Organic light-emitting device detection device and detection method

Abstract

The invention provides an organic light-emitting device detection device and detection method, and relates to the technical field of organic light-emitting device detection, and the device comprises a surface cleaning module, a film layer structure detection module, an electrode contact quality detection module, a surface quality detection module and a comprehensive quality evaluation module. According to the invention, through arranging the surface cleaning module, the film layer structure detection module, the electrode contact quality detection module, the surface quality detection module and the comprehensive quality evaluation module, a multi-dimensional detection system for covering the surface cleanliness, the film layer structure, the electrode contact quality and the surface defect of the device is constructed; through cooperative work of all the modules, systematic detection and quantitative evaluation of core quality parameters of the device are achieved, the problems that in the prior art, detection dimensions are isolated, and comprehensive judgment is lacked are solved, a comprehensive and objective evaluation basis is provided for the quality of the device, and the comprehensiveness and reliability of detection are remarkably improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of organic electroluminescent device detection, and particularly relates to an organic electroluminescent device detection apparatus and a detection method. Background Art

[0002] Due to characteristics such as self-luminescence and flexibility, organic electroluminescent devices are increasingly widely used in the fields of display and lighting. However, with the expansion of the industrial scale, the importance of device quality detection has become increasingly prominent. Existing detection technologies have the following problems: (1) Lack of a surface cleaning process, and surface dirt affects detection accuracy; (2) Single detection dimension and lack of systematic evaluation: Traditional detection methods mostly target a single index (such as brightness or voltage), and do not form a comprehensive detection system for core dimensions such as film layer structure, electrode contact quality, and surface defects. Summary of the Invention

[0003] The present invention provides an organic electroluminescent device detection apparatus and a detection method to solve at least one of the above-mentioned technical problems.

[0004] To solve the above technical problems, the present invention discloses an organic electroluminescent device detection apparatus and a detection method. The apparatus includes: A surface cleaning module for performing a full-range surface cleaning on the organic electroluminescent device to be detected and inspecting the cleaning effect; A film layer structure detection module for measuring the thickness of the organic layer of the organic electroluminescent device and obtaining a processed value of the film layer structure quality detection result of the organic electroluminescent device based on the thickness data of the organic layer; An electrode contact quality detection module for detecting the contact quality between the electrode and the organic layer of the organic electroluminescent device and obtaining a processed value of the electrode contact quality detection result of the organic electroluminescent device; A surface quality detection module for obtaining a processed value of the surface quality detection result of the organic electroluminescent device based on the trained surface quality detection model and the surface acquisition image of the organic electroluminescent device; A comprehensive quality evaluation module for obtaining a comprehensive quality evaluation result of the organic electroluminescent device based on the processed value of the film layer structure quality detection result, the processed value of the electrode contact quality detection result, and the processed value of the surface quality detection result of the organic electroluminescent device.

[0005] Preferably, the surface cleaning module includes: A cleaning unit for performing a full-range surface cleaning on the organic electroluminescent device to be detected; A cleaning effect inspection unit is used to collect surface images of various regions of the organic electroluminescent device to be detected after comprehensive surface cleaning, and based on the trained dirt recognition model, conduct a cleaning effect inspection on the organic electroluminescent device to be detected. If the inspection is qualified, it will be sent to the film layer structure detection module; otherwise, it will be sent back to the cleaning unit for comprehensive surface cleaning again until the cleaning effect inspection is qualified.

[0006] Preferably, the film layer structure detection module includes: A thickness value acquisition unit 1 is used to divide the organic electroluminescent device along the length direction of the organic electroluminescent device, divide the organic electroluminescent device into m thickness acquisition regions 1 with the same length, take auxiliary line 1 along the width direction of the organic electroluminescent device with the midpoint of the length direction of each thickness acquisition region 1 as the base point, take several thickness detection points on auxiliary line 1, and take the average value of the thickness detection values of several thickness detection points as the thickness value corresponding to the length direction of each thickness acquisition region 1; A thickness value acquisition unit 2 is used to divide the organic electroluminescent device along the width direction of the organic electroluminescent device, divide the organic electroluminescent device into n thickness acquisition regions 2 with the same width, take auxiliary line 2 along the length direction of the organic electroluminescent device with the midpoint of the width direction of each thickness acquisition region 2 as the base point, take several thickness detection points on auxiliary line 2, and take the average value of the thickness detection values of several thickness detection points as the thickness value corresponding to the width direction of each thickness acquisition region 2; A film layer structure quality detection result processing value acquisition unit is used to calculate the film layer structure quality detection result processing value of the organic electroluminescent device based on the thickness values corresponding to the length directions of m thickness acquisition regions 1 and the thickness values corresponding to the width directions of n thickness acquisition regions 2.

[0007] Preferably, the film layer structure quality detection result processing value of the organic electroluminescent device: ; Among them, is the film layer structure quality detection result processing value of the organic electroluminescent device, is the influence coefficient of thickness accuracy, is the thickness value corresponding to the length direction of the i-th thickness acquisition region 1, is the reference thickness value of the current organic electroluminescent device, is the thickness value corresponding to the width direction of the j-th thickness acquisition region 2, is the influence coefficient of thickness uniformity, m is the total number of thickness acquisition regions 1, and n is the total number of thickness acquisition regions 2.

[0008] Preferably, the electrode contact quality detection module includes: An image acquisition unit, configured to acquire images at multiple angles as first images through a high-resolution industrial camera in the off-screen state of the organic electroluminescent device, and acquire a global top view of the organic electroluminescent device as a second image in the light-emitting state of the organic electroluminescent device; A region to be detected determination unit, configured to obtain the region to be detected of the organic electroluminescent device based on a plurality of first images; An electrode contact quality detection result processing value acquisition unit, configured to obtain the contact defect region of the organic electroluminescent device based on a plurality of second images, and calculate the electrode contact quality detection result processing value of the organic electroluminescent device based on the number of pixel points in a plurality of contact defect regions.

[0009] Preferably, the region to be detected acquisition unit includes: A pixel acquisition sub-unit one, configured to obtain the pixel value of each pixel point in a plurality of first images, calculate the pixel mean value of adjacent pixel points corresponding to each pixel point in each first image, and use it as the intermediate pixel of the corresponding pixel point in this first image; A background acquisition sub-unit one, configured to calculate the sum of the intermediate pixels of the corresponding pixel points on a plurality of first images, and use the quotient of the sum of the intermediate pixels of the corresponding pixel points on a plurality of first images and the total number of first images as the background pixel value of the organic electroluminescent device corresponding to the pixel point, and use the image composed of the background pixel values of the organic electroluminescent device of each pixel point as the background image of the organic electroluminescent device; A region to be detected determination sub-unit, calculates the absolute value of the difference between the actual pixel value of each pixel point in the first image with the highest clarity and its background pixel value of the organic electroluminescent device. When the absolute value of the difference between the actual pixel value of each pixel point in the first image with the highest clarity and its background pixel value of the organic electroluminescent device is greater than a preset pixel difference, mark this pixel point as a pixel point in the region to be detected, and the region composed of all pixel points in the region to be detected is the region to be detected.

[0010] Preferably, the electrode contact quality detection result processing value acquisition unit includes: A background acquisition sub-unit two, configured to obtain the gray value of each pixel point in a plurality of regions to be detected in the second image, calculate the gray mean value of adjacent pixel points corresponding to each pixel point in each region to be detected, and use it as the background gray value of the region to be detected corresponding to the pixel point; A contact defect region determination sub-unit, when the gray value of the corresponding pixel point in the region to be detected is less than the background gray value of the region to be detected corresponding to the pixel point, use this pixel point as a pixel point in the contact defect region, and use the region composed of all pixel points in the contact defect region as the contact defect region of the corresponding region to be detected; An electrode contact quality detection result processing value acquisition subunit, which is used to calculate the electrode contact quality detection result processing value of an organic light-emitting device: ; wherein, is the electrode contact quality detection result processing value of the organic light-emitting device, is the total number of regions to be detected in the second image, is the total number of pixel points in the contact defect region of the i-th region to be detected in the second image, is the total number of pixel points in the i-th region to be detected in the second image.

[0011] Preferably, based on the film layer structure quality detection result processing value, the electrode contact quality detection result processing value, and the surface quality detection result processing value of the organic light-emitting device, a comprehensive quality evaluation result of the organic light-emitting device is obtained: ; wherein, is the comprehensive quality evaluation value of the organic light-emitting device, is the film layer structure quality weight value, is the preset maximum processing value of the film layer structure quality detection result, is the film layer structure quality detection result processing value of the organic light-emitting device, is the electrode contact quality weight value, is the preset maximum processing value of the electrode contact quality detection result, is the electrode contact quality detection result processing value of the organic light-emitting device, is the surface quality weight value, is the preset maximum processing value of the surface quality detection result, is the surface quality detection result processing value of the organic light-emitting device.

[0012] An organic light-emitting device detection method, comprising the following steps: S1. Perform a full-range surface cleaning on the organic light-emitting device to be detected and inspect the cleaning effect; S2. Measure the thickness of the organic layer of the organic light-emitting device, and based on the thickness data of the organic layer, obtain the film layer structure quality detection result processing value of the organic light-emitting device; S3. Detect the contact quality between the electrodes and the organic layer of the organic light-emitting device to obtain the electrode contact quality detection result processing value of the organic light-emitting device; S4. Based on the trained surface quality detection model and the surface acquisition image of the organic light-emitting device, obtain the surface quality detection result processing value of the organic light-emitting device; S5. Obtain the comprehensive quality evaluation result of the organic electroluminescent device based on the processed value of the film layer structure quality detection result, the processed value of the electrode contact quality detection result, and the processed value of the surface quality detection result of the organic electroluminescent device.

[0013] Compared with the prior art, the present invention has the following beneficial effects: By setting up a surface cleaning module, a film layer structure detection module, an electrode contact quality detection module, a surface quality detection module, and a comprehensive quality evaluation module, the present invention constructs a multi-dimensional detection system covering the surface cleanliness of the device, the film layer structure, the electrode contact quality, and surface defects. Compared with the traditional single-index detection, through the collaborative work of each module, the systematic detection and quantitative evaluation of the core quality parameters of the device are realized, solving the problems of isolated detection dimensions and lack of comprehensive determination in the prior art, providing a comprehensive and objective evaluation basis for the device quality, and significantly improving the comprehensiveness and reliability of the detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The drawings are used to provide a further understanding of the present invention, and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention, and do not constitute a limitation to the present invention. In the drawings: Figure 1 It is a schematic diagram of the detection device for the organic electroluminescent device of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0015] The following describes the preferred embodiments of the present invention with reference to the drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0016] In addition, in the present invention, descriptions such as "first" and "second" are only for descriptive purposes, and do not particularly refer to the order or sequence. Nor are they used to limit the present invention. They are only used to distinguish components or operations described with the same technical terms, and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions and technical features between various embodiments can be combined with each other, but it must be based on the ability of those of ordinary skill in the art to implement. When the combination of technical solutions appears to be contradictory or unable to be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0017] The present invention provides the following embodiments Embodiment 1 The embodiment of the present invention provides an organic electroluminescent device detection device and a detection method, as Figure 1 shown, including: A surface cleaning module for comprehensively cleaning the surface of the organic electroluminescent device to be detected and inspecting the cleaning effect; A film layer structure detection module for measuring the thickness of the organic layer of the organic electroluminescent device and obtaining a processed value of the film layer structure quality detection result of the organic electroluminescent device based on the thickness data of the organic layer; An electrode contact quality detection module for detecting the contact quality between the electrode and the organic layer of the organic electroluminescent device and obtaining a processed value of the electrode contact quality detection result of the organic electroluminescent device; A surface quality detection module for obtaining a processed value of the surface quality detection result of the organic electroluminescent device based on the trained surface quality detection model and the surface acquisition image of the organic electroluminescent device; A comprehensive quality evaluation module for obtaining a comprehensive quality evaluation result of the organic electroluminescent device based on the processed value of the film layer structure quality detection result, the processed value of the electrode contact quality detection result, and the processed value of the surface quality detection result of the organic electroluminescent device.

[0018] An organic electroluminescent device detection method includes the following steps: S1. Comprehensively clean the surface of the organic electroluminescent device to be detected and inspect the cleaning effect; S2. Measure the thickness of the organic layer of the organic electroluminescent device and obtain a processed value of the film layer structure quality detection result of the organic electroluminescent device based on the thickness data of the organic layer; S3. Detect the contact quality between the electrode and the organic layer of the organic electroluminescent device and obtain a processed value of the electrode contact quality detection result of the organic electroluminescent device; S4. Obtain a processed value of the surface quality detection result of the organic electroluminescent device based on the trained surface quality detection model and the surface acquisition image of the organic electroluminescent device; S5. Obtain a comprehensive quality evaluation result of the organic electroluminescent device based on the processed value of the film layer structure quality detection result, the processed value of the electrode contact quality detection result, and the processed value of the surface quality detection result of the organic electroluminescent device.

[0019] In this embodiment, the processed value of the film layer structure quality detection result of the organic electroluminescent device is a value reflecting the film layer structure quality of the organic electroluminescent device. The larger the processed value of the film layer structure quality detection result of the organic electroluminescent device, the worse the film layer structure quality.

[0020] In this embodiment, the processed value of the electrode contact quality detection result of the organic electroluminescent device is a value reflecting the contact quality between layers of the organic electroluminescent device. The larger the processed value of the electrode contact quality detection result of the organic electroluminescent device, the worse the contact quality.

[0021] In this embodiment, the processed value of the surface quality detection result of the organic electroluminescent device is a numerical value reflecting the surface quality of the organic electroluminescent device. The larger the processed value of the surface quality detection result of the organic electroluminescent device, the worse the surface quality of the organic electroluminescent device.

[0022] In this embodiment, the surface quality detection model is a model obtained after training a neural network model by using a large number of surface images of organic electroluminescent devices as the input quantity of the model in advance, and using the corresponding surface quality conditions of the large number of surface images of organic electroluminescent devices as the output quantity of the model.

[0023] The working principle and beneficial effects of the above technical solution are as follows: The organic electroluminescent device detection device of the present invention works through the cooperation of each module. First, the device is surface-cleaned and inspected, then the film layer structure, electrode contact quality, and surface quality are detected in sequence to obtain corresponding processed values, and finally the overall quality of the device is comprehensively evaluated. The detection method is executed in an orderly manner according to the corresponding steps to ensure the comprehensive detection of various quality indicators of the device; By setting up a surface cleaning module, a film layer structure detection module, an electrode contact quality detection module, a surface quality detection module, and a comprehensive quality evaluation module, the present invention constructs a multi-dimensional detection system covering the surface cleanliness, film layer structure, electrode contact quality, and surface defects of the device. Compared with the traditional single-index detection, through the cooperation of each module, the systematic detection and quantitative evaluation of the core quality parameters of the device are realized, solving the problems of isolated detection dimensions and lack of comprehensive judgment in the prior art, providing a comprehensive and objective evaluation basis for the device quality, and significantly improving the comprehensiveness and reliability of the detection.

[0024] Embodiment 2 On the basis of Embodiment 1, the surface cleaning module includes: A cleaning unit for performing a full-range surface cleaning on the organic electroluminescent device to be detected; A cleaning effect inspection unit for collecting surface images of each area of the organic electroluminescent device to be detected after the full-range surface cleaning, and based on the trained dirt recognition model, performing a cleaning effect inspection on the organic electroluminescent device to be detected. If the inspection is qualified, it is sent to the film layer structure detection module, otherwise it is sent back to the cleaning unit for another full-range surface cleaning until the cleaning effect inspection is qualified.

[0025] In this embodiment, the dirt recognition model is a model obtained after training a machine learning model by using a large number of images of organic electroluminescent devices after surface cleaning treatment as the input quantity of the model in advance, and using the corresponding cleaning effect conditions (i.e., whether there is dirt and the severity of the dirt) of the large number of organic electroluminescent device images as the output quantity of the model.

[0026] The working principle and beneficial effects of the above technical solution are as follows: By introducing a dirt recognition model for cleaning effect inspection, the automation and precision of cleaning effect inspection are realized. It can timely detect devices with incomplete cleaning and perform re-cleaning to ensure that the surface cleanliness of the devices entering the subsequent detection process meets the requirements, avoid affecting the accuracy of subsequent detection results such as the film layer structure and electrode contact quality due to surface dirt, and improve the reliability of the entire detection process and the credibility of the detection results.

[0027] Embodiment 3 On the basis of Embodiment 1, the film layer structure detection module includes: The first thickness value acquisition unit is used to divide the organic electroluminescent device along the length direction of the organic electroluminescent device, divide the organic electroluminescent device into m thickness acquisition regions one with the same length, take a secondary line one along the width direction of the organic electroluminescent device with the midpoint of the length direction of each thickness acquisition region one as the base point, take several thickness detection points on the secondary line one, and take the average value of the thickness detection values of the several thickness detection points as the thickness value corresponding to the length direction of each thickness acquisition region one; The second thickness value acquisition unit is used to divide the organic electroluminescent device along the width direction of the organic electroluminescent device, divide the organic electroluminescent device into n thickness acquisition regions two with the same width, take a secondary line two along the length direction of the organic electroluminescent device with the midpoint of the width direction of each thickness acquisition region two as the base point, take several thickness detection points on the secondary line two, and take the average value of the thickness detection values of the several thickness detection points as the thickness value corresponding to the width direction of each thickness acquisition region two; The film layer structure quality detection result processing value acquisition unit is used to calculate the film layer structure quality detection result processing value of the organic electroluminescent device based on the thickness values corresponding to the length direction of the m thickness acquisition regions one and the thickness values corresponding to the width direction of the n thickness acquisition regions two.

[0028] The working principle and beneficial effects of the above technical solution are as follows: The multi-dimensional thickness measurement and evaluation method of the film layer structure detection module can more comprehensively and accurately reflect the quality status of the film layer structure of the organic electroluminescent device. Compared with single-direction measurement, it takes into account the thickness changes in the length and width directions, can more accurately detect the non-uniformity and deviation of the film layer thickness, provides more detailed and reliable data support for the evaluation of the film layer structure quality, and helps to discover potential film layer quality problems.

[0029] Embodiment 4 On the basis of Embodiment 3, the film layer structure quality detection result processing value of the organic electroluminescent device: ; Wherein, is the processing value of the film layer structure quality detection of the organic electroluminescent device, is the influence coefficient of thickness accuracy, is the thickness value corresponding to the length direction of the i-th thickness acquisition area one, is the reference thickness value of the current organic electroluminescent device, is the thickness value corresponding to the width direction of the j-th thickness acquisition area two, is the influence coefficient of thickness uniformity, m is the total number of thickness acquisition areas one, and n is the total number of thickness acquisition areas two.

[0030] The working principle and beneficial effects of the above technical solution: Incorporate the accuracy and uniformity of thickness into the evaluation system in a quantitative manner, making the evaluation of the film layer structure quality more scientific and accurate. By adjusting the influence coefficient, the weights of various factors in the evaluation can be flexibly adjusted according to actual needs to meet different production and detection requirements.

[0031] Example 5 Based on Example 1, the electrode contact quality detection module includes: An image acquisition unit for acquiring images at multiple angles as the first images through a high-resolution industrial camera in the off-screen state of the organic electroluminescent device, and acquiring a global top view of the organic electroluminescent device as the second image in the light-emitting state of the organic electroluminescent device; A to-be-detected area determination unit for obtaining the to-be-detected area of the organic electroluminescent device based on a plurality of first images; An electrode contact quality detection result processing value acquisition unit for obtaining the contact defect area of the organic electroluminescent device based on a plurality of second images, and calculating the electrode contact quality detection result processing value based on the number of pixel points in a plurality of contact defect areas.

[0032] The working principle and beneficial effects of the above technical solution are: Detect the electrode contact quality by comparing the images in the off-screen and light-emitting states, which can more accurately detect the contact defects between the electrode and the organic layer. The multi-angle images and the global top view acquired by the high-resolution industrial camera provide rich information for the detection. The quantitative calculation method based on the number of pixel points makes the evaluation of the electrode contact quality more objective and accurate, which helps to timely discover potential electrode contact problems and improve the reliability of the device.

[0033] Example 6 Based on Example 1, the to-be-detected area acquisition unit includes: A pixel acquisition sub-unit one for acquiring the pixel value of each pixel point in a plurality of first images, calculating the pixel mean value of the adjacent pixel points corresponding to each pixel point of each first image, and taking it as the intermediate pixel of the corresponding pixel point of the first image; Background acquisition subunit 1, used to calculate the sum of the middle pixels of the corresponding pixels on the first images, and use the quotient of the sum of the middle pixels of the corresponding pixels on the first images and the total number of the first images as the organic electroluminescent device background pixel value of the corresponding pixel, and use the image composed of the organic electroluminescent device background pixel value of each pixel as the organic electroluminescent device background image; The subunit for determining the area to be detected calculates the absolute value of the difference between the actual pixel value of each pixel point in the first image with the highest clarity and the background pixel value of its organic electroluminescent device. When the absolute value of the difference between the actual pixel value of each pixel point in the first image with the highest clarity and the background pixel value of its organic electroluminescent device is greater than a preset pixel difference, the pixel point is marked as a pixel point of the area to be detected, and the area formed by all the pixels of the area to be detected is the area to be detected.

[0034] The working principle and beneficial effects of the above technical solution are as follows: the present invention can accurately identify the areas that need to be focused on from the off-screen image, eliminate background interference, and improve the accuracy and stability of image analysis by calculating the mean of adjacent pixel points and background pixel values, thereby providing a precise detection range for subsequent electrode contact quality detection, and helping to improve detection efficiency and the accuracy of detection results.

[0035] Example 7 On the basis of Embodiment 5, the electrode contact quality detection result processing value acquisition unit includes: The background acquisition subunit 2 is used to obtain the grayscale value of each pixel point of a plurality of to-be-detected areas in the second image, and calculate the grayscale mean of the adjacent pixels points corresponding to each pixel point of each to-be-detected area, and use it as the luminous background grayscale value of the to-be-detected area corresponding to the pixel point of the to-be-detected area; The contact defect area determination subunit, when the gray value of the corresponding pixel point in the area to be detected is less than the gray value of the luminous background of the area to be detected of the corresponding pixel point, takes the pixel point as the contact defect area pixel point, and takes the area composed of all the contact defect area pixels as the contact defect area corresponding to the area to be detected; The electrode contact quality detection result processing value acquisition subunit is used to calculate the electrode contact quality detection result processing value of the organic electroluminescent device: ;in, is the electrode contact quality test result processing value of the organic electroluminescent device, is the total number of areas to be detected in the second image, is the total number of pixels in the contact defect area of ​​the i-th area to be detected in the second image, is the total number of pixels in the i-th area to be detected in the second image.

[0036] The working principle and beneficial effects of the above technical solution are as follows: By analyzing the gray values of the area to be detected in the luminescent image, the present invention accurately identifies the contact defect area, and obtains the processing value of the electrode contact quality detection result through quantitative calculation. This method based on gray value comparison and pixel point statistics makes the evaluation of electrode contact quality more accurate and objective, can timely detect tiny contact defects, and provides strong support for the quality control of devices.

[0037] Example 8 Based on the processing value of the film layer structure quality detection result, the processing value of the electrode contact quality detection result, and the processing value of the surface quality detection result of the organic electroluminescent device on the basis of Example 1, the comprehensive quality evaluation result of the organic electroluminescent device is obtained: ; where is the comprehensive quality evaluation value of the organic electroluminescent device, is the film layer structure quality weight value, is the preset maximum processing value of the film layer structure quality detection result, is the processing value of the film layer structure quality detection result of the organic electroluminescent device, is the electrode contact quality weight value, is the preset maximum processing value of the electrode contact quality detection result, is the processing value of the electrode contact quality detection result of the organic electroluminescent device, is the surface quality weight value, is the preset maximum processing value of the surface quality detection result, is the processing value of the surface quality detection result of the organic electroluminescent device.

[0038] The working principle and beneficial effects of the above technical solution are as follows: By setting different weight values, the importance of different quality indicators in the comprehensive evaluation can be highlighted according to actual needs, making the evaluation result more in line with the requirements of actual production and application. Considering multiple quality indicators comprehensively can fully reflect the overall quality status of the device, provide a reliable basis for the screening and use of the device, and help improve the overall quality and market competitiveness of the product.

[0039] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention is also intended to include these changes and modifications.

Claims

1. An organic electroluminescent device detection apparatus, characterized in that: Including: A surface cleaning module for performing a full - range surface cleaning on the organic electroluminescent device to be detected and conducting a cleaning effect inspection; A film layer structure detection module for measuring the thickness of the organic layer of the organic electroluminescent device and obtaining a processed value of the film layer structure quality detection result of the organic electroluminescent device based on the thickness data of the organic layer; An electrode contact quality detection module for detecting the contact quality between the electrode and the organic layer of the organic electroluminescent device and obtaining a processed value of the electrode contact quality detection result of the organic electroluminescent device; A surface quality detection module for obtaining a processed value of the surface quality detection result of the organic electroluminescent device based on the trained surface quality detection model and the surface acquisition image of the organic electroluminescent device; A comprehensive quality evaluation module for obtaining a comprehensive quality evaluation result of the organic electroluminescent device based on the processed value of the film layer structure quality detection result, the processed value of the electrode contact quality detection result, and the processed value of the surface quality detection result of the organic electroluminescent device.

2. The organic electroluminescent device detection apparatus according to claim 1, wherein: The surface cleaning module includes: A cleaning unit for performing a full - range surface cleaning on the organic electroluminescent device to be detected; A cleaning effect inspection unit for collecting surface images of each area of the organic electroluminescent device to be detected after the full - range surface cleaning and conducting a cleaning effect inspection on the organic electroluminescent device to be detected based on the trained dirt recognition model. If the inspection is qualified, it will be sent to the film layer structure detection module; otherwise, it will be sent back to the cleaning unit for another full - range surface cleaning until the cleaning effect inspection is qualified.

3. An organic electroluminescent device detection apparatus according to claim 1, characterized in that: The film layer structure detection module includes: A thickness value acquisition unit one for dividing the organic electroluminescent device along the length direction of the organic electroluminescent device, dividing the organic electroluminescent device into m thickness acquisition areas one with the same length. Taking the mid - point of the length direction of each thickness acquisition area one as a base point, making an auxiliary line one along the width direction of the organic electroluminescent device, taking several thickness detection points on the auxiliary line one, and taking the average value of the thickness detection values of the several thickness detection points as the thickness value corresponding to the length direction of each thickness acquisition area one; A thickness value acquisition unit two for dividing the organic electroluminescent device along the width direction of the organic electroluminescent device, dividing the organic electroluminescent device into n thickness acquisition areas two with the same width. Taking the mid - point of the width direction of each thickness acquisition area two as a base point, making an auxiliary line two along the length direction of the organic electroluminescent device, taking several thickness detection points on the auxiliary line two, and taking the average value of the thickness detection values of the several thickness detection points as the thickness value corresponding to the width direction of each thickness acquisition area two; A film layer structure quality detection result processed value acquisition unit for calculating a processed value of the film layer structure quality detection result of the organic electroluminescent device based on the thickness values corresponding to the length direction of the m thickness acquisition areas one and the thickness values corresponding to the width direction of the n thickness acquisition areas two.

4. The organic electroluminescent device detection apparatus according to claim 3, wherein: The processed value of the film layer structure quality detection result of the organic electroluminescent device: ； Among them, is the processing value of the film layer structure quality detection result of the organic electroluminescent device, is the influence coefficient of thickness accuracy, is the thickness value corresponding to the length direction of the first thickness acquisition region of the i-th, is the reference thickness value of the current organic electroluminescent device, is the thickness value corresponding to the width direction of the second thickness acquisition region of the j-th, is the influence coefficient of thickness uniformity, m is the total number of the first thickness acquisition regions, and n is the total number of the second thickness acquisition regions.

5. An organic electroluminescent device detection apparatus according to claim 1, characterized in that: The electrode contact quality detection module includes: An image acquisition unit, configured to acquire images at multiple angles as first images through a high-resolution industrial camera in the off-screen state of the organic light-emitting device, and acquire a global top view of the organic light-emitting device as a second image in the light-emitting state of the organic light-emitting device; A to-be-detected area determination unit, configured to obtain the to-be-detected area of the organic light-emitting device based on a plurality of first images; An electrode contact quality detection result processing value acquisition unit, configured to obtain the contact defect area of the organic light-emitting device based on a plurality of second images, and calculate the electrode contact quality detection result processing value of the organic light-emitting device based on the number of pixel points in a plurality of contact defect areas.

6. The organic electroluminescent device detection apparatus according to claim 5, wherein: The to-be-detected area acquisition unit includes: A pixel acquisition sub-unit one, configured to obtain the pixel value of each pixel point in a plurality of first images, calculate the pixel mean value of adjacent pixel points corresponding to each pixel point in each first image, and use it as the intermediate pixel of the corresponding pixel point in this first image; A background acquisition sub-unit one, configured to calculate the sum of the intermediate pixels of the corresponding pixel points on a plurality of first images, and use the quotient of the sum of the intermediate pixels of the corresponding pixel points on a plurality of first images and the total number of first images as the organic light-emitting device background pixel value of the corresponding pixel point, and use the image composed of the organic light-emitting device background pixel values of each pixel point as the organic light-emitting device background image; A to-be-detected area determination sub-unit, configured to calculate the absolute value of the difference between the actual pixel value of each pixel point in the first image with the highest clarity and its organic light-emitting device background pixel value. When the absolute value of the difference between the actual pixel value of each pixel point in the first image with the highest clarity and its organic light-emitting device background pixel value is greater than a preset pixel difference, mark this pixel point as a to-be-detected area pixel point, and the area composed of all to-be-detected area pixel points is the to-be-detected area.

7. An organic electroluminescent device detection apparatus according to claim 5, characterized in that: The electrode contact quality detection result processing value acquisition unit includes: A background acquisition sub-unit two, configured to obtain the gray value of each pixel point in a plurality of to-be-detected areas in the second image, calculate the gray mean value of adjacent pixel points corresponding to each pixel point in each to-be-detected area, and use it as the to-be-detected area light-emitting background gray value of the corresponding pixel point in this to-be-detected area; A contact defect area determination sub-unit, when the gray value of the corresponding pixel point in the to-be-detected area is less than the to-be-detected area light-emitting background gray value of the corresponding pixel point, use this pixel point as a contact defect area pixel point, and use the area composed of all contact defect area pixel points as the contact defect area of the corresponding to-be-detected area; An electrode contact quality detection result processing value acquisition sub-unit, configured to calculate the electrode contact quality detection result processing value of the organic light-emitting device: ; wherein, is the processing value of the electrode contact quality detection result of the organic electroluminescent device, is the total number of regions to be detected in the second image, is the total number of pixel points in the contact defect region of the i-th region to be detected in the second image, is the total number of pixel points in the i-th region to be detected in the second image.

8. An organic electroluminescent device detection apparatus according to claim 1, wherein: Based on the film layer structure quality detection result processing value, the electrode contact quality detection result processing value, and the surface quality detection result processing value of the organic light-emitting device, obtain the comprehensive quality evaluation result of the organic light-emitting device: ; wherein, is the comprehensive quality evaluation value of the organic electroluminescent device, is the film layer structure quality weight value, is the preset maximum processing value of the film layer structure quality detection result, is the processing value of the film layer structure quality detection result of the organic electroluminescent device, is the electrode contact quality weight value, is the preset maximum processing value of the electrode contact quality detection result, is the processing value of the electrode contact quality detection result of the organic electroluminescent device, is the surface quality weight value, is the preset maximum processing value of the surface quality detection result, is the processing value of the surface quality detection result of the organic electroluminescent device.

9. A method for detecting an organic electroluminescent device, which is used to detect an organic electroluminescent device by using an organic electroluminescent device detection device according to any one of claims 1-8, characterized in that: Including the following steps: S1. Perform a comprehensive surface cleaning on the to-be-detected organic light-emitting device and check the cleaning effect; S2. Measure the thickness of the organic layer of the organic electroluminescent device, and based on the thickness data of the organic layer, obtain the processed value of the film layer structure quality detection result of the organic electroluminescent device; S3. Detect the contact quality between the electrode and the organic layer of the organic electroluminescent device, and obtain the processed value of the electrode contact quality detection result of the organic electroluminescent device; S4. Based on the trained surface quality detection model and the surface acquisition image of the organic electroluminescent device, obtain the processed value of the surface quality detection result of the organic electroluminescent device; S5. Based on the processed value of the film layer structure quality detection result, the processed value of the electrode contact quality detection result, and the processed value of the surface quality detection result of the organic electroluminescent device, obtain the comprehensive quality evaluation result of the organic electroluminescent device.

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