatio-temporal propagation characteristics of the pulsed light beam are simulated and analyzed using the ray tracing algorithm.

[0084] In another embodiment, the present invention provides a method for measuring the characteristics and basic optical parameters of an insulator discharge ultraviolet band light source, including the following steps:

[0085] S1. Build a simulation platform for abnormal insulator discharge to simulate various discharge situations that insulators may encounter during actual operation;

[0086] For example, build an adjustable insulator discharge simulation device in a certain high-voltage laboratory:

[0087] Use an 110kV porcelain suspension insulator string (7 pieces in series), and spray NaCl solutions with different salt density values (0.05 / 0.1 / 0.2mg / cm²) on the surface to simulate contaminated discharge;

[0088] Adjust the relative humidity to 85% and the temperature to 25°C in an artificial climate chamber to simulate a high-humidity operating environment;

[0089] Apply stepped voltage (gradually increasing from 10 kV to 80 kV) to the insulator through a 200 kV power frequency test transformer, and use a high-speed camera (frame rate 100,000 fps) to record the corona discharge, partial arc and flashover processes;

[0090] Artificially create a 0.5 mm wide crack at the edge of the insulator skirt, and inject conductive graphite paste to simulate internal defect discharge;

[0091] S2. Design an optical signal measurement system to capture the ultraviolet light quantum characteristics generated during the discharge process and obtain experimental data;

[0092] Furthermore, S2 also includes:

[0093] S21. Use an airtight optical integrating sphere to form a uniform light field, and accurately measure the discharge light radiation power through a vacuum photomultiplier tube;

[0094] For example, use an aluminum integrating sphere with a diameter of 1.5 m (the inner wall is coated with a diffuse reflection coating), open a quartz observation window (light transmission range 200 - 400 nm) at the top of the sphere, and place the insulator discharge point at the center of the sphere;

[0095] Install the vacuum photomultiplier tube at the side port of the integrating sphere and connect it to the spectrometer through an optical fiber bundle;

[0096] Measure the background noise (<5 photons / second) without discharge, and record the ultraviolet photon flux density during discharge;

[0097] At a discharge voltage of 50 kV, the optical power at the peak wavelength of 265 nm is measured to be 0.8 μW, and the system responsivity is calibrated through a standard tungsten lamp (traceable to NIST);

[0098] S22. Adopt the step-by-step voltage increase method to synchronously measure the relationship between the discharge optical power, discharge quantity and discharge energy, and determine the dynamic range of the discharge light radiation power;

[0099] For example, use a digital storage oscilloscope to synchronously collect:

[0100] The discharge current signal is measured through a coil (range 0 - 100 mA);

[0101] The optical power signal is output through the integrating sphere;

[0102] The discharge energy is calculated by voltage-current integration;

[0103] Exemplarily, the entire voltage increase process starts from 10 kV, with each step of 5 kV up to 80 kV, and each step is maintained for 30 seconds:

[0104] Intermittent corona discharge is detected at 30 kV, and the peak optical power is 0.12 μW;

[0105] A stable local arc appears at 60 kV, and the optical power jumps to 2.3 μW, corresponding to a discharge energy of 0.15 J;

[0106] Flashover occurs at 75 kV, and the optical power instantaneously reaches 15 μW (the dynamic range covers 0.1 μW to 15 μW);

[0107] From this, a fitting relationship between the optical power (P) and the discharge energy (Q) can be established, thereby further determining the dynamic range of the discharge optical radiation power.

[0108] S3. By analyzing the experimental data, calibrate the photon energy distribution characteristics, optical power characteristics, and directivity characteristics of the discharge light source;

[0109] For example, by obtaining the discharge ultraviolet spectrum (200 - 400 nm) through a spectrometer, it is found that:

[0110] The main peak of the contaminated discharge is located at 280 nm (corresponding to the radiation of the NO· excited state);

[0111] A high-intensity peak appears at 265 nm during the flashover process (secondary radiation generated by the air ionization N 2 );

[0112] Calculate the photon energy distribution: The proportion of 265-nm photons is 62% (single photon energy ≈ 4.68 eV);

[0113] In this way, the photon energy distribution characteristics of the discharge light source are calibrated;

[0114] For another example, by establishing an optical power - voltage curve through the boost data, it is found that:

[0115] The optical power threshold corresponding to the critical discharge starting voltage (25 kV) is 0.05 μW;

[0116] The voltage threshold corresponding to the saturated optical power (12 μW) is 72 kV;

[0117] In this way, the optical power characteristics are calibrated;

[0118] For another example, arrange a multi-angle detector array (0° to 180°, with an interval of 15°) outside the integrating sphere, and measure:

[0119] The corona discharge shows an isotropic distribution (radiation angle deviation < 5%);

[0120] The radiation intensity of the local arc increases by 40% in the direction of 30° to 60° (due to the orientation of the arc channel);

[0121] By using spherical harmonic function fitting (L = 3 order), the relationship between the directivity coefficient D and the polar angle θ can be further obtained; among them, through the relationship of the directivity coefficient, the detection device (such as a drone) can be guided to align with the discharge area at the best angle to improve the signal capture efficiency.

[0122] The above general description of the invention involved in the present invention and the description of its specific implementation manners should not be construed as a limitation on the technical solution of the invention. Those skilled in the art can, based on the content disclosed in the present invention, add, subtract, or combine the disclosed technical features in the above general description or / and specific implementation manners (including embodiments) without violating the constituent elements of the involved invention to form other technical solutions within the protection scope of the present invention.

Claims

1. A system for measuring the characteristics of the ultraviolet band light source and basic optical parameters of insulator discharge, characterized in that: include: Insulator abnormal discharge simulation device and measurement device; The insulator abnormal discharge simulation device is used to simulate various discharge conditions that the insulator may encounter during actual operation; The measuring device is used to capture and analyze the quantum characteristics of ultraviolet light generated during the discharge process.

2. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 1 is characterized in that: Preferably, the insulator abnormal discharge simulation device can simulate foreign matter on the surface of insulator components, metal parts falling off and insulation damage defects.

3. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 1 is characterized in that: The measuring device comprises: an insulator discharge ultraviolet band light source characteristic measuring device, which is used for measuring the light quantum characteristic of the solar-blind ultraviolet band generated in the insulator discharge process.

4. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 1 is characterized in that: The measuring device also includes: an insulator discharge ultraviolet band optical basic parameter measuring device, which is used to measure the ultraviolet light quantum energy distribution characteristics, optical power characteristics and directivity characteristics generated during the insulator discharge process.

5. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 3 is characterized in that: The insulator discharge ultraviolet band light source characteristic measuring device comprises: a broadband grating spectrometer.

6. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 4 is characterized in that: The device for measuring the basic optical parameters of insulator discharge in the ultraviolet band comprises: a device for measuring the light radiation power of insulator discharge and a device for measuring the light radiation direction of insulator discharge.

7. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 6 is characterized in that: The insulator discharge light radiation power measuring device comprises: an optical integrating sphere, a photomultiplier tube and a high-frequency current sensor.

8. The measuring system for the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 6 is characterized in that: The insulator discharge light radiation direction measuring device comprises: an optical integrating sphere, a rotating base and an avalanche diode.

9. A method for measuring the ultraviolet band light source characteristics and basic optical parameters of insulator discharge, characterized in that: The steps include: S1. Build an insulator abnormal discharge simulation platform to simulate various discharge conditions that insulators may encounter in actual operation; S2. Design an optical signal measurement system to capture the characteristics of ultraviolet light quanta generated during the discharge process and obtain experimental data; S3. Calibrate the photon energy distribution characteristics, optical power characteristics and directionality characteristics of the discharge light source by analyzing the experimental data.

10. The method for measuring the ultraviolet band light source characteristics and basic optical parameters of insulator discharge according to claim 9, characterized in that: S2 also includes: S21. Use an airtight optical integrating sphere to form a uniform light field and use a vacuum photomultiplier tube to accurately measure the discharge light radiation power; S22. Use the step-by-step voltage-boosting method to synchronously measure the relationship between the discharge light power, the discharge amount and the discharge energy to determine the dynamic range of the discharge light radiation power.

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