A level conversion circuit test system and method based on adaptive power management

Abstract

A level conversion circuit test system and method based on adaptive power management, which relates to the technical field of circuit testing, obtains the test content of the level conversion circuits to be tested in the current batch, and performs static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content; constructs an extreme test classification model, conducts extreme test analysis on the level conversion circuits to be tested that pass the dynamic test, and classifies the level conversion circuits to be tested into qualified level conversion circuits or predicted unqualified level conversion circuits; conducts extreme testing on the predicted unqualified level conversion circuits, and classifies the predicted unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results, significantly improving the accuracy and efficiency of level conversion circuit testing.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit testing, and in particular, to a level conversion circuit testing system and method based on adaptive power management. Background Art

[0002] In electronic devices, level conversion circuits are used to convert signals with different level standards to meet the communication and collaborative work requirements between different circuit modules. With the continuous development of electronic technology, the performance requirements for level conversion circuits are also getting higher and higher, including aspects such as conversion accuracy, speed, stability, and power consumption. At the same time, in order to improve the energy utilization efficiency of electronic devices, adaptive power management technology has been widely applied.

[0003] However, the existing level conversion circuit testing methods have certain limitations. On the one hand, traditional testing methods often do not fully consider the impact of adaptive power management on the performance of level conversion circuits, and cannot comprehensively and accurately evaluate the performance of the circuits in actual operation. On the other hand, the existing testing methods also have deficiencies in terms of testing efficiency, testing cost, and adaptability to complex circuits, and it is difficult to meet the requirements of the rapid development of modern electronic devices. Summary of the Invention

[0004] In order to solve the above technical problems, the purpose of the present invention is to provide a level conversion circuit testing method based on adaptive power management, including the following steps:

[0005] Step s1: Obtain the test content of the level conversion circuits to be tested in the current batch, and perform static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content;

[0006] Step s2: Construct a limit test classification model, perform limit test analysis on the level conversion circuits to be tested that pass the dynamic test, and divide the level conversion circuits to be tested into qualified level conversion circuits or estimated unqualified level conversion circuits;

[0007] Step s3: Perform limit testing on the estimated unqualified level conversion circuits, and divide the estimated unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the limit test results.

[0008] Further, the process of obtaining the test content of the level conversion circuits to be tested in the current batch and performing static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content includes:

[0009] Obtain the functional characteristics and application scenarios of the level conversion circuit to be tested in the current batch. Use data retrieval to obtain the test content of the level conversion circuit to be tested according to the functional characteristics and application scenarios. The test content includes static test content, dynamic test content, and extreme test content. Construct a static test content sequence, a dynamic test content sequence, and an extreme test content sequence according to the test content;

[0010] Test each level conversion circuit to be tested in the current batch according to the static test content sequence and the dynamic test content sequence.

[0011] Furthermore, the process of testing each level conversion circuit to be tested in the current batch according to the static test content sequence includes:

[0012] Construct a test environment, connect the level conversion circuit to be tested to an adaptive power management module, an oscilloscope, a logic analyzer, and a multimeter. This includes correctly connecting the level conversion circuit to be tested to a power module with adaptive power management function, an oscilloscope, a logic analyzer, and a multimeter according to the circuit schematic diagram. Connect the oscilloscope to measure the signal waveform, the logic analyzer to analyze the digital signal timing, and the multimeter to measure parameters such as voltage and current. Calibrate the oscilloscope, logic analyzer, and multimeter to ensure the measurement accuracy. Obtain the test indicators of the level conversion circuit to be tested and the corresponding level threshold range according to the static test content sequence. The test indicators include the power supply voltage output by the adaptive power management module to the level conversion circuit and the fixed level signal input to the level conversion circuit to be tested. Test the level conversion circuit according to the test indicators to obtain the output level of the level conversion circuit to be tested. Compare the output level of the level conversion circuit to be tested with the corresponding level threshold range. If the output level is within the level threshold range, test the level conversion circuit to be tested according to the dynamic test content sequence. If the output level is not within the level threshold range, mark the level conversion circuit to be tested as a non-conforming level conversion circuit.

[0013] Furthermore, the process of testing the level conversion circuit to be tested according to the dynamic test content sequence includes:

[0014] Obtain the conventional threshold interval of the dynamic test indexes of the level conversion circuit to be tested according to the dynamic test content stream program sequence. The dynamic test indexes include the frequency and amplitude of the input signal. Set input signals with different frequencies and amplitudes according to the conventional threshold interval of the dynamic test indexes to conduct dynamic tests on the level conversion circuit to be tested. The process of conducting dynamic tests includes: determining the frequency range and amplitude range of the input signal based on the design indexes and expected application scenarios of the level conversion circuit. For example, for a level conversion circuit used for audio signal processing, select different frequency signals covering the audio frequency range (20 Hz - 20 kHz), such as 20 Hz, 1 kHz, 10 kHz, 20 kHz, etc., and use a signal generator to generate periodic signals of these frequencies, such as sine waves, square waves, or triangular waves, etc., in order to comprehensively test the response of the circuit at different frequencies; at the same time, set the amplitude of the input signal. Start from a lower amplitude and gradually increase it to the maximum amplitude value specified by the design. Observe the performance changes of the level conversion circuit. For example, first set the amplitude of the input signal to 0.1 V, and then increase it to 0.5 V, 1 V, 2 V, etc. successively. When inputting signals with different frequencies and amplitudes, observe the waveforms of the input and output signals in real time through an oscilloscope, obtain the digital signal timing through a logic analyzer, obtain the output waveforms and digital signal timing of the level conversion circuit to be tested under different frequency and amplitude conditions, extract the features of the output waveforms and digital signal timing under different frequency and amplitude conditions, obtain waveform features and digital features. The waveform features include waveform amplitude and waveform frequency, and the digital features include signal delay, setup time, hold time, and clock jitter;

[0015] Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the input signal under different frequency and amplitude conditions, compare the waveform features and digital features under different frequency and amplitude conditions with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the first cumulative time when the waveform features are within the corresponding waveform feature threshold interval and the second cumulative time when the digital features are within the corresponding digital feature threshold interval, preset the cumulative time threshold, and compare the first cumulative time and the second cumulative time with the cumulative time threshold;

[0016] If both the first cumulative time and the second cumulative time under different frequency and amplitude conditions are less than or equal to the cumulative time threshold, then conduct the limit test analysis of the level conversion circuit to be tested;

[0017] If there is a first cumulative time or a second cumulative time greater than the cumulative time threshold, then mark the level conversion circuit to be tested as a non - qualified level conversion circuit.

[0018] Further, the process of constructing a limit test classification model for performing limit test analysis on the to-be-tested level conversion circuit that has passed the dynamic test and classifying the to-be-tested level conversion circuit into a qualified level conversion circuit or a predicted unqualified level conversion circuit includes:

[0019] Construct a limit test classification model based on deep learning. Input the waveform features and digital features of the to-be-tested level conversion circuit into the limit test classification model. According to the limit test classification model, classify the to-be-tested level conversion circuit into a qualified level conversion circuit or a predicted unqualified level conversion circuit. If the to-be-tested level conversion circuit is classified as a predicted unqualified level conversion circuit, perform a limit test.

[0020] Further, the process of constructing a limit test classification model based on deep learning includes:

[0021] Obtain the historical dynamic test records marked as qualified level conversion circuits in the limit test and the historical dynamic test records marked as unqualified level conversion circuits in the limit test. Use the historical dynamic test records of qualified level conversion circuits and the historical dynamic test records of unqualified level conversion circuits as the training set and the test set. Input the training set into the limit test classification model for training until the loss function is trained stably, and save the model parameters. Test the limit test classification model with the test set until it meets the preset requirements, and output the limit test classification model.

[0022] Constructing a limit test classification model based on deep learning is a complex process that involves multiple steps such as model selection, training, validation, and testing. The following is a detailed supplementary description of this process:

[0023] Considering the characteristics of waveform features and digital features, the present invention selects a convolutional neural network (CNN) suitable for time series analysis as the deep learning architecture. After determining the model architecture, the next step is to define the loss function. In the present invention, since the goal is to distinguish between qualified and unqualified level conversion circuits, the binary cross-entropy loss is selected as the optimization target. Subsequently, the prepared training set is input into the selected deep learning model for training. During the training process, the weights are continuously updated through the backpropagation algorithm, making the loss function gradually decrease until it reaches a stable state. During this period, techniques such as early stopping are used to avoid overfitting. In addition to the basic training process, the various parameters of the model are tuned through grid search, and the parameters include the learning rate, batch size, regularization coefficient, etc.

[0024] After the model training is completed and the parameters are adjusted, the final evaluation is carried out through the test set to obtain the evaluation results of the model. The evaluation results include classification metrics such as accuracy, recall rate, F1 score, etc. According to the evaluation results on the test set, it is judged whether the model meets the expected standard. If the requirements are met, the model parameters are saved and deployment is prepared; if not, it is necessary to return to a previous stage to re-examine issues such as data quality, model structure, or training strategy.

[0025] Further, the process of classifying the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the extreme test results of the estimated unqualified level conversion circuit includes:

[0026] Obtain the extreme values of the dynamic test metrics, perform extreme tests on the estimated unqualified level conversion circuit according to the extreme values of the dynamic test metrics, adjust the input signal frequency to the extreme value and the amplitude to the extreme value, observe the performance changes of the level conversion circuit, obtain the output waveform and digital signal timing of the estimated unqualified level conversion circuit, extract features from the output waveform and digital signal timing, and obtain waveform features and digital features;

[0027] Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the input signal under the condition that the dynamic test metric is at the extreme value, compare the waveform features and digital features with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the third cumulative time when the waveform feature is within the corresponding waveform feature threshold interval and the fourth cumulative time when the digital feature is within the corresponding digital feature threshold interval, preset the cumulative time threshold, and compare the third cumulative time and the fourth cumulative time with the cumulative time threshold;

[0028] If both the third cumulative time and the fourth cumulative time are less than or equal to the cumulative time threshold, mark the estimated unqualified level conversion circuit as a qualified level conversion circuit, and retrain the extreme test classification model according to the dynamic test records of the qualified level conversion circuit. The dynamic test records include waveform features and digital features in the dynamic test;

[0029] If there is a third cumulative time or a fourth cumulative time greater than the cumulative time threshold, mark the estimated unqualified level conversion circuit as an unqualified level conversion circuit.

[0030] A level conversion circuit test system based on adaptive power management includes a monitoring center, and the monitoring center is communicatively connected with a multi-state test module, a test analysis module, and an extreme test module;

[0031] The polymorphic test module is used to obtain the test content of the level conversion circuits to be tested in the current batch, and perform static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content;

[0032] The test analysis module is used to construct an extreme test classification model, perform extreme test analysis on the level conversion circuits to be tested that pass the dynamic test, and classify the level conversion circuits to be tested into qualified level conversion circuits or predicted unqualified level conversion circuits;

[0033] The extreme test module is used to perform extreme tests on the predicted unqualified level conversion circuits, and classify the predicted unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results.

[0034] Compared with the prior art, the beneficial effects of the present invention are:

[0035] 1. By obtaining the functional characteristics and application scenarios of the level conversion circuits to be tested to determine the test content, the traditional unified test mode is changed. Different level conversion circuits have different performance requirements in different application scenarios. This method can formulate test content according to the specific situation of each batch of circuits, avoiding test omissions for some special function circuits or over-testing for general circuits, and improving the accuracy and efficiency of testing.

[0036] 2. Adopt a phased test process combining static test, dynamic test and extreme test. The static test ensures the normal function of the circuit in the basic state, the dynamic test simulates the signal change situation of the circuit in actual work, and the extreme test examines the performance of the circuit under extreme conditions. This comprehensive test process can evaluate the level conversion circuit from multiple angles, greatly increasing the probability of discovering potential problems and ensuring the product quality.

[0037] 3. Constructing an extreme test classification model to pre-classify the circuits that pass the dynamic test can quickly screen out the circuits that may have problems in a large number of circuits to be tested for key testing. This not only reduces the unnecessary workload of extreme testing, but also focuses resources on the circuits that may be unqualified, improving the test efficiency. At the same time, using deep learning technology to construct the classification model can learn and optimize according to historical test data, and the classification accuracy will continuously improve with the continuous accumulation of test data.

[0038] 4. In dynamic testing and extreme testing, not only basic characteristics such as the amplitude and frequency of the output waveform are concerned, but also characteristics such as signal delay, setup time, hold time, and clock jitter in the digital signal timing are extracted for comprehensive evaluation. These characteristics can more comprehensively reflect the performance of the circuit. Especially in high-speed digital circuits, the accuracy of digital signal timing is crucial for the normal operation of the circuit. Through multi-characteristic comprehensive evaluation, it is possible to more accurately determine whether the performance of the circuit meets the requirements.

[0039] 5. When the results of extreme testing are inconsistent with the predicted results of the classification model, the extreme testing classification model is retrained based on the dynamic test records of qualified circuits. This feedback mechanism enables the classification model to continuously learn new data and characteristics, adapt to the characteristics of different batches of circuits, and improve the accuracy and adaptability of the model. As the testing continues, the model will become more and more intelligent and be able to classify and screen circuits more accurately. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 It is a schematic diagram of a method for testing a level conversion circuit based on adaptive power management according to an embodiment of the present application.

[0041] Figure 2 It is a schematic diagram of a system for testing a level conversion circuit based on adaptive power management according to an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0042] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0043] As Figure 1 shown, a method for testing a level conversion circuit based on adaptive power management includes the following steps:

[0044] Step S1: Obtain the test content of the level conversion circuits to be tested in the current batch, and perform static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content;

[0045] Step S2: Construct an extreme testing classification model, perform extreme testing analysis on the level conversion circuits to be tested that pass the dynamic testing, and classify the level conversion circuits to be tested into qualified level conversion circuits or predicted unqualified level conversion circuits;

[0046] Step s3: Perform a limit test on the estimated unqualified level conversion circuit, and classify the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the limit test results.

[0047] It should be further noted that in the specific implementation process, the process of obtaining the test content of the level conversion circuits to be tested in the current batch and performing static and dynamic tests on each level conversion circuit to be tested in the current batch includes:

[0048] Obtain the functional characteristics and application scenarios of the level conversion circuits to be tested in the current batch, and use data retrieval to obtain the test content of the level conversion circuits to be tested according to the functional characteristics and application scenarios. The test content includes static test content, dynamic test content, and limit test content. Construct a static test content flow program sequence, a dynamic test content flow program sequence, and a limit test content flow program sequence according to the test content;

[0049] Test each level conversion circuit to be tested in the current batch according to the static test content flow program sequence and the dynamic test content flow program sequence.

[0050] It should be further noted that in the specific implementation process, the process of testing each level conversion circuit to be tested in the current batch according to the static test content flow program sequence includes:

[0051] Construct a test environment, connect the level conversion circuit to be tested to an adaptive power management module, an oscilloscope, a logic analyzer, and a multimeter, including correctly connecting the level conversion circuit to be tested to a power module with adaptive power management function, an oscilloscope, a logic analyzer, and a multimeter according to the circuit schematic diagram. Connect the oscilloscope to measure the signal waveform, the logic analyzer to analyze the digital signal timing, and the multimeter to measure parameters such as voltage and current. Calibrate the oscilloscope, logic analyzer, and multimeter to ensure the measurement accuracy. Obtain the test indicators of the level conversion circuit to be tested and the corresponding level threshold range according to the static test content flow program sequence. The test indicators include the power supply voltage output by the adaptive power management module to the level conversion circuit and the fixed level signal input to the level conversion circuit to be tested. Test the level conversion circuit according to the test indicators, obtain the output level of the level conversion circuit to be tested, and compare the output level of the level conversion circuit to be tested with the corresponding level threshold range. If the output level is within the level threshold range, test the level conversion circuit to be tested according to the dynamic test content flow program sequence. If the output level is not within the level threshold range, mark the level conversion circuit to be tested as an unqualified level conversion circuit.

[0052] It should be further noted that in the specific implementation process, the process of testing the level conversion circuit to be tested according to the dynamic test content stream program sequence includes:

[0053] Obtain the conventional threshold interval of the dynamic test indexes of the level conversion circuit to be tested according to the dynamic test content stream program sequence. The dynamic test indexes include the frequency and amplitude of the input signal. Set input signals with different frequencies and amplitudes according to the conventional threshold interval of the dynamic test indexes to conduct dynamic tests on the level conversion circuit to be tested. The process of conducting dynamic tests includes: determining the frequency range and amplitude range of the input signal according to the design indexes and expected application scenarios of the level conversion circuit. For example, for a level conversion circuit used for audio signal processing, select different frequency signals covering the audio frequency range (20 Hz - 20 kHz), such as 20 Hz, 1 kHz, 10 kHz, 20 kHz, etc., and use a signal generator to generate periodic signals of these frequencies, such as sine waves, square waves, or triangular waves, etc., in order to comprehensively test the response of the circuit at different frequencies; at the same time, set the amplitude of the input signal. Start from a lower amplitude and gradually increase it to the maximum amplitude value specified by the design. Observe the performance changes of the level conversion circuit. For example, first set the input signal amplitude to 0.1 V, and then increase it to 0.5 V, 1 V, 2 V, etc. successively. When inputting signals with different frequencies and amplitudes, observe the waveforms of the input and output signals in real time through an oscilloscope, obtain the digital signal timing through a logic analyzer, obtain the output waveforms and digital signal timing of the level conversion circuit to be tested under different frequency and amplitude conditions, extract the characteristics of the output waveforms and digital signal timing under different frequency and amplitude conditions, obtain waveform characteristics and digital characteristics. The waveform characteristics include waveform amplitude and waveform frequency, and the digital characteristics include signal delay, setup time, hold time, and clock jitter;

[0054] Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the input signal under different frequency and amplitude conditions, compare the waveform characteristics and digital characteristics under different frequency and amplitude conditions with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the first cumulative time when the waveform characteristics are within the corresponding waveform feature threshold interval and the second cumulative time when the digital characteristics are within the corresponding digital feature threshold interval, preset a cumulative time threshold, and compare the first cumulative time and the second cumulative time with the cumulative time threshold;

[0055] If the first cumulative time and the second cumulative time under different frequency and amplitude conditions are both less than or equal to the cumulative time threshold, then conduct limit test analysis on the level conversion circuit to be tested;

[0056] If there is a first cumulative time or a second cumulative time greater than the cumulative time threshold, then mark the level conversion circuit to be tested as a non - qualified level conversion circuit.

[0057] It should be further noted that in the specific implementation process, the process of constructing the extreme test classification model, performing extreme test analysis on the to-be-tested level conversion circuit that has passed the dynamic test, and classifying the to-be-tested level conversion circuit into a qualified level conversion circuit or a predicted unqualified level conversion circuit includes:

[0058] Construct an extreme test classification model based on deep learning, input the waveform features and digital features of the to-be-tested level conversion circuit into the extreme test classification model, classify the to-be-tested level conversion circuit into a qualified level conversion circuit or a predicted unqualified level conversion circuit according to the extreme test classification model. If the to-be-tested level conversion circuit is classified as a predicted unqualified level conversion circuit, then perform an extreme test.

[0059] It should be further noted that in the specific implementation process, the process of constructing the extreme test classification model based on deep learning includes:

[0060] Obtain the historical dynamic test records marked as qualified level conversion circuits in the extreme test and the historical dynamic test records marked as unqualified level conversion circuits in the extreme test. Use the historical dynamic test records of qualified level conversion circuits and the historical dynamic test records of unqualified level conversion circuits as the training set and the test set. Input the training set into the extreme test classification model for training until the loss function is trained stably, and save the model parameters. Test the extreme test classification model through the test set until it meets the preset requirements, and output the extreme test classification model.

[0061] Constructing an extreme test classification model based on deep learning is a complex process that involves multiple steps such as model selection, training, validation, and testing. The following is a detailed supplementary description of this process:

[0062] Considering the characteristics of waveform features and digital features, the present invention selects a convolutional neural network (CNN) suitable for time series analysis as the deep learning architecture. After determining the model architecture, the next step is to define the loss function. In the present invention, since the goal is to distinguish between qualified and unqualified level conversion circuits, the binary cross-entropy loss is selected as the optimization target. Subsequently, the prepared training set is input into the selected deep learning model to start training. During the training process, the weights are continuously updated through the backpropagation algorithm, making the loss function gradually decrease until it reaches a stable state. During this period, techniques such as early stopping are used to avoid overfitting. In addition to the basic training process, the various parameters of the model are tuned through grid search, and the parameters include the learning rate, batch size, regularization coefficient, etc.

[0063] After the model training is completed and the parameters are adjusted, the final evaluation is carried out through the test set to obtain the evaluation results of the model. The evaluation results include classification metrics such as accuracy, recall rate, and F1 score. According to the evaluation results on the test set, it is judged whether the model meets the expected standards. If the requirements are met, the model parameters are saved and preparation for deployment is made; if not, it is necessary to return to a previous stage to re-examine issues such as data quality, model structure, or training strategy.

[0064] It should be further noted that in the specific implementation process, the process of classifying the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the extreme test results of the estimated unqualified level conversion circuit includes:

[0065] Obtain the extreme values of the dynamic test metrics, perform extreme tests on the estimated unqualified level conversion circuit according to the extreme values of the dynamic test metrics, adjust the input signal frequency to the extreme value and the amplitude to the extreme value, observe the performance changes of the level conversion circuit, obtain the output waveform and digital signal timing of the estimated unqualified level conversion circuit, extract features from the output waveform and digital signal timing, and obtain waveform features and digital features;

[0066] Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the preset input signal under the condition that the dynamic test metric is the extreme value. Compare the waveform features and digital features with the corresponding waveform feature threshold interval and digital feature threshold interval respectively to obtain the third cumulative time when the waveform features are within the corresponding waveform feature threshold interval and the fourth cumulative time when the digital features are within the corresponding digital feature threshold interval. Preset the cumulative time threshold, and compare the third cumulative time and the fourth cumulative time with the cumulative time threshold;

[0067] If both the third cumulative time and the fourth cumulative time are less than or equal to the cumulative time threshold, mark the estimated unqualified level conversion circuit as a qualified level conversion circuit, and retrain the extreme test classification model according to the dynamic test records of the qualified level conversion circuit. The dynamic test records include waveform features and digital features in the dynamic test;

[0068] If there is a third cumulative time or a fourth cumulative time greater than the cumulative time threshold, mark the estimated unqualified level conversion circuit as an unqualified level conversion circuit.

[0069] As Figure 2 shown, a level conversion circuit test system based on adaptive power management includes a monitoring center, and the monitoring center is communicatively connected with a multi-state test module, a test analysis module, and an extreme test module;

[0070] The polymorphic test module is used to obtain the test content of the level conversion circuits to be tested in the current batch, and perform static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content;

[0071] The test analysis module is used to construct an extreme test classification model, perform extreme test analysis on the level conversion circuits to be tested that pass the dynamic test, and classify the level conversion circuits to be tested into qualified level conversion circuits or predicted unqualified level conversion circuits;

[0072] The extreme test module is used to perform extreme tests on the predicted unqualified level conversion circuits, and classify the predicted unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results.

[0073] The above embodiments are only used to illustrate the technical method of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical method of the present invention can be modified or equivalently replaced without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A test method for a level conversion circuit based on adaptive power management, characterized in that, It includes the following steps: Step s1: Obtain the test content of the level conversion circuits to be tested in the current batch, and perform static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content; Step s2: Construct an extreme test classification model, perform extreme test analysis on the level conversion circuits to be tested that pass the dynamic test, and classify the level conversion circuits to be tested into qualified level conversion circuits or predicted unqualified level conversion circuits; Step s3: Perform extreme tests on the predicted unqualified level conversion circuits, and classify the predicted unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results; The process of performing extreme tests on the predicted unqualified level conversion circuits includes: Obtain the extreme values of the dynamic test indicators, perform extreme tests on the predicted unqualified level conversion circuits according to the extreme values of the dynamic test indicators, and obtain waveform characteristics and digital characteristics; Preset the waveform characteristic threshold range and the digital characteristic threshold range corresponding to the input signal under the condition that the dynamic test indicator is at the extreme value, obtain the third cumulative time when the waveform characteristic is within the corresponding waveform characteristic threshold range and the fourth cumulative time when the digital characteristic is within the corresponding digital characteristic threshold range. If both the third cumulative time and the fourth cumulative time are less than or equal to the cumulative time threshold, mark the predicted unqualified level conversion circuit as a qualified level conversion circuit, and retrain the extreme test classification model according to the dynamic test records of the qualified level conversion circuit; If there is a third cumulative time or a fourth cumulative time greater than the cumulative time threshold, mark the predicted unqualified level conversion circuit as an unqualified level conversion circuit.

2. The method for testing a level conversion circuit based on adaptive power management according to claim 1, wherein The process of obtaining the test content of the level conversion circuits to be tested in the current batch includes: Obtain the functional characteristics and application scenarios of the level conversion circuits to be tested in the current batch, and use data retrieval to obtain the test content of the level conversion circuits to be tested according to the functional characteristics and application scenarios. The test content includes static test content, dynamic test content, and extreme test content. Construct a static test content sequence, a dynamic test content sequence, and an extreme test content sequence according to the test content; Test each level conversion circuit to be tested in the current batch according to the static test content sequence and the dynamic test content sequence.

3. A method for testing a level conversion circuit based on adaptive power management according to claim 2, characterized in that, The process of testing each level conversion circuit to be tested in the current batch according to the static test content sequence includes: Construct a test environment, obtain the test indicators and the corresponding level threshold ranges according to the static test content sequence, test the level conversion circuit according to the test indicators, and obtain the output level of the level conversion circuit to be tested. If the output level is within the level threshold range, test the level conversion circuit to be tested according to the dynamic test content sequence, otherwise mark the level conversion circuit to be tested as an unqualified level conversion circuit.

4. A method for testing a level conversion circuit based on adaptive power management according to claim 3, characterized in that, The process of testing the level conversion circuit to be tested according to the dynamic test content sequence includes: Obtain the conventional threshold interval of dynamic test metrics according to the dynamic test content stream program sequence. Set input signals with different frequencies and amplitudes for dynamic testing according to the conventional threshold interval of dynamic test metrics. Obtain the output waveforms and digital signal timings of the level conversion circuit under test under different frequencies and amplitudes. Extract features from the output waveforms and digital signal timings to obtain waveform features and digital features; Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the input signal under different frequencies and amplitudes. Obtain the first cumulative time when the waveform features are within the corresponding waveform feature threshold interval and the second cumulative time when the digital features are within the corresponding digital feature threshold interval under different frequencies and amplitudes. Preset the cumulative time threshold. If both the first cumulative time and the second cumulative time under different frequencies and amplitudes are less than or equal to the cumulative time threshold, perform the limit test analysis of the level conversion circuit under test; If there is a first cumulative time or a second cumulative time greater than the cumulative time threshold, mark the level conversion circuit under test as a non-conforming level conversion circuit.

5. A method for testing a level conversion circuit based on adaptive power management according to claim 4, characterized in that The process of performing the limit test analysis on the level conversion circuit under test that passes the dynamic test includes: Construct a limit test classification model based on deep learning. Input the waveform features and digital features of the level conversion circuit under test into the limit test classification model. According to the limit test classification model, classify the level conversion circuit under test into a qualified level conversion circuit or a pre-estimated non-conforming level conversion circuit. If the level conversion circuit under test is classified as a pre-estimated non-conforming level conversion circuit, perform the limit test.

6. The test method for a level conversion circuit based on adaptive power management according to claim 5, wherein The process of constructing a limit test classification model based on deep learning includes: Obtain the historical dynamic test records marked as qualified level conversion circuits in the limit test and the historical dynamic test records marked as non-conforming level conversion circuits in the limit test. Use the historical dynamic test records of qualified level conversion circuits and the historical dynamic test records of non-conforming level conversion circuits as training data, and output the completed trained limit test classification model.

7. A level conversion circuit test system based on adaptive power management, specifically applied to a level conversion circuit test method based on adaptive power management according to any one of claims 1 to 6, characterized in that, It includes a monitoring center, and the monitoring center is communicatively connected to a multi-state test module, a test analysis module, and a limit test module; The multi-state test module is used to obtain the test content of the level conversion circuits under test in the current batch, and perform static tests and dynamic tests on each level conversion circuit under test in the current batch according to the test content; The test analysis module is used to construct a limit test classification model, perform limit test analysis on the level conversion circuits under test that pass the dynamic test, and classify the level conversion circuits under test into qualified level conversion circuits or pre-estimated non-conforming level conversion circuits; The limit test module is used to perform limit tests on the pre-estimated non-conforming level conversion circuits, and classify the pre-estimated non-conforming level conversion circuits into qualified level conversion circuits and non-conforming level conversion circuits according to the limit test results.

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