Simulation test method, device and system for integrated circuit, and storage medium

Abstract

The invention provides a simulation test method, device and system for an integrated circuit, and a storage medium, the method comprises the following steps: obtaining a test parameter table of the integrated circuit, and generating an experiment design table according to the test parameter table, the experiment design table comprises a plurality of test experiments, and each group of test experiments stipulate the values of all test parameters; a netlist template of the integrated circuit is obtained, the netlist template comprises variable parameters, and the variable parameters are in one-to-one correspondence with the test parameters; assigning corresponding variable parameters in the netlist template according to the values of all test parameters in each group of test experiments to obtain a netlist corresponding to the test experiments; and obtaining a simulation result of the integrated circuit under the netlist, and recording the simulation result as a simulation result of the test experiment. The test experiment and the corresponding netlist can be automatically generated based on the test parameter list and the netlist template, the simulation result is automatically collected after simulation is finished, the automation degree of the test process is improved, and the simulation test efficiency of the integrated circuit is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of EDA software, and particularly to a simulation test method, device, system, and storage medium for integrated circuits. Background Art

[0002] The integrated circuit simulation program (SPICE, Simulation Program with Integrated Circuit Emphasis) is a general software tool for simulating and analyzing the behavior of electronic circuits, and is widely used in fields such as circuit design, verification, and optimization.

[0003] Currently, the following problems exist in the SPICE simulation of integrated circuits: It is necessary to manually modify the values of the parameters to be tested in the SPICE netlist. Each time a test is performed, it needs to be manually modified once to generate the corresponding netlist file. For example, if 100 experiments are done, it needs to be modified 100 times. The simulation results (such as the eye height and eye width of the eye diagram) need to be manually screened and recorded from the SPICE output file, or relevant software is called for calculation, and then the results are manually entered into a table. This process is prone to missing key data or input errors. The entire process requires a large amount of manual operation, and the degree of automation is low. It is very easy for non-professional or unfamiliar personnel with the operation process to make mistakes. Summary of the Invention

[0004] One of the purposes of the present invention is to provide a simulation test method, device, system, and storage medium for integrated circuits for at least some of the problems existing in the prior art.

[0005] The technical solution provided by the present invention is as follows: A simulation test method for an integrated circuit includes: Obtaining a test parameter table of the integrated circuit, where the test parameter table includes all test parameters and their values for simulation testing; Generating an experimental design table for the integrated circuit according to the test parameter table, where the experimental design table includes several test experiments, and each group of test experiments specifies the values of all test parameters; Obtaining a netlist template of the integrated circuit, where the netlist template contains variable parameters, and the variable parameters correspond one-to-one with the test parameters; Assigning values to the variable parameters of the netlist template according to the values of all test parameters in each group of test experiments to obtain a netlist corresponding to the test experiment; Obtaining the simulation result of the integrated circuit under the netlist, which is recorded as the simulation result of the test experiment.

[0006] In some embodiments, a test report of the integrated circuit is generated according to all test experiments and their simulation results.

[0007] The present invention also provides a simulation test method for an integrated circuit, including: Obtain a test parameter table of the integrated circuit, where the test parameter table includes several primary parameters and their attributes, the secondary parameters included in the primary parameters, and the values for simulation testing corresponding to the attributes of the primary parameters; Generate an experimental design table for the integrated circuit according to the primary parameters and their attributes in the test parameter table, where the experimental design table includes several test experiments, and each group of test experiments specifies the attributes of all primary parameters; Obtain a netlist template of the integrated circuit, where the netlist template contains variable parameters, and the variable parameters correspond one-to-one with the secondary parameters; Determine the values of all secondary parameters corresponding to a test experiment according to the attributes of all primary parameters in each group of test experiments; Assign values to the variable parameters of the netlist template according to the values of all secondary parameters corresponding to the test experiment to obtain a netlist corresponding to the test experiment; Obtain the simulation result of the integrated circuit under the netlist, which is recorded as the simulation result of the test experiment.

[0008] In some embodiments, generate a test report for the integrated circuit according to all test experiments and their simulation results.

[0009] In some embodiments, obtaining the test parameter table of the integrated circuit includes: Obtain the primary parameters and their attributes, and the secondary parameters and their values through a graphical user interface.

[0010] In some embodiments, generating the experimental design table for the integrated circuit according to the primary parameters and their attributes in the test parameter table includes: Use the primary parameters as the factors of the experimental design, and according to the possible values of the factors, take the combination of all factor values randomly generated at one time as a group of test experiments.

[0011] In some embodiments, determining the values of all secondary parameters corresponding to a test experiment according to the attributes of all primary parameters in each group of test experiments includes: Obtain the attributes of the primary parameters of the test experiment; According to the test parameter table, determine the values of the secondary parameters associated with the attributes of the primary parameters; Assigning values to the variable parameters of the netlist template according to the values of all secondary parameters corresponding to the test experiment includes: By identifying the specific symbols used to mark the variable parameters in the netlist template, find the variable parameters of the netlist template; Obtain the values of the secondary parameters corresponding to the variable parameters from the values of all secondary parameters corresponding to the test experiment; Assign a value to the variable parameter with the value of the secondary parameter corresponding to the variable parameter.

[0012] The present invention also provides an integrated circuit simulation test device, comprising: a memory for storing a computer program; a processor for implementing the integrated circuit simulation test method according to any one of the preceding items when running the computer program.

[0013] The present invention also provides an integrated circuit simulation test system, comprising the integrated circuit simulation test device described in the foregoing embodiment.

[0014] The present invention also provides a computer storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the integrated circuit simulation test method according to any one of the preceding items are implemented.

[0015] Through the integrated circuit simulation test method, device, system, and storage medium provided by the present invention, at least the following beneficial effects can be brought: 1. The present invention automatically designs a test experiment according to a test parameter table, and then automatically generates a netlist corresponding to the test experiment in combination with a netlist template, and automatically collects simulation results after the simulation ends, improving the automation degree of the test process, thereby improving the integrated circuit simulation test efficiency.

[0016] 2. The present invention simplifies the design of the test experiment by classifying the parameters to be tested in the integrated circuit, taking the corresponding class as a primary parameter, and then taking the primary parameter as a factor of the test experiment, reasonably reducing the number of test experiments, thereby reducing the number of simulations and improving the simulation test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The following will further illustrate the above characteristics, technical features, advantages and implementation manners of an integrated circuit simulation test method, device, system, and storage medium in a clear and understandable manner in conjunction with the drawings and preferred embodiments.

[0018] Figure 1 is a flowchart of an embodiment of the integrated circuit simulation test method of the present invention; Figure 2 is a flowchart of another embodiment of the integrated circuit simulation test method of the present invention; Figure 3 is a schematic structural diagram of an embodiment of the integrated circuit simulation test device of the present invention; Figure 4 is a schematic structural diagram of an embodiment of the integrated circuit simulation test system of the present invention; Figure 5 is an example of a parameter definition table of another embodiment of the integrated circuit simulation test method of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0019] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will describe the specific embodiments of the present invention with reference to the accompanying drawings. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings, and other embodiments can be obtained.

[0020] To simplify the drawings, only the parts related to the present invention are schematically shown in each drawing, and they do not represent the actual structure of the product. In addition, to simplify the drawings for easy understanding, in some drawings, for components with the same structure or function, only one of them is schematically drawn, or only one of them is marked. In this document, "one" not only means "only this one", but also can mean "more than one" situation.

[0021] An embodiment of the present invention, as Figure 1 shown, a simulation test method for an integrated circuit, comprising: Step S100 obtains a test parameter table of the integrated circuit, and the test parameter table includes all test parameters and their values for simulation testing.

[0022] Step S200 generates an experimental design table of the integrated circuit according to the test parameters and their values in the test parameter table. The experimental design table includes several test experiments, and each group of test experiments specifies the values of all test parameters.

[0023] Step S300 obtains a netlist template of the integrated circuit. The netlist template contains variable parameters, and the variable parameters correspond one-to-one with the test parameters.

[0024] Step S400 assigns values to the corresponding variable parameters in the netlist template according to the values of all test parameters in each group of test experiments to obtain a netlist corresponding to the test experiment.

[0025] Step S500 obtains the simulation result of the integrated circuit under the netlist, which is recorded as the simulation result of the test experiment.

[0026] Step S600 generates a test report of the integrated circuit according to all test experiments and their simulation results.

[0027] Specifically, for simulating and testing an integrated circuit, first, it is necessary to determine the test parameters and their values required for simulation testing. For example, the resistance value of a certain resistor has a great influence on the function of the integrated circuit, so the resistance value of the resistor is used as a test parameter; since only the influence of its maximum value and minimum value on the integrated circuit needs to be observed, only two values (the maximum value and the minimum value) can be taken.

[0028] The test parameters and their values can be determined by engineers according to the test requirements or purposes. There may be multiple test parameters, and there may also be multiple values for the test parameters. For example, some test parameters need to test the maximum and minimum values, and some test parameters need to test the maximum value, minimum value, typical value, etc.

[0029] All the test parameters and their values form a test parameter table. The test parameter table of the integrated circuit can be obtained in various ways. For example, the test parameter table can be obtained by inputting a format file, or all the test parameters and their values can be input through a graphical user interface.

[0030] Design the test experiment according to the test parameters and their values. Take the test parameters as the factors of the experimental design. The combination of the primary values of all factors constitutes a test experiment. The designed several test experiments form an experimental design table. For example, the test parameter table includes 4 test parameters, and each test parameter has 3 values (maximum value, minimum value, and typical value). Corresponding to the experimental design, there are 4 factors, and each factor has 3 values. Using the full factorial experiment method, 81 (=3*3*3*3) combinations can be obtained. Each combination corresponds to a group of test experiments, and 81 groups of test experiments constitute the experimental design table. In actual situations, there are often many test parameters. Using the full factorial experiment method will result in too many combinations. The number of experiments can be determined first, and then the corresponding combinations can be selected from them according to the number of experiments. Other methods can also be used to combine the factors. For example, the combination of the values of all factors generated randomly once is used as a group of test experiments, and this operation is repeated until the test experiments that meet the number of experiments are obtained.

[0031] A netlist template is a template file that defines the component attributes and connection relationships in the netlist in a parameterized way. Some of the parameters are set as variable. By modifying the values of these variable parameters, different circuit configurations can be quickly generated without manually modifying every detail in the netlist. The variable parameters of the netlist template can be marked with specific symbols.

[0032] Obtain the netlist template of the integrated circuit. The variable parameters of the netlist template correspond one by one to the test parameters. Obtain the value of each test parameter according to the test experiment, and assign this value to the corresponding variable parameter in the netlist template. When all the variable parameters of the netlist template are assigned values, the netlist corresponding to the test experiment is obtained. Traverse all the test experiments in the experimental design table and repeat the above process to obtain the netlists of all test experiments.

[0033] Simulate the integrated circuit according to the netlists of all test experiments respectively, and the simulation results of each test experiment can be obtained. In one embodiment, the simulation results are the eye height and / or eye width of the eye diagram.

[0034] Collecting all the test experiments and their simulation results together can obtain the test report of the integrated circuit.

[0035] In this embodiment, the test experiments are automatically designed according to the test parameter table, and then the netlist corresponding to the test experiment is automatically generated in combination with the netlist template. After the simulation is completed, the simulation results are automatically collected, which improves the automation degree of the test process and thus improves the simulation test efficiency of the integrated circuit.

[0036] One embodiment of the present invention is as Figure 2 shown. A simulation test method for an integrated circuit includes: Step S110: Obtain the test parameter table of the integrated circuit. The test parameter table includes several first-level parameters and their attributes. The second-level parameters included in the first-level parameters and the values for simulation testing corresponding to the attributes of the first-level parameters.

[0037] Step S210: Generate an experimental design table according to the first-level parameters and their attributes in the test parameter table. The experimental design table includes several test experiments, and each group of test experiments specifies the attributes of all the first-level parameters.

[0038] Step S310: Obtain the netlist template of the integrated circuit. The netlist template contains variable parameters, and the variable parameters correspond one-to-one with the second-level parameters.

[0039] Step S410: Determine the values of all the second-level parameters corresponding to the test experiment according to the attributes of all the first-level parameters in each group of test experiments.

[0040] Step S420: Assign values to the corresponding variable parameters in the netlist template according to the values of the second-level parameters corresponding to the test experiment to obtain the netlist corresponding to the test experiment.

[0041] Step S510: Obtain the simulation results of the integrated circuit under the netlist, which are recorded as the simulation results of the test experiment.

[0042] Step S610: Generate a test report of the integrated circuit according to all the test experiments and their simulation results.

[0043] The basic steps of this embodiment are the same as those of the foregoing embodiment. Therefore, the differences are mainly elaborated here, and the same parts can be referred to the description of the foregoing embodiment.

[0044] In view of the fact that there are many parameters to be tested (i.e., test parameters) for the integrated circuit in actual situations, and the number of test experiments constructed according to the parameters to be tested is also very large. In order to effectively reduce the number of test experiments, we classify the parameters to be tested. The parameters to be tested are used as the second-level parameters, the class to which the second-level parameters belong is used as the first-level parameter, the second-level parameters included in the first-level parameter are specific objects under the same class, and attributes are defined in the class. For each attribute, the specific object has a specific value.

[0045] For example, a device has two parameters to be tested: length and width, as shown in Table 1. The device size to be tested is 10 5,12 8 Two situations, see which one is better. From the test scenario, it can be seen that there is a correlation between length length and width width. When length is the minimum value, width also takes the minimum value; when length is the maximum value, width also takes the maximum value, which shows that the value behavior of these two parameters in the test scenario is consistent. Therefore, length length and width width can be regarded as secondary parameters and attributed to the primary parameter size. Size has two attributes (minimum value and maximum value). In the design of the test experiment, it is completely possible to design according to the attributes of the primary parameter. For example, in the above example, the test experiment can be designed according to the attributes of the primary parameter size. One is the case where size takes the minimum value, and the other is the case where size takes the maximum value.

[0046] Table 1

[0047] There may be only one or more secondary parameters under a primary parameter. Compared with using secondary parameters as factors in designing test experiments, using primary parameters as factors in test experiments can reduce the number of factors in test experiments, thereby reducing the complexity of designing test experiments and the number of test experiments, which is equivalent to reducing the number of simulation tests.

[0048] When multiple parameters to be tested in an integrated circuit have the same value behavior in constructing a test scenario, these parameters can be classified into the same category and the category to which they belong is used as the corresponding first-level parameter. Alternatively, a parameter to be tested can be classified into a separate category, that is, there is only one second-level parameter under the corresponding first-level parameter.

[0049] Since the test experiment is constructed with the primary parameters as factors, and the variable parameters in the netlist template correspond one-to-one to the secondary parameters, when generating the netlist corresponding to the test experiment, it is necessary to first determine the value of the corresponding secondary parameter according to the properties of the primary parameters in the test experiment, and then use the value of the secondary parameter to assign the corresponding variable parameters in the netlist template. When all the variable parameters in the netlist template are assigned, the netlist corresponding to the test experiment is obtained.

[0050] For example, the attribute of the first-level parameter size in Test Experiment 1 is the minimum value. From this, it can be determined that the value of the second-level parameter length in Test Experiment 1 is 10, and the value of width is 5. Assume that the netlist template uses %parameter name% to represent variable parameters. The netlist template has two variable parameters, namely %length% and %width%. Assign the values of the second-level parameters in Test Experiment 1 to the variable parameters in the netlist template, that is, assign 10 to %length% and 5 to %width%. The netlist obtained in this way is the netlist corresponding to Test Experiment 1.

[0051] Use the above method to obtain the netlists corresponding to all test experiments, and then input these netlists into an integrated circuit simulation tool, such as SPICE, for simulation to obtain the simulation results of the test experiments. Integrate all the test experiments and their simulation results together to obtain a test report of the integrated circuit.

[0052] In this embodiment, by classifying the parameters to be tested in the integrated circuit, using the corresponding class as the first-level parameter, and then using the first-level parameter as the factor of the test experiment, the design of the test experiment can be simplified, the number of test experiments can be reasonably reduced, thereby reducing the number of simulations and improving the simulation test efficiency.

[0053] In one embodiment, step S110 of obtaining the test parameter table of the integrated circuit includes: obtaining the first-level parameters and their attributes, and the second-level parameters and their values through a graphical user interface.

[0054] In one embodiment, in step S410, determining the values of the second-level parameters corresponding to the test experiment according to the attributes of the first-level parameters of the test experiment includes: Obtain the attributes of the first-level parameters of the test experiment; according to the test parameter table, determine the values of the second-level parameters associated with the attributes of the first-level parameters.

[0055] In step S420, assigning the values of the second-level parameters corresponding to the test experiment to the variable parameters in the netlist template includes: In step S421, identify the specific symbols used to mark the variable parameters in the netlist template to find the variable parameters in the netlist template; In step S422, obtain the values of the second-level parameters corresponding to the variable parameters from all the values of the second-level parameters corresponding to the test experiment; In step S423, assign the value to the variable parameter.

[0056] One embodiment of the present invention, as Figure 3 shown, a simulation test device 100 for an integrated circuit includes: A memory 110 for storing a computer program 120; The processor 130 is used to implement the simulation test method of the integrated circuit described in any of the foregoing embodiments when running the computer program 120.

[0057] The memory 110 can be any internal storage unit and / or external storage device capable of implementing data and program storage. For example, the memory 110 can be a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash memory card, or the like.

[0058] As needed, the processor 130 can be a central processing unit (CPU), a graphics processing unit (GPU), a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA), a general purpose processor, or other logic devices, etc.

[0059] An embodiment of the present invention, as Figure 4 shown, a simulation test system for an integrated circuit includes: the simulation test device 100 for the integrated circuit described in the foregoing embodiment and an integrated circuit simulation tool 200.

[0060] The integrated circuit simulation tool can select a general simulation tool, such as SPICE or a device similar to SPICE.

[0061] The simulation test device 100 designs a test experiment according to the parameters to be tested of the integrated circuit and generates a netlist corresponding to the test experiment. The netlist is input into the integrated circuit simulation tool 200 for simulation, and the simulation results of the test experiment are extracted from the output of the simulation tool 200.

[0062] In some embodiments, the simulation test device 100 also generates a test report for the integrated circuit according to all the test experiments and their simulation results.

[0063] The present invention also provides a specific application embodiment, a simulation test method for an integrated circuit, including the following steps: (1) Read in a parameter definition table (i.e., a test parameter table, such as Figure 5). The parameter definition table uses Definition to identify a definition. Each definition includes a primary parameter and at least one secondary parameter. The primary parameter includes a parameter name and attributes. The first column is the parameter name, and the subsequent columns are attributes (also the values of the primary parameter); the secondary parameter includes a parameter name and values. The first column is the parameter name, and the subsequent columns are values. Below the primary parameter, the secondary parameters it contains are identified by square brackets [, ]. The values of the secondary parameter and the attributes of the primary parameter form a corresponding relationship by column. For example, Definition 1 includes a primary parameter cio and a secondary parameter cio1. Cio has 3 attributes, namely min, typ, and max. Cio contains a secondary parameter cio1, and cio1 has 3 values, namely 0.2, 0.6, and 1. The value 0.2 of cio1 means that the min attribute (i.e., the minimum value) of cio1 is 0.2, and the others are similar.

[0064] Read in the parameter definition table and parse the table. Each Definition can be stored in an array, including the name and attributes of the primary parameter, and the name and values of the secondary parameter.

[0065] (2) Use the primary parameter as a factor in the experimental design and conduct the experimental design. According to the recommended minimum number of experiments or manually set the number of experiments, as well as the possible values of the factor, randomly generate the combination of the factor values for each experiment to obtain the experimental design table. Each row in the experimental design table represents an experiment, and the row data is the value corresponding to the primary parameter.

[0066] (3) After generating the experimental design table, obtain the SPICE netlist template of the integrated circuit to be tested, where the variable parameters in the template are marked with "%parameter name%", and the parameter name is the secondary parameter in the parameter definition table.

[0067] (4) According to the attributes (i.e., the values of the primary parameter) defined by each row (representing an experiment) in the experimental design table, obtain the corresponding values of all associated secondary parameters, that is, convert the value of the primary parameter of an experiment into the value of the secondary parameter, and then replace the parameter marked with "%parameter name%" in the netlist template according to the value of the secondary parameter of this experiment (for example, check whether the name of this secondary parameter exists in the netlist template, and if so, replace it with the corresponding value of the secondary parameter) to obtain the netlist of this experiment.

[0068] (5) After generating the netlists of all experiments, input the netlists in sequence for SPICE simulation. After the simulation is completed, automatically collect the simulation results (such as the eye height and eye width of the eye diagram), and integrate the simulation results and the experimental table together to form a table containing experimental data and simulation results.

[0069] In this embodiment, an experimental design table can be automatically generated by importing a parameter definition table, and multiple netlists can be generated in combination with a netlist template for SPICE simulation. After the simulation is completed, the results are automatically collected and written into the table, avoiding operations such as manually designing the experimental table, modifying the netlist, and collecting the simulation results, thus improving the simulation test efficiency.

[0070] An embodiment of the present invention is a computer storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the simulation test method of the integrated circuit described in the foregoing embodiment are implemented.

[0071] It should be noted that the above embodiments can be freely combined as needed. The above are only the preferred embodiments of the present invention. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and refinements can be made, and these improvements and refinements should also be regarded as the protection scope of the present invention.

Claims

1. A simulation test method for an integrated circuit, characterized in that, including: Obtain a test parameter table of the integrated circuit, where the test parameter table includes all test parameters and their values for simulation testing; Generate an experimental design table of the integrated circuit according to the test parameter table, where the experimental design table includes several test experiments, and each group of test experiments specifies the values of all test parameters; Obtain a netlist template of the integrated circuit, where the netlist template contains variable parameters, and the variable parameters correspond one-to-one with the test parameters; Assign values to the variable parameters of the netlist template according to the values of all test parameters in each group of test experiments to obtain a netlist corresponding to the test experiment; Obtain the simulation result of the integrated circuit under the netlist, and record it as the simulation result of the test experiment.

2. The simulation testing method of the integrated circuit according to claim 1, wherein: Generate a test report of the integrated circuit according to all test experiments and their simulation results.

3. A simulation test method for an integrated circuit, characterized in that, including: Obtain a test parameter table of the integrated circuit, where the test parameter table includes several first-level parameters and their attributes, the second-level parameters included in the first-level parameters, and the values of the second-level parameters corresponding to the attributes of the first-level parameters for simulation testing; Generate an experimental design table of the integrated circuit according to the first-level parameters and their attributes in the test parameter table, where the experimental design table includes several test experiments, and each group of test experiments specifies the attributes of all first-level parameters; Obtain a netlist template of the integrated circuit, where the netlist template contains variable parameters, and the variable parameters correspond one-to-one with the second-level parameters; Determine the values of all second-level parameters corresponding to the test experiment according to the attributes of all first-level parameters in each group of test experiments; Assign values to the variable parameters of the netlist template according to the values of all second-level parameters corresponding to the test experiment to obtain a netlist corresponding to the test experiment; Obtain the simulation result of the integrated circuit under the netlist, and record it as the simulation result of the test experiment.

4. The simulation testing method of the integrated circuit according to claim 3, wherein: Generate a test report of the integrated circuit according to all test experiments and their simulation results.

5. The simulation test method of the integrated circuit according to claim 3, wherein, Obtaining the test parameter table of the integrated circuit includes: Obtain the first-level parameters and their attributes, the second-level parameters and their values through a graphical user interface.

6. The simulation test method of the integrated circuit according to claim 3, characterized in that, Generating the experimental design table of the integrated circuit according to the first-level parameters and their attributes in the test parameter table includes: Use the first-level parameters as factors of the experimental design, and according to the possible values of the factors, use a randomly generated combination of all factor values at one time as a group of test experiments.

7. The simulation testing method of the integrated circuit according to claim 3, wherein: The determining the values of all second-level parameters corresponding to the test experiment according to the attributes of all first-level parameters in each group of test experiments includes: Obtain the attributes of the first-level parameters of the test experiment; Determine the values of the second-level parameters associated with the attributes of the first-level parameters according to the test parameter table; Assigning values to the variable parameters of the netlist template according to the values of all second-level parameters corresponding to the test experiment includes: Find the variable parameters of the netlist template by identifying specific symbols used to mark the variable parameters in the netlist template; Obtain the values of the secondary parameters corresponding to the variable parameters from the values of all secondary parameters corresponding to the test experiment; Assign the values to the variable parameters.

8. An integrated circuit simulation and test device, characterized in that Comprising: A memory for storing a computer program; A processor for implementing the simulation test method of the integrated circuit according to any one of claims 1 to 7 when running the computer program.

9. An integrated circuit simulation and testing system, characterized in that, Including the simulation test device of the integrated circuit according to claim 8.

10. A computer storage medium, on which a computer program is stored, characterized in that, The steps of the simulation test method of the integrated circuit according to any one of claims 1 - 7 are implemented when the computer program is executed by the processor.

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