Test platform, system and method

Abstract

The invention relates to a test platform, a test system and a test method. The test platform comprises a connection interface, a storage device and an operation device. The connection interface is used for being coupled with a first operation device and receiving a first application requirement provided by the first operation device. The storage device stores a plurality of development board models. The operation device tests one of the development board models according to a first application demand to generate a plurality of first test data, and stores the first test data. When a second operation device is coupled to the connection interface and provides a second application demand, the operation device selects a preset development board model from the development board models according to the second application demand and the first test data and recommends the preset development board model to the second operation device.

Description

Technical Field

[0001] The present invention relates to the field of test platforms, and particularly to a test platform for collecting test data. Background Art

[0002] In the early stage of a customer's product development, the customer usually purchases an evaluation board (EVB) for project evaluation. Generally, from the time the customer places an order for the evaluation board until receiving it, and then adjusting the development environment to actually perform operations, it takes about one month of waiting time. After receiving the evaluation board, if the development result is completely inapplicable, the customer has to place a new order for a new evaluation board and wait for another month. The old evaluation board will be left idle and discarded, resulting in low evaluation efficiency and environmental pollution caused by the waste products. Summary of the Invention

[0003] An embodiment of the present invention provides a test platform, including a connection interface, a storage device, and an operating device. The connection interface is used to couple to a first operating device and receive a first application requirement provided by the first operating device. The storage device stores a plurality of development board models. The operating device tests one of the development board models according to the first application requirement to generate a plurality of first test data and stores the first test data. When a second operating device is coupled to the connection interface and provides a second application requirement, the operating device selects a preset development board model from the development board models according to the second application requirement and the first test data and recommends the preset development board model to the second operating device.

[0004] The present invention further provides a test system, including a first operating device and a test platform. The first operating device provides a first application requirement to an international network. The test platform includes a connection interface, a storage device, and an operating device. The connection interface is coupled to the international network to receive the first application requirement. The storage device stores a plurality of development board models. The operating device tests one of the development board models according to the first application requirement to generate a plurality of first test data and stores the first test data. When a second operating device is coupled to the connection interface and provides a second application requirement, the operating device selects a preset development board model from the development board models according to the second application requirement and the first test data and recommends the preset development board model to the second operating device.

[0005] The present invention further provides a testing method applicable to a testing platform. The testing method of the present invention includes receiving a first application requirement; testing one of a plurality of development board models according to the first application requirement to generate a plurality of test data; recording the test data; receiving a second application requirement; and selecting a preset development board model from the development board models according to the second application requirement and the test data, and recommending the preset development board model to a second operating device.

[0006] The testing method of the present invention can be implemented via the testing platform of the present invention, which is hardware or software capable of executing preset functions, and can also be incorporated in a recording medium in the form of programming code and implemented in combination with preset hardware. When the programming code is loaded and executed by an electronic device, a processor, a computer, or a machine, the electronic device, the processor, the computer, or the machine becomes a testing platform for implementing the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 It is a schematic diagram of the testing system of the present invention.

[0008] Figure 2 It is a schematic diagram of the testing platform of the present invention.

[0009] Figure 3 It is a possible flowchart of the testing method of the present invention.

[0010] [SYMBOL DESCRIPTION]

[0011] 100: Testing system

[0012] 110A - 110C: Operating device

[0013] 120: International network

[0014] 130: Testing platform

[0015] 140: Manufacturing planning platform

[0016] AR_A - AR_C: Application requirement

[0017] 131: Connection interface

[0018] 132: Operating device

[0019] 133: Storage device

[0020] MD1, MD2: Recommended model

[0021] PRC: Programming code

[0022] 134: Storage device

[0023] TMOD: Training model

[0024] PD: Predicted Data

[0025] 141: Storage Device

[0026] 142: Manufacturing Planning Module

[0027] 143: Connection Interface

[0028] S311~S315: Steps Detailed Implementation Manner

[0029] To make the objectives, features, and advantages of the present invention more apparent and understandable, embodiments are specifically provided below and described in detail in conjunction with the accompanying drawings. The specification of the present invention provides different embodiments to illustrate the technical features of different implementation manners of the present invention. Among them, the configuration of each element in the embodiments is only for illustration and is not intended to limit the present invention. In addition, the partial repetition of the reference numerals in the embodiments is for the purpose of simplifying the description and does not imply the relevance between different embodiments.

[0030] Figure 1 It is a schematic diagram of the test system of the present invention. As shown in the figure, the test system 100 includes an operating device 110A, an international network (Internet) 120, and a test platform 130. The operating device 110A is coupled to the international network 120 by a wireless or a wired manner to upload an application requirement AR_A to the test platform 130. The present invention does not limit the type of the operating device 110A. In a possible embodiment, the operating device 110A is a notebook computer or a desktop computer.

[0031] The present invention also does not limit the number of operating devices. The test system 100 may have more operating devices. In some embodiments, the test system 100 further includes operating devices 110B and 110C. The operating devices 110B and 110C upload application requirements AR_B and AR_C to the test platform 130 through the international network 120. The operating devices 110A~110C may be connected to the international network 120 simultaneously or differently. For example, when at least one of the operating devices 110A~110C is connected to the international network 120, another one of the operating devices 110A~110C may not be connected to the international network 120 yet, or after at least one of the operating devices 110A~110C is connected to the international network 120, another one of the operating devices 110A~110C is also connected to the international network 120. Since the characteristics of the operating devices 110B and 110C are similar to those of the operating device 110A, they will not be elaborated herein.

[0032] In a possible embodiment, the operating devices 110A to 110C are located at different clients. The users of the clients can connect to the test platform 130 through the operating devices 110A to 110C to perform virtual development board simulation tests on the test platform 130. Taking the operating device 110A as an example, the user uploads an application requirement AR_A through the operating device 110A. For example, if the user wants to test the UART transmission function of a preset development board, the operating device 110A can adjust the timer (not shown) of the preset development board through a simulator (not shown) of the test platform 130. At this time, the operating device 110A may upload a preset programming code to the test platform 130, requiring the timer to send a signal every 5 seconds and continuously execute for 60 seconds to complete one cycle. Further, the operating device 110A modifies the preset programming code so that the timer can send signals faster, every 3 seconds. The operating device 110A keeps modifying the preset programming code until the action of the timer meets the expected test results. If the accuracy rate of the timer is within an acceptable range, it means that the UART transmission function of the preset development board meets the requirements, and the operating device 110A does not need to upload a new preset programming code.

[0033] After the operating device 110A has run through all the testable links on the test platform 130, the content of the preset programming code has been modified. After the physical development board arrives, the client can burn the final version of the preset programming code into the physical development board and then compare the test results. By combining the online and offline test data comparisons, project evaluation can be made, improving efficiency and increasing the possibility of adjusting more environmental variables of the project, ensuring product success and customer satisfaction.

[0034] The test platform 130 is coupled to the international network 120 by a wireless or a wired method for receiving the application requirements AR_A to AR_C. In a possible embodiment, the test platform 130 is a cloud device for remote operating devices 110A to 110C to perform development board tests. The test platform 130 knows the functions that the operating devices 110A to 110C want to test according to the application requirements AR_A to AR_C. Then, the test platform 130 selects a suitable model from multiple development board models according to the previously collected and recorded test data and recommends it to the client. The client then tests the development board model online (on the test platform 130) through the operating devices 110A to 110C.

[0035] By collecting test data, the test platform 130 can further establish various parametric linear change models and present the parametric linear change models in a visualized form of data on the operating devices 110A-110C, facilitating the users of the client to use the operating devices 110A-110 to conduct online virtual development board tests. In some embodiments, the test platform 130 records and utilizes the collected test data, and recommends more suitable development board information to the client as a standard for the compatibility and feasibility evaluation of the client.

[0036] For example, in the previous online test of the client of the card reader, the most extreme parameter was to transmit three pieces of data per millisecond. Since the test platform 130 records the previous application scenarios, it can establish a model applicable to the test records. When the client of the card reader goes online again, the test platform 130 recommends available ICs or relevant test standard suggestions, and can provide possible future operation application test cases, shortening the detection time and the early development cycle of the client for the same type of products.

[0037] In other embodiments, the test platform 130 further has optimization and prediction functions to enhance the accuracy of the development board model. For the test data of the development board models for various preset application scenarios, the test platform 130 provides prediction data and can enhance the simulation models in different fields. For example, the client of the human-machine interface (HMI) product wants to test the power supply stability. When unstable current occurs, whether the HMI product can continuously play images (or sounds) stably. The client connects to the test platform 130 through an operating device (such as 110A), repeats the simulation and makes adjustments online. The test platform 130 collects the test data each time, and then finds different application scenarios for partitioning from the changes in the test data. In each partition, the test platform 130 further optimizes the numerical model to improve the correctness of the simulation test. In some embodiments, the test platform 130 can provide a simple environment setting for the operating device of the client for individual different application scenarios and push different IC lists for the client to select.

[0038] In other embodiments, the test system 100 further includes a manufacturing planning platform 140. The manufacturing planning platform 140 infers the development board that is more likely to be accepted by the client based on the test data collected by the test platform 130, and lists the corresponding component list according to the actual needs of the client. The manufacturing planning platform 140 may transmit the component list to the factory end through the international network 120. The manufacturing personnel at the factory end can receive the component list through a computer and manufacture a physical development board. Since the physical development board is manufactured according to the actual needs of the client to manufacture the more popular development board, the inventory of the physical development board can be reduced, the possible size of the development board can be reduced, and the cost can be saved.

[0039] Figure 2Schematic diagram of the test platform 130 of the present invention. For convenience of description, Figure 2 operation devices 110A and 110B are shown, but not intended to limit the present invention. The test platform 130 of this case can receive application requirements of a greater number of operation devices. The present invention also does not limit the time when the operation devices 110A and 110B are connected to the test platform 130. When the operation device 110A is connected to the test platform 130, the operation device 110B may not yet be connected to the test platform 130. When the operation device 110B is connected to the test platform 130, the operation device 110A may still be connected to the test platform 130 or may have gone offline.

[0040] The test platform 130 provides an appropriate development board model for the client to test online. After the test is completed, the test platform 130 notifies the manufacturing planning platform 140 to send out a physical development board to the client. Since the client has already conducted tests, the client can directly use the physical development board after receiving it.

[0041] The test platform 130 includes a connection interface 131, an operation device 132, and a storage device 133. The storage device 133 stores a model database. The model database records a plurality of development board models. In another possible embodiment, the storage device 133 further stores a data database that records a plurality of test data. In some embodiments, the storage device 133 is a non-volatile memory.

[0042] The connection interface 131 is used to couple the operation devices 110A and 110B and receive the application requirements AR_A and AR_B. In some embodiments, the connection interface 131 receives the application requirements AR_A and AR_B provided by the operation devices 110A and 110B through an international network (not shown). In a possible embodiment, the connection interface 131 is connected to an international network by a wireless method or a wired method (such as a network cable).

[0043] The operation device 132 selects one of the plurality of development board models stored in the storage device 133 as a recommended model according to the application requirements AR_A, AR_B, and a plurality of test data. Taking the operation device 110A as an example, when the operation device 132 receives the application requirement AR_A through the connection interface 131, the operation device 132 selects one of the plurality of development board models stored in the storage device 133 as a recommended model MD1 according to the application requirement AR_A and a plurality of test data. In a possible embodiment, the test data may be written into the storage device 133 in advance. For example, the test platform 130 tests many development board models in advance to obtain a plurality of test data. The test platform 130 collects the test data to facilitate recommending a suitable development board model to the client in the future.

[0044] The operating device 132 tests the recommendation model MD1 according to the application requirement AR_A to generate a plurality of first test data. In a possible embodiment, the operating device 132 writes the programming code provided by the operating device 110A into the recommendation model MD1, and sets the recommendation model MD1 according to the application requirement AR_A to generate a plurality of first test data. The operating device 132 records the first test data. In some embodiments, the operating device 132 writes the first test data into the storage device 133. As the number of tests performed by the operating device 132 increases, the data volume in the database of the storage device 133 becomes larger.

[0045] When the operating device 110B is coupled to the connection interface 131 and provides an application requirement AR_B, the operating device 132 selects one from the multiple development board models recorded in the storage device 133 as a recommendation model MD2 (or referred to as the first preset development board model) according to the application requirement AR_B and multiple test data (including at least one pre-written test data and at least one first test data). The operating device 132 recommends the recommendation model MD2 to the operating device 110B. The operating device 132 tests the recommendation model MD2 according to the application requirement AR_B to generate a plurality of second test data. In a possible embodiment, the operating device 132 writes the programming code provided by the operating device 110B into the recommendation model MD2, and sets the recommendation model MD2 according to the application requirement AR_B to generate a plurality of second test data. The operating device 132 may write the second test data into the database of the storage device 133.

[0046] During the process of the operating device 132 testing the development board models (such as MD1 and MD2), a plurality of test data (such as the first test data and the second test data) are generated. The operating device 132 collects and utilizes all the test data to provide a more suitable development board model for the client to test in future other test processes, significantly reducing the time for the client to test the development board model online.

[0047] For example, when a third operating device (not shown) is coupled to the connection interface 131 and provides a third application requirement, the operating device 132 selects one from the multiple development board models (or referred to as the second preset development board model) according to the third application requirement, the first test data, and the second test data, and recommends it to the third operating device. After testing the second preset development board model, the operating device 132 collects all the test data (or referred to as the third test data). The operating device 132 records all the collected test data to provide future possible operation application test cases, shortening the detection time of the same type of products.

[0048] In some embodiments, the operating device 110A provides a programming code PRC to the operating device 132. The operating device 132 loads the programming code PRC into the recommendation model MD1 and tests the recommendation model MD1 according to the application requirement AR_A. The operating device 110A modifies the programming code PRC according to the test result and provides the modified programming code to the operating device 132. The operating device 132 writes the modified programming code into the recommendation model MD1 and tests the recommendation model MD1 again. The operating device 132 collects and records all the test data to provide a more complete test operation. In other embodiments, the operating device 132 also loads the programming code provided by the operating device 110B into the recommendation model MD2. The operating device 110B modifies the programming code according to the second test data. Since the operation of the operating device 110B is similar to that of the operating device 110A, it will not be described in detail.

[0049] In a possible embodiment, the operating device 132 provides an operation application test data according to multiple test data, shortening the detection time of the same type of products. For example, when the operating device 132 tests the UART transmission function of a first recommendation model according to the application requirement AR_A of the operating device 110A, the operating device 132 may collect multiple UART test data. The operating device 132 generates a UART operation application test data according to the UART test data. When the connection interface 131 is coupled to the operating device 110B and the operating device 132 learns from the application requirement AR_B of the operating device 110B that the operating device 110B also wants to test the UART transmission function, the operating device 132 provides the UART operation application test data to the operating device 110B. Therefore, the operating device 110B does not need to repeatedly test the UART transmission function through the operating device 132, so the test time of the operating device 110B for the UART transmission function can be reduced.

[0050] In other embodiments, the test platform 130 generates a prediction data by using multiple test data. In this example, the test platform 130 further includes a storage device 134 for storing a training model TMOD, but it is not intended to limit the present invention. In some embodiments, the storage device 134 may be independent of the test platform 130. In this example, the storage device 134 may be coupled to the test platform 130 through a local area network (LAN) connection line. In a possible embodiment, the training model TMOD is a machine learning model. The test data collected by the operating device 132 is provided to the training model TMOD. The training model TMOD trains multiple test data to generate a prediction data PD.

[0051] The operating device 132 may write the prediction data PD into the storage device 133. In a possible embodiment, when an operating device wants to test a preset function (such as the UART transmission function) of a preset development board model, the operating device 132 directly provides the prediction data PD to the operating device, saving the test time of the operating device. In other embodiments, the training model TMOD may be stored in the storage device 133.

[0052] In some embodiments, the training model TMOD trains multiple sets of test data to generate an optimized model. The operating device 132 uses the optimized model as a development board model and writes it into the storage device 133. In another possible embodiment, the training model TMOD trains multiple sets of test data to update at least one development board model stored in the optimized storage device 133.

[0053] In some embodiments, the manufacturing planning platform 140 has a storage device 141 and a manufacturing planning module 142. The storage device 141 records the inventory quantity of physical development boards. The manufacturing planning module 142 learns the more popular types of development boards based on the multiple test data of the test platform 130, and issues orders to the factory according to the inventory data of the development boards. Since the orders issued by the manufacturing planning module 142 are for development boards with a higher acceptance rate, the inventory quantity of the development boards can be significantly reduced. In a possible embodiment, the manufacturing planning platform 140 further includes a connection interface 143. The connection interface 143 may be connected to an international network to transmit orders to the factory.

[0054] Figure 3 This is a possible flowchart of the test method of the present invention. The test method of the present invention can exist through programming code. When the programming code is loaded and executed by a machine, the machine becomes the test platform 130 for implementing the present invention. First, a first application requirement is received (step S311). Figure 1 For example, the operating device 110A may upload an application requirement AR_A to the test platform 130 through the international network 120.

[0055] According to the first application requirement, one of multiple development board models is tested to generate multiple test data (step S312), and the test data is recorded (step S313). In a possible embodiment, the test platform 130 has a storage device for storing multiple development board models and multiple test data. The test data may be pre-written or previous test results. For example, during an initial period, the test platform 130 presets different scenarios to test different development board models to generate multiple test data. The test platform 130 records the test data. In this example, when the operating device 110A provides the application requirement AR_A, the test platform 130 tests a preset development board model according to the application requirement AR_A and records the test data. Since the test platform 130 continuously records test data, the test data in the database is richer and more accurate.

[0056] Receive a second application requirement (step S314). Taking Figure 1 as an example, the operating device 110B may upload an application requirement AR_B to the test platform 130 through the international network 120. Then, according to the second application requirement and the test data, a preset development board model is selected from multiple development board models, and the preset development board model is recommended to the second operating device (step S315). In a possible embodiment, step S315 further records the test data of the preset development board model.

[0057] The test platform 130 collects test data samples to train the development board model for more accurate simulation behavior. The test platform 130 effectively makes good use of each test in different scenarios, collects the test data each time, provides better suggestions for the client, and improves the success of the client's product and customer satisfaction. Moreover, by reducing waste of component materials, avoiding excessive inventory of physical development boards, and at the same time reducing the environmental pressure caused by waste disposal and damaging environmental sustainability. It can also prevent the situation where the client purchases a development board that is not suitable because they fail to conduct an online test first when using the development board for the first time, reducing the client's need to revise the physical development board.

[0058] The testing method, or the preset form or a part thereof, of the present invention may exist in the form of programming code. The programming code can be stored in a physical medium, such as a floppy disk, an optical disk, a hard disk, or any other machine-readable (such as computer-readable) storage medium, or a computer program product not limited to an external form. Wherein, when the programming code is loaded and executed by a machine, such as a computer, this machine becomes a testing platform for participating in the present invention. The programming code can also be transmitted through some transmission media, such as wires or cables, optical fibers, or any transmission form. Wherein, when the programming code is received, loaded, and executed by a machine, such as a computer, this machine becomes a testing platform for participating in the present invention. When implemented in a general-purpose processing unit, the programming code combined with the processing unit provides a unique device whose operation is similar to that of an application of a preset logic circuit.

[0059] Unless otherwise defined, all terms (including technical and scientific terms) used herein shall be understood as the general understanding of those skilled in the art. In addition, unless explicitly stated, the definitions of terms in a general dictionary should be interpreted as being consistent with their meanings in the articles of the relevant technical field, and should not be interpreted as an ideal state or an overly formal voice. Although terms such as "first", "second", etc. may be used to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. In the claims of the patent application, terms such as "first", "second", etc. are used as labels and do not intend to impose numerical requirements on their objects.

[0060] Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make some modifications and refinements without departing from the spirit and scope of the present invention. For example, the systems, devices, or methods described in the embodiments of the present invention can be implemented in physical embodiments of hardware, software, or a combination of hardware and software. Therefore, the protection scope of the present invention shall be subject to what is defined by the claims.

Claims

1. A test platform, characterized in that: include: A connection interface, for coupling to a first operating device and receiving a first application requirement provided by the first operating device; a storage device for storing a plurality of development board models; as well as an operating device, which tests one of the development board models according to the first application requirement to generate a plurality of first test data and stores the first test data, in: When a second operating device is coupled to the connection interface and provides a second application requirement, the operating device selects a first preset development board model from the development board models based on the second application requirement and the first test data, and recommends the first preset development board model to the second operating device.

2. The test platform according to claim 1, characterized in that: The operating device tests the first preset development board model according to the second application requirement to generate a plurality of second test data, and writes the second test data into the storage device. When a third operating device is coupled to the connection interface and provides a third application requirement, the operating device selects a second preset development board model from the development board model based on the third application requirement and the first test data and the second test data, and recommends the second preset development board model to the third operating device.

3. The test platform according to claim 1, characterized in that: Also includes: a training model, training the first test data to generate a prediction data, in, The operating device provides the prediction data to the second operating device.

4. The test platform according to claim 1, characterized in that: The operating device generates an optimization model according to the first test data, and stores the optimization model in the storage device.

5. The test platform according to claim 1, characterized in that: The operating device updates at least one of the development board models according to the first test data.

6. A testing system, characterized in that: include: A first operating device provides a first application requirement to an international network; as well as A test platform, comprising: a connection interface, coupled to the international network, for receiving the first application requirement; a storage device storing a plurality of development board models; and an operating device, for testing one of the development board models according to the first application requirement to generate a plurality of first test data and store the first test data, in: When a second operating device is coupled to the connection interface and provides a second application requirement, the operating device selects a first preset development board model from the development board models based on the second application requirement and the first test data, and recommends the first preset development board model to the second operating device.

7. The test system according to claim 6, characterized in that: The second operating device provides a programming code, and the operating device loads the programming code into the first preset development board model and tests the first preset development board model to generate a plurality of second test data. The second operating device modifies the programming code according to the second test data, and the operating device loads the modified programming code into the first preset development board model and tests the first preset development board model to generate multiple third test data.

8. The test system according to claim 7, characterized in that: The operating device writes the second test data and the third test data into the storage device.

9. The test system according to claim 6, characterized in that: The operating device updates one of the development board models according to the first test data.

10. A testing method, applicable to a testing platform, characterized in that: include: Receiving a first application requirement; According to the first application requirement, testing one of the multiple development board models to generate multiple test data; Recording the test data; receiving a second application requirement from an operating device; as well as According to the second application requirement and the test data, a preset development board model is selected from the development board models, and the preset development board model is recommended to the operating device.

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