Test device and test method

Abstract

The present invention suppresses variation in voltage applied to a winding during a test. In a test device (1), when an instruction reception unit (3) receives a predetermined instruction, a voltage generation circuit (2) generates and outputs a voltage on the basis of a value (Et) obtained by correcting a voltage instruction value (Ee) corresponding to the predetermined instruction (A1) using a correction coefficient (C), and generates and outputs the voltage on the basis of a value (Et) obtained by correcting a voltage instruction value (Ee) corresponding to the predetermined instruction (A1) using a correction coefficient (C). The correction coefficient calculation unit (5) updates the correction coefficient (C) such that the deviation between the voltage measured by the voltage measurement unit (4) and the voltage command value (Ee) becomes small, and when the winding to be tested is measured, the voltage generation circuit (2) generates and outputs a voltage on the basis of a value obtained by correcting the voltage command value (Em) corresponding to the analysis using the correction coefficient (C), and simultaneously outputs the voltage on the basis of a value obtained by correcting the voltage command value (Em) corresponding to the analysis using the correction coefficient (C). An analysis result generation unit (6) generates an analysis result (83) on the basis of the voltage measured by the voltage measurement unit (4).

Description

Technical Field

[0001] The present invention relates to a test device and a test method, for example, a test device and a test method for measuring the winding characteristics of rotating machines such as motors and generators, components composed of coils such as transformers, and products. Background Art

[0002] Conventionally, as a test device for measuring the winding characteristics of rotating machines such as motors and generators, a pulse winding test device that measures the electrical characteristics of a winding based on voltage changes when a pulse voltage (impulse voltage) is applied to the winding of the test object is known (see Patent Document 1). (Prior Art Documents) (Patent Documents)

[0003] Patent Document 1: Japanese Patent No. 5405518 Gazette. Summary of the Invention (Technical Problems to be Solved by the Invention)

[0004] In the conventional pulse winding test device represented by Patent Document 1, a pulse voltage is generated by a voltage generation circuit provided inside the pulse winding test device and applied to the winding. At this time, there are many cases where a difference occurs between the pulse voltage generated by the voltage generation circuit and the voltage actually applied to the winding.

[0005] For example, when a user operates the pulse winding test device to set the pulse voltage to 1000V and a 1000V pulse voltage is output from the voltage generation circuit, the voltage applied to the test object winding is reduced to 950V - 980V with respect to the set voltage (1000V), and there are cases where there are deviations. This phenomenon is considered to be caused by voltage reduction due to parasitic capacitance, output impedance, transient response, and manufacturing deviations in the characteristics of the winding itself or the core of the winding. And, since a winding with a core has a magnetic hysteresis magnetic characteristic, the magnetization state of the core changes according to the history of the voltage or current applied to the winding. Therefore, in a winding with a core, the magnetization state of the core is also considered to be one of the causes of the applied voltage deviation. Among them, by measuring qualified products, the reduced part of the voltage applied to the winding of the test object is increased, thereby enabling correction of the voltage reduction, and the magnetization deviation of the core can be suppressed by a degaussing pulse described later.

[0006] However, it is difficult to suppress the deviation of the applied voltage caused by manufacturing deviations. Moreover, although the set value of the pulse voltage is constant, the voltage applied to the winding of the test object varies in the winding, resulting in non-constant actual measurement conditions. Therefore, from the perspective of quality management of the winding by the user, this is not preferable.

[0007] The present invention is proposed in view of the above problems, and its object is to suppress the deviation of the voltage applied to the winding when testing the winding. (Means for Solving Technical Problems)

[0008] The test device according to a representative embodiment of the present invention is characterized by having: a first external terminal connected to one terminal of the winding of the test object; a second external terminal connected to the other terminal of the winding of the test object; an instruction receiving unit for receiving an instruction; a correction coefficient calculation unit for calculating a correction coefficient; a voltage generation circuit for generating a voltage based on a voltage command value and the correction coefficient and outputting the voltage between the first external terminal and the second external terminal; a voltage measurement unit for measuring the voltage between the first external terminal and the second external terminal; and an analysis result generation unit for performing analysis related to the electrical characteristics of the winding of the test object based on the voltage measured by the voltage measurement unit and generating an analysis result. When the instruction receiving unit receives a specified instruction, the voltage generation circuit generates and outputs a voltage according to the value obtained by correcting the voltage command value corresponding to the specified instruction using the correction coefficient. At the same time, the correction coefficient calculation unit updates the correction coefficient in such a way that the deviation between the voltage measured by the voltage measurement unit and the voltage command value corresponding to the specified instruction becomes smaller. When performing the analysis, the voltage generation circuit generates and outputs a voltage according to the value obtained by correcting the voltage command value corresponding to the analysis using the correction coefficient. At the same time, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit. (Advantages of the Invention)

[0009] According to the test device of the present invention, it is possible to suppress the deviation of the voltage applied to the winding when testing the winding. Description of the Drawings

[0010] Figure 1 Shows the structure of the test device according to the embodiment. Figure 2 Shows an example of the structure of the voltage generation circuit. Figure 3 Is a timing chart when a demagnetization pulse and a measurement pulse are output from the voltage generation circuit. Figure 4It is a flowchart showing the processing flow of the test device in the degaussing mode. Figure 5 It is a flowchart showing the processing flow of the test device in the test mode. Detailed implementation mode

[0011] 1. Outline of the implementation mode First, a representative implementation mode of the invention disclosed in this application will be outlined. In addition, in the following description, as an example, the reference signs on the drawings corresponding to the components of the invention will be described in parentheses.

[0012] [1] The test device (1) according to the representative implementation mode of the present invention is characterized by having: a first external terminal (T1) to which one terminal of the winding (11) of the object to be tested is connected; a second external terminal (T2) to which the other terminal of the winding of the object to be tested is connected; an instruction receiving unit (3) for receiving an instruction; a correction coefficient calculation unit (5) for calculating a correction coefficient; a voltage generation circuit (2) for generating a voltage based on a voltage command value and the correction coefficient and outputting it between the first external terminal and the second external terminal; a voltage measurement unit (4) for measuring the voltage between the first external terminal and the second external terminal; and an analysis result generation unit (6) for performing an analysis related to the electrical characteristics of the winding of the object to be tested based on the voltage measured by the voltage measurement unit and generating an analysis result. When the instruction receiving unit receives a specified instruction (A1), the voltage generation circuit generates and outputs a voltage according to the value obtained by correcting the voltage command value corresponding to the specified instruction with the correction coefficient. At the same time, the correction coefficient calculation unit calculates the correction coefficient in such a way that the deviation between the voltage measured by the voltage measurement unit and the voltage command value corresponding to the specified instruction becomes smaller. When performing the analysis, the voltage generation circuit generates and outputs a voltage according to the value obtained by correcting the voltage command value corresponding to the analysis with the correction coefficient. At the same time, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit.

[0013] [2] According to the test device described in the above [1], when the instruction receiving unit receives the specified instruction, the voltage generation circuit may output pulses having a voltage (Et) a specified number of times, and the voltage corresponds to the value obtained by correcting the voltage command value corresponding to the specified instruction with the correction coefficient. At the same time, the correction coefficient calculation unit may update the correction coefficient according to the output of the pulses.

[0014] [3] The testing device according to [1] or [2] above, wherein the correction coefficient calculation unit can calculate the correction coefficient based on the ratio of the voltage (V) measured by the voltage measurement unit to the voltage command value (Ee) corresponding to the specified instruction.

[0015] [4] The testing device according to any one of [1] to [3] above, wherein the specified instruction can be an output instruction (A1) of a degaussing pulse, which is a voltage for suppressing the magnetization deviation of the iron core in a winding having an iron core. After calculating the correction coefficient, when the instruction receiving unit receives the execution instruction (A2) of the analysis, the voltage generation circuit generates and outputs a voltage corresponding to the value obtained by correcting the voltage command value (Em) corresponding to the analysis with the correction coefficient. At the same time, the analysis result generation unit can generate the analysis result based on the voltage measured by the voltage measurement unit.

[0016] [5] The testing device according to any one of [1] to [3] above, wherein the specified instruction can be the execution instruction (A2) of the analysis. After calculating the correction coefficient, the voltage generation circuit generates and outputs a voltage corresponding to the value obtained by correcting the voltage command value (Em) corresponding to the analysis with the correction coefficient. At the same time, the analysis result generation unit can generate the analysis result based on the voltage measured by the voltage measurement unit.

[0017] [6] The testing device according to any one of [1] to [4] above, wherein the voltage command value (Ee) corresponding to the specified instruction can be the same as the voltage command value (Em) corresponding to the measurement.

[0018] [7] The method according to a representative embodiment of the present invention is a test method using the following test device: The test device includes: a first external terminal connected to one terminal of a winding of a test object; a second external terminal connected to the other terminal of the winding of the test object; an instruction receiving unit that receives an instruction; a correction coefficient calculation unit that calculates a correction coefficient; a voltage generation circuit that generates a voltage based on a set voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal; a voltage measurement unit that measures the voltage between the first external terminal and the second external terminal; and an analysis result generation unit that performs analysis related to the electrical characteristics of the winding of the test object based on the voltage measured by the voltage measurement unit and generates an analysis result. The feature of this method is that it includes: a first step (S1, S2) in which the instruction receiving unit receives a specified instruction; a second step (S3 to S6) in which, after the first step, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value corresponding to the specified instruction using the correction coefficient; a third step (S7) in which the voltage measurement unit measures the voltage between the first external terminal and the second external terminal when the voltage generation circuit outputs a voltage in the second step; a fourth step (S8) in which the correction coefficient calculation unit calculates the correction coefficient in such a way that the deviation between the voltage measured in the third step and the voltage command value corresponding to the specified instruction becomes smaller; a fifth step (S13 to S16) in which, when performing the analysis, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value corresponding to the analysis using the correction coefficient; a sixth step (S17) in which the voltage measurement unit measures the voltage between the first external terminal and the second external terminal when the voltage generation circuit outputs a voltage in the fifth step; a seventh step (S19) in which the analysis result generation unit generates the analysis result based on the voltage measured in the sixth step.

[0019] 2. Specific Examples of Embodiments Hereinafter, specific examples of embodiments of the present invention will be described with reference to the drawings. In addition, in the following description, the same reference numerals are assigned to components common to each embodiment, and redundant description is omitted.

[0020] Figure 1 FIG. shows the structure of the test device 1 according to an embodiment of the present invention. Figure 1The shown test device 1 is a device for analyzing the electrical characteristics of windings (coils) that make up rotating machinery such as motors and generators or electrical equipment such as transformers. For example, the test device 1 is a pulse winding test device that calculates at least one value among parameters (i.e., equivalent inductance, equivalent capacitance, and equivalent resistance) related to the winding of the test object based on the voltage change when a voltage (pulse voltage) is applied to the winding of the test object.

[0021] In addition to the function of analyzing the electrical characteristics of the winding, the test device 1 also has a function of outputting a voltage (hereinafter also referred to as "demagnetizing pulse") for suppressing the magnetization deviation of the iron core in the winding with an iron core. And the test device 1 also has a function of suppressing the voltage deviation applied to the winding when testing the winding.

[0022] In the test device 1, as functional parts for realizing the above functions, for example, as Figure 1 shown, it has external terminals T1, T2, a voltage generation circuit 2, an instruction receiving part 3, a voltage measurement part 4, a correction coefficient calculation part 5, an analysis result generation part 6, an output part 7, and a storage part 8.

[0023] The external terminals T1, T2 are terminals for connecting to the winding 11 of the device under test (DUT). For example, one terminal of the winding 11 is connected to the external terminal T1, and the other terminal of the winding 11 is connected to the external terminal T2.

[0024] The voltage generation circuit 2 is a circuit for applying a specified voltage to the winding 11, which is the test object, connected between the external terminals T1, T2. Hereinafter, the pulse voltage output from the voltage generation circuit 2 when testing the winding 11 is called "measurement pulse", and the pulse voltage output from the voltage generation circuit 2 for suppressing the magnetization deviation of the iron core of the test object, i.e., the winding 11, is called "demagnetizing pulse".

[0025] The voltage generation circuit 2 generates a voltage based on the voltage command value E and the correction coefficient C described later and outputs it between the external terminal T1 and the external terminal T2. In addition, the voltage generation method of the voltage generation circuit 2 will be described in detail later.

[0026] The instruction receiving part 3 is a functional part for receiving instructions for the test device 1. The instruction receiving part 3 is realized, for example, through an input interface device and program processing using a CPU. The input interface device is an operation button or a touch panel, etc., for accepting the operation of the test device 1 by the user.

[0027] The instruction receiving unit 3 can, for example, have a communication circuit for communicating with an external device via wire or wirelessly. For example, the instruction receiving unit 3 can receive a signal transmitted from an information processing device (such as a PC or a tablet terminal, etc.) through the communication circuit, and give an execution instruction for other functional units to perform processing corresponding to the received signal. The information processing device is connected to the test device 1 via a wired or wireless network.

[0028] The instruction receiving unit 3 receives, for example, a first instruction A1 and a second instruction A2. The first instruction A1 and the second instruction A2 are input through an operation of the user on the above operation button or touch panel, etc., or through a signal received by the communication circuit, etc.

[0029] The first instruction A1 is, for example, an output instruction for a demagnetization pulse. The first instruction A1 corresponds to, for example, demagnetization pulse output condition information (hereinafter, also referred to as "demagnetization pulse information") 84. The demagnetization pulse information 84 includes, for example, a voltage command value Ee for specifying the magnitude (amplitude) of the demagnetization pulse, and a specified output number Ne for specifying the number of times the demagnetization pulse is output. In addition, the demagnetization pulse information 84 can be included in the first instruction A1.

[0030] The second instruction A2 is, for example, an instruction indicating to perform an analysis related to the electrical characteristics of the winding 11 of the test object. The second instruction A2 corresponds to measurement pulse related information (hereinafter, also referred to as "measurement pulse information") 87 as a test condition. The measurement pulse information 87 includes, for example, a voltage command value Em for specifying the magnitude (amplitude) of the measurement pulse, and a specified output number Nm for specifying the number of times the measurement pulse is output during the test. The measurement pulse information 87 can be included in the second instruction A2.

[0031] When the instruction receiving unit 3 receives the measurement pulse information 87 (voltage command value Em and specified output number Nm), it stores the measurement pulse information 87 in the storage unit 8. And when the instruction receiving unit 3 receives the demagnetization pulse information 84 (voltage command value Ee and specified output number Ne), it stores the demagnetization pulse information 84 in the storage unit 8.

[0032] In addition, the measurement pulse information 87 may not be included in the second instruction A2. For example, the measurement pulse information 87 only needs to be set in the test device 1 (storage unit 8) before the measurement pulse is output. It can be input by the user to the instruction receiving unit 3 before the second instruction A2 is input, or can be pre-stored in the storage unit 8. The same applies to the demagnetization pulse information 84. It only needs to be set in the test device 1 before the demagnetization pulse is output. It can be input by the user to the instruction receiving unit 3 before the first instruction A1 is input, or can be pre-stored in the storage unit 8.

[0033] In addition, for the instruction receiving unit 3, in addition to the above-mentioned demagnetization pulse information 84 and measurement pulse information 87, when information such as the sampling frequency described later is input as a measurement condition, these pieces of information can be stored in the storage unit 8.

[0034] The voltage measurement unit 4 is a functional unit that measures the voltage (inter-terminal voltage) between the external terminal T1 and the external terminal T2. The voltage measurement unit 4 stores the measured value (voltage measurement value) 81 of the voltage V in the storage unit 8.

[0035] Specifically, the voltage measurement unit 4 obtains the measured value of the voltage V by sampling the voltage V at a prescribed sampling period. The voltage measurement unit 4 is configured, for example, to include: a resistive voltage divider circuit that divides the voltage V between the external terminal T1 and the external terminal T2; and an A / D conversion circuit that converts the voltage divided by the resistive voltage divider circuit into a digital signal at a prescribed sampling period. The voltage measurement unit 4, for example, samples the voltage V at a prescribed sampling period, obtains time series data of the measured value (sampling data) of the voltage V, and stores it as the voltage measurement value 81 in the storage unit 8. In addition, the sampling period can be set, for example, by operating the instruction receiving unit 3 by the user, or can be set from an external device via the instruction receiving unit 3.

[0036] The correction coefficient calculation unit 5 is a functional unit that calculates the correction coefficient C. The correction coefficient C is a parameter for correcting the voltage command value so that the voltage output between the external terminals T1 and T2 becomes the desired value.

[0037] The correction coefficient C is stored in the storage unit 8 as correction coefficient information 82. For example, the initial value (correction coefficient C0) of the correction coefficient is pre-stored as the correction coefficient information 82. The correction coefficient calculation unit 5 updates the correction coefficient C in the correction coefficient information 82 each time the correction coefficient C is calculated. In addition, the correction coefficient C0 (initial value) can be set by operating the instruction receiving unit 3 by the user, or can be set by an external device via the instruction receiving unit 3. In the present embodiment, as an example, the correction coefficient C0 is pre-stored in the storage unit 8 and set to C0 = 1.000. A method for calculating (updating) the correction coefficient C using the correction coefficient calculation unit 5 will be described later.

[0038] The analysis result generation unit 6 is a functional unit that generates an analysis result related to the electrical characteristics of the winding 11 of the test object based on the voltage V measured by the voltage measurement unit 4. For the analysis of the electrical characteristics of the winding 11 of the test object, the analysis result generation unit 6 calculates, according to a well-known analysis method, at least one value of related parameters of the winding 11, such as equivalent inductance, equivalent capacitance, and equivalent resistance, based on the transient response characteristics of the voltage V between the external terminals T1 and T2 when a voltage (pulse voltage) is applied to the winding 11 connected between the external terminals T1 and T2.

[0039] The output unit 7 is a functional unit that outputs information for setting test conditions, analysis result information, etc. The output unit 7 is implemented, for example, by a display device such as a liquid crystal display. The display device can display information for setting test conditions, analysis result information, etc. on the screen. Also, the display device can display the transient response characteristics of the voltage measured by the voltage measurement unit 4 as a graph on the screen.

[0040] In addition to (or instead of) the above display device, the output unit 7 may include, for example, a communication circuit that connects to an external information processing device by wire or wirelessly and transmits data such as analysis results, and a circuit that writes data such as analysis results into a storage device (memory card, etc.) connected to the test device 1.

[0041] The storage unit 8 is a functional unit for storing the following information: a program that enables the test device 1 to function as a pulse winding test device, various parameters, analysis results of the winding 11 of the test object, etc. Stored in the storage unit 8 are, for example, the above-mentioned voltage measurement value 81, correction coefficient information 82, analysis result 83, degaussing pulse information 84, and measurement pulse information 87.

[0042] The above-mentioned correction coefficient calculation unit 5, analysis result generation unit 6, and storage unit 8 are implemented, for example, by a program processing device. Specifically, in a program processing device (such as a microcontroller) having a structure in which a processor such as a CPU, various storage devices such as RAM and ROM, a counter (timer), an A / D conversion circuit, a D / A conversion circuit, a clock generation circuit, and an input / output interface circuit are connected to each other via a bus or a dedicated line, the processor executes various arithmetic processes according to the program stored in the memory and controls the above-mentioned peripheral circuits based on the result of the arithmetic process, thereby implementing the correction coefficient calculation unit 5, the analysis result generation unit 6, and the storage unit 8.

[0043] In addition, a part of the functional units constituting the test device 1 can be implemented in an external information processing device (e.g., a portable terminal such as a PC or a tablet terminal, a server, etc.) that can communicate with the test device 1. For example, the voltage measurement value 81, etc. can be sent to the external information processing device through the output unit 7, so that the analysis result generation unit 6 can be implemented by this information processing device.

[0044] Here, the structure of the voltage generation circuit 2 will be described.

[0045] Figure 2 An example of the structure of the voltage generation circuit 2 is shown. As Figure 2 shown, the voltage generation circuit 2 has, for example, a switch SW, a pulse voltage application capacitor Cs, a current limiting resistor Rs, a rectifying element D, and an output control unit 20.

[0046] The pulse voltage application capacitor Cs is a capacitor that is charged to obtain the charge for generating a pulse voltage. One end of the pulse voltage application capacitor Cs is connected to the external terminal T2.

[0047] The switch SW is an element for switching whether to output a pulse voltage. The switch SW is implemented by a semiconductor element such as a power transistor or a thyristor, for example. The switch SW is connected between the other end of the pulse voltage application capacitor Cs and the external terminal T1.

[0048] The current limiting resistor Rs is an element for limiting the current flowing from the external terminal T1 to the winding 11 of the test object when discharging the pulse voltage application capacitor Cs. The current limiting resistor Rs is connected in series with the switch SW between the other end of the pulse voltage application capacitor Cs and the external terminal T1.

[0049] The rectifying element D allows the current to pass from the pulse voltage application capacitor Cs side to the external terminal T1 side and cuts off the current from the external terminal T1 side to the pulse voltage application capacitor Cs side. The rectifying element D is a diode, for example. In the following description, the rectifying element D is also labeled as "anti - reverse - flow diode D".

[0050] The anti - reverse - flow diode D is connected in series with the switch SW and the current limiting resistor Rs between the other end of the pulse voltage application capacitor Cs and the external terminal T1. For example, the anode of the anti - reverse - flow diode D is connected to one end of the current limiting resistor Rs, and the cathode of the anti - reverse - flow diode D is connected to the external terminal T1.

[0051] The output control unit 20 is a functional unit that controls the charging and discharging of the pulse voltage application capacitor Cs in response to an instruction from the instruction receiving unit 3. The output control unit 20 is implemented by the above - mentioned program processing device (microcontroller), for example.

[0052] In response to an instruction from the instruction receiving unit 3, the output control unit 20 controls the charging voltage of the capacitor Cs for applying a pulse voltage and the switch SW based on the demagnetization pulse information 84 and the measurement pulse information 87, thereby generating a voltage V between the external terminals T1 and T2. For example, in a state where the switch SW is open, the output control unit 20 charges the capacitor Cs for applying a pulse voltage to a desired voltage through a DC power supply (not shown), and then, by closing the switch SW, a voltage V is generated between the external terminals T1 and T2.

[0053] At this time, as described above, due to deviations in the characteristics of the winding 11 to be tested, etc., there is a case where the voltage V applied to the winding 11 from the external terminals T1 and T2 deviates. That is, when the voltage command value is set to "Em", and the capacitor Cs for applying a pulse voltage is charged so that the voltage of the capacitor Cs for applying a pulse voltage becomes "Em", and the capacitor Cs for applying a pulse voltage is discharged through the switch SW, the voltage V applied to the winding 11 from the external terminals T1 and T2 is sometimes different from "Em" (V≠Em). Furthermore, due to deviations in characteristics, etc., the voltage V of the winding 11 of each test object becomes different values.

[0054] Therefore, the output control unit 20 corrects the voltage command value Em using the correction coefficient C calculated in such a way that the voltage V applied to the winding 11 from the external terminals T1 and T2 becomes a desired value, and charges the capacitor Cs for applying a pulse voltage, so that the voltage of the capacitor Cs for applying a pulse voltage becomes a value obtained by correcting the voltage command value Em using the correction coefficient C. Then, the output control unit 20 discharges the capacitor Cs for applying a pulse voltage through the switch SW, thereby applying a voltage V of a desired value to the winding 11.

[0055] Next, a method for the test device 1 to calculate the correction coefficient C will be described.

[0056] As described above, the correction coefficient C is a parameter for correcting the voltage command value so that the voltage output between the external terminals T1 and T2 becomes a desired value. The correction coefficient C is calculated and updated by the correction coefficient calculation unit 5.

[0057] When the instruction receiving unit 3 receives a specified instruction, the voltage generation circuit 2 generates and outputs a voltage (set voltage) Et corresponding to a value obtained by correcting the voltage command value corresponding to the specified instruction using the correction coefficient C. The correction coefficient calculation unit 5 updates the correction coefficient C to reduce the deviation between the voltage V measured by the voltage measurement unit 4 and the voltage command value corresponding to the specified instruction.

[0058] Here, it is stipulated that the instruction is, for example, the first instruction A1 (output instruction of the demagnetization pulse) or the second instruction A2 (execution instruction of the analysis related to the electrical characteristics of the winding 11) as described above. In the present embodiment, the case where the stipulated instruction is the first instruction A1 will be described as an example.

[0059] Specifically, when the instruction receiving unit 3 receives the first instruction, the voltage generation circuit 2 generates and outputs a voltage based on the voltage command value corresponding to the first instruction A1, that is, the voltage command value Ee included in the demagnetization pulse information 84. Next, the correction coefficient calculation unit 5 calculates the correction coefficient C in such a way that the deviation between the voltage measured by the voltage measurement unit 4 and the voltage command value Ee corresponding to the first instruction A1 becomes smaller.

[0060] At this time, the correction coefficient calculation unit 5 can calculate the correction coefficient C based on the ratio of the voltage V measured by the voltage measurement unit 4 to the voltage command value (Ee) corresponding to the stipulated instruction. For example, when the correction coefficient before update is set as Cn-1 and the correction coefficient after update is set as Cn, the correction coefficient calculation unit 5 can calculate (update) the correction coefficient Cn based on the following formula (1). C n =Ee÷V×C n-1 ...(1)

[0062] Moreover, the correction coefficient calculation unit 5 can update the correction coefficient C for each output of the pulse. Specifically, when the instruction receiving unit 3 receives the stipulated instruction, the voltage generation circuit 2 outputs a pulse having a voltage a specified number of times, and this voltage corresponds to the value obtained by correcting the voltage command value corresponding to the stipulated instruction using the correction coefficient. At the same time, the correction coefficient calculation unit 5 updates the correction coefficient C for each output of the pulse. For example, when the instruction receiving unit 3 receives the first instruction A1, the voltage generation circuit 2 outputs a demagnetization pulse having a voltage (Et = Ee×C) a specified number of times (specified output times) Ne, and this voltage corresponds to the value obtained by correcting the voltage command value Ee of the demagnetization pulse using the correction coefficient C. The correction coefficient calculation unit 5 can update the correction coefficient Cn based on the voltage V measured each time the demagnetization pulse is output, the voltage command value Ee, and the immediately preceding correction coefficient Cn-1. Hereinafter, the calculation order of the correction coefficient C will be described.

[0063] Figure 3 is the timing chart when the demagnetization pulse and the measurement pulse are output from the voltage generation circuit 2.

[0064] In Figure 3 it is Figure 3The upper side shows, in sequence, the application timing and magnitude of the degaussing pulse and the measurement pulse output from the voltage generation circuit 2, the voltage between the external terminals T1 and T2, the correction coefficient, and the change over time of the operation mode of the test device 1.

[0065] The operation mode of the test device 1 has, for example, a "standby mode (standby state)" for waiting for an instruction to be input to the test device 1, a "degaussing mode", and a "test mode". The test device 1 outputs a degaussing pulse in the degaussing mode to suppress the magnetization deviation of the winding 11 of the object under test, while calculating (updating) the correction coefficient C, and in the test mode, outputs a measurement pulse to analyze the electrical characteristics of the winding 11 of the object under test.

[0066] Figure 4 is a flowchart showing the processing flow of the test device 1 in the degaussing mode.

[0067] For example, when Figure 3 the test device 1 is powered on at time t0, the test device 1 becomes the "standby mode". In the standby mode, the test device 1 determines whether the instruction receiving unit 3 has received the first instruction A1 (step S1). If the instruction receiving unit 3 has not received the first instruction A1 (step S1: no), the test device 1 maintains the standby mode.

[0068] For example, when Figure 3 at time t1, if the instruction receiving unit 3 has received the first instruction A1 (step S1: yes), the test device 1 becomes the degaussing mode (step S2).

[0069] In the degaussing mode, the test device 1 sets the conditions for the degaussing pulse (step S3). Specifically, the output control unit 20 of the voltage generation circuit 2 reads the voltage command value Ee of the degaussing pulse, the specified output number Ne, and the correction coefficient C included in the correction coefficient information 82 stored in the storage unit 8 as the degaussing pulse information 84. Here, it is set that the voltage command value Ee = 1000V, the specified output number Ne = 2, and the correction coefficient C = C0 (initial value) = 1.000.

[0070] Next, the output control unit 20 determines the set voltage Et of the degaussing pulse to be output next based on the voltage command value Ee and the correction coefficient C (step S4). For example, the output control unit 20 uses the value obtained by multiplying the voltage command value Ee by the correction coefficient C0 (= Ee × C0 = 1000V) as the set voltage Et of the degaussing pulse.

[0071] Next, the output control unit 20 charges the pulse voltage application capacitor Cs through a DC power source (not shown) so that the voltage of the pulse voltage application capacitor Cs becomes the set voltage Et (= 1000V) (step S5).

[0072] Next, the test device 1 outputs the first demagnetization pulse (step S6). Specifically, at Figure 3 time t2, the output control unit 20 turns on the switch SW. As a result, the charge charged to the capacitor Cs for applying the pulse voltage is discharged through the current limiting resistor Rs and the anti-backflow diode D, and a demagnetization pulse with a voltage (amplitude) V is generated between the external terminals T1 and T2. When the demagnetization pulse is output in step S6, the voltage measurement unit 4 starts measuring the voltage V between the external terminals T1 and T2 (step S7).

[0073] Next, the correction coefficient calculation unit 5 calculates the correction coefficient C (step 8). Specifically, as Figure 3 shown, the correction coefficient calculation unit 5 obtains the maximum value of the voltage V between the external terminals T1 and T2 measured by the voltage measurement unit 4, and calculates a new correction coefficient C based on the set voltage Et determined in step S4, the maximum value Vmax of the voltage V measured in step S7, and the immediately preceding correction coefficient C. For example, when Vmax = 920V, the immediately preceding correction coefficient is set as C0 (initial value), and the corrected correction coefficient is set as C1, the correction coefficient calculation unit 5 calculates the correction coefficient C1 based on the following formula (2) and stores the correction coefficient C1 as correction coefficient information 82 in the storage unit 8. Thereby, the correction coefficient information 82 in the storage unit 8 is updated. C1 = Ee ÷ Vmax × C0 = 1000 ÷ 920 × 1.000 = 1.087...(2)

[0075] Next, the test device 1 determines whether the output count of the demagnetization pulse has reached the specified output count Ne (step S9). When the output count of the demagnetization pulse has not reached the specified output count Ne (step S9: No), the test device 1 executes steps S4 to S9 again.

[0076] In the case of the above example, since only one demagnetization pulse has been output with respect to the specified output count Ne = 2, the test device 1 returns to step S4, and the output control unit 20 first determines the set voltage Et of the demagnetization pulse to be output next (step S4). For example, the output control unit 20 sets the value obtained by multiplying the voltage command value Ee by the updated correction coefficient C1 (= Ee × C = 1000 × 1.087 = 1087V) as the set voltage Et of the second demagnetization pulse to be output.

[0077] Next, the output control unit 20 charges the capacitor Cs for applying the pulse voltage through a DC power supply (not shown) so that the voltage of the capacitor Cs for applying the pulse voltage becomes the set voltage Et (= 1087V) (step S5).

[0078] Next, the test device 1 outputs a second demagnetization pulse (= 1087 V) (step S6). Specifically, at Figure 3 time t3, the output control unit 20 turns on the switch SW. As a result, the charge stored in the pulse voltage application capacitor Cs is discharged through the current limiting resistor Rs and the anti-backflow diode D, and a demagnetization pulse with a voltage (amplitude) V is generated between the external terminals T1 and T2. When the second demagnetization pulse is output in step S6, the voltage measurement unit 4 starts measuring the voltage V between the external terminals T1 and T2 (step S7).

[0079] Next, the correction coefficient calculation unit 5 calculates (updates) the correction coefficient (step 8). Specifically, as Figure 3 shown, the correction coefficient calculation unit 5 obtains the maximum value of the voltage V between the external terminals T1 and T2 measured by the voltage measurement unit 4, and updates the correction coefficient C based on the set voltage Et determined in step S4, the maximum value Vmax of the voltage V measured in step S7, and the immediately preceding correction coefficient C. For example, when the maximum value Vmax of the voltage V measured after time t3 is 1007 V, the immediately preceding correction coefficient is set to C1 (= 1.087), and the corrected correction coefficient is set to C2, the correction coefficient calculation unit 5 calculates the correction coefficient C2 based on the following formula (3) and stores the correction coefficient C2 as correction coefficient information 82 in the storage unit 8. Thereby, the correction coefficient information in the storage unit 8 is updated. C2 = Ee ÷ Vmax × C1 = 1000 ÷ 1007 × 1.087 = 1.079...(3) Next, the test device 1 determines whether the output number of the demagnetization pulses has reached the specified output number Ne (step S9). In the above example, since the output number of the demagnetization pulses (= 2) has reached the specified output number Ne (= 2) (step S9: Yes), the test device 1 ends the process of updating the correction coefficient C (step S10). After that, the test device 1 switches from the demagnetization mode to the standby mode, for example.

[0081] Through the above processing, the correction coefficient C for applying the desired voltage to the winding 11 of the test object can be calculated. In addition, in the above example, although the case where the specified output number Ne (the update number of the correction coefficient) of the demagnetization pulse is set to "2" is illustrated, it is not limited thereto, and the specified output number Ne may be 1 or more.

[0082] Next, the processing of the test device 1 in the test mode will be described. When performing analysis related to the electrical characteristics of the winding 11 of the DUT, the voltage generation circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting a voltage command value corresponding to the analysis related to the electrical characteristics of the winding 11 of the DUT using the correction factor C. At the same time, the analysis result generation unit 6 generates an analysis result 83 based on the voltage measured by the voltage measurement unit 4.

[0083] Here, the voltage command value corresponding to the analysis related to the electrical characteristics of the winding 11 of the DUT is, for example, the voltage command value Em of the measurement pulse information 87.

[0084] For example, when the instruction reception unit 3 receives a second instruction A2 indicating the execution of analysis related to the electrical characteristics of the winding 11 of the DUT after the correction factor is calculated, the voltage generation circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value Em corresponding to the second instruction A2 using the correction factor C. At the same time, the analysis result generation unit 6 generates an analysis result 83 based on the voltage measured by the voltage measurement unit 4.

[0085] Figure 5 It is a flowchart showing the processing flow of the test device 1 in the test mode.

[0086] In the following description, it is assumed that before performing the processing in the test mode, the above-described update processing of the correction factor C ( Figure 4 ) is performed, and the correction factor C2 (= 1.079) is stored in the storage unit 8 as the correction factor information 82.

[0087] For example, in the standby mode, the test device 1 determines whether the instruction reception unit 3 has received the second instruction A2 (step S11). If the instruction reception unit 3 has not received the second instruction A2 (step S11: No), the test device 1 maintains the standby mode.

[0088] For example, at Figure 3 time t4, the instruction reception unit 3 receives the second instruction A2 (step S11: Yes). In this case, the test device 1 enters the test mode (step S12).

[0089] In the test mode, the test device 1 sets the conditions for the measurement pulse (step S13). Specifically, the output control unit 20 reads the voltage command value Em of the measurement pulse information 87 stored in the storage unit 8, the specified output number Nm, and the correction factor C2 included in the correction factor information 82. Here, it is assumed that the voltage command value Em = 1000V, the specified output number Ne = 1, and the correction factor C2 = 1.079.

[0090] Next, the output control unit 20 determines the set voltage Et of the measurement pulse to be output next based on the voltage command value Em and the correction coefficient C2 (step S14). For example, the output controller 20 sets the value obtained by multiplying the voltage command value Em by the correction coefficient C2 (=Em×C2 = 1079V) as the set voltage Et to be set in the capacitor Cs for applying the pulse voltage.

[0091] Next, the output control unit 20 charges the capacitor Cs for applying the pulse voltage through a DC power supply (not shown) so that the voltage of the capacitor Cs for applying the pulse voltage becomes the set voltage Et (=1079V) (step S15).

[0092] Next, the test device 1 outputs a measurement pulse (=1079V) (step S16). Specifically, at the time t5 of Figure 3 , the output control unit 20 turns on the switch SW. As a result, the charge charged in the capacitor Cs for applying the pulse voltage is discharged through the current limiting resistor Rs and the anti - reverse diode D, and a measurement pulse with a voltage (amplitude) V is generated between the external terminals T1 and T2. When the measurement pulse is output in step S16, the voltage measurement unit 4 starts measuring the voltage V between the external terminals T1 and T2, and stores the measurement result of the voltage V as the voltage measurement value 81 in the storage unit 8 (step S17). At this time, since the set voltage Et (Et = 1079V) of the capacitor Cs for applying the pulse voltage is adjusted by the correction coefficient C2, the maximum value of the voltage V is approximately 1000V.

[0093] Next, the test device 1 determines whether the output number of the measurement pulses has reached the specified output number Nm (step S18). When the output number of the measurement pulses has not reached the specified output number Nm (step S18: No), the test device 1 executes steps S14 - S18 again.

[0094] In the case of the above example, since the output number of the measurement pulses (=1) has reached the specified output number Nm (=1) (step S18: Yes), the test device 1 executes the analysis process of the electrical characteristics of the winding 11 of the test object (step S19). Specifically, the analysis result generation unit 6 calculates various parameters of the winding 11 by the above method using the voltage measurement value 81 measured in step S17, stores them as the analysis result 83 in the storage unit 8, and the output unit 7 displays information related to the analysis result 83 of the winding 11 on the screen of the display device, for example. After that, the test device 1 switches from the test mode to the standby mode, for example.

[0095] As described above, in the test apparatus 1 according to the embodiment, when the instruction receiving unit 3 receives a specified instruction (e.g., the first instruction A1), the voltage generation circuit 2 generates and outputs a voltage (set voltage Et = Ee × C), which corresponds to a value obtained by correcting a voltage command value (e.g., voltage command value Ee) corresponding to the specified instruction using a correction coefficient C. The correction coefficient calculation unit 5 updates the correction coefficient C in such a manner that the deviation between the voltage V measured by the voltage measurement unit 4 and the voltage command value (Ee) corresponding to the specified instruction becomes smaller. Further, when performing analysis related to the electrical characteristics of the winding 11, the voltage generation circuit 2 generates and outputs a voltage (set voltage Et = Em × C), which corresponds to a value obtained by correcting a voltage command value (e.g., voltage command value Em) corresponding to the analysis related to the electrical characteristics of the winding 11 using the correction coefficient C. The analysis result generation unit 6 generates an analysis result 83 based on the voltage V measured by the voltage measurement unit 4 at this time.

[0096] Accordingly, it is possible to adjust the correction coefficient C such that the voltage applied to the winding 11 of the test object becomes a desired magnitude, and to determine the voltage of the measurement pulse to be applied to the winding 11 of the test object based on the adjusted correction coefficient C. Therefore, it is possible to suppress a deviation in the voltage applied to the winding 11 of the test object due to the characteristics of the winding 11 of the test object or the like.

[0097] In addition, in the test apparatus 1, when the instruction receiving unit 3 receives a specified instruction, the voltage generation circuit 2 may output a pulse having a voltage a specified number of times, the voltage corresponding to a value obtained by correcting a voltage command value corresponding to the specified instruction using a correction coefficient. At the same time, the correction coefficient calculation unit 5 may update the correction coefficient for each output of the pulse.

[0098] Accordingly, the greater the number of outputs of the pulse (e.g., degaussing pulse) applied to the winding 11 of the test object before the test, the greater the number of updates of the correction coefficient C. Therefore, it is possible to improve the accuracy of the correction coefficient C and further suppress the voltage deviation of the voltage applied to the winding 11 of the test object. Further, since it is only necessary to specify the number of outputs of the degaussing pulse according to the accuracy required for the voltage applied to the winding 11 of the test object, it is possible to implement the test apparatus 1 that can meet various demands of users and is convenient to use.

[0099] Further, the specified instruction may be set as the output instruction of the degaussing pulse, i.e., the first instruction A1. Therefore, there is no need to newly provide an operation button or command for updating the correction coefficient C. Further, by simply instructing the output of the degaussing pulse by operating the test apparatus 1, it is possible to suppress the deviation of the magnetization state of the winding 11 and update the correction coefficient C. Therefore, it is possible to suppress an increase in the analysis time due to the update of the correction coefficient C.

[0100] Further, in the test apparatus 1, when the instruction receiving unit 3 receives an instruction to perform analysis related to the electrical characteristics of the winding 11 of the test object, i.e., the second instruction A2, the voltage generation circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value Em corresponding to the second instruction A2 using the correction coefficient C. At the same time, the analysis result generation unit 6 can generate an analysis result 83 based on the voltage measured by the voltage measurement unit 4. Thus, the calculation process of the correction coefficient and the analysis process of the winding are respectively executed according to independent first instruction A1 and second instruction A2. Therefore, the user can make the test apparatus 1 perform the update of the correction coefficient and the analysis of the winding at the desired timing respectively.

[0101] In addition, in the test apparatus 1, the correction coefficient calculation unit 5 can update the correction coefficient C based on the ratio of the voltage V measured by the voltage measurement unit 4 to the voltage command value (Ee) corresponding to a specified instruction. For example, the correction coefficient calculation unit 5 can update the correction coefficient Cn based on the above formula (1).

[0102] Thus, the correction coefficient can be updated by a simpler calculation, so that an increase in the operation load of the test apparatus 1 (program processing apparatus) caused by incorporating the voltage correction function into the test apparatus 1 can be suppressed.

[0103] Further, in the test apparatus 1, it is preferable that the voltage command value corresponding to the specified instruction A1 is the same as the voltage command value related to the analysis of the electrical characteristics of the winding 11 of the test object. For example, it is preferable that the voltage command value Ee of the demagnetization pulse is the same as the voltage command value Em of the measurement pulse (Ee = Em). Thus, the correction coefficient is adjusted according to the voltage to be applied to the winding 11 during analysis, so that the voltage accuracy of the measurement pulse can be further improved.

[0104] Expansion of the Embodiment As described above, although the invention completed by the inventor of the present application has been specifically described based on the embodiment, the present invention is not limited thereto, and various changes can be made without departing from its gist.

[0105] For example, in the above embodiment, although the case where the specified instruction (which becomes the start trigger condition for the calculation process of the correction coefficient) is the first instruction A1 (output instruction of the demagnetization pulse) is exemplified, it is not limited thereto. For example, it can also be an instruction different from the output instruction of the demagnetization pulse (for example, an instruction to calculate the correction coefficient). In this case, it is only necessary to newly provide a user interface or command such as an operation button for the above instruction in the test apparatus 1.

[0106] Also, in the above-described embodiment, although it is exemplified that the specified instruction (which is the start trigger condition for the calculation process of the correction coefficient) is the first instruction A1, that is, when the first instruction A1 is input to the test device 1, the test device 1 performs the calculation (update) of the correction coefficient, this is not limiting. For example, it may also be the case where when the second instruction A2 is input to the test device 1, the test device 1 continuously performs the calculation process of the correction coefficient C and the analysis process of the winding 11 based on the input of the second instruction A2.

[0107] Specifically, the specified instruction is set to the second instruction A2 (the execution instruction for the analysis related to the electrical characteristics of the winding 11 to be tested). More specifically, when the instruction receiving unit 3 receives the second instruction A2, the voltage generation circuit 2 generates and outputs a voltage based on the voltage command value Em corresponding to the second instruction A2. At the same time, the correction coefficient calculation unit 5 calculates the correction coefficient C in such a way that the deviation between the voltage measured by the voltage measurement unit 4 and the voltage command value Em corresponding to the second instruction A2 becomes smaller. Then, after calculating the correction coefficient C, the voltage generation circuit 2 generates and outputs a voltage corresponding to the value obtained by correcting the voltage command value Em using the correction coefficient C. At the same time, the analysis result generation unit 6 generates the analysis result 83 based on the voltage measured by the voltage measurement unit 4.

[0108] Thus, the user can continuously perform the calculation of the correction coefficient C and the analysis related to the electrical characteristics of the winding 11 using the correction coefficient C only by inputting the execution instruction (second instruction A2) related to the analysis of the electrical characteristics of the winding 11. Therefore, the user does not need to input the output instruction (first instruction A1) of the demagnetization pulse in advance.

[0109] In this case, the voltage generation circuit 2 can use the measurement pulse information 87 as the demagnetization pulse information 84. For example, the voltage generation circuit 2 can set the voltage command value Ee of the demagnetization pulse to be the same value as the voltage command value Em of the measurement pulse information 87 and output the demagnetization pulse. Also, the voltage generation circuit 2 can set the specified output number Ne of the demagnetization pulse to be the same value as the specified output number Nm of the measurement pulse and output the demagnetization pulse. Or, the demagnetization pulse information 84 can be preset in the storage unit 8. Thus, the user only needs to set the measurement pulse information 87 without setting the demagnetization pulse information 84.

[0110] Further, in the above-described embodiment, although it is exemplified that when the test device 1 outputs a plurality of demagnetization pulses, the correction coefficient C is updated each time a demagnetization pulse is output, this is not limiting. That is, the correction coefficient calculation unit 5 only needs to calculate the correction coefficient C by the above method based on the measured value of the voltage V when at least one of the plurality of demagnetization pulses is applied to the winding 11.

[0111] For example, the correction coefficient calculation unit 5 can calculate the correction coefficient Cn based on the measured value of the voltage V when the initially output demagnetization pulse is applied to the winding 11 and the correction coefficient Cn-1, or can calculate the correction coefficient Cn based on the measured value of the voltage V when the last output demagnetization pulse is applied to the winding 11 and the correction coefficient Cn-1. Alternatively, when the demagnetization pulses are output Ne times, the correction coefficient calculation unit 5 can calculate the correction coefficient C based on each of the initially output n (<Ne) demagnetization pulses, or can calculate the correction coefficient C based on each of the last output n demagnetization pulses. That is, the number of output times of the demagnetization pulses (specified output times Ne) and the number of update times of the correction coefficient may not be the same.

[0112] In addition, in the above-described embodiment, although as an example, the case where the voltage command value Ee of the first demagnetization pulse is set to 1000V in order to make the voltage applied to the winding 11 during the test be 1000V is illustrated, it is not limited thereto. For example, the voltage command value required to apply 1000V to the qualified winding 11 can be measured in advance, and this voltage command value can be set as the voltage command value of the first demagnetization pulse. For example, when the voltage command value for applying 1000V to the winding 11 is 1090V, the voltage command value Ee of the first demagnetization pulse can be set to "1090V". Alternatively, the initial value C0 of the correction coefficient can be set to "1.090 (= 1090V ÷ 1000V)", and the first demagnetization pulse can be output.

[0113] In addition, in the above-described embodiment, although the case where the demagnetization pulse is used as the pulse applied to the winding 11 in order to calculate the correction coefficient is illustrated, the type of the pulse is not limited thereto. For example, in order to calculate the correction coefficient, the same pulse as the measurement pulse applied when analyzing the electrical characteristics of the winding 11 of the test object can be applied to the winding 11. At this time, the number of output times of the pulse used to calculate the correction coefficient may be the same as or different from the number of output times of the measurement pulse (specified output times Nm).

[0114] And, when the correction coefficient C calculated by the update exceeds the specified range, the correction coefficient calculation unit 5 can limit the correction coefficient C to the upper limit value or the lower limit value of the specified range, and can also stop the output of the demagnetization pulse or the measurement pulse by the voltage generation circuit 2 after the output unit 7 outputs information indicating an abnormal state (error). Thus, in the case where there is an abnormality (such as a short circuit fault or an open circuit fault) in the winding of the test object itself, it is possible to prevent the correction coefficient C from being set to an abnormal value, which may cause an inappropriate voltage to be output from the external terminals T1 and T2.

[0115] In addition, the above flowcharts illustrate an example for explaining operations, and the present invention is not limited thereto. That is, the steps shown in each diagram of the flowchart are specific examples, and the present invention is not limited to this flow. For example, the order of a part of the processing can be changed, other processing can be inserted between each processing, and a part of the processing can be performed in parallel. Symbol Explanation

[0116] 1: Test device; 2: Voltage generation circuit; 3: Indication receiving unit; 4: Voltage measurement unit; 5: Correction coefficient calculation unit; 6: Analysis result generation unit; 7: Output unit; 8: Storage unit; 81: Voltage measurement value; 82: Correction coefficient information; 83: Analysis result; 84: Demagnetization pulse information; 87: Measurement pulse information; A1: First indication; A2: Second indication; Cs: Pulse voltage application capacitor; Rs: Current limiting resistor; D: Rectifying element (reverse current preventing diode); T1: External terminal (first external terminal); T2: External terminal (second external terminal).

Claims

1. A testing device, characterized in that, having: a first external terminal connected to one terminal of a winding of a device under test; a second external terminal connected to the other terminal of the winding of the device under test; an instruction receiving unit that receives an instruction; a correction coefficient calculation unit that calculates a correction coefficient; a voltage generation circuit that generates a voltage based on a voltage command value and the correction coefficient and outputs the voltage between the first external terminal and the second external terminal; a voltage measurement unit that measures the voltage between the first external terminal and the second external terminal; and an analysis result generation unit that performs analysis related to the electrical characteristics of the winding of the device under test based on the voltage measured by the voltage measurement unit and generates an analysis result, when the instruction receiving unit receives a specified instruction, the voltage generation circuit generates and outputs a voltage based on the voltage command value corresponding to the specified instruction, and at the same time, the correction coefficient calculation unit calculates the correction coefficient in such a way that the deviation between the voltage measured by the voltage measurement unit and the voltage command value corresponding to the specified instruction becomes smaller; when performing the analysis, the voltage generation circuit generates and outputs a voltage corresponding to the value obtained by correcting the voltage command value corresponding to the analysis using the correction coefficient, and at the same time, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit.

2. The test device according to claim 1, wherein when the instruction receiving unit receives the specified instruction, the voltage generation circuit outputs a pulse having a voltage a specified number of times, the voltage corresponding to the value obtained by correcting the voltage command value corresponding to the specified instruction using the correction coefficient, and at the same time, the correction coefficient calculation unit updates the correction coefficient for each output of the pulse.

3. The test device according to claim 1, wherein the correction coefficient calculation unit calculates the correction coefficient based on the ratio of the voltage measured by the voltage measurement unit to the voltage command value corresponding to the specified instruction.

4. The test device according to claim 1, wherein the specified instruction is an output instruction of a demagnetization pulse, which is a voltage for suppressing magnetization deviation of the iron core in a winding having an iron core, after calculating the correction coefficient, when the instruction receiving unit receives an execution instruction of the analysis, the voltage generation circuit generates and outputs a voltage corresponding to the value obtained by correcting the voltage command value corresponding to the analysis using the correction coefficient, and at the same time, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit.

5. The test device according to claim 1, wherein the specified instruction is an execution instruction of the analysis After calculating the correction coefficient, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value corresponding to the measurement using the correction coefficient. At the same time, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit.

6. The test device according to claim 1, wherein the voltage command value corresponding to the specified instruction and the voltage command value corresponding to the measurement are the same.

7. A testing method, characterized in that, A test device is used as follows: The test device includes: a first external terminal connected to one terminal of the winding of the test object; a second external terminal connected to the other terminal of the winding of the test object; an instruction receiving unit that receives an instruction; a correction coefficient calculation unit that calculates a correction coefficient; a voltage generation circuit that generates a voltage based on a set voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal; a voltage measurement unit that measures the voltage between the first external terminal and the second external terminal; and an analysis result generation unit that performs analysis related to the electrical characteristics of the winding of the test object based on the voltage measured by the voltage measurement unit and generates an analysis result. The test method includes: a first step in which the instruction receiving unit receives a specified instruction; a second step in which, after the first step, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value corresponding to the specified instruction using the correction coefficient; a third step in which the voltage measurement unit measures the voltage between the first external terminal and the second external terminal when the voltage generation circuit outputs a voltage in the second step; a fourth step in which the correction coefficient calculation unit calculates the correction coefficient in such a way that the deviation between the voltage measured in the third step and the voltage command value corresponding to the specified instruction becomes smaller; a fifth step in which, when performing the analysis, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value corresponding to the analysis using the correction coefficient; a sixth step in which the voltage measurement unit measures the voltage between the first external terminal and the second external terminal when the voltage generation circuit outputs a voltage in the fifth step; a seventh step in which the analysis result generation unit generates the analysis result based on the voltage measured in the sixth step.

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