Power supply test fixture and test device
Through the control module and pull-load module of the power supply test fixture, the automatic testing of electronic equipment power is solved, and the problems of testing complexity and inefficiency in the existing technology are improved, and the testing efficiency and applicability are improved.
Patent Information
- Application Number
- CN202410052008.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-01-11
- Publication Date
- 2025-07-11
AI Technical Summary
The prior art requires a variety of testing instruments and complex testing processes when testing electronic devices, resulting in inefficiency in testing.
The power supply test fixture is adopted, including a control module and a pull-load module. By outputting multiple control signals, the pull-load module is controlled to be in different load states. The test circuit is used to obtain analog signals and process them by the processor and then transmitted to the upper computer to realize automated testing.
Power supply testing can be completed without the need for instruments such as oscilloscopes, oscilloscope probes and electronic loads, simplifying the test process and improving testing efficiency and applicability.
Smart Images
Figure CN120294370A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing technologies, and in particular, to a power supply test fixture and a test device. Background Art
[0002] With the development of society, electronic devices are becoming more and more standardized and modularized. Some components / parts in electronic devices can be developed in parallel or asynchronously by different manufacturers, which can give full play to the advantages of different manufacturers, shorten the development cycle, reduce R & D investment, lower the cost of electronic devices, and improve the cost performance of electronic devices. As a result, for a variety of components / parts from different manufacturers, the workload of testing the performance of these components / parts has increased significantly, such as testing the form of components / parts, the flexibility of high-speed signal design, and the test boundary, etc.
[0003] At present, for a variety of standard interfaces of electronic devices, the test networking is complex, and more test instruments are required to test electronic devices, such as oscilloscopes, current probes, coaxial cables, and load meters, etc. In addition, testing electronic devices also requires test personnel to identify test waveforms and measure key data, which will result in a low test efficiency for testing electronic devices. Summary of the Invention
[0004] This application provides a power supply test fixture and a test device, which improve the test efficiency of the power supply to be tested.
[0005] To achieve the above object, this application adopts the following technical solutions.
[0006] In a first aspect, this application provides a power supply test fixture, which includes: a control module and a loading module. The loading module includes a first connector, and the loading module is coupled to the power supply to be tested through the first connector. The control module includes a processor, a first output circuit, and a first test circuit. The first output circuit is used to output a plurality of first control signals to the loading module, and the plurality of first control signals are used to control the loading module to be in different load states. The first test circuit is used to obtain the analog signals of the power supply to be tested when the loading module is in different load states, and obtain a first test result. The processor is used to receive and process the first test result, and output the processed first test result to the host computer.
[0007] Thus, the control module can output a plurality of first control signals to control the loading module to be in different load states, and then the control module can obtain the analog signals of the power supply to be tested when the loading module is in different load states through the first test circuit. The processor processes the first test result and transmits it to the host computer. In this power supply test fixture, test instruments such as oscilloscopes, oscilloscope probes, and electronic loads are not required to obtain the test result of the power supply to be tested, which simplifies the test process of the power supply to be tested and improves the test efficiency of the power supply to be tested.
[0008] In a possible design, the first output circuit includes: a digital-to-analog converter and an amplification circuit. The input end of the digital-to-analog converter is coupled to the output end of the processor, the output end of the digital-to-analog converter is coupled to the input end of the amplification circuit, and the output end of the amplification circuit is coupled to the input end of the loading module. The digital-to-analog converter is configured to convert a plurality of digital signals sent by the processor into a plurality of first control signals. The amplification circuit is configured to amplify the plurality of first control signals and output the amplified plurality of first control signals to the loading module. Thus, the control module can convert and amplify the plurality of digital signals sent by the processor through the first output circuit to obtain a plurality of first control signals that can be recognized by the loading module and whose voltage values are adapted to the loading module.
[0009] In a possible design, the first test result includes a voltage test result and a current test result. The first test circuit includes a first analog-to-digital converter, a second analog-to-digital converter, a first sampling circuit, and a second sampling circuit. The input end of the first sampling circuit is coupled to the loading module, the output end of the first sampling circuit is coupled to the input end of the first analog-to-digital converter, and the output end of the first analog-to-digital converter is coupled to the processor. The input end of the second sampling circuit is coupled to the loading module, the output end of the second sampling circuit is coupled to the input end of the second analog-to-digital converter, and the output end of the second analog-to-digital converter is coupled to the processor. The first sampling circuit is configured to sample the voltage of the power supply under test when the loading module is in different load states to obtain a voltage signal, and the first analog-to-digital converter is configured to convert the voltage signal into a digital signal to obtain the voltage test result. The second sampling circuit is configured to sample the current of the power supply under test when the loading module is in different load states to obtain a current signal. The second analog-to-digital converter is configured to convert the current signal into a digital signal to obtain the current test result. Thus, the power supply test fixture can implement the tests of test items related to the voltage signal and current signal of the power supply under test, and does not require test instruments such as an oscilloscope, an oscilloscope probe, and an electronic load, improving the test efficiency of the power supply under test.
[0010] In a possible design, the loading module includes: a first resistor and a plurality of cascaded first transistors, and the plurality of cascaded first transistors are connected in series with the first resistor. The first end of the first first transistor among the plurality of cascaded first transistors is coupled to the first end of the first connector, and the first end of the first resistor is coupled to the second end of the first connector. Thus, by making the first transistor operate in the linear region, the loading module can achieve loading slope and current control.
[0011] In a possible design, the control module further includes: a second output circuit and a second test circuit. The second output circuit is configured to output a plurality of second control signals to the load pulling module, and the plurality of second control signals are used to control the load pulling module to be in different load states. The second test circuit is configured to obtain an analog signal of the power supply under test when the load pulling module is in different load states, and obtain a second test result. The processor is further configured to receive and process the second test result, and output the processed second test result to the host computer. Thus, the power supply test fixture can be compatible with the tests of power supplies under test with multiple rated output voltages, so as to improve the applicability of the power supply test fixture, and can also test power supplies under test with multiple rated output voltages simultaneously, improving the test efficiency.
[0012] In a possible design, the load pulling module further includes a second resistor and a plurality of cascaded second transistors. The plurality of cascaded second transistors and the second resistor are connected in series, and the number of second transistors is less than the number of first transistors. The load pulling module further includes a second connector. The first end of the first transistor of the plurality of cascaded second transistors is coupled to the first end of the second connector, and the first end of the second resistor is coupled to the second end of the second connector. Thus, by making the second transistors operate in the linear region, the load pulling module can achieve load pulling slope and current control. In addition, different numbers of transistors can achieve different load currents, and can be compatible with the tests of power supplies under test with multiple rated output voltages, so as to improve the applicability of the first power supply test solution.
[0013] In a possible design, the load pulling module further includes a first adder circuit, a second adder circuit, a first capacitor, and a second capacitor. The first input terminal of the first adder circuit is coupled to the first end of the first transistor of the plurality of cascaded first transistors, the second input terminal of the first adder circuit is coupled to the first end of the first capacitor, the second end of the first capacitor is coupled to the first end of the first transistor of the plurality of cascaded second transistors, and the output terminal of the first adder circuit is coupled to the control module. The first input terminal of the second adder circuit is coupled to the first end of the first transistor of the plurality of cascaded second transistors, the second input terminal of the second adder circuit is coupled to the first end of the second capacitor, the second end of the second capacitor is coupled to the first end of the first transistor of the plurality of cascaded first transistors, and the output terminal of the second adder circuit is coupled to the control module.
[0014] In a possible design, the load pulling module further includes a first subtractor circuit and a second subtractor circuit. The first input terminal of the first subtractor circuit is coupled to the first end of the first resistor, the second input terminal of the first subtractor circuit is coupled to the second end of the first resistor, and the output terminal of the first subtractor circuit is coupled to the control module. The first input terminal of the second subtractor circuit is coupled to the first end of the second resistor, the second input terminal of the second subtractor circuit is coupled to the second end of the second resistor, and the output terminal of the second subtractor circuit is coupled to the control module.
[0015] In a possible design, the power supply test fixture further includes: a third connector and a fourth connector. The power supply test fixture outputs the processed first test result to the host computer through the third connector, and the power supply test fixture is coupled to an external power supply through the fourth connector. Thus, two-way communication can be achieved between the power supply test fixture and the host computer. The power supply test fixture can obtain the configuration signal sent by the host computer, and the power supply test fixture can also send the first test result or the second test result to the host computer. In addition, the power supply test fixture can be independently powered by an external power supply, and the performance of the power supply under test during hot insertion and hot extraction can be tested.
[0016] In a possible design, the first test result includes at least one of the following: the power-on and power-off waveforms, the power-on and power-off timings, the ripple and noise, the output voltage value, the transient current, and the test result of overcurrent protection.
[0017] In a second aspect, the present application provides a test device, which includes a plurality of power supply test fixtures as in the first aspect, and the plurality of power supply test fixtures are cascaded.
[0018] In a third aspect, the present application provides an electronic device, which includes a printed circuit board and the power supply test fixture as in the first aspect.
[0019] In a fourth aspect, the present application provides a computer-readable storage medium, which includes computer instructions. When the computer instructions run on an electronic device, the electronic device is caused to execute the power supply test method in any one of the above aspects and any possible implementation manner.
[0020] In a fifth aspect, the present application provides a computer program product. When the computer program product runs on a computer or a processor, the computer or the processor is caused to execute the power supply test method in any one of the above aspects and any possible implementation manner.
[0021] These aspects or other aspects of the present application will be more clearly understood in the following description. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 It is a test scenario diagram of an expansion component provided by the present application;
[0023] Figure 2 It is a schematic structural diagram of a power supply test fixture provided by the present application;
[0024] Figure 3 It is another schematic structural diagram of a power supply test fixture provided by the present application;
[0025] Figure 4 It is yet another schematic structural diagram of a power supply test fixture provided by the present application;
[0026] Figure 5 Schematic diagram of another power test fixture provided by this application;
[0027] Figure 6 Schematic diagram of a test device provided by this application;
[0028] Figure 7 Flow chart of a power test method provided by this application. Specific implementation manners
[0029] For ease of understanding, some descriptions of concepts related to this application are given as examples for reference. As follows:
[0030] Power integrity (PI), that is, the quality of the power waveform. In the power distribution network (PDN), considering the system power supply network comprehensively, the influence of noise on the power supply is eliminated or weakened. Among them, the design goal of power integrity is to control the power supply noise within a very small tolerance range (for example, ±2.5%), and respond to the rapid change of current by the load in real time, so as to provide a clean and stable voltage for the system and a low-impedance return path for other signals.
[0031] Next, the technical solutions in this application will be described with reference to the accompanying drawings in this application. Among them, in the description of this application, unless otherwise specified, " / " means "or". For example, A / B can mean A or B; "and / or" in this article is just a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of this application, "a plurality of" means two or more than two.
[0032] Hereinafter, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of this embodiment, unless otherwise specified, the meaning of "a plurality of" is two or more.
[0033] When testing the power integrity of a power supply under test, test instruments such as a load tester, coaxial cables, probes, and oscilloscopes are often required to form a set of test systems. In this test system, relevant test parameters of the oscilloscope need to be set. The specific test parameters of the oscilloscope are shown in Table 1, and Table 1 shows the measurement specifications and test specifications corresponding to the test items of the power supply under test. Among them, the test items can include ripple noise, dynamic load characteristics, power-on and power-off waveforms, power-on and power-off timings, metal oxide semiconductor (MOS) transistor voltage stress, output voltage value, boost voltage value, multi-phase output current sharing test, and over-current protection test.
[0034] Table 1
[0035]
[0036]
[0037] Specifically, if testing the input power supply of a test component, a standard direct current (DC) source productized component (such as an oscilloscope, oscilloscope probe, and coaxial cable, etc.) can be used for combined testing, and the device receiving end can test current, voltage, ripple noise, etc. If testing the output power supply of a test component, an electronic load is required to implement loading when testing current and voltage, and an oscilloscope is used to test ripple noise.
[0038] As Figure 1 shown, Figure 1 it shows a signal source ( Figure 1 denoted by "S" in Figure 1 ), an expansion component ( Figure 1 denoted by "D" in
[0039] ), and an oscilloscope (
[0040] denoted by "D" in Figure 1 ). Among them, the signal source can be used to generate power signals, the expansion component can be a device under test (DUT), specifically, the expansion component can be an expansion board, a backplane, and a riser, etc. The oscilloscope can obtain various signals on the expansion component through an oscilloscope probe. Multiple test items of the expansion component can be tested through the oscilloscope and the signal source to obtain multiple test results. The tester can determine whether the test results meet the test standards to determine whether the expansion component passes the test.
[0039] As can be seen from Table 1, there are many test items for power integrity, and the required test instruments are also relatively many, and the test scenarios are complex.
[0040] Accordingly, the present application provides a power supply test fixture. The power supply test fixture includes a control module and a loading module. Among them, the control module can output multiple first control signals to control the loading module to be in different load states. Then, the control module can obtain the analog signal of the power supply under test when the loading module is in different load states through a first test circuit. After the processor processes the first test result, it is transmitted to the host computer. In this power supply test fixture, test instruments such as an oscilloscope, an oscilloscope probe, and an electronic load are not required to obtain the test result of the power supply under test, which simplifies the test process of the power supply under test and improves the test efficiency of the power supply under test.
[0041] In the above scenario, the power supply test fixture provided by the present application can be applied to the test of complex electronic device hardware systems with multiple components, multiple device models, multiple peripheral models, and multiple manufacturers, such as servers and storage devices. The power supply test fixture can be used to test the power modules of various terminal devices. Among them, the terminal devices can be mobile phone terminals, tablets, laptop computers, vehicle-mounted terminals, servers, etc.
[0042] The following further introduces the power supply test fixture provided by the present application.
[0043] As Figure 2 shown, Figure 2 is a schematic structural diagram of a power supply test fixture provided by the present application. The power supply test fixture 20 includes a control module 21 and a loading module 22. Among them, the loading module 22 includes a first connector 221. The loading module 22 is coupled to the power supply under test through the first connector 221. The control module 21 includes a processor 211, a first output circuit 212, and a first test circuit 213. Among them, the power supply under test can be provided with a connector that matches the first connector 221, and the signal of the power supply under test is transmitted to the loading module 22 through this connector and the first connector 221.
[0044] Among them, the first output circuit 212 is used to output multiple first control signals to the loading module 22, and the multiple first control signals are used to control the loading module 22 to be in different load states.
[0045] Exemplarily, the load state can include a constant current state, a constant resistance state, a constant voltage state, and a constant power state. Taking the load state as the constant current state as an example, different load states can be different load currents. Specifically, the control module 21 can accurately adjust the load current of the power supply under test by outputting multiple first control signals to the loading module 22.
[0046] For example, assuming that the maximum load current of the power supply under test is 3A, if the ripple and noise of the power supply under test are to be tested, the loading module 22 can be adjusted to be in a short-circuit state, a 1.5A load current state, and a 3A load current state respectively through multiple first control signals.
[0047] For another example, assume that the maximum load current of the power supply under test is 3 A. When testing the multi-phase output current sharing of the power supply under test, the loading module 22 can be adjusted to a load current state of 0.3 A and a load current state of 3 A through multiple first control signals, where the load current increases by 10% each time.
[0048] Among them, the first test circuit 213 is used to obtain the analog signal of the power supply under test when the loading module 22 is in different load states, and obtain the first test result.
[0049] Exemplarily, the analog signal can include a voltage signal and a current signal. For example, continuing with the example of testing the ripple and noise of the power supply under test, assume that the rated output voltage of the power supply under test is 3.3 V. When the loading module 22 is in a short-circuit state, a 1.5 A load current state, and a 3 A load current state respectively, the first test circuit 213 can obtain the voltage signal of the power supply under test respectively to obtain multiple ripple and noise values of the power supply under test, that is, the first test result.
[0050] For another example, when testing the multi-phase output current sharing of the power supply under test, for the current signal when the loading module 22 increases from a load current state of 0.3 A to a load current state of 3 A at a growth rate of 10%, the first test circuit 213 can obtain the current signal of the power supply under test respectively to obtain the current sharing error, that is, the first test result.
[0051] Among them, the processor 211 is used to receive and process the first test result, and output the processed first test result to the host computer.
[0052] Exemplarily, the processor 211 can be a device such as a complex programmable logic device (CPLD) or a field programmable gate array (FPGA). The host computer can be a terminal device, such as a mobile phone, a tablet computer, and a laptop computer.
[0053] Among them, the first test result can include at least one of the following: power-on and power-off waveforms, power-on and power-off timings, ripple and noise, output voltage values, transient currents, and overcurrent protection test results.
[0054] Exemplarily, the processor 211 can receive and process the first test result of the first test circuit 213, obtain a test report, and output the test report to the host computer. Specifically, if the processor 211 determines that the values of multiple ripples and noises obtained by the first test circuit 213 are all less than 50 mV, it indicates that the test item of the ripple and noise of the power supply under test passes. Or, if the processor 211 determines that the current sharing error when the load current is less than 20% obtained by the first test circuit 213 is between 10% and 40%, and the current sharing error when the load current is less than 12% is between 50% and 100%, it indicates that the test item of the multi-phase output current sharing test of the power supply under test passes.
[0055] In addition, the processor 211 can also analyze the test waveform. For example, when testing the power-on and power-off waveforms, the processor 211 can determine the overshoot and negative overshoot of the test waveform.
[0056] Therefore, the power supply test fixture 20 provided by the present application can get rid of the dependence on oscilloscopes, electronic loads, and tool kits, realize the automatic testing of the power supply under test, reduce the test cost of the power supply under test, and improve the test efficiency.
[0057] Optionally, as Figure 3 shown, Figure 3 is a schematic structural diagram of another power supply test fixture provided by the present application. Among them, the first output circuit 212 can include a digital-to-analog converter (DAC) 2121 and an amplification circuit 2122. The input end of the digital-to-analog converter 2121 is coupled to the output end of the processor 211, the output end of the digital-to-analog converter 2121 is coupled to the input end of the amplification circuit 2122, and the output end of the amplification circuit 2122 is coupled to the input end of the loading module 22. Among them, the digital-to-analog converter 2121 is used to convert multiple digital signals sent by the processor 211 into multiple first control signals, and the amplification circuit 2122 is used to amplify the multiple first control signals and output the amplified multiple first control signals to the loading module 22.
[0058] Exemplarily, the digital-to-analog converter 2121 is a device that converts digital signals into analog signals. In a digital system, signals are stored and transmitted in digital form. The digital-to-analog converter 2121 can convert the signals in digital form into analog signals, so that the signals of the digital system can be recognized by the outside world (people or other non-digital systems). Thus, when the output signal of the processor 211 is a digital signal, the digital-to-analog converter 2121 can convert the digital signal into an analog signal, that is, the first control signal, and the first control signal can be recognized by the loading module.
[0059] Exemplarily, the amplifier circuit 2122 can be a device that amplifies the voltage or power of an input signal. The amplifier circuit 2122 can be composed of electron tubes / transistors, a power transformer, and other electrical components. In one example, taking the amplification of voltage by the amplifier circuit 2122 as an example, assuming that the analog signal output by the digital-to-analog converter 2121 is the first voltage value, the amplifier circuit 2122 can amplify the first voltage value to a second voltage value adapted to the loading module 22.
[0060] Optionally, continuing to refer to Figure 3 , the first test result includes a voltage test result. The first test circuit 213 includes a first analog-to-digital converter 2131 and a first sampling circuit 2132. Among them, the input end of the first sampling circuit 2132 is coupled to the loading module 22, the output end of the first sampling circuit 2132 is coupled to the input end of the first analog-to-digital converter 2131, and the output end of the first analog-to-digital converter 2131 is coupled to the processor 211. The first sampling circuit 2132 is used to sample the voltage of the power supply to be tested when the loading module 22 is in different load states to obtain a voltage signal. The first analog-to-digital converter 2131 is used to convert the voltage signal into a digital signal to obtain a voltage test result.
[0061] Exemplarily, the first sampling circuit 2132 can sample the voltage signal on the loading module 22, convert the continuous voltage signal y(t) into a sampling value y(kT), where k is a positive integer, T is the sampling period, and y(kT) can be abbreviated as y[k], which is repeated every T seconds. Among them, the sampling period is determined by the sampling frequency. The higher the sampling frequency, the closer the obtained signal is to the original signal. Specifically, the sampling method of the first sampling circuit 2132 can be divided into: timed sampling and free running sampling. Among them, timed sampling can use a timer to trigger the sampling process, that is, the processor 211 provides a pulse or interrupt every T seconds to trigger a sampling process. Free running sampling can be to perform a sampling process in each code execution cycle.
[0062] Exemplarily, the first sampling circuit 2132 can include two types of circuits: non-isolated type and isolated type. If the first sampling circuit 2132 is of the non-isolated type, the first sampling circuit 2132 can include a voltage divider sampling circuit. If the first sampling circuit 2132 is of the isolated type, the first sampling circuit 2132 can also include a sampling circuit composed of elements such as Hall elements, isolated operational amplifiers, optocouplers, and current transformers.
[0063] Exemplarily, an analog to digital converter (ADC) can be a converter that converts an analog quantity after being compared and processed with a standard quantity (or reference quantity) into a discrete signal represented by a binary numerical value. Among them, the first analog to digital converter 2131 can be a converter that converts a voltage signal into a digital signal, that is, the first analog to digital converter 2131 converts the sampled value y(kT) output by the first sampling circuit 2132 into a digital signal.
[0064] For example, if it is desired to test the power-on waveform of the power supply under test, the first sampling circuit 2132 can sample multiple voltage values of the power supply under test from the start of power-on to the stable output voltage value, obtaining multiple sampled values. The first analog to digital converter 2131 converts the multiple sampled values into multiple digital signals, and the processor 211 can restore the power-on waveform based on the multiple digital signals to obtain the overshoot and negative overshoot.
[0065] It can be understood that the first sampling circuit 2132 and the first analog to digital converter 2131 can also be integrated in a module, and this module can implement the functions of sampling and conversion.
[0066] Optionally, continuing to refer to Figure 3 , the first test result includes a current test result. The first test circuit 213 includes a second analog to digital converter 2133 and a second sampling circuit 2134. Among them, the input end of the second sampling circuit 2134 is coupled to the load pulling module 22, the output end of the second sampling circuit 2134 is coupled to the input end of the second analog to digital converter 2133, and the output end of the second analog to digital converter 2133 is coupled to the processor. The second sampling circuit 2134 is used to sample the current of the power supply under test when the load pulling module 22 is in different load states, obtaining a current signal. The second analog to digital converter 2133 is used to convert the current signal into a digital signal, obtaining a current test result.
[0067] Exemplarily, the second sampling circuit 2134 can sample the current signal on the load pulling module 22, converting the continuous current signal I(t) into a sampled value I(kT), where k is a positive integer and T is the sampling period, and it is repeated once every time interval of T seconds. Among them, the second sampling circuit 2134 can include two types of circuits: isolated and non-isolated. If the second sampling circuit 2134 is non-isolated, the second sampling circuit 2134 can be a current voltage division sampling circuit. If the second sampling circuit 2134 is isolated, the second sampling circuit 2134 can include a sampling circuit composed of a Hall current sensor, etc.
[0068] Exemplarily, the second analog to digital converter 2133 can be a converter that converts a current signal into a digital signal, that is, the second analog to digital converter 2133 can convert the sampled value I(kT) output by the second sampling circuit 2134 into a digital signal.
[0069] It is understandable that the second sampling circuit 2134 and the second analog-to-digital converter 2133 can also be integrated into one module, and this module can implement the functions of sampling and conversion.
[0070] Optionally, continue to refer to Figure 3 , the loading module 22 includes a first resistor 222 and a plurality of cascaded first transistors 223. The plurality of cascaded first transistors 223 and the first resistor 222 are connected in series, and each transistor 223 includes a control terminal. The first end of the first first transistor 223 among the plurality of cascaded first transistors 223 is coupled to the first end of the first connector 221, and the first end of the first resistor 222 is coupled to the second end of the first connector 221. Among them, the first output circuit 212 is specifically configured to output a plurality of first control signals to the control terminals of the plurality of first transistors 223 respectively.
[0071] Exemplarily, the first transistor 223 can be a metal oxide semiconductor (MOS) transistor. The plurality of first transistors 223 are cascaded to achieve a constant current load. Each stage of the cascaded plurality of first transistors 223 can be independently controlled and can be controlled by the plurality of first control signals output by the first output circuit 212. Specifically, the first control signal can control the first transistor 223 to operate in the linear region. At this time, the first transistor 223 is equivalent to a variable resistor, and the current of the first transistor 223 in the linear region does not change with the change of voltage, thereby realizing the control of the loading slope and current.
[0072] Optionally, as Figure 4 shown, Figure 4 is a schematic structural diagram of another power supply test fixture provided by the present application. The control module 21 may further include a second output circuit 214 and a second test circuit 215. The second output circuit 214 is configured to output a plurality of second control signals to the loading module 22, where the plurality of second control signals are used to control the loading module 22 to be in different load states. The second test circuit 215 is configured to obtain the analog signal of the power supply under test when the loading module 22 is in different load states, and obtain a second test result. The processor 211 is further configured to receive and process the second test result and output the processed second test result to the host computer.
[0073] Exemplarily, the second output circuit 214 may have the same structure as the first output circuit 212. Specifically, the second output circuit 214 may include a digital-to-analog converter and an amplification circuit. The digital-to-analog converter is configured to convert a plurality of digital signals sent by the processor 211 into a plurality of second control signals, and the amplification circuit is configured to amplify the plurality of second control signals and output the amplified plurality of second control signals to the loading module 22.
[0074] Exemplarily, the second test circuit 215 may have the same structure as the first test circuit 213. Specifically, the second test circuit 215 may include a first sampling circuit and a first analog-to-digital converter. The first sampling circuit is configured to sample the voltage of the power supply under test when the loading module 22 is in different load states, so as to obtain a voltage signal. The first analog-to-digital converter is configured to convert the voltage signal into a digital signal to obtain a voltage test result. In addition, the second test circuit 215 may further include a second sampling circuit and a second analog-to-digital converter. The second sampling circuit is configured to sample the current of the power supply under test when the loading module 22 is in different load states, so as to obtain a current signal. The second analog-to-digital converter is configured to convert the current signal into a digital signal to obtain a current test result.
[0075] Optionally, continuing to refer to Figure 4 , the loading module 22 may further include a second resistor 224 and a plurality of cascaded second transistors 225. The plurality of cascaded second transistors 225 and the second resistor 224 are connected in series, and each second transistor 225 includes a control terminal. The loading module 22 may further include a second connector 226. The first end of the first transistor 225 of the plurality of cascaded second transistors 225 is coupled to the second connector 226, and the first end of the second resistor 224 is coupled to the second end of the second connector 226. Wherein, the second output circuit 214 is specifically configured to output a plurality of second control signals to the control terminals of the plurality of second transistors 225 respectively. The second connector 226 may be the same connector as the first connector 221, and the loading module 22 may be coupled to the power supply under test through the second connector 226.
[0076] Exemplarily, the second transistor 225 may be the same transistor as the first transistor 223. The plurality of second transistors 225 also adopt a cascaded manner, which can achieve a constant current load. Each stage of the cascaded plurality of second transistors 225 can be independently controlled and can be controlled by the plurality of second control signals of the second output circuit 214. Specifically, the second control signal can control the second transistor 225 to operate in the linear region. At this time, the second transistor 225 is equivalent to a variable resistor, and the current of the second transistor 225 in the linear region does not change with the change of voltage, thereby realizing the control of the loading slope and current. Wherein, the loading module may also be coupled to the power supply under test through the second connector 226.
[0077] Among them, the number of the second transistors 225 is less than that of the first transistors 223. Specifically, the loading module 22 may include 32 first transistors 223 and 8 second transistors 225. That is, the first transistors 223 can achieve a larger range of load currents and can precisely adjust the magnitude of the load current. In a specific example, the first transistors 223 and the first resistors 222 can be coupled to a power supply under test with a rated output voltage of 12V through the first connector 221, and the second transistors 225 and the second resistors 224 can be coupled to a power supply under test with a rated output voltage of 5V through the second connector 226.
[0078] It can be understood that the power supply test fixture 20 provided in the present application may further include more output circuits and test circuits to be compatible with the tests of power supplies under test with various rated output voltages, so as to improve the applicability of the power supply test fixture 20, and can also test power supplies under test with multiple rated output voltages simultaneously to improve the test efficiency.
[0079] Optionally, continuing to refer to Figure 4 , the loading module 22 may further include a first adder circuit 227, a second adder circuit 228, a first capacitor 229, and a second capacitor 2210. The first input terminal of the first adder circuit 227 is coupled to the first terminal of the first one of the multiple first transistors 223, the second input terminal of the first adder circuit 227 is coupled to the first terminal of the first capacitor 229, the second terminal of the first capacitor 229 is coupled to the first terminal of the first one of the multiple second transistors 225, and the output terminal of the first adder circuit 227 is coupled to the control module 21. The first input terminal of the second adder circuit 228 is coupled to the first terminal of the first one of the multiple second transistors 225, the second input terminal of the second adder circuit 228 is coupled to the first terminal of the second capacitor 2210, the second terminal of the second capacitor 2210 is coupled to the first terminal of the first one of the multiple first transistors 223, and the output terminal of the second adder circuit 228 is coupled to the control module 21.
[0080] Exemplarily, continuing with the first transistor 223, the first resistor 222, and the power supply under test with a rated output voltage of 12V, as well as the second transistor 225, the second resistor 224, and the power supply under test with a rated output voltage of 5V as an example, the voltage value at the first end of the first one of the multiple first transistors 223 is approximately 12V, and the voltage value at the first end of the first one of the multiple second transistors 225 is approximately 5V. Then, the voltage value at the first input terminal of the first adder circuit 227 is approximately 12V, and the voltage value at the second end of the first capacitor 229 coupled to the second input terminal of the first adder circuit 227 is approximately 5V. Thus, the sampling accuracy of the first sampling circuit 2132 can be improved. Additionally, the voltage value at the first input terminal of the second adder circuit 228 is approximately 5V, and the voltage value at the second end of the second capacitor 2210 coupled to the second input terminal of the second adder circuit 228 is approximately 12V. Thus, the test accuracy of the second test circuit 215 can be improved.
[0081] Optionally, continuing to refer to Figure 4 , the loading module 22 may further include a first subtraction circuit 2211 and a second subtraction circuit 2212. The first input terminal of the first subtraction circuit 2211 is coupled to the first end of the first resistor 222, the second input terminal of the first subtraction circuit 2211 is coupled to the second end of the first resistor 222, and the output terminal of the first subtraction circuit 2211 is coupled to the control module 21. The first input terminal of the second subtraction circuit 2212 is coupled to the first end of the second resistor 224, the second input terminal of the second subtraction circuit 2212 is coupled to the second end of the second resistor 224, and the output terminal of the second subtraction circuit 2212 is coupled to the control module 21.
[0082] Exemplarily, the first subtraction circuit 2211 may be a current amplification circuit, which can amplify the current signal and improve the sampling accuracy of the second sampling circuit 2134. Additionally, the second subtraction circuit 2212 may have the same structure as the first subtraction circuit 2211.
[0083] Optionally, as Figure 5 shown, Figure 5 is a structural diagram of another power supply test fixture provided by the present application. The power supply test fixture 20 may include a third connector 23 and a fourth connector 24. Among them, the power supply test fixture 20 outputs the processed first test result to the host computer through the third connector 23, and the power supply test fixture 20 is coupled to an external power supply through the fourth connector 24. Among them, Figure 5 the power supply test fixture shown in Figure 2 、 Figure 3 and Figure 4 shown in may be understood as a main power supply test fixture,
[0084] Exemplarily, the third connector 23 is an interface that can communicate with a host computer, such as a Gigabit Ethernet (GE) interface or a serial port. The host computer can send a configuration signal to the processor 211 through the third connector 23, and this configuration signal can be used to set the parameters of the loading module 22. The processor 211 can also send the processed test results, such as the first test result and the second test result, to the host computer through the third connector 23.
[0085] Exemplarily, the fourth connector 24 can be a power supply interface of the power test fixture 20. The power test fixture 20 can be powered by a separate external power supply. Thus, the power test fixture 20 can achieve hot plugging and hot unplugging, where hot plugging and hot unplugging mean inserting and unplugging when the power test fixture 20 is in the working state. Specifically, before the power test fixture 20 is connected to the power supply under test, the load current of the loading module 22 can be set. Additionally, when the power test fixture 20 is disconnected from the power supply under test, the normal operation of the first sampling circuit 2132 or the second sampling circuit 2134 can be ensured.
[0086] Optionally, as Figure 6 shown, Figure 6 is a schematic structural diagram of a test device provided by the present application. The test device 60 can include a main power test fixture and a plurality of cascaded slave power test fixtures. The main power test fixture further includes a fifth connector 25, and the main power test fixture is coupled to the first-stage slave power test fixture among the plurality of cascaded slave power test fixtures through the fifth connector 25. Each slave power test fixture further includes a sixth connector 26 and a seventh connector 27. The slave power test fixture is coupled to the previous-stage slave power test fixture through the sixth connector 26, and the slave power test fixture is coupled to the next-stage slave power test fixture through the seventh connector 27.
[0087] Exemplarily, Figure 6 shows a plurality of slave power test fixtures, which are respectively slave power test fixture 20_1, slave power test fixture 20_2,..., slave power test fixture 20_n, where n is an integer greater than or equal to 1. In a possible example, n can be 24, that is, the test device 60 can include 24 slave power test fixtures. Each slave power test fixture can include a sixth connector 26 and a seventh connector 27. For example, the slave power test fixture 20_1 can include a sixth connector 26_1 and a seventh connector 27_1, and the slave power test fixture 20_2 can include a sixth connector 26_2 and a seventh connector 27_2. Additionally, the power supply under test can be coupled to the main power test fixture and the plurality of slave power test fixtures respectively through a plurality of eighth connectors.
[0088] Exemplarily, the fifth connector 25, the sixth connector 26, and the seventh connector 27 can all be type-C interfaces. Specifically, communication can be carried out between the fifth connector 25 and the sixth connector 26 through an I2C bus, a general-purpose input / output (GPIO) interface, or a cable. Communication can also be carried out between the sixth connector 26 and the seventh connector 27 through an I2C bus, a GPIO interface, or a cable. Specifically, the test results of each slave power test fixture can be transmitted to the upper-level slave power test fixture through an I2C bus, a GPIO interface, or a cable. Finally, the master power test fixture aggregates the test results and transmits them to the host computer through the third connector 23.
[0089] In addition, the master power test fixture 50 can also supply power to multiple slave power test fixtures through the fifth connector 25, the sixth connector 26, and the seventh connector 27.
[0090] Applied to the above power test fixture, the power test method provided by the present application will be introduced below.
[0091] As Figure 7 shown, Figure 7 is a flowchart of a power test method provided by the present application. The method includes S701 to S703.
[0092] S701. The first output circuit outputs a plurality of first control signals to the loading module.
[0093] Among them, the plurality of first control signals are used to control the loading module to be in different load states.
[0094] Exemplarily, the load state of the loading module can be a constant current state, and the plurality of first control signals can precisely adjust the load current of the power supply under test. Among them, the specific implementation manner of S701 can refer to the above description of the first output circuit.
[0095] S702. The first test circuit obtains the analog signals of the power supply under test when the loading module is in different load states, and obtains the first test result.
[0096] Exemplarily, the analog signals can include voltage signals and current signals. The first test circuit can obtain the analog signals when the loading module is in different load states based on the test items to obtain the first test result. Among them, the specific implementation manner of S702 can refer to the above description of the first test circuit.
[0097] S703. The processor receives and processes the first test result, and outputs the processed first test result to the host computer.
[0098] Exemplarily, the processor may receive and process the first test result of the first test circuit to obtain a test report, and output the test report to the host computer. For the specific implementation manner of S703, reference may be made to the description of the first test circuit above.
[0099] Thus, the power supply test fixture provided by the present application can get rid of the dependence on oscilloscopes, electronic loads, and tool kits, realize the automated test of the power supply to be tested, reduce the test cost of the power supply to be tested, and improve the test efficiency.
[0100] Optionally, S701 may include: the digital-to-analog converter converts a plurality of digital signals sent by the processor into a plurality of first control signals, and the amplification circuit amplifies the plurality of first control signals and outputs the amplified plurality of first control signals to the load pulling module.
[0101] Optionally, the first test result includes a voltage test result, and S702 may include: the first sampling circuit samples the voltage of the power supply to be tested when the load pulling module is in different load states to obtain a voltage signal, and the first analog-to-digital converter converts the voltage signal into a digital signal to obtain the voltage test result.
[0102] Optionally, the first test result includes a current test result, and S702 may include: the second sampling circuit samples the current of the power supply to be tested when the load pulling module is in different load states to obtain a current signal, and the second analog-to-digital converter converts the current signal into a digital signal to obtain the current test result.
[0103] Optionally, the method further includes: the second output circuit outputs a plurality of second control signals to the load pulling module, the plurality of second control signals are used to control the load pulling module to be in different load states, the second test circuit obtains the analog signal of the power supply to be tested when the load pulling module is in different load states to obtain a second test result, and the processor further receives and processes the second test result and outputs the processed second test result to the host computer.
[0104] The present application also provides an electronic device, which includes a printed circuit board and a power supply test fixture disposed on the printed circuit board.
[0105] The present application also provides a computer storage medium, in which computer instructions are stored. When the computer instructions run on the electronic device, the electronic device is enabled to execute the above-related method steps to implement the power supply test method in the above embodiments.
[0106] The present application also provides a computer program product. When the computer program product runs on a computer, the computer is enabled to execute the above-related steps to implement the power supply test method executed by the electronic device in the above embodiments.
[0107] Among them, the power supply test fixture, test device, electronic device, computer storage medium, computer program product or chip provided in this embodiment are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be elaborated here.
[0108] Through the description of the above embodiments, those skilled in the art can understand that for the convenience and conciseness of description, only the above division of each functional module is used as an example. In actual applications, the above functions can be allocated to different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above.
[0109] In several embodiments provided in this application, it should be understood that the disclosed device and method can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point, the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical, mechanical or other form.
[0110] The unit described as a separate component may or may not be physically separated. The component displayed as a unit may be a physical unit or multiple physical units, that is, it may be located in one place, or it may be distributed to multiple different places. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0111] In addition, each functional unit in each embodiment of this application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit.
[0112] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The software product is stored in a storage medium and includes several instructions for causing a device (which can be a single-chip microcomputer, a chip, etc.) or a processor to execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read only memory (ROM), random access memory (RAM), magnetic disks, or optical discs.
[0113] The above content is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present application can easily think of changes or substitutions, which should all be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.
Claims
1. A power supply test fixture, characterized in that, Including: A control module and a loading module, the loading module includes a first connector, and the loading module is coupled to the power supply under test through the first connector; The control module includes a processor, a first output circuit, and a first test circuit; The first output circuit is configured to: output a plurality of first control signals to the loading module, and the plurality of first control signals are used to control the loading module to be in different load states; The first test circuit is configured to: obtain an analog signal of the power supply under test when the loading module is in different load states, and obtain a first test result; The processor is configured to: receive and process the first test result, and output the processed first test result to the host computer.
2. The power supply test fixture according to claim 1, wherein The first output circuit includes: a digital-to-analog converter and an amplifier circuit, the input end of the digital-to-analog converter is coupled to the output end of the processor, the output end of the digital-to-analog converter is coupled to the input end of the amplifier circuit, and the output end of the amplifier circuit is coupled to the input end of the loading module; The digital-to-analog converter is configured to: convert a plurality of digital signals sent by the processor into the plurality of first control signals; The amplifier circuit is configured to: amplify the plurality of first control signals, and output the amplified plurality of first control signals to the loading module.
3. The power supply test fixture according to claim 1, wherein The first test circuit includes a first analog-to-digital converter, a second analog-to-digital converter, a first sampling circuit, and a second sampling circuit. The input end of the first sampling circuit is coupled to the loading module, the output end of the first sampling circuit is coupled to the input end of the first analog-to-digital converter, the output end of the first analog-to-digital converter is coupled to the processor, the input end of the second sampling circuit is coupled to the loading module, the output end of the second sampling circuit is coupled to the input end of the second analog-to-digital converter, and the output end of the second analog-to-digital converter is coupled to the processor.
4. The power supply test fixture according to claim 1, characterized in that, The loading module includes: a first resistor and a plurality of cascaded first transistors, and the plurality of cascaded first transistors are connected in series with the first resistor; The first end of the first first transistor among the plurality of cascaded first transistors is coupled to the first end of the first connector, and the first end of the first resistor is coupled to the second end of the first connector.
5. The power supply test fixture according to any one of claims 1-4, characterized in that The control module further includes: a second output circuit and a second test circuit; The second output circuit is configured to: output a plurality of second control signals to the loading module, and the plurality of second control signals are used to control the loading module to be in different load states; The second test circuit is configured to: obtain an analog signal of the power supply under test when the loading module is in different load states, and obtain a second test result; The processor is further configured to: receive and process the second test result, and output the processed second test result to the host computer.
6. The power supply test fixture according to claim 5, wherein The loading module further includes: a second resistor and a plurality of cascaded second transistors, and the plurality of cascaded second transistors are connected in series with the second resistor, and the number of the second transistors is less than the number of the first transistors; The pulling load module further includes a second connector. The first end of the first transistor among the multiple cascaded second transistors is coupled to the first end of the second connector, and the first end of the second resistor is coupled to the second end of the second connector.
7. The power supply test fixture according to claim 6, wherein The pulling load module further includes: a first adder circuit, a second adder circuit, a first capacitor, and a second capacitor; The first input terminal of the first adder circuit is coupled to the first end of the first transistor among the multiple cascaded first transistors. The second input terminal of the first adder circuit is coupled to the first end of the first capacitor. The second end of the first capacitor is coupled to the first end of the first transistor among the multiple cascaded second transistors. The output terminal of the first adder circuit is coupled to the control module; The first input terminal of the second adder circuit is coupled to the first end of the first transistor among the multiple cascaded second transistors. The second input terminal of the second adder circuit is coupled to the first end of the second capacitor. The second end of the second capacitor is coupled to the first end of the first transistor among the multiple cascaded first transistors. The output terminal of the second adder circuit is coupled to the control module.
8. The power supply test fixture according to claim 7, wherein The pulling load module further includes: a first subtractor circuit and a second subtractor circuit; The first input terminal of the first subtractor circuit is coupled to the first end of the first resistor. The second input terminal of the first subtractor circuit is coupled to the second end of the first resistor. The output terminal of the first subtractor circuit is coupled to the control module; The first input terminal of the second subtractor circuit is coupled to the first end of the second resistor. The second input terminal of the second subtractor circuit is coupled to the second end of the second resistor. The output terminal of the second subtractor circuit is coupled to the control module.
9. The power supply test fixture according to any one of claims 1-8, characterized in that, The power supply test fixture further includes: a third connector and a fourth connector. The power supply test fixture outputs the processed first test result to the host computer through the third connector, and the power supply test fixture is coupled to an external power supply through the fourth connector.
10. A test device, characterized in that, It includes multiple power supply test fixtures as described in any one of claims 1-9, and the multiple power supply test fixtures are cascaded.