An anti-mis-touch conductive film and an optical detection device for detecting quality of the conductive film

Abstract

This invention belongs to the technical field of conductive film optical inspection equipment, and relates to an anti-accidental contact conductive film and an optical inspection device for detecting the quality of the conductive film. The device includes a synchronous inspection mechanism, comprising a material carrier plate. Symmetrical baffles are fixedly connected to both ends of the upper surface of the material carrier plate. A mating plate is provided along the moving path of the baffles. A sliding crossbeam is fixedly connected to the upper surface of the mating plate. Both ends of the sliding crossbeam are slidably connected to a first slide rail. A second slide rail is provided at the rear end of the first slide rail. Pull ropes are fixedly connected to both ends of the sliding crossbeam, and a piston is fixedly connected to the other end of the pull ropes. The piston is slidably connected within a slide rail. A spring is nested on the pull rope, located between the piston and the slide rail near the bottom of the sliding crossbeam. A CCD inspection camera is fixedly connected to the middle of the sliding crossbeam. This invention aims to improve the accuracy, efficiency, and automation level of conductive film quality inspection, meeting the high standards required by modern electronic manufacturing.

Description

Technical Field

[0001] This invention relates to the field of conductive film optical inspection equipment technology, specifically to an anti-accidental contact conductive film and an optical inspection device for detecting the quality of the conductive film. Background Technology

[0002] With the rapid development of the electronics industry, conductive films, as key materials for electronic components such as touchscreens, flexible displays, and solar cells, directly affect product performance and yield. Traditional conductive film inspection mainly relies on manual visual inspection or static optical inspection. However, manual inspection is inefficient and easily affected by subjective factors, while static inspection requires frequent start-up and shutdown of the conveyor line, which is difficult to meet the needs of high-speed continuous production. In addition, during dynamic inspection, the relative motion between the conductive film and the camera can easily lead to image blurring or distortion, affecting the accuracy of defect identification. In existing technologies, some equipment uses high-speed cameras with complex algorithms to compensate for motion blur, but this is costly and requires high system computing power; other solutions fix the conductive film through mechanical clamping or vacuum adsorption, but this can easily cause deformation or damage to the film material, especially with poor adaptability to ultra-thin flexible conductive films. For example, Chinese patent CN214252075U discloses an automated testing device for keyboard conductive films, which realizes automatic loading and unloading of conductive films during quality testing and visual inspection of the appearance of conductive films, greatly reducing labor costs and improving production efficiency. However, in actual use, the production line needs to be stopped intermittently to cooperate with the transfer device to pick up the conductive film to be tested and send it to the visual inspection component for testing. After the conductive film is tested, the conductive film is put back into the production line by the transfer device before the production line can be restarted, resulting in low testing efficiency.

[0003] In view of this, the present invention proposes an anti-accidental contact conductive film and an optical detection device for detecting the quality of the conductive film, thereby solving the above-mentioned technical problems. Summary of the Invention

[0004] The purpose of this section is to outline some aspects of embodiments of the present invention and to briefly describe some preferred embodiments. Simplifications or omissions may be made in this section, as well as in the abstract and title of this application, to avoid obscuring the purpose of these documents; however, such simplifications or omissions should not be construed as limiting the scope of the invention.

[0005] An anti-accidental contact conductive film and an optical inspection device for detecting the quality of the conductive film are disclosed. The synchronous inspection mechanism includes a material carrier plate. Symmetrical baffles are fixedly connected to both ends of the upper surface of the material carrier plate. A matching plate is provided on the moving path of the baffles. A sliding crossbar is fixedly connected to the upper surface of the matching plate. Both ends of the sliding crossbar are slidably connected to a first slide rail. A second slide rail is also provided at the rear end of the first slide rail.

[0006] Among them, the two ends of the sliding cross frame are fixedly connected to pull ropes, the other end of the pull ropes is fixedly connected to a piston, the piston is slidably connected in the slide rail, and a spring is nested on the pull rope. The spring is located between the piston and the slide rail near the bottom of the sliding cross frame.

[0007] A CCD inspection camera is fixedly connected to the middle of the sliding crossbar.

[0008] Preferably, the synchronous detection mechanism is located on the conveying mechanism, which includes a double-speed chain conveyor line and the material carrier plate is located on the double-speed chain conveyor line.

[0009] Preferably, the double-speed chain conveyor line is also equipped with a testing chamber, with the first and second slide rails located on the inner side wall of the testing chamber, and the slide rails located within the wall thickness of the testing chamber.

[0010] Preferably, the first slide rail is parallel to the double-speed chain conveyor line, and the second slide rail is arc-shaped with a gradually increasing height, so that the height of the sliding crossbeam gradually increases after passing through the first slide rail and entering the second slide rail.

[0011] Preferably, the testing chamber is equipped with a stabilizing mechanism, which includes a second air intake port located on a baffle plate. The second air intake port is also equipped with a sealing gasket. A cavity is located below the second air intake port and is located inside the material carrier plate. The second air intake port and the cavity are connected. A suction cup is located on the upper surface of the material carrier plate, and the cavity and the suction cup are connected. A first air intake port is located on the mating plate and extends into the sliding crossbeam and the mating plate. An air guide pipe is fixedly connected to the sliding crossbeam and is connected to the first air intake port. The other end of the air guide pipe is wound up by a coiler and fixedly connected to the slide rail. The second air intake port is connected to the first air intake port during movement.

[0012] Preferably, the piston and the slide are in a sealed sliding connection, and a pressure valve is provided at the end of the slide away from the sliding crossbeam. The position of the piston during movement is always closer to the sliding crossbeam than the connection position between the air guide pipe and the slide.

[0013] Preferably, a conductive film to be tested is placed on a carrier plate, and the distribution of suction cups at the upper end of the carrier plate is pre-designed according to the type of conductive film.

[0014] Preferably, the testing chamber is equipped with a spraying mechanism, which includes an air compressor. The air compressor is connected to a spraying head via a pipe, and the spraying head is directed toward the double-speed chain conveyor line.

[0015] Preferably, the detection chamber is equipped with a cleaning mechanism, which includes an L-shaped bracket with a cleaning sponge on it, the cleaning sponge being located on the moving path of the CCD detection camera.

[0016] An anti-accidental contact conductive film, comprising:

[0017] A substrate layer, which is a transparent and flexible material, is used to provide structural support;

[0018] A conductive layer is disposed on the substrate layer and includes a plurality of spaced conductive units, the conductive units being used to detect touch signals;

[0019] An anti-accidental touch layer covers the conductive layer and includes multiple sensing areas and isolation areas. The sensing areas correspond to the conductive units and are used to enhance the sensitivity of touch signals. The isolation areas are used to isolate signal interference between adjacent conductive units.

[0020] A protective layer covers the anti-accidental contact layer and is used to protect the conductive layer and the anti-accidental contact layer from external damage;

[0021] A signal processing module, electrically connected to the conductive layer, is used to receive and process touch signals detected by the conductive unit, and to distinguish between intentional touches and accidental touches using a preset algorithm.

[0022] The beneficial effects of this invention are:

[0023] This invention achieves high-precision optical inspection of conductive films during dynamic transport by coordinating a synchronous inspection mechanism and a conveying mechanism. When the carrier plate carries the conductive film into the inspection chamber, the contact between the baffle and the mating plate drives the sliding crossbeam to move synchronously along the parallel No. 1 slide rail, keeping the CCD inspection camera and the conductive film relatively stationary for continuous imaging, effectively eliminating image distortion problems caused by traditional dynamic imaging. A reset system consisting of a pull rope, piston, and spring, combined with the lifting design of the arc-shaped No. 2 slide rail, enables automatic camera reset after inspection, allowing continuous operation of the production line without shutdown. The stabilizing mechanism uses the negative pressure generated by the piston movement, transmitted through the air duct and suction port to the suction cup to form an adaptive adsorption force, dynamically fixing the conductive film during inspection and avoiding displacement errors during imaging. This innovative equipment combines mechanical transmission, negative pressure adsorption, and optical inspection, significantly improving production efficiency while ensuring inspection accuracy, and is particularly suitable for the automated batch inspection needs of high-precision conductive films. Attached Figure Description

[0024] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the following description of the embodiments will be briefly introduced. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] in:

[0026] Figure 1This is a schematic diagram of the overall structure of the present invention;

[0027] Figure 2 This is a schematic diagram of the conveying mechanism in this invention;

[0028] Figure 3 This is a schematic diagram of the internal structure of the detection chamber in this invention;

[0029] Figure 4 for Figure 3 Enlarged schematic diagram of the structure at point A;

[0030] Figure 5 This is a schematic diagram of the synchronous detection mechanism in this invention;

[0031] Figure 6 for Figure 5 Enlarged schematic diagram of the structure at point B;

[0032] Figure 7 for Figure 5 Enlarged schematic diagram of the structure at point C;

[0033] Figure 8 This is a schematic diagram of the synchronous detection mechanism and detection chamber in this invention;

[0034] Figure 9 This is a schematic diagram of the stabilizing mechanism in this invention;

[0035] Figure 10 for Figure 9 Enlarged schematic diagram of the structure at point D;

[0036] Figure 11 This is a schematic diagram showing the position of the CCD detection camera and the cleaning sponge during movement.

[0037] In the picture:

[0038] 1. Conveying mechanism; 11. Double-speed chain conveyor line; 12. Testing room;

[0039] 2. Synchronous detection mechanism; 21. Carrier plate; 22. Baffle; 23. Sliding crossbeam; 24. CCD inspection camera; 25. No. 1 slide rail; 26. Pull rope; 27. Piston; 28. Spring; 29. ​​Mating plate; 210. Slide rail; 211. No. 2 slide rail;

[0040] 3. Stabilizing mechanism; 31. Air guide tube; 32. No. 1 air intake port; 33. Pressure valve; 34. No. 2 air intake port; 35. Cavity; 36. Suction cup;

[0041] 4. Spraying mechanism; 41. Air compressor; 42. Spray nozzle;

[0042] 5. Cleaning mechanism; 51. L-shaped bracket; 52. Cleaning sponge;

[0043] 99. Conductive film. Detailed Implementation

[0044] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0045] Example:

[0046] like Figures 1-8 As shown, an optical inspection device for detecting the quality of conductive films includes a synchronous inspection mechanism 2. The synchronous inspection mechanism 2 includes a material carrier plate 21. Symmetrical baffles 22 are fixedly connected to both ends of the upper surface of the material carrier plate 21. A mating plate 29 is provided on the moving path of the baffles 22. A sliding crossbeam 23 is fixedly connected to the upper surface of the mating plate 29. The two ends of the sliding crossbeam 23 are slidably connected to a first slide rail 25. A second slide rail 211 is also provided at the rear end of the first slide rail 25. During the movement, the baffles 22 contact the mating plate 29, thereby allowing the sliding crossbeam 23 to slide in the first slide rail 25 and the second slide rail 211.

[0047] The sliding crossbar 23 is fixedly connected to both ends of a pull rope 26, and a piston 27 is fixedly connected to the other end of the pull rope 26. The piston 27 is slidably connected within the slide rail 210. A spring 28 is nested on the pull rope 26 and is located between the piston 27 and the slide rail 210 near the bottom of the sliding crossbar 23. The combined structure of the pull rope 26, piston 27, slide rail 210 and spring 28 is used for the reset of the sliding crossbar 23.

[0048] A CCD inspection camera 24 is fixedly connected to the middle of the sliding crossbar 23; the CCD inspection camera 24 converts light signals into electrical signals through photoelectric conversion and transmits them to an external analysis system to analyze the quality of the conductive film 99.

[0049] The synchronous detection mechanism 2 is mounted on the conveying mechanism 1. The conveying mechanism 1 includes a double-speed chain conveyor line 11 and a material carrier plate 21 mounted on the double-speed chain conveyor line 11. The material carrier plates 21 on the double-speed chain conveyor line 11 are equidistant. The double-speed chain conveyor line 11 is existing technology and will not be described in detail here.

[0050] The double-speed chain conveyor line 11 is also equipped with a testing chamber 12. The first slide rail 25 and the second slide rail 211 are both located on the inner side wall of the testing chamber 12, and the slide 210 is located in the wall thickness of the testing chamber 12.

[0051] The first slide rail 25 is parallel to the double-speed chain conveyor line 11, and the second slide rail 211 is arc-shaped and gradually increases in height, so that the sliding crossbar 23 gradually increases in height after passing through the first slide rail 25 and entering the second slide rail 211.

[0052] In this embodiment, the conductive film 99 to be tested is placed on the carrier plate 21, and the carrier plate 21 and the conductive film 99 are moved by the double-speed chain conveyor 11. Then the carrier plate 21 carries the conductive film 99 into the testing chamber 12. During this process, the baffle 22 on the carrier plate 21 contacts the mating plate 29, and the carrier plate 21 pushes the mating plate 29 to drive the sliding crossbar 23 to slide in the first slide rail 25. It should be noted that the carrier plate 21 causes the sliding crossbar 23 to move synchronously.

[0053] During the sliding process of the aforementioned sliding crossbar 23 in the first slide rail 25, the conductive film 99 is located below the CCD detection camera 24, and the material carrier plate 21 drives the conductive film 99 and the sliding crossbar 23 drives the CCD detection camera 24 to move synchronously. At this time, the CCD detection camera 24 takes multiple pictures of the conductive film 99 and transmits the pictures to the terminal analysis system to perform quality analysis on the conductive film 99.

[0054] Subsequently, the baffle 22 continues to push the mating plate 29, causing the sliding crossbeam 23 to move. When the sliding crossbeam 23 enters the second slide rail 211 from the first slide rail 25, the height of the sliding crossbeam 23 gradually increases, causing the mating plate 29 to move upward relative to the baffle 22. When the sliding crossbeam 23 moves to the preset height, the mating plate 29 disengages from the baffle 22. At this time, the baffle 22 no longer pushes the mating plate 29. Then, the material carrier plate 21 carries the conductive film 99, which has finished testing, into the next process.

[0055] It is important to understand that when the sliding crossbeam 23 moves in the first slide rail 25 and the second slide rail 211, it pulls the pull rope 26. The pull rope 26 pulls the piston 27 to slide in the slide rail 210. At the same time, the spring 28 is compressed. When the mating plate 29 and the baffle 22 separate, the spring 28 extends and drives the piston 27 to slide and reset. This causes the piston 27 to drive the pull rope 26 to pull the sliding crossbeam 23 and the CCD inspection camera 24 to reset, thereby enabling the inspection of the next conductive film 99.

[0056] According to the above embodiments, it can be understood that the CCD inspection camera 24 can move synchronously with the conductive film 99 to capture images, avoiding the image distortion problem caused by the traditional CCD inspection camera 24 capturing images of the moving conductive film 99 from a fixed position, thus improving the detection accuracy. At the same time, after capturing images of the conductive film 99, the CCD inspection camera 24 will automatically reset and capture images of the next conductive film 99, so that the double-speed conveyor line 11 can continuously transport conductive films 99 for detection without stopping, which has the advantage of high efficiency.

[0057] like Figures 3-10 As shown, the testing chamber 12 is equipped with a stabilizing mechanism 3, which includes a second air intake 34. The second air intake 34 is located on the baffle 22 and is also equipped with a sealing gasket. Below the second air intake 34, there is a cavity 35 located in the material carrier plate 21. The second air intake 34 and the cavity 35 are connected. The upper surface of the material carrier plate 21 is equipped with a suction cup 36, which is connected to the cavity 35. The mating plate 29 is equipped with a first air intake 32, which extends into the sliding crossbeam 23 and the mating plate 29. A guide pipe 31 is fixedly connected to the sliding crossbeam 23. The guide pipe 31 is connected to the first air intake 32. The other end of the guide pipe 31 is wound up by a coiler and fixedly connected to the slide rail 210. The second air intake 34 is connected to the first air intake 32 during movement.

[0058] The piston 27 and the slide 210 are sealed and slidably connected. The end of the slide 210 away from the sliding cross frame 23 is provided with a pressure valve 33. The position of the piston 27 during movement is always closer to the sliding cross frame 23 than the connection position between the air pipe 31 and the slide 210.

[0059] The conductive film 99 to be tested is placed on the carrier plate 21. The suction cups 36 on the upper end of the carrier plate 21 are pre-designed according to the type of conductive film 99. The carrier plate 21 can be replaced. When testing different types of conductive films 99, a suitable carrier plate 21 should be selected. The position of the suction cups 36 on the carrier plate 21 should match the conductive film 99 to be tested, so that the suction cups 36 can adsorb and fix the conductive film 99.

[0060] In this embodiment, after the baffle 22 and the mating plate 29 come into contact, the first air intake port 32 and the second air intake port 34 are connected. At the same time, when the piston 27 slides in the slide rail 210, it causes the air guide tube 31 to draw in air. Finally, the suction force is transmitted to the cavity 35 through the second air intake port 34. Then, the suction force acts on the suction cup 36, causing the suction cup 36 to adsorb and fix the conductive film 99. At the same time, the sliding crossbar 23 drives the CCD detection camera 24 to slide in the first slide rail 25 and take pictures. The conductive film 99 is adsorbed and fixed, which can prevent the conductive film 99 from shifting or sliding when it is photographed by the CCD detection camera 24, so as not to cause the image captured by the CCD detection camera 24 to be distorted. During this process, the piston 27 continues to slide in the slide rail 210, and the suction force becomes larger and larger. The pressure valve 33 set on the slide rail 210 can keep the pressure at a preset level.

[0061] like Figure 1 , Figure 3 and Figure 8As shown, the testing chamber 12 is equipped with a spraying mechanism 4, which includes an air compressor 41. The air compressor 41 is connected to a spraying head 42 through a pipe, and the spraying head 42 is directed toward the double-speed chain conveyor line 11.

[0062] The detection chamber 12 is equipped with a cleaning mechanism 5, which includes an L-shaped bracket 51 and a cleaning sponge 52 on the L-shaped bracket 51. The cleaning sponge 52 is located on the moving path of the CCD detection camera 24.

[0063] In this embodiment, the air compressor 41 sprays high-pressure airflow from the nozzle 42 through the pipeline to blow the conductive film 99 on the carrier plate 21, so that the dust and impurities on the conductive film 99 are cleaned, preventing the dust and impurities from causing the image captured by the CCD detection camera 24 to be inaccurate.

[0064] like Figure 11 As shown, the sliding crossbar 23 slides a certain distance in the first slide rail 25 and then enters the second slide rail 211. Subsequently, the lower end of the CCD detection camera 24 comes into contact with the cleaning sponge 52. When the sliding crossbar 23 slides in the second slide rail 211, it will cause the CCD detection camera 24 to rise and rotate counterclockwise. When it resets, the CCD detection camera 24 rotates clockwise. Thus, during the contact between the CCD detection camera 24 and the cleaning sponge 52, it is similar to the CCD detection camera 24 being wiped by the cleaning sponge 52, removing dust from the surface of the CCD detection camera 24 and improving the accuracy of the images captured by the CCD detection camera 24.

[0065] The present invention also provides a conductive film to prevent accidental contact, comprising:

[0066] A substrate layer, which is a transparent and flexible material, is used to provide structural support;

[0067] A conductive layer is disposed on the substrate layer and includes a plurality of spaced conductive units, the conductive units being used to detect touch signals;

[0068] An anti-accidental touch layer covers the conductive layer and includes multiple sensing areas and isolation areas. The sensing areas correspond to the conductive units and are used to enhance the sensitivity of touch signals. The isolation areas are used to isolate signal interference between adjacent conductive units.

[0069] A protective layer covers the anti-accidental contact layer and is used to protect the conductive layer and the anti-accidental contact layer from external damage;

[0070] A signal processing module, electrically connected to the conductive layer, is used to receive and process touch signals detected by the conductive unit, and to distinguish between intentional touches and accidental touches using a preset algorithm.

[0071] The workflow is as follows:

[0072] The conductive film 99 to be tested is placed on the carrier plate 21. The carrier plate 21 and the conductive film 99 are moved by the double-speed chain conveyor 11. Then, the carrier plate 21 carries the conductive film 99 into the testing chamber 12. During this process, the baffle 22 on the carrier plate 21 contacts the mating plate 29, and the carrier plate 21 pushes the mating plate 29 to drive the sliding crossbar 23 to slide in the first slide rail 25. The conductive film 99 is below the CCD inspection camera 24, and the carrier plate 21 and the sliding crossbar 23 and the CCD inspection camera 24 are always moving synchronously. At this time, the CCD inspection camera 24 takes multiple pictures of the conductive film 99 and transmits the pictures to the terminal analysis system to perform quality analysis on the conductive film 99. Subsequently, baffle 22 continues to push mating plate 29, causing sliding crossbeam 23 to move. When sliding crossbeam 23 enters from slide rail 25 into slide rail 211, the height of sliding crossbeam 23 gradually increases, causing mating plate 29 to move upward relative to baffle 22. After sliding crossbeam 23 reaches the preset height, mating plate 29 disengages from baffle 22. At this point, baffle 22 no longer pushes mating plate 29. Then, material carrier plate 21 carries the conductive film 99, which has finished testing, into the next process. When sliding crossbeam 23 moves in slide rail 25 and slide rail 211, it pulls pull rope 26. Pull rope 26 pulls piston 27 to slide in slide rail 210. At the same time, spring 28 is compressed. When mating plate 29 and baffle 22 separate, spring 28 extends and drives piston 27 to slide back to its original position. This causes piston 27 to pull pull rope 26 to pull sliding crossbeam 23 and CCD inspection camera 24 back to their original position, thus enabling the next conductive film 99 to be inspected. During the above process, after the baffle 22 and the mating plate 29 come into contact, the first air intake port 32 and the second air intake port 34 are connected. At the same time, when the piston 27 slides in the slide rail 210, it causes the air guide tube 31 to draw in air. Finally, the suction force is transmitted to the cavity 35 through the second air intake port 34. Then, the suction force acts on the suction cup 36, causing the suction cup 36 to adsorb and fix the conductive film 99. At the same time, the sliding crossbar 23 drives the CCD inspection camera 24 to slide in the first slide rail 25 and take pictures. The conductive film 99 is adsorbed and fixed, which can prevent the conductive film 99 from shifting or sliding when it is photographed by the CCD inspection camera 24, thus preventing the distortion of the picture taken by the CCD inspection camera 24. In this process, the sliding crossbar 23 slides a certain distance in the first slide rail 25 and then enters the second slide rail 211. Subsequently, the lower end of the CCD inspection camera 24 comes into contact with the cleaning sponge 52. When the sliding crossbar 23 slides in the second slide rail 211, it will cause the CCD inspection camera 24 to rise and rotate counterclockwise. When it returns to its original position, the CCD inspection camera 24 rotates clockwise. This process, during which the CCD inspection camera 24 comes into contact with the cleaning sponge 52, is similar to the CCD inspection camera 24 being wiped by the cleaning sponge 52, removing dust from the surface of the CCD inspection camera 24 and improving the accuracy of the images captured by the CCD inspection camera 24.During the above process, the air compressor 41 sprays high-pressure airflow from the nozzle 42 through the pipeline to blow the conductive film 99 on the carrier plate 21, so that the dust and impurities on the conductive film 99 are cleaned, preventing the dust and impurities from causing the image captured by the CCD detection camera 24 to be inaccurate.

[0073] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of protection claimed by the present invention. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. An optical inspection device for detecting the quality of a conductive film, comprising a synchronous inspection mechanism (2), the synchronous inspection mechanism (2) comprising a carrier plate (21), characterized in that, Symmetrical baffles (22) are fixedly connected to both ends of the upper surface of the material carrier plate (21). A matching plate (29) is provided on the moving path of the baffle (22). A sliding crossbar (23) is fixedly connected to the upper surface of the matching plate (29). The two ends of the sliding crossbar (23) are slidably connected to the first slide rail (25). A second slide rail (211) is also provided at the rear end of the first slide rail (25). Among them, the two ends of the sliding crossbar (23) are fixedly connected to the pull rope (26), and the other end of the pull rope (26) is fixedly connected to the piston (27). The piston (27) is slidably connected in the slide rail (210). A spring (28) is nested on the pull rope (26). The spring (28) is located between the piston (27) and the slide rail (210) near the bottom of the sliding crossbar (23). A CCD inspection camera (24) is fixedly connected to the middle of the sliding crossbar (23); The synchronous detection mechanism (2) is located on the conveying mechanism (1), which includes a double-speed chain conveyor (11) and a material carrier plate (21) is located on the double-speed chain conveyor (11). The double-speed chain conveyor line (11) is also equipped with a testing chamber (12). The first slide rail (25) and the second slide rail (211) are both located on the inner side wall of the testing chamber (12), and the slide rail (210) is located in the wall thickness of the testing chamber (12). The first slide rail (25) is parallel to the double-speed chain conveyor line (11), and the second slide rail (211) is arc-shaped and its height gradually increases, so that the height of the sliding crossbar (23) gradually increases after passing through the first slide rail (25) and entering the second slide rail (211).

2. The optical inspection device for detecting the quality of conductive films as described in claim 1, characterized in that, The testing chamber (12) is equipped with a stabilizing mechanism (3), which includes a second suction port (34). The second suction port (34) is located on a baffle (22), and a sealing gasket is also provided on the second suction port (34). A cavity (35) is located below the second suction port (34), and the cavity (35) is located inside the material carrier plate (21). The second suction port (34) and the cavity (35) are connected. A suction cup (36) is provided on the upper surface of the material carrier plate (21). The cavity (35) and the suction cup (36) are connected. 36) Connecting, the mating plate (29) is provided with a first air inlet (32), the first air inlet (32) extends into the sliding cross frame (23) and the mating plate (29), the sliding cross frame (23) is fixedly connected with an air guide pipe (31), the air guide pipe (31) and the first air inlet (32) are connected, the other end of the air guide pipe (31) is wound up by a coiler and fixedly connected to the slide rail (210) and connected, the second air inlet (34) is connected to the first air inlet (32) during movement.

3. The optical inspection device for detecting the quality of conductive films as described in claim 2, characterized in that, The piston (27) and the slide (210) are sealed and slidably connected. A pressure valve (33) is provided at the end of the slide (210) away from the sliding crossbar (23). The position of the piston (27) during movement is always closer to the sliding crossbar (23) than the connection position between the air pipe (31) and the slide (210).

4. The optical inspection device for detecting the quality of conductive films as described in claim 2, characterized in that, The conductive film (99) to be tested is placed on the carrier plate (21), and the suction cups (36) at the top of the carrier plate (21) are pre-designed according to the type of conductive film (99).

5. The optical inspection device for detecting the quality of conductive films as described in claim 4, characterized in that, The testing chamber (12) is equipped with a spraying mechanism (4), which includes an air compressor (41). The air compressor (41) is connected to a spraying head (42) through a pipe, and the spraying head (42) faces the double-speed chain conveyor line (11).

6. The optical inspection device for detecting the quality of conductive films as described in claim 5, characterized in that, The detection chamber (12) is equipped with a cleaning mechanism (5), which includes an L-shaped bracket (51) and a cleaning sponge (52) on the L-shaped bracket (51). The cleaning sponge (52) is located on the moving path of the CCD detection camera (24).

Images