Power supply test system and test method
Through the combination of integrated tester and upper computer, the integration and parallelization of power supply tests are achieved, and the problem of low power supply test efficiency in the existing technology is solved, which improves test efficiency and reduces costs.
Patent Information
- Application Number
- CN202510690891.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-26
- Publication Date
- 2025-07-08
AI Technical Summary
In the prior art, the research and development and commissioning of power supplies and batch factory testing of finished products need to rely on multiple independent equipment to work together, and the operation is complex and dispersed, resulting in low testing efficiency.
It provides a power supply test system, including an integrated tester and a host computer. The integrated tester includes multiple integrated test modules, each module is equipped with multiple test submodules to perform different test functions and to conduct parallel testing through the host computer generation test instructions.
The integration and parallelization of tests are realized, the operation steps are reduced, the testing efficiency is improved, and the simultaneous testing of multiple power supplies is supported, which reduces the testing cost and human error.
Smart Images
Figure CN120275855A_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the technical field of power supplies, and particularly relates to a test system and a test method for a power supply. Background Art
[0002] A power supply is the foundation for the operation of electronic devices and systems. It is responsible for converting the input electrical energy into stable voltage and current required by the devices to ensure the normal operation of the devices. In various application fields, such as industrial control, medical equipment, communication systems, and consumer electronics products, etc., the performance of the power supply directly affects the stability and reliability of the system. Therefore, it is very important to test the power supply to identify its working state.
[0003] Currently, the research and development debugging of power supplies and the batch factory testing of finished products rely on the collaborative work of multiple independent devices. This method is complex and decentralized in operation, resulting in low test efficiency of the power supply. Summary of the Invention
[0004] This application aims to at least solve one of the technical problems existing in the prior art. For this purpose, this application provides a test system and a test method for a power supply, which can reduce the operation steps, make the test integrated, and can realize the simultaneous parallel testing of multiple power supplies, thereby improving the test efficiency.
[0005] In a first aspect, this application provides a test system for a power supply, including an integrated tester and a host computer connected to each other; The integrated tester includes a plurality of integrated test modules. Each integrated test module is connected to a corresponding power supply to be tested. Each integrated test module includes a plurality of test sub-modules, and each test sub-module is configured to execute a corresponding test function; The host computer is used to generate test instructions for the power supply to be tested and send them to the integrated tester, and instruct the test sub-modules in the integrated test module to execute the corresponding test functions to test the connected power supply to be tested.
[0006] According to an embodiment of this application, a plurality of the integrated test modules are used to connect different power supplies to be tested for parallel testing of different power supplies to be tested, or to connect different charging interfaces of the same power supply to be tested for parallel testing of different charging interfaces of the same power supply to be tested.
[0007] According to an embodiment of this application, the test sub-modules are divided into a power detection sub-module, an analog charging sub-module, and an analog load sub-module; Among them, the power detection sub-module is used to detect the output power of the power supply to be tested, and the output power includes voltage, current and power value; the analog charging sub-module is used to simulate an electrical device to apply for voltage output to the power supply to be tested to test the response ability of the power supply to be tested; the analog load sub-module is used to simulate the load operation of the power supply to be tested to test the load-carrying performance of the power supply to be tested.
[0008] According to an embodiment of the present application, the integrated tester is further used to detect the electrical parameters of the power supply to be tested and output the electrical parameters to the host computer; The host computer is used to determine the target test step of the power supply to be tested based on the electrical parameters and the protocol interaction data between the host computer and the integrated tester, and generate and send the test instruction to the integrated tester based on the target test step, instructing the test sub-module in the integrated test module to execute the corresponding test function according to the target test step; Among them, the electrical parameters include AC input voltage, current, power, frequency, PF value (the effective value of the product output power, that is, the ratio of the output power to the input power), DC voltage, current, power, ripple (VPP), no-load power consumption and product efficiency, and the target test steps include no-load step, load step, short-circuit protection, over-current protection step and aging step.
[0009] According to an embodiment of the present application, the host computer includes a display screen and a control unit connected to each other; The display screen is used to display a power supply test interface, and the power supply test interface is provided with a control area and a result display area, and the control area is used to receive a first input; The control unit is used to generate and send the test instruction to the integrated tester based on the first input, receive the test result generated by the integrated tester for testing the power supply to be tested based on the test instruction, and the result display area is used to display the test result.
[0010] According to an embodiment of the present application, the test system of the power supply further includes: An alarm component, connected to the integrated tester, is used to give an alarm prompt when the test result of testing the power supply to be tested is unqualified, to indicate that the power supply to be tested is unqualified; The alarm component includes a sound alarm component and a light alarm component. The sound alarm component is used to output an alarm prompt sound when the test result of testing the power supply to be tested is unqualified, and the light alarm component is used to output a first optical signal when the test result of testing the power supply to be tested is unqualified.
[0011] According to an embodiment of the present application, in each of the integrated test modules, a plurality of the test sub-modules are provided on the same circuit board, and electrical isolation is provided between the plurality of test sub-modules.
[0012] According to an embodiment of the present application, the test system of the power supply further includes: A test fixture, the test fixture is connected to the integrated tester, the test fixture includes a fixing component and a test wire, the fixing component is used to fix the power supply to be tested, and the integrated test module is connected to the corresponding power supply to be tested through the test wire.
[0013] In a second aspect, the present application provides a test method for a power supply, which is applied to the test system of the power supply as described in the first aspect. The test system includes an integrated tester and a host computer connected to each other. The integrated tester includes a plurality of integrated test modules. Each of the integrated test modules is connected to a corresponding power supply to be tested. Each of the integrated test modules includes a plurality of test sub-modules. Each of the test sub-modules is configured to execute a corresponding test function. The method includes: Generating a test instruction for the power supply to be tested by the host computer and sending it to the integrated tester; Responding to the test instruction through the test sub-module in the integrated test module to execute the corresponding test function, so as to test the connected power supply to be tested.
[0014] According to an embodiment of the present application, the test of the power supply to be tested includes protocol debugging, load testing, and protection testing.
[0015] The additional aspects and advantages of the present application will be partly given in the following description, partly will become obvious from the following description, or will be understood through the practice of the present application.
[0016] A test system and a test method for a power supply provided by the present application have the following beneficial effects compared with the prior art: (1) By setting a plurality of test sub-modules in the integrated test module, each test sub-module executes different test functions, and a plurality of test functions are integrated in one module. The tester does not need to switch between different devices, and the test task can be completed using one module, which can reduce the operation steps, make the test integrated, and set a plurality of integrated test modules in the integrated tester. Each integrated test module can correspond to an independent test channel to test the connected power supply to be tested. Each channel can perform independent test operations on the connected power supply to be tested simultaneously, and multi-power simultaneous parallel testing can be achieved, thereby improving the test efficiency.
[0017] (2) The host computer analyzes the electrical parameters received from the integrated tester, conducts data interaction according to the predefined communication protocol, and evaluates the performance of the power supply to be tested by using the preset algorithm model, so as to determine the target test step most suitable for the current power supply state. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] The above and / or additional aspects and advantages of the present application will become apparent and be easily understood from the description of the embodiments in conjunction with the following drawings, where: Figure 1 is one of the schematic structural diagrams of the test system for the power supply provided by the embodiment of the present application; Figure 2 is another schematic structural diagram of the test system for the power supply provided by the embodiment of the present application; Figure 3 is still another schematic structural diagram of the test system for the power supply provided by the embodiment of the present application; Figure 4 is one of the schematic flowcharts of the test method for the power supply provided by the embodiment of the present application; Figure 5 is another schematic flowchart of the test method for the power supply provided by the embodiment of the present application; Figure 6 is still another schematic flowchart of the test method for the power supply provided by the embodiment of the present application; Figure 7 is yet another schematic flowchart of the test method for the power supply provided by the embodiment of the present application.
[0019] REFERENCE MARKS: test system 100, integrated tester 110, integrated test module 111, test sub-module 111a, host computer 120, test fixture 130, server 140. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0020] The technical solutions in the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application belong to the scope of protection of the present application.
[0021] The terms "first", "second", etc. in the description and claims of this application are used to distinguish similar objects, rather than to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of this application can be implemented in an order other than those illustrated or described herein, and the objects distinguished by "first", "second", etc. are generally of the same category, and do not limit the number of objects. For example, the first object can be one or multiple. In addition, "and / or" in the description and claims means at least one of the connected objects, and the character " / ", generally indicates an "or" relationship between the associated objects before and after.
[0022] The following will combine the accompanying drawings and through specific embodiments and their application scenarios to elaborate in detail on the power supply test system 100 and the power supply test method provided by the embodiments of this application.
[0023] This application provides a power supply test system 100.
[0024] As Figure 1 shown, the power supply test system 100 includes an integrated tester 110 and a host computer 120 that are connected to each other.
[0025] Among them, the integrated tester 110 is a device that executes the test task of the power supply, and the host computer 120 is a device that controls the integrated tester 110 and analyzes the test results of the integrated tester 110.
[0026] The integrated tester 110 and the host computer 120 can be communicatively connected via RS485 according to the Modbus communication protocol.
[0027] In this embodiment, the integrated tester 110 includes a plurality of integrated test modules 111. Each integrated test module 111 is connected to a corresponding power supply to be tested. Each integrated test module 111 includes a plurality of test sub-modules 111a, and each test sub-module 111a is configured to execute a corresponding test function.
[0028] Among them, the power supply to be tested is the power supply to be tested, and the power supply can be a fast charger, an adapter, a vehicle charger, a power bank, etc. Testing the power supply to be tested can include testing the no-load power consumption of the power supply to be tested, testing the efficiency of the power supply to be tested, conducting a no-load test on the power supply to be tested, conducting a constant current (CC) load test on the power supply to be tested, conducting a constant voltage (CV) load test on the power supply to be tested, conducting an overcurrent protection test on the power supply to be tested, conducting an overload protection test on the power supply to be tested, conducting a short-circuit protection test on the power supply to be tested, testing the front and back sides of the data line of the power supply to be tested, testing the charging control line of the power supply to be tested, and conducting an aging test on the power supply to be tested.
[0029] Testing the front and back sides of the data line of the power supply to be tested is used to ensure that the power supply can work stably under various connection conditions. The Type-C interface adopts a symmetrical design, allowing users to insert it without distinguishing the front and back. However, this symmetry depends on the bidirectional compatibility of the internal pins and circuits. Testing the front and back sides is to verify whether the physical structures and electrical connections on both sides are completely symmetrical. During the production and assembly process, problems such as poor soldering, pin misalignment, and shielding layer damage may occur. Testing the front and back sides can detect unilateral faults in a timely manner (such as only the front side is available and the back side fails). Therefore, testing the front and back sides of the data line can prevent defective products from entering the market and affecting the user experience or even the brand image.
[0030] The integrated tester 110 includes a plurality of integrated test modules 111. The electrical isolation between the integrated test modules 111 reduces mutual interference. Each integrated test module 111 can have the same structure. An integrated test module 111 can be regarded as an independent test instrument. Each integrated test module 111 is connected to the corresponding power supply to be tested and can independently test the connected power supply to be tested.
[0031] Each integrated test module 111 includes a plurality of test sub-modules 111a. The test sub-module 111a is a module in the integrated test module 111 that can execute a single test function. The cooperation among the test sub-modules 111a in the integrated test module 111 can realize the testing of the connected power supply to be tested.
[0032] Each test sub-module 111a is configured to execute the corresponding test function, and the test functions executed by the test sub-modules 111a in the integrated test module 111 are different.
[0033] In this embodiment, the host computer 120 is used to generate test instructions for the power supply to be tested and send them to the integrated tester 110, instructing the test sub-module 111a in the integrated test module 111 to execute the corresponding test function to test the connected power supply to be tested.
[0034] Among them, the test instructions correspond to the integrated test module 111. When a certain integrated test module 111 is connected to the power supply to be tested, the host computer 120 can generate the test instructions corresponding to this integrated test module 111 and send the generated test instructions to this integrated test module 111. The test sub-modules 111a in the integrated test module 111 respectively execute the corresponding test functions based on the test instructions, and the power supply to be tested connected is tested according to the results of each test sub-module 111a executing the test function.
[0035] In the related art, the research and development debugging of the power supply and the batch factory testing of the finished products need to rely on multiple independent devices to work together. This method is complex and scattered in operation, resulting in low test efficiency of the power supply.
[0036] In the embodiment of the present application, by setting multiple test sub-modules 111a in the integrated test module 111, each test sub-module 111a executes different test functions, and multiple test functions are integrated in one module. The tester does not need to switch between different devices and can complete the test task using one module, which can reduce the operation steps, make the test integrated, and thus improve the test efficiency.
[0037] In the related art, usually a device can only test one power supply at the same time, and the test efficiency is low.
[0038] In the embodiment of the present application, by setting multiple integrated test modules 111 in the integrated tester 110, each integrated test module 111 can correspond to an independent test channel to test the connected power supply to be tested. Each channel can simultaneously perform independent test operations on the connected power supply to be tested, and can realize the simultaneous parallel test of multiple power supplies, thereby improving the test efficiency.
[0039] According to the power test system 100 provided by the embodiments of the present application, by setting multiple test sub-modules 111a in the integrated test module 111, each test sub-module 111a performs different test functions, and multiple test functions are integrated in one module. Testers do not need to switch between different devices and can complete the test tasks using one module, which can reduce the operation steps, make the test integrated, and set multiple integrated test modules 111 in the integrated tester 110. Each integrated test module 111 can correspond to an independent test channel to test the connected power supply to be tested. Each channel can simultaneously perform independent test operations on the connected power supply to be tested, and can achieve simultaneous parallel testing of multiple power supplies, thereby improving the test efficiency.
[0040] In some embodiments, multiple integrated test modules 111 are used to connect different power supplies to be tested for parallel testing of different power supplies to be tested, or to connect different charging interfaces of the same power supply to be tested for parallel testing of different charging interfaces of the same power supply to be tested.
[0041] In this embodiment, within the same time period, each integrated test module 111 can be connected to a corresponding power supply to be tested for parallel testing of multiple power supplies to be tested.
[0042] Within the same time period, each integrated test module 111 can be connected to a corresponding charging interface in a power supply to be tested for parallel testing of multiple charging interfaces in the power supply to be tested.
[0043] Within the same time period, it is also possible to simultaneously achieve parallel testing of multiple power supplies to be tested and parallel testing of multiple charging interfaces in the power supply to be tested.
[0044] In this embodiment, the integrated test module 111 that is not connected to the power supply to be tested can be in a standby state.
[0045] In some embodiments, the test sub-module 111a is divided into a power detection sub-module, an analog charging sub-module, and an analog load sub-module.
[0046] Among them, the power detection sub-module is used to detect the output power of the power supply to be tested, and the output power includes voltage, current, and power value; the analog charging sub-module is used to simulate an electrical device to apply for voltage output from the power supply to be tested to test the response ability of the power supply to be tested; the analog load sub-module is used to simulate the load operation of the power supply to be tested to test the load performance of the power supply to be tested.
[0047] The load performance includes the load adaptability and stability of the power supply to be tested.
[0048] In this embodiment, an integrated test module 111 may include a power detection sub-module, a simulated charging sub-module, and a simulated load sub-module. The power detection sub-module, the simulated charging sub-module, and the simulated load sub-module cooperate with each other to test the power supply to be tested.
[0049] The power detection sub-module can monitor the output power of the power supply to be tested in real time, including voltage, current, and power values. The simulated charging sub-module can simulate the situation where various electrical devices apply for voltage output from the power supply to be tested, and test the response ability of the power supply to be tested under different charging scenarios. The simulated load sub-module can simulate various load conditions that the power supply to be tested may encounter in actual use, and test the load adaptability and stability of the power supply to be tested. The three modules cooperate with each other to jointly implement the comprehensive performance test of the power supply to be tested.
[0050] In some embodiments, the integrated tester 110 is also used to detect the electrical parameters of the power supply to be tested and output the electrical parameters to the host computer 120; The host computer 120 is used to determine the target test steps of the power supply to be tested based on the electrical parameters and the protocol interaction data between the host computer 120 and the integrated tester 110, and generate and send a test instruction to the integrated tester 110 based on the target test steps, instructing the test sub-module 111a in the integrated test module 111 to execute the corresponding test function according to the target test steps; Among them, the electrical parameters include voltage, current, power, ripple, and efficiency, and the target test steps include no-load step, loaded step, over-current protection step, and aging step.
[0051] The no-load step is the working state of the test power supply without an external load connected, mainly used to check the start-up, stable operation, and no-load loss and other characteristics of the power supply.
[0052] The loaded step is to apply a predetermined load to the power supply to test its output performance, efficiency, and stability under different load conditions.
[0053] The over-current protection step is to verify whether the over-current protection mechanism of the power supply is effective. By simulating a load condition exceeding the rated current, it is ensured that the power supply can automatically cut off the output or take other protection measures under abnormal conditions.
[0054] The aging step is a long-term running test used to evaluate the reliability and life of the power supply under continuous working conditions, usually including running tests under harsh environments such as high temperature and high humidity.
[0055] In this embodiment, the integrated tester 110 can be connected with corresponding sensors to detect and obtain the electrical parameters of the power supply to be tested. The electrical parameters are used to characterize the performance and characteristics of the power supply to be tested. After detecting the electrical parameters of the power supply to be tested, the integrated tester 110 outputs the electrical parameters to the host computer 120.
[0056] In this embodiment, the protocol interaction data is the data exchange between the host computer 120 and the integrated tester 110 according to a pre-agreed communication protocol. The target test step is the specific test steps and conditions determined by the host computer 120 according to the electrical parameters and test requirements of the power supply to be tested.
[0057] In this embodiment, the host computer 120 analyzes the electrical parameters received from the integrated tester 110, conducts data interaction according to a predefined communication protocol, and evaluates the performance of the power supply to be tested by using a preset algorithm model, so as to determine the target test step most suitable for the current power supply state.
[0058] In this embodiment, the host computer 120 generates a test instruction based on the target test step. The test instruction carries information corresponding to the target test step. The host computer 120 sends the test instruction to the integrated tester 110. The corresponding integrated test module 111 can control its own test sub-module 111a to execute the corresponding test function according to the conditions and steps included in the target test step.
[0059] In some embodiments, the host computer 120 includes a display screen and a control unit connected to each other; The display screen is used to display a power supply test interface. The power supply test interface is provided with a control area and a result display area. The control area is used to receive a first input; The control unit is used to generate and send a test instruction to the integrated tester 110 based on the first input, and receive the test result generated by the integrated tester 110 testing the power supply to be tested based on the test instruction. The result display area is used to display the test result.
[0060] Wherein, the first input is the input of the user on the power supply test interface.
[0061] The power supply test interface is an interface for user interaction, including a control area for receiving the user's first input to generate a test instruction, and a result display area for presenting the test result of the power supply to be tested.
[0062] In this embodiment, the control unit identifies the user's intention based on the first input, converts the user's intention into an instruction format that the integrated tester 110 can understand to generate a test instruction, and sends the test instruction to the corresponding integrated test module 111.
[0063] The test results of the power supply to be tested are transmitted to the host computer 120 and displayed in the result display area to prompt the user.
[0064] In some embodiments, the power supply test system 100 further includes an alarm component.
[0065] The alarm component is connected to the integrated tester 110 and is used to give an alarm prompt when the test result of the power supply to be tested is unqualified, so as to indicate that the power supply to be tested is unqualified.
[0066] In this embodiment, after the integrated tester 110 completes the test of the power supply to be tested, the host computer 120 can analyze the test results according to the preset test criteria. If the test results show that the performance of the power supply to be tested is unqualified, the host computer 120 can send a signal to the alarm component through the integrated tester 110 to trigger an alarm.
[0067] In this embodiment, when the test result of the power supply to be tested is unqualified, giving an alarm prompt can promptly prompt the tester or operator, so as to take corresponding measures and improve the test efficiency.
[0068] In this embodiment, the alarm component includes a sound alarm component and a light alarm component. The sound alarm component is used to output an alarm prompt sound when the test result of the power supply to be tested is unqualified, and the light alarm component is used to output a first light signal when the test result of the power supply to be tested is unqualified.
[0069] The first light signal is a visible light signal, such as a red light flashing, which is used to attract the attention of the tester or operator visually. The sound alarm component and the light alarm component work together to remind the tester or operator through different senses, ensuring that the unqualified test results are noticed in time.
[0070] In this embodiment, the setting of the alarm component enhances the practicability and reliability of the power supply test system 100, making the test process more perfect.
[0071] The alarm component includes a sound alarm component and a light alarm component, which are used to provide an intuitive unqualified prompt according to the test results after testing the power supply to be tested. The sound alarm component can emit an alarm prompt sound when the test result is unqualified to remind the operator's attention aurally; the light alarm component can output a first light signal when the test result is unqualified, such as a flashing red light or lights of other colors, and quickly locate the problem through visual prompts. The tester can further check or process the power supply to be tested in time according to the alarm prompt, ensuring the quality of the power supply.
[0072] In some embodiments, the integrated tester 110 may be compatible with multiple power management and charging technology standards.
[0073] Among them, power management refers to the technologies and management means for controlling and monitoring power devices to ensure the stable operation of power devices, improve energy utilization efficiency, and extend the device lifespan. Power management includes the management of power adapters, battery management, energy-saving management, etc.
[0074] The charging technology standards include the following: (Quick Charge, QC) developed by Qualcomm, mainly for mobile devices such as smartphones and tablets. The QC protocol adopts a parallel shunt technology, which distributes current by identifying the voltage requirements of the device to protect the battery and shorten the charging time. Since QC2.0, Qualcomm has entered the era of high-voltage charging, supporting multiple voltage levels such as 9V, 12V, 20V, etc., including QC2.0 / 3.0 / 4+; (USB Power Delivery, USB PD) protocol is launched by the US Implementers Forum (USB-IF) in the United States and is a fast-charging protocol based on the USB Type-C interface. It uses the bidirectional communication function of the Type-C interface to achieve fast charging by negotiating voltage and current. The maximum output power of the USB-PD protocol can reach 240W, including PD2.0 / 3.0 / 3.1 (the EPR power expansion with a maximum support of 48V / 5A / 240W) and (Programmable Power Supply, PPS) programmable power standard. (Pump Express, PE) is a fast-charging technology launched by MediaTek. It combines an efficient charging management chip and an optimized charging algorithm to achieve a faster charging speed. The PE protocol can automatically identify the characteristics of the charging device during the charging process, thus providing a more intelligent and safe charging experience. Similar to the QC protocol, the PE protocol also supports multiple voltage and current combinations to meet the charging requirements of different devices, including MTK PE / PE+ 1.1 / PE+ 2.0.
[0075] In this embodiment, when the integrated tester 110 supports at least one of the above protocols, it can simulate different power management and charging scenarios when testing the power supply to be tested, ensure that it complies with the supported charging protocol specifications, and thus verify whether the performance of the power supply to be tested meets the standards under actual use conditions, and comprehensively evaluate the compatibility and performance of the power supply to be tested.
[0076] In some embodiments, multiple test sub-modules 111a in each integrated test module 111 are provided on the same circuit board, and the multiple test sub-modules 111a are electrically isolated from each other.
[0077] In this embodiment, multiple test sub-modules 111a in each integrated test module 111 are arranged on the same circuit board, and electrical isolation is achieved between the test sub-modules 111a, which can reduce the electrical interference between the test sub-modules 111a while improving the integration degree of the integrated test module 111, thereby improving the accuracy and reliability of the test.
[0078] In some embodiments, as Figure 2 shown, the test system 100 of the power supply further includes a test fixture 130.
[0079] The test fixture 130 is connected to the integrated tester 110. The test fixture 130 includes a fixing component and test wires. The fixing component is used to fix the power supply to be tested, and the integrated test module 111 is connected to the corresponding power supply to be tested through the test wires.
[0080] Among them, the test fixture 130 is a device that can fix the power supply to be tested or provide a specific test environment so as to be able to perform a series of predetermined test processes efficiently and accurately.
[0081] In this embodiment, connecting the test fixture 130 to the integrated tester 110 can achieve stable and reliable testing of the power supply to be tested.
[0082] The test fixture 130 includes a fixing component and test wires. The fixing component is used to fix the power supply to be tested to ensure the stable position of the power supply to be tested during the test and prevent the test results from being affected by movement or vibration.
[0083] The integrated test module 111 is connected to the corresponding power supply to be tested through the test wires, so that the test signal can be accurately transmitted to the power supply to be tested and the feedback signal from the power supply to be tested can be received, thereby completing the testing of various performance indicators.
[0084] The test system 100 of the power supply provided by the embodiment of the present application is applied to the laboratory debugging and verification of power supply products and the large-scale factory testing of production lines.
[0085] In the related art, the research and development debugging of the power supply and the batch factory testing of the finished products rely on the collaborative work of multiple independent devices. This method is complex and scattered in operation. The switching of multiple devices results in a long test process and difficult operation, making the test efficiency of the power supply low. The single professional device is expensive due to its many functions, but many functions are not used, resulting in waste and high test costs. In addition, it is difficult for production line workers to master the operation of professional instruments. Moreover, manual recording is prone to errors and it is difficult to standardize large-scale testing.
[0086] In the embodiments of the present application, by setting multiple test sub-modules 111a in the integrated test module 111, each test sub-module 111a performs different test functions. Multiple test functions are integrated in one module, and testers do not need to switch between different devices. They can complete the test tasks using one module, which can reduce the operation steps, make the test integrated. Moreover, multiple integrated test modules 111 are set in the integrated tester 110. Each integrated test module 111 can correspond to an independent test channel to test the power supply to be tested connected thereto. Each channel can simultaneously perform independent test operations on the power supply to be tested connected thereto, and can realize the simultaneous parallel test of multiple power supplies, thereby improving the test efficiency. The corresponding test sub-modules 111a can be set in the integrated test module 111 according to the test requirements, reducing function waste and cost. In addition, the interactive interface replaces complex buttons, and the technical management touches the operation to set the test process to achieve a minimalist interaction. The production line workers only need to cooperate with the test fixture 130 to place the power supply to be tested to realize the test of the power supply to be tested, and distinguish whether the power supply to be tested is qualified according to the prompt of the alarm component, without reading data. Moreover, multiple test sub-modules 111a are integrated in the integrated test module 111 to cooperate with the test of the power supply to be tested, and manual recording is not required, and standardized large-batch testing can be realized.
[0087] In this embodiment, the power detection sub-module in the integrated test module 111 can be an alternating current (AC) power meter, and the analog charging sub-module can be a fast charging protocol spoofing module and an analog load sub-module.
[0088] In this embodiment, the integrated tester 110 can include an expansion interface, that is, a reserved communication and result output interface, and supports networking access to a large-scale automatic test equipment (ATE).
[0089] The power test system 100 provided by the embodiments of the present application can improve the efficiency of the entire process of testing the power supply to be tested. The power test system 100 can be divided into a research and development end and a production end.
[0090] Among them, laboratory personnel can obtain the electrical parameters and protocol interaction data of the power supply to be tested in real time through the application program (APP) at the research and development end, and the debugging efficiency is improved. There are two modes in the APP application program, namely the research and development mode and the production mode. The research and development mode is mainly used for product debugging in the research and development stage, and the production mode is used for batch testing on the production line. It is determined whether the product is qualified according to the obtained electrical data and the set standard values.
[0091] At the production end, the test steps are automatically executed without complex operations, shortening the test cycle and supporting the daily production capacity requirement of tens of thousands.
[0092] The test system 100 of the power supply provided by the embodiment of the present application realizes cost reduction, that is, reduces equipment procurement and training expenditures, through hardware integration, convenient operation, and cloud management; improves efficiency, that is, a semi-automatic standardized test process to eliminate human errors; and is scalable, that is, provides high-cost-effective modules for ATE to assist in full automation upgrades.
[0093] The test system 100 of the power supply provided by the embodiment of the present application forms an integrated semi-automatic test system 100 through self-designed multi-modules, abandonment of redundant functions, high integration, and self-developed test software, solving the problems of high test costs and low production efficiency caused by the large number of devices required for current power product testing, troublesome wiring, and inconvenient operation.
[0094] As Figure 2 shown, the test system 100 of the power supply may include a server 140, an industrial control computer, i.e., a host computer 120, a power supply comprehensive tester, i.e., an integrated tester 110, and a test fixture 130.
[0095] By self-designing an AC power meter module, a fast charging protocol module, and an electronic load module, and combining a microcontroller unit (MCU) to collect data from each module and control the actions of each module, an integrated tester 110 is assembled. The software-side host computer 120 is responsible for sending instructions to the integrated tester 110, receiving and displaying data, judging whether the power supply to be tested is qualified according to the data and the set step rules, setting the power supply to be tested and step data, and sending them to the server 140 for cloud storage.
[0096] As Figure 3 shown, the control software of the host computer 120 may include an authorization and authentication module, a product management module, a step setting module, a R & D test module, a production line test module, and a system setting module.
[0097] Among them, the authorization and authentication module is used for online authorization and authentication, and un-authorized devices cannot use the system. The product management module is used for technical or management personnel to manage product names and parameter settings. The step setting module is used to set corresponding test steps according to the electrical parameters such as the protocol, voltage, current, and power of different power supplies to be tested, supports multiple test steps and free sorting. The R & D test module is used to display the electrical data of the power supply to be tested in real time, supports protocol triggering and CC / CV load testing. The production line test module is used for multi-channel trigger testing, automatically running test steps, and judging the test results of the power supply to be tested according to the pre-stored step test data. The system setting module is used for system information setting and upgrade.
[0098] As Figure 3As shown, the microcontroller unit of the integrated tester 110 may include a communication module, a data acquisition module, a fast charging protocol module, an electronic load module, a system protection module, and a firmware upgrade module.
[0099] Among them, the communication module receives commands from the host computer 120 and replies with data according to the Modbus protocol via RS485. The data acquisition module is used to collect data such as AC / DC voltage, current, power, and temperature through various sensor integrated circuits (ICs). The fast charging protocol module is used for the fast charging spoofing module to be responsible for simulating an electrical device to apply for voltage output from the power supply according to the commands of the host computer 120. The PID control module is used to control the electronic load to simulate the load test of the electrical device. The system protection module is used to protect the system security against reverse connection, overvoltage, overcurrent, overheating, short circuit, etc. The firmware upgrade module is used for the host computer 120 to pull the cloud firmware and send it to the MCU to complete the online upgrade, ensuring function update and repair.
[0100] The embodiment of the present application also provides a method for testing a power supply.
[0101] The testing method is executed based on the above-mentioned power supply testing system 100. The testing system 100 includes an integrated tester 110 and a host computer 120 connected to each other. The integrated tester 110 includes a plurality of integrated test modules 111. Each integrated test module 111 is connected to a corresponding power supply to be tested. Each integrated test module 111 includes a plurality of test sub-modules 111a, and each test sub-module 111a is configured to execute a corresponding test function.
[0102] As Figure 4 shown, the method for testing the power supply includes: step 410 and step 420.
[0103] Step 410: Generate a test command for the power supply to be tested by the host computer 120 and send it to the integrated tester 110.
[0104] Step 420: Execute the corresponding test function in the test sub-module 111a of the integrated test module 111 in response to the test command to test the connected power supply to be tested.
[0105] According to the power supply testing method provided by the embodiments of the present application, by setting multiple test sub-modules 111a in the integrated test module 111, each test sub-module 111a performs different test functions, and multiple test functions are integrated into one module. Testers do not need to switch between different devices, and can complete the test tasks using one module, which can reduce the operation steps, make the test integrated, and set multiple integrated test modules 111 in the integrated tester 110. Each integrated test module 111 can correspond to an independent test channel to test the connected power supply to be tested. Each channel can simultaneously perform independent test operations on the connected power supply to be tested, and can realize the simultaneous parallel testing of multiple power supplies, thereby improving the test efficiency.
[0106] In some embodiments, the testing of the power supply to be tested includes protocol debugging, load testing, and protection testing.
[0107] As Figure 5 shown, for the debugging mode process, after connecting the sample power supply (power supply to be tested), protocol debugging, load testing, and protection testing are sequentially performed, and the production parameters are locked after the test passes.
[0108] Among them, the production parameters are the technical indicators and performance standards involved in the production process of the power supply, including but not limited to electrical characteristics such as output voltage, output current, power factor, and efficiency, as well as protocol-related parameters such as the handshake process of the fast charging protocol and the voltage and current adjustment strategy.
[0109] In the load testing and protection testing, the PID algorithm is used to control the current size to simulate the power consumption of the load to test the power supply. The protection testing is essentially also tested through the load module. If the current is too large due to problems such as short circuit, the power supply should turn off the output to prevent burning the user product.
[0110] The debugging mode is mainly used by R & D personnel. After R & D personnel design a product and get a sample for testing, if there are problems such as fluctuations in the load testing or it does not meet the design requirements, they need to modify the schematic diagram, re-fabricate the sample, and test it again until it is stable and meets the design requirements. Then the schematic diagram of the stable version can be locked, archived, and delivered for production. The test system 100 can implement this test function on one interface.
[0111] As Figure 6 shown, for the production line mode process, after the technician logs in to the system, they add a product model, import debugging parameters, set test steps, and save them to the cloud template. Then the production line workers connect the equipment, and the integrated tester 110 automatically executes the test step protocol handshake verification, the test step load stability test, and the test step protection function trigger. When all tests pass, the green light comes on and there is a prompt sound. Otherwise, the red light comes on and there is an alarm sound, and the results are archived.
[0112] Regarding the production line mode for batch factory testing of the production line, the production line tester places the power supply to be tested on the test fixture 130 and presses the switch to start the automatic test process. After the test process is completed, there will be a result prompt. The unqualified products are taken out and the next batch of tests is continued.
[0113] As Figure 7 shown, for the coordination process between the host computer 120 and the integrated tester 110, the power supply product to be tested is connected to the integrated tester 110. The host computer 120 detects the voltage of the voltage bus (VBUS) of the power supply to be tested, generates and sends a test instruction carrying the target test step. The integrated tester 110 parses the test instruction and executes the actions corresponding to the target test step, respectively performing protocol handshakes to send process data object (PDO) requests, performing load tests to adjust the electronic load, performing protection tests to trigger protection signals, collecting real-time data, transmitting and parsing the data, determining whether the power supply to be tested is qualified, recording PASS to indicate passing if it meets the standard, otherwise recording FALL to indicate exceeding the tolerance, and generating a test report to upload to the cloud server 140.
[0114] The embodiments of the present application have been described above in conjunction with the accompanying drawings. However, the present application is not limited to the above specific embodiments. The above specific embodiments are merely illustrative and not restrictive. Under the inspiration of the present application, those of ordinary skill in the art can also make many forms without departing from the purpose of the present application and the scope protected by the claims, and all of them belong to the protection scope of the present application.
[0115] In the description of this specification, the description with reference to terms such as "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.
[0116] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and purposes of the present application. The scope of the present application is defined by the claims and their equivalents.
Claims
1. A test system for a power supply, characterized in that, It includes an integrated tester and a host computer that are connected to each other; The integrated tester includes a plurality of integrated test modules. Each integrated test module is connected to a corresponding power supply to be tested. Each integrated test module includes a plurality of test sub-modules. Each test sub-module is configured to execute a corresponding test function. Among them, the instrument itself has functions such as AC input short-circuit protection, reverse connection protection, overvoltage protection, overcurrent protection, over-power protection, and over-temperature protection for the product to be tested; The host computer is used to generate test instructions for the power supply to be tested and send them to the integrated tester, instructing the test sub-modules in the integrated test module to execute the corresponding test functions to test the connected power supply to be tested.
2. The test system of the power supply according to claim 1, characterized in that A plurality of the integrated test modules are used to connect different power supplies to be tested to perform parallel tests on different power supplies to be tested, or connect different charging interfaces of the same power supply to be tested to perform parallel tests on different charging interfaces of the same power supply to be tested.
3. The test system for a power supply according to claim 1, characterized in that, The test sub-modules are divided into a power detection sub-module, a simulated charging sub-module, and a simulated load sub-module; Among them, the power detection sub-module is used to detect the output power of the power supply to be tested. The output power includes voltage, current, and power value; the simulated charging sub-module is used to simulate an electrical device to apply for voltage output from the power supply to be tested to test the response ability of the power supply to be tested; the simulated load sub-module is used to simulate the load operation of the power supply to be tested to test the load-carrying performance of the power supply to be tested.
4. The test system for a power supply according to claim 1, characterized in that, The integrated tester is also used to detect the electrical parameters of the power supply to be tested and output the electrical parameters to the host computer; The host computer is used to determine the target test step of the power supply to be tested based on the electrical parameters and the protocol interaction data between the host computer and the integrated tester, and based on the target test step, generate and send the test instruction to the integrated tester, instructing the test sub-modules in the integrated test module to execute the corresponding test functions according to the target test step; Among them, the electrical parameters include AC input voltage, current, power, frequency, PF value, DC voltage, current, power, ripple (VPP), no-load power consumption, and product efficiency, etc., Among them, the target test steps include no-load step, load step, short-circuit protection, overcurrent protection step, aging step, etc.
5. The test system for a power supply according to any one of claims 1-4, characterized in that, The host computer includes a display screen and a control unit that are connected to each other; The display screen is used to display a power supply test interface. The power supply test interface is provided with a control area and a result display area. The control area is used to receive a first input; The control unit is used to generate and send the test instruction to the integrated tester based on the first input, receive the test result generated by the integrated tester for testing the power supply to be tested based on the test instruction, and the result display area is used to display the test result.
6. The test system for the power supply according to any one of claims 1-4, characterized in that, It also includes: An alarm component, connected to the integrated tester, is configured to give an alarm prompt to indicate that the power supply under test is unqualified when the test result of testing the power supply under test is unqualified; The alarm component includes a sound alarm component and a light alarm component. The sound alarm component is configured to output an alarm prompt sound when the test result of testing the power supply under test is unqualified, and the light alarm component is configured to output a first optical signal when the test result of testing the power supply under test is unqualified.
7. The test system for a power supply according to any one of claims 1-4, characterized in that, In each of the integrated test modules, multiple test sub-modules are arranged on the same circuit board, and electrical isolation is provided between the multiple test sub-modules.
8. The test system for a power supply according to any one of claims 1-4, characterized in that, It further includes: A test fixture, which is connected to the integrated tester. The test fixture includes a fixing component and a test wire. The fixing component is used to fix the power supply under test, and the integrated test module is connected to the corresponding power supply under test through the test wire.
9. A test method for a power supply, characterized in that, A test system for a power supply according to any one of claims 1-8. The test system includes an integrated tester and a host computer connected to each other. The integrated tester includes multiple integrated test modules. Each integrated test module is connected to a corresponding power supply under test. Each integrated test module includes multiple test sub-modules. Each test sub-module is configured to perform a corresponding test function. The method includes: Generating a test instruction for the power supply under test by the host computer and sending it to the integrated tester; Executing the corresponding test function in response to the test instruction by the test sub-module in the integrated test module to test the connected power supply under test.
10. The test method for the power supply according to claim 9, characterized in that, The test of the power supply under test includes protocol debugging, load testing, and protection testing.