Server hardware testing device

Abstract

The invention discloses a server hardware testing device, and relates to the technical field of servers, the server hardware testing device comprises a supporting plate, a testing table and a clamping assembly, the testing table is rotatably arranged on the supporting plate, the clamping assembly is movably arranged on the testing table, the clamping assembly comprises a fixed part and a movable part, and the fixed part and the movable part are arranged on the supporting plate. The movable part is connected with the fixed part, the movable part can move in the circumferential direction of the test board relative to the fixed part, the number of the clamping assemblies is multiple, and the multiple clamping assemblies are arranged in the circumferential direction of the test board at intervals. According to the testing device for the server hardware, a tester can quickly and easily adjust the position and angle of the to-be-tested hardware, different testing requirements are met, the time required for repositioning or installing the hardware is shortened, the overall testing efficiency is improved, the testing device can adapt to the server hardware of various types and sizes, and the testing efficiency is improved. The requirement for replacing the testing device is lowered, and the working efficiency is further improved.

Description

Technical Field

[0001] This application relates to the technical field of servers, and particularly to a test device for server hardware. Background Art

[0002] In the related art, it is pointed out that with the continuous development and complexity of server hardware, the requirements for the test platform are also constantly increasing. Due to the fixed structure and single function of the traditional test platform, it has been difficult to meet the current diverse and high-efficiency test requirements. Especially during the test process, the angle and height of the server cannot be flexibly adjusted, which not only affects the test efficiency but also may increase the work intensity of the test personnel, reducing the accuracy and convenience of the test work. Summary of the Invention

[0003] This application aims to solve at least one of the technical problems existing in the prior art. For this reason, this application proposes a test device for server hardware, which improves the test efficiency, reduces the work intensity of the test personnel, and improves the accuracy and convenience of the test work.

[0004] The test device for server hardware according to this application includes: a support plate; a test bench rotatably provided on the support plate; a plurality of clamping components movably provided on the test bench. The clamping component includes: a fixed member and a movable member, the movable member is connected to the fixed member, and the movable member is movable relative to the fixed member in the circumferential direction of the test bench. The plurality of clamping components are arranged at intervals in the circumferential direction of the test bench. Each clamping component is movable along the radial direction of the test bench. The movable member includes a first movable block and a second movable block. The first movable block is slidably connected to the fixed member relatively in the circumferential direction of the test bench, and the second movable block is slidably connected to the first movable block relatively in the circumferential direction of the test bench.

[0005] The test device for server hardware according to this application, by providing a rotatable test bench and adjustable clamping components, allows the test personnel to quickly and easily adjust the position and angle of the hardware to be tested, meet different test requirements, reduce the time required for repositioning or installing the hardware, improve the overall test efficiency, can adapt to various types and sizes of server hardware, reduce the need to replace the test device, and further improve the work efficiency. By providing a fixed member, a first movable block and a second movable block, the adjustability of the clamping component in the radial direction and the circumferential direction is realized, which can adapt to server hardware of various sizes and shapes, improve the versatility and practicality of the test device for server hardware, reduce the time for reconfiguring the test area, and enhance the overall test efficiency.

[0006] In some feasible embodiments of the present application, a first mating portion is formed on the fixing member, a second mating portion is formed on the first movable block, and the first movable block and the fixing member are slidably mated through the first mating portion and the second mating portion.

[0007] In some feasible embodiments of the present application, a third mating portion is formed on the first movable block, a fourth mating portion is formed on the second movable block, and the second movable block and the first movable block are slidably mated through the third mating portion and the fourth mating portion.

[0008] In the above technical solution, the sliding adjustment between the first movable block and the fixing member is realized through the first mating portion and the second mating portion. The first mating portion and the second mating portion also play a guiding role, ensuring that the first movable block relative to the fixing member realizes the sliding adjustment between the second movable block and the first movable block through the third mating portion and the fourth mating portion, solving the problem of poor flexibility when the traditional test platform clamps the hardware, and also improving the stability during the test process.

[0009] In some feasible embodiments of the present application, the test device for server hardware further includes: an adjusting mechanism, the adjusting mechanism is disposed between the support plate and the test table, and the adjusting mechanism includes: a first transmission mechanism, a second transmission mechanism, an electromagnetic clutch, and a driving mechanism, and the driving mechanism is switchably connected to the first transmission mechanism and the second transmission mechanism through the electromagnetic clutch.

[0010] In the above technical solution, by setting the electromagnetic clutch, the driving mechanism can be quickly and stably switched between connecting the first transmission mechanism and connecting the second transmission mechanism, and the function can be expanded without adding an additional power source. This not only saves space, but also reduces the cost and the structural complexity of the test device for server hardware. The tester can quickly and easily adjust the position and angle of the hardware to be tested to meet different test requirements.

[0011] In some feasible embodiments of the present application, the electromagnetic clutch has a switchable engaged state and disengaged state. When the electromagnetic clutch is in the engaged state, the driving mechanism is connected to at least some of the clamping assemblies of the plurality of clamping assemblies through the first transmission mechanism, and is used to drive the clamping assemblies to move in the radial direction of the test table. When the electromagnetic clutch is in the disengaged state, the driving mechanism is connected to the test table through the second transmission mechanism, and is used to drive the test table to rotate.

[0012] In the above technical solution, a single driving mechanism is enabled to perform multiple functions, and it can not only achieve precise movement in the radial direction through the first transmission mechanism, but also achieve the rotation of the test table.

[0013] In some feasible embodiments of the present application, the first transmission mechanism includes: a first gear set, the first gear set includes a first bevel gear and a second bevel gear, and the first bevel gear meshes with the second bevel gear; a transmission rod, the first bevel gear is connected to the transmission rod, and the transmission rod is connected to the drive shaft of the drive mechanism through the electromagnetic clutch; a lead screw, the lead screw extends along the radial direction of the test bench and is rotatable relative to the test bench, and the second bevel gear is connected to the lead screw; a fitting, the fitting is connected to the fixing member, the fitting is sleeved on the lead screw and is threadedly connected to the lead screw.

[0014] In the above technical solution, by setting the lead screw, the rotational motion is converted into a linear motion for precisely controlling the position of the fitting. The first bevel gear and the second bevel gear mesh with each other to transmit power and change the transmission direction. The overall design of the first transmission mechanism is simple and compact, reducing the failure rate of the test device for server hardware.

[0015] In some feasible embodiments of the present application, the lead screws and the clamping assemblies are arranged in one-to-one correspondence.

[0016] In some feasible embodiments of the present application, the test bench is formed with a meshing portion. The second transmission mechanism includes: a second gear set, the second gear set includes a first gear and a second gear, and the second gear meshes with both the first gear and the meshing portion; a telescopic rod, one end of the telescopic rod is connected to the support plate, and the other end of the telescopic rod is connected to the second gear to drive the second gear to move in the up-and-down direction.

[0017] In the above technical solution, by setting the telescopic rod, the second gear can be moved in the up-and-down direction. When the test bench needs to be rotated, the electromagnetic clutch is powered off, and the drive mechanism is disconnected from the first transmission mechanism. The telescopic rod extends to drive the second gear to move towards the plane where the first gear is located, so that the first gear meshes with the second gear. In this way, the drive mechanism can always be connected to only one of the first transmission mechanism and the second transmission mechanism, avoiding the situation where the drive mechanism is connected to both the first transmission mechanism and the second transmission mechanism at the same time, thereby avoiding accidents.

[0018] In some feasible embodiments of the present application, an installation cavity is defined between the test bench and the support plate. The drive mechanism and the second transmission mechanism are arranged in the installation cavity, and the meshing portion is formed on the peripheral wall of the installation cavity. One of the test bench and the support plate is provided with a first sliding portion, and the other of the test bench and the support plate is provided with a second sliding portion. The test bench and the support plate are slidably matched through the first sliding portion and the second sliding portion.

[0019] In the above technical solution, the installation cavity is defined by the test bench and the support plate, making the overall structure of the test device for server hardware more compact, improving the space utilization rate. The test bench and the support plate cooperate and slide through the first sliding part and the second sliding part to achieve stable and accurate guiding, ensuring the smoothness during the rotation of the test bench.

[0020] In some feasible embodiments of the present application, the test device for server hardware further includes: a base, the base is arranged below the support plate; a lifting mechanism, the lifting mechanism is arranged between the base and the support plate to move the support plate in the up and down direction; a blower, the blower is arranged on the support plate, and the blower is arranged at an interval from the test bench.

[0021] Some additional aspects and advantages of the present application will be given in the following description, some will become obvious from the following description, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] To more clearly illustrate the embodiments of the present application, the following will briefly introduce the drawings required for the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0023] Figure 1 A test device for server hardware provided by an embodiment of the present application; Figure 2 For Figure 1 A cross-sectional schematic diagram of the test device shown in Figure 3 For Figure 2 A partial enlarged view of the a position shown in Figure 4 For Figure 1 A structural schematic diagram of the clamping assembly shown in

[0024] Among them, the above drawings include the following reference numerals: 100, a test device for server hardware; 1, a support plate; 11, a second sliding part; 12, an installation cavity; 2, a test bench; 21, a guide groove; 22, a first sliding part; 23, an engaging part; 3, a clamping assembly; 31, a fixing part; 311, a first mating part; 32, a first movable block; 321, a second mating part; 322, a third mating part; 33, a second movable block; 331, a fourth mating part; 332, an anti-slip groove; 4. The first transmission mechanism; 41. The first bevel gear; 42. The second bevel gear; 43. The transmission rod; 44. The lead screw; 45. The fitting; 5. The second transmission mechanism; 51. The first gear; 52. The second gear; 53. The telescopic rod; 6. The driving mechanism; 61. The driving shaft; 7. The electromagnetic clutch; 8. The base; 9. The lifting mechanism; 10. The fan. Detailed implementation manners

[0025] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the protection scope of the present application.

[0026] It should be noted that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus cannot be construed as a limitation on the present application. The terms "installation", "connection", and "coupling" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the internal communication of two elements. The terms "parallel", "perpendicular", and "equal" include the described situations and situations similar to the described situations, and the range of the similar situations is within the acceptable deviation range, where the acceptable deviation range is determined by those of ordinary skill in the art considering the measurements being discussed and the errors associated with the measurements of specific quantities (i.e., the limitations of the measurement system). For example, "parallel" includes absolute parallel and approximate parallel, where the acceptable deviation range of approximate parallel can be, for example, within 5° deviation; "perpendicular" includes absolute perpendicular and approximate perpendicular, where the acceptable deviation range of approximate perpendicular can also be, for example, within 5° deviation. "Equal" includes absolute equality and approximate equality, where the acceptable deviation range of approximate equality can be, for example, that the difference between the two equal ones is less than or equal to 5% of either one. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific situations.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs; the terms used herein are for the purpose of describing specific embodiments only and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above drawings are intended to cover non-exclusive inclusion.

[0028] In the description of the embodiments of this application, technical terms such as "first" and "second" are only used to distinguish different objects and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity, specific order, or primary-secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "a plurality" is more than two, unless otherwise specifically defined.

[0029] Reference to "embodiment" herein means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of this application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0030] In the description of the embodiments of this application, the term "and / or" is merely a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this text generally represents an "or" relationship between the associated objects before and after.

[0031] In the description of the embodiments of this application, the term "a plurality" refers to more than two (including two).

[0032] In the related art, it is pointed out that with the continuous development and complexity of server hardware, the requirements for the test platform are also constantly increasing. Due to the fixed structure and single function of the traditional test platform, it has been difficult to meet the current diverse and high-efficiency test requirements. Especially during the test process, the inability to flexibly adjust the angle and height of the server not only affects the test efficiency but also may increase the work intensity of the test personnel, reducing the accuracy and convenience of the test work.

[0033] Based on the above considerations, in order to meet the current diverse and high-efficiency test requirements, the applicant has designed a test device for server hardware through in-depth research. The following refers to Figures 1-4 Describe the test device for server hardware according to the embodiments of this application.

[0034] AsFigures 1-4 As shown Figure 1 A test device for server hardware provided by an embodiment of the present application; Figure 2 is Figure 1 A cross-sectional schematic view of the test device for server hardware shown in Figure 3 is Figure 2 A partial enlarged view of part a shown in Figure 4 is Figure 1 A structural schematic view of the clamping assembly shown in

[0035] The test device 100 for server hardware according to an embodiment of the present application includes: a support plate 1, a test bench 2, and a clamping assembly 3.

[0036] Specifically, the test bench 2 is rotatably arranged on the support plate 1, the clamping assembly 3 is movably arranged on the test bench 2, the clamping assembly 3 includes: a fixing member 31 and a movable member, the movable member is connected to the fixing member 31, and the movable member is movable relative to the fixing member 31 in the circumferential direction of the test bench 2. There are multiple clamping assemblies 3, and the multiple clamping assemblies 3 are arranged at intervals in the circumferential direction of the test bench 2. Each clamping assembly 3 is movable along the radial direction of the test bench 2. The movable member includes a first movable block 32 and a second movable block 33. The first movable block 32 is slidably connected to the fixing member 31 relatively in the circumferential direction of the test bench 2, and the second movable block 33 is slidably connected to the first movable block 32 relatively in the circumferential direction of the test bench 2. Thus, through the rotatable test bench 2 and the adjustable clamping assembly 3, testers can quickly and easily adjust the position and angle of the hardware to be tested, meet different test requirements, reduce the time required for repositioning or installing the hardware, improve the overall test efficiency, can adapt to various types and sizes of server hardware, reduce the need to replace the test device 100 for server hardware, and further improve the work efficiency; moreover, by setting the fixing member 31, the first movable block 32, and the second movable block 33, the adjustability of the clamping assembly 3 in the radial direction and the circumferential direction is realized, which can adapt to server hardware of various sizes and shapes, improve the versatility and practicality of the test device 100 for server hardware, reduce the time for reconfiguring the test area, and enhance the overall test efficiency.

[0037] It can be understood that the support plate 1 is the foundation of the test device 100 for server hardware. The support plate 1 provides a stable installation position for the test bench 2. The test bench 2 is arranged on the support plate 1 and is rotatable relative to the support plate 1. The clamping assembly 3 is used to fix the server hardware to be tested to ensure that the server hardware remains stable during the test. Each clamping assembly 3 includes a fixing member 31 and a movable member. The movable member is movably connected to the fixing member 31 and is movable relative to the fixing member 31 in the circumferential direction of the test bench 2. In this way, by adjusting the position of the movable member, server hardware of different sizes and shapes can be accommodated. Moreover, in order to stably clamp the server hardware, multiple clamping assemblies 3 are provided, and the multiple clamping assemblies 3 are evenly spaced in the circumferential direction of the test bench 2, enhancing the stability and reliability of the clamping.

[0038] For example, referring to Figure 1 As shown, the test bench 2 is arranged on the upper side of the support plate 1. The test bench 2 is connected to the support plate 1 and is formed as a circle. The test bench 2 is rotatable relative to the support plate 1 in the circumferential direction of the test bench 2. The clamping assembly 3 includes four. The four clamping assemblies 3 are evenly spaced in the circumferential direction of the test bench 2. The four clamping assemblies 3 enclose a test area, and the server hardware is placed in the test area. The size and shape of the test area are defined by the four clamping assemblies 3. Specifically, the distance between the four clamping assemblies 3 defines the size of the test area, and the relative position between the fixing member 31 and the movable member of each clamping assembly 3 defines the shape of the test area.

[0039] As Figure 1 and Figure 4 shown, the clamping assembly 3 includes four. The four clamping assemblies 3 each include a fixing member 31, a first movable block 32, and two second movable blocks 33. The first movable block 32 is slidably connected to the fixing member 31 and is slidable relative to the fixing member 31 in the circumferential direction of the test bench 2 (such as the A direction shown in Figure 1 ). The two second movable blocks 33 are arranged adjacent to each other in the length direction of the first movable block 32. Each second movable block 33 is slidably connected to the first movable block 32 and is slidable relative to the first movable block 32 in the circumferential direction. In this way, the clamping assembly 3 can not only be adjusted according to the size of the server hardware but also according to the shape of the server hardware. When clamping hardware with an irregular shape, the position of the second movable block 33 can be adjusted to ensure the best fixing effect.

[0040] The test device 100 for server hardware according to an embodiment of the present application, by providing a rotatable test bench 2 and an adjustable clamping assembly 3, enables testers to quickly and easily adjust the position and angle of the hardware under test, meeting different test requirements, reducing the time required for repositioning or installing the hardware, improving the overall test efficiency, being able to accommodate server hardware of various types and sizes, reducing the need to replace the test device 100 for server hardware, and further improving work efficiency; by providing a fixing member 31, a first movable block 32 and a second movable block 33, the adjustability of the clamping assembly 3 in the radial direction and the circumferential direction is achieved, enabling it to accommodate server hardware of various sizes and shapes, improving the versatility and practicality of the test device 100 for server hardware, reducing the time for reconfiguring the test area, and enhancing the overall test efficiency.

[0041] Furthermore, a first mating portion 311 is formed on the fixing member 31, a second mating portion 321 is formed on the first movable block 32, the first movable block 32 and the fixing member 31 are slidably mated through the first mating portion 311 and the second mating portion 321, a third mating portion 322 is formed on the first movable block 32, a fourth mating portion 331 is formed on the second movable block 33, and the second movable block 33 and the first movable block 32 are slidably mated through the third mating portion 322 and the fourth mating portion 331. Thus, the sliding adjustment between the first movable block 32 and the fixing member 31 is achieved through the first mating portion 311 and the second mating portion 321, and the first mating portion 311 and the second mating portion 321 also play a guiding role, ensuring that the second movable block 33 and the first movable block 32 are slidably adjusted relative to the fixing member 31 through the third mating portion 322 and the fourth mating portion 331, solving the problem of poor flexibility when clamping hardware on a traditional test platform and also enhancing the stability during the test process.

[0042] It can be understood that, such as Figure 1 and Figure 4As shown in the figure, a first mating portion 311 is formed on the fixing member 31. The first mating portion 311 is formed as a first sliding groove, and the first sliding groove extends along the A direction. A second mating portion 321 is formed on the first movable block 32. The second mating portion 321 is formed as a first sliding block, and the first sliding block extends along the A direction. The first sliding block is located in the first sliding groove, and the first sliding block is slidable relative to the first sliding groove. Two first sliding grooves are formed on each fixing member 31, and the two first sliding grooves are arranged at intervals in the up and down direction. Two first sliding blocks are formed on each first movable block 32, and the two first sliding blocks are arranged at intervals in the up and down direction. The two first sliding grooves and the two first sliding blocks correspond to each other one by one. A third mating portion 322 is formed on the first movable block 32. The third mating portion 322 is formed as a second sliding groove, and the second sliding groove extends along the A direction. A fourth mating portion 331 is formed on the second movable block 33. The fourth mating portion 331 is formed as a second sliding block, and the second sliding block extends along the A direction. The second sliding block is located in the second sliding groove, and the second sliding block is slidable relative to the second sliding groove. Four second sliding grooves are formed on each first movable block 32. The four second sliding grooves are divided into two groups, and the two second sliding grooves in each group are arranged at intervals in the up and down direction. Two second sliding blocks are formed on each second movable block 33, and the two second sliding blocks are arranged at intervals in the up and down direction. The two second sliding blocks of each second movable block 33 cooperate with the corresponding two second sliding grooves.

[0043] Further, as Figure 4 shown in the figure, an anti-slip portion is formed on the surface of the second movable block 33 facing the test area. The anti-slip portion is formed as an anti-slip groove 332, and the anti-slip groove 332 extends in the up and down direction. The anti-slip groove 332 includes a plurality of them, and the plurality of anti-slip grooves 332 are arranged in the radial direction.

[0044] In other embodiments of the present application, the first mating portion 311 and the second mating portion 321 may also be formed in a form of cooperation between a track and a ball or a form of cooperation between a roller and a guide groove. The third mating portion 322 and the fourth mating portion 331 may also be formed in a form of cooperation between a track and a ball or a form of cooperation between a roller and a guide groove. The cooperation form of the first mating portion 311 and the second mating portion 321 includes but is not limited to this. The cooperation form of the third mating portion 322 and the fourth mating portion 331 includes but is not limited to this.

[0045] In any embodiment of the present application, the test device 100 for server hardware further includes: an adjusting mechanism disposed between the support plate 1 and the test bench 2. The adjusting mechanism includes: a first transmission mechanism 4, a second transmission mechanism 5, an electromagnetic clutch 7, and a driving mechanism 6. The driving mechanism 6 is switchably connected to the first transmission mechanism 4 and the second transmission mechanism 5 through the electromagnetic clutch 7. Thus, by setting the electromagnetic clutch 7, the driving mechanism 6 can quickly and stably switch between connecting the first transmission mechanism 4 and connecting the second transmission mechanism 5, and the function can be expanded without adding an additional power source. This not only saves space but also reduces the cost and the structural complexity of the test device 100 for server hardware. The tester can quickly and easily adjust the position and angle of the hardware to be tested to meet different test requirements.

[0046] It can be understood that, as shown in Figure 2 , the adjusting mechanism is located between the support plate 1 and the test bench 2. The first transmission mechanism 4, the second transmission mechanism 5, the electromagnetic clutch 7, and the driving mechanism 6 are all located between the support plate 1 and the test bench 2. When the electromagnetic clutch 7 is energized, the driving mechanism 6 is connected to the first transmission mechanism 4. The driving mechanism 6 is connected to the first transmission mechanism 4 through the electromagnetic clutch 7 to transmit power to the first transmission mechanism 4. When the electromagnetic clutch 7 is de-energized, the driving mechanism 6 is connected to the second transmission mechanism 5. The driving mechanism 6 is connected to the second transmission mechanism 5 to transmit power to the second transmission mechanism 5.

[0047] Furthermore, the electromagnetic clutch 7 has a switchable engaged state and disengaged state. When the electromagnetic clutch 7 is in the engaged state, the driving mechanism 6 is connected to at least part of the clamping components 3 of the plurality of clamping components 3 through the first transmission mechanism 4 for driving the clamping components 3 to move in the radial direction of the test bench 2. When the electromagnetic clutch 7 is in the disengaged state, the driving mechanism 6 is connected to the test bench 2 through the second transmission mechanism 5 for driving the test bench 2 to rotate. Thus, a single driving mechanism 6 can perform multiple functions, that is, it can achieve precise movement in the radial direction through the first transmission mechanism 4 and also achieve the rotation of the test bench 2.

[0048] It can be understood that, as shown in Figure 2 and Figure 3As shown, the electromagnetic clutch 7 realizes the switching between the engaged state and the disengaged state by energizing and de-energizing. When the electromagnetic clutch 7 is in the engaged state, the driving mechanism 6 is connected to the four clamping assemblies 3 through the first transmission mechanism 4, and the power of the driving mechanism 6 is transmitted to the clamping assemblies 3, enabling the clamping assemblies 3 to move in the radial direction of the test bench 2 for adjusting the positions of the clamping assemblies 3 to accurately clamp the hardware under test. When the electromagnetic clutch 7 is in the disengaged state, the driving mechanism 6 is connected to the test bench 2 through the second transmission mechanism 5, and the power of the driving mechanism 6 is transmitted to the test bench 2, causing the test bench 2 to rotate about the axis for adjusting the angle of the hardware under test.

[0049] In any embodiment of the present application, the first transmission mechanism 4 includes: a first gear set, a transmission rod 43, a lead screw 44, and a fitting 45. The first gear set includes a first bevel gear 41 and a second bevel gear 42. The first bevel gear 41 meshes with the second bevel gear 42. The first bevel gear 41 is connected to the transmission rod 43. The transmission rod 43 is connected to the drive shaft 61 of the driving mechanism 6 through the electromagnetic clutch 7. The lead screw 44 extends in the radial direction of the test bench 2 and is rotatable relative to the test bench 2. The second bevel gear 42 is connected to the lead screw 44. The fitting 45 is connected to the fixing member 31. The fitting 45 is sleeved on the lead screw 44 and is threadedly connected to the lead screw 44. Thus, by providing the lead screw 44, the rotational motion is converted into a linear motion for accurately controlling the position of the fitting 45. The first bevel gear 41 and the second bevel gear 42 mesh with each other for transmitting power and changing the transmission direction. The overall design of the first transmission mechanism 4 is simple and the structure is compact, reducing the failure rate of the test device 100 for server hardware.

[0050] It can be understood that, referring to Figure 2 As shown, the first bevel gear 41 is connected to the transmission rod 43. The transmission rod 43 extends in the vertical direction. When the electromagnetic clutch 7 is in the engaged state, the transmission rod 43 is connected to the drive shaft 61 of the driving mechanism 6. The lead screw 44 extends in the horizontal direction. The second bevel gear 42 is connected to the lead screw 44. The fitting 45 is sleeved on the lead screw 44. The fitting 45 is connected to the fixing member 31. In this way, when the electromagnetic clutch 7 is in the engaged state, the power provided by the driving mechanism 6 is transmitted from the transmission rod 43 to the first bevel gear 41. The first bevel gear 41 transmits the power to the second bevel gear 42. The second bevel gear 42 transmits the power to the lead screw 44. The lead screw 44 rotates about its own axis, so that the fitting 45 moves along the axial direction of the lead screw 44, driving the clamping assembly 3 to move in the radial direction of the test bench 2.

[0051] Further, the first bevel gear 41 includes one, and the second bevel gear 42 includes four. One first bevel gear 41 meshes with four second bevel gears 42 simultaneously. In this way, the synchronous control of the clamping assembly 3 is achieved, ensuring the motion synchronism of the four clamping assemblies 3, and improving the clamping stability and reliability of the clamping assembly 3.

[0052] Referring Figure 1 and Figure 2 As shown, the clamping assembly 3 includes four, and the lead screw 44 includes four. The lead screws 44 are arranged in one-to-one correspondence with the clamping assemblies 3. A second bevel gear 42 is connected to each lead screw 44. In this way, each lead screw 44 correspondingly transmits power to one clamping assembly 3, which can ensure the accuracy of the operation, avoid mutual interference between multiple clamping assemblies 3, reduce the failure rate, and facilitate maintenance.

[0053] In any embodiment of the present application, the test bench 2 is formed with a meshing portion 23. The second transmission mechanism 5 includes: a second gear set and a telescopic rod 53. The second gear set includes a first gear 51 and a second gear 52. The second gear 52 meshes with both the first gear 51 and the meshing portion 23. One end of the telescopic rod 53 is connected to the support plate 1, and the other end of the telescopic rod 53 is connected to the second gear 52 to drive the second gear 52 to move in the up and down direction. Thus, by setting the telescopic rod 53, the movement of the second gear 52 in the up and down direction can be realized. When the test bench 2 needs to be rotated, the electromagnetic clutch 7 is powered off, the driving mechanism 6 is disconnected from the first transmission mechanism 4, and the telescopic rod 53 extends to drive the second gear 52 to move towards the plane where the first gear 51 is located, so that the first gear 51 meshes with the second gear 52. In this way, the driving mechanism 6 can always be connected to only one of the first transmission mechanism 4 and the second transmission mechanism 5, avoiding the situation where the driving mechanism 6 is simultaneously connected to the first transmission mechanism 4 and the second transmission mechanism 5, thereby avoiding accidents.

[0054] It can be understood that, referring Figure 2 As shown, the meshing portion 23 is formed on the test bench 2. The first gear 51 and the test bench 2 are coaxially arranged. The second gear 52 is located between the first gear 51 and the test bench 2 and meshes with both the first gear 51 and the meshing portion 23. The telescopic rod 53 extends in the up and down direction. The lower end of the telescopic rod 53 is fixedly connected to the support plate 1, and the upper end of the telescopic rod 53 is connected to the second gear 52. The telescopic rod 53 drives the second gear 52 to move in the up and down direction, so that the second gear 52 can mesh with the first gear 51 and the meshing portion 23, or the second gear 52 can be disengaged from between the first gear 51 and the meshing portion 23. A guiding groove 21 is formed on the test bench 2. The guiding groove 21 extends along the radial direction of the test bench 2. The fitting 45 passes through the guiding groove 21 and is connected to the fixing member 31.

[0055] In any embodiment of the present application, an installation cavity 12 is defined between the test bench 2 and the support plate 1. The driving mechanism 6 and the second transmission mechanism 5 are arranged in the installation cavity 12. The meshing portion 23 is formed on the peripheral wall of the installation cavity 12. One of the test bench 2 and the support plate 1 is provided with a first sliding portion 22, and the other of the test bench 2 and the support plate 1 is provided with a second sliding portion 11. The test bench 2 and the support plate 1 cooperate and slide through the first sliding portion 22 and the second sliding portion 11. Thus, the installation cavity 12 is defined by the test bench 2 and the support plate 1, making the overall structure of the test device 100 for server hardware more compact, improving the space utilization rate. The test bench and the support plate 1 cooperate and slide through the first sliding portion 22 and the second sliding portion 11 to achieve stable and accurate guiding, ensuring the smoothness of the test bench 2 during rotation.

[0056] It can be understood that, with reference to Figure 2 As shown, the test bench 2 is formed with a first groove recessed upward, and the support plate 1 is formed with a second groove recessed downward. The first groove and the second groove cooperate to form the installation cavity 12. The driving mechanism 6, the first transmission mechanism 4, and the second transmission mechanism 5 are all arranged in the installation cavity 12. The meshing portion 23 is formed on the peripheral wall of the first groove. The test bench 2 is provided with a first sliding portion 22, and the first sliding portion 22 is formed as a sliding block. The support plate 1 is formed with a second sliding portion 11, and the second sliding portion 11 is formed as a sliding groove. The sliding block is arranged in the sliding groove and can slide in the sliding groove. The sliding groove extends circumferentially along the test bench 2 to form a ring.

[0057] In any embodiment of the present application, the test device 100 for server hardware further includes: a base 8, a lifting mechanism 9, and a blower 10. The base 8 is arranged below the support plate 1. The lifting mechanism 9 is arranged between the base 8 and the support plate 1 to move the support plate 1 in the up and down direction. The blower 10 is arranged on the support plate 1, and the blower 10 is arranged at an interval from the test bench 2. With reference to Figure 1 As shown, the base 8 is arranged below the support plate 1, providing a stable support for the test device 100 for server hardware. The lifting mechanism 9 is located between the base 8 and the support plate 1 and is used to drive the support plate 1 to move in the up and down direction, realizing the height adjustment function of the test bench 2. The blower 10 is arranged on the support plate 1, and the blower 10 is used to maintain the temperature stability of the test environment and prevent overheating from affecting the test results.

[0058] Next, the test device 100 for server hardware according to a specific embodiment of the present application will be described with reference to Figures 1-4 As shown, the test device 100 for server hardware includes: a support plate 1, a test bench 2, a clamping assembly 3, a base 8, a lifting mechanism 9, and a blower 10.

[0059] With reference to Figures 1-4 As shown, the test device 100 for server hardware includes: a support plate 1, a test bench 2, a clamping assembly 3, a base 8, a lifting mechanism 9, and a blower 10.

[0060] Specifically, the test bench 2 is disposed on the upper side of the support plate 1. The test bench 2 is connected to the support plate 1. The test bench 2 is formed in a circular shape. The test bench 2 is rotatable relative to the support plate 1 in the circumferential direction of the test bench 2. There are four clamping assemblies 3, and the four clamping assemblies 3 are evenly spaced in the circumferential direction of the test bench 2. The four clamping assemblies 3 enclose a test area, and the server hardware is placed in the test area. The size and shape of the test area are defined by the four clamping assemblies 3. Specifically, the distance between the four clamping assemblies 3 defines the size of the test area, and the relative position of each clamping assembly 3 includes a fixing member 31 and a movable member, and the relative position of the movable member and the fixing member 31 defines the shape of the test area.

[0061] There are four clamping assemblies 3. Each of the four clamping assemblies 3 includes a fixing member 31, a first movable block 32 and two second movable blocks 33. The first movable block 32 is slidably connected to the fixing member 31. The first movable block 32 is slidable relative to the fixing member 31 in the circumferential direction of the test bench 2. The two second movable blocks 33 are arranged adjacent to each other in the length direction of the first movable block 32. Each second movable block 33 is slidably connected to the first movable block 32. Each second movable block 33 is slidable relative to the first movable block 32 in the circumferential direction. In this way, the clamping assembly 3 can not only be adjusted according to the size of the server hardware, but also be adjusted according to the shape of the server hardware. When clamping hardware with an irregular shape, the position of the second movable block 33 can be adjusted to ensure the best fixing effect.

[0062] A first mating portion 311 is formed on the fixing member 31. The first mating portion 311 is formed as a first chute, and the first chute extends along the A direction. A second mating portion 321 is formed on the first movable block 32. The second mating portion 321 is formed as a first slider, and the first slider extends along the A direction. The first slider is located in the first chute, and the first slider is slidable relative to the first chute. Two first chutes are formed on each fixing member 31, and the two first chutes are spaced apart in the up-down direction. Two first sliders are formed on each first movable block 32, and the two first sliders are spaced apart in the up-down direction. The two first chutes and the two first sliders correspond to each other one by one; a third mating portion 322 is formed on the first movable block 32. The third mating portion 322 is formed as a second chute, and the second chute extends along the A direction. A fourth mating portion 331 is formed on the second movable block 33. The fourth mating portion 331 is formed as a second slider, and the second slider extends along the A direction. The second slider is located in the second chute, and the second slider is slidable relative to the second chute. Four second chutes are formed on each first movable block 32. The four second chutes are divided into two groups, and the two second chutes in each group are spaced apart in the up-down direction. Two second sliders are formed on each second movable block 33, and the two second sliders are spaced apart in the up-down direction. The two second sliders of each second movable block 33 cooperate with the corresponding two second chutes.

[0063] On one side surface of the second movable block 33 facing the test area, an anti-slip portion is formed. The anti-slip portion is formed as an anti-slip groove 332. The anti-slip groove 332 extends in the up and down direction. There are a plurality of anti-slip grooves 332, and the plurality of anti-slip grooves 332 are arranged in the radial direction. The adjusting mechanism is located between the support plate 1 and the test bench 2. The first transmission mechanism 4, the second transmission mechanism 5, the electromagnetic clutch 7 and the driving mechanism 6 are all located between the support plate 1 and the test bench 2. When the electromagnetic clutch 7 is energized, the driving mechanism 6 is connected to the first transmission mechanism 4. The driving mechanism 6 is connected to the first transmission mechanism 4 through the electromagnetic clutch 7 and transmits power to the first transmission mechanism 4. When the electromagnetic clutch 7 is de-energized, the driving mechanism 6 is connected to the second transmission mechanism 5 and transmits power to the second transmission mechanism 5.

[0064] The electromagnetic clutch 7 realizes the switching between the engaged state and the disengaged state by means of energization and de-energization. When the electromagnetic clutch 7 is in the engaged state, the driving mechanism 6 is connected to the four clamping assemblies 3 through the first transmission mechanism 4. The power of the driving mechanism 6 is transmitted to the clamping assemblies 3, so that the clamping assemblies 3 can move in the radial direction of the test bench 2 to adjust the positions of the clamping assemblies 3 for accurately clamping the hardware to be tested. When the electromagnetic clutch 7 is in the disengaged state, the driving mechanism 6 is connected to the test bench 2 through the second transmission mechanism 5. The power of the driving mechanism 6 is transmitted to the test bench 2, so that the test bench 2 rotates around the axis to adjust the angle of the hardware to be tested.

[0065] The first bevel gear 41 is connected to the transmission rod 43. The transmission rod 43 extends in the up and down direction. When the electromagnetic clutch 7 is in the engaged state, the transmission rod 43 is connected to the drive shaft 61 of the driving mechanism 6. The lead screw 44 extends in the horizontal direction. The second bevel gear 42 is connected to the lead screw 44. A fitting 45 is sleeved on the lead screw 44, and the fitting 45 is connected to the fixing member 31. In this way, when the electromagnetic clutch 7 is in the engaged state, the power provided by the driving mechanism 6 is transmitted from the transmission rod 43 to the first bevel gear 41. The first bevel gear 41 transmits the power to the second bevel gear 42. The second bevel gear 42 transmits the power to the lead screw 44. The lead screw 44 rotates around its own axis, so that the fitting 45 moves along the axial direction of the lead screw 44 to drive the clamping assembly 3 to move in the radial direction of the test bench 2.

[0066] There are four clamping assemblies 3 and four lead screws 44. The lead screws 44 are arranged in one-to-one correspondence with the clamping assemblies 3. A second bevel gear 42 is connected to each lead screw 44. In this way, each lead screw 44 correspondingly transmits power to one clamping assembly 3, which can ensure the accuracy of operation, avoid mutual interference between multiple clamping assemblies 3, reduce the failure rate, and facilitate maintenance. There is one first bevel gear 41 and four second bevel gears 42. One first bevel gear 41 meshes with the four second bevel gears 42 at the same time. In this way, synchronous control of the clamping assemblies 3 is achieved, the motion synchronization of the four clamping assemblies 3 is ensured, and the clamping stability and reliability of the clamping assemblies 3 are improved.

[0067] The meshing portion 23 is formed on the test bench 2. The first gear 51 and the test bench 2 are coaxially arranged. The second gear 52 is located between the first gear 51 and the test bench 2 and meshes with both the first gear 51 and the meshing portion 23. The telescopic rod 53 extends in the up and down direction. The lower end of the telescopic rod 53 is fixedly connected to the support plate 1, and the upper end of the telescopic rod 53 is connected to the second gear 52. The telescopic rod 53 drives the second gear 52 to move in the up and down direction, so that the second gear 52 can mesh with the first gear 51 and the meshing portion 23, or the second gear 52 can be disengaged from between the first gear 51 and the meshing portion 23. A guiding groove 21 is formed on the test bench 2, and the guiding groove 21 extends along the radial direction of the test bench 2. The fitting 45 passes through the guiding groove 21 and is connected to the fixing member 31.

[0068] The test bench 2 forms a first groove that is recessed upward, and the support plate 1 forms a second groove that is recessed downward. The first groove and the second groove cooperate to form an installation cavity 12. The driving mechanism 6, the first transmission mechanism 4, and the second transmission mechanism 5 are all arranged in the installation cavity 12. The meshing portion 23 is formed on the peripheral wall of the first groove. A first sliding portion 22 is provided on the test bench 2, and the first sliding portion 22 is formed as a sliding block. A second sliding portion 11 is formed on the support plate 1, and the second sliding portion 11 is formed as a sliding groove. The sliding block is arranged in the sliding groove and can slide in the sliding groove. The sliding groove extends along the circumferential direction of the test bench 2 to form a ring.

[0069] The base 8 is arranged below the support plate 1, providing a stable support for the test device 100 of the server hardware. The lifting mechanism 9 is located between the base 8 and the support plate 1 and is used to drive the support plate 1 to move in the up and down direction, realizing the height adjustment function of the test bench 2. The fan 10 is arranged on the support plate 1, and the fan 10 is used to maintain the temperature stability of the test environment and prevent overheating from affecting the test results.

[0070] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and purposes of the present application. The scope of the present application is defined by the claims and their equivalents.

Claims

1. A test device for server hardware, characterized in that Comprising: Support plate (1); Test bench (2), which is rotatably arranged on the support plate (1); A plurality of clamping assemblies (3), which are movably arranged on the test bench (2). The clamping assembly (3) includes: a fixing member (31) and a movable member. The movable member is connected to the fixing member (31), and the movable member is movable relative to the fixing member (31) in the circumferential direction of the test bench (2). The plurality of clamping assemblies (3) are spaced apart in the circumferential direction of the test bench (2). Each clamping assembly (3) is movable along the radial direction of the test bench (2). The movable member includes a first movable block (32) and a second movable block (33). The first movable block (32) is slidably connected to the fixing member (31) relatively in the circumferential direction of the test bench (2), and the second movable block (33) is slidably connected to the first movable block (32) relatively in the circumferential direction of the test bench (2).

2. The test device for server hardware according to claim 1, characterized in that, A first mating portion (311) is formed on the fixing member (31), and a second mating portion (321) is formed on the first movable block (32). The first movable block (32) and the fixing member (31) are slidably mated through the first mating portion (311) and the second mating portion (321).

3. The test device for server hardware according to claim 1, characterized in that, A third mating portion (322) is formed on the first movable block (32), and a fourth mating portion (331) is formed on the second movable block (33). The second movable block (33) and the first movable block (32) are slidably mated through the third mating portion (322) and the fourth mating portion (331).

4. The test device for server hardware according to claim 2, wherein Also comprising: An adjusting mechanism, which is arranged between the support plate (1) and the test bench (2). The adjusting mechanism includes: a first transmission mechanism (4), a second transmission mechanism (5), an electromagnetic clutch (7), and a driving mechanism (6). The driving mechanism (6) is switchably connected to the first transmission mechanism (4) and the second transmission mechanism (5) through the electromagnetic clutch (7).

5. The test device for server hardware according to claim 4, wherein The electromagnetic clutch (7) has a switchable engaged state and disengaged state. When the electromagnetic clutch (7) is in the engaged state, the driving mechanism (6) is connected to at least part of the plurality of clamping assemblies (3) through the first transmission mechanism (4) for driving the clamping assembly (3) to move in the radial direction of the test bench (2). When the electromagnetic clutch (7) is in the disengaged state, the driving mechanism (6) is connected to the test bench (2) through the second transmission mechanism (5) for driving the test bench (2) to rotate.

6. The test device for server hardware according to claim 5, wherein The first transmission mechanism (4) includes: A first gear set, which includes a first bevel gear (41) and a second bevel gear (42). The first bevel gear (41) meshes with the second bevel gear (42); The transmission rod (43), the first bevel gear (41) is connected to the transmission rod (43), and the transmission rod (43) is connected to the drive shaft (61) of the drive mechanism (6) through the electromagnetic clutch (7); The lead screw (44), the lead screw (44) extends along the radial direction of the test bench (2) and is rotatable relative to the test bench (2), and the second bevel gear (42) is connected to the lead screw (44); The fitting (45), the fitting (45) is connected to the fixing member (31), the fitting (45) is sleeved on the lead screw (44) and is threadedly connected to the lead screw (44).

7. The test device for server hardware according to claim 6, wherein The lead screw (44) and the clamping assembly (3) are arranged in one-to-one correspondence.

8. The test device for server hardware according to claim 5, wherein The test bench (2) is formed with an engaging portion (23), and the second transmission mechanism (5) includes: A second gear set, the second gear set includes a first gear (51) and a second gear (52), and the second gear (52) is engaged with both the first gear (51) and the engaging portion (23); The telescopic rod (53), one end of the telescopic rod (53) is connected to the support plate (1), and the other end of the telescopic rod (53) is connected to the second gear (52) to drive the second gear (52) to move in the vertical direction.

9. The test device for server hardware according to claim 8, characterized in that An installation cavity (12) is defined between the test bench (2) and the support plate (1), the drive mechanism (6) and the second transmission mechanism (5) are arranged in the installation cavity (12), and the engaging portion (23) is formed on the peripheral wall of the installation cavity (12), One of the test bench (2) and the support plate (1) is provided with a first sliding portion (22), and the other of the test bench (2) and the support plate (1) is provided with a second sliding portion (11), and the test bench (2) and the support plate (1) are slidably matched through the first sliding portion (22) and the second sliding portion (11).

10. The test device for server hardware according to any one of claims 1-9, characterized in that, It further includes: The base (8), the base (8) is arranged below the support plate (1); The lifting mechanism (9), the lifting mechanism (9) is arranged between the base (8) and the support plate (1) to move the support plate (1) in the vertical direction; The blower (10), the blower (10) is arranged on the support plate (1), and the blower (10) is arranged at an interval from the test bench (2).

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