Probe system based on magnetic adsorption convenient fixing structure

Through a convenient fixed structure based on magnetic adsorption, the arc-shaped calibration plate and limiting slot are used to achieve accurate positioning and stable connection of the probe, which solves the measurement error problem caused by inaccurate probe installation, improves the reliability and working efficiency of measurement, and ensures stable signal transmission.

CN120233128AInactive Publication Date: 2025-07-01DONGGUAN QITUO ELECTRONIC TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202510318664.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-18
Publication Date
2025-07-01
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

In the prior art, the probe is not accurately placed at the specified position of the probe holder during installation, causing the contact point to deviate from the ideal position, introducing additional contact resistance, and reducing the reliability and confidence of the measurement results.

Method used

The convenient fixing structure based on magnetic adsorption is adopted, including the probe base, inner tube, outer tube and calibration parts. The magnetic and mechanical structure ensures the precise positioning and stable connection of the probe body in the mounting base, and the arc-shaped calibration plate and limiting groove are used to achieve radial positioning and interference fit to ensure the tight connection between the probe body and the plug.

Benefits of technology

The precise positioning of the probe in the mount is achieved, measurement errors are avoided, signal transmission is ensured, operation process is simplified, measurement accuracy and working efficiency are improved, probes are prevented from loosening and falling off, and good heat dissipation performance is provided.

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Abstract

The invention relates to the technical field of current probes, and discloses a probe system based on a magnetic adsorption convenient fixing structure, the probe system comprises a probe seat, the probe seat comprises a support and a mounting seat, and the mounting seat is arranged in the support; the probe main body is arranged in the mounting seat; wherein the mounting seat comprises an inner tube and an outer tube, and a calibration piece used for calibrating the position of the probe main body is arranged in a space defined by the inner tube and the outer tube. The probe system based on the magnetic adsorption convenient fixing structure can effectively solve the problems that in the prior art, because a probe is not accurately placed at a designated position of a probe base during installation, a contact point of the probe and a measured object deviates from an ideal position, additional contact resistance is introduced, measured parameters such as resistance and voltage are deviated, and the measurement precision is poor. The reliability and the credibility of a measurement result are reduced, and subsequent data analysis and judgment are difficult.
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Description

Technical Field

[0001] The present invention relates to the technical field of current probes, and particularly to a probe system based on a convenient fixing structure by magnetic adsorption. Background Art

[0002] A probe is generally formed by riveting a needle tip, a needle tail, a spring, and a needle tube using relevant instruments. It can measure the magnitude of alternating or direct current flowing through a wire without cutting off the circuit, convert the current signal into a voltage signal for easy observation and analysis. And the staff can install a suitable probe in the probe base according to the type of the electrical device to be measured to achieve rapid testing of the electrical device.

[0003] For some probes that require high-precision installation, special auxiliary positioning tools or jigs are needed for calibration to align the central axes of the probe and the probe base to ensure accurate transmission of the test signal. If the probe is not accurately placed at the designated position of the probe base during installation, the contact point between the probe and the object to be measured will deviate from the ideal position, introducing additional contact resistance, which will cause deviations in parameters such as measured resistance and voltage, reducing the reliability and credibility of the measurement results and bringing difficulties to subsequent data analysis and judgment. Summary of the Invention

[0004] Technical Problem to be Solved Aiming at the above-mentioned drawbacks of the prior art, the present invention provides a probe system based on a convenient fixing structure by magnetic adsorption, which can effectively solve the problem in the prior art that when the probe is not accurately placed at the designated position of the probe base during installation, the contact point between the probe and the object to be measured will deviate from the ideal position, introducing additional contact resistance, which will cause deviations in parameters such as measured resistance and voltage, reducing the reliability and credibility of the measurement results and bringing difficulties to subsequent data analysis and judgment.

[0005] To achieve the above object, the present invention is realized through the following technical solutions: The present invention provides a probe system based on a convenient fixing structure by magnetic adsorption, including: A probe base, the probe base includes a bracket and a mounting seat, and the mounting seat is arranged inside the bracket; A probe body, the probe body is arranged inside the mounting seat; Wherein, the mounting seat includes an inner tube and an outer tube, and a calibration member for calibrating the position of the probe body is arranged in the space surrounded by the inner tube and the outer tube. The inner tube is fixedly connected to the surface of the bracket through a support plate arranged at its top, and the outer tube is rotatably connected to the circumferential outer surface of the inner tube through a ring groove arranged on its inner wall; Wherein, a locking member for limiting the position of the outer tube is arranged on the upper surface of the bracket.

[0006] Further, a jack is provided on the upper surface of the probe body, and a limiting groove is provided on the circumferential outer surface of the probe body, and an inclined surface is provided in the limiting groove. A plurality of the limiting grooves are provided and are distributed in a circumferential array around the central axis of the probe body; A plug is fixedly connected to the middle part of the support plate, and the plug penetrates through the top of the inner tube and extends into the jack.

[0007] Further, the calibration member includes a first movable rod and a second movable rod. Both the first movable rod and the second movable rod penetrate through the circumferential outer surface of the inner tube. A curved calibration plate that fits against the circumferential outer surface of the probe body is fixedly connected to one end of the first movable rod away from the outer tube. A plurality of the curved calibration plates are provided and are distributed in a circumferential array along the inner tube. The curved calibration plate is connected to the inner wall of the inner tube through an elastic member provided on its circumferential outer surface. The inner tube is slidably connected to a vertical rod through a limiting frame provided on its circumferential outer surface, and the vertical rod fits against one ends of the first movable rod and the second movable rod close to the outer tube through an inclined surface provided at its end.

[0008] Further, the inner tube is connected to a contact plate that fits against one end of the first movable rod away from the outer tube through a circular wire spring provided at the top of its inner wall. The inner tube is fixedly connected to an electromagnet through an elastic member provided at the top of its inner wall. A magnetic connection is provided between the top of the contact plate and the electromagnet.

[0009] Further, the locking member includes a fixed ring, the fixed ring is fixedly connected to the top of the bracket, the fixed ring is slidably connected to a wedge block through a notch provided on its top, and the wedge block is connected to the inner wall of the notch through a compression spring provided at its bottom. A plurality of the wedge blocks are provided and are distributed in a circumferential array along the fixed ring. A ring plate is fixedly connected to the circumferential outer surface of the outer tube, and a contact block that fits against the wedge block is fixedly connected to the bottom end of the ring plate.

[0010] Further, the locking member further includes a limiting rod, the limiting rod penetrates through the inner wall of the inner tube and fits against the inner wall of the limiting groove. An abutting arc block is fixedly connected to one end of the limiting rod close to the outer tube, and the abutting arc block is connected to the outer wall of the inner tube through a return spring provided on its surface. An arc-shaped block that fits against the circumferential outer surface of the abutting arc block is fixedly connected to the inner wall of the outer tube.

[0011] Further, a through hole is provided on the circumferential outer surface of the inner tube, and a heat dissipation slot hole is provided on the circumferential outer surface of the outer tube, and a dust-proof net is provided inside the heat dissipation slot hole.

[0012] The technical solution provided by the present invention has the following beneficial effects compared with the prior art: The present invention is provided with a calibration member, a limiting rod and a limiting groove. The arc-shaped calibration plate gradually approaches and fits the circumferential outer surface of the probe body from different directions, which can provide accurate radial positioning for the installation of the probe, ensure that the probe body is in an accurate position in the mounting seat, and avoid measurement errors caused by the position deviation of the probe body. Moreover, the inclined surface in the limiting groove cooperates with the inclined surface of the limiting rod, which will cause the probe body to generate a short-distance upward displacement, so as to make the connection between the probe body and the plug closer. The upward displacement makes an interference fit state between the two, increasing the friction and biting force between them, effectively preventing the probe body from loosening or even falling off the plug due to vibration, shaking and other reasons during use, and ensuring the stability of the probe body during work. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0014] Figure 1 is a three-dimensional structure schematic diagram of an embodiment of the present invention; Figure 2 is a three-dimensional separated structure schematic diagram of an embodiment of the present invention; Figure 3 is a three-dimensional separated structure schematic diagram of the mounting seat of an embodiment of the present invention; Figure 4 is a three-dimensional structure schematic diagram of the probe body of an embodiment of the present invention; Figure 5 is a cross-sectional structure schematic diagram of an embodiment of the present invention; Figure 6 is an embodiment of the present invention Figure 5 is an enlarged schematic diagram of the structure at A in the figure; Figure 7 is an embodiment of the present invention Figure 5 is an enlarged schematic diagram of the structure at B in the figure; Figure 8 is an embodiment of the present invention Figure 5 is an enlarged schematic diagram of the structure at C in the figure; Figure 9 is a three-dimensional separated structure schematic diagram of the inner tube and the calibration member of an embodiment of the present invention; Figure 10 is a three-dimensional structure schematic diagram of the calibration member of an embodiment of the present invention; Figure 11 is a cross-sectional structure schematic diagram of the mounting seat of an embodiment of the present invention; Figure 12 is an embodiment of the present inventionFigure 11 Schematic enlarged view of the structure at position D in the [Chinese context]; Figure 13 This is a schematic diagram of the three-dimensional state conversion structure of the inner tube and the outer tube in the embodiment of the present invention.

[0015] The reference numerals in the figure respectively represent: 1, probe base; 11, bracket; 12, mounting seat; 121, inner tube; 1211, through hole; 122, outer tube; 1221, heat dissipation slot hole; 1222, dust-proof net; 123, calibration member; 1231, movable rod 1; 1232, movable rod 2; 1233, arc calibration plate; 1234, vertical rod; 1235, abutting plate; 1236, electromagnetic block; 13, locking member; 131, fixed ring; 132, notch; 133, wedge block; 134, compression spring; 135, ring plate; 136, abutting block; 137, limiting rod; 138, abutting arc block; 139, arc block; 2, probe body; 21, jack; 22, limiting groove; 23, plug. Detailed implementation manners

[0016] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Apparently, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0017] The present invention will be further described below with reference to the embodiments. Embodiment

[0018] Please refer to Figures 1 - 13 , the present invention provides a technical solution: a probe system based on a convenient fixing structure by magnetic adsorption, including: A probe base 1, the probe base 1 includes a bracket 11 and a mounting seat 12, and the mounting seat 12 is arranged inside the bracket 11; A probe body 2, the probe body 2 is arranged inside the mounting seat 12; Among them, the mounting seat 12 includes an inner tube 121 and an outer tube 122. A calibration member 123 for calibrating the position of the probe body 2 is arranged in the space surrounded by the inner tube 121 and the outer tube 122. The inner tube 121 is fixedly connected to the surface of the bracket 11 through a support plate provided at its top, and the outer tube 122 is rotatably connected to the circumferential outer surface of the inner tube 121 through a ring groove provided on its inner wall; Among them, a locking member 13 for limiting the position of the outer tube 122 is arranged on the upper surface of the bracket 11.

[0019] The upper surface of the probe body 2 is provided with a jack 21, and the circumferential outer surface of the probe body 2 is provided with a limiting groove 22, and the limiting groove 22 is provided with an inclined surface. There are several limiting grooves 22 and they are distributed in a circumferential array around the central axis of the probe body 2; A plug 23 is fixedly connected to the middle part inside the support plate, and the plug 23 penetrates through the top of the inner tube 121 and extends into the jack 21.

[0020] The calibration part 123 includes a first movable rod 1231 and a second movable rod 1232. Both the first movable rod 1231 and the second movable rod 1232 penetrate through the circumferential outer surface of the inner tube 121. One end of the first movable rod 1231 away from the outer tube 122 is fixedly connected with an arc-shaped calibration plate 1233 that fits against the circumferential outer surface of the probe body 2. There are multiple arc-shaped calibration plates 1233 and they are distributed in a circumferential array along the inner tube 121. The arc-shaped calibration plate 1233 is connected to the inner wall of the inner tube 121 through an elastic member arranged on its circumferential outer surface. The inner tube 121 is slidably connected with a vertical rod 1234 through a limiting frame arranged on its circumferential outer surface, and the vertical rod 1234 fits against one ends of the first movable rod 1231 and the second movable rod 1232 close to the outer tube 122 through an inclined surface arranged at its end.

[0021] The inner tube 121 is connected with an abutting plate 1235 that fits against one end of the first movable rod 1231 away from the outer tube 122 through a circular wire spring arranged at the top of its inner wall. The inner tube 121 is fixedly connected with an electromagnetic block 1236 through an elastic member arranged at the top of its inner wall. There is a magnetic connection between the top end of the abutting plate 1235 and the electromagnetic block 1236.

[0022] The locking part 13 includes a fixed ring 131. The fixed ring 131 is fixedly connected to the top of the support 11. The fixed ring 131 is slidably connected with a wedge block 133 through a notch 132 opened on its top. The wedge block 133 is connected to the inner wall of the notch 132 through a compression spring 134 arranged at its bottom end. There are multiple wedge blocks 133 and they are distributed in a circumferential array along the fixed ring 131. A ring plate 135 is fixedly connected to the circumferential outer surface of the outer tube 122, and an abutting block 136 that fits against the wedge block 133 is fixedly connected to the bottom end of the ring plate 135.

[0023] The locking part 13 further includes a limiting rod 137. The limiting rod 137 penetrates through the inner wall of the inner tube 121 and fits against the inner wall of the limiting groove 22. One end of the limiting rod 137 close to the outer tube 122 is fixedly connected with an abutting arc block 138. The abutting arc block 138 is connected to the outer wall of the inner tube 121 through a return spring arranged on its surface. An arc-shaped block 139 that fits against the circumferential outer surface of the abutting arc block 138 is fixedly connected to the inner wall of the outer tube 122.

[0024] The outer circumferential surface of the inner tube 121 is provided with through holes 1211, and the outer circumferential surface of the outer tube 122 is provided with heat dissipation slot holes 1221, and a dust-proof net 1222 is arranged inside the heat dissipation slot holes 1221.

[0025] Principle and advantages of the probe system based on the convenient fixing structure by magnetic adsorption: During actual use, the operator gradually moves the probe body 2 towards the inner tube 121. When the top of the probe body 2 abuts against the abutting plate 1235, the probe body 2 will push the abutting plate 1235 to continue moving in the inner tube 121. Since the abutting plate 1235 and the inner tube 121 are connected by a round wire spring, the round wire spring will be compressed. And there are mutually fitting inclined surfaces between the abutting plate 1235 and the second movable rod 1232 (the inclined surface of the abutting plate 1235 is provided with a guide groove, and the inclined surface of the second movable rod 1232 is provided with a guide block that fits with the guide groove). When the abutting plate 1235 is displaced by the push of the probe body 2, due to the interaction of the inclined surfaces, a component force along the inclined surface will be generated on the second movable rod 1232, and the second movable rod 1232 will move under the action of this component force. Since there are mutually fitting inclined surfaces between the vertical rod 1234 and the first movable rod 1231 and the second movable rod 1232 respectively, the first movable rod 1231 will drive each arc calibration plate 1233 to move synchronously towards the probe body 2 (the number of arc calibration plates 1233 can be set according to actual use requirements, and three arc calibration plates 1233 are selected here). When the arc calibration plates 1233 gradually fit with the outer circumferential surface of the probe body 2, the position of the probe body 2 in the probe seat 1 can be automatically calibrated, so that the central axis of the probe body 2 coincides with the central axis of the mounting seat 12.

[0026] At the same time, when the abutting plate 1235 approaches the electromagnetic block 1236 near the inner top end of the inner tube 121, the electromagnetic block 1236 will generate a magnetic force to adsorb the abutting plate 1235. At this time, the abutting plate 1235 moves to the maximum distance, so that the arc calibration plates 1233 closely fit on the outer circumferential surface of the probe body 2 (a flexible rough material can be installed on the side of the arc calibration plate 1233 close to the probe body 2, which can increase the friction between the arc calibration plate 1233 and the probe body 2, and this flexible rough material will not affect the normal detection of the probe body 2). At the same time, the plug 23 will be inserted into the probe body 2, thus completing the preliminary fixation of the probe body 2.

[0027] It should be noted that the arc calibration plates 1233 gradually approach and fit with the outer circumferential surface of the probe body 2 from different directions, which can ensure that the probe body 2 is accurately located at the center of the mounting seat 12, keep the probe body 2 in a stable posture during the detection process, and ensure that the relative position between the probe body 2 and the object to be measured is consistent each time.

[0028] The present invention uses a calibration part 123 to adjust the position of the probe body 2, which has the following advantages: Advantage 1: The arc-shaped calibration plate 1233 gradually approaches and fits the outer circumferential surface of the probe body 2 from different directions. The fitting of the arc-shaped calibration plate 1233 and the surface of the probe body 2 can provide accurate radial positioning for the installation of the probe, ensuring that the probe body 2 is in an accurate position within the mounting seat 12, which helps to improve the accuracy of subsequent measurements and avoid measurement errors caused by the position deviation of the probe body 2.

[0029] Advantage 2: Each arc-shaped calibration plate 1233 gradually approaches the probe body 2 synchronously, which can evenly distribute the contact pressure on the surface of the probe body 2, ensure the stability of the contact resistance between the probe body 2 and the object under test or the circuit, and ensure the stable and accurate transmission of signals. At the same time, the uniform contact pressure enables the probe body 2 not to be adjusted and calibrated frequently during use, simplifies the operation process, reduces the requirements for the skill level of operators, and improves work efficiency.

[0030] After the preliminary fixation of the probe body 2 is completed, at this time, the operator rotates the outer tube 122 forcefully. When the outer tube 122 rotates, the ring plate 135 installed on the outer circumferential surface of the outer tube 122 can drive the abutting block 136 to rotate synchronously. When the abutting block 136 rotates, it will contact the wedge block 133 on the surface of the fixed ring 131. The wedge block 133 and the abutting block 136 are respectively provided with inclined surfaces and vertical surfaces. When the abutting block 136 is in the initial position, the vertical surface of the wedge block 133 will fit with the vertical surface of the wedge block 133. As the operator continues to rotate the outer tube 122, the inclined surface of the abutting block 136 will gradually contact the inclined surface of the wedge block 133, so that the wedge block 133 can be squeezed into the notch 132 (the outer tube 122 can only rotate in a single direction. When rotating in the reverse direction, the vertical surface of the wedge block 133 will interfere with the vertical surface of the abutting block 136). When the wedge block 133 completely enters the notch 132, at this time, the outer tube 122 can rotate a certain angle. When the abutting block 136 just disengages from the top of the wedge block 133, the compression spring 134 will reset the wedge block 133, and the adjacent two wedge blocks 133 will re-limit the abutting block 136 (after the wedge block 133 is reset, a part of the shorter vertical surface of the wedge block 133 will fit with the shorter vertical surface of the abutting block 136, which can prevent the outer tube 122 from disengaging from the limit of the wedge block 133 during use).

[0031] As the outer tube 122 rotates, the arc-shaped block 139 fixed on the inner wall of the outer tube 122 will come into contact with the abutting arc block 138 on the limiting rod 137 (a roller is fitted on the surface of the abutting arc block 138 to increase the smoothness of movement between the arc-shaped block 139 and the abutting arc block 138). Since the arc-shaped block 139 is convex, as the arc-shaped block 139 rotates, the arc-shaped block 139 will gradually press the abutting arc block 138, and then the limiting rod 137 will gradually move towards the limiting groove 22 on the surface of the probe body 2. When the limiting rod 137 just enters the limiting groove 22, the inclined surface at the end of the limiting rod 137 will come into contact with the inclined surface inside the limiting groove 22. At this time, as the limiting rod 137 continues to move, the two inclined surfaces will press against each other (the limiting rod 137 passes through the inner tube 121, and the position of the limiting rod 137 is limited and there will be no displacement in the vertical direction), so that the probe body 2 will generate a short-distance displacement in the vertical direction. When the plane of the limiting rod 137 is flush with the plane of the limiting groove 22, the limiting rod 137 will be inserted into the limiting groove 22 (the width of the limiting rod 137 is the same as the final fitting position of the limiting groove 22), thus completing the installation and fixation of the probe body 2. At the same time, the electromagnetic block 1236 at the top end inside the inner tube 121 will stop working (since the electromagnetic block 1236 is connected to the inner tube 121 through an elastic member and can undergo a certain degree of deformation, during the process of the limiting rod 137 being inserted into the limiting groove 22, the abutting plate 1235 can continue to undergo a short-distance displacement in the vertical direction).

[0032] When it is necessary to disassemble the probe body 2, the operator only needs to rotate the outer tube 122 so that the arc-shaped block 139 and the abutting arc block 138 are separated. At this time, the limiting rod 137 will return to its initial position with the cooperation of the return spring. Then the probe body 2 will lose its limit. At the same time, the arc-shaped calibration plate 1233 will return to its initial position with the cooperation of the elastic member, and the operator can directly take out the probe body 2.

[0033] During the rotation of the outer tube 122, the heat dissipation slot holes 1221 on the circumferential outer surface of the outer tube 122 will gradually align with the through holes 1211 on the inner tube 121. When the probe body 2 is limited, the heat dissipation slot holes 1221 will be completely connected to the through holes 1211, thus forming a heat dissipation channel, which is beneficial to the heat dissipation of the probe body 2 during the detection process. And when the operator disassembles the probe body 2 from the mounting seat 12, the heat dissipation slot holes 1221 and the through holes 1211 will be misaligned, and the inner wall of the outer tube 122 will block the through holes 1211, which can prevent dust and impurities from entering the inner tube 121 through the heat dissipation channel formed by the heat dissipation slot holes 1221 and the through holes 1211.

[0034] It should be noted that after the limiting rod 137 cooperates with the limiting groove 22 to limit the probe body 2, the electromagnetic block 1236 stops working. At the same time, an electromagnetic shielding layer is provided outside the electromagnetic block 1236. For example, a shielding cover is made of a metal material with good electrical conductivity such as copper or aluminum to wrap the electromagnetic block 1236 to prevent the magnetic field from leaking outwards and reduce the influence on the probe body 2. And when the probe body 2 is connected to the probe base 1, the current needs to be transmitted to the probe body 2 through the plug 23. Since the metal material at the plug 23 has a certain resistivity, Joule heat will be generated when the current passes through. Therefore, the heat dissipation slot holes 1221 are opened near the connection position between the plug 23 and the probe body 2, which is beneficial to the heat dissipation of the probe body 2.

[0035] The present invention adopts the limiting rod 137 and the limiting groove 22, which have the following advantages: Advantage 1: Multiple limiting rods 137 are inserted into the limiting groove 22 from different directions due to the extrusion of the arc-shaped block 139, which can make the limiting rods 137 receive balanced forces when entering the limiting groove 22. Compared with the traditional installation of the probe body 2, the installation steps of the probe body 2 are simplified, and it can be avoided that due to operation errors of the staff, the probe body 2 is not evenly stressed during installation, the position of the probe body 2 in the probe base 1 is relatively displaced, the measurement reference position is changed, and the measurement data is inaccurate.

[0036] Advantage 2: Due to the cooperation of the inclined surfaces in the limiting groove 22 and the limiting rod 137, the probe body 2 will generate a short-distance upward displacement, so that the connection between the probe body 2 and the plug 23 is tighter. The upward displacement makes a state similar to an interference fit between them, increasing the friction force and biting force between them, effectively preventing the probe body 2 from loosening or even falling off due to vibration, shaking, etc. during use, and ensuring the stability of the probe body 2 during work.

[0037] Advantage 3: By rotating the outer tube 122, the heat dissipation slot holes 1221 are communicated with the through holes 1211, and a smoother air circulation channel can be formed, so that the heat can be dissipated to the surrounding environment more quickly, avoiding the occurrence of local overheating. When the probe base 1 is not in use, the heat dissipation slot holes 1221 and the through holes 1211 will be misaligned, and the through holes 1211 are blocked by the inner wall of the outer tube 122, which can effectively block foreign matters such as dust and sundries from entering the inside of the probe base 1 and affecting the normal use of the probe body 2.

[0038] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements will not cause the essence of the corresponding technical solutions to deviate from the protection scope of the technical solutions of the embodiments of the present invention.

Claims

1. A probe system based on a convenient fixing structure of magnetic adsorption, characterized in that: include: A probe base (1), the probe base (1) comprising a bracket (11) and a mounting base (12), the mounting base (12) being arranged inside the bracket (11); A probe body (2), wherein the probe body (2) is arranged inside the mounting seat (12); The mounting seat (12) comprises an inner tube (121) and an outer tube (122); a calibration piece (123) for calibrating the position of the probe body (2) is provided in the space enclosed by the inner tube (121) and the outer tube (122); the inner tube (121) is fixedly connected to the surface of the bracket (11) via a support plate provided on the top thereof; and the outer tube (122) is rotatably connected to the circumferential outer surface of the inner tube (121) via an annular groove provided on the inner wall thereof; Wherein, a locking piece (13) for limiting the position of the outer tube (122) is provided on the upper surface of the bracket (11).

2. According to claim 1, a probe system based on a convenient fixing structure of magnetic adsorption is characterized in that: The upper surface of the probe body (2) is provided with an insertion hole (21), the circumferential outer surface of the probe body (2) is provided with a limiting groove (22), and an inclined surface is provided in the limiting groove (22), and a plurality of the limiting grooves (22) are arranged in a circumferential array around the central axis of the probe body (2); A plug (23) is fixedly connected to the middle of the support plate, and the plug (23) passes through the top of the inner tube (121) and extends into the insertion hole (21).

3. According to claim 1, a probe system based on a convenient fixing structure of magnetic adsorption is characterized in that: The calibration member (123) comprises a movable rod 1 (1231) and a movable rod 2 (1232), wherein the movable rod 1 (1231) and the movable rod 2 (1232) both penetrate the circumferential outer surface of the inner tube (121), and an end of the movable rod 1 (1231) away from the outer tube (122) is fixedly connected to an arc-shaped calibration plate (1233) that fits the circumferential outer surface of the probe body (2), and the arc-shaped calibration plate (1233) is provided with a plurality of movable rods extending along the inner tube (121). The tubes (121) are arranged in a circular array, the arc-shaped calibration plate (1233) is connected to the inner wall of the inner tube (121) via an elastic member arranged on the outer surface of the circle, the inner tube (121) is slidably connected to a vertical rod (1234) via a limit frame arranged on the outer surface of the circle, and the vertical rod (1234) is fitted with an end of the movable rod 1 (1231) and the movable rod 2 (1232) close to the outer tube (122) via an inclined surface arranged at the end thereof.

4. The probe system based on a convenient fixing structure of magnetic adsorption according to claim 1, characterized in that: The inner tube (121) is connected to an abutment plate (1235) that fits with an end of the movable rod (1231) away from the outer tube (122) via a round wire spring arranged at the top of its inner wall. The inner tube (121) is fixedly connected to an electromagnetic block (1236) via an elastic member arranged at the top of its inner wall. The top of the abutment plate (1235) and the electromagnetic block (1236) are magnetically connected.

5. The probe system based on a convenient fixing structure of magnetic adsorption according to claim 1, characterized in that: The locking member (13) comprises a fixed circular ring (131), wherein the fixed circular ring (131) is fixedly connected to the top of the bracket (11), and the fixed circular ring (131) is slidably connected to a wedge block (133) via a notch (132) provided at the top of the fixed circular ring (131), and the wedge block (133) is connected to the inner wall of the notch (132) via a compression spring (134) provided at the bottom end thereof, and a plurality of wedge blocks (133) are provided and are distributed in an array along the circumference of the fixed circular ring (131), and a ring plate (135) is fixedly connected to the circumferential outer surface of the outer tube (122), and a contact block (136) that fits the wedge block (133) is fixedly connected to the bottom end of the ring plate (135).

6. The probe system based on a convenient fixing structure of magnetic adsorption according to claim 1, characterized in that: The locking member (13) further comprises a limiting rod (137), the limiting rod (137) passing through the inner wall of the inner tube (121) and being in contact with the inner wall of the limiting groove (22); an end of the limiting rod (137) close to the outer tube (122) is fixedly connected to an abutting arc block (138), and the abutting arc block (138) is connected to the outer wall of the inner tube (121) via a return spring arranged on its surface; and an arc block (139) is fixedly connected to the inner wall of the outer tube (122) and is in contact with the circumferential outer surface of the abutting arc block (138).

7. The probe system based on a convenient fixing structure of magnetic adsorption according to claim 1, characterized in that: The inner tube (121) has a through hole (1211) on its circumferential outer surface, the outer tube (122) has a heat dissipation slot hole (1221) on its circumferential outer surface, and a dustproof net (1222) is provided inside the heat dissipation slot hole (1221).