Chip rotation test fixture, chip test device and chip test machine

Abstract

The invention provides a chip rotation test fixture, a chip test device and a chip test machine. The chip rotation test clamp comprises a rotating table, a plurality of trays and a material supporting frame. The trays are arranged on the rotating table in the circumferential direction of the rotating table, and a feeding position and a discharging position are arranged on the rotating track of the trays. Each tray comprises two limiting pieces and two jacking pieces, and the two jacking pieces are horizontally opposite to the two limiting pieces respectively and are horizontally and movably arranged. Each jacking piece is connected with a first elastic piece, and the first elastic pieces are used for providing elastic force so that the jacking pieces can move towards the corresponding limiting pieces. Material supporting frames are arranged below the feeding position and the discharging position, each material supporting frame comprises a pushing mechanism and a lifting mechanism, and the lifting mechanisms are connected with the pushing mechanisms and used for driving the pushing mechanisms to ascend and descend so that the pushing mechanisms can be connected with or separated from the two jacking pieces; the pushing mechanism can push the two jacking pieces to move away from the corresponding limiting pieces. The chip testing device and the chip testing machine comprise the chip rotation testing clamp.

Description

Technical Field

[0001] The present invention relates to the technical field of testing equipment, and particularly relates to a chip rotation testing fixture, a chip testing device, and a chip testing machine. Background Art

[0002] Generally, a chip is provided inside an ordinary electronic product. Usually, the chip needs to be tested after being processed. By testing, problems existing in the chip can be found, so that the problems of the products reaching consumers are minimized or the reliability of the products is improved.

[0003] In the existing chip testing fixture, its structure is relatively complex and the manufacturing cost is relatively high.

[0004] Therefore, it is necessary to provide a chip rotation testing fixture, a chip testing device, and a chip testing machine to solve the above technical problems. Summary of the Invention

[0005] The present invention provides a chip rotation testing fixture, a chip testing device, and a chip testing machine, which have a simple structure and reduce the manufacturing cost.

[0006] The technical solution of the present invention is as follows: A chip rotation testing fixture includes: A platform rotation mechanism, which includes a rotating table rotatably arranged around the vertical direction; A plurality of trays for carrying chips; the plurality of trays are arranged on the rotating table along the circumferential direction of the rotating table and rotate with the rotating table, and a loading position and an unloading position are arranged on the rotation track of the trays; each tray includes two limiting members and two pressing members, the two limiting members are respectively used for limiting two adjacent sides of the chip, the two pressing members are respectively arranged horizontally opposite to the two limiting members and are horizontally movably arranged to press or release the chip; each pressing member is connected with a first elastic member, and the first elastic member is used to provide an elastic force to make the pressing member move towards the corresponding limiting member to press the chip; and A material supporting frame, the material supporting frame is arranged below both the loading position and the unloading position, the material supporting frame includes a pushing mechanism and a lifting mechanism, the lifting mechanism is connected with the pushing mechanism and is used to drive the pushing mechanism to lift, so that the pushing mechanism is connected to or separated from the two pressing members; when the pushing mechanism is connected to the pressing member, the pushing mechanism can push the two pressing members to move away from the corresponding limiting members to release the chip.

[0007] In the chip rotation testing fixture of the present invention, the pushing mechanism includes: A connecting plate, which is connected to the lifting mechanism; Two pushing components, the pushing components include a push rod and a lifting rod; the push rod includes a first rod and a second rod connected in an L-shape, and the connection between the first rod and the second rod is rotatably connected to the connecting plate; the lifting rod moves vertically, and the top end of the lifting rod is connected to the end of the second rod; and, A push driving member is arranged on the connecting plate and connected to the bottom end of each lifting rod, and is used to drive each lifting rod to move vertically so that the ends of the two first rods move closer to or away from the tightening member in the horizontal direction.

[0008] In the chip rotation test fixture described in the present invention, the tray further includes a bottom plate, the two limit members and the two tightening members are both arranged on the bottom plate, and the bottom plate is detachably connected to the rotating table.

[0009] In the chip rotation test fixture of the present invention, a positioning groove is provided on the bottom plate; the chip rotation test fixture also includes a clamping mechanism, which includes: A fixed block connected to the rotating table; A movable rod is vertically movable and penetrates the fixed block, and the movable rod can rotate vertically and move vertically; A buckle connected to the top end of the movable rod and capable of abutting against and separating from the bottom plate, wherein when the buckle abuts against the bottom plate, the buckle is inserted into the positioning groove to limit the buckle from rotating; and A compression spring is sleeved on the movable rod and is used for providing elastic force to move the movable rod downward so that the buckle presses the bottom plate downward.

[0010] In the chip rotation test fixture described in the present invention, the bottom plate is provided with a avoidance opening; the support rack also includes a support block, which is movably arranged at the avoidance opening along the vertical direction, and the support block is connected to the lifting mechanism, and the two limiting members and the two tightening members are arranged at the avoidance opening, and the top surface of the support block is provided with four supporting bars, and the four supporting bars are arranged in an X shape along the diagonal lines of the chip, which are used to carry the chip and make the four edges of the chip suspended.

[0011] In the chip rotation test fixture of the present invention, the limiting member is horizontally adjustable on the bottom plate so as to be able to move closer to or away from the corresponding pressing member.

[0012] In the chip rotation test fixture of the present invention, the chip rotation test fixture further includes an adjustment mechanism, and the adjustment mechanism includes: A cam mechanism, comprising a cam, the cam being arranged on the rotating platform for vertical rotation and located at an end of the stopper away from the chip, and the peripheral surface of the cam abutting against the stopper; A second elastic member, which is connected to the limiting member and is used to provide elastic force so that the limiting member moves away from the chip and remains in contact with the cam; and, An adjustment driving mechanism, which is arranged on the material supporting rack at the loading position. The adjustment driving mechanism includes a cam driving mechanism and a vertical driving mechanism; the vertical driving mechanism is connected to the cam driving mechanism and can drive the cam driving mechanism to lift and then connect or disconnect from the cam mechanism; when the cam driving mechanism is connected to the cam mechanism, the cam driving mechanism can drive the cam to rotate.

[0013] In the chip rotation test fixture of the present invention, the cam mechanism further includes: A fixed table, which is connected to the rotating table; A rotating shaft, which is movably penetrated through the fixed table. The top end of the rotating shaft is connected to the cam, and the bottom end of the rotating shaft is provided with two rotating holes; and, A first compression spring, which is sleeved on the rotating shaft and is used to provide downward elastic force so that the cam remains in contact with the fixed table; The cam driving mechanism includes: A transmission block, which is rotatably arranged around the vertical direction; Two transmission pins, which are movably arranged along the vertical direction on the transmission block. At least one of them is located at the eccentric position of the transmission block, and the bottom of the transmission pin is suspended; Two second compression springs, which are respectively sleeved on the two transmission pins and are used to provide upward elastic force so that the transmission pins protrude upward from the transmission block; and, A cam driver, which is connected to the transmission block and is used to drive the transmission block and the two transmission pins to rotate. When the two transmission pins are located in the two rotating holes, the rotation of the transmission block can make the rotating shaft and the cam rotate through the two transmission pins.

[0014] Another technical solution of the present invention is: A chip testing device, which includes: The above-mentioned chip rotation test fixture. A marking position, a detection position and a marking position are further arranged on the rotation track of the tray. The loading position, the marking position, the detection position, the marking position and the unloading position are arranged in sequence in a ring shape; An alignment mechanism, which is arranged at the marking position; A detection head, which is arranged at the detection position; and, A marking mechanism, which is arranged at the marking position.

[0015] Another technical solution of the present invention is: A chip testing machine, which includes: The above-mentioned chip testing device; and, A loading and unloading device, which is used to load a chip onto the tray located at the loading position and unload the chip from the tray located at the unloading position.

[0016] Compared with the prior art, the beneficial effects of the present invention are as follows: When the chip rotation test fixture of the present invention is working, when one of the trays rotates to the loading position, the lifting mechanism of the material supporting frame located below the loading position drives the pushing mechanism to rise. The pushing mechanism is connected to the pressing members and pushes the two pressing members to move away from the corresponding limiting members, so that there is enough space between the two pressing members and the two limiting members to accommodate the chip. After the chip is placed between the two pressing members and the two limiting members, the pushing mechanism is separated from the pressing members, and the first elastic member makes the pressing members move towards the corresponding limiting members to press the chip. The lifting mechanism drives the pushing mechanism to descend back to the low position, and the above-mentioned tray continues to rotate. At the same time, when one of the trays rotates to the unloading position, the lifting mechanism of the material supporting frame located below the unloading position drives the pushing mechanism to rise. The pushing mechanism is connected to the pressing members and pushes the two pressing members to move away from the corresponding limiting members to loosen the chip, and the chip can be taken away. In the chip rotation test fixture of the present invention, the material supporting frame located below the loading position can assist the pressing members to clamp the chips in sequence, and the material supporting frame located below the unloading position can assist the pressing members to loosen the chips in sequence. Its structure is simple and the manufacturing cost is reduced. Description of the Drawings

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following briefly introduces the drawings required to be used in the embodiments. The drawings in the following description are only the corresponding drawings of some embodiments of the present invention.

[0018] Figure 1 Schematic structural diagram of a chip testing machine provided by a preferred embodiment of the present invention.

[0019] Figure 2 Schematic structural diagram of a chip rotation test fixture provided by a preferred embodiment of the present invention.

[0020] Figure 3 For Figure 2 Enlarged structural diagram of part B in

[0021] Figure 4 Top view structural diagram of a chip rotation test fixture provided by a preferred embodiment of the present invention.

[0022] Figure 5 For Figure 4 Enlarged structural diagram of part A in

[0023] Figure 6Schematic diagram of the material supporting frame of the chip rotation test fixture provided by the preferred embodiment of the present invention at the loading position.

[0024] Figure 7 Schematic diagram of the material supporting frame of the chip rotation test fixture provided by the preferred embodiment of the present invention at the loading position from another angle.

[0025] Figure 8 Schematic diagram of the pushing mechanism of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0026] Figure 9 Schematic diagram of the push rod of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0027] Figure 10 Schematic diagram of the cam driving mechanism of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0028] Figure 11 Schematic diagram of the cam mechanism of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0029] Figure 12 Schematic diagram of the clamping mechanism of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0030] Figure 13 Schematic diagram of the supporting block of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0031] Figure 14 Schematic diagram of the limiting member of the chip rotation test fixture provided by the preferred embodiment of the present invention.

[0032] Wherein, 100. Chip, 1. Chip rotation test fixture, 11. Rotating table, 12. Tray, 121. Limiting member, 1211. Extension piece, 122. Tightening member, 123. First elastic member, 124. Bottom plate, 1241. Positioning groove, 1242. Avoidance opening, 13. Material supporting frame, 131. Pushing mechanism, 1311. Connecting plate, 1312. Pushing component, 13121. Push rod, 13122. First rod, 13123. Second rod, 13124. First rotating bearing, 13125. Lifting rod, 13126. Second rotating bearing, 13127. Accommodating groove, 1313. Pushing driving member, 132. Lifting mechanism, 133. Supporting block, 1331. Bearing strip, 1332. Perforation, 134. Distance measuring device 14. Clamping mechanism, 141. Fixed block, 142. Movable rod, 1421. Clamping piece, 143. Buckle, 144. Compression spring 15. Adjusting mechanism 151. Cam mechanism, 1511. Cam, 1512. Fixed platform, 1513. Rotating shaft, 15131. Rotating hole, 15132. Limit block, 1514. First compression spring 152. Second elastic member 153. Adjusting drive mechanism 1531. Cam drive mechanism, 15311. Transmission block, 15312. Transmission pin, 15313. Second compression spring, 15314. Cam driver, 15315. Groove 1532. Vertical drive mechanism 2. Alignment mechanism 3. Detection head 4. Marking mechanism 5. Loading and unloading device

[0033] In the figure, units with similar structures are denoted by the same reference numerals. Detailed implementation manner

[0034] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention.

[0035] The directional terms mentioned in the present invention, such as "up", "down", "front", "rear", "left", "right", "inside", "outside", "side", "top" and "bottom", etc., are only references to the orientation of the accompanying drawings. The directional terms used are for explaining and understanding the present invention, rather than for limiting the present invention.

[0036] The terms "first", "second", etc. in the terms of the present invention are only for descriptive purposes, and cannot be understood as indicating or implying relative importance, nor as a limitation on the order of precedence.

[0037] In the present invention, unless otherwise clearly defined and limited, terms such as "installation", "connection", "linkage", "fixation" shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral one; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection through an intermediate medium, and it may be the communication inside two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0038] The chip rotation test fixture in the prior art has a relatively complex structure and a high manufacturing cost.

[0039] The following is a preferred embodiment of a chip rotation test fixture 1, a chip test device, and a chip testing machine provided by the present invention that can solve the above technical problems.

[0040] A preferred embodiment of the present invention provides a chip testing machine. Please refer to Figure 1 and Figure 2 , the chip testing machine includes a chip test device and a loading and unloading device 5. The loading and unloading device 5 is used for loading and unloading the chip 100 to and from the chip test device.

[0041] Please refer to Figure 1 , the chip test device includes a chip rotation test fixture 1, an alignment mechanism 2, a detection head 3, and a marking mechanism 4. On the rotation trajectory of the tray 12, there are a loading position, a marking position, a detection position, a marking position, and an unloading position, and the loading position, the marking position, the detection position, the marking position, and the unloading position are arranged in sequence in a ring shape. The alignment mechanism 2 is arranged at the marking position and is used to take a photo of the chip 100 to determine the position of the chip 100. The detection head 3 is arranged at the detection position and is used to detect the chip. The marking mechanism 4 is arranged at the marking position and is used to mark the chip 100. The loading and unloading device 5 is used to load the chip 100 onto the tray 12 located at the loading position and unload the chip 100 from the tray 12 located at the unloading position. In this embodiment, the loading and unloading device 5 completes the loading and unloading of the chip 100 through two manipulators respectively.

[0042] Please refer to Figure 2 , Figure 4 , Figure 5 and Figure 6 , the chip rotation test fixture 1 includes a platform rotation mechanism, a plurality of trays 12, and a chip support 13. The platform rotation mechanism can drive the plurality of trays 12 to rotate, and the chip support 13 is used to clamp or release the chip 100 by the tray 12.

[0043] The platform rotating mechanism includes a rotating table 11 rotatably arranged around the vertical direction and a rotating driving member. The rotating driving member is connected to the rotating table 11 and is used to drive the rotating table 11 to rotate around the vertical direction. In this embodiment, the rotating driving member is arranged below the rotating table 11, and the alignment mechanism 2, the detection head 3, and the marking mechanism 4 are all located above the rotating table 11.

[0044] The tray 12 is used to carry the chips, and each tray 12 can carry one chip 100. A plurality of trays 12 are arranged on the rotating table 11 along the circumferential direction of the rotating table 11 and rotate with the rotating table 11, so that the plurality of chips move successively at the loading position, the marking position, the detection position, the marking position, and the unloading position. Each tray 12 includes two limiting members 121 and two pressing members 122. The two limiting members 121 are respectively used to limit two adjacent sides of the chip 100. The two pressing members 122 are respectively arranged horizontally opposite to the two limiting members 121 and are horizontally movably arranged to press or release the chip 100. Each pressing member 122 is connected with a first elastic member 123. The first elastic member 123 is used to provide an elastic force to make the pressing member 122 move towards the corresponding limiting member 121 to press the chip. Below the loading position and the unloading position, a material supporting frame 13 is provided. The material supporting frame 13 includes a pushing mechanism 131 and a lifting mechanism 132. The lifting mechanism 132 is connected to the pushing mechanism 131 and is used to drive the pushing mechanism 131 to lift, so that the pushing mechanism 131 is connected to or separated from the two pressing members 122. When the pushing mechanism 131 is connected to the pressing member 122, the pushing mechanism 131 can push the two pressing members 122 to move away from the corresponding limiting member 121 to release the chip 100.

[0045] For the chip rotation test fixture 1 of the present invention, during operation, when one of the trays 12 rotates to the loading position, the lifting mechanism 132 of the material supporting frame 13 located below the loading position drives the pushing mechanism 131 to rise. The pushing mechanism 131 is connected to the tightening members 122 and pushes the two tightening members 122 to move away from the corresponding limiting members 121, so that there is enough space between the two tightening members 122 and the two limiting members 121 to accommodate the chip 100. After the chip 100 is placed between the two tightening members 122 and the two limiting members 121, the pushing mechanism 131 is separated from the tightening members 122, and the first elastic member 123 causes the tightening members 122 to move towards the corresponding limiting members 121 to clamp the chip 100. The lifting mechanism 132 drives the pushing mechanism 131 to descend back to the low position, and the tray 12 moves to other positions under the drive of the rotating table 11. At the same time, when one of the trays 12 rotates to the unloading position with the rotating table 11, the lifting mechanism 132 of the material supporting frame 13 located below the unloading position drives the pushing mechanism 131 to rise. The pushing mechanism 131 is connected to the tightening members 122 and pushes the two tightening members 122 to move away from the corresponding limiting members 121 to loosen the chip 100, and the chip 100 can be taken away. For the chip rotation test fixture 1 of the present invention, the material supporting frame 13 located below the loading position can assist the tightening members 122 to clamp the chips in sequence, and the material supporting frame 13 located below the unloading position can assist the tightening members 122 to loosen the chips in sequence. Its structure is simple, reducing the manufacturing cost; loading and unloading can be carried out simultaneously, improving the detection efficiency.

[0046] Please refer to Figure 6 and Figure 8, the pushing mechanism 131 includes a connecting plate 1311, two pushing components 1312, and a pushing driving member 1313. The connecting plate 1311 is connected to the lifting mechanism 132. Each pushing component 1312 includes a push rod 13121 and a lifting rod 13125. The push rod 13121 includes a first rod 13122 and a second rod 13123 that are connected in an L shape. The junction of the first rod 13122 and the second rod 13123 is rotatably connected to the connecting plate 1311. The lifting rod 13125 moves vertically, and the top end of the lifting rod 13125 is connected to the end of the second rod 13123. The pushing driving member 1313 is disposed on the connecting plate 1311 and is connected to the bottom end of each lifting rod 13125 for driving each lifting rod 13125 to move vertically, so that the ends of the two first rods 13122 move closer to or away from the pressing member 122 in the horizontal direction. By using the L-shaped push rod 13121, the vertical movement of the end of the second rod 13123 can be converted into the horizontal movement of the end of the first rod 13122. When the pushing driving member 1313 drives the lifting rod 13125 to move upward, it drives the end of the second rod 13123 to move upward, the push rod 13121 rotates, and the end of the first rod 13122 moves closer to the pressing member 122. When the pushing driving member 1313 drives the lifting rod 13125 to move downward, it drives the end of the second rod 13123 to move downward, the push rod 13121 rotates in the reverse direction, and the end of the first rod 13122 moves away from the pressing member 122. With the above structure, one pushing driving member 1313 can be used to simultaneously control the ends of the two first rods 13122 to move closer to or away from the corresponding pressing members 122 in different horizontal directions, which is convenient for control and saves costs.

[0047] Please refer to Figure 8 , a first rotating bearing 13124 is provided at the end of the first rod 13122, and the first rotating bearing 13124 is used to push the pressing member 122 to move. The friction between the first rod 13122 and the pressing member 122 can be reduced, which is convenient for pushing the pressing member 122 to move.

[0048] Please refer to Figure 8 and Figure 9 , a receiving groove 13127 is provided at the end of the second rod 13123. A second rotating bearing 13126 is provided at the top end of the lifting rod 13125, and the second rotating bearing 13126 is rotatably disposed in the receiving groove 13127. This makes the lifting rod 13125 push the second rod 13123 to move smoothly.

[0049] Please refer to Figure 14, the limiting member 121 is provided with an extending piece 1211 extending downward for connecting or separating from the first rod 13122. When the first rod 13122 is lifted and can be located on one side of the horizontal direction of the extending piece 1211 and is connected to the extending piece 1211, the first rod 13122 pushes the extending piece 1211 to move horizontally, thereby pushing the limiting member 121 to move away from the corresponding pressing member 122.

[0050] Please refer to Figure 5 , the tray 12 further includes a bottom plate 124. The two limiting members 121 and the two pressing members 122 are both arranged on the bottom plate 124, and the bottom plate 124 is detachably connected to the rotating table 11. If the tray 12 is damaged, it can be replaced separately, which can save costs.

[0051] Please refer to Figure 5 and Figure 12 , a positioning groove 1241 is arranged on the bottom plate 124. The chip rotation test fixture 1 further includes a clamping mechanism 14, which includes a fixed block 141, a movable rod 142, a buckle 143 and a compression spring 144. The fixed block 141 is connected to the rotating table 11. The movable rod 142 is vertically movably inserted through the fixed block 141, and the movable rod 142 can rotate around the vertical direction and move vertically. A clamping piece 1421 is arranged at the bottom of the movable rod 142. The buckle 143 is connected to the top end of the movable rod 142 and can abut against and separate from the bottom plate 124. When the buckle 143 abuts against the bottom plate 124, the buckle 143 is inserted into the positioning groove 1241 to limit the rotation of the buckle 143. The compression spring 144 is sleeved on the movable rod 142, and its two ends respectively abut against the clamping piece 1421 and the fixed block 141. The compression spring 144 is used to provide elastic force to make the movable rod 142 move downward so that the buckle 143 presses the bottom plate 124 downward. In the normal state, the buckle 143 is located in the positioning groove 1241, the compression spring 144 makes the movable rod 142 move downward, and the buckle 143 presses the bottom plate 124 downward, so that the tray 12 can be locked to the rotating table 11. When the tray 12 needs to be replaced, pull up the buckle 143 to remove it from the positioning groove 1241, and then rotate the buckle 143 so that the buckle 143 is vertically misaligned with the bottom plate 124, then the whole tray 12 can be removed from the rotating table 11 to replace the tray 12. With the above structure, it is convenient to replace and fix the tray 12.

[0052] Multiple clamping mechanisms 14 can be arranged and distributed around the tray 12 to firmly fix the tray 12 and prevent it from loosening. An anti-false groove matching the shape of the bottom plate 124 can also be arranged on the rotating table 11 to facilitate the installation of the bottom plate 124 onto the rotating table 11 and at the same time make the positions of the two pressing members 122 correspond to the positions of the two first rods 13122.

[0053] Please refer to Figure 5, the bottom plate 124 is provided with an avoidance opening 1242. The chip carrier 13 further includes a supporting block 133 which is vertically movably arranged at the avoidance opening 1242. The supporting block 133 is connected to the lifting mechanism 132. Two limiting members 121 and two pressing members 122 are arranged at the avoidance opening 1242. Four bearing strips 1331 are arranged on the top surface of the supporting block 133. The four bearing strips 1331 are arranged in an X shape along the diagonal of the chip 100, for bearing the chip 100 and making the four edges of the chip 100 in a suspended state. The two limiting members 121 and the two pressing members 122 clamp the chip 100 at the avoidance opening 1242, which can make the chip 100 suspended and facilitate the double-sided detection of the chip 100. At the loading position, the lifting mechanism 132 drives the supporting block 133 to move upward. After the chip 100 falls on the supporting block 133, the pressing member 122 presses the chip tightly, and the supporting block 133 moves downward. At the unloading position, after the supporting block 133 moves upward to make the chip fall on the supporting block 133, the pressing member 122 releases the chip, and the manipulator takes away the chip 100. The supporting block 133 moves downward to complete the unloading of the chip 100, and the empty tray 12 can continue to move to the loading position. With the above structure, it is convenient to pick and place the chip. The four bearing strips 1331 facilitate the two limiting members 121 and the two pressing members 122 to clamp the four sides of the chip, and reduce the friction between the chip and the supporting block 133. The four bearing strips 1331 can avoid the positions of the two limiting members 121 and the two pressing members 122, and prevent the supporting block 133 from contacting the limiting members 121 and the pressing members 122.

[0054] Please refer to Figure 13 and Figure 6 , a through hole 1332 vertically penetrating is arranged on the supporting block 133. The chip carrier 13 further includes a ranging device 134 which is connected to the connecting plate 1311, so that the ranging device 134 moves up and down together with the supporting block 133. The ranging device 134 is oppositely arranged with the through hole 1332 in the vertical direction. The ranging device 134 can be used to determine whether the chip is placed correctly, so as to control the movement of the two pressing members 122 to accurately clamp the four sides of the chip.

[0055] Please refer to Figure 5 , the limiting member 121 is horizontally adjustably arranged on the bottom plate 124, so as to be able to move closer to or away from the corresponding pressing member 122. The horizontal positions of the two limiting members 121 can be adjusted according to chips of different sizes, so that the chip can be clamped at the middle position of the avoidance opening 1242, which is convenient for accurate testing.

[0056] More specifically, please refer to Figure 5 , Figure 7 and Figure 11, the chip rotation test fixture 1 further includes an adjustment mechanism 15. The adjustment mechanism 15 includes a cam mechanism 151, a second elastic member 152, and an adjustment driving mechanism 153. The cam mechanism 151 includes a cam 1511 which is rotatably arranged on the rotating table 11 in the vertical direction, located at one end of the limiting member 121 away from the chip, and the circumferential surface of the cam 1511 abuts against the limiting member 121. The second elastic member 152 is connected to the limiting member 121 and is used to provide an elastic force so that the limiting member 121 moves away from the chip and remains in contact with the cam 1511. When the cam 1511 rotates, the limiting member 121 can move horizontally to adjust its position. The adjustment driving mechanism 153 is arranged on the material supporting frame 13 at the loading position. The adjustment driving mechanism 153 includes a cam driving mechanism 1531 and a vertical driving mechanism 1532. The vertical driving mechanism 1532 is connected to the cam driving mechanism 1531 and can drive the cam driving mechanism 1531 to lift and then connect or disconnect from the cam mechanism 151. When the cam driving mechanism 1531 is connected to the cam mechanism 151, the cam driving mechanism 1531 can drive the cam 1511 to rotate. The vertical driving mechanism 1532 drives the cam driving mechanism 1531 to rise. The cam driving mechanism 1531 is connected to the cam mechanism 151. The action of the cam driving mechanism 1531 can make the cam 1511 rotate to adjust the position of the limiting member 121. The second elastic member 152 makes the limiting member 121 keep in contact with the cam 1511 so that the limiting member 121 remains stationary after its position is adjusted. The vertical driving mechanism 1532 drives the cam driving mechanism 1531 to descend, which will not prevent the rotating table 11 from rotating.

[0057] Please refer to Figure 11 , the cam mechanism 151 further includes a fixed table 1512, a rotating shaft 1513, and a first compression spring 1514. The fixed table 1512 is connected to the rotating table 11. The rotating shaft 1513 is movably inserted through the fixed table 1512. The top end of the rotating shaft 1513 is connected to the cam 1511. The bottom end of the rotating shaft 1513 is provided with a limiting block 15132 and two rotating holes 15131. The first compression spring 1514 is sleeved on the rotating shaft 1513, and the two ends of the first compression spring 1514 respectively abut against the limiting block 15132 and the fixed table 1512. The first compression spring 1514 is used to provide a downward elastic force so that the cam 1511 remains in contact with the fixed table 1512.

[0058] Please refer to Figure 10, the cam drive mechanism 1531 includes a transmission block 15311, two transmission pins 15312, two second compression springs 15313, and a cam driver 15314. The transmission block 15311 is rotatably arranged about the vertical direction. The two transmission pins 15312 are vertically movably arranged on the transmission block 15311, and at least one of them is located at an eccentric position of the transmission block 15311, and the bottom of the transmission pin 15312 is suspended. The two second compression springs 15313 are respectively sleeved on the two transmission pins 15312 and are used to provide an upward elastic force so that the transmission pins 15312 protrude upward from the transmission block 15311. The cam driver 15314 is connected to the transmission block 15311 and is used to drive the transmission block 15311 and the two transmission pins 15312 to rotate. When the two transmission pins 15312 are located in the two rotation holes 15131, the rotation of the transmission block 15311 can cause the rotation shaft 1513 and the cam 1511 to rotate through the two transmission pins 15312.

[0059] The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to rise. The two transmission pins 15312 are located in the two rotation holes 15131, and the cam driver 15314 drives the transmission block 15311 and the two transmission pins 15312 to rotate, so that the cam 1511 rotates. The first compression spring 1514 provides a downward elastic force to keep the cam 1511 in contact with the fixed table 1512 and prevent the cam 1511 from shifting vertically. The two transmission pins 15312 can rotate about the vertical direction and the bottom is suspended, so that the two transmission pins 15312 will not get stuck during the process of driving the cam 1511 to rotate. The two second compression springs 15313 provide an upward elastic force so that the transmission pins 15312 protrude upward from the transmission block 15311. When the two transmission pins 15312 are inserted into the two rotation holes 15131, both the first compression spring 1514 and the second compression spring 15313 can be compressed to provide a buffering force during contact and avoid damage caused by rigid contact.

[0060] A snap ring is arranged on the transmission pin 15312, a groove 15315 is arranged on the transmission block 15311, the second compression spring 15313 is arranged in the groove 15315, and the two ends of the second compression spring 15313 are respectively in contact with the bottom wall of the groove 15315 and the lower surface of the snap ring to provide an upward acting force on the transmission pin 15312 through the snap ring.

[0061] The working principle of the chip tester according to the preferred embodiment of the present invention: The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to rise. The two transmission pins 15312 are located in the two rotation holes 15131. The cam driver 15314 drives the transmission block 15311 and the two transmission pins 15312 to rotate, causing the cam 1511 to rotate, thereby adjusting the position of the limiting member 121 to match the size of the chip. The second elastic member 152 causes the limiting member 121 to remain in contact with the cam 1511 so that the limiting member 121 remains stationary after the position is adjusted. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to descend without interfering with the rotation of the turntable 11.

[0062] When one of the trays 12 rotates to the loading position, the lifting mechanism 132 of the material supporting frame 13 located below the loading position drives the pushing mechanism 131 and the supporting block 133 to rise. The pushing drive member 1313 drives the lifting rod 13125 to move upward, driving the end of the second rod 13123 to move upward. The push rod 13121 rotates, and the end of the first rod 13122 moves close to the pressing member 122 and pushes the two pressing members 122 to move away from the corresponding limiting members 121, so that there is enough space between the two pressing members 122 and the two limiting members 121 to accommodate the chip. The loading and unloading device 5 places the chip on the four bearing strips 1331 of the supporting block 133. The pushing drive member 1313 drives the lifting rod 13125 to move downward, driving the end of the second rod 13123 to move downward. The push rod 13121 rotates in the reverse direction, and the end of the first rod 13122 moves away from the pressing member 122. The first elastic member 123 causes the pressing member 122 to move toward the corresponding limiting member 121 to press the chip.

[0063] The pushing mechanism 131 and the supporting block 133 move downward.

[0064] The turntable 11 rotates, so that the chip passes through the marking position, the detection position, and the marking position in sequence from the loading position and reaches the unloading position.

[0065] When one of the trays 12 rotates to the unloading position, the lifting mechanism 132 of the material supporting frame 13 located below the unloading position drives the pushing mechanism 131 and the supporting block 133 to rise. The pushing mechanism 131 is connected to the pressing member 122 and pushes the two pressing members 122 to move away from the corresponding limiting members 121 to release the chip. The chip falls on the supporting block 133, and the loading and unloading device 5 takes away the chip.

[0066] The pushing mechanism 131 and the supporting block 133 move downward. The turntable 11 rotates to move the empty tray 12 to the loading position.

[0067] The two material supporting frames 13 at the loading position and the unloading position can act simultaneously, and the loading and unloading are carried out at the same time to improve the efficiency.

[0068] In this way, the working process of the chip testing machine in this preferred embodiment is completed.

[0069] In the chip rotation test fixture of the present invention, during operation, when one of the trays rotates to the loading position, the lifting mechanism of the material supporting frame located below the loading position drives the pushing mechanism to rise. The pushing mechanism is connected to the pressing members and pushes the two pressing members to move away from the corresponding limiting members, so that there is enough space between the two pressing members and the two limiting members to accommodate the chip. After the chip is placed between the two pressing members and the two limiting members, the pushing mechanism is separated from the pressing members, and the first elastic member causes the pressing members to move towards the corresponding limiting members to press the chip. The lifting mechanism drives the pushing mechanism to descend back to the low position, and the above-mentioned tray continues to rotate. At the same time, when one of the trays rotates to the unloading position, the lifting mechanism of the material supporting frame located below the unloading position drives the pushing mechanism to rise. The pushing mechanism is connected to the pressing members and pushes the two pressing members to move away from the corresponding limiting members to release the chip, and the chip can be taken away. In the chip rotation test fixture of the present invention, the material supporting frame located below the loading position can assist the pressing members to clamp the chips in sequence, and the material supporting frame located below the unloading position can assist the pressing members to release the chips in sequence. Its structure is simple and the manufacturing cost is reduced.

[0070] In summary, although the present invention has been disclosed above with preferred embodiments, the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, according to the concept of the technical solution of the present invention, makes equivalent substitutions or changes, and should be covered within the protection scope of the present invention.

Claims

1. A chip rotation test fixture, characterized in that, Comprising: A platform rotating mechanism, which includes a rotating table rotatably arranged around the vertical direction; A plurality of trays for carrying chips; A plurality of the trays are arranged on the rotating table along the circumferential direction of the rotating table and rotate with the rotating table. A loading position and an unloading position are arranged on the rotation track of the tray; each tray includes two limiting members and two pressing members. The two limiting members are respectively used to limit two adjacent sides of the chip. The two pressing members are respectively arranged horizontally opposite to the two limiting members and are horizontally movably arranged to press or release the chip; each pressing member is connected with a first elastic member, and the first elastic member is used to provide an elastic force to make the pressing member move towards the corresponding limiting member to press the chip; and, A material supporting frame. The material supporting frame is arranged below both the loading position and the unloading position. The material supporting frame includes a pushing mechanism and a lifting mechanism. The lifting mechanism is connected to the pushing mechanism and is used to drive the pushing mechanism to lift and lower, so that the pushing mechanism is connected to or separated from the two pressing members; when the pushing mechanism is connected to the pressing member, the pushing mechanism can push the two pressing members to move away from the corresponding limiting members to release the chip.

2. The chip rotation test fixture according to claim 1, wherein The pushing mechanism includes: A connecting plate, which is connected to the lifting mechanism; Two pushing components. The pushing component includes a push rod and a lifting rod; the push rod includes a first rod and a second rod connected in an L shape. The connection part of the first rod and the second rod is rotatably connected to the connecting plate; the lifting rod moves vertically, and the top end of the lifting rod is connected to the end of the second rod; and, A pushing driving member, which is arranged on the connecting plate and is connected to the bottom end of each lifting rod, and is used to drive each lifting rod to move vertically, so that the ends of the two first rods move closer to or away from the pressing member in the horizontal direction.

3. The chip rotation test fixture according to claim 1, characterized in that, The tray further includes a bottom plate. The two limiting members and the two pressing members are both arranged on the bottom plate. The bottom plate is detachably connected to the rotating table.

4. The chip rotation test fixture according to claim 3, wherein A positioning groove is arranged on the bottom plate; the chip rotation test fixture further includes a clamping mechanism, which includes: A fixed block, which is connected to the rotating table; A movable rod, which is vertically movably inserted through the fixed block. The movable rod can rotate around the vertical direction and move vertically; A buckle, which is connected to the top end of the movable rod and can abut against and separate from the bottom plate. When the buckle abuts against the bottom plate, the buckle is inserted into the positioning groove to limit the rotation of the buckle; and, A compression spring, which is sleeved on the movable rod and is used to provide an elastic force to make the movable rod move downward, so that the buckle presses the bottom plate downward.

5. The chip rotation test fixture according to claim 3, wherein A avoiding port is arranged on the bottom plate; the material supporting frame further includes a supporting block. The supporting block is vertically movably arranged at the avoiding port. The supporting block is connected to the lifting mechanism. The two limiting members and the two pressing members are arranged at the avoiding port. Four bearing strips are arranged on the top surface of the supporting block. The four bearing strips are arranged in an X shape along the diagonal of the chip and are used to carry the chip and make the four edges of the chip in a suspended state.

6. The chip rotation test fixture according to claim 5, characterized in that, The limiting member is horizontally adjustably arranged on the bottom plate so as to be able to move closer to or away from the corresponding pressing member.

7. The chip rotation test fixture according to claim 6, wherein The chip rotation test fixture further includes an adjustment mechanism, and the adjustment mechanism includes: A cam mechanism, which includes a cam. The cam is rotatably arranged vertically on the rotating table and is located at one end of the limiting member away from the chip. The circumferential surface of the cam abuts against the limiting member. A second elastic member, which is connected to the limiting member and is used to provide an elastic force so that the limiting member moves away from the chip and remains in abutment with the cam. And, An adjustment driving mechanism, which is arranged on the material supporting frame at the loading position. The adjustment driving mechanism includes a cam driving mechanism and a vertical driving mechanism. The vertical driving mechanism is connected to the cam driving mechanism and can drive the cam driving mechanism to lift and then connect or disconnect from the cam mechanism. When the cam driving mechanism is connected to the cam mechanism, the cam driving mechanism can drive the cam to rotate.

8. The chip rotation test fixture according to claim 7, characterized in that The cam mechanism further includes: A fixed table, which is connected to the rotating table; A rotating shaft, which is movably penetrated through the fixed table. The top end of the rotating shaft is connected to the cam, and two rotating holes are arranged at the bottom end of the rotating shaft. And, A first compression spring, which is sleeved on the rotating shaft and is used to provide a downward elastic force so that the cam remains in abutment with the fixed table. The cam driving mechanism includes: A transmission block, which is rotatably arranged vertically; Two transmission pins, which are vertically movably arranged on the transmission block. At least one of them is located at an eccentric position of the transmission block, and the bottom of the transmission pin is suspended. Two second compression springs, which are respectively sleeved on the two transmission pins and are used to provide an upward elastic force so that the transmission pins protrude upward from the transmission block. And, A cam driver, which is connected to the transmission block and is used to drive the transmission block and the two transmission pins to rotate. When the two transmission pins are located in the two rotating holes, the rotation of the transmission block can make the rotating shaft and the cam rotate through the two transmission pins.

9. A chip testing device, characterized in that, Includes: The chip rotation test fixture according to any one of claims 1-8. A marking position, a detection position and a marking position are further arranged on the rotation track of the tray. The loading position, the marking position, the detection position, the marking position and the unloading position are arranged in sequence in a ring shape. An alignment mechanism, which is arranged at the marking position; A detection head, which is arranged at the detection position; and, A marking mechanism, which is arranged at the marking position.

10. A chip tester, characterized in that, Includes: The chip test device according to claim 9; And, A loading and unloading device, which is used to load the chip onto the tray at the loading position and unload the chip at the tray at the unloading position.

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