Capacitance testing device

Abstract

The invention provides a capacitor testing device which can transfer a testing station which consumes short time from a box carrying conveying device to a feeding and discharging station, and therefore the scale of the box carrying conveying device and the scale of the corresponding testing station are reduced. The device comprises a feeding station, a discharging station, a box carrying and conveying device and a first testing station arranged along the box carrying and conveying device, the box carrying and conveying device is a linear rail or a rotating disc, the feeding station and the discharging station are arranged at the two ends of the box carrying and conveying device respectively, and the feeding station and / or the discharging station are / is provided with a rotating tower. The turret comprises a plurality of material taking mechanisms, a rotating mechanism and a lifting mechanism, the material taking mechanisms are uniformly arranged along the center of the turret and are driven by the rotating mechanism to rotate, the lifting mechanism is used for driving the material taking mechanisms to move up and down, the turret is provided with a second test station, the second test station comprises a test probe, and the test probe is located below the material taking mechanisms. When the material taking mechanism carrying the capacitor descends, the capacitor can be in contact with the test probe located under the capacitor.

Description

Technical Field

[0001] The present invention relates to the technical field of capacitance testing, and particularly to a capacitance testing device. Background Art

[0002] In the testing and screening production line of capacitors, especially in the production line of chip electrolytic capacitors (tantalum capacitors or aluminum electrolytic capacitors), it is necessary to conduct tests such as current surge tests and automatic tests of four parameters (capacitance, loss, ESR, leakage current) on finished capacitors (with shaped leads and single independent form) or capacitors still on the lead frame at low cost and high speed. The time lengths of the above test items sometimes vary greatly. For example, test items such as surge and capacitance testing can be completed in just a few tenths of a second, while items such as leakage current sometimes take up to several minutes.

[0003] Existing testing devices, such as the patent disclosed in the patent with the publication number CN217774870U, introduce a series of testing stations arranged on a carrier box conveying device (linear transport track) to test the capacitors in the carrier box. During testing, the probes are pressed down to contact the capacitor electrodes in the carrier box, thereby connecting the capacitor to the testing instrument or testing circuit. Additionally, there is also a method using a turntable as the carrier box conveying device. For example, in the patent application with the publication number CN115569871A, the testing stations are distributed around the turntable. Both of these two solutions set the testing stations on the same carrier box conveying device, which will result in a relatively large scale of the carrier box conveying device and the corresponding testing stations (long linear transport track length and large turntable diameter). Summary of the Invention

[0004] Aiming at the problem that setting all the testing stations on the same carrier box conveying device in the existing testing device will lead to a relatively large scale of the carrier box conveying device and the corresponding testing stations, the present invention provides a capacitance testing device, which can transfer the testing stations with short time consumption from the carrier box conveying device to the loading and unloading station, thereby reducing the scale of the carrier box conveying device and the corresponding testing stations.

[0005] Its technical solution is as follows: A capacitance testing device, which includes a loading station, an unloading station, a carrier box conveying device, and a first testing station arranged along the carrier box conveying device. The carrier box conveying device is a linear track or a turntable. The loading station and the unloading station are respectively arranged at both ends of the carrier box conveying device. A turret is installed at the loading station and / or the unloading station. The turret includes a material taking mechanism, a rotating mechanism, and a lifting mechanism. A plurality of the material taking mechanisms are evenly arranged along the center of the turret and are driven by the rotating mechanism to rotate. The lifting mechanism is used to drive the material taking mechanism to move up and down. It is characterized in that: A second testing station is provided at the turret. The second testing station includes testing probes. The testing probes are located below the material taking mechanism. When the material taking mechanism carrying the capacitance descends, the capacitance can contact the testing probes directly below it.

[0006] Further, the carrier box conveying device is a linear track or a turntable, and the first testing station includes a leakage current testing station.

[0007] Further, when the turret is installed at the loading station, the second testing station at the loading station includes one or more of a surge testing station, a capacitance testing station, a loss testing station, and an ESR testing station.

[0008] Further, when the turret is installed at the unloading station, the second testing station at the unloading station includes one or more of a capacitance testing station, a loss testing station, and an ESR testing station.

[0009] Even further, a screening station is also provided at the turret. The screening station includes a waste box located below the material taking mechanism.

[0010] Further, a carrier box loading mechanism is also provided between the turret and the carrier box conveying device. The carrier box loading mechanism includes a cross slide. The cross slide is used to drive the carrier box located below the material taking mechanism to move horizontally or vertically.

[0011] Further, a capacitance appearance inspection station is also provided at the turret.

[0012] Further, the unloading station is connected to a taping station.

[0013] Even further, when the capacitance electrodes at the unloading station face upward, a capacitance flipping mechanism is provided between the unloading station and the taping station.

[0014] Beneficial effects: By adopting the above method, the test station two with short time consumption can be moved from the cassette conveying device to the loading and unloading station. After the turret carries the capacitor through the material taking mechanism, under the action of the lifting mechanism, it can drive the capacitor to move downward, so that the electrodes of the capacitor contact the test probes and the capacitor is tested. After the test is completed, it continues to move and load the capacitor, so as to reduce the scale of the cassette conveying device and the corresponding test station. Description of the Drawings

[0015] Figure 1 It is a schematic structural diagram of the present invention; Figure 2 It is a schematic structural diagram of the turret; Figure 3 It is Figure 2 a top view schematic diagram of Figure 4 It is a schematic structural diagram of the test station two. Detailed Embodiments

[0016] Such as Figure 1 the capacitor testing device shown, which includes a loading station 1, an unloading station 2, a cassette conveying device 3 located between the loading station 1 and the unloading station 2, and a test station one 4 arranged along the cassette conveying device 3. The loading station 1 and / or the unloading station 2 is provided with a turret 5. Combining Figure 2 , Figure 3 , the turret 5 includes a material taking mechanism 51, a rotating mechanism 52 and a lifting mechanism 53. A plurality of material taking mechanisms 51 are uniformly arranged along the center of the turret and are driven by the rotating mechanism 52 to rotate. The lifting mechanism 53 is used to drive the material taking mechanism 51 to move up and down. A test station two is provided at the turret 5. Combining Figure 4 shown, the test station two includes test probes 6. The test probes 6 are located below the material taking mechanism 51. When the material taking mechanism 51 carrying the capacitor 7 descends, the capacitor 7 can contact the test probes 6 located directly below it.

[0017] Specifically, the above turret can be directly purchased from the market and is prior art. The material taking mechanism 51 can be a suction head, which is driven by a motor to rotate, and the lifting mechanism 53 can be a cylinder. The suction head is connected to the cylinder so as to drive the suction head to move up and down through the cylinder. Figure 1 , Figure 3 In

[0018] Referring to the patent solution cited in the background art, the carrier box conveying device 3 can be a linear track or a turntable. The first test station at least includes a time-consuming test item, that is, a leakage current test station (including charging). Of course, it can also include some short-time-consuming items according to needs.

[0019] When a turret is installed at the loading station, the second test station at the loading station can include one or more low-time-consuming stations among the surge test station, capacitance test station, loss test station, and ESR test station. When a turret is installed at the unloading station, the second test station at the unloading station is one or more low-time-consuming stations among the capacitance test station, loss test station, and ESR test station. Tests such as surge and capacitance are relatively short-time-consuming, generally a few tenths of a second, which is equivalent to the time spent on loading and unloading operations such as placing the capacitor in the carrier box or taking the capacitor from the loading tray, and will not affect the loading and unloading efficiency. At the same time, since the surge may cause the capacitor to explode, compared with performing the surge test in the carrier box, performing the surge test at the turret is more convenient for cleaning. A screening station is also provided at the turret 5. The screening station includes a waste bin 9 located below the picking mechanism 51 for removing unqualified capacitors after testing.

[0020] Regarding how to transfer the capacitor to or from the carrier box, a carrier box loading mechanism 10 is also provided between the turret 5 and the carrier box conveying device 3. The carrier box loading mechanism 10 includes a cross slide 11. The cross slide 11 is used to drive the carrier box 12 located below the picking mechanism 51 to move horizontally or vertically. After placing the capacitor into the empty capacitor placement slot directly below the picking mechanism 51, the position of the carrier box is moved by the cross slide 11 to move the next empty capacitor placement slot below the picking mechanism 51. After the carrier box is full, the carrier box can be placed on the carrier box conveying device 3 by a robotic arm or a carrier box transfer mechanism (for example, sucking up the carrier box by a carrier box suction cup).

[0021] A capacitor appearance inspection station can also be provided at the turret 5. The capacitor appearance inspection station specifically includes a bottom inspection station and four-side inspection stations, which can complete the inspection of the bottom surface and 4 side surfaces of the capacitor. There are multiple positions for inspecting the upper surface of the capacitor. One option is to set an upper surface inspection station on the turntable. The unloading station 2 is connected to the taping station 13. When the capacitor electrodes face upward at the unloading station 2, a capacitor flipping mechanism is provided between the unloading station 2 and the taping station 13 (because the capacitor electrodes need to face downward during taping). If a turret is not used for unloading, the capacitor flipping mechanism can refer to the flipping assembly described in the patent with the publication number CN218014270U. If a turret is used for unloading, a flipping device can be provided in front of the unloading turret device. After sucking up a capacitor from the carrier box, the capacitor is flipped 180 degrees and moved to below the picking mechanism 51 with the electrodes facing downward, and then sucked up by the turret suction head and finally placed into the taping carrier tape.

[0022] In addition, when the capacitors in the loading station are sourced from the capacitors with electrodes facing upward in the carrier after aging, the loading device for the bulk capacitors is omitted. A carrier prediction station can also be provided on the carrier conveying device 3 to detect capacitors that have short-circuited after aging. Such short-circuited capacitors can be identified through capacitance and loss tests, or by using a dedicated rapid short-circuit test method, enabling the surge station to avoid applying current surges to the short-circuited capacitors, thereby preventing capacitor explosion and combustion. If the first test station in the carrier conveying device 3 tests the capacitors with electrodes facing downward, the above-mentioned capacitor flipping mechanism needs to be provided at the loading station.

[0023] The above are only the preferred specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by those familiar with the technology within the technical scope disclosed by the present invention should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. A capacitance testing device, comprising a loading station, an unloading station, a cassette conveying device, and a first testing station arranged along the cassette conveying device, wherein the cassette conveying device is a linear track or a turntable, the loading station and the unloading station are respectively arranged at two ends of the cassette conveying device, a turret is installed at the loading station and / or the unloading station, the turret includes a material taking mechanism, a rotating mechanism, and a lifting mechanism, a plurality of the material taking mechanisms are uniformly arranged along the center of the turret and are driven by the rotating mechanism to rotate, and the lifting mechanism is used to drive the material taking mechanism to move up and down, and is characterized in that: A test station two is provided at the turret. The test station two includes test probes, and the test probes are located below the material taking mechanism. When the material taking mechanism carrying a capacitor descends, the capacitor can contact the test probes directly below it.

2. The capacitance testing device according to claim 1, wherein: The test station one includes a leakage current test station.

3. The capacitance testing device according to claim 1, wherein: When the turret is installed at the loading station, the test station two at the loading station includes one or more of a surge test station, a capacitance test station, a loss test station, and an ESR test station.

4. The capacitance testing device according to claim 1, wherein: When the turret is installed at the unloading station, the test station two at the unloading station includes one or more of a capacitance test station, a loss test station, and an ESR test station.

5. The capacitance testing device according to claim 3 or 4, characterized in that: A screening station is also provided at the turret. The screening station includes a waste box located below the material taking mechanism.

6. The capacitance testing device according to claim 1, wherein: A cassette loading mechanism is also provided between the turret and the cassette conveying device. The cassette loading mechanism includes a cross slide, and the cross slide is used to drive the cassette located below the material taking mechanism to move horizontally or vertically.

7. The capacitance testing device according to claim 1, characterized in that: A capacitor appearance inspection station is also provided at the turret.

8. The capacitance testing device according to claim 1, wherein: The unloading station is connected to the taping station.

9. The capacitance testing device according to claim 8, wherein: When the capacitor electrodes at the unloading station face upward, a capacitor flipping mechanism is provided between the unloading station and the taping station.

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