Steady-state characteristic testing device, method, equipment and medium

Abstract

The invention discloses a steady-state characteristic test device, method, equipment and medium, and the device comprises a test circuit, a measurement module, a power loss calculation module, a change trend determination module and a steady-state characteristic evaluation module, and builds a test environment which accords with a test device. Under the same operation condition, the power loss and the temperature rise value of an evaluation object of a test device under different test stages are obtained by only changing a single test parameter, and the change trends of the power loss and the temperature rise value under different test stages are analyzed. And the evaluation result of the steady-state operation characteristics of the evaluation object in two aspects of power loss and temperature rise can be quickly obtained. The test method simplifies the test steps, does not depend on a complex test instrument, improves the power loss test efficiency, and can accurately position design defects or application error areas in the first power module and the second power module in the test device and other devices of the test circuit.

Description

Technical Field

[0001] The present invention relates to the technical field of testing, and particularly to a steady-state characteristic testing device, method, equipment and medium. Background Art

[0002] In the field of power electronics, the performance evaluation and power loss testing of devices are important links in product development and optimization design. The relevant testing methods mainly rely on power analyzers and other precision testing equipment. Specifically, the total circuit loss is usually measured by a power analyzer, while the device power loss requires using a white-box testing method to capture the electrical parameters of the device and calculate them in combination with the corresponding loss model. Although this method can provide a certain degree of testing accuracy, the testing process is cumbersome, involving multiple steps of operation, which not only has low work efficiency, but also greatly increases the usage cost of testing equipment and labor cost.

[0003] In addition, there is little research on verifying the steady-state operation characteristics of devices. During the product development process, engineers usually directly evaluate whether the device meets the design requirements by testing the device characteristics under set working conditions. This method cannot quickly locate design defects or eliminate them, resulting in low testing efficiency, which may in turn affect the long-term reliability of the product. For example, a situation with too large a design margin will significantly increase the product cost, while insufficient design margin may cause reliability problems. Summary of the Invention

[0004] The main object of the present invention is to provide a steady-state characteristic testing device, method, equipment and medium, aiming to at least solve the technical problem of low testing efficiency existing in the related testing methods.

[0005] To achieve the above object, the technical solution of the present invention is as follows:

[0006] In the first aspect of the present invention, a steady-state characteristic testing device is provided, including a testing circuit, a measurement module, a power loss calculation module, a change trend determination module and a steady-state characteristic evaluation module connected in sequence;

[0007] The testing circuit is used for electrically connecting with a test device and establishing a testing environment; wherein, the testing environment is used for providing an operating condition for the test device;

[0008] The measurement module is used for obtaining measurement data of an evaluation object in the test device when changing a test parameter under the same operating condition in the testing environment; wherein, the measurement data includes the voltage, current and temperature corresponding to the evaluation object before and after changing the test parameter, and the test parameter includes one of body parameters, external parameters, brand types;

[0009] The power loss calculation module is configured to calculate the power loss of the evaluation object under different test parameters according to the test parameters, the operating frequency, and the measurement data;

[0010] The change trend determination module is configured to determine the change trends of the test parameters, the power loss, and the temperature rise value according to the measurement data, the power loss, and the temperature rise value;

[0011] The steady-state characteristic evaluation module is configured to obtain an evaluation result of the steady-state operating characteristics of the evaluation object according to the change trends of the test parameters, the power loss, and the temperature rise value.

[0012] In a second aspect of the present invention, a steady-state characteristic test method is provided, which is applied to the steady-state characteristic test device as in the first aspect. The steady-state characteristic test method includes:

[0013] Electrically connect a test circuit to a test device and establish a test environment; wherein, the test environment is used to provide an operating condition for the test device;

[0014] Obtain the measurement data of an evaluation object in the test device when changing a test parameter under the same operating condition in the test environment; wherein, the measurement data includes the voltage, current, and temperature respectively corresponding to the evaluation object before and after changing the test parameter, and the test parameter includes one of the body parameter, external parameter, and brand type;

[0015] Calculate the power loss of the evaluation object under different test parameters according to the test parameters, the operating frequency, and the measurement data;

[0016] Determine the change trends of the test parameters, the power loss, and the temperature rise value according to the measurement data, the power loss, and the temperature rise value;

[0017] Obtain an evaluation result of the steady-state operating characteristics of the evaluation object according to the change trends of the test parameters, the power loss, and the temperature rise value.

[0018] In a third aspect of the present invention, an electronic device is provided. The electronic device includes a memory, a processor, and a bus; the bus is used to realize the connection and communication between the memory and the processor; the processor is used to execute a computer program stored on the memory; when the processor executes the computer program, the steps in the steady-state characteristic test method as in the second aspect are realized.

[0019] In a fourth aspect of the present invention, a computer-readable storage medium is provided, on which a computer program is stored. It is characterized in that when the computer program is executed by a processor, the steps in the steady-state characteristic test method as in the second aspect are realized.

[0020] The steady-state characteristic testing device, method, equipment and medium of the present invention, through a testing circuit, a measurement module, a power loss calculation module, a change trend determination module and a steady-state characteristic evaluation module, establish a testing environment that conforms to the tested device. Under the same operating conditions, by only changing a single testing parameter, the power loss and temperature rise value of an evaluation object of the tested device in different testing stages are obtained, and based on the principle of single variable, the change trends of the power loss and temperature rise value in different testing stages are analyzed, and the evaluation results of the steady-state operating characteristics of the evaluation object in terms of power loss and temperature rise are quickly obtained. This testing method simplifies the testing steps, does not rely on complex testing instruments, improves the power loss testing efficiency, and can accurately locate design defects or application misunderstandings in the first power module, the second power module and the remaining devices of the testing circuit in the tested device. Description of the Drawings

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments recorded in the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0022] Figure 1 It is a schematic structural diagram of the steady-state characteristic testing device provided by the embodiment of the present application;

[0023] Figure 2 It is a schematic diagram of the steady-state characteristic testing device provided by the embodiment of the present application for collecting data, calculating and displaying;

[0024] Figure 3 It is a schematic diagram of the influence of the steady-state operating characteristics of the tested device in the embodiment of the present application on device parameters, operating condition parameters, power and temperature rise value;

[0025] Figure 4 It is a schematic diagram of the flow steps of the steady-state characteristic testing method provided by the embodiment of the present application;

[0026] Figure 5 It is a schematic diagram of the module connection inside the electronic device provided by the embodiment of the present application.

[0027] The realization, functional characteristics and advantages of the object of the present invention will be further described with reference to the embodiments and the drawings. Detailed Embodiments

[0028] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0029] It should be noted that related terms such as "first", "second", etc. can be used to describe various components, but these terms do not limit the components. These terms are only used to distinguish one component from another. For example, without departing from the scope of the present invention, the first component can be called the second component, and similarly, the second component can also be called the first component. The term "and / or" refers to any combination of one or more of the related items and the described items.

[0030] Please refer to Figure 1 , this embodiment provides a steady-state characteristic test device, and the steady-state characteristic test device includes a test circuit 10, a measurement module 20, a power loss calculation module 30, a change trend determination module 40, and a steady-state characteristic evaluation module 50 that are connected in sequence.

[0031] In the steady-state characteristic test device, the test circuit 10 is electrically connected to the input end of the measurement module 20, the output end of the measurement module 20 is electrically connected to the input end of the power loss calculation module 30, the output end of the power loss calculation module 30 is electrically connected to the input end of the change trend determination module 40, and the output end of the change trend determination module 40 is electrically connected to the input end of the steady-state characteristic evaluation module 50.

[0032] Through the electrical connection relationships of the above-mentioned modules, the modules of the steady-state characteristic test device can perform the following functions:

[0033] The test circuit 10 is used to be electrically connected to test devices (for example, the first power module 11, the second power module 12, the input capacitor C in , the output capacitor C0, the inductor L, etc.) and establish a test environment. Among them, the test environment is used to provide operating conditions for the test devices, and the condition setting parameters involved in the operating conditions generally refer to operating voltage, current, or operating frequency.

[0034] It should be noted that: the test environment has appropriately set the operating conditions (voltage, current, frequency) of the device. In the subsequent test work, the single variable of the test parameters involved in this application is only the test parameters of the device to be evaluated.

[0035] The measurement module 20 is used to obtain the measurement data of an evaluation object in the test device when the test environment changes a test parameter under the same operating conditions.

[0036] Specifically, mainly based on ensuring the principle of single variable, the measurement data of an evaluation object in the test device when the test environment changes a test parameter to be in different test stages; for example, before the test parameter changes, the test environment is in the previous test stage, and after the test parameter changes, the test environment is in the current test stage. Then the measurement data includes the voltage, current, and temperature corresponding to the evaluation object before and after changing the test parameter, and the test parameter includes one of the body parameters, external parameters, and brand types.

[0037] Specifically, when the changed test parameter is an object parameter, the object parameter can be any one of the resistance value, capacitance value, inductance value, power level, material property, geometric dimension of the evaluation object (which is one of the test devices); and when the changed test parameter is an external parameter, the external parameter can be any one of the environmental temperature, humidity, air flow condition, mechanical stress, external connection circuit parameter; when the changed test parameter is the brand type, different brand types produced by different manufacturers are mainly considered (i.e., the test parameter is brand A or brand B).

[0038] The measurement module 20 is also used to transmit the test data to the power loss calculation module 30.

[0039] The power loss calculation module 30 is used to calculate the power loss of the evaluation object at different test stages (or can be defined as different test parameters or before and after changing the test parameter) according to the test parameters, operating frequency and measurement data at different test stages (by changing a single test parameter to be in different test environments), and obtain the temperature rise value of the test device under the corresponding test parameters of the test device at different test stages, and transmit the power loss and temperature rise value at different test stages to the change trend determination module 40. The change trend determination module 40 is used to determine the test parameter change trend, power loss change trend and temperature rise change trend according to the measurement data, power loss and temperature rise value at different test stages. The steady-state characteristic evaluation module 50 is used to finally obtain the evaluation result of the steady-state operation characteristic of the evaluation object according to the test parameter change trend, power loss change trend and temperature rise change trend.

[0040] Specifically, when obtaining the power loss and temperature rise value at different test stages, the energy efficiency and electrical performance of the evaluation object under different test parameters are reflected based on the power loss, and the thermal performance and heat dissipation capacity of the evaluation object under different test parameters are reflected by the temperature rise value. Thus, the test parameter can be used as the abscissa, and the power loss or temperature rise value can be used as the ordinate to construct a trend change schematic diagram. In this trend change schematic diagram, the change trends of the corresponding power loss and temperature rise value with the change of the test parameter can be intuitively obtained, that is, finally determine the test parameter change trend, power loss change trend and temperature rise change trend.

[0041] It should be noted that the power loss change trend is used to reflect the energy efficiency level of the evaluation object and the dynamic change of energy loss under different working conditions. The temperature rise change trend is used to reflect the heat dissipation stability and rationality of the evaluation object under different test parameters. The test parameter change trend is used to reflect the dynamic response ability, operating state characteristic and parameter correlation law of the evaluation object under different input conditions. Through these three change trends, the first power module 11, the second power module 12, and the input capacitor C in the test device can be comprehensively understoodin When one of the output capacitor C0, inductor L, etc. (peripheral devices of the power module arranged around the power module) is used as the evaluation object, its performance in terms of electrical performance, thermal performance, and operation adaptability.

[0042] In addition, the change trend is not just simply "increasing" or "decreasing". It refers to the change rule and direction of a certain variable (such as power loss, temperature rise value, etc.) when changing with another variable (such as any one of the body parameters, external parameters, brand types). The trend can be monotonic or non-linear, and the specific performance needs to be analyzed in combination with the test data.

[0043] Specifically, the change trends of test parameters, power loss, and temperature rise value can be comprehensively analyzed through the schematic diagram of the trend change covering power loss and temperature rise value. For example, in a test scenario: when the test parameter can be the resistance value of the evaluation object (one of the test devices), the resistance changes from 5 ohms to 10 ohms (that is, the change trend of the test parameter increases). As the resistance value increases, the power loss gradually rises from 18 W to 24 W (that is, the change trend of the power loss increases). At the same time, the temperature rise value rises from 18 degrees to 25 degrees (that is, the change trend of the temperature rise value increases), indicating that the operating efficiency of the test device decreases and the thermal stability weakens when the resistance value increases. It is recommended to narrow the range of the resistance value and optimize the heat dissipation of the first power module, the second power module, and the peripheral devices of the power module in the test device, that is, output the evaluation result of the test parameter (the currently selected resistance value) that should be narrowed during the operation of the test device. Among them, the evaluation result includes the influence result of the change of the test parameter on the steady-state operation characteristics of the evaluation object and reasonable suggestions for device design or device selection.

[0044] The steady-state characteristic test device of the present invention, through the test circuit 10, measurement module 20, power loss calculation module 30, change trend determination module 40, and steady-state characteristic evaluation module 50, establishes a test environment that conforms to the test device. Under the same operating conditions, by only changing a single test parameter, the power loss and temperature rise value of an evaluation object of the test device in different test stages are obtained, and based on the principle of single variable, the change trends of the power loss and temperature rise value in different test stages are analyzed, and the evaluation results of the steady-state operation characteristics of the evaluation object in terms of power loss and temperature rise are quickly obtained. This test device simplifies the test steps, does not rely on complex test instruments, improves the test efficiency of power loss, and can accurately locate the design defects or application misunderstandings when one of the first power module 11, second power module 12, input capacitor C in When one of the output capacitor C0, inductor L is used as the evaluation object, its design defects or application misunderstandings can be accurately located.

[0045] It should be noted that the first power module and the second power module mentioned in the embodiments of the present application can be modules such as half-bridges and full-bridges, and these modules are usually the constituent units of a full-bridge power conversion circuit, a bidirectional power converter, a Dual Active Bridge (DAB) circuit, etc.

[0046] In an alternative embodiment of this embodiment, the steady-state characteristic test device further includes a host computer 60. The host computer 60 obtains the evaluation results of the steady-state operation characteristics of the evaluation object transmitted by the steady-state characteristic evaluation module 50, the change trends of the test parameters, the power loss change trend, and the temperature rise change trend transmitted by the change trend determination module 40, the operating condition parameters, the operating frequency, and the measurement data transmitted by the power loss calculation module 30 to calculate the power loss of the test device, and synchronously displays the above received data, so as to facilitate the tester to monitor the test results in real time and analyze the data change trends.

[0047] In an alternative embodiment of this embodiment, the test circuit 10 includes a DC power supply Uin, and the test device includes a first power module 11, a second power module 12, an input capacitor C in , an output capacitor C o , an inductor L, and the evaluation object is one of the devices in the test device.

[0048] Specifically, the positive pole of the DC power supply Uin is simultaneously electrically connected to the first end of the input capacitor C in , the first input end of the first power module 11. The negative pole of the DC power supply Uin, the second input end of the first power module 11, and the second end of the input capacitor C in are all grounded. The first output end 112 of the first power module 11 is electrically connected to the first input end 121 of the second power module 12 through the inductor L. The second output end 111 of the first power module 11 is electrically connected to the second input end 122 of the second power module 12 through a cable. The first output end of the second power module 12 is electrically connected to the first end of the output capacitor C o , and the second output end of the second power module 12 is electrically connected to the second end of the output capacitor C o .

[0049] It should be noted that when connecting the test device (the first power module 11 and the second power module 12) to the test circuit 10, the first output end 112 of the first power module 11 is connected to the first input end 121 of the second power module 12 through the inductor L, and the second output port 111 of the first power module 11 is connected to the second input end 122 of the second power module 12 through a cable, so that the first power module 11 and the input capacitor C in in the test current constitute a power unit 1, and the second power module 12 and the output capacitor C oThe power unit 2 is constructed, finally enabling the test device to be successfully connected to the test circuit 10 and completing the construction of the test environment.

[0050] Thus, through the connection form of the inductor L, it is ensured that the current waveforms between the first power module 11 and the second power module 12 can be appropriately smoothed, thereby reducing the influence of electromagnetic interference. At the same time, the second output terminal of the first power module 11 is connected to the second input terminal of the second power module through a cable. By means of direct connection, while ensuring the stability of the electrical connection, the circuit impedance is minimized as much as possible to ensure the high efficiency of power transfer.

[0051] Among them, during the test process of the established test environment, there is no load connection (no actual load device is externally connected). By controlling the power switches in the first power module 11 and the second power module 2 to conduct or disconnect according to the preset driving actions, the voltages at both ends of the first power module 11 and the second power module 2 are dynamically balanced, and the two power units exchange power through the intermediate inductor L to achieve the reactive power exchange inside the system; the DC power supply Uin does not need to provide a large amount of active power to the test circuit, but only needs to provide the active power required for the loss of the devices and power modules during the operation of the test circuit. At the same time, the working condition requirements of the device for different voltages, different currents, and different operating frequencies can be realized. That is, in the test circuit of the test environment, the voltage (current) waveforms flowing through the first power module 11 and the second power module 12 only have a phase difference, and the effective values of the voltage (current) are the same, and the power losses of the devices inside the two power modules are the same.

[0052] It should be noted that since the electrical connection between the test circuit 10 and the test device can achieve the dynamic balance based on the internal reactive power, the active power required by the test circuit 10 is mainly used to compensate for the losses generated during operation. This design enables the DC power supply Uin not to provide a large amount of active power, but only needs to meet the active power required for the losses of the power modules (the first power module 11 and the second power module 12) during operation and the losses of the devices inside the test circuit 10 (input capacitor C in 、output capacitor C0, inductor L), significantly reducing the power load of the power supply. In addition, this implementation can adapt to the requirements of different operating conditions, including test conditions of different voltages, different currents, and different operating frequencies. During the operation of the test device, there is a phase difference between the voltage (or current) waveforms between the first power module 11 and the second power module 12, but their effective values remain the same. This characteristic ensures that the power losses of the devices inside the two power modules are equal, further verifying the stability and balance of the test working conditions. To sum up, this implementation not only realizes the efficient exchange of internal reactive power, but also reduces the large-power dependence on the external power supply, while meeting the requirements of various operating conditions and ensuring the test stability of the comprehensive performance test of the power module.

[0053] In an alternative embodiment of the present embodiment, the steady-state characteristic test device further includes a test parameter setting module. The test parameter setting module is used to set the test environment according to an input test parameter to change the test environment (from the previous test stage to the current test stage). In different test stages, the measurement module is used to obtain at least two sets of measurement data corresponding to an evaluation object of the test device when it is in the previous test stage and the current test stage respectively.

[0054] When the test environment is in the previous test stage, the temperature detection module, voltage detection module and current detection module in the measurement module respectively obtain the inductor temperature, the temperature of the input capacitor, the temperature of the output capacitor, the temperature of the power module, the test input voltage, the internal voltage of the second power module, the test input current, the internal current of the first power module, and the internal current of the second power module when the test environment is in the previous test stage. Then, by changing a single test parameter to make the test environment enter the current test stage, the temperature detection module, voltage detection module and current detection module in the measurement module respectively obtain the inductor temperature, the temperature of the input capacitor, the temperature of the output capacitor, the temperature of the power module, the test input voltage, the internal voltage of the second power module, the test input current, the internal current of the first power module, and the internal current of the second power module when the test environment is in the current test stage. Thus, the acquisition of measurement data of different test parameters in two different test stages is completed, so that the subsequent power loss calculation module can calculate the power losses corresponding to the two test parameters based on the two sets of test data corresponding to different test stages.

[0055] Please refer to Figure 2 , the power loss calculation module is used to calculate the total power loss P of the device loss , the power loss P of the input capacitor Cin , the power loss P of the output capacitor Cout , the power loss P of the inductor L , the winding loss P of the inductor L_coil and the core loss P of the inductor L_core , and calculate the power loss P of the first power module or the second power module in the test device according to the obtained loss values PM (the loss of the first power module is equal to the loss of the second power module).

[0056] Specifically, when the power loss calculation module 30 performs the calculation, the specific formula involved is as follows:

[0057] Adopt the first calculation formula P loss =U in *I 1_RMS , calculate the total power loss P of the device loss , where, U in is the DC power supply voltage, I1_RMS is the direct current power supply current.

[0058] Adopt the second calculation formula P Cin =(I 1_RMS -I 2_RMS ) 2 *ESR_Cin(f s ,T c ) to calculate the input capacitor power loss P Cin , I 2_RMS is the effective value of the current flowing into power module 1, and ESR_Cin(f s ,T c ) is the equivalent series resistance of the input capacitor, which is related to the operating frequency fs and the capacitor operating temperature T c .

[0059] Adopt the third calculation formula as P Cout =I 4_RMS 2 *ESR_Cout(f s ,T c ) to calculate the output capacitor power loss P Cout , where, I 4_RMS is the effective value of the current flowing into the output capacitor; ESR_Cout(f s ,T c ) is the equivalent series resistance of the capacitor.

[0060] Adopt the fourth calculation formula including P L_coil =I 3_RMS 2 ·ESR_L(T L_coil ) to calculate the inductor winding loss P L_coil , I 3_RMS is the effective value of the inductor current, and ESR_L(T L_coil ) is the equivalent series resistance of the inductor winding, which is related to the inductor winding temperature T L_coil .

[0061] Adopt the fifth calculation formula as P L_core =P cv (fs,ΔI3,T L_core )·V L to calculate the inductor core loss P L_core , where, P cv (fs,ΔI3,T L_core ) is the core loss per unit volume, which is related to the operating frequency f s , the peak-to-peak value of the inductor current ΔI3 and the inductor core temperature T L_core , and V L is the inductor volume.

[0062] Use the sixth calculation formula P L = P L_coil + P L_core to calculate the total inductance loss P L and use the seventh calculation formula P PM = (P loss - P cin - P cout - P L ) / 2 to calculate the power loss P PM of the power module.

[0063] Based on the above calculation process, using the collected data corresponding to different test stages as the data basis for calculation, the power loss calculation module 30 of the steady-state characteristic test device can calculate the power losses of the power modules corresponding to different test parameters, that is, finally, the first power loss corresponding to the test device in the previous test stage and the second power loss corresponding to the test device in the current test stage can be obtained.

[0064] Furthermore, the power loss calculation module 30 is also integrated with the function of calculating the temperature rise. When the power loss is obtained, use the eighth calculation formula ΔT = R th * P PM to calculate the temperature rise. ΔT represents the temperature rise (the temperature rise of the hot spot compared to the ambient temperature), R th represents the equivalent thermal resistance from the hot spot to the environment, and P PM represents the power loss of the first power module or the second power module.

[0065] Specifically, the steady-state characteristics of the device and the power module are mainly affected by device parameters (body parameters, external parameters) and operating conditions. The power loss of the device and the power module is the main characterization parameter of its steady-state characteristics. The consumption of energy means that heat is generated in the device body, which is specifically manifested as the increase in the temperature of the device itself. According to the eighth calculation formula, the greater the power loss of the device, the higher the temperature rise compared to the ambient temperature.

[0066] Therefore, the power loss calculation module 30 can finally obtain the first power loss and the first temperature rise corresponding to the test device before changing the test parameters, and the second power loss and the second temperature rise corresponding to the test device after changing a single test parameter. In addition, the temperature rise can also be directly obtained through the temperature detection module.

[0067] In an alternative implementation of this embodiment, the steady-state characteristic evaluation module 50 is configured to output an evaluation result that the evaluation object reduces the test parameter during design or selects a brand type with low power loss and low temperature rise during the selection of the evaluation object when the change trend of the test parameter increases and the change trends of the power loss and the temperature rise value increase synchronously. Or, when the change trend of the test parameter increases and the change trends of the power loss and the temperature rise value decrease synchronously, output an evaluation result that the evaluation object increases the test parameter during design or selects a brand type with low power loss and low temperature rise during the selection of the evaluation object; or, when the change trend of the test parameter increases or decreases and the change trends of the power loss and the temperature rise value tend to be stable, output an evaluation result that the evaluation object selects the lowest price or the current test parameter has little impact on the steady-state characteristics of the evaluated device during the selection. Through the above at least three evaluation methods, it is possible to dynamically analyze the steady-state operation characteristics of the evaluation object in the test device based on the two parameters of the temperature rise value and the power loss, combined with whether the corresponding change trends increase or decrease synchronously, so as to output the corresponding evaluation result to prompt the design optimization direction of the test device being tested by the tester.

[0068] Please refer to Figure 3 , which shows the logical relationship of the steady-state characteristic evaluation of the device and the power module, emphasizing the influence of different parameters and operating conditions on its steady-state characteristics and the main manifestation forms. Specifically, the parameter differences (such as materials, design specifications, or brand models, etc.) and operating conditions (such as voltage, load, frequency, etc.) of the device and the power module act as influencing factors, jointly acting on its steady-state characteristics, and are reflected through two key indicators of power loss (heat) and device temperature rise. The power loss is directly converted into heat, which in turn affects the temperature rise of the device, forming specific thermal and electrical characteristic manifestations. This evaluation process helps to deeply understand the stability and performance of the device and the power module under different conditions, providing a scientific basis for subsequent optimized design, operating parameter adjustment, and reliability analysis.

[0069] Please refer to Figure 4 , which shows a steady-state characteristic test method provided by an embodiment of the present invention. The steady-state characteristic test method includes:

[0070] Step S401, electrically connect the test circuit to the test device and establish a test environment; wherein, the test environment is used to provide an operating condition for the test device;

[0071] Step S402, obtain the measurement data of an evaluation object in the test device when changing a test parameter under the same operating condition of the test environment; wherein, the measurement data includes the voltage, current, and temperature corresponding to the evaluation object before and after changing the test parameter, and the test parameter includes one of the body parameter, external parameter, and brand type;

[0072] Step S403: Calculate the power loss of the evaluation object under different test parameters according to the test parameters, operating frequency, and measurement data.

[0073] Step S404: Determine the changing trends of the test parameters, power loss, and temperature rise value according to the measurement data, power loss, and temperature rise value.

[0074] Step S405: Obtain the evaluation result of the steady-state operation characteristics of the evaluation object according to the changing trends of the test parameters, power loss, and temperature rise value.

[0075] The steady-state characteristic test method of the present invention establishes a test environment that conforms to the test device. Under the same operating conditions, by only changing a single test parameter, the power loss and temperature rise value of an evaluation object of the test device in different test stages are obtained. Based on the principle of single variable, the changing trends of the power loss and temperature rise value in different test stages are analyzed, and the evaluation result of the steady-state operation characteristics of the evaluation object in terms of power loss and temperature rise is quickly obtained. This test device simplifies the test steps, does not rely on complex test instruments, improves the test efficiency of power loss, and can accurately locate the design defects or application misunderstandings when one of the first power module 11, the second power module 12, the input capacitor C in , the output capacitor C0, and the inductor L of the test device is used as the evaluation object.

[0076] Please refer to Figure 5 , which shows the electronic device provided by the embodiment of the present invention. This electronic device can be used to implement the steady-state characteristic test method in any of the foregoing embodiments. The electronic device includes:

[0077] A memory 501, a processor 502, a bus 503, and a computer program stored on the memory 501 and executable on the processor 502. The memory 501 and the processor 502 are connected through the bus 503. When the processor 502 executes the computer program, the steady-state characteristic test method in the foregoing embodiment is implemented. Among them, the number of processors can be one or more.

[0078] The memory 501 can be a high-speed random access memory (RAM, Random Access Memory) or a non-unstable memory, such as a disk memory. The memory 501 is used to store executable program codes, and the processor 502 is coupled to the memory 501.

[0079] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of devices or modules can be in electrical, mechanical or other forms.

[0080] The modules described as separate components may or may not be physically separated. The components shown as modules may or may not be physical modules, that is, they can be located in one place or distributed to multiple network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0081] In addition, in each embodiment of the present application, the functional modules can be integrated into one processing module, or each module can exist physically alone, or two or more modules can be integrated into one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software functional modules.

[0082] If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a readable storage medium and includes several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods in each embodiment of the present application. The aforementioned readable storage medium includes: various media such as USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical discs that can store program codes.

[0083] It should be noted that for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily all essential to the present application.

[0084] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0085] The above are only the preferred embodiments of the present invention, and do not limit the patent scope of the present invention accordingly. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, shall be equally included in the patent protection scope of the present invention.

Claims

1. A steady-state characteristic testing device, characterized in that: The steady-state characteristic test device comprises a test circuit, a measurement module, a power loss calculation module, a change trend determination module and a steady-state characteristic evaluation module connected in sequence; The test circuit is used to be electrically connected to the test device and establish a test environment; wherein the test environment is used to provide operating conditions for the test device; The measurement module is used to obtain measurement data of an evaluation object in the test device when the test environment changes a test parameter under the same operating conditions; wherein the measurement data includes voltage, current and temperature corresponding to the evaluation object before and after the test parameter is changed, and the test parameter includes one of a body parameter, an external parameter and a brand type; The power loss calculation module is used to calculate the power loss of the evaluation object under different test parameters according to the test parameters, the operating frequency and the measurement data; The change trend determination module is used to determine the test parameter change trend, the power loss change trend and the temperature rise value change trend according to the measurement data, the power loss and the temperature rise value; The steady-state characteristic evaluation module is used to obtain an evaluation result of the steady-state operation characteristic of the evaluation object according to the test parameter change trend, the power loss change trend and the temperature rise value change trend.

2. The steady-state characteristic testing device according to claim 1, characterized in that: The test circuit includes a DC power supply, and the test device includes a first power module, a second power module, an input capacitor, an inductor, and an output capacitor; The positive electrode of the DC power supply is electrically connected to the first end of the input capacitor and the first input end of the first power module at the same time, the negative electrode of the DC power supply, the second input end of the first power module and the second end of the input capacitor are all grounded, the first output end of the first power module is electrically connected to the first input end of the second power module via the inductor, the second output end of the first power module is electrically connected to the second input end of the second power module via a cable, the first output end of the second power module is electrically connected to the first end of the output capacitor, and the second output end of the second power module is electrically connected to the second end of the output capacitor.

3. The steady-state characteristic testing device according to claim 2, characterized in that: The steady-state characteristic testing device also includes a test parameter setting module; The test parameter setting module is used to set the test environment according to an input test parameter, so that the test environment changes from the previous test stage to the current test stage; The measurement module is used to obtain at least two groups of measurement data corresponding to an evaluation object of the test device when it is in a previous test phase and a current test phase respectively.

4. The steady-state characteristic testing device according to claim 3, characterized in that: The measurement module includes a temperature detection module, a voltage detection module and a current detection module; The temperature detection module is used to obtain the inductor temperature, the input capacitor temperature, the output capacitor temperature, and the power module temperature in the previous test phase and change a test parameter to obtain the inductor temperature, the input capacitor temperature, the output capacitor temperature, and the power module temperature in the current test phase; The voltage detection module is used to obtain the test input voltage and the internal voltage of the second power module in the previous test phase and change a test parameter to test the input voltage and the internal voltage of the second power module in the current test phase; The current detection module is used to obtain the test input current, the internal current of the first power module, and the internal current of the second power module in the previous test stage and change a test parameter to obtain the test input current, the internal current of the first power module, and the internal current of the second power module in the current test stage.

5. The steady-state characteristic testing device according to claim 3, characterized in that: The power loss calculation module is used to calculate the total power loss of the device, the input capacitor power loss, the output capacitor power loss, the inductor power loss, the inductor winding loss and the inductor core loss, and calculate the power loss of the first power module or the second power module in the test device according to the total power loss of the device, the input capacitor power loss, the output capacitor power loss, the inductor power loss, the inductor winding loss and the inductor core loss; The power loss calculation module includes the following calculation formula when performing calculation: The first calculation formula P loss =U in *I 1_RMS , calculate the total power loss P of the device loss , where U in is the DC power supply voltage, I 1_RMS is the DC power supply current; The second calculation formula P Cin =(I 1_RMS -I 2_RMS ) 2 *ESR - Cin(f s ,T c ), calculate the input capacitor power loss P C in,I 2_RMS is the effective value of the current flowing into power module 1, ESR - Cin(f s ,T c ) is the equivalent series resistance of the input capacitor, which is related to the operating frequency fs and the capacitor operating temperature T c Related; The third calculation formula is P C out=I 4-RMS 2 *ESR-Cout(fs,Tc) calculates the output capacitor power loss P C out, where I 4-RMS is the effective value of the current flowing into the output capacitor; ESR-Cout (fs, Tc) is the equivalent series resistance of the capacitor; The fourth calculation formula includes P L_coil =I 3_RMS 2 ·ESR_L(T L_coil ) Calculate the inductor winding loss P L_coil , I 3_RMS is the effective value of the inductor current, ESR_L(T L_coil ) is the equivalent series resistance of the inductor winding, which is related to the inductor winding temperature T L_coil Related; The fifth calculation formula is P L_core =P cv (fs,ΔI3,T L_core )·V L Calculate the inductor core loss P L_core , where P cv (fs,ΔI3,T L_core ) is the magnetic loss per unit volume of the core, which is related to the operating frequency f s , the peak-to-peak value of the inductor current ΔI3 and the inductor core temperature T L_core Related, V L is the volume of the inductor; The sixth calculation formula P L =P L_coil +P L_core Calculate the total inductor loss P L ; Seventh calculation formula P PM =(P loss -P cin -P cout -P L ) / 2Calculate the power module power loss P PM .

6. The steady-state characteristic testing device according to claim 3, characterized in that: The steady-state characteristic evaluation module is used to output the evaluation result that the evaluation object reduces the test parameters during design or selects a brand type with small power loss and temperature rise during model selection when the test parameter change trend increases and the power loss change trend and the temperature rise value change trend increase synchronously; Alternatively, when the test parameter change trend increases and the power loss change trend and the temperature rise change trend decrease synchronously, output the evaluation result of increasing the tested parameter during design of the evaluation object or selecting a brand type with small power loss and temperature rise during model selection of the evaluation object; Alternatively, when the test parameter change trend increases or decreases, and the power loss change trend and the temperature rise change trend are stable, the evaluation result is outputted that the evaluation object selects the lowest price when selecting or the current test parameter has the least impact on the steady-state characteristics of the evaluated device.

7. The steady-state characteristic testing device according to claim 1, characterized in that: The steady-state characteristic testing device also includes a host computer; The host computer is used to display the voltage, the current, the temperature rise value, the power loss of the test device, the test parameter change trend, the power loss change trend and the temperature rise value change trend.

8. A steady-state characteristic testing method, characterized in that: Applied to the steady-state characteristic testing device according to any one of claims 1 to 7, the steady-state characteristic testing method comprises: Electrically connect the test circuit to the test device and establish a test environment; wherein the test environment is used to provide operating conditions for the test device; Obtaining measurement data of an evaluation object in the test device when the test environment changes a test parameter under the same operating conditions; wherein the measurement data includes voltage, current and temperature respectively corresponding to the evaluation object before and after the test parameter is changed, and the test parameter includes one of a body parameter, an external parameter and a brand type; Calculate the power loss of the evaluation object under different test parameters according to the test parameters, the operating frequency and the measurement data; Determine the test parameter change trend, the power loss change trend and the temperature rise value change trend according to the measurement data, the power loss and the temperature rise value; According to the test parameter change trend, power loss change trend and temperature rise value change trend, an evaluation result of the steady-state operation characteristic of the evaluation object is obtained.

9. An electronic device, characterized in that: Includes memory, processor and bus; The bus is used to realize the connection and communication between the memory and the processor; The processor is used to execute the computer program stored in the memory; When the processor executes the computer program, the steps of the steady-state characteristics testing method according to claim 8 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps in the steady-state characteristics testing method of claim 8 are implemented.

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