Test method and device based on standardized interface, medium and equipment

Abstract

The invention discloses a test method and device based on a standardized interface, a medium and equipment. According to the application, the current loop topology and the voltage loop parameter of the device to be detected are firstly analyzed through the preset configuration information of the test interface connector; and based on the analysis result, generating a limiting adjustment instruction and triggering a limiting short-circuit handle to operate, realizing isolation of the to-be-detected device and an external current signal, and generating a current isolation signal. Meanwhile, the electrical connection between the device to be detected and the external voltage transformer is cut off by using the voltage decoupling control module, so that the isolation of voltage signals is realized and voltage isolation signals are generated. And finally, according to the current and voltage isolation signals, a verification signal is injected into the test interface channel, and the test validity is judged by analyzing the deviation between the verification signal and the sampling data of the to-be-detected device. The process not only improves the test efficiency, but also significantly reduces the risk of misoperation, and ensures the safety and reliability of the secondary equipment test of the power system.

Description

Technical Field

[0001] The present invention relates to the field of testing based on standardized interfaces, and particularly to a testing method, device, medium and equipment based on standardized interfaces. Background Art

[0002] In the power system, the commissioning and maintenance of secondary equipment (such as relay protection devices, measurement and control devices, etc.) are key links to ensure the safe and stable operation of the power system. Traditional testing methods usually require frequent replacement of testing instruments and manual disconnection and connection of the connecting wires of current and voltage circuits. Such operations are not only time-consuming and laborious, but also have a high risk of incorrect operations. Especially when maintaining operating equipment, it may cause serious problems such as open circuit of current transformers (CTs) and short circuit of voltage transformers (PTs), thus affecting the normal operation of the power system.

[0003] In existing technical solutions, although some attempts have been made to reduce the workload of wire disconnection and connection by improving testing instruments or adopting wireless transmission technology, most of these solutions have not fundamentally solved the problem of rapid and safe decoupling between the device to be detected and the operating system. For example, Patent CN116466169A proposes a testing scheme for synchronous maintenance of multiple devices. Although it realizes synchronous testing of multiple devices and rapid plugging and unplugging of testing interfaces, it does not elaborate on how to rapidly and safely decouple CTs and PTs in the actual field environment, and additional workload and time costs will still be increased when deploying multiple distributed testers and wireless networking.

[0004] In addition, the existing research on rapid testing of secondary switchboards mostly focuses on the improvement of testing instruments and tools, while ignoring the signal interface design between the testing interface and the device to be detected and the decoupling mechanism between the device to be detected and the operating system. This results in that in actual operation, testers still need to rely on the traditional hard wiring method of disconnecting and connecting circuits, which is not only inefficient but also has a high risk of incorrect operations. These problems lead to the inability of existing technologies to rapidly and accurately test secondary equipment. Summary of the Invention

[0005] The present invention provides a testing method, device, medium and equipment based on standardized interfaces to solve the problem that existing technologies cannot rapidly and accurately test secondary equipment.

[0006] In a first aspect, the present application provides a testing method based on standardized interfaces, including:

[0007] Analyze the current loop topology and voltage loop parameters of the device to be detected according to the configuration information of the preset testing interface connector;

[0008] Generate a limit adjustment instruction according to the parsed current loop topology, and trigger a preset limit short - circuit handle according to the instruction, so as to isolate the device under test from the external current signal and generate a current isolation signal;

[0009] Cut off the electrical connection between the device under test and the external voltage transformer according to the parsed voltage loop parameters and a preset voltage decoupling control module, so as to isolate the device under test from the external voltage signal and generate a voltage isolation signal;

[0010] Inject a calibration signal into the test interface channel according to the voltage isolation signal and the current isolation signal, and obtain a validity determination result of the test according to the deviation analysis between the calibration signal and the sampling data of the device under test.

[0011] This application can accurately identify the connection status of the current and voltage loops by parsing the current loop topology and voltage loop parameters of the device under test, providing an accurate basis for subsequent isolation operations. Secondly, by using the step - by - step operation of the limit short - circuit handle, the short - circuit of the current transformer side loop and the isolation of the device side loop are realized, avoiding the misoperation risk caused by frequent wiring disconnection and connection in the traditional method, and ensuring the safe isolation of the current loop at the same time. Further, by means of a preset voltage decoupling control module, the electrical connection between the device under test and the external voltage transformer is cut off, realizing the rapid isolation of the voltage loop and further reducing the risk in the test process. Finally, by injecting a calibration signal and analyzing the deviation of the sampling data, the validity of the test is determined in real time, ensuring the accuracy and reliability of the test results. This application effectively solves the problem that the prior art cannot quickly and accurately test secondary equipment.

[0012] As a preferred embodiment of the first aspect, the step of generating a limit adjustment instruction according to the parsed current loop topology, and triggering a preset limit short - circuit handle according to the instruction, so as to isolate the device under test from the external current signal and generate a current isolation signal is specifically as follows:

[0013] Generate a limit adjustment instruction according to the parsed current loop topology;

[0014] Trigger the semi - locking operation of the limit short - circuit handle according to the instruction, so that the current transformer side loop of the device under test is short - circuited and the device side loop is conducting;

[0015] Monitor the current parameters of other devices sharing the same current transformer of the device under test. If the current parameters remain within a preset first threshold range within a preset time period, trigger the full - locking operation of the limit short - circuit handle to completely isolate the device side loop of the device under test;

[0016] Isolate the device under test from the external current signal and generate a current isolation signal according to the semi - locking and full - locking operations of the limit short - circuit handle.

[0017] In this preferred embodiment, the present application first generates a limit adjustment instruction by parsing the current loop topology to ensure the accuracy and pertinence of the operation. Subsequently, a semi-locking operation of the limit shorting handle is triggered to short-circuit the current transformer side loop while keeping the device side loop conducting. This process provides a transition state for the subsequent full-locking operation and ensures the safety of the operation. Further, by monitoring the current parameters of other devices sharing the same current transformer and triggering the full-locking operation when the parameters are within the preset threshold range, complete isolation of the device side loop of the device to be detected is achieved. This step-by-step operation not only avoids risks such as open circuit of the current transformer caused by misoperation but also ensures the reliability of the isolation operation. Finally, through the semi-locking and full-locking operations of the limit shorting handle, a current isolation signal is generated, providing a clear isolation state feedback for the subsequent test steps. This series of innovative designs significantly improves the safety and efficiency of the test process, reduces the risk of misoperation, and enhances the operational reliability of the power system.

[0018] As a preferred embodiment of the first aspect, the parsing of the current loop topology and voltage loop parameters of the device to be detected according to the configuration information of the preset test interface connector is specifically as follows:

[0019] Identify the connection points of the current loop and voltage loop of the device to be detected according to the terminal layout information of the test interface connector;

[0020] Obtain the current loop topology and voltage loop parameters of the device to be detected according to the connection points of the current loop and voltage loop;

[0021] Analyze the current loop topology and voltage loop parameters to determine the current information of the device to be detected and the connection state between the device to be detected and the external voltage transformer.

[0022] In this preferred embodiment, the present application realizes the accurate analysis of the current loop and voltage loop of the device to be detected through the configured information of the preset test interface connector, significantly improving the accuracy and efficiency of the test. Specifically, first, using the terminal layout information of the test interface connector, the connection points of the current loop and voltage loop are accurately identified, which ensures a comprehensive understanding of the device connection status. Subsequently, based on the identified connection points, the current loop topology and voltage loop parameters of the device to be detected are obtained, further enhancing the understanding of the electrical characteristics of the device. Finally, through the analysis of the current loop topology and voltage loop parameters, the current information of the device and the connection status with the external voltage transformer are determined, providing a solid foundation for subsequent isolation and test operations. This series of steps not only improves the degree of automation of the test, reduces the complexity of manual operations and the risk of misoperations, but also ensures the safety and reliability of the test process, significantly improving the overall efficiency and accuracy of the secondary equipment test in the power system.

[0023] As a preferred embodiment of the first aspect, according to the analyzed voltage loop parameters and the preset voltage decoupling control module, the electrical connection between the device to be detected and the external voltage transformer is cut off, so that the device to be detected is isolated from the external voltage signal and a voltage isolation signal is generated. Specifically:

[0024] According to the analyzed voltage loop parameters, determine the position of the voltage breaker of the test interface connector; wherein, the voltage breaker is connected in series between the voltage loop of the device to be detected and the external voltage transformer;

[0025] Through the preset voltage decoupling control module, send a disconnection control signal to the voltage breaker, so that the voltage breaker switches from the closed state to the open state;

[0026] After the voltage breaker switches to the open state, confirm that the electrical connection between the device to be detected and the external voltage transformer has been cut off, so that the device to be detected is isolated from the external voltage signal and a voltage isolation signal is generated.

[0027] In this preferred embodiment, the present application realizes the rapid and safe isolation of the device to be tested from the external voltage transformer by accurately analyzing the voltage loop parameters and using the preset voltage decoupling control module. First, based on the analyzed voltage loop parameters, the specific position of the voltage air switch in the test interface connector is determined, and this position information ensures the accuracy of subsequent operations. Then, a disconnection control signal is sent to the voltage air switch through the voltage decoupling control module, causing the voltage air switch to switch from the closed state to the open state. This process not only cuts off the electrical connection between the device to be tested and the external voltage transformer but also avoids the risk of misoperation caused by manual operation. Finally, after the voltage air switch switches to the open state, the system confirms the isolation state between the device to be tested and the external voltage signal and generates a voltage isolation signal, providing a clear feedback for subsequent test steps. This series of automated operations significantly improves the efficiency and reliability of voltage loop isolation, reduces the test time, and ensures the safety of the testing process of secondary equipment in the power system.

[0028] As a preferred embodiment of the first aspect, according to the voltage isolation signal and the current isolation signal, a calibration signal is injected into the test interface channel, and based on the deviation analysis between the calibration signal and the sampling data of the device to be tested, a validity determination result of the test is obtained. Specifically:

[0029] According to the voltage isolation signal, the current isolation signal, and a preset test standard, a calibration signal is injected into the test interface channel;

[0030] Wherein, the calibration signal includes preset current and voltage waveforms;

[0031] Calculate the deviation value between the calibration signal and the sampling signal of the device to be tested. If the deviation value is less than a preset second threshold, it is determined that the test is valid.

[0032] In this preferred embodiment, the present application triggers the injection of the calibration signal through the feedback signal and analyzes the deviation between the calibration signal and the sampling data of the device to be tested based on a preset standard, thereby efficiently and accurately determining the validity of the test. Specifically, first, a calibration signal including preset current and voltage waveforms is injected into the test interface channel according to the feedback signal and the preset test standard to provide a standardized reference for the test. Subsequently, the deviation value between the calibration signal and the device sampling signal is calculated and compared with a preset second threshold. If the deviation value is less than the threshold, it can be determined that the test is valid. This process not only ensures the accuracy and reliability of the test results but also reduces the subjectivity of human judgment through the preset standard and threshold, improves the test efficiency and automation degree, and provides a strong guarantee for the rapid and accurate testing of secondary equipment in the power system.

[0033] In a second aspect, the present application provides a test device based on a standardized interface. The test device based on the standardized interface includes: a parsing module, a current isolation module, a voltage isolation module, and a test module;

[0034] The parsing module is configured to parse the current loop topology and voltage loop parameters of the device under test according to the configuration information of a preset test interface connector;

[0035] The current isolation module is configured to generate a limit adjustment instruction according to the parsed current loop topology, and trigger a preset limit shorting handle according to the instruction, so as to isolate the device under test from an external current signal and generate a current isolation signal;

[0036] The voltage isolation module is configured to cut off the electrical connection between the device under test and an external voltage transformer according to the parsed voltage loop parameters and a preset voltage decoupling control module, so as to isolate the device under test from an external voltage signal and generate a voltage isolation signal;

[0037] The test module is configured to inject a calibration signal into a test interface channel according to the voltage isolation signal and the current isolation signal, and obtain a determination result of test effectiveness based on the deviation analysis between the calibration signal and the sampled data of the device under test.

[0038] With four modules in this device working in division and coordination, the secondary equipment can be tested more accurately. By parsing the current loop topology and voltage loop parameters of the device under test, the present application can accurately identify the connection status of the current and voltage loops, providing an accurate basis for subsequent isolation operations. Secondly, by using the step-by-step operation of the limit shorting handle, the shorting of the current transformer side loop and the isolation of the device side loop are realized, avoiding the misoperation risk caused by frequent wiring disconnection and connection in the traditional method, and ensuring the safe isolation of the current loop at the same time. Further, by means of a preset voltage decoupling control module, the electrical connection between the device under test and the external voltage transformer is cut off, realizing the rapid isolation of the voltage loop and further reducing the risk during the test process. Finally, by injecting a calibration signal and analyzing the deviation of the sampled data, the effectiveness of the test is judged in real time, ensuring the accuracy and reliability of the test results. The present application effectively solves the problem that the prior art cannot quickly and accurately test secondary equipment.

[0039] As a preferred embodiment of the second aspect, the current isolation module is configured to generate a limit adjustment instruction according to the parsed current loop topology, and trigger a preset limit shorting handle according to the instruction, so as to isolate the device under test from an external current signal and generate a current isolation signal, specifically as follows:

[0040] Generate a limit adjustment instruction according to the parsed current loop topology;

[0041] Trigger the semi-locking operation of the limit shorting handle according to the instruction, so that the current transformer side circuit of the device to be detected is shorted and the device side circuit is conducted;

[0042] Monitor the current parameters of other devices sharing the same current transformer of the device to be detected. If the current parameters remain within the preset first threshold range within a preset time period, trigger the full-locking operation of the limit shorting handle to completely isolate the device side circuit of the device to be detected;

[0043] According to the semi-locking and full-locking operations of the limit shorting handle, isolate the device to be detected from the external current signal and generate a current isolation signal.

[0044] In this preferred embodiment, the application first generates a limit adjustment instruction by parsing the current loop topology to ensure the accuracy and pertinence of the operation. Subsequently, trigger the semi-locking operation of the limit shorting handle to short the current transformer side circuit while keeping the device side circuit conducted. This process provides a transition state for the subsequent full-locking operation and ensures the safety of the operation. Further, by monitoring the current parameters of other devices sharing the same current transformer and triggering the full-locking operation when the parameters remain within the preset threshold range, the complete isolation of the device side circuit of the device to be detected is achieved. This step-by-step operation not only avoids risks such as open circuit of the current transformer caused by misoperation but also ensures the reliability of the isolation operation. Finally, through the semi-locking and full-locking operations of the limit shorting handle, a current isolation signal is generated, providing a clear isolation state feedback for the subsequent test steps. This series of innovative designs significantly improves the safety and efficiency of the test process, reduces the risk of misoperation, and enhances the operational reliability of the power system.

[0045] As a preferred embodiment of the second aspect, the voltage isolation module is used to cut off the electrical connection between the device to be detected and the external voltage transformer according to the parsed voltage loop parameters and the preset voltage decoupling control module, so that the device to be detected is isolated from the external voltage signal and a voltage isolation signal is generated. Specifically:

[0046] Determine the position of the voltage air switch of the test interface connector according to the parsed voltage loop parameters; wherein, the voltage air switch is connected in series between the voltage loop of the device to be detected and the external voltage transformer;

[0047] Send a breaking control signal to the voltage air switch through the preset voltage decoupling control module to switch the voltage air switch from the closed state to the open state;

[0048] After the voltage air switch is switched to the open state, confirm that the electrical connection between the device to be detected and the external voltage transformer has been cut off, so that the device to be detected is isolated from the external voltage signal and a voltage isolation signal is generated.

[0049] In this preferred embodiment, the present application realizes the fast and safe isolation between the device to be detected and the external voltage transformer by accurately analyzing the voltage loop parameters and using the preset voltage decoupling control module. First, based on the analyzed voltage loop parameters, the specific position of the voltage air switch in the test interface connector is determined, and this position information ensures the accuracy of subsequent operations. Then, a disconnection control signal is sent to the voltage air switch through the voltage decoupling control module, causing the voltage air switch to switch from the closed state to the open state. This process not only cuts off the electrical connection between the device to be detected and the external voltage transformer but also avoids the risk of misoperation caused by manual operation. Finally, after the voltage air switch switches to the open state, the system confirms the isolation state between the device to be detected and the external voltage signal and generates a voltage isolation signal, providing clear feedback for subsequent test steps. This series of automated operations significantly improves the efficiency and reliability of voltage loop isolation, reduces the test time, and ensures the safety of the test process of secondary equipment in the power system.

[0050] In a third aspect, the present application provides a computer-readable storage medium, which includes a stored computer program. When the computer program runs, it controls the device where the computer-readable storage medium is located to execute a test method based on a standardized interface as described above. Its beneficial effects are the same as those of the test method based on a standardized interface provided in the first aspect of the present application.

[0051] In a fourth aspect, the present application provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements any one of the test methods based on a standardized interface as described in the first aspect. Description of the Drawings

[0052] Figure 1 : A flowchart of an embodiment of the test method based on a standardized interface provided by the present application;

[0053] Figure 2 : A structural schematic diagram of an embodiment of the terminal module of the test interface connector provided by the present application;

[0054] Figure 3 : A structural schematic diagram of an embodiment of the mechanical structure principle of the self-sealing current terminal of the test interface connector provided by the present application;

[0055] Figure 4 : A structural schematic diagram of an embodiment of the wiring scheme of single-set protection voltage and current provided by the present application;

[0056] Figure 5: Schematic diagram of a structure of an embodiment of the wiring principle of the CT end device test interface connector provided by this application;

[0057] Figure 6 : Schematic diagram of a structure of an embodiment of the dual - set protection voltage - current multiplexing wiring scheme provided by this application;

[0058] Figure 7 : Schematic diagram of a structure of an embodiment of the wiring principle of the non - end device test interface connector under the CT series connection scheme provided by this application;

[0059] Figure 8 : Schematic diagram of a structure of an embodiment of the test device based on a standardized interface provided by this application. Detailed implementation manners

[0060] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0061] Embodiment 1

[0062] Please refer to Figure 1 , a test method based on a standardized interface provided for the embodiments of the present invention.

[0063] In this embodiment, the process of the test method based on the standardized interface in this application is described in detail through steps S01 - S04.

[0064] S01: Analyze the current loop topology and voltage loop parameters of the device to be detected according to the configured information of the preset test interface connector.

[0065] As a preferred embodiment of Embodiment 1, the configured information of the preset test interface connector is specifically:

[0066] The number of terminals (cores) of the test interface connector can be selected and designed according to the number of CT / PT loops accessed by the device to be detected, and can support up to 12 module positions, with any combination of PT / CT; the typical example of the test interface connector in this application is designed with 26 cores, including 20 current terminals and 6 voltage terminals;

[0067] The schematic diagram of the terminal module of the test interface connector is as shown in Figure 2 ; the test interface connector integrates the functions of current - voltage series connection and important loop test, and realizes the voltage parallel connection function through an air switch;

[0068] The test interface connector is deployed between the standard 24-core current and voltage type cable connector (aviation plug) and the protection (or measurement and control) device (supplementary note: the 25th and 26th cores of the test interface connector are the internal lead terminals of the panel cabinet and are not connected to the standard 24-core current and voltage type cable connector (aviation plug)), and is connected to the above-mentioned cable connector and device through prefabricated wiring harnesses or cables inside the panel; the test interface connector is designed as an independent set for each device to be tested; the terminal layout of the test interface device takes into account the convenience of design, short-circuiting and test wiring after short-circuiting, without the need to unplug the external cable connector.

[0069] S02: Generate a limit adjustment instruction according to the analyzed current loop topology, and trigger a preset limit short-circuit handle according to the instruction to isolate the device to be detected from the external current signal and generate a current isolation signal.

[0070] As a preferred embodiment of the first embodiment, the limit short-circuit handle isolates the device to be detected from the external current, specifically:

[0071] The adjacent current terminals in the left and right columns of the test interface connector are designed as self-closed circuits. Circuit switching is achieved through a limit short-circuit handle. After the limit handle is pulled out, it has a self-sealing function on the current CT side to prevent the CT from being open during the test operation.

[0072] The mechanical structure principle of the self-enclosed current terminal of the test interface connector is as follows Figure 3 As shown;

[0073] a) Pull out the limit short-circuit handle of the current terminal of the test interface connector, and pull out the corresponding connection pin. There are buckles on both sides, and the pin will be stuck in the half-pulled position. At this time, the loop self-sealing (2-4 terminal short-circuited) connected to the CT side and the terminal (1-2 and 3-4) connected to the device to be tested are still in the conductive state.

[0074] b) Press the clips on both sides and lift them up to pull out the limit short-circuit handle, and disconnect the terminals (1-2 and 3-4) on the side of the device to be tested. At this time, the current terminals on the side of the device to be tested are completely isolated from the external CT.

[0075] c) The voltage terminal module does not need to be self-sealed.

[0076] As a preferred embodiment of the first embodiment, the wiring mode of the current terminal is designed according to different current loop topologies, and the isolation of the current loop is achieved by operating the limit short-circuit handle, specifically:

[0077] (1) Current terminal wiring scheme for non-CT series connection (or terminal device under CT series connection scheme):

[0078] Under this scheme, only one device is connected to the external CT, and there is no series connection loop or device at the end of the CT series connection loop. The IA, IB, IC, and I0 of the external CT are respectively connected to the 2nd, 6th, 10th, and 14th terminals of the test interface connector; the IA, IB, IC, and I0 corresponding to the device to be tested are respectively connected to the 1st, 5th, 9th, and 13th terminals of the test interface connector; the I1 and IN of the external dedicated CT channel are respectively connected to the 18th and 20th of the test interface connector, and the I1 and IN of the dedicated CT on the device side are respectively connected to the 17th and 19th of the test interface connector.

[0079] In this scenario, considering that when the current terminal limit short-circuit handle is fully pulled out, the loop on the CT side is self-sealed (the 2-4, 6-8, 10-12, and 14-16 terminals are short-circuited, and the 1-2, 5-6, 9-10, and 13-14 connections are disconnected). In order to ensure reliable self-sealing of the external CT loop, the 4th, 8th, 12th, and 16th terminals need to be short-circuited during wiring design.

[0080] Schematic diagram of the voltage and current wiring scheme for single-set protection: As Figure 4 shown.

[0081] Wiring schematic diagram of the test interface connector for the CT end device is as Figure 5 shown.

[0082] (2) Current terminal wiring scheme for non-end devices in the CT series connection scenario:

[0083] In this scenario, the external CT is serially multiplexed through at least two protection or measurement and control devices. The IA, IB, IC, and I0 of the external CT are respectively connected to the 2nd, 6th, 10th, and 14th terminals of the test interface connector; the IA, IB, IC, and I0 corresponding to the device to be tested are respectively connected to the 1st, 5th, 9th, and 13th terminals of the test interface connector; the I1 and IN of the external dedicated CT channel are respectively connected to the 18th and 20th of the test interface connector, and the I1 and IN of the dedicated CT on the device side are respectively connected to the 17th and 19th of the test interface connector; the 4th, 8th, 12th, and 16th terminals of the test interface connector are respectively connected to the IA, IB, IC, and I0 of another device (protection or measurement and control).

[0084] In this scenario, when the current terminal limit short-circuit handle is fully pulled out, the loop on the CT side is self-sealed (the 2-4, 6-8, 10-12, and 14-16 terminals are short-circuited, and the 1-2, 5-6, 9-10, and 13-14 connections are disconnected). The device to be tested is isolated from the CT, and the current loop of another device is not affected. Therefore, there is no need to short-circuit the 4th, 8th, 12th, and 16th terminals during wiring design.

[0085] Schematic diagram of the voltage and current wiring scheme for double-set protection is as Figure 6 shown.

[0086] The wiring schematic diagram of the test interface connector for non-terminal devices under the CT cascading scheme is as Figure 7 shown.

[0087] In this preferred embodiment, the present application first generates a limit adjustment instruction by parsing the current loop topology to ensure the accuracy and pertinence of the operation. Subsequently, the semi-locking operation of the limit shorting handle is triggered to short-circuit the current transformer side loop while keeping the device side loop conducting. This process provides a transition state for the subsequent full-locking operation and ensures the safety of the operation. Further, by monitoring the current parameters of other devices sharing the same current transformer and triggering the full-locking operation when the parameters are within the preset threshold range, complete isolation of the device side loop of the device to be detected is achieved. This step-by-step operation not only avoids risks such as open circuit of the current transformer caused by misoperation but also ensures the reliability of the isolation operation. Finally, through the semi-locking and full-locking operations of the limit shorting handle, a current isolation signal is generated, providing a clear isolation state feedback for the subsequent test steps. This series of innovative designs significantly improves the safety and efficiency of the test process, reduces the risk of misoperation, and enhances the operating reliability of the power system.

[0088] S03: According to the parsed voltage loop parameters and the preset voltage decoupling control module, cut off the electrical connection between the device to be detected and the external voltage transformer to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal.

[0089] As a preferred embodiment of Embodiment 1, the step of cutting off the electrical connection between the device to be detected and the external voltage transformer according to the parsed voltage loop parameters and the preset voltage decoupling control module to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal is specifically:

[0090] To meet the requirements of rapid and efficient test acceptance of the switchgear and achieve rapid isolation of the external voltage signal during the maintenance process, a voltage air switch is designed between the test interface connector and the voltage loop of the standard 24-core current and voltage type cable connector (flight plug);

[0091] During normal operation, the air switch is switched on, and the device collects the external PT signal; during device maintenance, the corresponding air switch is disconnected, and the voltage loop of the device is isolated from the external PT.

[0092] As a preferred embodiment of Embodiment 1, the normal operating state of the secondary equipment of the present application is specifically:

[0093] Normal operating state of the secondary equipment at the end of the CT cascading loop:

[0094] When the secondary equipment to be tested is at the end of the CT series connection loop, during normal operation, the current terminal limit short-circuit handles of the test interface connector are all in the fully inserted state. At this time, the current terminals 1 and 2, 3 and 4, 5 and 6, 7 and 8, 9 and 10, 11 and 12, 13 and 14, 15 and 16 of the test interface connector are conducting; 2 and 4, 6 and 8, 10 and 12, 14 and 16 are disconnected; the external PT access breaker is in the closed state, and the external A, B, C three-phase and N-phase voltages are respectively connected to the voltage acquisition channel of the secondary equipment device through the test interface connector nodes 21, 22, 23, 25.

[0095] The A-phase current flows from the external CT into the test interface connector node 2, then flows through node 1 into the secondary equipment IA, and after passing through the equipment sampling, it flows out of IA' to the current neutral point I0 on the equipment side (the external three-phase current outflow ends IA', IB', C' of the device are respectively short-circuited to I0);

[0096] The B-phase current flows from the external CT into the test interface connector node 6, then flows through node 5 into the secondary equipment IB, and after passing through the equipment sampling, it flows out of IB' to the current neutral point I0 on the equipment side (the external three-phase current outflow ends IA', IB', C' of the device are respectively short-circuited to I0);

[0097] The C-phase current flows from the external CT into the test interface connector node 10, then flows through node 9 into the secondary equipment IC, and after passing through the equipment sampling, it flows out of IC' to the current neutral point I0 on the equipment side (the external three-phase current outflow ends IA', IB', C' of the device are respectively short-circuited to I0);

[0098] The current neutral point I0 on the equipment side returns to the neutral point of the external CT through the test interface connector nodes 13 and 14.

[0099] The wiring schematic diagram of the test interface connector of the CT end device is as Figure 5 shown.

[0100] Normal operation state of the secondary equipment at the non-end of the CT series connection loop:

[0101] When the secondary equipment to be tested is not at the end of the CT series connection circuit, during normal operation, the current terminal limit shorting handles of the test interface connector are all in the fully inserted state. At this time, the current terminals 1 and 2, 3 and 4, 5 and 6, 7 and 8, 9 and 10, 11 and 12, 13 and 14, 15 and 16 of the test interface connector are conducting; 2 and 4 are disconnected, 6 and 8 are disconnected, 10 and 12 are disconnected, 14 and 16 are disconnected; the external PT access breaker is in the closed state, and the external A, B, C three-phase and N-phase voltages are respectively connected to the voltage acquisition channel of the secondary equipment device through the test interface connector nodes 21, 22, 23, 25.

[0102] The A-phase current flows from the external CT into the test interface connector node 2, then flows through node 1 into the secondary equipment I A, and after passing through the equipment sampling, it flows out of IA′ to the test interface connector node 3, and then flows out through node 4 to the test interface connector of the next secondary equipment in the CT series connection circuit;

[0103] The B-phase current flows from the external CT into the test interface connector node 6, then flows through node 5 into the secondary equipment I B, and after passing through the equipment sampling, it flows out of I B′ to the test interface connector node 7, and then flows out through node 8 to the test interface connector of the next secondary equipment in the CT series connection circuit;

[0104] The C-phase current flows from the external CT into the test interface connector node 10, then flows through node 9 into the secondary equipment I C, and after passing through the equipment sampling, it flows out of I C′ to the test interface connector node 11, and then flows out through node 12 to the test interface connector of the next secondary equipment in the CT series connection circuit;

[0105] The I 0 returned by the next secondary equipment in the CT series connection circuit passes through the test interface connector node 16 of this secondary equipment, then flows into the I 0 of this equipment through node 15, and after passing through the equipment sampling, it flows out of I 0′ to the test interface connector node 13, and then returns to the I 0 of the CT through node 14.

[0106] The wiring schematic diagram of the test interface connector of the non-terminal device under the CT series connection scheme is as Figure 7 shown.

[0107] More specifically, the entire detailed process of the AC test of this application is specifically as follows:

[0108] When the secondary equipment needs to be taken out of operation for maintenance, it is necessary to short-circuit the external current circuit of this equipment and then isolate it from this equipment to avoid test current from entering the normal operation circuit and reverse charging to the primary side or affecting the normal operation of other secondary equipment in the same circuit.

[0109] a) Check the wiring diagram of the secondary equipment cabinet to be inspected, and confirm the current and voltage circuit parameters of the secondary equipment to be inspected, including the number of CT / PT circuits, the connection status of the current terminals and voltage terminals, whether the current circuit is connected in series with other secondary equipment, and other actual conditions.

[0110] b) Before formal operation, check and record the voltage and current data of the device to be tested during operation, and make backup or record of various fixed value parameters;

[0111] c) Take relevant safety measures for the device to be inspected (such as exiting related protection functions or protecting exits) to avoid false triggering of secondary equipment.

[0112] d) Operate the test interface connector current terminals:

[0113] Locate the test interface connector corresponding to the device to be tested, unscrew it and remove the cover.

[0114] Step 1: Find the N-phase current terminal of the corresponding channel, operate the N-phase current (I0) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position; at this time, the CT module loop is self-sealed (14-16 terminals are short-circuited), and the 13-14 and 15-16 terminals are still short-circuited and turned on; at this time, the corresponding channel A, B, and C three-phase current values ​​displayed by the secondary equipment to be inspected should still be in normal operation;

[0115] Step 2: Locate the A-phase current terminal of the corresponding channel, operate the A-phase current (IA) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (2-4 terminals are short-circuited), and the 1-2 and 3-4 terminals are still in the short-circuited and conductive state. Confirm that the A-phase current displayed by the secondary device to be inspected is approximately 0 and the current of other secondary devices in the same CT circuit is normal, then operate the limit short-circuit handle to the full pull-out state again, press the reverse buckles on both sides of the limit short-circuit handle inward, and pull the limit short-circuit handle outward completely. At this time, the CT module circuit is self-sealed (2-4 terminals are short-circuited), and the 1-2 and 3-4 terminals are completely disconnected. At this time, the A-phase current channel of the secondary device to be inspected has been decoupled from the system CT.

[0116] Step 3: Locate the B-phase current terminal of the corresponding channel, operate the B-phase current (IB) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (6-8 terminals are short-circuited), and the 5-6 and 7-8 terminals are still in the short-circuited conduction state. Confirm that the B-phase current displayed by the secondary device to be inspected is approximately 0 and the current of other secondary devices in the same CT circuit is normal, then operate the limit short-circuit handle to the full pull-out state again, press the reverse buckles on both sides of the limit short-circuit handle inward, and pull the limit short-circuit handle outward completely. At this time, the CT module circuit is self-sealed (6-8 terminals are short-circuited), and the 5-6 and 7-8 terminals are completely disconnected. At this time, the B-phase current channel of the secondary device to be inspected has been decoupled from the system CT.

[0117] Step 4: Locate the C-phase current terminal of the corresponding channel, operate the C-phase current (IC) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (10-12 terminals are short-circuited), and the 9-10 and 11-12 terminals are still in the short-circuited conduction state. Confirm that the C-phase current displayed by the secondary device to be inspected is approximately 0 and the current of other secondary devices in the same CT circuit is normal, then operate the limit short-circuit handle to the full pull-out state again, press the reverse buckles on both sides of the limit short-circuit handle inward, and pull the limit short-circuit handle outward completely. At this time, the CT module circuit is self-sealed (10-12 terminals are short-circuited), and the 9-10 and 11-12 terminals are completely disconnected. At this time, the C-phase current channel of the secondary device to be inspected has been decoupled from the system CT.

[0118] Step 5: Locate the N-phase current terminal of the corresponding channel, and ensure that the above four steps are completed reliably. Operate the short-circuit limit handle of the N-phase (I0) current terminal of the test interface connector to the fully pulled-out state. Press the undercuts on both sides of the limit short-circuit handle inward with force, and fully pull out the limit short-circuit handle. At this time, the CT module loop is self-sealed (14-16 terminals are short-circuited). At this time, the 13-14 and 15-16 terminals are completely disconnected. At this time, the current channel of the secondary equipment to be tested has been completely decoupled from the system CT.

[0119] e) Review the data of the secondary device to be tested and other secondary devices in the same CT circuit again to confirm that the current of the secondary device to be tested is 0 and that the current data of other secondary devices in the same CT circuit are in normal operation.

[0120] f) Operate the three-phase voltage access circuit breaker and the voltage extraction UX circuit breaker of the secondary equipment to be inspected to the separated state respectively, browse the secondary equipment to be inspected, and confirm that the device voltage display is 0.

[0121] g) Voltage sampling test of the secondary equipment to be tested: insert the three-phase voltage or extraction voltage pins (or connectors) of the relay tester UA, UB, UC, UX, and UN into the voltage sockets of the test interface connector (corresponding to the sockets 21, 22, 23, 24, and 25 on the right side), and increase the voltage sampling channel of the test verification device one by one to verify its reliability.

[0122] h) Current sampling test of the secondary equipment to be tested: insert the three-phase current pins (or connectors) IA, IB, IC, and IN of the relay tester into the current sockets of the test interface connector (corresponding to sockets 1, 5, 9, and 13 on the right side), and increase the current sampling channel reliability of the test verification device one by one.

[0123] i) Complete the functional test and logic verification of the device according to the test items related to the secondary equipment to be tested, and release the coupling relationship between the secondary equipment and the tester.

[0124] j) Operation recovery test interface connector current terminals:

[0125] Step 1: Locate the N-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the N-phase current (I0) terminal to the half-insertion state, the two sides of the buckle are just stuck in the buckle, and the internal pin will be stuck in the half-pull position; at this time, the CT module circuit is self-sealed (14-16 terminals remain short-circuited), and the 13-14 and 15-16 terminals are restored to the short-circuited conduction state; confirm whether the operating status and current value of other secondary equipment in the same CT circuit are normal.

[0126] Step 2: Locate the A-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the A-phase current (IA) terminal to the half-inserted state, the two side buckles are just stuck in the buckle, and the internal pin will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (the 2-4 terminals remain short-circuited), and the 1-2 and 3-4 terminals are restored to the short-circuited conduction state. After confirming that the A-phase current of other secondary devices in the same CT circuit is normal, operate the limit short-circuit handle again to the full insertion state, press the limit short-circuit handle hard until it is fully inserted, and the CT module releases the circuit self-sealing (the 2-4 terminals are disconnected). At this time, the 1-2 and 3-4 terminals are in the conduction state. At this time, the A-phase current channel of the secondary device has returned to normal. Browse the A channel current of the device and confirm that it has returned to normal.

[0127] Step 3: Locate the B-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the B-phase current (IB) terminal to the half-inserted state, the two side buckles are just stuck in the buckle, and the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (the 6-8 terminals remain short-circuited), and the 5-6 and 7-8 terminals are restored to the short-circuited conduction state. After confirming that the B-phase current of other secondary devices in the same CT circuit is normal, operate the limit short-circuit handle again to the full insertion state, press the limit short-circuit handle hard until it is fully inserted, and the CT module releases the circuit self-sealing (the 6-8 terminals are disconnected), and the 5-6 and 7-8 terminals are in the conduction state. At this time, the B-phase current channel of the secondary device returns to normal, browse the B channel current of the device and confirm that it has returned to normal.

[0128] Step 4: Locate the C-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the C-phase current (IC) terminal to the half-inserted state, the two side buckles are just stuck in the buckle, and the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (10-12 terminals remain short-circuited), and the 9-10 and 11-12 terminals are restored to the short-circuited conduction state. After confirming that the B-phase current of other secondary devices in the same CT circuit is normal, operate the limit short-circuit handle again to the full insertion state, press the limit short-circuit handle hard until it is fully inserted, and the CT module releases the circuit self-sealing (10-12 terminals are disconnected). At this time, the 9-10 and 11-12 terminals are in the conduction state, and the C-phase current channel of the secondary device is restored to normal. Browse the C channel current of the device and confirm that it has returned to normal.

[0129] Step 5: Locate the N-phase current terminal of the corresponding channel, and ensure that the above four steps are completed reliably. Operate the limit short-circuit handle to the full insertion state, and press the limit short-circuit handle hard until it is fully inserted. At this time, the CT module releases the loop self-sealing (14-16 terminals are disconnected). At this time, the 13-14 and 15-16 terminals are in the conducting state. At this time, the current channel of the secondary device returns to normal. Browse the three-phase current of the equipment and confirm that it has returned to normal.

[0130] k) Operate the three-phase voltage access circuit breaker and the voltage extraction UX circuit breaker of the secondary equipment under inspection to the closed state respectively, browse the secondary equipment under inspection, and confirm that the device voltage has returned to normal.

[0131] l) Restore the set values, protection outputs and various parameters of the secondary equipment under test, release various safety measures, and restore the normal operation of the secondary equipment under test.

[0132] In this preferred embodiment, the present application realizes the accurate analysis of the current loop and voltage loop of the device to be tested through the configured information of the preset test interface connector, significantly improving the accuracy and efficiency of the test. Specifically, first, the terminal layout information of the test interface connector is used to accurately identify the connection points of the current loop and voltage loop, which ensures a comprehensive understanding of the device connection status. Subsequently, based on the identified connection points, the current loop topology and voltage loop parameters of the device to be tested are obtained, further enhancing the understanding of the device's electrical characteristics. Finally, through the analysis of the current loop topology and voltage loop parameters, the current information of the device and its connection status with the external voltage transformer are determined, providing a solid foundation for subsequent isolation and test operations. This series of steps not only improves the automation level of the test, reduces the complexity of manual operations and the risk of misoperations, but also ensures the safety and reliability of the test process, significantly enhancing the overall efficiency and accuracy of the secondary equipment test in the power system.

[0133] S04: Inject a calibration signal into the test interface channel according to the voltage isolation signal and current isolation signal, and obtain a validity determination result of the test based on the deviation analysis between the calibration signal and the sampled data of the device to be tested.

[0134] As a preferred embodiment of Embodiment 1, the step of injecting a calibration signal into the test interface channel according to the voltage isolation signal and current isolation signal, and obtaining a validity determination result of the test based on the deviation analysis between the calibration signal and the sampled data of the device to be tested is specifically as follows:

[0135] Inject a calibration signal into the test interface channel according to the voltage isolation signal, current isolation signal, and preset test criteria;

[0136] Wherein, the calibration signal includes preset current and voltage waveforms;

[0137] Calculate the deviation value between the calibration signal and the sampled signal of the device to be tested. If the deviation value is less than a preset second threshold, determine that the test is valid.

[0138] In this preferred embodiment, the present application triggers the injection of a verification signal through a feedback signal, and analyzes the deviation between the verification signal and the sampled data of the device to be detected based on a preset standard, so as to efficiently and accurately determine the effectiveness of the test. Specifically, first, a verification signal including a preset current and voltage waveform is injected into the test interface channel according to the feedback signal and the preset test standard, providing a standardized reference for the test. Subsequently, the deviation value between the verification signal and the device sampling signal is calculated and compared with a preset second threshold. If the deviation value is less than the threshold, the test can be determined to be effective. This process not only ensures the accuracy and reliability of the test results, but also reduces the subjectivity of human judgment through preset standards and thresholds, improving the test efficiency and automation level, and providing a strong guarantee for the rapid and accurate testing of secondary equipment in the power system.

[0139] By analyzing the current loop topology and voltage loop parameters of the device to be detected, the present application can accurately identify the connection status of the current and voltage loops, providing an accurate basis for subsequent isolation operations. Secondly, by using the step-by-step operation of the limit short-circuit handle, the short-circuit of the current transformer side loop and the isolation of the device side loop are realized, avoiding the risk of misoperation caused by frequent wiring disconnection and connection in the traditional method, and ensuring the safe isolation of the current loop. Further, through a preset voltage decoupling control module, the electrical connection between the device to be detected and the external voltage transformer is cut off, realizing the rapid isolation of the voltage loop and further reducing the risk during the test process. Finally, by injecting a verification signal and analyzing the deviation of the sampled data, the effectiveness of the test is determined in real time, ensuring the accuracy and reliability of the test results. The present application effectively solves the problem that the prior art cannot quickly and accurately test secondary equipment.

[0140] Embodiment 2

[0141] Please refer to Figure 8 , a test device based on a standardized interface provided by an embodiment of the present application.

[0142] In this embodiment, the test device based on a standardized interface includes an analysis module 10, a current isolation module 20, a voltage isolation module 30, and a test module 40.

[0143] The analysis module 10 is used to analyze the current loop topology and voltage loop parameters of the device to be detected according to the configuration information of the preset test interface connector.

[0144] As a preferred embodiment of Embodiment 2, the configuration information of the preset test interface connector is specifically:

[0145] The number of test interface connector terminals (cores) can be selected and designed according to the number of CT / PT circuits connected to the device to be tested, and can support up to 12 module positions and any combination of PT / CT; the typical example test interface connector of this application is designed to be 26 cores, including 20 current terminals and 6 voltage terminals;

[0146] The schematic diagram of the test interface connector terminal module is as follows Figure 2 As shown; the test interface connector integrates current and voltage series connection function and important circuit test function, and realizes voltage parallel connection function through circuit breaker;

[0147] The test interface connector is deployed between the standard 24-core current and voltage type cable connector (aviation plug) and the protection (or measurement and control) device (supplementary note: the 25th and 26th cores of the test interface connector are lead terminals inside the panel cabinet and are not connected to the standard 24-core current and voltage type cable connector (aviation plug)), and is connected to the above-mentioned cable connector and device through prefabricated wiring harnesses or cables inside the panel; the test interface connector is designed as an independent set for each device to be tested;

[0148] The terminal layout of the test interface device takes into account the convenience of design, short-circuiting and test wiring after short-circuiting without unplugging the external cable connector.

[0149] The current isolation module 20 is used to generate a limit adjustment instruction according to the analyzed current loop topology, and trigger a preset limit short-circuit handle according to the instruction to isolate the device to be detected from the external current signal and generate a current isolation signal.

[0150] As a preferred embodiment of the second embodiment, the limit short-circuit handle isolates the device to be detected from the external current, specifically:

[0151] The adjacent current terminals in the left and right columns of the test interface connector are designed as self-closed circuits. Circuit switching is achieved through a limit short-circuit handle. After the limit handle is pulled out, it has a self-sealing function on the current CT side to prevent the CT from being open during the test operation.

[0152] The mechanical structure principle of the self-enclosed current terminal of the test interface connector is as follows Figure 3 As shown;

[0153] a) Pull out the limit short-circuit handle of the current terminal of the test interface connector, and pull out the corresponding connection pin. There are buckles on both sides, and the pin will be stuck in the half-pulled position. At this time, the loop self-sealing (2-4 terminal short-circuited) connected to the CT side and the terminal (1-2 and 3-4) connected to the device to be tested are still in the conductive state.

[0154] b) Press both side buckles and then lift upwards to pull out the limit short - circuit handle. Disconnect the connection of the terminals (1 - 2 and 3 - 4) on the side of the device to be tested. At this time, the current terminals on the side of the device to be tested are completely isolated from the external CT.

[0155] c) The voltage terminal module does not need self - sealing.

[0156] As a preferred embodiment of Embodiment 2, design the wiring method of the current terminals according to different current loop topologies, and realize the isolation of the current loop through the operation of the limit short - circuit handle. Specifically:

[0157] (1) Wiring scheme for current terminals in the case of non - CT series connection (or the end device in the CT series connection scheme):

[0158] In this scheme, the external CT is only connected to one device, without a series connection loop or the device is at the end of the CT series connection loop. IA, IB, IC, and I0 of the external CT are respectively connected to terminals 2, 6, 10, and 14 of the test interface connector; IA, IB, IC, and I0 on the side of the device to be tested are respectively connected to terminals 1, 5, 9, and 13 of the test interface connector; I1 and IN of the external dedicated CT channel are respectively connected to terminals 18 and 20 of the test interface connector, and I1 and IN of the dedicated CT on the device side are respectively connected to terminals 17 and 19 of the test interface connector.

[0159] In this scenario, considering that when the limit short - circuit handle of the current terminal is completely pulled out, the loop on the CT - connected side is self - sealed (the connection terminals 2 - 4, 6 - 8, 10 - 12, 14 - 16 are short - circuited, and 1 - 2, 5 - 6, 9 - 10, 13 - 14 are disconnected). In order to ensure reliable self - sealing of the external CT loop, terminals 4, 8, 12, and 16 need to be short - circuited during wiring design.

[0160] Schematic diagram of the wiring scheme for single - set protection voltage and current: As Figure 4 shown.

[0161] Schematic wiring diagram of the test interface connector for the CT end device is as Figure 5 shown.

[0162] (2) Wiring scheme for current terminals of non - end devices in the CT series connection scenario:

[0163] In this scenario, the external CT is connected in series and multiplexed through at least two protection or measurement and control devices. The IA, IB, IC, and I0 of the external CT are respectively connected to the 2nd, 6th, 10th, and 14th terminals of the test interface connector; the IA, IB, IC, and I0 corresponding to the device to be tested are respectively connected to the 1st, 5th, 9th, and 13th terminals of the test interface connector; the I1 and IN of the external dedicated CT channel are respectively connected to the 18th and 20th terminals of the test interface connector, and the I1 and IN of the dedicated CT on the device side are respectively connected to the 17th and 19th terminals of the test interface connector; the 4th, 8th, 12th, and 16th terminals of the test interface connector are respectively connected to the IA, IB, IC, and I0 of another device (protection or measurement and control).

[0164] In this scenario, when the current terminal limit short - circuit handle is fully pulled out, the circuit on the CT side is self - sealed (the 2 - 4, 6 - 8, 10 - 12, 14 - 16 connection terminals are short - circuited, and the 1 - 2, 5 - 6, 9 - 10, 13 - 14 connections are disconnected). The device to be tested is isolated from the CT, and the current circuit of another device is not affected. Therefore, when designing the wiring, there is no need to short - circuit the 4th, 8th, 12th, and 16th terminals.

[0165] The schematic diagram of the double - set protection voltage and current wiring scheme is as Figure 6 shown.

[0166] The wiring schematic diagram of the test interface connector for non - terminal devices in the CT series connection scheme is as Figure 7 shown.

[0167] In this preferred embodiment, the present application first generates a limit adjustment instruction by analyzing the current loop topology to ensure the accuracy and pertinence of the operation. Subsequently, it triggers the semi - locking operation of the limit short - circuit handle to short - circuit the current transformer side circuit while keeping the device side circuit conducting. This process provides a transition state for the subsequent full - locking operation and ensures the safety of the operation. Further, by monitoring the current parameters of other devices sharing the same current transformer and triggering the full - locking operation when the parameters are within the preset threshold range, the complete isolation of the device side circuit of the device to be detected is achieved. This step - by - step operation not only avoids risks such as the open - circuit of the current transformer caused by misoperation but also ensures the reliability of the isolation operation. Finally, through the semi - locking and full - locking operations of the limit short - circuit handle, a current isolation signal is generated, providing a clear isolation state feedback for the subsequent test steps. This series of innovative designs significantly improves the safety and efficiency of the test process, reduces the risk of misoperation, and enhances the operational reliability of the power system.

[0168] The voltage isolation module 30 is used to cut off the electrical connection between the device to be detected and the external voltage transformer according to the analyzed voltage loop parameters and the preset voltage decoupling control module, so as to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal.

[0169] As a preferred embodiment of the second embodiment, the method according to the analyzed voltage loop parameters and the preset voltage decoupling control module cuts off the electrical connection between the device to be detected and the external voltage transformer, so as to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal, specifically:

[0170] To meet the requirements of rapid and efficient test acceptance of the switchgear and realize the rapid isolation of the external voltage signal during the maintenance process, a voltage air switch is designed between the test interface connector and the voltage loop of the standard 24-core current and voltage type cable connector (aeronautical plug);

[0171] During normal operation, the air switch is switched on, and the device collects the external PT signal; during device maintenance, the corresponding air switch is disconnected, and the voltage loop of the device is isolated from the external PT.

[0172] As a preferred embodiment of the second embodiment, the normal operating state of the secondary equipment of the present application is specifically:

[0173] Normal operating state of the secondary equipment at the end of the CT series connection loop:

[0174] If the secondary equipment to be inspected is at the end of the CT series connection loop, when it is in the normal operating condition, the current terminal limit shorting handles of the test interface connector are all in the fully inserted state. At this time, the current terminals 1 and 2, 3 and 4, 5 and 6, 7 and 8, 9 and 10, 11 and 12, 13 and 14, 15 and 16 of the test interface connector are conducted; 2 and 4 are disconnected, 6 and 8 are disconnected, 10 and 12 are disconnected, 14 and 16 are disconnected; the external PT access air switch is in the closed state, and the external A, B, C three-phase and N-phase voltages are respectively connected to the voltage acquisition channel of the secondary equipment device through the test interface connector nodes 21, 22, 23, 25.

[0175] The A-phase current flows from the external CT into the test interface connector node 2, then flows through node 1 into the secondary equipment IA, and after passing through the device sampling, it flows out of IA' to the current neutral point I0 on the device side (the external three-phase current outflow ends IA', IB', C' of the device are respectively short-circuited to I0);

[0176] The B-phase current flows from the external CT into the test interface connector node 6, then flows through node 5 into the secondary equipment IB, and after passing through the device sampling, it flows out of IB' to the current neutral point I0 on the device side (the external three-phase current outflow ends IA', IB', C' of the device are respectively short-circuited to I0);

[0177] The C-phase current flows into the test interface connector node 10 from the external CT, then flows through node 9 into the secondary device IC, and after being sampled by the device, it flows out of IC' to the current neutral point I0 on the device side (the three-phase current output terminals IA', IB', and C' outside the device are respectively short-circuited to I0);

[0178] The current neutral point I0 on the device side returns to the neutral point of the external CT via the test interface connector nodes 13 and 14.

[0179] The wiring schematic diagram of the CT end device test interface connector is as Figure 5 shown.

[0180] Normal operating state of the non-terminal secondary device in the CT series connection loop:

[0181] If the secondary device to be inspected is at the non-terminal of the CT series connection loop, when it is in normal operating conditions, the current terminal limit short-circuit handles of the test interface connector are all in the fully inserted state. At this time, the current terminals 1 and 2, 3 and 4, 5 and 6, 7 and 8, 9 and 10, 11 and 12, 13 and 14, 15 and 16 of the test interface connector are conducting; 2 and 4 are disconnected, 6 and 8 are disconnected, 10 and 12 are disconnected, 14 and 16 are disconnected; the external PT access breaker is in the closed state, and the external A, B, C three-phase and N-phase voltages are respectively connected to the voltage acquisition channel of the secondary device through the test interface connector nodes 21, 22, 23, and 25.

[0182] The A-phase current flows into the test interface connector node 2 from the external CT, then flows through node 1 into the secondary device IA, and after being sampled by the device, it flows out of IA' to node 3 of the test interface connector, and then flows out through node 4 to the test interface connector of the next secondary device in the CT series connection loop;

[0183] The B-phase current flows into the test interface connector node 6 from the external CT, then flows through node 5 into the secondary device IB, and after being sampled by the device, it flows out of IB' to node 7 of the test interface connector, and then flows out through node 8 to the test interface connector of the next secondary device in the CT series connection loop;

[0184] The C-phase current flows into the test interface connector node 10 from the external CT, then flows through node 9 into the secondary device IC, and after being sampled by the device, it flows out of IC' to node 11 of the test interface connector, and then flows out through node 12 to the test interface connector of the next secondary device in the CT series connection loop;

[0185] The I0 returned by the next secondary device of the CT series connection circuit passes through node 16 of the test interface connector of this secondary device, then flows into the I0 of this device through node 15, and after being sampled by the device, it flows out as I0' to node 13 of the test interface connector, and then returns to the I0 of the CT through node 14.

[0186] The wiring schematic diagram of the test interface connector of the non-terminal device under the CT series connection scheme is as Figure 7 shown.

[0187] More specifically, the entire detailed process of the AC test of this application is specifically as follows:

[0188] When the secondary device needs to be taken out of operation for maintenance, the external current circuit of this device needs to be short-circuited and then isolated from this device to prevent the test current from entering the normal operation circuit and reverse charging to the primary side or affecting the normal operation of other secondary devices in the same circuit.

[0189] a) Check the wiring diagram of the secondary device cabinet to be inspected, and confirm the current and voltage circuit parameters of the secondary device to be inspected, including the actual conditions such as the number of CT / PT circuits, the connection status of current terminals and voltage terminals, and whether the current circuit is connected in series with other secondary devices.

[0190] b) Check and record the voltage and current data during the operation of the device to be inspected before the formal operation, and make backups or records of various setting parameters;

[0191] c) Take relevant safety measures for the device to be inspected itself (such as measures to withdraw relevant protection functions or protection exits, etc.) to prevent the secondary device from triggering misoperation.

[0192] d) Operate the current terminal of the test interface connector:

[0193] Locate the test interface connector corresponding to the device to be inspected, unscrew the screw and remove the cover.

[0194] First step: Locate the N-phase current terminal of the corresponding channel, and operate the N-phase current (I0) terminal to pull out the limit short-circuit handle to the half-pulled state. Since there are reverse buckles on both sides, the internal pin will be stuck in the half-pulled position; at this time, the CT module circuit is self-sealed (the 14-16 connection terminals are short-circuited), and at this time, the 13-14 and 15-16 connection terminals are still short-circuited and conducting; at this time, the corresponding channel A, B, and C three-phase current values displayed by the secondary device to be inspected should still be in the normal operation state;

[0195] Step 2: Locate the A-phase current terminal of the corresponding channel, operate the A-phase current (IA) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (2-4 terminals are short-circuited), and the 1-2 and 3-4 terminals are still in the short-circuited and conductive state. Confirm that the A-phase current displayed by the secondary device to be inspected is approximately 0 and the current of other secondary devices in the same CT circuit is normal, then operate the limit short-circuit handle to the full pull-out state again, press the reverse buckles on both sides of the limit short-circuit handle inward, and pull the limit short-circuit handle outward completely. At this time, the CT module circuit is self-sealed (2-4 terminals are short-circuited), and the 1-2 and 3-4 terminals are completely disconnected. At this time, the A-phase current channel of the secondary device to be inspected has been decoupled from the system CT.

[0196] Step 3: Locate the B-phase current terminal of the corresponding channel, operate the B-phase current (IB) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (6-8 terminals are short-circuited), and the 5-6 and 7-8 terminals are still in the short-circuited conduction state. Confirm that the B-phase current displayed by the secondary device to be inspected is approximately 0 and the current of other secondary devices in the same CT circuit is normal, then operate the limit short-circuit handle to the full pull-out state again, press the reverse buckles on both sides of the limit short-circuit handle inward, and pull the limit short-circuit handle outward completely. At this time, the CT module circuit is self-sealed (6-8 terminals are short-circuited), and the 5-6 and 7-8 terminals are completely disconnected. At this time, the B-phase current channel of the secondary device to be inspected has been decoupled from the system CT.

[0197] Step 4: Locate the C-phase current terminal of the corresponding channel, operate the C-phase current (IC) terminal to pull out the limit short-circuit handle to the half-pulled state. Due to the reverse buckles on both sides, the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (10-12 terminals are short-circuited), and the 9-10 and 11-12 terminals are still in the short-circuited conduction state. Confirm that the C-phase current displayed by the secondary device to be inspected is approximately 0 and the current of other secondary devices in the same CT circuit is normal, then operate the limit short-circuit handle to the full pull-out state again, press the reverse buckles on both sides of the limit short-circuit handle inward, and pull the limit short-circuit handle outward completely. At this time, the CT module circuit is self-sealed (10-12 terminals are short-circuited), and the 9-10 and 11-12 terminals are completely disconnected. At this time, the C-phase current channel of the secondary device to be inspected has been decoupled from the system CT.

[0198] Step 5: Locate the N-phase current terminal of the corresponding channel, and ensure that the above four steps are completed reliably. Operate the short-circuit limit handle of the N-phase (I0) current terminal of the test interface connector to the fully pulled-out state. Press the undercuts on both sides of the limit short-circuit handle inward with force, and fully pull out the limit short-circuit handle. At this time, the CT module loop is self-sealed (14-16 terminals are short-circuited). At this time, the 13-14 and 15-16 terminals are completely disconnected. At this time, the current channel of the secondary equipment to be tested has been completely decoupled from the system CT.

[0199] e) Review the data of the secondary device to be tested and other secondary devices in the same CT circuit again to confirm that the current of the secondary device to be tested is 0 and that the current data of other secondary devices in the same CT circuit are in normal operation.

[0200] f) Operate the three-phase voltage access circuit breaker and the voltage extraction UX circuit breaker of the secondary equipment to be inspected to the separated state respectively, browse the secondary equipment to be inspected, and confirm that the device voltage display is 0.

[0201] g) Voltage sampling test of the secondary equipment to be tested: insert the three-phase voltage or extraction voltage pins (or connectors) of the relay tester UA, UB, UC, UX, and UN into the voltage sockets of the test interface connector (corresponding to the sockets 21, 22, 23, 24, and 25 on the right side), and increase the voltage sampling channel of the test verification device one by one to verify its reliability.

[0202] h) Current sampling test of the secondary equipment to be tested: insert the three-phase current pins (or connectors) IA, IB, IC, and IN of the relay tester into the current sockets of the test interface connector (corresponding to sockets 1, 5, 9, and 13 on the right side), and increase the current sampling channel reliability of the test verification device one by one.

[0203] i) Complete the functional test and logic verification of the device according to the test items related to the secondary equipment to be tested, and release the coupling relationship between the secondary equipment and the tester.

[0204] j) Operation recovery test interface connector current terminals:

[0205] Step 1: Locate the N-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the N-phase current (I0) terminal to the half-insertion state, the two sides of the buckle are just stuck in the buckle, and the internal pin will be stuck in the half-pull position; at this time, the CT module circuit is self-sealed (14-16 terminals remain short-circuited), and the 13-14 and 15-16 terminals are restored to the short-circuited conduction state; confirm whether the operating status and current value of other secondary equipment in the same CT circuit are normal.

[0206] Step 2: Locate the A-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the A-phase current (IA) terminal to the half-inserted state, the two side buckles are just stuck in the buckle, and the internal pin will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (the 2-4 terminals remain short-circuited), and the 1-2 and 3-4 terminals are restored to the short-circuited conduction state. After confirming that the A-phase current of other secondary devices in the same CT circuit is normal, operate the limit short-circuit handle again to the full insertion state, press the limit short-circuit handle hard until it is fully inserted, and the CT module releases the circuit self-sealing (the 2-4 terminals are disconnected). At this time, the 1-2 and 3-4 terminals are in the conduction state. At this time, the A-phase current channel of the secondary device has returned to normal. Browse the A channel current of the device and confirm that it has returned to normal.

[0207] Step 3: Locate the B-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the B-phase current (IB) terminal to the half-inserted state, the two side buckles are just stuck in the buckle, and the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (the 6-8 terminals remain short-circuited), and the 5-6 and 7-8 terminals are restored to the short-circuited conduction state. After confirming that the B-phase current of other secondary devices in the same CT circuit is normal, operate the limit short-circuit handle again to the full insertion state, press the limit short-circuit handle hard until it is fully inserted, and the CT module releases the circuit self-sealing (the 6-8 terminals are disconnected), and the 5-6 and 7-8 terminals are in the conduction state. At this time, the B-phase current channel of the secondary device returns to normal, browse the B channel current of the device and confirm that it has returned to normal.

[0208] Step 4: Locate the C-phase current terminal of the corresponding channel, operate the limit short-circuit handle to insert the C-phase current (IC) terminal to the half-inserted state, the two side buckles are just stuck in the buckle, and the internal pins will be stuck in the half-pulled position. At this time, the CT module circuit is self-sealed (10-12 terminals remain short-circuited), and the 9-10 and 11-12 terminals are restored to the short-circuited conduction state. After confirming that the B-phase current of other secondary devices in the same CT circuit is normal, operate the limit short-circuit handle again to the full insertion state, press the limit short-circuit handle hard until it is fully inserted, and the CT module releases the circuit self-sealing (10-12 terminals are disconnected). At this time, the 9-10 and 11-12 terminals are in the conduction state, and the C-phase current channel of the secondary device is restored to normal. Browse the C channel current of the device and confirm that it has returned to normal.

[0209] Step 5: Locate the N-phase current terminal of the corresponding channel, and ensure that the above four steps are completed reliably. Operate the limit short-circuit handle to the full insertion state, and press the limit short-circuit handle hard until it is fully inserted. At this time, the CT module releases the loop self-sealing (14-16 terminals are disconnected). At this time, the 13-14 and 15-16 terminals are in the conducting state. At this time, the current channel of the secondary device returns to normal. Browse the three-phase current of the equipment and confirm that it has returned to normal.

[0210] k) Operate the three-phase voltage access breaker and the extraction voltage UX breaker of the secondary equipment to be detected to the closed state respectively, browse the secondary equipment to be detected, and confirm that the device voltage returns to normal.

[0211] l) Restore the settings, protection exits, and various parameters of the secondary equipment to be detected, remove various safety measures, and the secondary equipment to be detected resumes normal operation.

[0212] In this preferred embodiment, the present application realizes the accurate analysis of the current loop and voltage loop of the device to be detected through the configuration information of the preset test interface connector, significantly improving the accuracy and efficiency of the test. Specifically, first, the connection points of the current loop and voltage loop are accurately identified using the terminal layout information of the test interface connector, which ensures a comprehensive understanding of the device connection status. Subsequently, based on the identified connection points, the current loop topology and voltage loop parameters of the device to be detected are obtained, further enhancing the understanding of the device's electrical characteristics. Finally, through the analysis of the current loop topology and voltage loop parameters, the current information of the device and the connection status with the external voltage transformer are determined, providing a solid foundation for subsequent isolation and test operations. This series of steps not only improves the degree of automation of the test, reduces the complexity of manual operations and the risk of misoperations, but also ensures the safety and reliability of the test process, significantly improving the overall efficiency and accuracy of the secondary equipment test in the power system.

[0213] The test module 40 is used to inject a calibration signal into the test interface channel according to the voltage isolation signal and the current isolation signal, and obtain a test validity determination result based on the deviation analysis between the calibration signal and the sampling data of the device to be detected.

[0214] As a preferred embodiment of the second embodiment, the step of injecting a calibration signal into the test interface channel according to the voltage isolation signal and the current isolation signal, and obtaining a test validity determination result based on the deviation analysis between the calibration signal and the sampling data of the device to be detected is specifically as follows:

[0215] Inject a calibration signal into the test interface channel according to the voltage isolation signal, the current isolation signal, and a preset test standard;

[0216] Wherein, the calibration signal includes a preset current and voltage waveform;

[0217] Calculate the deviation value between the calibration signal and the sampling signal of the device to be detected. If the deviation value is less than a preset second threshold, determine that the test is valid.

[0218] In this preferred embodiment, the present application triggers the injection of a calibration signal through a feedback signal and analyzes the deviation between the calibration signal and the sampled data of the device under test based on a preset standard, so as to efficiently and accurately determine the effectiveness of the test. Specifically, first, a calibration signal including a preset current and voltage waveform is injected into the test interface channel according to the feedback signal and the preset test standard to provide a standardized reference for the test. Subsequently, the deviation value between the calibration signal and the device sampling signal is calculated and compared with a preset second threshold. If the deviation value is less than the threshold, the test can be determined to be valid. This process not only ensures the accuracy and reliability of the test results, but also reduces the subjectivity of human judgment through the preset standard and threshold, improves the test efficiency and automation level, and provides a strong guarantee for the rapid and accurate testing of secondary equipment in the power system.

[0219] This device uses four modules to work separately and coordinately to test secondary equipment more accurately. By analyzing the current loop topology and voltage loop parameters of the device under test, the present application can accurately identify the connection status of the current and voltage loops, providing an accurate basis for subsequent isolation operations. Secondly, by using the step-by-step operation of the limit short-circuit handle, the short-circuit of the current transformer side loop and the isolation of the device side loop are realized, avoiding the risk of misoperation caused by frequent wiring disconnection and connection in the traditional method, and ensuring the safe isolation of the current loop. Further, through a preset voltage decoupling control module, the electrical connection between the device under test and the external voltage transformer is cut off, realizing the rapid isolation of the voltage loop and further reducing the risk during the test. Finally, by injecting a calibration signal and analyzing the deviation of the sampled data, the effectiveness of the test is determined in real time, ensuring the accuracy and reliability of the test results. The present application effectively solves the problem that the prior art cannot quickly and accurately test secondary equipment.

[0220] Embodiment 3:

[0221] The embodiment of the present application provides a computer-readable storage medium, which includes a stored computer program. When the computer program runs, it controls the device where the computer-readable storage medium is located to execute the described test method based on a standardized interface;

[0222] Among them, for the above-mentioned test method based on a standardized interface, when it is implemented in the form of a software functional unit and used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, to implement all or part of the processes in the above-mentioned embodiment methods of the present invention, it can also be completed by instructing relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, the steps of the above-mentioned various method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file or some intermediate form, etc. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disc, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electrical carrier signal, telecommunication signal, and software distribution medium, etc.

[0223] Embodiment 4

[0224] The present application provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements any one of the test methods based on a standardized interface as described in Embodiment 1.

[0225] For the above-mentioned specific embodiments, the purpose, technical solutions, and beneficial effects of the present invention have been further described in detail. It should be understood that the above-mentioned are only specific embodiments of the present invention and are not used to limit the protection scope of the present invention. In particular, it is pointed out that for those skilled in the art, any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A testing method based on a standardized interface, characterized in that: include: Analyze the current loop topology and voltage loop parameters of the device to be tested according to the preset configuration information of the test interface connector; Generate a limit adjustment instruction according to the analyzed current loop topology, and trigger a preset limit short-circuit handle according to the instruction to isolate the device to be detected from the external current signal and generate a current isolation signal; According to the analyzed voltage loop parameters and the preset voltage decoupling control module, the electrical connection between the device to be detected and the external voltage transformer is cut off to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal; According to the voltage isolation signal and the current isolation signal, a verification signal is injected into the test interface channel, and the validity determination result of the test is obtained according to the deviation analysis between the verification signal and the sampling data of the device to be tested.

2. The test method based on the standardized interface according to claim 1, characterized in that: The method generates a limit adjustment instruction according to the analyzed current loop topology, and triggers a preset limit short-circuit handle according to the instruction to isolate the device to be detected from the external current signal and generate a current isolation signal, specifically: Generate limit adjustment instructions based on the analyzed current loop topology; Triggering the semi-locking operation of the limit short-circuit handle according to the instruction, so that the current transformer side circuit of the device to be detected is short-circuited and the device side circuit is turned on; Monitor the current parameters of other devices that share the same current transformer as the device to be detected, and if the current parameters remain within a preset first threshold range within a preset time period, trigger the full locking operation of the limit short-circuit handle to completely isolate the device-side circuit of the device to be detected; According to the half-locking and full-locking operations of the position-limiting short-circuiting handle, the device to be detected is isolated from the external current signal and a current isolation signal is generated.

3. The test method based on the standardized interface according to claim 1, characterized in that: According to the configuration information of the preset test interface connector, the current loop topology and voltage loop parameters of the device to be detected are analyzed, specifically: Identifying connection points of a current loop and a voltage loop of a device to be tested according to the terminal layout information of the test interface connector; According to the connection points of the current loop and the voltage loop, obtaining the current loop topology and the voltage loop parameters of the device to be detected; The current loop topology and voltage loop parameters are analyzed to determine current information of the device to be detected and a connection state between the device to be detected and an external voltage transformer.

4. The test method based on the standardized interface according to claim 1, characterized in that: According to the analyzed voltage loop parameters and the preset voltage decoupling control module, the electrical connection between the device to be detected and the external voltage transformer is cut off to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal, specifically: According to the analyzed voltage loop parameters, the position of the voltage circuit breaker of the test interface connector is determined; wherein the voltage circuit breaker is connected in series between the device to be detected and the voltage circuit breaker of the external voltage transformer; A disconnection control signal is sent to the voltage circuit breaker through a preset voltage decoupling control module, so that the voltage circuit breaker is switched from a closed state to a disconnected state; After the voltage circuit breaker is switched to the disconnected state, it is confirmed that the electrical connection between the device to be detected and the external voltage transformer has been cut off, so that the device to be detected is isolated from the external voltage signal and a voltage isolation signal is generated.

5. The test method based on the standardized interface according to claim 1, characterized in that: According to the voltage isolation signal and the current isolation signal, a verification signal is injected into the test interface channel, and the validity determination result of the test is obtained according to the deviation analysis between the verification signal and the sampling data of the device to be tested, which is specifically: Injecting a verification signal into the test interface channel according to the voltage isolation signal, the current isolation signal and a preset test standard; Wherein, the verification signal includes preset current and voltage waveforms; The deviation value between the verification signal and the sampling signal of the device to be detected is calculated, and if the deviation value is less than a preset second threshold value, it is determined that the test is valid.

6. A test device based on a standardized interface, characterized in that: include: Analysis module, current isolation module, voltage isolation module and test module; The parsing module is used to parse the current loop topology and voltage loop parameters of the device to be tested according to the preset configuration information of the test interface connector; The current isolation module is used to generate a limit adjustment instruction according to the analyzed current loop topology, and trigger a preset limit short-circuit handle according to the instruction, so as to isolate the device to be detected from the external current signal and generate a current isolation signal; The voltage isolation module is used to cut off the electrical connection between the device to be detected and the external voltage transformer according to the analyzed voltage loop parameters and the preset voltage decoupling control module, so as to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal; The test module is used to inject a verification signal into the test interface channel according to the voltage isolation signal and the current isolation signal, and obtain a determination result of the test effectiveness according to a deviation analysis between the verification signal and the sampling data of the device to be tested.

7. The test device based on the standardized interface according to claim 6, characterized in that: The current isolation module is used to generate a limit adjustment instruction according to the analyzed current loop topology, and trigger a preset limit short-circuit handle according to the instruction to isolate the device to be detected from the external current signal and generate a current isolation signal, specifically: Generate limit adjustment instructions based on the analyzed current loop topology; Triggering the semi-locking operation of the limit short-circuit handle according to the instruction, so that the current transformer side circuit of the device to be detected is short-circuited and the device side circuit is turned on; Monitor the current parameters of other devices that share the same current transformer as the device to be detected, and if the current parameters remain within a preset first threshold range within a preset time period, trigger the full locking operation of the limit short-circuit handle to completely isolate the device-side circuit of the device to be detected; According to the half-locking and full-locking operations of the position-limiting short-circuiting handle, the device to be detected is isolated from the external current signal and a current isolation signal is generated.

8. The test device based on the standardized interface according to claim 6, characterized in that: The voltage isolation module is used to cut off the electrical connection between the device to be detected and the external voltage transformer according to the analyzed voltage loop parameters and the preset voltage decoupling control module, so as to isolate the device to be detected from the external voltage signal and generate a voltage isolation signal, specifically: According to the analyzed voltage loop parameters, the position of the voltage circuit breaker of the test interface connector is determined; wherein the voltage circuit breaker is connected in series between the device to be detected and the voltage circuit breaker of the external voltage transformer; A disconnection control signal is sent to the voltage circuit breaker through a preset voltage decoupling control module, so that the voltage circuit breaker is switched from a closed state to a disconnected state; After the voltage circuit breaker is switched to the disconnected state, it is confirmed that the electrical connection between the device to be detected and the external voltage transformer has been cut off, so that the device to be detected is isolated from the external voltage signal and a voltage isolation signal is generated.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored computer program, wherein when the computer program is executed, the device where the computer-readable storage medium is located is controlled to execute the standardized interface-based testing method according to any one of claims 1 to 5.

10. A terminal device, characterized in that: The system comprises a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor implements the test method based on a standardized interface as claimed in any one of claims 1 to 5 when executing the computer program.

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