Inspection in module or module precursor manufacturing process

Abstract

An inspection device for layer material has a first layer conveyor and a first drive device to pick up a single anode or cathode layer from a first transfer point by a pick-up device and to send it to a first transfer point. The first layer turner transfers a single anode or cathode layer from the picker to the stacking table at a first transfer point. The driving device aligns the pick-up device and the stacking table to each other according to a signal emitted by processing the first or second image capture. Wherein the first image collector is aligned with the first region of the first layer turner between the first transfer point and the first transfer point, so that the first image capture is performed when the pick-up device of the first layer turner passes through the first image collector. The second image collector is aligned with a second region of the first tier turner between the first transfer point and the first transfer point for a second image capture as the pickup of the first tier turner passes through the second image collector. In this variant, the stacking table is arranged and designed to pick up individual anode or cathode layers at a first handover point to form a stack of stacks.

Description

[0001] Background

[0002] The present disclosure discloses an inspection performed during the manufacturing process of a module or a module precursor. These modules or module precursors can be, for example, a layer configuration including a layer material, a configuration for a fuel cell or a battery cell, or a component for manufacturing these configurations. The layer material can include an electrode layer designed as an anode layer or a cathode layer. This inspection is disclosed as a method and a device. For details, see the claims. The specification also contains relevant information about the inspection structure and operation mode, as well as about device variants and method variants. Prior art

[0003] WO 2021 171 946A1 relates to a stacking table on which a laminate stack composed of a release film and an electrode layer is stacked. A transfer unit is used to transfer the release film and the electrode layer and place them on the stacking table. The above test device tests the position of the electrode layer in the laminate stack released by the transfer unit.

[0004] JP 2014 078464A relates to a laminator for alternately laminating a rectangular thin film as a positive electrode and a rectangular thin film as a negative electrode on a rectangular release film to manufacture a laminate.

[0005] WO 2021 171 946A1 relates to a test device for testing the position of an electrode layer in a laminate material from the side of the release film, in which the release film and the electrode layer are bonded together by an adhesive. An infrared radiator irradiates the laminate material with infrared light from the side of the release film. An infrared-sensitive camera records the infrared light that penetrates the release film and is reflected by the electrode layer. A detection unit detects the position of the electrode layer based on the image recorded by the camera.

[0006] WO 2020 130 184A1 describes the manufacturing of a battery stack of a secondary battery. The stacking table can move back and forth. A separator supply unit is positioned on the stacking table to supply a separator to the stacking table. A first multi-head is provided on one side of the stacking table, which stacks the electrode layers layer by layer by placing the electrode layers on the stacking table that moves to one side. A second multi-head is provided on the other side of the lamination table, which stacks the electrode layers on the stacking table that moves to the other side.

[0007] Technical Problem

[0008] Based on this, the present invention aims to provide an economical and durable stacking unit configuration and an operation mode for laminating stack materials at a high processing speed, so as to manufacture modules or module precursors, such as fuel cells or battery cells including layer materials, with high precision.

[0009] Proposed Solution

[0010] To solve this problem, the present invention proposes an inspection device and an inspection method as described in the independent device claims or method claims.

[0011] The inspection solution proposed herein can be integrated into a processing system (device or method), in which the stacking table moves back and forth, and at the end positions, an anode or a cathode is assembled by one of the two layer conveyors to form an electrode stack. The back-and-forth movement of the stacking table between the first and second handover points limits the number of anode layers or cathode layers that can be placed per unit time. One solution proposed herein is that when the picker of one of the layer flippers approaches the picker of the other layer flipper, especially in the space between the two layer flippers, it retracts radially. Compared with the circular trajectory of the pickers where the two layer flippers cannot contact each other, this solution can shorten the distance between the first and second handover points. Thereby, the movement path length of the stacking table between the two handover points can be reduced. This is particularly important after the picker places the anode layer or cathode layer on the shelf of the stacking table ( Figure 1 at the 6 o'clock position in ), and the empty picker enters the space between the two layer flippers. Without this radial retraction of the picker, its trajectory will be significantly larger, which will inevitably lead to an increase in the distance between the first and second handover points. This also makes the design of the entire device more compact. In summary, in one variant, the pickers of the two layer flippers each move along an approximately upright ellipse, the (vertical) major axis of which extends from the center of the relevant transfer point to the center of the relevant handover point, and the (horizontal) minor axes of which do not touch each other. Guiding the pickers along these approximately elliptical paths can avoid collisions of the pickers when turning back from the handover point to the transfer point even when the two layer flippers are close to each other, so as to keep the path of the stacking table from one layer flipper to the other as short as possible.

[0012] In one variant of the device, the first and second layer flippers are arranged and designed such that when the picker approaches the first or second transfer point and / or the first or second handover point, the picker is extended by the respective second drive device. In order to pick up the anode layer and the cathode layer at the transfer point ( Figure 1 at the 12 o'clock or 6 o'clock position in ), the pickers of the two layer flippers can be extended radially. The radial movement of the picker starts before the picker reaches the 6 o'clock or 12 o'clock position, rather than when it reaches that position.

[0013] This improves the position accuracy of picking up the anode layer and the cathode layer from the two conveyors at the transfer point. In this way, more anode layers and cathode layers can be placed on the stacking table per unit time without affecting the construction accuracy of the electrode stack.

[0014] In a variant of the device, an endless diaphragm is fed from above into the space between two layer turners and folded into a Z-shape on the stacking table. The stacking table continuously moves horizontally back and forth between two handover positions. Thus, the process of forming an electrode stack starts with the diaphragm, and then the anode layer and the cathode layer are alternately placed on the stacking table by the two layer turners. The anode layer and the cathode layer are always separated by the folded diaphragm.

[0015] In a variant of the device, the first conveyor and the second conveyor are adjacent to each other and at a certain distance. In a variant of the device, the first conveyor and / or the second conveyor is designed as a belt conveyor, with its respective bottom surface facing the first or the second layer turner, so as to convey the individual anode layers and individual cathode layers on its bottom surface to the first or the second transfer point.

[0016] In a variant of the device, the first conveyor and / or the second conveyor each has a controlled negative pressure / overpressure conveyor belt. They are set and designed to pick up the individual anode layers and individual cathode layers by controlled pneumatic negative pressure and hold them during the conveyance to the first or the second transfer point. In a variant of the device, the individual anode layers and individual cathode layers are handed over to the first or the second layer turner at the first or the second transfer point by controlled pneumatic overpressure (in the form of, for example, a short blowing impact).

[0017] In a variant of the device, the first and / or the second layer turner each has a plurality of pickers for picking up the individual anode layers or cathode layers. The pickers are set and designed to rotate one by one continuously or periodically past the transfer point and the handover point. During this process, the pickers of the first and / or the second layer turner can pick up or hand over the individual anode layers or cathode layers.

[0018] The rotation angle of the first and / or the second layer turner is, for example, about 180°. However, it can also be smaller (e.g., 90°) or larger (e.g., 270°). The rotation angle describes the degree to which the layer conveyor rotates or flips a layer between the transfer point and the handover point. The layer turner picks up a layer from the conveyor, flips it, and then places it on the stacking table, thus completing the flipping of the layer. This means that the free upper side of the layer that is away from the conveyor before being picked up by the picker is the same as the free upper side of the layer after being placed on the stacking table, except that it has turned by a rotation angle (e.g., 180°) in direction. The first or the second layer turner and its pickers rotate around their respective rotation centers / rotation axes.

[0019] In a variant of the device, the first and second layer turners substantially have a consistent structure, consistent functions, and / or consistent dimensions. In a variant of the device, the first and second layer turners are arranged and designed to rotate clockwise and counterclockwise respectively by their respective first drive devices, so that a single anode layer and a cathode layer reach the handover point from the transfer point while avoiding the space between the first and second layer turners. In other words, a single anode layer or cathode layer is not between the two layer turners, but is "carried around" the first and second layer turners from the transfer point to the handover point.

[0020] In a variant of the device, the first and second transfer points each have a first center between the first conveyor or the second conveyor and the first or second layer turner, and the first and second handover points each have a second center between the first or second layer turner and the stacking table. In a variant of the device, these first and second centers are located on a straight line that substantially at least approximately intersects the respective rotation centers of the first conveyor or the second conveyor.

[0021] In a variant of the device, the stacking table has shelves for placing single anode layers and cathode layers. In a variant of the device, the stacking table has a single-axis or multi-axis positioning device that is arranged and designed to move the shelf along or around the relevant axis to align it with the first or second handover point. This enables the layers to be precisely stacked on the shelf, thus achieving reliable production without significant losses due to defective electrode stacks produced.

[0022] In a variant of the device, the stacking table has at least one first clamping finger and at least one second clamping finger, which are arranged and designed to alternately or simultaneously engage with or disengage from the topmost anode layer and cathode layer, and / or press the topmost anode layer and cathode layer against the electrode stack on the shelf. In a variant, the shelf / stacking table can be rotated around the z-axis (vertical axis) by the clamping fingers. In a variant, the shelf / stacking table can be positioned in the x-direction and / or y-direction by the clamping fingers.

[0023] In a variant of the device, the first and second layer turners are arranged and designed to pick up a single anode layer and a single cathode layer by controlled pneumatic negative pressure and hold them during the flipping to the first and second handover points. As a supplementary or alternative solution, a single anode layer and a single cathode layer can be handed over at the first and second handover points by controlled pneumatic overpressure in order to stack these layers on the shelf.

[0024] In a variant of the device, the first and second layer turners each have a rotatable overpressure / negative pressure distribution device which is arranged and designed to provide a controlled pneumatic negative pressure and / or overpressure for the picker. In a variant of the device, the first and second layer turners are arranged and designed to turn only individual anode layers and individual cathode layers to the first and second handover points.

[0025] In a variant of the device, each positioning device is arranged and designed to lower the shelf by a distance during the stacking of a single anode layer and a single cathode layer, the distance corresponding substantially to the thickness of a single anode layer or a single cathode layer.

[0026] In a variant of the device, the first drive device is designed as a rotary drive device which is arranged and designed to turn the picker of the layer turner. In a variant of the device, the second drive device has a rotary drive device whose eccentric shaft is drivingly coupled to the picker to radially retract and / or extend the picker of the layer turner. As an alternative, the second drive device has a linear drive device which is drivingly coupled to one of the pickers to radially retract and / or extend the picker of the associated layer turner.

[0027] A method for manufacturing a module or a module precursor (in particular a fuel cell or a battery cell comprising layer materials) implemented, for example, with the above-described device, comprising the following steps, for example, performed in the following order: conveying a single anode layer to a first transfer point for transfer to the first layer turner; conveying a single cathode layer to a second transfer point for transfer to the second layer turner; picking up the single anode layer or cathode layer at the first or second transfer point by means of the respective picker of the first or second layer turner; turning the picked-up single anode layer or cathode layer by a certain angle of rotation so that it reaches the first or second handover point; moving the stacking table back and forth between the first and second handover points by means of a drive device; handing over the single anode layer or cathode layer to the stacking table at the first or second handover point when the stacking table is located at the first or second handover point; radially retracting the picker of the first and / or second layer turner when it approaches the picker of the other layer turner.

[0028] When the picker approaches the picker of the other layer turner on the way from the handover point to the transfer point or from the transfer point to the handover point, this proximity between the pickers of one layer turner and the picker of the other layer turner is particularly important in the space between the two layer turners.

[0029] A first variant of an inspection device for layer materials, in particular for layer materials for manufacturing fuel cells or battery cells, has a first layer conveyor and a first drive device and is set up and designed to pick up individual anode or cathode layers from a first transfer point by means of at least one picker and to convey them to a first handover point. In this variant, the first layer conveyor is set up and designed to hand over an individual anode or cathode layer from the picker to a stacking table at the first handover point when at least one picker is located at the first handover point. In this variant, at least one drive device is provided to align the picker and the stacking table with each other in accordance with signals issued on the basis of the processing of a first and / or second image capture. In this variant, a first image collector is aligned with a first region of the first layer conveyor between the first transfer point and the first handover point and is set up and designed to perform a first image capture when at least one picker of the first layer conveyor passes by the first image collector. In this variant, as an alternative or in addition, a second image collector is aligned with a second region of the first layer conveyor between the first transfer point and the first handover point and is set up and designed to perform a second image capture when at least one picker of the first layer conveyor passes by the second image collector. In this variant, the stacking table is set up and designed to pick up an individual anode or cathode layer at the first handover point to form a stack.

[0030] In one variant, the first layer conveyor includes a layer turner which is set up and designed to pick up an individual anode or cathode layer from a first transfer point by means of at least one picker and to rotate it through a certain angle of rotation to reach the first handover point.

[0031] In one variant, the first layer conveyor includes a layer gripper which is set up and designed to pick up an individual anode or cathode layer from a first transfer point by means of a picker in the form of, for example, a suction tool or a gripping tool and to convey it to the first handover point.

[0032] In one variant, a second layer conveyor is set up and designed to pick up an individual cathode or anode layer and to convey it to a second handover point. In one variant, a first image collector is aligned with a first region of the second layer conveyor between a second transfer point and the second handover point and is set up and designed to perform a first image capture when the second layer conveyor passes by the first image collector. As an alternative or in addition, in one variant, a second image collector is aligned with a second region of the second layer conveyor between the second transfer point and the second handover point and is set up and designed to perform a second image capture when the second layer conveyor passes by the second image collector.

[0033] In one variant, the second-layer conveyor includes a layer inverter which is arranged and designed to pick up a single anode layer or cathode layer from a second transfer point by means of at least one picker, rotate it through a certain angle of rotation so as to reach a second handover point.

[0034] In one variant, the second-layer conveyor includes a layer gripper which is arranged and designed to pick up a single anode layer or cathode layer from a second transfer point by means of a picker in the form of, for example, a suction tool or a gripping tool and convey it to a second handover point.

[0035] In one variant, a drive device is assigned to the stacking table, which drive device is arranged and designed to move the stacking table back and forth between a first and a second handover point. In one variant, the first- and second-layer conveyors are respectively arranged and designed to hand over a single anode layer or cathode layer to the stacking table at the first and second handover points. In one variant, there is provided at least one drive device so as to orient the layer conveyor and / or at least one layer inverter or layer gripper relative to the stacking table according to signals issued from processing the first and / or second image captures in the control device. This drive device can be designed as an additional y-direction drive device for the shelf and / or a rotary drive device about the z-axis (i.e., θ upwards).

[0036] In one variant, the first region and the second region of at least one picker of the layer inverter are corner regions of at least one picker of the layer inverter which are diagonally opposite each other. In one variant, the first corner region and the second corner region of at least one picker of the layer inverter are arranged and designed to pick up the first corner or the second corner of a single anode layer or cathode layer. In one variant, at the moment of the first and / or second image capture at an angle of approximately 30° to approximately 150°, or at an angle of approximately 60° to approximately 120°, at an angle of approximately 80° to approximately 100°, or at an angle of approximately 90° to the surface of the picker in the relevant region, the first and / or second image collectors are aligned with the first and / or second corner regions of the picker between the transfer point and the handover point.

[0037] In one variant, the first and / or second image pick-up device can be adjusted along its optical axis for focusing and / or can be moved during operation. In one variant, the white light source assigned to the first and / or second image pick-up device is set up and designed to illuminate the anode layer / cathode layer so that the first and / or second image pick-up device can capture an image. In one variant, at least one optically effective element is assigned to the first and / or second image pick-up device respectively; wherein the optically effective element is set up and designed to detect the position and / or orientation of the anode layer / cathode layer at one or more locations or regions before or at the moment when the anode layer / cathode layer reaches the handover point, or on the way to the handover point; and / or wherein at least one optically effective element is a lens or a lens assembly, a mirror or a mirror assembly, a prism or a prism assembly, a light conductor assembly, an area light, a coaxial ring light, a dark field light or a combination thereof.

[0038] In one variant, the control unit is set up and designed to obtain correction values based on the one or more image captures described above and based on the position and / or orientation of the anode layer / cathode layer before it is picked up by the stacking table, the position and / or orientation of the stacking table, and / or the position and / or orientation of the individual anode layer / cathode layer relative to the stacking table during the flipping of the anode layer / cathode layer onto the stacking table. In one variant, the control unit is set up and designed to take these correction values into account in the positioning instructions sent to the layer flipper, the pick-up device and / or the stacking table when orienting the stacking table carrying the conveyed anode layer / cathode layer relative to the placement point. In one variant, the control unit is set up and designed to take these correction values regarding the orientation and position of the stacking table when picking up the anode layer / cathode layer into account in the positioning instructions sent to the layer flipper, the pick-up device and / or the stacking table so that the stacking table picks up the anode layer / cathode layer at the central zero position and / or in alignment with the electrode stack located at the handover point. In one variant, the control unit is set up and designed to determine the orientation and position of the stacking table at or before the moment of picking up the anode layer / cathode layer by checking the position of the newly incoming anode layer / cathode layer directly in front of the handover point during the image capture.

[0039] In one variant, the pick-up device can be moved radially relative to its axis of rotation, and the first image pick-up device and / or the second image pick-up device is designed to perform the first or second image capture when the pick-up device moves radially outwards or inwards.

[0040] A variant of an inspection method performed during the manufacture of a module or module precursor includes the following steps: picking up an anode layer / cathode layer from a transfer point; transporting the anode layer / cathode layer from the transfer point to a handover point; detecting the position and / or orientation of the anode layer / cathode layer on a layer inverter between the transfer point and the handover point by a first image acquirer, where the first image acquirer is aligned with a first area of the layer inverter and is set and designed to perform a first image capture when the anode layer / cathode layer on the layer inverter passes by the first image acquirer.

[0041] In a variant of the inspection method, the position and / or orientation of the anode layer / cathode layer on the layer inverter is detected between the transfer point and the handover point by a second image acquirer, where the second image acquirer is aligned with a second area of the layer inverter and is set and designed to perform a second image capture when at least one picker of the layer inverter passes by the second image acquirer. In a variant of the inspection method, the picker and the stacking table are aligned with each other according to signals obtained by processing the first and / or second image captures. In a variant of the inspection method, when at least one picker is located at the handover point, a single anode layer or cathode layer is released from at least one picker to the stacking table at the handover point to form a stack.

[0042] In a variant of the inspection method, when at least one picker of the layer inverter passes by the image acquirer, the first and / or second image acquirer detects the position and / or orientation of the anode layer / cathode layer in the x, y, z, and / or θ directions at a vertical viewing angle of ± approximately 25° with respect to the surface of the anode layer / cathode layer. In a variant of the inspection method, a light source assigned to the first and / or second image acquirer illuminates the anode layer / cathode layer so that the first and / or second image acquirer can capture an image. In a variant of the inspection method, the first and / or second image acquirer thoroughly detects the anode layer / cathode layer through image capture to detect its position and / or orientation in the x, y, z, and / or θ directions. In a variant of the inspection method, the first and / or second image acquirer detects an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least one edge segment of the anode layer / cathode layer by a single image capture relative to their respective fixed image acquirer zero points to detect the position and / or orientation of the anode layer / cathode layer in the x, y, z, and / or θ directions. In a variant of the inspection method, the first and / or second image acquirer is designed as a matrix camera or a line scan camera for detecting the position and / or orientation of the anode layer / cathode layer in the x, y, z, and / or θ directions before, at, or during its travel to the handover point.

[0043] In a variant of the inspection method, correction values are obtained based on the position and / or orientation of the anode layer / cathode layer in the x, y, z, and / or θ directions after being picked up by at least one picker of the layer flipper, the position and / or orientation of the stacking table in the x, y, z, and / or θ directions, and / or the position and / or orientation of a single anode layer / cathode layer picked up during the flipping of the anode layer / cathode layer towards the stacking table. In a variant of the inspection method, these correction values are taken into account when orienting the picker of the layer flipper carrying the transferred anode layer / cathode layer in the x, y, z, and / or θ directions relative to the stacking table at the handover point. In a variant of the inspection method, when orienting the picker of the layer flipper, these correction values are considered in the x, y, z, and / or θ directions so that the anode layer / cathode layer is picked up by the stacking table at the central zero position and / or in an aligned manner with each other.

[0044] During the battery manufacturing process, when performing the first type of inspection proposed herein using the first and second image collectors (cameras), the electrode layers are stacked together as precisely as possible with the aid of the first and second image collectors. In this way, the efficiency of the finished fuel cell or battery cell can be maximized. The less precisely the electrode layers are stacked, the lower the efficiency. The inspection proposed herein detects the exact position of the electrode layer just before stacking (i.e., during the flipping process). Based on this position, a scale for correcting the relative position between the stacking table and the picker of the layer flipper is determined and applied. In this way, the individual electrode layers can be placed on the growing stack as precisely as possible. This processing method can avoid product rejection and improve the efficiency of the finished fuel cell or battery cell.

[0045] In a variant, the first and second corner regions of the electrode or layer flipper being inspected are different. In a variant, the stacking table is set and designed to pick up a single anode layer or cathode layer at the first handover point to form a layer stack.

[0046] In a variant, the first and second corner regions of the first layer flipper are regions that are diagonally opposite each other along the first layer flipper. In a variant, when at least one picker of the first layer flipper is on the path between the first transfer point and the first handover point, the first and second corner regions are two (substantially the same size) surface regions of this picker.

[0047] In a variant, the first and second corner regions of at least one picker of the first layer conveyor are set and designed to pick up the first or second corner of a single anode layer or cathode layer.

[0048] In one variant, at the moment of the first and / or second image capture at an angle of approximately 25° to approximately 150°, or at an angle of approximately 60° to approximately 120°, or at an angle of approximately 80° to approximately 100°, or at an angle of approximately 90° (relative to the surface of the anode layer / cathode layer or the first / second picker), the first and / or second image acquirers align with the first and / or second corner regions of the first / second layer conveyor between the first / second transfer points at the first / second transfer points.

[0049] In the variant of the inspection, the first and / or second cameras detect the position and / or orientation of the anode layer / cathode layer on the picker at a vertical downward viewing angle of ± approximately 25° to ± approximately 30° with respect to the anode layer / cathode layer or the surface of the first / second picker when the picker passes by the relevant image acquirer. In the variant of the inspection, the first and / or second image acquirers can be adjusted along their optical axes for focusing and / or can be moved during operation.

[0050] In the variant of the inspection, the white light sources assigned to the first and / or second image acquirers illuminate the anode layer / cathode layer so that the first and second image acquirers can capture images. In the variant of the inspection, the first and / or second cameras thoroughly detect the anode layer / cathode layer through a (single) one-time image capture to detect its position and / or orientation.

[0051] In a variant of the inspection method, the first and / or second cameras detect an area, at least one corner region, two diagonal corner regions, and / or at least one corner region and at least one edge segment of the anode layer / cathode layer through a single one-time image capture to detect the position and / or orientation of the anode layer / cathode layer.

[0052] In the variant of the inspection, the first and / or second cameras are designed as matrix cameras or line scan cameras for detecting the position and / or orientation of the anode layer / cathode layer during the flipping process towards the stacking table.

[0053] In the variant of the inspection, correction values are obtained based on the position and / or orientation of the anode layer / cathode layer on the picker during the flipping process of the anode layer / cathode layer towards the handover point onto the stacking table. In the variant of the inspection, these correction values are taken into account when orienting the stacking table relative to the picker carrying the conveyed anode layer / cathode layer at the placement point.

[0054] In the variant of the inspection, these correction values are taken into account when orienting the stacking table so as to pick up the anode layer / cathode layer through the stacking table, so that the anode layer / cathode layer is on the central zero position and / or is picked up by the stacking table in an aligned manner.

[0055] In a variant, during inspection, before and / or when the anode layer / cathode layer is placed on the stacking table, the stacking device can be positioned relative to the anode layer / cathode layer by means of the calculated correction values, so that the anode layer / cathode layer is picked up by the stacking table in a zero-positioned manner. To this end, the position and / or orientation of the stacking table relative to the anode layer / cathode layer / relative to the layer conveyor can be corrected at the handover point. Similarly, after the picking operation is completed during the transfer process, the stacking table can be positioned according to the correction values from the image capture, so that when the anode layer / cathode layer is placed on the electrode stack located there at the handover point, the stacking table places the anode layer / cathode layer in a manner suitable for the anode layer / cathode layer and with a minimal correction movement or without further correction movement. This can be done very quickly and with high precision. For example, the device described below is suitable for performing the inspection.

[0056] In the variant of the inspection, the (white) light source assigned to the one or more cameras is set and designed to illuminate the anode layer / cathode layer so that the cameras can capture images.

[0057] In a variant of the inspection device, at least one optically effective element is provided in front of one or all of the cameras, which is set and designed to detect the position and / or orientation of the anode layer / cathode layer at one or more locations or regions before the anode layer / cathode layer is picked up by the picker, i.e., when it reaches the handover point, or on the way to the handover point. In the variant of the device, at least one optically effective element is designed as a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, a light conductor assembly, an area light, a coaxial ring light, a dark field light, or a combination thereof. In the variant of the inspection, the control unit is set and designed to obtain correction values according to the image capture and / or according to the data from the detection device and / or the first and / or second cameras, and according to the position and / or orientation of the anode layer / cathode layer before it is picked up by the stacking table, the position and / or orientation of the stacking table, and / or the position and / or orientation of the individual anode layer / cathode layer relative to the stacking table during the flipping process of the anode layer / cathode layer onto the stacking table.

[0058] In the variant of the inspection, the control unit is set and designed to take these correction values into account in the positioning instructions sent to the layer flipper and / or its picker and / or the stacking table when orienting the stacking table carrying the transferred anode layer / cathode layer relative to the handover point. In the variant of the inspection, the control unit is set and designed to take these correction values regarding the orientation and position of the stacking table when picking up the anode layer / cathode layer into account in the positioning instructions, so that the stacking table picks up the anode layer / cathode layer at the central zero position and / or in alignment with the electrode stack located at the handover point.

[0059] By inspecting the position of the newly incoming anode layer / cathode layer directly in front of the handover point, the orientation and position of the stacking table at the time of or before picking up the anode layer / cathode layer can be accurately determined. In this way, the stacking table can pick up the anode layer / cathode layer in a precisely determined and corrected manner to form an electrode stack that is perfectly aligned both vertically and in terms of the angular position around the vertical axis.

[0060] In a second variant, an inspection device for layer materials (especially for layer materials used in the manufacture of fuel cells or battery cells) includes a first layer conveyor that has at least one picker and a first drive device and is set up and designed to pick up individual anode layers or cathode layers from a first transfer point by means of at least one picker and transport them to a first handover point. In one variant, the stacking table is set up and designed to pick up individual anode layers or cathode layers from the picker at the first handover point to form a stack. In one variant, the first layer conveyor is set up and designed to hand over an individual anode layer or cathode layer from its picker to the stacking table at the first handover point when the picker is at the first handover point. In one variant, a third image collector is aligned in a lateral view of the stack with an area that includes the upper edge of the stack located on the stacking table and includes the tabs of the anode layer or cathode layer located at the top of the stack, and the third image collector is set up and designed to perform a third image capture before and / or after the anode layer or cathode layer is placed on the stacking table. In one variant, the control device is set up and designed to indicate the (in)availability of the layer stack based on a signal generated by processing the third image capture. The stack can then be (automatically) removed.

[0061] In one variant, the layer conveyor includes a layer flipper that is set up and designed to pick up an individual anode layer or cathode layer from a first transfer point by means of at least one picker and rotate it by a certain angle of rotation to reach the first handover point.

[0062] In another variant, the layer conveyor includes a layer gripper that is set up and designed to pick up an individual anode layer or cathode layer from a first transfer point by means of one of its pickers (which is in the form of, for example, a suction tool or a gripping tool) and transport it to the first handover point.

[0063] In another variant, the inspection device includes a second-layer conveyor, which is arranged and designed to pick up a single cathode layer or anode layer and deliver it to a second handover point. In one variant, a drive device is assigned to the stacking table, which is arranged and designed to move the stacking table back and forth between the first and second handover points. In one variant, the first and second-layer conveyors are respectively arranged and designed to hand over a single anode layer or cathode layer to the stacking table at the first or second handover point at the first and second handover points. In one variant, at least one drive device is provided to orient the layer conveyor and / or at least one layer flipper or layer gripper relative to the stacking table according to signals issued in the control device for processing the first and / or second image captures.

[0064] In one variant, the second-layer conveyor includes a layer flipper, which is arranged and designed to pick up a single anode layer or cathode layer from a second transfer point by means of at least one picker and rotate it by a certain rotation angle to reach the second handover point.

[0065] In one variant, the second-layer conveyor includes a layer gripper, which is arranged and designed to pick up a single anode layer or cathode layer from a second transfer point by means of a picker (in the form of, for example, a suction tool or a gripping tool) and deliver it to the second handover point.

[0066] In one variant, the first third region and the second third region of the stack respectively include the tabs of the uppermost anode layer or cathode layer on the stacking table at the first or second handover point. In one variant, one or two third image collectors are arranged on the first side of the inspection device, and one or two third image collectors are arranged on the second side of the inspection device. In one variant, one or more third image collectors are arranged in a fixed position relative to the movable stacking table. In one variant, one or more third image collectors are connected to the stacking table so as to be movable therewith.

[0067] In one variant of the inspection device, at least one third image collector can be adjusted along its optical axis for focusing and / or can be moved during operation. In one variant, the light source assigned to the third image collector is set and designed to illuminate the anode layer / cathode layer so that the third image collector can capture an image. In one variant, at least one optical effective element is assigned to at least one third image collector. In one variant, the optical effective element is set and designed to enable the tab of the anode layer or cathode layer located at the top of the stack to be recognized in the third image capture after the anode layer or cathode layer is placed on the stack. In one variant, at least one optical effective element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, a light conductor assembly, an area light, a coaxial ring illumination device, a dark field illumination device, a transmitted light illumination device, or a combination thereof.

[0068] In transmitted light illumination, the direction of the light is opposite to the viewing direction of the image acquisition device. The light does not pass through the material of the connecting piece as it would, for example, when illuminating a semiconductor chip with infrared light.

[0069] In a variant of the inspection device, the transmitted light illumination device is arranged on the opposite side of the third image collector, i.e. on the other side of the position of the lug on the stacking table, and is designed to bring the lug into the beam path. This means that by processing the third image capture, a tilting of the lug can be identified, i.e. the top edge of the lug in the image capture is not oriented substantially horizontally (<±10° relative to the horizontal plane or the optical axis of the associated third image collector) or is not oriented flush with the electrode and / or causes a disturbing contour.

[0070] In one variant of the inspection device, the coaxial ring lighting device is arranged on the side of the third image collector, i.e., on the side where the terminal lug is located on the stacking table, and is designed to bring the terminal lug into the beam path so as to identify the warping of the terminal lug by processing the third image capture, i.e., the top edge of the terminal lug in the image capture is not oriented (<±10° relative to the horizontal plane or the optical axis of the relevant third image collector) or is not flush with the electrode and / or causes an interfering contour.

[0071] A second inspection method performed during the manufacturing process of a module or a module precursor includes the following steps: picking up the anode layer / cathode layer at a first transfer point and sending the anode layer or cathode layer from the first transfer point to a first handover point; handing over a single anode layer or cathode layer to a stacking table at the handover point to form a stack; aligning a third image collector with an area at a lateral perspective, the area including the upper edge of the stack on the stacking table, wherein the area includes a wiring tab of the anode layer or cathode layer at the top of the stack; and after the anode layer or cathode layer is placed on the stacking table, performing a third image capture by the third image collector; and indicating the (un)availability of the stack based on a signal emitted by processing the third image capture.

[0072] In one variant, the inspection method further comprises the following steps: adjusting at least one third image collector along its optical axis for focusing, and / or moving at least one third image collector along its optical axis during operation for focusing; and / or illuminating the anode layer / cathode layer by a light source assigned to at least one third image collector so that at least one third image collector performs a third image capture; and / or assigning at least one optically effective element to at least one third image collector; wherein the optically effective element is set and designed so that after the anode layer or cathode layer is placed on the layer stack, the terminal block of the anode layer or cathode layer located at the top of the layer stack can be identified from a lateral perspective in the third image capture; and / or wherein the at least one optically effective element is a lens or a lens assembly, a mirror or a mirror assembly, a prism or a prism assembly, a light conductor assembly, an area light, a coaxial ring lighting device, a dark field lighting device, a transmitted light lighting device or a combination thereof.

[0073] In one variant, the inspection method further comprises the following steps: arranging a transmitted light illumination device on the opposite side of the third image collector, i.e., on the other side of the position of the terminal lug on the stacking table, and designing at least one third image collector to bring the terminal lug into the light beam path; so as to identify the warping of the terminal lug by processing the third image capture, i.e., the top edge of the terminal lug is not oriented (<±10° relative to the horizontal plane or the optical axis of the relevant third image collector) or is not flush with the electrode, and / or causes an interfering contour.

[0074] In one variant, the inspection method further comprises the following steps: arranging a coaxial ring lighting device on one side of at least one third image collector, i.e., the side where the terminal lug is located on the stacking table, and designing at least one third image collector to bring the terminal lug into the light beam path; identifying the warping of the terminal lug by processing the third image capture, i.e., the top edge of the terminal lug in the third image capture is not horizontally oriented (<±10° relative to the horizontal plane or the optical axis of the relevant third image collector) or is not flush with the electrode, and / or causes an interfering contour.

[0075] During the battery manufacturing process, a further second inspection using at least one third image collector (camera) is also performed to check the alignment of the terminal tab of the topmost electrode layer with the one or more terminal tabs below to keep it as flat as possible.

[0076] This further inspection can be used as an alternative or supplement to the first inspection. This can avoid possible failures or efficiency degradation of the finished fuel cell or cell unit. This is because when stacking an electrode layer, there may also be cases where the tabs stand up, bulge, or bend upward, resulting in a risk of tab bending, for example when stacking the next electrode layer of the same polarity. If the tabs are not fully connected, the efficiency of the fuel cell or cell unit will decrease. If the tabs bend onto the release film and come into contact with the mating electrode layer, it will cause a short circuit of the cell unit. The inspection proposed in this article will immediately detect the exact orientation of the tabs of each electrode layer after stacking. Based on this position, a scale for determining and applying the relative position between the pickers of the calibration stacking table and the layer flipper is determined. Relative to the electrode stack already existing on the stacking table, the individual electrode layers can thus be placed on the growing stack as precisely as possible. This means that waste can be reduced and efficiency can be increased.

[0077] The third inspection performed on battery manufacturing includes the following steps, for example, performed in the following order: providing separate anode / cathode layers; transporting the anode / cathode layers to a handover point; stacking the transported anode / cathode layers on a stacking table at the handover point; detecting the electrode stack at the handover point after the anode / cathode layer has been stacked thereon, from at least one lateral view of the corners and / or vertical edges of the electrode stack; and the orientation and / or position of the stacked anode / cathode layer or each stacked anode / cathode layer relative to the rest of the growing electrode stack at the handover point.

[0078] In a third variant, this can be achieved by an inspection device for a layer material, in particular for a layer material for manufacturing a fuel cell or a battery cell, in which: a first layer conveyor is provided and designed to pick up a single anode layer or cathode layer and convey it to a first handover point; a stacking table is provided and designed to pick up a single anode layer or cathode layer at the first handover point to form a stack; the first layer conveyor is provided and designed to hand over a single anode layer or cathode layer to the stacking table at the first handover point; and a fourth image collector is aligned with a fourth area of the stack composed of anode layers and cathode layers in a plane lateral view of the stack, and is provided and designed to capture an image after the anode layer or cathode layer is placed on the stack on the stacking table, wherein the fourth area includes the corners of the anode layer or cathode layer located at the top of the stack and / or the vertical edges of the stack; and / or, a fifth image collector is aligned with a fifth area of the stack composed of anode layers and cathode layers in a plane lateral view of the stack, and is provided and designed to capture an image after the anode layer or cathode layer is placed on the stack on the stacking table, wherein the fifth area includes the corners of the anode layer or cathode layer located at the top of the stack and / or the vertical edges of the stack; the fourth area and the fifth area include areas on the stack composed of anode layers and cathode layers that are adjacent to each other on the layer surface or opposite to each other along the diagonal when viewed from the lateral view of the stack. The inspection device can be designed to indicate the (in)availability of the stack according to the signals issued by processing the image captures of the fourth and fifth image collectors.

[0079] In one variant, the fourth and fifth areas are different areas of the stack on the stacking table.

[0080] In one variant, the layer conveyor includes a layer flipper, which is provided and designed to pick up a single anode layer or cathode layer from a first transfer point by at least one picker and rotate it by a certain rotation angle to reach the first handover point.

[0081] In one variant, the layer conveyor includes a layer gripper, which is provided and designed to pick up a single anode layer or cathode layer from a first transfer point by a picker (in the form of, for example, a suction tool or a gripping tool) and convey it to the first handover point.

[0082] In a variant, the fourth image collector and / or the fifth image collector can be adjusted along their optical axes for focusing and / or can be moved during operation. In a variant, the light sources respectively assigned to the fourth image collector and / or the fifth image collector are set and designed to illuminate the anode layer / cathode layer so that the fourth image capture or the fifth image capture is performed by the fourth image collector or the fifth image collector. In a variant, at least one optically effective element is assigned to the fourth image collector or the fifth image collector. In a variant, the optically effective element is set and designed so that after the anode layer or the cathode layer is placed on the stack, the corners of the anode layer or the cathode layer at the top of the stack and / or the vertical edges of the stack can be recognized during the fourth image capture or the fifth image capture. In a variant, at least one optically effective element is a lens or a lens assembly, a mirror or a mirror assembly, a prism or a prism assembly, a light conductor assembly, an area light, a coaxial ring illumination device, a dark field illumination device, a transmitted light illumination device or a combination thereof.

[0083] In a variant, the transmitted light illumination device is arranged on the opposite side of the fourth image collector or the fifth image collector, i.e., on the other side of the position where the corners of the anode layer or the cathode layer at the top of the stack and / or the vertical edges of the stack are located, and is designed to incorporate the corners and / or the vertical edges into the beam path. In a variant, by processing the fourth image capture or the fifth image capture, warping, offset or torsion of the anode layer or the cathode layer can be recognized, i.e., the corners of the anode layer or the cathode layer at the top of the stack and / or the vertical edges cause interference contours in the image capture.

[0084] In a variant, the coaxial ring illumination device is arranged on the side of the fourth image collector or the fifth image collector, i.e., on this side of the position where the corners of the anode layer or the cathode layer at the top of the stack and / or the vertical edges of the stack are located, and is designed to incorporate the corners and / or the vertical edges into the beam path. In a variant, by processing the fourth image capture or the fifth image capture, warping, displacement or torsion of the anode layer or the cathode layer can be recognized, i.e., the corners and / or the vertical edges cause interference contours in the image capture.

[0085] In a variant, the first fourth region and the first fifth region of the stack each include the corners of the substantially horizontally oriented first edge of the anode layer or the cathode layer at the top of the stack and / or the corners of the vertical edges of the stack on the stacking table, and / or the second fourth region and the second fifth region of the stack each include the corners of the second edge of the anode layer or the cathode layer at the top of the stack and / or the corners of the vertical edges of the stack on the stacking table. In a variant, one or more fourth or fifth image collectors are arranged in a fixed position relative to the movable stacking table. In a variant, one or more fourth or fifth image collectors are connected to the stacking table so as to be movable therewith.

[0086] In one variant, the third inspection method carried out during the manufacturing process of the module or module precursor includes the following steps: picking up the anode layer / cathode layer from the transfer point by at least one picker; when at least one picker is located at the handover point, handing over the single anode layer or cathode layer from at least one picker to the stacking table at the handover point to form a stack; aligning a fourth image collector with a fourth region of the stack composed of the anode layer and the cathode layer from the lateral perspective of the plane of the stack, wherein the fourth region includes the corners of the anode layer or cathode layer located at the top of the stack and / or the vertical edges of the stack; performing a fourth image capture after the anode layer or cathode layer is placed on the stack on the stacking table; and / or aligning a fifth image collector with a fifth region of the stack composed of the anode layer and the cathode layer from the lateral perspective of the stack, wherein the fifth region includes the corners of the anode layer or cathode layer located at the top of the stack and / or the vertical edges of the stack; and / or performing a fifth image capture after the anode layer or cathode layer is placed on the stack on the stacking table; and / or wherein the fourth region or the fifth region of the anode layer or cathode layer includes regions adjacent to each other on the layer surface or opposite to each other along the diagonal of the stack composed of the anode layer and the cathode layer when viewed from the lateral perspective of the stack; and indicating the availability of the stack according to the signals issued by processing the fourth and fifth image captures.

[0087] In one variant, the inspection method includes the following steps: adjusting the fourth or fifth image collector along its optical axis for focusing, and / or moving the relevant image collector along its optical axis during operation for focusing. In one variant, the fourth or fifth region is illuminated by a light source assigned to the fourth or fifth image collector so that the relevant image collector can perform the fourth or fifth image capture. In one variant, at least one optically effective element is assigned to the fourth or fifth image collector so that the corners of the anode layer or cathode layer located at the top of the stack and / or the vertical edges of the stack can be recognized in the fourth or fifth image capture after the anode layer or cathode layer is placed on the stack. In one variant, at least one optically effective element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, a light conductor assembly, an area light, a coaxial ring illumination device, a dark field illumination device, a transmitted light illumination device, or a combination thereof.

[0088] In one variant, the inspection method comprises the following steps: arranging a transmitted-light illumination device on the opposite side of the fourth or fifth image acquisition device, i.e., on the other side of the corner of the anode layer or cathode layer located at the top of the stack or the vertical edge of the stack on the stacking table, and designing the transmitted-light illumination device to incorporate the corner and / or the vertical edge of the stack into the light beam path. In one variant, at least partial lifting, offset or torsion of the anode layer or cathode layer located at the top of the stack is identified by processing the fourth or fifth image capture, i.e., the uppermost corner and / or vertical edge causes interference profiles.

[0089] In one variant, the inspection method comprises the following steps: arranging a coaxial ring illumination device on one side of the fourth or fifth image acquisition device, i.e., on this side of the corner of the anode layer or cathode layer located at the top of the stack or the vertical edge of the stack on the stacking table, and designing the transmitted-light illumination device to incorporate the corner and / or the vertical edge of the stack into the light beam path. In one variant, at least partial lifting, offset or torsion of the anode layer or cathode layer located at the top of the stack is identified by processing the fourth or fifth image capture, i.e., the uppermost corner and / or vertical edge causes interference profiles. In one variant, one or more of the fourth or fifth image acquisition devices are oriented at an angle of approximately ±5° to approximately ±25° (e.g., ±13°) with respect to the longitudinal or transverse edge of the anode layer or cathode layer located at the top of the stack.

[0090] In one variant, the inspection method carried out during the manufacture of the module or module precursor further comprises the following steps: picking up the anode layer / cathode layer from the second transfer point by means of at least one second picker of the second layer flipper; transferring a single anode layer or cathode layer from at least one picker to the stacking table at the handover point to form a stack when the second picker is at the handover point; aligning the fourth image acquisition device with a fourth region of the stack composed of the anode layer and the cathode layer from a lateral perspective in the plane of the stack, wherein the fourth region includes the corner of the anode layer or cathode layer located at the top of the stack and / or the vertical edge of the stack; carrying out a fourth image capture after the anode layer or cathode layer has been placed on the stack on the stacking table; and / or aligning the fifth image acquisition device with a fifth region of the stack composed of the anode layer and the cathode layer from a lateral perspective in the plane of the stack, wherein the fifth region includes the corner of the anode layer or cathode layer located at the top of the stack and / or the vertical edge of the stack (HK); and carrying out a fifth image capture after the anode layer or cathode layer has been placed on the stack on the stacking table; and / or wherein the fourth or fifth region of the anode layer or cathode layer includes regions that are adjacent to each other on the layer surface or opposite to each other along the diagonal when viewed from the lateral perspective of the stack of the stack composed of the anode layer and the cathode layer; and indicating the (in)availability of the stack according to the signals issued by processing the fourth and fifth image captures.

[0091] This further third inspection can be used as an alternative or supplement to the first and / or second inspections.

[0092] Through this procedure, the exact positional relationship between the top layer and other layers in the electrode stack can be determined. As the height of the electrode stack increases, this test becomes increasingly important because when the top layer is placed in the wrong position without further correction, it will inevitably lead to rejection of the electrode stack. As the height of the electrode stack increases, the inspection also becomes more precise because the geometric areas (the corners or vertical edges of the electrode stack) to be measured can be detected and evaluated more easily and precisely.

[0093] In a variant of the third inspection, more precise correction values can also be calculated when placing the next layer onto the electrode stack. In summary, this procedure with precise position inspection greatly reduces the risk of short circuits, such as the short circuit risk of fuel cells or battery cells.

[0094] This can also be clearly seen from the fact that previous solutions could only place layers with an accuracy of approximately ±0.5 mm, while the solution proposed herein can achieve an accuracy of ±0.1 mm or even higher when placing the anode layer / cathode layer on the electrode stack, thereby reducing the scrap rate and increasing the efficiency.

[0095] In a variant of the method, four matrix cameras are used, which (when viewed from the side) are aligned with all four corners / (vertical) edges of the electrode stack at the placement point. In a variant of the method, incident light illumination or backlight illumination or dark field illumination is achieved through a relevant light source. In this way, the relevant areas of different anode layers / cathode layers can be easily identified. In a variant of the method, mirrors or prisms are used to guide the light beam path of the third camera to adapt to the spatial conditions.

[0096] In a variant of the method, a matrix camera that observes the electrode stack with a side view is used, which thoroughly detects the electrode stack as a whole during image capture; or two matrix cameras are used, each of which detects one of the two corners of the electrode stack from the side; at most four matrix cameras are used, which detect all four corners of the electrode stack from above and are aligned with the electrode stack at the placement point with a lateral view. In a related variant, the light beam path of the camera is also guided by appropriately arranging mirrors or prisms, etc. to adapt to the spatial conditions. In a variant, each camera uses a coaxial (red) illumination device and / or (white) spotlight for illumination.

[0097] In this way, it can be accurately identified that the anode layer / cathode layer is always placed in the correct position on the electrode stack with the correct orientation.

[0098] In a variant of the method, the movement of the lifting device with the associated workpiece carrier along the vertical axis (z-axis) and its errors are also taken into account, i.e., before placing the anode layer / cathode layer to form the electrode stack, a camera is used to detect the x- and y-positions of the workpiece carrier at different z-height positions. In this way, when placing the anode layer / cathode layer, it is possible to use the camera to check whether the anode layer / cathode layer is stacked at the correct x- and y-positions, which correspond to the z-position of the workpiece carrier on the lifting device. In this way, when picking up the anode layer / cathode layer with the stacking device, the accuracy in the rotational direction (θ-direction) around the vertical axis can also be corrected in order to subsequently accurately stack the anode layer / cathode layer of the electrode stack.

[0099] In a variant of the device, the control unit is set and designed to determine the position of the stacked anode layer / cathode layer relative to the other layers of the electrode stack by checking the position / twist / offset of each anode layer / cathode layer relative to each other after the anode layer / cathode layer has been placed on the electrode stack, and / or the control unit is set and designed to determine the offset of each anode layer / cathode layer relative to each other by image capture of at least one (vertical and / or horizontal) edge of the electrode stack by means of at least one third camera. In a variant of the device, the control unit is set and designed to check the captured images by means of corner / edge search to determine whether one or more anode layers / cathode layers of the electrode stack are higher or lower than the other anode layers / cathode layers and / or whether the accuracy has been maintained when stacking the anode layer / cathode layer.

[0100] In a variant of the device, the control unit is set and designed to determine the different dimensions of the (vertical) edges that are stepped in the z-direction in the lateral view based on the captured images of the alternately stacked anode and cathode layers in the electrode stack and to check the shape and / or dimensions of the stacked anode and cathode layers. In a variant of the device, the control unit is set and designed to check the stacked anode and cathode layers to determine by what deviation each individual layer is higher / lower than the other anode or cathode layers of the electrode stack. In a variant of the device, the control unit is set and designed to check the captured images to determine by what z-direction (vertical axis) deviation the different anode layers / cathode layers form steps in the electrode stack.

[0101] In a variant of the device, the control unit is configured and designed to receive captured images from at least two third cameras, which images contain the corners and / or their edges captured from the side on the vertical axis (z-axis) of the electrode stack at the placement point, in order to inspect the stacked anode layers and cathode layers to determine in what x-direction or y-direction (lateral, longitudinal) deviation each individual layer is above / below other anode or cathode layers of the electrode stack in the longitudinal and / or transverse direction of the layer; and / or to inspect in what z-direction (vertical axis) deviation different anode / cathode layers form steps in the electrode stack.

[0102] In a variant of the device, at least two cameras are aligned with the (vertical) edges of the electrode stack, and / or a (white) spotlight illuminates the desired positions on the electrode stack in order to provide illumination for the relevant edges of the electrode stack.

[0103] In a variant of the device, the control unit is configured and designed to receive captured images from at least four cameras, which images contain the four corners of the electrode stack at the placement point as seen from the side, in order to determine the position of the anode / cathode layer stacked on top in the electrode stack relative to at least one layer located below it, which is achieved by: after the anode / cathode layer is placed on the electrode stack, the position / twist / offset of each anode / cathode layer relative to each other is inspected by image capture of each of the four cameras.

[0104] In a variant of the device, the control unit is configured and designed to take into account the movement of the lifting device with the associated workpiece carrier along the vertical axis (z-axis) and its errors, which is achieved by: before starting to place the anode / cathode layer to form the electrode stack, using a third camera to detect the x- and y-positions of the workpiece carrier at different z-axis heights by capturing images, and storing the corresponding data in the data memory in order to compare with the x- and y-positions of the workpiece carrier at different z-axis heights during the placement of the anode / cathode layer, so as to inspect whether the anode / cathode layer has been stacked within the accuracy range at the x- and y-positions corresponding to the relevant z-axis position of the workpiece carrier on the lifting device, and / or to correct the orientation in the rotational direction around the z-axis (vertical axis) (θ-direction) when picking up and / or placing the anode / cathode layer.

[0105] The above procedures and devices greatly reduce the risk of short circuits occurring in the resulting modules, thereby improving the overall quality and efficiency of the finished fuel cell or battery cell.

[0106] Overall, the above devices and methods can achieve an accuracy of ±0.1 mm or higher at high stack throughput.

[0107] The method aspects have been introduced above in the form of an apparatus, and vice versa. Both the method aspects and the apparatus aspects contribute to the explanation of the configuration and its operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0108] Other features, characteristics, and advantages of the apparatus and the processing method can be obtained from the following description in conjunction with the drawings. Those skilled in the art can clearly understand the possible variations from the following description with reference to the drawings. Among them, the figures schematically show the apparatuses discussed herein and explain the operation of these apparatuses. In individual cases, the same or similar components in the figures are not separately labeled with reference numerals.

[0109] Wherein:

[0110] Figure 1 is a front schematic view of an apparatus for manufacturing a module or a module precursor;

[0111] Figure 2 is a side schematic view of one of two layer flippers of another variant of an apparatus for manufacturing a module or a module precursor;

[0112] Figure 3 is a perspective side view of a layer flipper with a stacking table on which a stack is placed;

[0113] Figure 4a and Figure 4b is a top view of a shelf of a stacking table on which a stack is placed at first and second placement points configured with an image acquirer for a second inspection;

[0114] Figure 5a and Figure 5b is a top view of a shelf of a stacking table on which a stack is placed at first and second placement points configured with an image acquirer for a third inspection;

[0115] Figure 6 is a top view of a shelf of a stacking table on which a stack is placed at first and second placement points configured with an image acquirer for a second inspection; and

[0116] Figure 7 is a top view of a shelf of a stacking table on which a stack is placed at first and second placement points further configured with an image acquirer for a third inspection.

[0117] Detailed Description of Variants of the Apparatus and Method

[0118] Figure 1 Schematically shows an apparatus 100 for manufacturing a module or a module precursor. Herein, the apparatus 100 is described by taking as an example the manufacturing of a fuel cell or a battery cell containing a layer material and / or a fluid.

[0119] In the apparatus 100, the first conveyor 110 is used to convey a single anode layer AL to the first transfer point U1 for transfer to the first layer flipper 150. The second conveyor 120 is used to convey a single cathode layer KL to the second transfer point U2 for transfer to the second layer flipper 200.

[0120] As Figure 1 shown, the first conveyor 110 and the second conveyor 120 are arranged in the upper region of the apparatus 100 at the same level, adjacent to each other and at a certain distance. Here, the first conveyor 110 and the second conveyor 120 are designed as belt conveyors, and their respective bottom surfaces 112, 122 face the first and second layer flippers 150, 200 respectively. Thus, the first conveyor 110 and the second conveyor 120 can convey the single anode layer AL and the single cathode layer KL on their bottom surfaces 112, 122 to the first and second transfer points U1, U2. In particular, the first conveyor 110 and the second conveyor 120 each have a controlled negative pressure conveyor belt with suction ports 114, 124 in order to suck and hold the single anode layer AL and the single cathode layer KL by means of a pneumatic negative pressure p-- provided in a controlled manner, and hold them during the conveyance to the first and second transfer points U1, U2. By means of a pneumatic overpressure p++ that can be optionally provided in a controlled manner, the single anode layer AL and the single cathode layer KL can be quickly and controllably transferred to the first and second layer flippers 150, 200 at the first and second transfer points U1, U2 respectively. As an alternative, the pneumatic negative pressure p-- of the first and second conveyors 110, 120 can be reduced or cancelled at the first and second transfer points U1, U2. The first conveyor 110 can receive the single anode layer AL from a stack or a third conveyor (not shown), in particular from a negative pressure conveyor belt. The second conveyor 120 can receive the single cathode layer KL from a stack or a fourth conveyor (not shown), in particular from a negative pressure conveyor belt.

[0121] The first and second layer flippers 150, 200 each have four generally rectangular planar pickers 156, 206 and a first drive device 300 (see Figure 2)。The pickers 156, 206 are used to pick up single anode layers AL and cathode layers KL from the upper planes of the first and second conveyors 110, 120 at the first or second transfer points U1, U2. These pickers 156, 206 are indirectly mounted in a radially displaceable manner on shafts 160, 210 which are rotatably mounted. These shafts 160, 210 are rotated by a first drive device 300 by a respective rotational angle RW (here 180°) so that the pickers 156, 206 reach their respective first or second handover points A1, A2. The first drive device 300 drives the layer turners 150, 200 to rotate as a whole. In this way, the first and second layer turners 150, 200 are arranged to pick up single anode layers or cathode layers AL, KL with their multiple pickers, and pick up or hand over single anode layers or cathode layers AL, KL when the pickers successively or periodically rotate past the transfer points U1, U2 and the handover points A1, A2 one by one. The first and second layer turners 150, 200 are rotated clockwise or counterclockwise by their respective first drive devices 300 so that the single anode layers or cathode layers AL, KL reach the handover points A1, A2 from the transfer points U1, U2 while avoiding the space R between the first and second layer turners 150, 200.

[0122] Obviously, the first and second layer turners 150, 200 basically have a consistent structure, consistent function and / or consistent dimensions.

[0123] The endless diaphragm belt, not shown in detail in the figure, enters from between the two conveyors 110, 120 from top to bottom and passes through the space R, and exits from the gap between two rotatably mounted rollers at the lower end of the space R. The diaphragm belt is folded into a Z shape on the stacking table, and the anode layers and cathode layers are separated by the diaphragm belt.

[0124] The first and second layer turners 150, 200 (see Figure 1 ) have a set of linear drive devices 351 arranged on a turntable as a second drive device 350 for the pickers 156, 206, where there is always a linear drive device 351 in driving coupling with one of the pickers 156, 206 to retract and / or extend the picker of the relevant layer turner 150, 200 radially.

[0125] In another variant, the first and second layer turners 150, 200 each have a second drive device 350 for the pickers 156, 206 (see Figure 2)。After the relevant layer is placed on the stacking table 400, when the pickers of another layer flipper approach their transfer points U1, U2 in the space between the two layer flippers, the second drive device 350 is used to radially retract the relevant pickers 156, 206. The second drive device 350 drives the tubes, the turntables connected thereto, and the pickers 156, 206 to rotate around the rotation center DZ. Due to being coupled to the eccentrics described below, the pickers 156, 206 will move radially. The first drive device 300 is a controlled servo motor, which drives the layer flipper to rotate integrally so as to flip the picker around the rotation center of the layer flipper. At Figure 2 In the variant shown, the second drive device 350 is a servo motor that can be controlled independently of the first rotation drive device 300, and this servo motor is drivingly coupled to the inner shafts 160, 210 designed as eccentric shafts. This eccentric shaft is equipped with eccentrics 372, 374 for each picker, so that the pickers 156, 206 of the layer flippers 150, 200 retract and extend radially. For this purpose, each eccentric 372, 374 is surrounded by a needle bearing, and the outer sides of the needle bearings are equipped with rings 376, 378, which are respectively hinged to the relevant pickers 156, 206. When the shafts 160, 210 rotate, the eccentrics 372, 374 will move the pickers 156, 206 guided in the radially oriented linear guides 380, 382 outward or inward. In particular, when the pickers of the first and / or second layer flippers approach the pickers of another layer flipper on the way from the handover point to the transfer point or from the transfer point to the handover point, the pickers will retract radially.

[0126] The second drive device 350 drives the inner shafts 160, 210 to rotate and causes the pickers to extend and retract radially. In particular, when the pickers approach the first and second transfer points U1, U2 and the first and second handover points A1, A2, the second drive device 350 is also used to drive the first and second layer flippers to radially extend their respective pickers. In summary, in this variant, the pickers of the two layer flippers each move on an approximately upright ellipse, the major axis of which extends from the center of the relevant transfer point to the center of the relevant handover point, and the minor axes of which do not touch each other. At Figure 1 In this, this ellipse E is shown in dotted line at the second layer flipper 200. It can be seen that this movement is not necessarily symmetric, because the pickers far from the space R extend radially more than the pickers located in the space R.

[0127] The first drive device 300 and the second drive device 350 are combined by a combined bevel gear and axial transmission device 390, and drive the inner shafts 160, 210 or all the pickers of the layer flipper to rotate integrally independently of each other through connecting elements (such as tubes 352). As Figure 2As shown, the tube 352 and the shaft coupled to the first drive device 300 have a collinear axis of rotation.

[0128] The stacking table 400 for picking up stacks of individual anode layers AL and cathode layers KL at the first and second transfer points A1, A2 is equipped with a drive device 410. This drive device 410 drives the stacking table 400 to move back and forth between the first and second transfer points A1, A2 along the x-axis in a controlled manner, so that the position of the stacking table 400 is accurately aligned with the individual anode layers and cathode layers AL, KL to be placed thereon. In Figure 1 the figure, the stacking table is shown by a solid line when in the left alignment position below the layer inverter 150, and by a dash-dotted line when in the right alignment position below the layer inverter 200.

[0129] When the pickers 156, 206 are located at the first and second transfer points A1, A2, the first and second layer inverters 150, 200 transfer the individual anode layers and cathode layers AL, KL from their pickers 156, 206 (located at Figure 1 the 6 o'clock position in the figure) to the stacking table 400 at the first and second transfer points A1, A2 respectively.

[0130] For this purpose, in the variant of the device 100 shown here, the first and second transfer points U1, U2 each have a first center (approximately above the center of the picker at the 12 o'clock position between the picker and the conveyor), and the first and second transfer points A1, A2 each have a second center (approximately below the center of the picker at the 6 o'clock position between the picker and the stacking table). These first and second centers are located on an imaginary straight line that intersects the center of rotation DZ of the first layer inverter 150 or the second layer inverter 200. The first and second layer inverters respectively only flip the individual anode layer AL and the individual cathode layer KL to the first and second transfer points A1, A2.

[0131] In a configuration with an eccentric drive device, the first drive device of one layer inverter and the second drive device of the same layer inverter can rotate continuously in the same direction, or can also rotate temporarily in opposite directions. In this way, the overall rotational movement of the layer inverter can be superimposed on the radial telescopic movement of its picker, making the distance between the two layer inverters particularly short, and thus making the distance between the two transfer points particularly short. In addition, the two layer inverters (in Figure 1 and Figure 2In the two variants), rotation can occur through their respective first drive devices, causing the pickers of one layer inverter to rotate in exactly the opposite direction relative to the pickers of the other layer inverter. This means that, in the case where each layer inverter has pickers, one picker of one layer inverter is located near the transfer point, while one picker of the other layer inverter is located near the handover point. In the case where each layer inverter has four pickers, one picker of one layer inverter is approximately 45° ahead of one picker of the other layer inverter.

[0132] The stacking table 400 has a shelf 420 for placing single anode layers and cathode layers AL, KL and a positioning device 430 having a respective rotational drive device about the z-axis for moving the shelf 420 along the above-mentioned axis and about the z-axis. In this way, the stacking table 400 and its shelf 420, or more precisely, its center, can be precisely aligned with the first and second handover points A1, A2 and the picker located at the 6 o'clock position.

[0133] The stacking table 400 has first and second clamping fingers 442, 444. In one variant, two clamping fingers are provided on each of the opposite sides. Among them, the clamping fingers move in the y-direction perpendicular to the rotational plane of the picker. These two clamping fingers 442, 444 laterally clamp the electrode stack formed by the anode layer and the cathode layer AL, KL from both sides (lateral side or longitudinal side) in the x-direction or y-direction and engage or disengage from the uppermost layer of the anode layer and the cathode layer AL, KL in a controlled manner so as to press the uppermost layer of the anode layer and the cathode layer AL, KL against the electrode stack ES on the shelf 420. For this purpose, according to the arrangement of the clamping fingers 442, 444, corresponding linear drive devices 446, 448 are provided in the z-direction and the x-direction or y-direction, which drive the first and second clamping fingers 442, 444 to move relative to the bottom plate 450 and the shelf 420 of the stacking table 400 in a controlled manner. In one variant, the stacking table 400 is supported on a rigid plate having grooves. The bottom plate 450 can only move relative to the rigid plate along two linear guides in the x-direction. A Y-shaped plate is provided on the bottom plate 450, which can move relative to the bottom plate 450 in the y-direction. The Y-shaped plate carries an actuator plate. The shelf 420 is located on the actuator plate. The actuator plate can rotate about the z-axis together with the shelf 420, so that the clamping fingers and their actuators can also rotate about the z-axis.

[0134] According to the movement direction and arrangement of the clamping fingers, an x-direction actuator or a y-direction actuator is provided on the actuator plate for each clamping finger so as to be able to position a single clamping finger in the y-direction. The z-direction driver of each clamping finger is arranged on a separate plate, which is arranged on the Y-shaped plate and beside the shelf 420. The y-direction actuator drives the displacement of the separate plate in this way, so that the clamping fingers 442, 444 are displaced together with their z-direction drivers.

[0135] The clamping fingers 442, 444 are also used to clamp the endless diaphragm belt on the shelf 420 or the previously formed stack when the stacking table moves between the transfer points A1, A2, so that the anode layer and the cathode layer Al, KL placed on the shelf 420 are always separated by the electrically insulating diaphragm.

[0136] When the Y-shaped plate is displaced in the y-direction, the actuator plate will also be displaced in the y-direction together with the clamping fingers. The shelf 420 can be positioned in the z-direction by a z-direction drive, which can be arranged directly below the shelf and leave a moving space in the x-direction in the central groove of the rigid plate.

[0137] The first and second layer turners 150, 200 are designed to pick up a single anode layer AL and a single cathode layer KL by controlled pneumatic negative pressure p-- and hold them during the turning to the first and second transfer points A1, A2. In addition, in the variant of the device 100 shown here, the first and second layer turners 150, 200 are designed to transfer a single anode layer AL and a single cathode layer KL by short blowing impacts at the first and second transfer points by means of controlled pneumatic overpressure p++, so as to stack the layers AL, KL on the shelf 420 to form an electrode stack ES.

[0138] For this purpose, as Figure 2 shown, the first and second layer turners 150, 200 each have a rotatable overpressure / negative pressure distribution device 650, which is arranged around the inner shafts 160, 210 to provide controlled pneumatic negative pressure p-- and / or overpressure p++ for the pickers. Among them, two concentric rings 652, 654 are rotatably surrounded by each other in a fluid-tight manner, thereby realizing overpressure / negative pressure transfer 656 for each picker. For each picker 156, 206, a fluid pipeline extends from the overpressure / negative pressure transfer 656 to the inner shafts 160, 210 and then extends from there to the connection point of the radial flexible pipeline 656 and the relevant picker 156, 206. The flexible pipeline 656 communicates with a plurality of openings on the picker surface away from the rotation center.

[0139] As an alternative, an elastic nozzle is assigned to each of these openings, which slightly protrudes from the picker surface (the protruding degree is less than 3mm, for example) and is connected to the flexible pipeline 656. In this way, the anode layer AL and the cathode layer KL can be picked up safely and gently and transferred to the shelf 420 with high alignment accuracy. During the stacking process, after each single anode layer AL and single cathode layer KL are placed, the positioning device 430 will lower the shelf 420 by a certain distance in a controlled manner, and this distance corresponds to the thickness of a single anode layer AL or a single cathode layer KL. This ensures that the free path from the transfer pickers 156, 206 to the arrival of the electrode stack ES is very short and clear.

[0140] The first to third inspections of the layer materials included in the above variants, such as the first to third inspections carried out during the manufacturing process of fuel cells or battery cells, will be described below.

[0141] The first inspection device has a first layer conveyor 150 with four pickers 156 and a first drive device 300 ( Figure 1 left side) for picking up a single anode layer or cathode layer AL, KL from a first transfer point U1 by at least one picker 156 and delivering it to a first handover point A1. When at least one picker 156 is at the first handover point A1, the first layer inverter 150 hands over the single anode layer or cathode layer AL, KL from its picker 156 to the stacking table 400 at the first handover point A1, more precisely to its shelf 420. The drive device 410 aligns the picker 156 and the stacking table 400 with each other according to a signal issued by processing the first and / or second image captures. The first image collector K1 aligns a first area E1 of the first layer inverter 150 between the first transfer point U1 and the first handover point A1 and performs a first image capture when the picker 156 of the first layer inverter 150 with a single anode layer or cathode layer AL, KL passes by the first image collector K1. The second image collector K2 aligns a second area E2 of the first layer inverter 150 between the first transfer point U2 and the first handover point A2 and performs a second image capture when the picker 156 of the first layer inverter 150 with a single anode layer or cathode layer AL, KL passes by the image collector K2. The second area E2 can be different from the first area E1. The stacking table 400 picks up the relevant single anode layer AL at the first handover point A1 and the relevant single cathode layer KL at the second handover point A2 to form a stack.

[0142] In the illustrated variant, the first layer conveyor 150 has a layer inverter 156 for picking up a single anode layer or cathode layer from a first transfer point U1 by at least one picker 156 and rotating it by a certain rotation angle (about 180° here) to reach the first handover point A1.

[0143] In a variant not further illustrated here, the first layer conveyor 150 has a layer gripper that picks up a single anode layer or cathode layer from a first transfer point U1 by a picker (in the form of, for example, a suction tool or a gripping tool) and delivers it to the first handover point A1.

[0144] Similar to the first layer conveyor 150, the second layer conveyor 200 ( Figure 1On the right side in the middle) is set and designed to pick up a single cathode layer or anode layer KL, AL and deliver it to the second handover point A2. The first image collector K1' between the second transfer point U2 and the second handover point A2 is aligned with the first area E1' of the second layer conveyor 200, and a first image capture is performed when the second layer conveyor 200 passes by the first image collector K1'. The second image collector K2' is aligned with the second area E2' of the second layer conveyor between the second transfer point U2 and the second handover point A2, and a second image capture is performed when the second layer conveyor passes by the second image collector K2'.

[0145] In the illustrated variant, the second layer conveyor 200 has a layer flipper 206 that picks up a single anode layer or cathode layer from the second transfer point U2 by means of at least one picker 206 and rotates it by a certain rotation angle (here 180°) to reach the second handover point A2.

[0146] In a variant not further illustrated, the second layer conveyor 200 has a layer gripper that is set and designed to pick up a single anode layer or cathode layer from the second transfer point U2 by means of a picker (in the form of, for example, a suction tool or a gripping tool) and deliver it to the second handover point A2.

[0147] A drive device 410 is assigned to the stacking table 400 and drives the stacking table 400 to move back and forth between the first and second handover points A1, A2. When the stacking table is at the first or second handover point A1, A2, the first and second layer conveyors respectively hand over a single anode layer or cathode layer AL, KL to the stacking table 400 at the first and second handover points A1, A2. The drive device aligns the relevant layer conveyor and / or the relevant at least one layer flipper 156, 206 with the stacking table 400 according to the signals issued by processing the first and second image captures.

[0148] The first regions E1 and the second regions E2 of the pickers of the two layer turners 150, 200 are here corner regions that are diagonally opposite each other on the pickers of the layer turners 150, 200. The first regions E1 and the second regions E2 of the pickers of the two layer turners 150, 200 are arranged and designed for picking up the first and second corners of a single anode layer or cathode layer AL, KL. Accordingly, the first and second image pick-up devices K1, K2, K1', K2' are arranged diagonally opposite each other and align the first regions E1 and the second regions E2 of the pickers of the two layer turners 150, 200 when the pickers pass by the first and second image pick-up devices K1, K2, K1', K2'. The first and second image pick-up devices K1, K2, K1', K2' are arranged between the two transfer points U1, U2 and the two handover points A1, A2 so as to align the first and second regions E1, E2 of the pickers 156, 206 at the moment of the first and / or second image capture. At the inspection positions of the first and / or second image pick-up devices K1, K2, K1', K2', the angle between the camera axis and the anode or cathode is approximately 90°.

[0149] The first and / or second image pick-up devices K1, K2, K1', K2' can be adjusted along their optical axes for focusing. As an alternative or in addition, in other variants, the first and / or second image pick-up devices can also be moved during operation. The white light sources assigned to the first and second image pick-up devices K1, K2, K1', K2' illuminate the anode layer / cathode layer in order to capture an image. In other variants, one or more optically effective elements are assigned to the first or second image pick-up devices K1, K2, K1', K2' in order to detect the position and / or orientation of the anode layer / cathode layer at one or more positions or regions before or when or on the way to the handover point. The optically effective element can be a lens or a lens assembly, a mirror or a mirror assembly, a prism or a prism assembly, a light conductor assembly, an area light, a coaxial ring light, a dark field light, etc., or a combination thereof.

[0150] The control unit ECU obtains correction values based on image capture and based on the position and / or orientation of the anode layer / cathode layer AL, KL before being picked up by the stacking table 400, the position and / or orientation of the stacking table 400, and the position and / or orientation of the individual anode layer / cathode layer AL, KL relative to the stacking table 400 during the flipping process of the anode layer / cathode layer AL, KL towards the stacking table 400. When orienting the stacking table 400 carrying the transferred anode layer / cathode layer relative to the handover points A1, A2, the control unit ECU takes these correction values into account in the positioning instructions sent to the layer flipper, picker, and / or stacking table. The control unit 400 takes these correction values, especially regarding the orientation and position of the stacking table when picking up the anode layer / cathode layer, into account in the positioning instructions sent to the layer flipper, picker, and / or stacking table, so that the stacking table picks up the anode layer / cathode layer at the central zero position and / or in alignment with the electrode stack located at the handover point.

[0151] The control unit determines the orientation and position of the stacking table 400 when picking up the anode layer / cathode layer AL, KL by checking the position of the incoming anode layer / cathode layer AL, KL directly in front of the handover points A1, A2 during image capture.

[0152] During the inspection process, an inspection method including the following steps is also used: picking up the anode layer / cathode layer AL, KL from the transfer points U1, U2 by the pickers 156 of the layer flippers 150, 200; transporting the pickers 156 of the layer flippers 150, 200 from the transfer points to the handover points A1, A2; detecting the x, y, z, and / or θ-direction position and / or orientation of the anode layer / cathode layer AL, KL on the pickers 156 of the layer flippers 150, 200 by the first image collector K1 between the transfer point U1 and the handover point A1, where the first image collector K1 is aligned with the first area E1 of the layer flipper 150 and is set and designed to perform the first image capture when the picker of the layer flipper passes by the first image collector K1; detecting the x, y, z, and / or θ-direction position and / or orientation of the anode layer / cathode layer AL, KL on at least one picker 156 of the layer flippers 150, 200 by the second image collector K2 between the transfer points U1, U2 and the handover point A1, where the second image collector K2 is aligned with the second area E2 of the layer flipper 150 and is set and designed to perform the second image capture when the picker of the layer flipper passes by the second image collector K2; aligning the picker 156 and the stacking table 400 (more precisely its shelf 420) with each other according to the signals issued by processing the first and / or second image captures; and transferring the anode layer or cathode layer AL, KL from the picker 156 to the stacking table 400 at the handover points A1, A2 when the picker 156 is located at the handover points A1, A2 to form a stack.

[0153] When the picker of the layer turner passes by the image pickers K1, K2, the first and second image pickers K1, K2 detect the position and / or orientation of the anode layer / cathode layer AL, KL in the x, y, z, and / or θ directions from a perspective looking vertically down on the anode layer / cathode layer AL, KL. The light sources L1, L2 assigned to the first and / or second image pickers K1, K2 illuminate the anode layer / cathode layer AL, KL so that the first and second image pickers K1, K2 can capture images. In a variant not shown, the first and second image pickers K1, K2 thoroughly detect the anode layer / cathode layer AL, KL during image capture to detect its position and / or orientation in the x, y, z, and / or θ directions. In another variant, the first and / or second image pickers K1, K2 detect a region, at least one corner region, two diagonal corner regions, or at least one corner region and at least one edge segment of the anode layer / cathode layer AL, KL through a single image capture relative to their respective fixed image picker zero points to detect the position and / or orientation of the anode layer / cathode layer AL, KL in the x, y, z, and / or θ directions. The first or second image picker K1, K2 can be designed as a matrix camera or a line scan camera to detect the position and / or orientation of the anode layer / cathode layer AL, KL in the x, y, z, and / or θ directions before, during, or on the way to the handover point A1 when the anode layer / cathode layer AL, KL reaches the handover point A1.

[0154] Correction values are obtained based on the position and / or orientation of the anode layer / cathode layer AL, KL in the x, y, z, and / or θ directions after being picked up by at least one picker of the layer turner, the position and / or orientation of the stacking table 400 in the x, y, z, and / or θ directions, and / or the position and / or orientation of a single anode layer / cathode layer AL, KL picked up during the flipping of the anode layer / cathode layer AL, KL towards the stacking table 400. These correction values are taken into account when the picker of the layer turner carrying the conveyed anode layer / cathode layer AL, KL is oriented with respect to the stacking table 400 in the x, y, z, and / or θ directions at the handover points A1, A2. When orienting the stacking table 400 or the picker of the layer turner, these correction values are considered in the x, y, z, and / or θ directions so that the anode layer / cathode layer AL, KL can be picked up by the stacking table 400 at the central zero position and / or in an aligned manner with each other.

[0155] In the second inspection device 100, the first layer conveyor 150 picks up a single anode layer or cathode layer AL, KL from the first transfer point U1 and delivers it to the first handover point A1. The stacking table 400 (more precisely, its shelf 420) picks up a single anode layer or cathode layer AL, KL at the first handover point A1 to form a stack. When the stacking table is located at the first handover point A1, the first layer conveyor 150 hands over the single anode layer or cathode layer AL, KL to the stacking table 400 at the first handover point A1. The third image collectors K3, K3' are aligned in a lateral view with at least one area E3, E3' that includes the upper edge OK of the stack located on the stacking table 400. This area E3, E3' includes the tabs T of the anode layer or cathode layer AL, KL located at the top of the stack. After the anode layer or cathode layer AL, KL is placed on the stack on the stacking table 400, the third image collectors K3, K3' perform a third image capture. The control unit ECU indicates the (in)availability of the stack based on the signals issued from the processing of the third image capture.

[0156] The layer conveyor here has a layer flipper that picks up a single anode layer or cathode layer from the first transfer point U1 by one of four pickers 156 and rotates it by a certain rotation angle (here 180°) to reach the first handover point A1.

[0157] In a variant not further illustrated, the layer conveyor has a layer gripper that picks up a single anode layer or cathode layer from the first transfer point U1 by a picker (in the form of, for example, a suction tool or a gripping tool) and delivers it to the first handover point A1.

[0158] A second layer conveyor similar to the first layer conveyor picks up a single cathode layer or anode layer KL, AL and delivers it to the second handover point A2. A drive device 410 is assigned to the stacking table 400 and drives the stacking table 400 to move back and forth between the first and second handover points A1, A2. When the stacking table is located at the first and second handover points A1, A2, the first and second layer conveyors respectively hand over the single anode layer or cathode layer AL, KL to the stacking table 400 at the first and second handover points A1, A2. At least one drive is used to orient the layer conveyor and / or at least one layer flipper 156, 206 or layer gripper relative to the stacking table 400 based on the signals issued from the processing of the first and / or second image capture in the control unit ECU.

[0159] The second layer conveyor also has a layer flipper that similarly picks up a single anode layer or cathode layer from the second transfer point U2 by a picker 206 and rotates it by a certain rotation angle (here 180°) to reach the second handover point A2.

[0160] In a variant not shown, the second-layer conveyor has a layer gripper that picks up a single anode layer or cathode layer from the second transfer point U2 by means of a picker, which is in the form of, for example, a suction tool or a gripping tool, and delivers it to the second handover point A2.

[0161] The first third region E3 and the second third region E3' of the stack (see Figure 4a ) each include, in a side view, the tabs of the uppermost anode layer or cathode layer AL, KL on the stacking table 400 at the first or second handover point A1, A2. One or two third image pick-up devices K3, K3a, K3', K3a' are arranged on the first side of the inspection device 100 or the shelf 420, for example Figure 1 on the left side in, one or two third image pick-up devices K3, K3a, K3', K3a' are arranged on the second side of the inspection device 100 opposite the first side, for example Figure 1 on the right side in. The two third image pick-up devices K3, K3a, K3', K3a' on one side of the inspection device 100 or the shelf 420 are spaced apart from each other in the y-direction. In a variant, one or more third image pick-up devices K3, K3a, K3', K3a' are arranged in fixed positions relative to the stacking table 400 that moves back and forth between the two handover points A1, A2. This is shown by Figure 4a . In a variant not shown in detail, only two of the four fixed third image pick-up devices K3, K3a'K3a, K3' arranged diagonally are provided, namely Figure 4a the third image pick-up devices K3, K3a' or the third image pick-up devices K3a, K3' in. As an alternative, in a variant not shown in detail, only two of the four fixed third image pick-up devices K3, K3a'K3a, K3' arranged on one side of the stacking table 400 are provided, namely Figure 4a the third image pick-up devices K3, K3a or the third image pick-up devices K3a', K3' in. In a variant, the optical axis of one of the third image pick-up devices or the optical axis of each of the plurality of image pick-up devices is horizontally oriented, or has a maximum deviation from the horizontal line of + / - 10°.

[0162] As another variant, Figure 6 shows a top view of the shelf 420 with the stacking table on which the stack is placed at the first and second placement points configured with image pick-up devices for a second inspection. Taking the third image pick-up devices K3a, K3' as an example, they detect the first and second third regions E3, E3' respectively with backlight or transmitted light (from the outside in a side view) from the light source WL. In this way, the tabs of the uppermost anode layer or cathode layer AL, KL on the stacking table 400 at the first and second handover points A1, A2 are inspected.

[0163] If space conditions permit, in other variants, one or more third image collectors K3, K3a, K3', K3a' are fixedly connected to the stacking platform 400 (see Figure 4b ), and can move with it between the two transfer points A1, A2. In a variant not shown in detail, only two third image collectors arranged along the diagonal line are provided among the four third image collectors K3, K3a'K3a, K3' that can move with the stacking table, that is, Figure 4b As an alternative, in a variant not shown in detail, only two third image collectors K3, K3a'K3a, K3' arranged on one side of the stacking platform 400 are provided among the four third image collectors K3, K3a'K3a, K3' that can move with the stacking platform, that is, Figure 4b The third image collector K3, K3a that can move with the stacking table or the third image collector K3a', K3' that can move with the stacking table.

[0164] The third image collector K3, K3a, K3', K3a' can be adjusted along its optical axis so as to focus on the area E3, E3'. The light source L3 (see Figure 3 ) illuminates the anode layer / cathode layer on the stack so that the third image collector captures the image. The light source L3 is a coaxial ring lighting device here. The coaxial ring lighting device is arranged on the side of the third image collector K3, directly adjacent to each of the third image collectors K3, K3a, K3', K3a' on the side of the position of the wiring lug T on the stacking table 400, and is configured to include the wiring lug T in the beam path. Therefore, by processing the third image capture, when the top edge of the wiring lug T is not horizontally oriented in the image capture and / or causes an interfering contour, the vertical tilting of the wiring lug T can be identified.

[0165] A second inspection method performed during the manufacturing process of a module or a module precursor includes the following steps: picking up the anode layer / cathode layer AL, KL at a first transfer point U1, and sending the anode layer or cathode layer AL, KL from the first transfer point U1 to a first handover point A1; handing over a single anode layer or cathode layer AL, KL to the stacking table 400 at the handover points A1, A2 to form a layer stack; aligning the third image collector K3, K3' with a lateral perspective at an area E3, which includes an upper edge OK of the layer stack located on the stacking table 400, wherein the area includes a terminal T of the anode layer or cathode layer AL, KL located at the top of the layer stack; wherein, after the anode layer or cathode layer AL, KL is placed on the stacking table 400, a third image capture is performed by the third image collector K3, K3'; and the unavailability of the layer stack is indicated based on a signal emitted by processing the third image capture.

[0166] In the illustrated variant, the coaxial annular lighting device is arranged on the side of the third image collector, that is, on the side of the position of the lug T on the stacking table 400, and the third image collector K3 is set so that the lug T is included in the beam path. Finally, a third image capture is performed and processed in the ECU so that the tilting of the lug T is identified by processing the third image capture, that is, in the third image capture, the top edge of the lug T is not horizontally oriented and / or causes an interfering contour.

[0167] In the third inspection device 100 for layer materials (especially layer materials for manufacturing fuel cells or battery cells), the first layer conveyor 150 picks up a single anode layer or cathode layer AL, KL and delivers it to the first handover point A1. The stacking station 400 picks up the anode layer or cathode layer AL, KL at the first handover point A1 to form a stack. The first layer conveyor 150 transfers the anode layer or cathode layer AL, KL to the stacking station 400 at the first handover point A1. The fourth image collector K4 is aligned with the fourth area E4 of the stack composed of the anode layer and the cathode layer AL, KL in a planar lateral viewing angle of the stack, and after the anode layer or cathode layer AL, KL is placed on the stack on the stack 400, a fourth image capture is performed, wherein the fourth area E4 includes the corners of the anode layer or cathode layer AL, KL located at the top of the stack and / or the vertical edge HK of the stack. In this way, not only the layer stacked on the top can be identified, but also one or more mispositioned layers further down in the entire stack can be identified. In this way, outliers that are offset due to process changes can be found. In the illustrated variant, the fifth image collector K5 is aligned with the fifth region E5 of the stack composed of the anode layer and the cathode layer AL, KL with a plane lateral perspective of the stack, and after the anode layer or the cathode layer AL, KL is placed on the stack on the stacking table 400, the fifth image capture is performed, wherein the fifth region E5 includes the corners of the anode layer or the cathode layer AL, KL located at the top (or below, see above) of the stack and / or the vertical edge HK of the stack. Regions E4 and E5 are separated here. In particular, the fourth region E4 and the fifth region E5 of the anode layer or the cathode layer AL, KL include regions on the stack composed of the anode layer and the cathode layer AL, KL that are adjacent to each other on the layer surface or diagonally opposite to each other from the lateral perspective of the stack.

[0168] The layer conveyor comprises a layer turner 156 in order to pick up a single anode layer or cathode layer from the first transfer point U1 by means of at least one picker 156 and turn it through a certain rotation angle (here 180°) to reach the first handover point A1.

[0169] The fourth image collector K4 and the fifth image collector K5 can be adjusted along their optical axes for focusing. The light source assigned to the fourth image collector K4 and the fifth image collector K5 illuminates the anode layer / cathode layer so that the fourth image collector K4 or the fifth image collector K5 performs the fourth image capture or the fifth image capture. At least one optically effective element is assigned to the fourth image collector K4 and the fifth image collector K5 respectively, and after the anode layer or cathode layer AL, KL is placed on the stack, the optically effective element enables the corner E4 or E5 of the anode layer or cathode layer AL, KL located at the top of the stack and the vertical side HK of the stack to be identified in the fourth image capture and the fifth image capture. The at least one optically effective element is a coaxial annular lighting device. The coaxial annular lighting device is located on the side of the fourth image collector K4 or the fifth image collector K5, that is, the side where the corner of the anode layer or cathode layer AL, KL located at the top of the stack (or lower, see above) and the vertical side HK of the stack are located. The coaxial ring illumination device - together with the associated image acquisition device - incorporates corners and / or vertical edges HK into the beam path. Therefore, by processing the fourth and fifth image captures, it is possible to identify tilting, offset or twisting of the anode layer or cathode layer AL, KL about the vertical axis, i.e. corners and / or vertical edges HK that cause interfering contours in the image capture.

[0170] When the stacking station is located at the first or second handover point A1 , A2 , the first fourth area E4 and the second fourth area E4 ′ of the stack respectively include the corners of the anode layer or cathode layer AL, KL at the top of the stack and the vertical edges HK of the stack on the stacking station 400 .

[0171] In one variant, the first fourth image collector K4 and the first fifth image collector K5 are arranged on the first side ( Figure 5a The second fourth image collector K4' and the second fifth image collector K5' are arranged on the second side ( Figure 5a ). Figure 5a In , the fourth and fifth image collectors are arranged in fixed positions relative to the movable stacking table 400 (more precisely, its shelf 420). Figure 5b In the embodiment, the fourth and fifth image collectors are connected to the stacking stage 400 so as to be able to move therewith.

[0172] To achieve a compact and low-vibration overall arrangement of the inspection device, in one variant, the first and / or second image pickers K1, K2, optionally also the first fourth image picker K4 and / or the first fifth image picker K5 are arranged on a support frame which extends parallel to the picker 156 when the picker 156 passes by the first and / or second image pickers K1, K2. In another embodiment, the support frame can be L-shaped (lying L) and wrap around the layer inverter 150 in an L-shape such that the side of the layer inverter 150 facing away from the first drive device 300 (see Figure 2 ) is rotatably mounted on the support frame. For the same purpose, such a support frame can also be assigned to the second layer inverter 200 in order to accommodate the image pickers assigned to the second layer inverter 200.

[0173] In a variant not shown in detail, only two of the four fourth and fifth image pickers K4, K4', K5, K5' arranged diagonally are provided, i.e., Figure 5a or Figure 5b the image pickers K4, K5' or the image pickers K4', K5 among them. As an alternative, in a variant not shown in detail, only two of the four fourth and fifth image pickers K4, K4', K5, K5' which can move with the stacking table are provided on the side of the stacking table 400, i.e., Figure 5b the image pickers K4, K5 which can move with the stacking table 400 or the image pickers K4', K5' which can move with the stacking table.

[0174] As other variants, Figure 7 shows a top view of the shelf of the stacking table on which the stack is placed at the first and second placement points configured with image pickers for the third inspection. Among them, the fourth and fifth image pickers K4, K5, K4', K5' are exemplaryly at an angle β of approximately ±5° to approximately ±25°, for example approximately ±13°, with respect to the longitudinal or transverse sides of the anode layer or cathode layer AL, KL located at the top of the stack. This can avoid the disturbing effects of (not shown) annular or S-shaped endless diaphragms. Looking from above, the optical axes of the fourth or fifth image pickers K4, K5, K4', K5' located at the first or second handover points A1, A2 can be selectively inclined to the left or right of the (imaginary) extended transverse or longitudinal sides of the anode layer or cathode layer AL, KL located at the top of the stack, with an inclination angle of β. Figure 7This is represented by the image pick-up device shown in dashed lines. In this way, the corner regions of the uppermost anode layer or cathode layer AL, KL on the stacking table 400 are inspected at the first or second handover points A1, A2. The third inspection method includes the following steps: picking up the anode layer / cathode layer AL, KL from the transfer points U1, U2 by at least one pick-up device 156, 206 of the layer turners 150, 200; when at least one pick-up device 156, 206 is located at the handover points A1, A2, transferring the single anode layer or cathode layer AL, KL from at least one pick-up device 156 at the handover point A1, A2 to the stacking table 400 to form a stack; aligning the fourth image pick-up device K4 with a lateral view of the plane of the stack composed of the anode layer and the cathode layer AL, KL to the fourth region E4 of the stack, wherein the fourth region E4 includes the corners of the anode layer or cathode layer AL, KL located at the top of the stack and / or the vertical edge HK of the stack; and after placing the anode layer or cathode layer AL, KL on the stack on the stacking table 400, performing a fourth image capture; and / or aligning the fifth image pick-up device K5 with a lateral view of the plane of the stack composed of the anode layer and the cathode layer AL, KL to the fifth region E5 of the stack, wherein the fifth region E5 includes the corners of the anode layer or cathode layer AL, KL located at the top of the stack and / or the vertical edge HK of the stack; and after placing the anode layer or cathode layer AL, KL on the stack on the stacking table 400, performing a fifth image capture. Among them, the fourth region E4 and the fifth region E5 of the anode layer or cathode layer AL, KL include regions on the stack composed of the anode layer and the cathode layer AL, KL that are adjacent to each other on the layer surface (for example, located on the same edge of the layer) or opposite to each other along the diagonal when viewed from the lateral view of the stack; and indicating the (in)availability of the stack according to the signals issued by processing the fourth and fifth image captures.

[0175] The fourth and fifth image collectors K4, K5 can be adjusted along their optical axes for focusing. The image collectors K4, K5K4', K5' illuminate the fourth and fifth areas E4, E5 for the fourth and fifth image captures with the light source assigned to the fourth and fifth image collectors. Optically effective elements are assigned to the fourth and fifth image collectors, respectively, in the form of coaxial ring lighting devices, so that after the anode layer or cathode layer AL, KL is placed on the stack, the corners of the anode layer or cathode layer AL, KL at the top of the stack and / or the vertical edge HK of the stack can be identified in the fourth and fifth image captures. The coaxial ring lighting device is arranged as incident light on one side of the fourth or fifth image collector, that is, on the side where the corners of the anode layer or cathode layer at the top of the stack or the vertical edge HK of the stack on the stacking table are located. To this end, the incident light lighting device is arranged so that the corners and vertical edge HK of the stack are included in the beam path. Thus, by processing the fourth and fifth image captures, at least partial tilting, displacement or twisting of the anode or cathode layer AL, KL at the top of the layer stack can be identified, ie the uppermost corner and / or vertical edge HK causing an interfering contour.

[0176] The above-mentioned variations of the treatment and inspection, their structural and operational aspects, and variations of the treatment methods are only intended to help better understand the structure, mode of operation and characteristics; they do not limit the present disclosure to the embodiments. The accompanying drawings are partial schematic diagrams. The basic characteristics and effects are shown in the drawings, and in some cases they are obviously enlarged to illustrate the functions, working principles, technical solutions and features. Each mode of operation, each principle, each technical solution and each feature disclosed in the drawings or in the text can be freely combined with all claims, each feature in the text and other drawings, and other modes of operation, principles, technical solutions and features contained in or obtainable from the present disclosure, so as to assign all conceivable combinations to the program. This also includes the combination between all individual embodiments in the text (i.e., each part of the specification) and the claims, as well as the combination between different variants in the text, the claims and the drawings. The claims also do not limit the content disclosed, and therefore do not limit the possible combinations of all the disclosed features with each other. All disclosed features are also explicitly disclosed here individually and in combination with all other features.

Claims

1. An inspection device (100) for a layer material, in particular for manufacturing a layer material of a fuel cell or a battery cell, wherein, - The first-layer conveyor has at least one picker (156) and a first drive device (300), and is arranged and designed to pick up a single anode layer or cathode layer (AL, KL) from a first transfer point (U1) through the at least one picker (156) and send it to a first handover point (A1); - The first-layer conveyor (150) is arranged and designed to hand over a single anode layer or cathode layer (AL, KL) from the picker (156) to a stacking table (400) at the first handover point (A1) when the at least one picker (156) is located at the first handover point (A1); - There is at least one drive device (410) for aligning the picker (156) and the stacking table (400) with each other according to a signal issued by processing the first and / or second image capture; and - The first image collector (K1) aligns a first area (E1) of the first-layer conveyor (150) between the first transfer point (U1) and the first handover point (A1), and is arranged and designed to perform a first image capture when at least one picker of the first-layer conveyor passes the first image collector (K1); and / or - The second image collector (K2) aligns a second area (E2) of the first-layer conveyor (150) between the first transfer point (U1) and the first handover point (A1), and is arranged and designed to perform a second image capture when at least one picker of the first-layer conveyor passes the second image collector (K2); - The stacking table (400) is arranged and designed to pick up the single anode layer or cathode layer (AL, KL) at the first handover point (A1) to form a stack.

2. The inspection device (100) according to claim 1, wherein, The first-layer conveyor includes a layer flipper (150), which is arranged and designed to pick up a single anode layer or cathode layer from the first transfer point (U1) through the at least one picker (156) and rotate it by a certain rotation angle to reach the first handover point (A1).

3. The inspection device (100) according to claim 1, wherein, The first-layer conveyor includes a layer gripper, which is arranged and designed to pick up a single anode layer or cathode layer from the first transfer point (U1) through a picker in the form of, for example, a suction tool or a gripping tool and send it to the first handover point (A1).

4. The inspection device (100) according to any one of claims 1 to 3, wherein, - The second-layer conveyor (200) is arranged and designed to pick up a single cathode layer or anode layer (KL, AL) and send it to a second handover point (A2); - The first image collector (K1') aligns a first area (E1') of the second-layer conveyor (200) between the second transfer point (U2) and the second handover point (A2), and is arranged and designed to perform a first image capture when the second-layer conveyor (200) passes the first image collector (K1'); and / or - The second image collector (K2') aligns with the second area (E2') of the second-layer conveyor between the second transfer point (U2) and the second handover point (A2), and is arranged and designed to perform a second image capture when the second-layer conveyor passes by the second image collector (K2').

5. The inspection device (100) according to claim 4, wherein, The second-layer conveyor includes a layer flipper, which is arranged and designed to pick up a single anode layer or cathode layer from the second transfer point (U2) by means of the at least one picker (206), rotate it by a certain rotation angle so as to reach the second handover point (A2).

6. The inspection device (100) according to claim 4, wherein, The second-layer conveyor includes a layer gripper, which is arranged and designed to pick up a single anode layer or cathode layer from the second transfer point (U2) by means of a picker in the form of, for example, a suction tool or a gripping tool, and send it to the second handover point (A2).

7. The inspection device (100) according to any one of the above claims, wherein, - A drive device (410) is assigned to the stacking table (400), and the drive device is arranged and designed to move the stacking table (400) back and forth between the first and second handover points (A1, A2); - The first and second-layer conveyors are respectively arranged and designed to hand over a single anode layer or cathode layer (AL, KL) to the stacking table (400) at the first and second handover points (A1, A2) when the stacking table is located at the first or second handover point (A1, A2); - There is at least one drive device to orient the layer conveyor and / or the at least one layer flipper (150, 200) or layer gripper relative to the stacking table (400) according to the signal issued by the control device for processing the first and / or second image capture, and / or, wherein this drive device can be designed as an additional y-direction drive device for the shelf (420) and / or a rotational drive device around the z-axis (i.e., θ upward).

8. The inspection device (100) according to any one of claims 1 to 3, wherein, - The first area (E1) and the second area (E2) of at least one picker of the layer flipper (150, 200) are corner areas that are diagonally opposite to each other along the at least one picker of the layer flipper (150, 200); and / or - The first area (E1) and the second area (E2) of at least one picker of the layer flipper (150, 200) are arranged and designed to pick up the first corner or the second corner of the single anode layer or cathode layer (AL, KL); and / or - At the moment of performing the first and / or second image capture at an angle of approximately 30° to approximately 150°, or approximately 60° to approximately 120°, or approximately 80° to approximately 100°, or approximately 90° with respect to the surface of the picker, the first and / or second image collectors (K1, K2, K1', K2') align with the first or second area (E2) of the picker (156, 206) between the transfer points (U1, U2) and the handover points (A1, A2).

9. The inspection device (100) according to any one of claims 1 to 8, wherein, - The first and / or second image pick-up devices (K1, K2, K1', K2') can be adjusted along their optical axes for focusing and / or can be moved during operation; And / or - The white light sources assigned to the first and / or second image pick-up devices (K1, K2, K1', K2') are set and designed to illuminate the anode layer / cathode layer so that the first and / or second image pick-up devices (K1, K2, K1', K2') can capture images; And / or - At least one optically effective element is assigned to the first and / or second image pick-up devices (K1, K2, K1', K2') respectively; Wherein the optically effective element is set and designed to detect the position and / or orientation of the anode layer / cathode layer at one or more positions or regions before or when the anode layer / cathode layer reaches the handover point, or on the way to the handover point; and / or, wherein the at least one optically effective element is a lens or a lens assembly, a mirror or a mirror assembly, a prism or a prism assembly, a light conductor assembly, an area light, a coaxial ring light, a dark field light or a combination thereof.

10. The inspection device (100) according to any one of claims 1 to 9, wherein, - The control unit is set and designed to obtain correction values according to the one or more image captures and according to the position and / or orientation of the anode layer / cathode layer before being picked up by the stacking table, the position and / or orientation of the stacking table and / or the position and / or orientation of the single anode layer / cathode layer relative to the stacking table during the flipping process of the anode layer / cathode layer to the stacking table; and / or - The control unit is set and designed to take these correction values into account in the positioning instructions sent to the layer flipper, the pick-up device and / or the stacking table when orienting the stacking table relative to the placement point; and / or - The control unit is set and designed to take these correction values regarding the orientation and position of the stacking table when picking up the anode layer / cathode layer into account in the positioning instructions sent to the layer flipper, the pick-up device and / or the stacking table so that the stacking table picks up the anode layer / cathode layer at the central zero position and / or in alignment with the electrode stack located at the handover point; and / or - The control unit is set and designed to determine the orientation and position of the stacking table when picking up the anode layer / cathode layer by checking the position of the newly incoming anode layer / cathode layer directly in front of the handover point during the image capture.

11. The inspection device (100) according to any one of claims 1 to 10, wherein, - The pick-up device can move radially relative to its rotation axis, and the first image pick-up device and / or the second image pick-up device (K1, K2, K1', K2') are designed to perform the first or second image capture when the pick-up device moves radially outwards or inwards.

12. An inspection method performed during the manufacture of a manufacturing module or module precursor, comprising the steps of: - A single anode layer / cathode layer (AL, KL) is picked up from a first transfer point (U1, U2) by at least one pick-up device (156) of a layer flipper (150, 200); and - Rotate at least one picker (156) of the layer inverter (150, 200) by a certain rotation angle from the transfer point to reach the handover point (A1, A2); - Detect the (x, y, z and / or θ-direction) position and / or orientation of the anode layer / cathode layer (AL, KL) on at least one picker (156) of the layer inverter (150, 200) between the transfer point (U1) and the handover point (A1) by means of a first image collector (K1), wherein the first image collector (K1) is aligned with a first area (E1) of the layer inverter (150) and is arranged and designed to perform a first image capture when at least one picker of the layer inverter passes by the first image collector (K1); - Detect the (x, y, z and / or θ-direction) position and / or orientation of the anode layer / cathode layer (AL, KL) on at least one picker (156) of the layer inverter (150, 200) between the transfer points (U1, U2) and the handover point (A1) by means of a second image collector (K2), wherein the second image collector (K2) is aligned with a second area (E1) of the layer inverter (150) and is arranged and designed to perform a second image capture when at least one picker of the layer inverter passes by the second image collector (K2); - Align the picker (156) and the stacking table (400) with each other according to the signals issued by processing the first and / or second image captures; and - When the at least one picker (156) is located at the handover point (A1, A2), hand over the single anode layer or cathode layer (AL, KL) from the at least one picker (156) to the stacking table (400) at the handover point (A1, A2) to form a stack.

13. The inspection method according to claim 12, wherein, - When at least one picker of the layer inverter passes by the image collectors (K1, K2), the first and / or second image collectors (K1, K2) detect its (in the x, y, z and / or θ-directions) position and / or orientation at a vertical perspective of ± about 25° overlooking the anode layer / cathode layer (AL, KL); and / or - The light sources (L1, L2) assigned to the first and / or second image collectors (K1, K2) illuminate the anode layer / cathode layer (AL, KL) so that the first and / or second image collectors (K1, K2) can capture images; and / or - The first and / or second image collectors (K1, K2) thoroughly detect the anode layer / cathode layer (AL, KL) through image capture to detect its (in the x, y, z and / or θ-directions) position and / or orientation; and / or - The first and / or second image collectors (K1, K2) detect an area of the anode layer / cathode layer (AL, KL) through a single image capture relative to their respective fixed image collector zero points, - At least one corner area, - Two diagonal corner areas, and / or -- at least one corner region and at least one edge section for detecting the position and / or orientation of the anode layer / cathode layer (AL, KL) (in the x, y, z, and / or θ directions); and / or - the first and / or second image acquisition device (K1, K2) is designed as a matrix camera or a line scan camera for detecting the position and / or orientation (in the x, y, z, and / or θ directions) of the anode layer / cathode layer (AL, KL) before or at the moment when the anode layer / cathode layer (AL, KL) reaches the handover point (A1) or on the way to the handover point (A1).

14. The inspection method according to any one of the above method claims, wherein, - according to -- the position and / or orientation (in the x, y, z, and / or θ directions) of the anode layer / cathode layer (AL, KL) after being picked up by at least one picker of the layer inverter -- the position and / or orientation (in the x, y, z, and / or θ directions) of the stacking table (400), and / or -- the position and / or orientation (in the x, y, z, and / or θ directions) of the picked-up individual anode layer / cathode layer (AL, KL) during the flipping of the anode layer / cathode layer (AL, KL) towards the stacking table (400) to obtain correction values; and - taking these correction values into account when orienting the picker of the layer inverter carrying the conveyed anode layer / cathode layer (AL, KL) relative to the stacking table (400) (in the x, y, z, and / or θ directions) at the handover points (A1, A2); and / or - taking these correction values into account (in the x, y, z, and / or θ directions) when orienting the picker of the layer inverter so that the anode layer / cathode layer (AL, KL) is picked up by the stacking table (400) at the central zero position and / or in an aligned manner with each other.

Images