Detection method, readable storage medium, program product and detection equipment

Abstract

The invention relates to the technical field of terminals, in particular to a detection method, a readable storage medium, a program product and detection equipment. The detection method is applied to the detection equipment, and the detection equipment can obtain two-dimensional contour data of a first assembly part, outside a main body, of an installation structure of to-be-detected equipment and determine characteristic parameters of the installation structure based on the two-dimensional contour data. And inputting the characteristic parameters into a formula to obtain the installation score of the installation structure. The detection device can determine whether the installation structure meets the requirement according to the installation score. Therefore, the mounting structure of the to-be-detected object can be detected in batches, and a detector does not need to judge whether the mounting structure has problems or not through human eye observation in the detection process, so that the detection efficiency and accuracy are improved.

Description

Technical Field

[0001] This application relates to the technical field of terminals, and in particular, to a detection method, a readable storage medium, a program product, and a detection device. Background Art

[0002] For some assembled objects such as devices and components, during the installation stage, due to errors during the installation process, there may be problems with improper installation of some installation structures (for example, the keys of an electronic device are tilted or protruded, and the radius of the transition fillet at the edge of the camera is too small, etc.), resulting in an unattractive appearance of the assembled object. Moreover, due to the improper installation of the installation structures on the contour of the assembled object, the user may experience a scratching feeling when using it, reducing the user experience.

[0003] Therefore, after the installation of the assembled object is completed or during the installation process, it is necessary to detect the installation of the installation structures of the assembled object to avoid the problem that the installation structures of the assembled object scratch the palm when the user uses the assembled object due to improper installation of the installation structures of the assembled object.

[0004] Currently, when detecting the installation structures of an assembled object, inspectors detect whether there are problems with the installation structures of the device by visual observation. However, the efficiency and accuracy of detecting an assembled object by the method of visual observation are both low. Summary of the Invention

[0005] Embodiments of this application provide a detection method, a readable storage medium, a program product, and a detection device.

[0006] In a first aspect, an embodiment of this application provides a detection method, which is applied to a detection device and includes: obtaining two-dimensional contour data of a first component part located outside the main body after an installation component is installed on the main body; determining characteristic parameters of the installation component based on the two-dimensional contour data; obtaining an installation score of the installation component based on the characteristic parameters of the installation component and coefficients corresponding to the characteristic parameters, and determining that the installation component meets the installation requirements when the installation score corresponding to the installation component meets a detection threshold; where the characteristic parameters include at least one of the following parameters: the step difference of the installation component, the skew angle of the installation component, the curvature radius of the transition fillet of the installation component, and the assembly gap of the installation component.

[0007] Exemplarily, in some embodiments of the present application, the installation component may also be referred to as an installation structure, and the main body may also be referred to as an assembled main body. After the installation component is installed on the main body, the part exposed to the outside is the first structural part, and the installation surface of the main body corresponding to the installation component of the first structural part can be used as the first component part. The two-dimensional contour data of the first component part can be obtained by a contour detection device, and the contour detection device can be the same device as the detection device or different devices. After obtaining the two-dimensional contour data of the first component part, the contour detection device can send it to the detection device.

[0008] The detection device can perform calculations such as screening and fitting on the two-dimensional contour data to determine the characteristic parameters of the installation component. Then, by inputting the characteristic parameters into the formula, the installation score of the installation component can be obtained. When the installation score of the installation component meets the detection threshold, it can be determined that the installation component meets the installation requirements. Thus, it is not necessary for the inspector to determine whether the installation component meets the installation requirements based on visual observation, thereby improving the detection efficiency of the installation component. Since it is not necessary for the inspector to judge whether the installation component meets the requirements based on experience, the accuracy of the detection result can be improved.

[0009] In a possible implementation of the first aspect described above, the installation score of the above-mentioned assembly structure is obtained based on the following formula:

[0010] Y = AX1 + BX2 + CX3 + DX4 + E

[0011] Wherein, Y is the installation score of the installation component, X1 is the segment difference of the installation component with the largest deviation from the standard segment difference, X2 is the skew angle of the installation component, X3 is the radius of curvature of the transition fillet of the installation component with the largest deviation from the radius of curvature of the standard transition fillet, X4 is the assembly gap of the installation component with the largest deviation from the standard assembly gap, A is the coefficient of the segment difference of the installation component, B is the coefficient of the skew angle of the installation component, C is the coefficient of the radius of curvature of the transition fillet of the installation component, D is the coefficient of the assembly gap of the installation component, and E is the compensation parameter.

[0012] Exemplarily, in some embodiments of the present application, after determining the characteristic parameters of the installation component, the detection device can input the characteristic parameters into the formula to obtain the installation score of the installation component.

[0013] In a possible implementation of the above first aspect, the coefficients corresponding to the above characteristic parameters and the compensation parameters are obtained based on the following method: obtaining at least one sample data, where the sample data includes characteristic parameters and the reference scores corresponding to the characteristic parameters; inputting the at least one sample data into a first model to obtain the calculated scores corresponding to the characteristic parameters in each sample data, where the parameters of the first model include: the coefficients corresponding to the characteristic parameters and the compensation parameters; adjusting the parameters of the first model based on the calculated scores and the reference scores corresponding to each sample data so that the calculated scores output by the first model meet the termination condition; when the calculated scores output by the first model meet the termination condition, taking the numerical values of the parameters of the first model as the values of the coefficients corresponding to each characteristic parameter and the values of the compensation parameters.

[0014] Exemplarily, in some embodiments of the present application, the coefficients of the characteristic parameters can be determined based on the first model, and the first model is, for example, set in the detection device. In other embodiments, the first model can also be set in other devices, such as set in the server. After the coefficients and compensation parameters of the characteristic parameters are determined by the first model, the formula one is input into the detection device to obtain the installation score of the installation component.

[0015] Among them, the process of determining the coefficients and compensation parameters of the characteristic parameters based on the first model is, for example, inputting the sample data into the first model, and then comparing the scores calculated by the sample data with the reference scores. If the comparison result meets the termination condition, the numerical values of the parameters in the first model can be used as the coefficients corresponding to each characteristic parameter. If the comparison result does not meet the termination condition, the parameters in the first model need to be adjusted, and the scores are calculated again based on the sample data and then compared with the reference scores. Until the scores calculated based on the samples meet the termination condition.

[0016] In a possible implementation of the above first aspect, the coefficients corresponding to the above characteristic parameters are obtained by fitting or are empirical values.

[0017] In a possible implementation of the above first aspect, the above first component includes the part of the installation component located outside the main body and the part of the main body corresponding to the installation surface of the installation component.

[0018] In a possible implementation of the above first aspect, the above two-dimensional contour data is the two-dimensional coordinate data of the contour of the first component projected on the projection plane.

[0019] Exemplarily, in some embodiments of the present application, the coordinate data of the two-dimensional contour of the first component on the projection plane can be directly obtained by the contour detection device. In other embodiments, the contour detection device can also obtain the three-dimensional contour data of the first component and project the three-dimensional contour data on the projection plane to obtain the two-dimensional contour data of the installation component.

[0020] In a possible implementation of the first aspect described above, the installation component further includes a second component part. After the installation component is installed on the main body, the second component part is located inside the main body.

[0021] Exemplarily, in some embodiments of the present application, the second component part may also be referred to as the second structural part. After the installation component is installed on the main body, the second component part is located inside the main body and will not be exposed.

[0022] In a possible implementation of the first aspect described above, the installation score corresponding to the installation component satisfies the detection threshold, including any one of the following: the higher the installation score corresponds to, the more the installation component meets the installation requirements, and the installation score of the installation component is greater than the detection threshold; or the lower the installation score corresponds to, the more the installation component meets the installation requirements, and the installation score of the installation component is less than the detection threshold; or the installation score of the installation component is within the first threshold range.

[0023] Exemplarily, in some embodiments of the present application, when the score of the installation component satisfies the detection threshold, it can be determined that the installation component meets the installation requirements. Among them, the larger the installation score, the more the installation of the installation component meets the installation requirements, and then the installation score of the installation component needs to be greater than the detection threshold.

[0024] In other embodiments, if the installation score of the installation component is smaller, it means that the installation component meets the installation requirements more, then the installation score of the installation component needs to be less than the detection threshold.

[0025] In other embodiments, for example, the installation component may also be within the range of the first threshold, and it can be determined that the installation component meets the installation requirements. Then, when the installation score of the installation component is within the first threshold, it can be determined that the installation component meets the detection threshold.

[0026] In a second aspect, the present application provides a detection system, including a detection device, a contour detection device, and a clamping device; the clamping device is used to fix the object to be detected; the contour detection device is used to obtain the contour data of the first component part of the installation component of the object to be detected and process the contour data into two-dimensional contour data; wherein, the installation component is a structure installed on the main body of the object to be detected, and the first component part is the part located outside the main body and the part of the installation surface of the main body corresponding to the installation component after the installation component is installed on the main body; the detection device is used to determine the characteristic parameters of the installation component based on the two-dimensional contour data; and based on the characteristic parameters of the installation component and the coefficients corresponding to the characteristic parameters, obtain the installation score of the installation component. When the installation score corresponding to the installation component satisfies the detection threshold, it is determined that the installation component meets the installation requirements; wherein, the characteristic parameters include at least one of the following parameters: the step difference of the installation component, the skew angle of the installation component, the curvature radius of the transition fillet of the installation component, and the assembly gap of the installation component.

[0027] Exemplarily, in some embodiments of the present application, the holding device can fix multiple objects to be detected simultaneously to improve the detection efficiency of the objects to be detected.

[0028] The beneficial effects achievable in the second aspect can refer to the beneficial effects of the method provided in any implementation manner of the first aspect, which will not be elaborated herein.

[0029] In a third aspect, the present application provides a detection device, which includes: a memory for storing instructions; at least one processor for executing the instructions to enable the device to implement the method provided in the first aspect and any possible implementation manner of the first aspect. The beneficial effects achievable in the third aspect can refer to the beneficial effects of the method provided in any implementation manner of the first aspect, which will not be elaborated herein.

[0030] In a fourth aspect, the present application provides a computer-readable storage medium, in which instructions are stored. When the instructions are executed by a device, the computer is enabled to implement the method provided in the first aspect and any possible implementation manner of the first aspect. The beneficial effects achievable in the fourth aspect can refer to the beneficial effects of the method provided in any implementation manner of the first aspect, which will not be elaborated herein.

[0031] In a fifth aspect, the present application provides a computer program product, which, when running on a device, enables the device to implement the method provided in the first aspect and any possible implementation manner of the first aspect. The beneficial effects achievable in the fifth aspect can refer to the beneficial effects of the method provided in any implementation manner of the first aspect, which will not be elaborated herein. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1A According to some embodiments of the present application, a perspective view of an electronic device is shown;

[0033] Figure 1B According to some embodiments of the present application, a side view of an electronic device is shown;

[0034] Figure 1C According to some embodiments of the present application, it shows Figure 1B a schematic structural diagram of part A in

[0035] Figure 2A According to some embodiments of the present application, a detection system is shown;

[0036] Figure 2B According to some embodiments of the present application, a flowchart of an embodiment for detecting the installation structure of an object to be inspected is shown;

[0037] Figure 3According to some embodiments of the present application, the contour data of an electronic device is shown;

[0038] Figure 4 According to some embodiments of the present application, a schematic diagram of obtaining the characteristic parameters of an object to be inspected is shown;

[0039] Figure 5 According to some embodiments of the present application, a flowchart of implementing a determination of characteristic parameters is shown;

[0040] Figure 6 According to some embodiments of the present application, a schematic diagram of a coordinate system including the contour of an installation structure is shown;

[0041] Figure 7 According to some embodiments of the present application, a flowchart of implementing a detection of an object to be inspected is shown;

[0042] Figure 8 According to some embodiments of the present application, a schematic diagram of the structure of a clamping fixture is shown;

[0043] Figure 9 According to some embodiments of the present application, a schematic diagram of the structure of a detection device is shown. Specific Embodiments

[0044] The illustrative embodiments of the present application include but are not limited to detection methods, readable storage media, and devices.

[0045] In order to make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described in detail below in conjunction with the accompanying drawings of the specification and specific embodiments.

[0046] As mentioned above, in some scenarios, during the installation process of an assembled object, the installation structure of the assembled object may not meet the installation requirements due to errors. When the user uses the assembled object, problems such as scratching the hand may occur, bringing an unpleasant user experience to the user.

[0047] Exemplarily, the assembled object in the embodiments of the present application may be, for example, an electronic device such as a mobile phone, a tablet computer, a notebook, a wearable device, a laptop computer, an ultra-mobile personal computer (UMPC), a netbook, a personal digital assistant (PDA), etc., or an object formed by installing an installation structure and an assembled main body such as a toy, a model, furniture, a part, etc. The embodiments of the present application do not limit the specific type of the assembled object.

[0048] It can be understood that the installation structure in the embodiments of the present application can be various components installed on another object (hereinafter referred to as the assembly main body), with a part located outside the assembly main body and a part located inside the assembly main body, such as buttons on a device, protruding cameras, screens, screws, etc., or it can also be a protruding part caused by improper assembly of the device housing. For ease of description, hereinafter, the part of the installation structure located outside the assembly main body or the protruding part on the device housing is referred to as the first structural part, and the part of the installation structure located inside the assembly main body is referred to as the second structural part.

[0049] Next, taking a mobile phone as an example, a scenario where the installation structure of an electronic device is improperly installed, causing a problem of scratching the user's hand during use, will be introduced.

[0050] For example, Figures 1A to 1C shows a schematic diagram of an electronic device. Among them, Figure 1A is a three-dimensional view of the electronic device, Figure 1B is a side view of the electronic device, Figure 1C is Figure 1B a schematic diagram of the structure of part A in

[0051] Such as Figure 1A shown, in some embodiments of the present application, the installation structure of the electronic device 100 can be, for example, the button 10 and the camera 20. Among them, the button 10 protrudes from the outline of the middle frame 30 (as the assembly main body) of the electronic device 100 in the width direction of the electronic device 100 (for example, the X direction in Figure 1A ), and the button 10 extends in the length direction of the electronic device 100 (for example, the Y direction in Figure 1A ). The camera 20 protrudes from the outline of the rear shell 40 of the electronic device 100 in the thickness direction of the electronic device 100 (for example, the Z direction in Figure 1A ).

[0052] Such as Figure 1B and Figure 1C shown, during the installation process of the electronic device 100, due to a failure in some assembly stages of the installation assembly line, the button 10 of the electronic device 100 is tilted. For example, Figure 1C the button contour 11 formed by the button 10 protruding from the outline of the middle frame 30 of the electronic device 100 is tilted (for example, the protruding direction of the button 10 is not parallel to the X direction). When the user holds the electronic device 100, the finger may also be scratched by the button 10 when touching the button 10.

[0053] Or, such as Figure 1BAs shown in the figure, the radius of the transition fillet 21 of the contour of the camera 20 of the electronic device 100 is too small, resulting in the fillet 21 of the camera 20 scraping the user's palm when the user touches the electronic device 100.

[0054] In summary, during the installation process of the assembled object, due to installation errors, the deviation of the first structural part of the installation structure of the assembled object is too large, not meeting the installation requirements. This causes the appearance of the assembled object to bring a bad user experience.

[0055] Currently, generally, inspectors use the method of visual observation to detect whether the installation structure of the assembled object meets the installation requirements. However, in the visual observation detection method, inspectors need to observe each electronic device one by one, resulting in low efficiency. In addition, since there is no reasonable evaluation index during visual observation, the accuracy of the detection results depends on the experience of the inspectors, resulting in inaccurate detection results for detecting the installation structure of the assembled object through visual observation.

[0056] To solve the above problems, the present application proposes a detection method for detecting whether the installation of the installation structure in the assembled object meets the requirements. Specifically, the detection device can obtain the two-dimensional contour data at the installation structure of the assembled object to be detected (hereinafter referred to as the object under test), such as the two-dimensional contour data projected by the installation structure on the projection plane, such as Figure 1B in the figure, the projected contour of the button 10 on the XZ plane), and determine the characteristic parameters of the installation structure (such as the step difference, skew angle, curvature radius of the transition fillet, assembly gap, etc.) based on the obtained two-dimensional contour data. Secondly, the detection device can determine whether the installation of the installation structure meets the requirements based on the characteristic parameters of the installation structure. For example, the detection device can determine the installation score of the installation structure based on the characteristic parameters of the installation structure, and when the installation score of the installation structure meets the detection threshold, it is determined that the installation of the installation structure of the object under test meets the requirements.

[0057] Based on the above method, the detection device can determine the installation score of the installation structure of the object under test. Therefore, it is not necessary for the staff to judge whether the installation structure of the object under test meets the installation requirements based on experience through visual observation, and the detection results are more in line with the requirements. Moreover, since it is not necessary for the staff to visually observe the object under test, the detection efficiency of the installation structure of the object under test can be improved.

[0058] In some embodiments of the present application, the projection plane is a plane perpendicular to the plane where the installation structure protrudes and parallel to one extension direction of the installation structure. In other embodiments, the projection plane can also be other planes selected by the inspector, and the setting method and position of the projection plane are not limited herein.

[0059] In some embodiments of the present application, the detection device can obtain the contour data at the installation structure of the object under inspection through a contour detection device or other devices or apparatuses that can detect the contour of the object under inspection (two-dimensional contour data or three-dimensional contour data).

[0060] In some embodiments, a plurality of objects under inspection can be installed on a detection jig so that the detection device can simultaneously obtain the contour data of the installation structures of the plurality of objects under inspection through a contour detection device. Then, the detection device can respectively detect the installations of the installation structures of the plurality of objects under inspection to improve the detection efficiency.

[0061] That is to say, when batch detecting a production line of assembled objects, a plurality of objects under inspection corresponding to the assembled objects can be detected simultaneously, thereby improving the efficiency of detecting the objects under inspection.

[0062] In some embodiments, the detection device can score the installation of the installation structure of the object under inspection through a preset evaluation model. The evaluation model can be, for example, Equation (1):

[0063] Y = AX1 + BX2 + CX3 + DX4 + E (1)

[0064] Wherein, Y is the installation score, and X1, X2, X3, and X4 are characteristic parameters of the object under inspection. In the embodiments of the present application, the object under inspection includes four characteristic parameters. In other embodiments, the object under inspection may further include more or fewer characteristic parameters. For example, it includes three characteristic parameters or five characteristic parameters. A, B, C, and D are the weights corresponding to the characteristic parameters, and E is the compensation parameter of the evaluation model. Exemplarily, in some embodiments, Wherein, e is the natural constant, a1 is the coefficient of weight A, and a2 is the exponent of weight A corresponding to e. b1 is the coefficient of weight B, and b2 is the exponent of weight B corresponding to e. c1 is the coefficient of weight C, and c2 is the exponent of weight C corresponding to e. d1 is the coefficient of weight D, and d2 is the exponent of weight D corresponding to e.

[0065] In some embodiments, A, B, C, D, and E in formula (1) can be empirical values, experimental values, or values obtained by training the evaluation model.

[0066] In some embodiments, the detection device can use a pre-trained evaluation model to determine the score for the installation of the installation structure based on the characteristic parameters of the installation structure. For example, the detection device can input the characteristic parameters (X1, X2, X3, X4) of the installation structure into the above evaluation model to obtain the installation score Y of the object under inspection.

[0067] In some embodiments, the evaluation model is trained by a first model in a detection device or in other devices (such as a server, etc.) based on training data. The training data may include, for example, feature parameter training data (such as data on the step difference, skew angle, curvature radius of the transition fillet, assembly gap, etc. of each mounting structure of the existing object under inspection, i.e., existing data such as X1, X2, X3, X4, etc.) and evaluation result training data corresponding to the feature parameter training data (existing Y data, where the Y data may be obtained, for example, through investigations by developers or user feedback). Among them, the feature parameter training data and the evaluation result training data can be used as sample data. The sample data is input into the first model to train the parameters of the first model. When the scoring result obtained by the first model based on the sample data and the parameters meets the termination condition, the numerical values of the parameters of the first model can be obtained as the weights (A, B, C, D) corresponding to each feature parameter and the corresponding compensation parameter (E) to obtain the evaluation model.

[0068] Among them, the process of determining the coefficients of the feature parameters and the compensation parameters based on the first model is, for example, to input the sample data into the first model, and then compare the score calculated by the sample data with the reference score. If the comparison result meets the termination condition, the numerical values of the parameters in the first model can be used as the coefficients corresponding to each feature parameter. If the comparison result does not meet the termination condition, the parameters in the first model need to be adjusted, and the score is calculated again based on the sample and then compared with the reference score. Until the score calculated based on the sample data meets the termination condition.

[0069] Next, taking the assembled object as an electronic device as an example, the detection system for the mounting structure of the object under inspection in the embodiments of the present application will be introduced.

[0070] For example, Figure 2A According to some embodiments of the present application, a detection system is shown.

[0071] As Figure 2A shown, the detection system includes a detection device 1000, an electronic device 100 (also referred to as the object under inspection or the object to be detected), a clamping fixture 200 (as a clamping device), and a contour detection device 300 (as a contour detection device).

[0072] Exemplarily, in the embodiments of the present application, the electronic device 100 may be, for example, a mobile phone, and the installation structure may be, for example, a button on the mobile phone. In some other embodiments, the electronic device 100 may also be a tablet computer, a notebook, a wearable device, a laptop computer, an ultra-mobile personal computer (UMPC), a netbook, a personal digital assistant (PDA), etc. The embodiments of the present application do not limit the specific type of the electronic device 100 as the object to be inspected.

[0073] Exemplarily, in some embodiments of the present application, the clamping fixture 200 is used to fix the electronic device 100 so that the contour detection device 300 can detect the electronic device 100 to obtain the contour data of the electronic device 100. In some embodiments of the present application, the clamping fixture can hold multiple electronic devices 100 at one time, so as to batch obtain the contour data of the electronic devices 100, thereby improving the detection efficiency of the installation structure of the electronic device 100.

[0074] The contour detection device 300 is used to obtain the contour data of the electronic device 100 to determine the installation score of the electronic device 100. In some embodiments of the present application, the contour detection device 300 may be, for example, any one of the following:

[0075] Laser profilometer: The laser profilometer uses a laser beam to irradiate the object to be measured, and records the contour information of the object surface through an optical system and a receiver.

[0076] Stylus profilometer: The stylus profilometer uses a stylus to contact the surface of the object to be measured, and records the position change of the stylus through an electrical signal or an optical signal, thereby obtaining the contour information of the object surface.

[0077] Optical profilometer: The optical profilometer uses an optical microscope and a charge coupled device (CCD) camera to observe and record the contour information of the surface of the object to be measured.

[0078] Coordinate measuring machine: The coordinate measuring machine obtains the contour information of the object surface by measuring the coordinate positions of points on the surface of the object to be measured in three-dimensional space.

[0079] Machine vision profilometer: The machine vision profilometer uses a camera and a light source to irradiate the object to be measured, and analyzes the captured image through image processing technology to obtain the contour information of the object surface.

[0080] In some other embodiments, the contour detection device 300 may also be any other device or equipment that can detect the contour data (two-dimensional contour data or three-dimensional contour data) of the object to be inspected, which is not limited herein.

[0081] The detection device 1000 is used to process the contour data of the electronic device 100 (or the object to be inspected), so as to determine the installation score of the installation structure of the electronic device 100, and thus determine whether the installation structure of the electronic device 100 meets the installation requirements. The detection device 1000 can include, for example, a mobile phone, a server, a tablet computer, a notebook, a wearable device, a laptop computer, an ultra-mobile personal computer (UMPC), a netbook, a personal digital assistant (PDA), etc. The type of the detection device 1000 is not limited in this application. In some other embodiments, the detection device 1000 can also be the same device as the contour detection device 300.

[0082] Next, the process of detecting the installation structure of the object to be inspected in the embodiments of this application will be introduced.

[0083] For example, Figure 2B According to some embodiments of this application, a flowchart of an embodiment for detecting the installation structure of the object to be inspected is shown.

[0084] Exemplarily, in the implementation process of this application, the execution subject of each implementation process is the detection device 1000. When introducing the following implementation processes, the implementation subjects of each process will not be repeated.

[0085] As Figure 2B shown, this implementation process includes:

[0086] S201, obtain the two-dimensional contour data of each object to be inspected.

[0087] Exemplarily, in some embodiments of this application, the object to be inspected is taken as the above-mentioned electronic device 100. For example, the staff can fix the electronic devices 100 to be detected in batches on the clamping fixture 200, and then scan the contour of the electronic device 100 through the contour detection device 300 to obtain the contour data of the electronic device 100. If the contour detection device 300 and the detection device 1000 are not the same device, the detection device 1000 can obtain the contour data of the electronic device 100 from the contour detection device 300.

[0088] Exemplarily, in some embodiments, the contour detection device 300 can directly obtain the two-dimensional contour data of the electronic device 100. Among them, in the process of obtaining the two-dimensional contour data of the electronic device 100, it is necessary to determine the two-dimensional plane (hereinafter referred to as the projection plane) for obtaining the contour projection of the installation structure of the electronic device 100. The projection plane is a plane perpendicular to the plane where the installation structure protrudes and parallel to an extension direction of the installation structure. For example, inFigure 1A In this case, the button 10 of the electronic device 100 protrudes from the YZ plane and extends in the Z direction. Then, the XZ plane is used as the projection plane of the installation structure. In some other embodiments, for example Figure 1A In this case, the button 10 protrudes from the YZ and extends in the Y direction. Then, the XY plane can also be selected as the projection direction. It can be understood that to detect the installation structure, it is necessary to obtain the two-dimensional contour data of the installation structure in at least one projection plane. In some other embodiments, the projection plane can also be other planes selected by the inspector, and the present application does not limit the projection plane.

[0089] The contour data of the electronic device 100 can be, for example, a set of point data on the contour surface of the electronic device 100 (hereinafter referred to as point cloud). Taking the two-dimensional contour data of the installation structure of the electronic device 100 as an example, Figure 3 shows the point cloud of the contour of the button 10 and part of the middle frame 30 of the electronic device 100 (for example, 01, 02, 03, 04, similar Figure 1C to the button contour 11 in), where the installation structure is the button 10. It can be seen that, Figure 3 also includes other point clouds (such as 05, 06, 07, 08), which are point clouds formed by some impurities scanned during the process of scanning the object to be inspected by the contours of other devices (such as the clamping fixture 200) or the contour detection device 300.

[0090] In some other embodiments, the contour detection device 300 can obtain the three-dimensional contour data of the electronic device 100. Corresponding to the three-dimensional contour data of the electronic device 100 collected by the contour detection device 300, the detection device 1000 can also process the three-dimensional contour data to obtain the two-dimensional contour data of the corresponding installation structure. For example, project the three-dimensional contour data onto a determined projection plane to obtain the corresponding two-dimensional contour data.

[0091] S202. Determine the characteristic parameters of the installation structure in each object to be inspected based on the two-dimensional contour data.

[0092] Exemplarily, in some embodiments of the present application, after the detection device 1000 obtains the two-dimensional contour data of the object to be inspected, it will screen and group the two-dimensional contour data, and determine the characteristic parameters of the object to be inspected according to the two-dimensional contour data of the object to be inspected. For example, group the point clouds of the installation structure part of each object to be inspected, and filter out the point clouds of other devices or impurities. And perform fitting and calculation on the point clouds of the installation structure part of the object to be inspected to determine the characteristic parameters of the object to be inspected. For example, Figure 4 shows a schematic diagram of screening, fitting, and obtaining characteristic parameters of the point cloud 03 of the object to be inspected.

[0093] For example, after screening and fitting the point cloud 03, the point cloud 03" is determined, where the point cloud 03" includes five lines such as l1, l2, l3, l4, and l5. l3 is the fitted line of the installation structure of the electronic device 100 (for example, the fitted line of the button 10 of the electronic device 100, hereinafter referred to as the prominent fitted line), and l1 and l5 are the fitted lines of the contour of the planar structure of the corresponding installation structure of the electronic device 100 (for example, the fitted line of the middle frame 30 of the electronic device 100, hereinafter referred to as the planar fitted line). The characteristic parameters may include, for example, the step differences (D1, D2) of the installation structure. In some embodiments of the present application, the step difference is the distance between the two end points of the prominent fitted line (for example, l3) and the planar fitted lines (for example, l1 and l5) respectively. For example, in some embodiments of the present application, D1 is the distance between the left end point of the l3 line and the l1 line. D2 is the distance between the right end point of the l3 line and the l5 line. Among them, l1, l3, and l5 are arranged in sequence from left to right.

[0094] Skew angle: In some embodiments of the present application, the skew angle is, for example, the angle between the prominent fitted line (for example, l3) and the planar fitted line (for example, l1 or l5). For example, in the embodiments of the present application, the skew angle is the angle between L1 and L2, or the angle between the line l3 and l5 (or l1). Since the contours of the planar structures of the corresponding installation structures are generally collinear structures, in the embodiments of the present application, only the angle between one planar fitted line and the prominent fitted line can be selected as the skew angle. In other embodiments, the installation structure of the object under inspection may also include other numbers of skew angles, such as two skew angles.

[0095] Transition fillets (G1, G2, G3, G4): In some embodiments of the present application, the transition fillet may be, for example, the radius of curvature of the high-order polynomial fitted by the end point of the prominent fitted line and at least two data points adjacent to the end point at the end point. Or the radius of curvature corresponding to the curve of the high-order polynomial fitted by the end point adjacent to the planar fitted line and the prominent fitted line and at least two data points adjacent to the end point at the end point. For example, in the embodiments of the present application, G1 is the radius of curvature of the curve of the high-order polynomial fitted by the end point where l1 and l2 intersect and at least two points at both ends of the end point at the end point. Similarly, G2 is the radius of curvature of the curve of the high-order polynomial fitted by the end point where l2 and l3 intersect and at least two points at both ends of the end point at the end point. G3 is the radius of curvature of the curve of the high-order polynomial fitted by the end point where l3 and l4 intersect and at least two points at both ends of the end point at the end point. G4 is the radius of curvature of the curve of the high-order polynomial fitted by the end point where l4 and l5 intersect and at least two points at both ends of the end point at the end point.

[0096] Assembly gaps (M1, M2): In the embodiments of the present application, the assembly gap is, for example, the distance between the protruding fitting straight line and the adjacent planar fitting straight line in the extending direction of the contour of the planar structure of the corresponding mounting structure. For example, in the implementation of the present application, M1 is the difference between the X-axis coordinate points of the right endpoint of the straight line l1 and the left endpoint of the straight line l3. M2 is the difference between the X-axis coordinate points of the right endpoint of the straight line l3 and the left endpoint of the straight line l5.

[0097] In some other embodiments, the mounting structure of the object under inspection may further include other characteristic parameters, and the embodiments of the present application do not limit the characteristic parameters of the object under inspection. The process of screening, fitting, and obtaining characteristic parameters for the point cloud is described in detail below.

[0098] S203. Determine the installation score of the mounting structure of each object under inspection based on the characteristic parameters.

[0099] Exemplarily, after the detection device 1000 determines the characteristic parameters of the object under inspection, the characteristic parameters can be input into the evaluation model. The evaluation model is shown in formula (1). Among them, X1 is the segment difference with the largest deviation from the standard segment difference, X2 is the skew angle, X3 is the transition fillet with the largest deviation from the standard transition fillet (or the radius of curvature with the largest deviation from the standard radius of curvature of the transition fillet), and X4 is the assembly gap with the largest deviation from the standard assembly gap.

[0100] In the embodiments of the present application, each type of electronic device 100 corresponds to an evaluation model, and the weights (A, B, C, D) of the characteristic parameters of different evaluation models and the corresponding compensation parameter (E) are different. That is to say, one type of electronic device 100 corresponds to an evaluation model.

[0101] Exemplarily, after the detection device 1000 inputs the characteristic parameters of the object under inspection into the evaluation model, the installation score (i.e., the Y value) of the object under inspection can be obtained through the evaluation model. That is to say, the installation score of the object under inspection is determined based on objective detection data, rather than manually determined according to experience. Therefore, the installation score of the object under inspection is more accurate.

[0102] S204. Determine whether the installation score of the object under inspection meets the detection threshold.

[0103] Exemplarily, after the detection device obtains the installation score of the object under inspection, it can determine whether the installation score of the object under inspection exceeds the detection threshold. For example, in the embodiments of the present application, the installation score is the error score of the mounting structure of the object under inspection, and the greater the error of the mounting structure, the higher the score of the object under inspection.

[0104] If it is determined that the installation score of the object under inspection exceeds the detection threshold, it can be determined that the corresponding object under inspection does not meet the installation requirements.

[0105] If it is determined that the installation score of the object under inspection does not exceed the detection threshold, it can be determined that the corresponding object under inspection does not meet the installation requirements.

[0106] For example, if the installation score of the object under inspection corresponding to the point cloud 03 is 60 points and the detection threshold is 80 points, it can be determined that the object under inspection does not exceed the detection threshold, thereby ending the detection of the object under inspection.

[0107] In some other embodiments, it can also be determined whether the installation structure of the object under inspection is abnormally installed according to whether the installation score is higher than the detection threshold. At this time, the installation score can represent the user's satisfaction with the electronic device 100 or the installation score of the electronic device 100 that meets the standards. The higher the user's satisfaction with the electronic device 100, or the more the installation structure of the electronic device 100 meets the installation standards, the higher the installation score of the electronic device 100.

[0108] In some other embodiments, the detection threshold can be, for example, the score of a certain area. For example, the installation score of the installation structure of the electronic device 100 with a score between 100 and 120 meets the installation requirements, and the installation score of the installation structure of the electronic device 100 less than 100 points or greater than 120 points does not meet the installation requirements.

[0109] S205, determine the object under inspection with an installation score that meets the detection threshold as the object under inspection that meets the installation requirements.

[0110] Exemplarily, in some embodiments of the present application, after the detection device 1000 determines that the installation score of the object under inspection exceeds the detection threshold, it can be determined that the object under inspection does not meet the installation requirements. If the detection device 1000 determines that the installation score of the object under inspection does not exceed, it will send a message indicating that the object under inspection is abnormal, and the staff can determine that the installation structure of the corresponding object under inspection does not meet the requirements according to this message.

[0111] In some other embodiments, if the installation score decreases as the installation error of the installation structure of the object under inspection increases, when the detection device 1000 determines that the installation score of the object under inspection exceeds the detection threshold, it is determined that the installation score of the installation structure of the object under inspection meets the installation requirements.

[0112] In some other embodiments, if the detection threshold is a range of scores (for example, the installation score is between 100 and 120 points), when the detection device 1000 determines that the installation score of the object under inspection reaches the score range of the detection threshold, it can be determined that the object under inspection meets the installation requirements.

[0113] In summary, the inspection device 1000 can inspect the installation structure of the object to be inspected, which can improve the inspection speed of the object to be inspected. Moreover, the installation score of the object to be inspected determined by the inspection device 1000 is more accurate, avoiding the inaccurate situation of manually judging the inspection result of the object to be inspected based on experience.

[0114] The following combines Figure 3 and Figure 4 to introduce the process of determining the characteristic parameters of the object to be inspected.

[0115] For example, Figure 5 According to some embodiments of the present application, a flowchart of an embodiment for determining characteristic parameters is shown.

[0116] Exemplarily, the characteristic parameters of the object to be inspected include step difference, skew angle, curvature radius of the transition fillet, and assembly gap. In the embodiments of the present application, the execution subject of each process can be the inspection device. The execution subject of each of the following processes is the inspection device, and the execution subject of each process will not be repeated when introducing the following processes. In other embodiments, the execution subject for determining the characteristic parameters of the object to be inspected can also be other electronic devices, such as a server, etc. The present application does not limit the execution subject for determining the characteristic parameters of the object to be inspected.

[0117] As Figure 5 shown, this process includes:

[0118] S501, divide the two-dimensional contour data of the object to be inspected to obtain the point cloud data of the installation structure.

[0119] Exemplarily, as Figure 3 shown, when inspecting the installation structure of the object to be inspected, the contour of the object to be inspected can be scanned batch by the contour detection device 300 and the corresponding clamping fixture 200, so as to obtain the contour data of the object to be inspected. If the three-dimensional contour data obtained by the contour detection device 300 is the three-dimensional contour data of the object to be inspected, it is necessary to project the three-dimensional contour data on the projection plane to obtain the two-dimensional contour data of the object to be inspected. The process of obtaining the two-dimensional contour data of the object to be inspected is detailed in the S201 process. Exemplarily, the two-dimensional contour data of the object to be inspected includes the point cloud of multiple data points. The point cloud of the two-dimensional contour is placed in the XY coordinate system, and each data point theoretically has an X-axis coordinate and a Y-axis coordinate. In the embodiments of the present application, the X-axis is, for example, the direction parallel to the extension direction of the installation structure in the projection plane.

[0120] Exemplarily, in the embodiments of the present application, taking the two-dimensional contour data of the object to be inspected collected by the contour detection device 300 as an example, during the process of the contour detection device 300 scanning the object to be inspected, the X-axis coordinates of each data point are evenly arranged. When the contour detection device 300 scans the object to be inspected, it will record the Y-axis coordinates corresponding to the X-axis, that is, generate the coordinates of the data points. However, since there are multiple objects to be inspected, although the X-axis coordinates are continuous, the Y-axis coordinates are not continuous (there are no objects to be inspected in some parts scanned by the contour detection device 300). Therefore, where there is no object to be inspected scanned, there is no data for the Y-axis coordinates corresponding to the X-axis coordinates. The part where there is no data for the Y-axis coordinates is called an interval space. During the process of dividing the two-dimensional contour data of the object to be inspected, taking the space interval as the separation point, the two-dimensional contour data of the object to be inspected is divided into multiple groups of point clouds. For example Figure 3 the two-dimensional contour data in includes the point clouds (01, 02, 03, 04) of the installation structure of the object to be inspected and other interfering point clouds (05, 06, 07, 08).

[0121] In other embodiments, the screening of the two-dimensional contour data can also be other methods, and the method of screening the two-dimensional contour data is related to the contour detection device 300 for collecting the object to be inspected.

[0122] Then, the point clouds of the installation structure of the object to be inspected are screened out from the multiple groups of point clouds. For example, the number of data points in each group of point clouds is screened. If the number of data points in the point cloud exceeds the number threshold, it can be determined that the point cloud is the point cloud of the installation structure of the object to be inspected. Among them, the number threshold can be, for example, 200. In other embodiments, the number threshold can also be other data (for example, the number threshold is 300), or range data (for example, between 200 and 300). The number threshold can be determined according to the density of the two-dimensional contour and the shape of the installation structure. The present application does not limit the data of the number threshold. In this way, 01, 02, 03, and 04 can be screened out as the point clouds of the two-dimensional contour of the installation structure of the object to be inspected.

[0123] After screening out the point clouds of the object to be inspected, the point clouds of the object to be inspected need to be further screened to obtain the point clouds of the two-dimensional contour of the installation structure of a single object to be inspected. For example, as Figure 4 shown, after screening the point cloud 03 of the object to be inspected, the point cloud 03' of the installation structure of the object to be inspected is obtained.

[0124] S502. Classify the point cloud data of the installation structure.

[0125] Exemplarily, after determining the point cloud of the installation structure of the object under inspection, it is necessary to classify the point cloud of the installation structure. For example, the point cloud data of the installation structure may include the point cloud data corresponding to the contour of the installation structure and the point cloud data corresponding to the contour of the planar structure of the installation structure. In some embodiments of the present application, taking the button 10 of the electronic device 100 as an example. The point cloud of the contour of the button 10 of the electronic device 100 includes the point cloud data of the contour of the middle frame 30 part and the point cloud data of the contour of the button 10 part. In other embodiments, the point cloud data of the contour of the button part can also be divided into the point cloud data of the horizontal structure and the point cloud data of the vertical structure.

[0126] Exemplarily, the classification process is, for example, to classify the data with the difference in the Y-axis coordinates of adjacent point cloud data of the installation structure less than the coordinate threshold into one category. Exemplarily, in the embodiments of the present application, the coordinate threshold is 0.08 mm. In other embodiments, the coordinate threshold can also be other values. The coordinate threshold can be determined according to the density of the point cloud and the shape of the installation structure. Taking the electronic device 100 as an example, classifying the point cloud data of the installation structure according to the coordinate threshold, the point cloud of the horizontal structure of the button 10 can be classified (for example, the point cloud data fitted to the straight line l3) into one category, and the point cloud of the middle frame 30 part can be divided into two categories (the middle frames 30 on the left and right of the button 10, for example, the point cloud data fitted to the straight lines l1 and l5). Then the point cloud of the vertical structure of the button 10 and the middle frame 30 will be divided into many categories, and the point cloud of the vertical structure of the button 10 and the middle frame 30 can be classified and filtered, and only the point cloud of the horizontal structure of the button 10 and the point cloud of the middle frame part are retained.

[0127] S503, perform linear fitting on the point cloud data of the same category of the installation structure.

[0128] Exemplarily, after classifying the point cloud of the installation structure, perform linear fitting on the point cloud of the same category to form a straight line corresponding to the contour of the installation structure. In some embodiments of the present application, the straight line can be fitted by the least squares method. In other embodiments, the straight line can also be fitted by other methods, and the present application does not limit the method of fitting the straight line.

[0129] Exemplarily, taking the electronic device 100 as an example, the contour of the button 10 of the electronic device 100 is divided into three categories (the horizontal structure of the button and the middle frame structures on the left and right of the button). Thus, the contour of the button 10 of the electronic device 100 is fitted into three straight lines l1, l3, and l5. The adjacent endpoints between l1 and l3 can be connected to form a straight line l2, and the endpoints between l3 and l5 can be connected to form a straight line l4. In this way, the straight lines l1 to l5 can form the contour of the button 10. For example, Figure 4 The contour 03” of the installation structure after linear fitting.

[0130] S504. Obtain the characteristic parameters of the object under inspection based on the fitted straight line of the point cloud data.

[0131] Exemplarily, after obtaining the installation structure profile 03”, the characteristic parameters of the object under inspection can be determined according to the installation structure profile 03”. For example, the characteristic parameters of the object under inspection include step difference, skew angle, curvature radius of the transition fillet, and assembly gap.

[0132] Among them, the step difference can be, for example, the distance between the two ends of the straight line l3 (i.e., the straight line of the protruding part, such as the straight line of the button horizontal structure) and the reference lines l1 and l5 (such as the straight line of the middle frame part).

[0133] For example, Figure 6 The schematic diagram of the coordinate system including the installation structure profile 03” is shown according to the embodiment of the present application. As Figure 6 shown, the endpoints at both ends of the straight line l3 are P1 = (x1, y1) and P2 = (x2, y2) respectively. Then, the distances D1 between P1 and l1 and D2 between P2 and l5 can be determined respectively through the distance formula from a point to a straight line (such as the following formula (ii)).

[0134]

[0135] Where aX + bY + c = 0 is the function of the straight line, x and y are the corresponding coordinate points, and D represents the distance between the coordinate point (x, y) and the straight line aX + bY + c = 0.

[0136] For example, P1 = (10, 6), P2 = (15, 5.5), and the function of the straight line l1 is Y = 0. Then Among them, x = 10, y = 6, a = 0, b = 1, c = 0. Among them, x = 10, y = 5.5, a = 0, b = 1, c = 0.

[0137] The skew angle can be, for example, the angle between the straight line l3 and the l4 axis. The angle between l3 and the l4 axis can be determined by formula (iii):

[0138]

[0139] Among them, θ is the angle between l3 and l1. For example, P1 = (10, 6), P2 = (15, 5.5), then x1 = 10, x2 = 15, y1 = 6, y2 = 5.5. Then Degree. Skew angle = 180 degrees - θ = 5.72 degrees.

[0140] The curvature radius of the transition fillet is the curvature radius between curves in the embodiment of the present application. Refer to Figure 4, the transitional rounded corners may include G1, G2, G3, and G4. Among them, G1 is the radius of curvature between l1 and l2, G2 is the radius of curvature between l2 and l3, G3 is the radius of curvature between l3 and l4, and G4 is the radius of curvature between l4 and l5.

[0141] Exemplarily, the calculation formula for the radius of curvature is formula (IV):

[0142]

[0143] Where G is the radius of curvature of the curve function y. is the first derivative of the curve function y with respect to x. is the second derivative of the curve function y with respect to x.

[0144] Exemplarily, when determining G1, at least three data points at the G1 position need to be obtained (for example, obtaining a point P3 at the connection of l1 and l2, and a point P4 adjacent to P3 on l1 and a point P5 adjacent to P3 on l2), and polynomial fitting is performed on these data points to generate a curve function Y1, and then the radius of curvature corresponding to the point P3 in the middle of the curve Y1 is calculated as G1. Similarly, G2, G3, and G4 are also determined in a similar manner.

[0145] For example, in some embodiments of the present application, the function of Y1 is Then, P3 = (5, 0), then Similarly, G2, G3, and G4 can be obtained.

[0146] Referring to Figure 6 , the assembly gap M1 is the distance between the X-axis coordinates of P1 and P3, and M2 is the distance between the X-axis coordinates of P2 and P6. This distance can be obtained by subtracting the X-axis coordinates of the corresponding points.

[0147] For example, if P1 = (10, 6) and P3 = (5, 0), then M1 = 10 - 5 = 5.

[0148] After obtaining the characteristic parameters of the object under inspection, the characteristic parameters can be substituted into formula (1) to determine the score of the object under inspection. In the embodiments of the present application, since one characteristic parameter includes multiple data, for example, the step difference includes D1 and D2, the transitional fillets include G1, G2, G3, and G4, and the assembly gap includes M1 and M2. When substituting into formula (1), one data is selected from each characteristic parameter. When selecting data from each characteristic parameter to substitute into formula (1), the data with the largest error needs to be selected to ensure the accuracy of the detection result of the object under inspection. For example, in the step difference, D1 is selected (D1 > D2, the larger step difference is likely to scratch the hand), in the transitional fillets, G1 is selected (the transitional fillet of G1 is the smallest, and the smaller transitional fillet is likely to scratch the hand), and in the assembly gap, M1 is selected (M1 is greater than M2, the larger assembly gap is likely to become loose and is not aesthetically pleasing) and substituted into formula (1) to obtain the detection result of the object under inspection. The detection device can determine whether the object under inspection meets the requirements according to the detection result.

[0149] It can be understood that when the above-mentioned characteristic parameters are substituted into formula (1), only the numerical part is retained. That is to say, the characteristic parameter is only a dimensionless numerical value. When each set of evaluation models selects the numerical part of the characteristic parameter, the units of the corresponding numerical values are the same. For example, in the embodiments of the present application, the units of the characteristic parameters of the step difference and the assembly gap are millimeters, the curvature radius of the transitional fillet has no dimension, and the unit of the skew angle is degrees. That is to say, when selecting the numerical part of the characteristic parameter, the units of the step difference and the assembly gap are unified as millimeters, and the unit of the skew angle is unified as degrees. When different evaluation models select the numerical part of the characteristic parameter, different units can also be selected. For example, in some other embodiments, the units of the step difference and the assembly gap are centimeters, and the unit of the skew angle is degrees.

[0150] Next, the implementation flowchart for detecting the object under inspection in the embodiments of the present application is introduced.

[0151] For example, Figure 7 According to some embodiments of the present application, an implementation flowchart for detecting an object under inspection is shown.

[0152] Exemplarily, in the embodiments of the present application, the installation score of the installation structure of the object under inspection is, for example, based on the evaluation of the user as training data. The higher the installation score, for example, during the user's use of the electronic device, the more serious the impact of the installation structure of the electronic device on the user. Next, taking the scratching impact of the installation structure on the user as an example, the process of detecting the object under inspection is introduced.

[0153] As Figure 7 shown, the detection process of the object under inspection includes:

[0154] 710, detection level.

[0155] Exemplarily, the detection layer is used to obtain the contour data of the object to be inspected. The devices required for the detection layer may include, for example:

[0156] 711, a 3D profiler;

[0157] 712, a batch detection fixture;

[0158] 713, an automated detection user interface (UI).

[0159] Among them, the 3D profiler may be, for example, the above-mentioned contour detection device 300, the batch detection fixture may be, for example, the above-mentioned clamping fixture 200, and the automated detection UI may be, for example, the UI of the above-mentioned detection device 1000.

[0160] Fix a plurality of objects to be inspected through the batch detection fixture, and then use the 3D profiler to obtain the contour data of the objects to be inspected. The 3D profiler then sends the contour data to the detection device 1000 for processing.

[0161] 720, the algorithm layer.

[0162] Exemplarily, the algorithm layer may be, for example, the layer where the detection device 1000 obtains the characteristic parameters of the installation structure corresponding to the object to be inspected according to the contour data.

[0163] The algorithm layer may include, for example:

[0164] 721, automated batch calculation;

[0165] 722, output result indicators.

[0166] Among them, the automated batch calculation is, for example, the process of the detection device 1000 screening, fitting, and determining the characteristic parameters of the contour data of a batch of objects to be inspected. The output result indicators are, for example, the characteristic parameters of the installation structure corresponding to the object to be inspected. For the process of obtaining the characteristic parameters, see Figure 5 the process of obtaining characteristic parameters in the embodiments.

[0167] 730, the comprehensive evaluation layer.

[0168] Exemplarily, the comprehensive evaluation layer is, for example, the process of inputting the characteristic parameters of the object to be inspected into formula (1) and determining the installation score of the object to be inspected based on the characteristic parameters.

[0169] The comprehensive evaluation layer may include, for example:

[0170] 731, the comprehensive quantification result of the hand-cutting experience.

[0171] Among them, the comprehensive quantitative result of the hand-scraping experience is, for example, the installation score of the object under inspection. In the embodiments of the present application, when the detection device 1000 determines the installation score of the object under inspection, it is the score of the installation structure of the object under inspection that has an impact on the user's hand-scraping. Therefore, the installation score of the object under inspection obtained by the detection device 1000 can be the comprehensive quantitative result of the hand-scraping experience of the object under inspection.

[0172] 740, abnormal feedback level.

[0173] Exemplarily, the abnormal feedback level is, for example, based on the installation score of the object under inspection, to determine whether the installation structure of the object under inspection meets the installation requirements.

[0174] The abnormal feedback level may, for example, include:

[0175] 741, determine whether it exceeds the threshold;

[0176] 742, feedback abnormal hand-scraping experience;

[0177] 743, do not feedback information.

[0178] Among them, after the detection device 1000 determines the installation score of the object under inspection, it can determine whether the installation score exceeds the threshold, and this threshold may, for example, be the above-mentioned detection threshold. Since the installation score of the object under inspection is the score for evaluating the adverse impact of the installation structure of the object under inspection on the user. That is to say, the higher the installation score of the object under inspection, the greater the adverse impact on the user. Therefore, when the detection device 1000 determines that the installation score of the object under inspection exceeds the detection threshold, 742 will be executed, and the abnormal hand-scraping experience will be feedback. That is to say, the installation of the installation structure of the object under inspection does not meet the requirements. If the detection device 1000 determines that the installation score of the object under inspection does not exceed the detection threshold, the detection device does not feedback information. That is to say, the installation of the installation structure of the object under inspection meets the installation requirements.

[0179] Through the processes of the above four levels, multiple objects under inspection can be detected at one time, improving the detection efficiency of the objects under inspection. Moreover, based on the contour data of the installation structure of the object under inspection, the detection device 1000 can determine the characteristic parameters of the object under inspection. Based on the characteristic parameters of the object under inspection, the detection device 1000 can also determine the installation score of the object under inspection, making the scoring of the object under inspection more reasonable.

[0180] Next, a clamping fixture for batch obtaining the contour data of the object under inspection will be introduced.

[0181] For example, Figure 8 According to some embodiments of the present application, a structural schematic diagram of a clamping fixture is shown.

[0182] As Figure 8As shown, the clamping fixture includes a frame body 210, a moving plate 220, a push rod 230, and a partition plate 240.

[0183] The moving plate 220 slides along the length direction of the frame body 210 (for example, Figure 8 the X direction in ). Along the X direction, at least one partition plate 240 is provided between the moving plate 220 and the first side wall 213 of the frame body 210. A cavity 242 is formed between two partition plates 240, or between the partition plate and the moving plate, or between the partition plate and the first side wall 213. The cavity 242 is used to place the object under inspection.

[0184] Along the X direction, a push rod 230 is connected to the side of the moving plate 220 opposite to the first side wall 213. The push rod 230 is used to push the moving plate 220 to move along the X direction to control the interval of the cavity 242 along the X direction, so as to clamp the object under inspection. The push rod 230 is also used to fix the moving plate 220 to keep the position of the moving plate 220 stationary to clamp and fix the object under inspection.

[0185] Exemplarily, in some embodiments of the present application, the frame body 210 includes a bottom plate extending along the XY (the Y direction can be, for example, the width direction of the frame body 210) plane, and a first side wall 213 and a second side wall 212 oppositely arranged along the X direction. The first side wall 213 and the second side wall 212 extend along the height direction of the frame body 210 (for example, the Z direction in the body 8). A slide bar 214 is connected between the first side wall 213 and the second side wall 212. The slide bar 214 extends along the X direction. The moving plate 220 and the partition plate 240 are sleeved on the slide bar 214 so that the moving plate 220 and the partition plate 240 slide on the slide bar 214 along the X direction to control the interval of the cavity 242. Among them, there are four slide bars 214. In other embodiments, other numbers of slide bars can also be set, such as two or six slide bars 214.

[0186] In some embodiments of the present application, the push rod 230 passes through the second side wall 212 and is threadedly connected to the second side wall 212. The push rod 230 is movably connected to the moving plate 220. When the push rod 230 rotates, it can move along the X direction through the thread to push the moving plate 220 to move. Thus, the purpose of adjusting the size of the cavity 242 by the moving plate 220 is achieved. When the push rod 230 does not rotate, it can fix the moving plate 220 so that the moving plate 220 presses the object under inspection, thereby clamping the object under inspection. In other embodiments, the push rod 230 can also move or fix the moving plate 220 in other ways. For example, the push rod 230 can pass through the second side wall 212 along the X direction and slide along the X direction, and can also be fixed to the second side wall 212 through a snap structure.

[0187] In some embodiments of the present application, the partition 240 is further provided with a notch 241, which can facilitate the placement of the object to be inspected and expose the installation structure of the object to be inspected, so as to facilitate the contour detection device 300 to collect the contour data of the object to be inspected.

[0188] Through the above clamping fixture 200, multiple objects to be inspected can be clamped in batches at one time. Therefore, the contour detection device 300 can collect the contour data of multiple objects to be inspected at one time, thereby improving the detection speed of the objects to be inspected.

[0189] Furthermore, an embodiment of the present application further provides a detection device 1000 for implementing the detection methods provided in the foregoing embodiments.

[0190] Exemplarily, Figure 9 According to some embodiments of the present application, a schematic structural diagram of a detection device 1000 is shown.

[0191] As Figure 9 shown, the detection device 1000 includes a processor 110, a memory 120, a communication interface 130, and a bus 140.

[0192] The processor 110 may include one or more processing units. For example, the processor 110 may include a central processing unit (CPU), a modulation and demodulation processor, a graphics processing unit (GPU), an image signal processor (ISP), a microcontroller unit (MCU), a video codec, a digital signal processor (DSP), a baseband processor, a neural-network processing unit (NPU), a field programmable gate array (FPGA), etc. In some embodiments, different processing units may be independent devices or integrated in one or more processors 110.

[0193] In some embodiments, the processor 110 may be used to execute one or more programs to implement the detection methods provided in the foregoing embodiments.

[0194] For example, the processor 110 may be used to execute instructions such as determining the characteristic parameters of the installation structure of the object to be inspected and determining the installation score of the object to be inspected in the detection device 1000.

[0195] The memory 120 may include one or more memories for storing data or program codes. For example, in some embodiments, the memory 120 may be used to store data, such as the two-dimensional contour data in various embodiments of the present application. For another example, in some embodiments, the memory 120 may be used to store instructions corresponding to the data processing methods provided in the foregoing embodiments.

[0196] In some embodiments, the memory 120 may include a hard disk drive, a solid state drive, a flash memory, an optical disc, or a magneto-optical disc.

[0197] In some embodiments, the memory 120 may include removable or non-removable or fixed media.

[0198] In some embodiments, the memory 120 may be inside or outside the detection device 1000.

[0199] The communication interface 130 is used to implement communication between the detection device 1000 and other devices (such as the contour detection device 300). In some embodiments, the communication interface 130 may include a wireless communication interface and a wired communication interface.

[0200] In some embodiments, the wireless communication interface may provide wireless communication solutions applied to the detection device 1000, including wireless local area networks (WLAN) (such as wireless fidelity (Wi-Fi) networks), Bluetooth (BT), global navigation satellite system (GNSS), frequency modulation (FM), near field communication (NFC), infrared technology (IR), etc. The wireless communication module may be one or more devices integrating at least one communication processing module.

[0201] The wired communication interface may include an Ethernet interface (such as a fiber optic interface, an RJ-45 interface, etc.), a universal serial bus (USB), a power line carrier communication (PLC) interface, a high definition multimedia interface (HDMI) interface, a digital audio interface, etc., for providing wired communication solutions applied to the detection device 1000.

[0202] The bus 140 is used to connect the processor 110, the memory 120, the communication interface 130, and other possible modules or circuits.

[0203] It should be understood that Figure 9 The structure of the detection device 1000 described above is only an example. In some other embodiments, the detection device 1000 may include more or fewer modules, which are not limited herein.

[0204] The embodiments of the present application also provide a program product. When the program product is executed on the detection device, the detection device can implement the detection methods provided in the foregoing embodiments.

[0205] The embodiments of the present application also provide a readable storage medium. One or more programs are stored in the readable storage medium. When the one or more programs are executed by the detection device, the detection device can implement the detection methods provided in the foregoing embodiments.

[0206] The embodiments of the mechanism disclosed in the present application can be implemented in hardware, software, firmware, or a combination of these implementation methods. The embodiments of the present application can be implemented as a computer program or program code executed on a programmable system, which includes at least one processor, a storage system (including volatile and non-volatile memories and / or storage elements), at least one input device, and at least one output device.

[0207] The program code can be applied to the input instructions to execute the various functions described in the present application and generate output information. The output information can be applied to one or more output devices in a known manner. For the purposes of the present application, the processing system includes any system having a processor such as, for example, a digital signal processor, a microcontroller, an application specific integrated circuit, or a microprocessor.

[0208] The program code can be implemented in a high-level procedural language or an object-oriented programming language to communicate with the processing system. When necessary, the program code can also be implemented in assembly language or machine language. In fact, the mechanism described in the present application is not limited to the scope of any specific programming language. In any case, the language can be a compiled language or an interpreted language.

[0209] In some cases, the disclosed embodiments may be implemented in hardware, firmware, software, or any combination thereof. The disclosed embodiments may also be implemented as instructions carried or stored on one or more transient or non-transient machine-readable (e.g., computer-readable) storage media, which may be read and executed by one or more processors. For example, the instructions may be distributed via a network or via other computer-readable media. Thus, machine-readable media may include any mechanism for storing or transmitting information in a form readable by a machine (e.g., a computer), including but not limited to, floppy disks, optical disks, optical discs, compact disc-read only memory (CD-ROMs), magneto-optical disks, read only memory (ROM), random-access memory (RAM), erasable programmable read only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), magnetic or optical cards, flash memory, or tangible machine-readable memories for transmitting information (e.g., carrier waves, infrared signals, digital signals, etc.) in electrical, optical, acoustic, or other forms using the Internet. Thus, machine-readable media include any type of machine-readable media suitable for storing or transmitting electronic instructions or information in a form readable by a machine (e.g., a computer).

[0210] In the drawings, some structural or method features may be shown in a particular arrangement and / or order. However, it should be understood that such a particular arrangement and / or ordering may not be required. Rather, in some embodiments, these features may be arranged in a different manner and / or order than shown in the illustrative drawings. Additionally, the inclusion of a structural or method feature in a particular figure does not imply that such a feature is required in all embodiments, and in some embodiments, these features may be omitted or may be combined with other features.

[0211] It should be noted that each unit / module mentioned in the device embodiments of the present application is a logical unit / module. Physically, a logical unit / module can be a physical unit / module, a part of a physical unit / module, or can be implemented as a combination of multiple physical units / module. The physical implementation manner of these logical units / module itself is not the most important. The combination of the functions implemented by these logical units / module is the key to solving the technical problems proposed by the present application. In addition, in order to highlight the innovative part of the present application, the above device embodiments of the present application do not introduce units / modules that are not closely related to solving the technical problems proposed by the present application, which does not mean that there are no other units / modules in the above device embodiments.

[0212] It should be noted that in the examples and descriptions of this patent, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variation thereof is intended to cover non-exclusive inclusion, such that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the phrase "comprising one" does not exclude the presence of additional identical elements in the process, method, article or device comprising the element.

Claims

1. A detection method, applied to a detection device, characterized in that, Including: After obtaining the installation component and the main body are installed, obtaining two-dimensional contour data of a first component part located outside the main body; Based on the two-dimensional contour data, determining characteristic parameters of the installation component; Based on the characteristic parameters of the installation component and the coefficients corresponding to the characteristic parameters, obtaining an installation score of the installation component; When the installation score corresponding to the installation component meets a detection threshold, determining that the installation component meets the installation requirements; Wherein, the characteristic parameters include at least one of the following parameters: the step difference of the installation component, the skew angle of the installation component, the curvature radius of the transition fillet of the installation component, and the assembly gap of the installation component.

2. The method according to claim 1, wherein The installation score of the assembly structure is obtained based on the following formula: Y = AX1 + BX2 + CX3 + DX4 + E Wherein, Y is the installation score of the installation component, X1 is the step difference of the installation component with the largest deviation from the standard step difference, X2 is the skew angle of the installation component, X3 is the curvature radius of the transition fillet of the installation component with the largest deviation from the standard transition fillet curvature radius, X4 is the assembly gap of the installation component with the largest deviation from the standard assembly gap, A is the coefficient of the step difference of the installation component, B is the coefficient of the skew angle of the installation component, C is the coefficient of the curvature radius of the transition fillet of the installation component, D is the coefficient of the assembly gap of the installation component, and E is a compensation parameter.

3. The method according to claim 2, wherein The coefficients corresponding to the characteristic parameters and the compensation parameter are obtained based on the following method: Obtaining at least one sample data, where the sample data includes the characteristic parameters and the reference scores corresponding to the characteristic parameters; Inputting the at least one sample data into a first model to obtain the calculated scores corresponding to the characteristic parameters in each of the sample data, where the parameters of the first model include: the coefficients corresponding to the characteristic parameters and the compensation parameter; Adjusting the parameters of the first model based on the calculated scores and the reference scores corresponding to each of the sample data so that the calculated scores output by the first model meet the termination condition; When the calculated scores output by the first model meet the termination condition, taking the numerical values of the parameters of the first model as the values of the coefficients corresponding to each of the characteristic parameters and the value of the compensation parameter.

4. The method according to claim 2, characterized in that The coefficients corresponding to the characteristic parameters are obtained by fitting or are empirical values.

5. The method according to claim 1, characterized in that The first component includes the part of the installation component located outside the main body and the part of the main body corresponding to the installation surface of the installation component.

6. The method according to claim 1, wherein The two-dimensional contour data is the two-dimensional coordinate data of the contour of the first component projected on the projection plane.

7. The method according to claim 1, characterized in that, The installation component further includes a second component part, and after the installation component is installed with the main body, the second component part is located inside the main body.

8. The method according to claim 1, characterized in that, The installation score corresponding to the installation component meeting the detection threshold includes any one of the following: The higher the installation score, the more the installation component meets the installation requirements, and the installation score of the installation component is greater than the detection threshold; or The lower the installation score, the more the installation component meets the installation requirements, and the installation score of the installation component is less than the detection threshold; or The installation score of the installation component is within the first threshold range.

9. A detection system, characterized in that, It includes a detection device, a contour detection device, and a clamping device; The clamping device is used to fix the object to be detected; The contour detection device is used to obtain the contour data of the first component part of the installation component of the object to be detected, and process the contour data into two-dimensional contour data; wherein, the installation component is a structure installed on the main body of the object to be detected, and the first component part is the part located outside the main body and the part of the installation surface of the main body corresponding to the installation component after the installation component is installed on the main body; The detection device is used to determine the characteristic parameters of the installation component based on the two-dimensional contour data; And based on the characteristic parameters of the installation component and the coefficients corresponding to the characteristic parameters, obtain the installation score of the installation component. When the installation score corresponding to the installation component meets the detection threshold, it is determined that the installation component meets the installation requirements; Wherein, the characteristic parameters include at least one of the following parameters: the step difference of the installation component, the skew angle of the installation component, the curvature radius of the transition fillet of the installation component, and the assembly gap of the installation component.

10. A detection device, characterized in that, The detection device includes a memory for storing instructions; At least one processor for executing the instructions to enable the detection device to implement the method according to any one of claims 1 to 8.

11. A computer-readable storage medium, characterized in that, Instructions are stored on the readable storage medium, and when the instructions are executed on a computer, the computer executes the method according to any one of claims 1 to 8.

12. A computer program product, characterized in that, When the computer program product runs on the device, the device executes the method according to any one of claims 1 to 8.

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