Universal automatic reliability evaluation and verification device and method for low-level power management device

Abstract

The invention discloses a general reliability evaluation and verification device for low-level power management devices. Automatic test equipment (1) is used for test excitation generation, system control, data analysis test and report generation of a whole system; the test cable (2) is used for connecting the automatic test equipment (1) with the switching mother set (3); the switching mother board (3) is connected with the automatic test equipment (1) and the verification daughter board (4) through various types of connectors and is used for transmitting and exciting test signals; the verification daughter board (4) is adapted to a to-be-tested device, customized design is carried out according to electrical characteristics and interface requirements of the to-be-tested power management device, compatibility is ensured, and test requirements are met; the high and low temperature test box (5) is used for carrying out an environmental test on the power management device under an extreme temperature condition; and the nitrogen introduction device is communicated with the high-low temperature test box (5) and is used for introducing nitrogen into the high-low temperature test box (5) to prevent condensed water or water vapor from appearing on the surface of the device in the temperature change process.

Description

Technical Field

[0001] The present invention relates to the field of reliability evaluation and verification, and particularly to a general automated reliability evaluation and verification device and method for low-level power management devices. Background Art

[0002] With the continuous progress and development of semiconductor technology, electronic devices are evolving towards having more functions, faster speeds, and smaller sizes. Among them, low-level power management devices are key components in active electronic equipment. Power management devices are responsible for the conversion, distribution, detection, and other power management of electrical energy in an electronic device system, including converting the source voltage and current into a power supply that can be used by loads such as microprocessors and sensors, providing a stable and reliable power supply voltage for the electronic system, and ensuring the safe and stable operation of the electronic device. Their performance and reliability directly affect the working efficiency and service life of the electronic device. Power management devices mainly include DC / DC converters, point-of-load power supplies, linear regulators, etc.

[0003] In the aerospace field, power management devices are often responsible for the efficient conversion, distribution, and management of energy to ensure the stable operation of spacecraft and their subsystems. Their applications cover the power systems of spacecraft, satellite power supply, deep space probes, space stations, and various payload devices, meeting the high-efficiency energy supply requirements in extreme environments. For example, isolated DC / DC converters can provide electrical isolation, enhancing safety and adapting to complex application scenarios; point-of-load power supplies are usually located near key loads such as microprocessors, ASICs, FPGAs, and DSPs, converting high-voltage electrical energy into low-voltage electrical energy to meet system requirements and quickly responding to dynamic load changes to improve system performance.

[0004] Aerospace application scenarios of power management devices usually have the characteristics of long mission cycles and non-replaceability in orbit. Therefore, there are particularly high requirements for the reliability of the devices, especially for their lifespan. To ensure that these power management devices can operate stably for a long time in a complex aerospace environment, it is necessary to comprehensively measure their electrical performance parameters and strictly assess their reliability before installing the power management devices.

[0005] First of all, it is necessary to comprehensively measure the electrical performance parameters of power management devices at three temperatures, including but not limited to key indicators such as input-output voltage range, conversion efficiency, ripple noise, load regulation, temperature drift, short-circuit protection, and power consumption management. These parameters determine the working stability of the device;

[0006] Secondly, the power management device needs to have good environmental adaptability. The spacecraft will experience extreme temperature differences, high pressure differences, and a long-term vacuum environment during the period from launch to orbital operation. To ensure that the device can work stably in these environments for a long time, the power management device needs to undergo high and low temperature cycle tests, temperature shock tests, etc., to ensure that the device can withstand the changes in day and night temperature differences in orbit without failure;

[0007] In addition, the life prediction of the device is an important step to ensure its long-term stable operation. The power management device needs to evaluate its reliability during long-term use through accelerated life tests (ALT) and high-temperature aging tests. These tests simulate the aging process of the device under extreme conditions, helping to predict its performance during the actual mission cycle and ensuring that its performance does not degrade or fail during the entire mission cycle.

[0008] Although the existing reliability evaluation and verification devices for power management devices can meet the basic requirements under certain test conditions, such as Patent CN217766750U, a power test device, or Patent CN103308867B, a cascaded mobile power test device, etc., they often have the following limitations: First, they cannot be adapted to multiple different types of power management devices at the same time, resulting in the lack of universality and scalability of test results; Second, there is a lack of an automated test platform, and the test process requires a large amount of manual intervention, with a long test cycle and low efficiency, making it difficult to meet the requirements in mass production; Third, the test environments of many power management devices do not integrate equipment such as high and low temperature chambers, lacking the ability to jointly simulate multi-dimensional factors in complex aerospace environments.

[0009] 1. Unable to adapt to multiple power management devices at the same time. The existing test devices for power management devices usually can only test specific types of power devices. For example, some test devices may only be applicable to linear voltage regulators, while others may only be applicable to DC / DC converters. This specificity causes the test device to be unable to meet the needs of multiple power management devices, making it impossible to efficiently conduct joint tests on multiple devices in practical applications, increasing the test cost and complexity. In addition, there are a wide variety of devices, and separate test platforms and test procedures are required for each device, which not only causes redundant hardware and time costs but also increases the difficulty of management and maintenance.

[0010] 2. Lack of an automated test platform, resulting in low efficiency. Most of the traditional reliability test devices for power management devices rely on manual operations for test setup, data collection, and analysis. A large amount of manual intervention is required during the test process, which not only increases the risk of human error but also makes the test cycle longer and the efficiency lower. Especially when a large number of samples need to be tested, manual operations are not only prone to operational errors but also significantly extend the test time and reduce work efficiency. Therefore, the existing test devices lacking an automated test platform cannot meet the requirements for fast, efficient, and accurate testing in modern production and R & D processes.

[0011] 3. Lack of integration of high and low temperature test capabilities. Especially in the field of aerospace applications, power management devices often need to work under extreme temperature change conditions. High and low temperature tests are important means to verify the reliability of power management devices in actual working environments. Most of the existing test devices for power management devices do not integrate environmental simulation equipment such as high and low temperature test chambers and cannot conduct conventional environmental adaptability tests, such as high and low temperature cycling, temperature shock, thermal vacuum, etc., nor can they implement long-term reliability tests such as accelerated life test (ALT). Therefore, the long-term stability and safety of power management devices in actual applications cannot be comprehensively evaluated.

[0012] In addition to the above problems, there are also the following problems in the test assessment of power management devices in extreme temperature environments. In previous related patents, such as patent CN116381376A, a system and method for fully automatic high and low temperature testing of electronic devices, or patent CN221426704U, a high and low temperature experimental device for integrated circuit electronic devices, etc., these problems have not been solved in relatively mature industrialized design test devices:

[0013] 1. During the rapid heating or cooling process, the presence of condensation may cause problems such as material aging and electrical performance degradation of power management devices, affecting the test results, which are difficult to comprehensively evaluate within the conventional test cycle;

[0014] 2. The capacitance value of the filter capacitor in the test circuit of power management devices is sensitive to temperature. Generally, the capacitance of ceramic capacitors increases with the increase of temperature, making it difficult to ensure the consistency of device parameter test conditions in a wide temperature range;

[0015] 3. In a high temperature environment, the reliability degradation problem caused by the oxidation of the encapsulation bonding part of power management devices;

[0016] 4. Currently, the life assessment tests of power management devices are all carried out in the form of static voltage bias plus high temperature environment accelerated life test. Only the comprehensive influence of static electrical stress and thermal stress is considered, ignoring the difference from the dynamic electrical stress under actual working conditions, which affects the accuracy of the test results. Summary of the Invention

[0017] The object of the present invention is to provide a general automated reliability evaluation and verification device for low-level power management devices, characterized in that the device includes an automated test equipment 1, a test cable 2, a transfer mother board 3, a verification daughter board 4, a high and low temperature test chamber 5, and the nitrogen gas injection device; wherein,

[0018] The automated test equipment 1 is used for test excitation generation, system control, data analysis test, and report generation of the entire system;

[0019] The test cable 2 is used to connect the automated test equipment 1 and the transfer mother board 3;

[0020] The transfer mother board 3 is connected to the automated test equipment 1 and the verification daughter board 4 through various types of connectors, and is used for the transmission and excitation of test signals;

[0021] The verification daughter board 4 is adapted to the device under test, and is customized according to the electrical characteristics and interface requirements of the power management device under test to ensure compatibility and meet the test requirements;

[0022] The high and low temperature test chamber 5 is used for environmental tests of power management devices under extreme temperature conditions; when performing high and low temperature environmental tests, the test tooling composed of the transfer mother board 3, the verification daughter board 4, and the test fixing box is placed in the high and low temperature test chamber 5, and the electrical connection between the internal transfer mother board 3 and the external automated test equipment 1 is realized through the cable through holes preset on the side wall of the box body to ensure the effective transmission of test signals during the test process;

[0023] The nitrogen gas injection device is communicated with the high and low temperature test chamber 5, and is used for injecting nitrogen gas into the high and low temperature test chamber 5 to reduce the moisture content in the chamber, so as to prevent condensation water or water vapor from appearing on the surface of the device during the temperature change process.

[0024] Preferably, for the test cable 2 to adapt to different test scenarios, the test cable is divided into two sets, long and short, for different test requirements respectively;

[0025] When performing conventional electrical performance tests, a short test cable is used; when performing high and low temperature environmental tests, a long coaxial test cable is used with a capacitor, and different types of filter capacitors are selected at different temperatures to keep the capacitance value of the filter capacitor in the test circuit consistent under different test temperature conditions, so as to achieve in-situ testing in a wide temperature range.

[0026] Preferably, the automated test equipment 1 includes a power supply, a data acquisition instrument, an infrared thermal imager, a programmable electronic load, and a test computer running a host computer module; wherein,

[0027] The power supply is used to provide accurate and adjustable input voltage and current for the power management device to be tested, and to monitor the electrical parameters of the power supply circuit in real time;

[0028] The data acquisition instrument is combined with a high-precision differential probe to collect transient signal waveforms of key nodes of the device under test and monitor the ripple, noise and dynamic response characteristics of voltage or current;

[0029] The thermal imager is used for non-contact measurement of the temperature distribution of the device under test under steady state and dynamic load, and is combined with thermal analysis software to realize hot spot positioning, temperature rise curve drawing and thermal resistance calculation, and supports synchronous triggering and acquisition of electrical parameters;

[0030] The programmable electronic load is used to simulate the dynamic load characteristics under working conditions and realize constant current, constant voltage, constant power and dynamic load test modes;

[0031] The test computer runs the host computer module for integrated control of the above test equipment, realizes test process automation, real-time data processing and analysis, and generates a reliability evaluation report.

[0032] Preferably, the cabinet of the automated testing equipment 1 is provided with rollers at the bottom for easy movement, and the two front wheels are provided with brakes and locking devices; a cooling fan is installed at the top of the cabinet, and a filter is installed at the air outlet.

[0033] Preferably, when the power management device is subjected to a high and low temperature environment reliability evaluation test, the high and low temperature test box 5 is provided with a transfer motherboard 3 and a verification daughterboard 4; wherein,

[0034] The transfer motherboard 3 is connected to the automated test equipment and the verification daughter board through various types of connectors, and is responsible for the transmission and excitation of bidirectional test signals between the automated test equipment and the verification daughter board;

[0035] The verification sub-board 4 is adapted to the device to be tested, is designed according to the characteristics of devices of different specifications and models, uses interchangeable connectors and adapters to achieve reliable connection with devices of different models, supports extended test compatibility through partial replacement, and has a high degree of versatility;

[0036] The design of the verification sub-board 4 can develop actual working condition load circuits for each device; when the electronic load cannot fully cover the actual load working condition, the actual load is used to replace the traditional electronic load to improve the accuracy of reliability evaluation;

[0037] The adapter motherboard 3 and the verification daughterboard 4 form a test tool through a standardized motherboard-daughterboard hierarchical structure, establish a unified test interface and program framework, replace the traditional customized development model for a single device, significantly improve test efficiency and support fast switching of multiple tasks.

[0038] Preferably, the test tooling is designed modularly and consists of an adapter motherboard 3, a verification daughter board 4, and a test fixing box; among them,

[0039] The test tooling has two working modes: during the test of conventional electrical performance parameters, it is integrally integrated into the drawer-type structure of the cabinet of the automatic test equipment 1; during the high and low temperature environmental test, the entire test tooling can be moved to the high and low temperature test chamber 5 for testing;

[0040] All signal test points of the test tooling are concentrated in the signal box of the automatic test equipment 1. The signal box integrates circuits such as relay switches, power supply control, and signal conditioning, and leads out the test signals of the test tooling from the panel and accesses them to instruments such as data acquisition instruments, thermal imagers, and electronic loads for testing;

[0041] The test fixing box is placed in the drawer. When in use, the drawer can be pulled out to insert and remove cables. Closing the drawer does not affect the normal use of the cabinet;

[0042] The test fixing box can fix the verification daughter board and the heat dissipation reinforcement board; the fixing position of the daughter board is unique, which is convenient for replacing other daughter boards. A heat dissipation metal plate is designed under the power supply chip of the daughter board to enhance the heat dissipation of the chip.

[0043] Preferably, the materials used in the fixing box include PF, ABS, and aluminum alloy, all of which have good high and low temperature resistance and meet the test conditions in high and low temperature environments; the plug-in fixing terminals of the daughter board have a certain elasticity to ensure the stability after the daughter board is pressed in, and at the same time, it is also convenient for replacement, that is, the daughter board is firmly locked when inserted into the fixing box and is easy to operate when pulled out for replacement.

[0044] Preferably, the upper computer module operated by the test computer includes: a main control module, a self-check module, a test control module, and a data management module; among them,

[0045] The main control module is responsible for the configuration, scheduling, and management of system software and hardware resources, provides a user interaction interface, calls the self-check module at startup, controls the task execution authority according to the self-check results, and allows users to view historical data in case of equipment failure;

[0046] The self-check module realizes the detection of hardware status, communication lines, and power supply voltage, feeds back the results to the main control module, and displays fault information;

[0047] The test control module is independently designed with functional modules, and the functions are independent and do not affect each other;

[0048] The data management module includes a data storage and output sub-module. The storage module realizes the functions of temporary caching and hard disk storage. The output module provides data chart display, playback, and customized report generation, and supports operations such as saving, printing, and exporting documents.

[0049] Preferably, the screen display of the automated test equipment includes a menu bar, a device management area, and a test area; among them,

[0050] The menu bar includes: a test management unit, a data recording unit, an instrument maintenance unit, a start and stop unit, and a user management unit; the device management area displays information of the samples to be tested; the test area displays all test items and test results:

[0051] The test management unit adds and deletes existing devices under test according to model number, batch number, and serial number, so as to facilitate the selection of devices under test during testing, and also supports file batch import;

[0052] The test management unit sets parameters for test items such as "start-up characteristics", "power output", "power output", "protection circuit", "inrush current", "auxiliary function", and multiple power-on and power-off for power management devices, and views test results;

[0053] The test management unit sets up the automated test process; an automated test sequence loads and configures any test items, and also supports changing the order of test items;

[0054] The data recording unit includes three functions: viewing test results, exporting data records, and generating test reports; data records are exported in the format required by the user, supporting.txt,.csv, and excel formats; test reports are also exported in word or PDF mode according to the established requirements of the user; SQL Server 2008 database is used for data management to record test data and provide a query function to compare and display test data at different stages of the same product;

[0055] The instrument maintenance unit involves all measurement devices used in this system, including the connection status and setting parameters of each device;

[0056] The user management unit divides users into two categories, one is an administrator user and the other is a test user; the administrator user has the highest system authority and is responsible for user account management, test parameter configuration, system setting modification, and access and export of all test data; the test user has limited permissions and can only execute the preset test process, view current test data, and generate test reports.

[0057] The present invention also provides an evaluation and verification method applied to a reliability evaluation and verification device, characterized by including the steps:

[0058] Step 1: Determine the test plan for the reliability assessment test of the power management device to be tested; the specific design is as follows:

[0059] 1. The test duration is 2000 hours, and the test temperature point is 85°C;

[0060] 2. The test points are selected for testing every 400 hours: 0h, 400h, 800h, 1200h, 1600h, 2000h;

[0061] 3. Test the thermal stress conditions until the temperature of the outer shell of the device under test reaches the maximum rated operating temperature of 85°C;

[0062] 4. For the test methods of performance parameters, follow the standards such as QJ 10006-2008, GJB 7400-2011, GJB 548C-2021 to test various performance parameters;

[0063] Step 2: After installing the device under test on the verification daughter board, place the test tooling in the drawer of the automated test equipment;

[0064] Step 3: Conduct an initial electrical parameter test on the device at room temperature;

[0065] Step 4: Place the test tooling in the high and low temperature test chamber and heat it to make the chamber environment reach 85°C. Keep it for 10 minutes to remove the water vapor and other gases adsorbed by the device under test, and then evacuate the chamber; then introduce nitrogen into the high and low temperature test chamber until the chamber returns to 1.1×10 5 Pa, slightly higher than the external air pressure;

[0066] Step 5: The test motherboard provides dynamic electrical stress to the device under test, and real-time performance parameter testing is carried out by the upper computer software platform;

[0067] Step 6: After the test time reaches the life reliability assessment test point, take out the device under test from the high and low temperature test chamber and cool it down to the room temperature environment, and conduct performance parameter testing at room temperature;

[0068] Step 8: After the test is completed, record the parameters, and pay attention to the drift degree of each performance parameter relative to the initial value; after the recording is completed, repeat steps 2-6 until the drift degree of a certain performance parameter has reached the device failure standard or the test time has reached the duration of the reliability assessment test. After the test and recording are completed, the life enhancement test ends;

[0069] Step 9: If all the performance parameters of the device under test are qualified at the end of the life enhancement test, the reliability assessment test of the device passes.

[0070] The advantages of the general automated reliability evaluation and verification device for low-level power management devices described in the present invention compared with the prior art are as follows:

[0071] 1. The present invention has a wide range of applications and is compatible with a variety of devices. The motherboard and daughterboard in the device of the present invention adopt a standard modular design, and the components such as the adapter motherboard, verification daughterboard and test cable are highly compatible and adaptable, and can support power management devices of different models and specifications, such as DC / DC converters, load point power supplies, linear regulators, etc. The standardized test interface and standardized test procedures formed by the test equipment replace the original process of developing test circuits and test procedures separately for each device, thereby improving work efficiency and facilitating rapid switching between multiple test tasks;

[0072] 2. The present invention improves the accuracy of device board-level evaluation and verification. The verification sub-board can develop actual working condition load circuits for each device. Electronic loads cannot fully cover actual load conditions. By using actual loads to replace traditional electronic loads, the accuracy of reliability evaluation can be improved;

[0073] 3. The present invention has highly automated and intelligent testing. Through the development of an automated testing platform, the present invention realizes fully automatic testing of the performance of power management devices, significantly improves testing efficiency, and reduces errors caused by manual operations. At the same time, the testing platform has intelligent analysis functions, can evaluate test results in real time, and automatically generate test reports, greatly improving the intelligence level of the testing process;

[0074] 4. The present invention realizes in-situ testing of devices under wide temperature range conditions. A high and low temperature test chamber is integrated in the evaluation and verification device, and the high and low temperature test chamber supports a wide operating temperature range (-60°C to +150°C). A nitrogen introduction system is designed to avoid electrical short circuits, corrosion or other unforeseen failures caused by moisture. At the same time, in order to avoid the influence of the filter capacitor's capacitance on the test results due to its sensitivity to temperature, the capacitor can be matched with a coaxial cable, and different types of capacitors can be selected for filtering at different temperatures to achieve consistency in the filter capacitor capacitance in the test circuit under different test temperature conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0075] Figure 1 A schematic diagram of the structure of a general reliability evaluation and verification device for power management devices provided by an embodiment of the present invention;

[0076] Figure 2 A schematic diagram of a cabinet and connection method of a general evaluation and verification device for power management devices provided in an embodiment of the present invention;

[0077] Figure 3 A schematic diagram of a power management device test tool provided in an embodiment of the present invention;

[0078] Figure 4 A schematic diagram of a power management device test fixture box provided in an embodiment of the present invention;

[0079] Figure 5 Schematic diagram of reliability test for power management devices provided by embodiments of the present invention;

[0080] Figure 6 Schematic diagram of the physical structure composition of the host computer software platform provided by embodiments of the present invention;

[0081] Figure 7 Schematic diagram of the functional structure of the host computer software platform provided by embodiments of the present invention;

[0082] Figure 8 Schematic diagram of the main interface of the host computer software provided by embodiments of the present invention;

[0083] Figure 9 Flowchart of an embodiment for conducting a reliability assessment test on power management devices using the present invention. Detailed implementation manners

[0084] Next, the technical solutions in the embodiments of the present invention will be described clearly and completely. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0085] The present invention provides a general automated reliability evaluation and verification device for low-level power management devices, characterized in that the device includes an automated test equipment 1, a test cable 2, a transfer mother board 3, a verification daughter board 4, a high and low temperature test chamber 5, and the nitrogen gas introduction device; wherein,

[0086] The automated test equipment 1 is used for generating test stimuli for the entire system, system control, data analysis testing, and report generation;

[0087] The test cable 2 is used to connect the automated test equipment 1 to the transfer mother board 3;

[0088] The transfer mother board 3 is connected to the automated test equipment 1 and the verification daughter board 4 through various types of connectors, and is used for the transmission and excitation of test signals;

[0089] The verification daughter board 4 is adapted to the device under test and is customized according to the electrical characteristics and interface requirements of the power management device under test to ensure compatibility and meet the test requirements;

[0090] The high and low temperature test chamber 5 is used for environmental testing of power management devices under extreme temperature conditions; when performing high and low temperature environmental testing, the test fixture composed of the adapter motherboard 3, the verification daughter board 4, and the test fixing box is placed in the high and low temperature test chamber 5, and the electrical connection between the internal adapter motherboard 3 and the external automated test equipment 1 is realized through the cable through holes preset on the side wall of the chamber, ensuring the effective transmission of test signals during the test process;

[0091] The nitrogen gas inlet device is connected to the high and low temperature test chamber 5 and is used to introduce nitrogen gas into the high and low temperature test chamber 5 to reduce the moisture content in the chamber, thereby preventing condensation water or water vapor from appearing on the surface of the device during the temperature change process.

[0092] According to an embodiment of the present invention, for the test cable 2 to adapt to different test scenarios, the test cable is divided into two sets, a long set and a short set, which are respectively used for different test requirements;

[0093] When performing conventional electrical performance testing, a short test cable is used; when performing high and low temperature environmental testing, a long coaxial test cable is used in combination with a capacitor, and corresponding different types of filter capacitors are selected at different temperatures to maintain the consistency of the capacitance value of the filter capacitor in the test circuit under different test temperature conditions, so as to achieve in-situ testing in a wide temperature range.

[0094] According to an embodiment of the present invention, the automated test equipment 1 includes a power supply, a data acquisition instrument, a thermal imager, a programmable electronic load, and a test computer running a host computer module; among them,

[0095] The power supply is used to provide an accurately adjustable input voltage and current for the power management device to be tested, and to monitor the electrical parameters of the power supply circuit in real time;

[0096] The data acquisition instrument is combined with a high-precision differential probe and is used to collect the transient signal waveforms of the key nodes of the device to be tested, and to monitor the voltage or current ripple, noise, and dynamic response characteristics; when high-precision acquisition is required, a data acquisition instrument is used, and in other cases, the data acquisition instrument can be replaced by an oscilloscope.

[0097] The thermal imager is used for non-contact measurement of the temperature distribution of the device to be tested under steady-state and dynamic loads, and combines thermal analysis software to achieve hot spot location, temperature rise curve drawing, and thermal resistance calculation, and supports synchronous trigger acquisition with electrical parameters;

[0098] The programmable electronic load is used to simulate the dynamic load characteristics under working conditions and to achieve constant current, constant voltage, constant power, and dynamic load test modes;

[0099] The test computer running the host computer module is used to integrally control the above-mentioned various test equipment, realize the automation of the test process, real-time data processing and analysis, and generate a reliability evaluation report.

[0100] According to an embodiment of the present invention, rollers are installed at the bottom of the cabinet of the automated test device 1 for easy movement, and the two front wheels are equipped with brakes and locking devices; a cooling fan is installed at the top of the cabinet, and a filter is installed at the air outlet.

[0101] According to an embodiment of the present invention, when a reliability evaluation test of power management devices in high and low temperature environments is carried out, a transfer mother board 3 and a verification daughter board 4 are arranged in the high and low temperature test chamber 5; among them,

[0102] The transfer mother board 3 is connected to the automated test device and the verification daughter board through various types of connectors, and undertakes the function of transmitting and exciting two-way test signals between the automated test device and the verification daughter board;

[0103] The verification daughter board 4 is adapted to the device under test, designed according to the characteristics of devices of different specifications and models, and uses interchangeable connectors and adapters to achieve reliable connection with devices of different models, supports expanding test compatibility through partial replacement, and has high versatility;

[0104] The design of the verification daughter board 4 can develop an actual working condition load circuit for each device; when the electronic load cannot fully cover the actual load working conditions, the actual load is used to replace the traditional electronic load to improve the accuracy of reliability evaluation;

[0105] The transfer mother board 3 and the verification daughter board 4 form a test tooling through a standardized mother board - daughter board hierarchical structure, establish a unified test interface and program framework, replace the traditional customized development mode for a single device, significantly improve the test efficiency and support multi - task rapid switching.

[0106] According to an embodiment of the present invention, in order to enable the evaluation and verification device to be adapted to a variety of power management devices at the same time, reduce the test cost and complexity, the test tooling adopts a modular design and consists of a transfer mother board 3, a verification daughter board 4 and a test fixing box; among them,

[0107] The test tooling has two working modes: during the conventional electrical performance parameter test, it is integrally integrated into the drawer - type structure of the cabinet of the automated test device 1; during the high and low temperature environment test, the test tooling can be integrally moved to the high and low temperature test chamber 5 for testing;

[0108] All the signal test points of the test tooling are concentrated in the signal box of the automated test device 1. The signal box integrates circuits such as relay switches, power supply control, and signal conditioning, and leads out the test signals of the test tooling from the panel and accesses them to instruments such as data acquisition instruments, thermal imagers, and electronic loads for testing;

[0109] The described test fixing box is placed in a drawer. When in use, the drawer can be pulled out to insert and remove cables, and closing the drawer does not affect the normal use of the cabinet.

[0110] The described test fixing box can fix the verification daughter board and the heat dissipation strengthening board; the fixing position of the daughter board is unique, which is convenient for replacing other daughter boards. A heat dissipation metal plate is designed under the power chip of the daughter board to enhance the heat dissipation of the chip.

[0111] According to an embodiment of the present invention, the materials used in the fixing box include PF, ABS, and aluminum alloy, all of which have good high and low temperature resistance and meet the test conditions in high and low temperature environments; the plug-in and fixing terminals of the daughter board have a certain elasticity to ensure the stability after the daughter board is pressed in, and at the same time, it is also convenient for replacement, that is, the daughter board is firmly locked when inserted into the fixing box and is easy to operate when pulled out for replacement.

[0112] According to an embodiment of the present invention, the upper computer module operated by the described test computer includes: a main control module, a self-check module, a test control module, and a data management module; among them,

[0113] The main control module is responsible for the configuration, scheduling, and management of system software and hardware resources, provides a user interaction interface, calls the self-check module at startup, controls the task execution permission according to the self-check result, and allows users to view historical data in case of equipment failure;

[0114] The self-check module realizes the detection of hardware status, communication lines, and power supply voltage, feeds back the results to the main control module, and displays the fault information;

[0115] The test control module is independently designed with functional modules, and the functions are independent and do not affect each other;

[0116] The data management module includes a data storage and output sub-module. The storage module realizes the functions of temporary caching and hard disk storage, and the output module provides data chart display, playback, and customized report generation, and supports operations such as saving, printing, and exporting documents.

[0117] According to an embodiment of the present invention, the screen display of the automated test equipment includes a menu bar, a device management area, and a test area; among them,

[0118] The menu bar includes: a test management unit, a data recording unit, an instrument maintenance unit, a start and stop unit, and a user management unit; the device management area displays the information of the samples to be tested; the test area displays all the test items and test results:

[0119] The test management unit adds and deletes existing devices to be tested according to the model, batch number, and serial number, so as to facilitate the selection of devices to be tested during the test, and at the same time, it also supports batch file import;

[0120] The test management unit sets parameters for test items such as "start-up characteristics", "power output", "power output", "protection circuit", "inrush current", "auxiliary functions", and multiple power-on and power-off cycles of power management devices, and views the test results;

[0121] The test management unit sets up the automated test process; an automated test sequence can load and configure any test item, and at the same time supports changing the order of test items;

[0122] The data recording unit includes three functions: viewing test results, exporting data records, and generating test reports; the data records are exported in the format required by the user, supporting.txt,.csv, and excel formats; the test reports are also exported in word or PDF mode according to the established requirements of the user; SQL Server 2008 database is used for data management to record test data and provide a query function to compare and display the test data at different stages of the same product;

[0123] The instrument maintenance unit involves all measurement devices used in this system, including the connection status and set parameters of each device;

[0124] The user management unit divides users into two categories, one is the administrator user and the other is the test user; the administrator user has the highest system authority and is responsible for user account management, test parameter configuration, system setting modification, and access and export of all test data; the test user has limited permissions and can only execute the preset test process, view the current test data, and generate test reports.

[0125] The present invention also provides an evaluation and verification method applied to a reliability evaluation and verification device, including the steps:

[0126] Step 1: Determine the test plan for the reliability assessment test of the power management device to be tested; the specific design is as follows:

[0127] 1 The test duration is 2000 hours, and the test temperature point is 85°C;

[0128] 2 Test points are selected for testing every 400 hours: 0h, 400h, 800h, 1200h, 1600h, 2000h;

[0129] 3 Test the thermal stress condition, and the outer shell temperature of the device to be tested reaches the maximum rated operating temperature of 85°C;

[0130] 4 For the performance parameter test method, test each performance parameter in accordance with standards such as QJ 10006-2008, GJB 7400-2011, and GJB 548C-2021;

[0131] Step 2: After the device under test is installed on the verification daughter board, place the test fixture into the drawer of the automated test equipment;

[0132] Step 3: Conduct an initial electrical parameter test on the device at room temperature;

[0133] Step 4: Place the test fixture into the high and low temperature test chamber and heat it to make the internal environment reach 85°C. Keep it for 10 minutes to remove the water vapor and other gases adsorbed by the device under test, and then evacuate the chamber. Then, introduce nitrogen into the high and low temperature test chamber until the internal pressure of the chamber returns to 1.1×10 5 Pa, slightly higher than the external air pressure;

[0134] Step 5: The test motherboard provides dynamic electrical stress to the device under test, and real-time performance parameter testing is carried out by the host computer software platform;

[0135] Step 6: After the test time reaches the test point of the life reliability assessment test, take out the device under test from the high and low temperature test chamber and cool it down to the room temperature environment, and conduct performance parameter testing at room temperature;

[0136] Step 8: After the test is completed, record the parameters, and pay attention to the drift degree of each performance parameter relative to the initial value. After the recording is completed, repeat Steps 2 - 6 until the drift degree of a certain performance parameter has reached the device failure standard or the test time has reached the duration of the reliability assessment test. After the test and recording are completed, the life enhancement test ends;

[0137] Step 9: If all the performance parameters of the device under test are qualified at the end of the life enhancement test, the reliability assessment test of the device passes.

[0138] Although the content of the present invention has been introduced in detail through the above preferred embodiments, it should be understood that the above description should not be regarded as a limitation of the present invention. After those skilled in the art have read the above content, various modifications and substitutions to the present invention will be obvious. Therefore, the protection scope of the present invention should be defined by the appended claims.

Claims

1. A general automated reliability evaluation and verification device for low-level power management devices, characterized in that The device includes an automated test equipment (1), a test cable (2), a transfer motherboard (3), a verification daughter board (4), a high and low temperature test chamber (5), and the nitrogen gas injection device; wherein, The automated test equipment (1) is used for test excitation generation, system control, data analysis test, and report generation of the entire system; The test cable (2) is used to connect the automated test equipment (1) and the transfer motherboard (3); The transfer motherboard (3) is connected to the automated test equipment (1) and the verification daughter board (4) through various types of connectors, and is used for the transmission and excitation of test signals; The verification daughter board (4) adapts to the device under test, and is customized according to the electrical characteristics and interface requirements of the power management device under test to ensure compatibility and meet the test requirements; The high and low temperature test chamber (5) is used for environmental tests of power management devices under extreme temperature conditions; when performing high and low temperature environmental tests, the test fixture composed of the transfer motherboard (3), the verification daughter board (4), and the test fixing box is placed in the high and low temperature test chamber (5), and the electrical connection between the internal transfer motherboard (3) and the external automated test equipment (1) is realized through the cable through holes preset on the side wall of the chamber to ensure the effective transmission of test signals during the test process; The nitrogen gas injection device is connected to the high and low temperature test chamber (5) and is used to inject nitrogen gas into the high and low temperature test chamber (5) to reduce the moisture content in the chamber, thereby preventing condensation water or water vapor from appearing on the surface of the device during the temperature change process.

2. The reliability evaluation and verification device according to claim 1, characterized in that The test cable (2) is divided into two sets of long and short cables to adapt to different test scenarios, and is respectively used for different test requirements; When performing conventional electrical performance tests, short test cables are used; when performing high and low temperature environmental tests, long coaxial test cables are used in combination with capacitors, and corresponding different models of filter capacitors are selected at different temperatures to maintain the consistency of the capacitance values of the filter capacitors in the test circuit under different test temperature conditions, so as to achieve in-situ testing in a wide temperature range.

3. The reliability evaluation and verification device according to claim 1, wherein The automated test equipment (1) includes a power supply, a data acquisition instrument, a thermal imager, a programmable electronic load, and a test computer running a host computer module; wherein, The power supply is used to provide an accurately adjustable input voltage and current for the power management device under test, and to monitor the electrical parameters of the power supply circuit in real time; The data acquisition instrument is combined with a high-precision differential probe to collect the transient signal waveforms of key nodes of the device under test, and to monitor the voltage or current ripple, noise, and dynamic response characteristics; The thermal imager is used for non-contact measurement of the temperature distribution of the device under test under steady-state and dynamic loads, and combines thermal analysis software to achieve hot spot positioning, temperature rise curve drawing, and thermal resistance calculation, and supports synchronous trigger acquisition with electrical parameters; The programmable electronic load is used to simulate the dynamic load characteristics under working conditions and to achieve constant current, constant voltage, constant power, and dynamic load test modes; The test computer running the host computer module is used to integrally control the above-mentioned various test devices, realize the automation of the test process, real-time data processing and analysis, and generate a reliability evaluation report.

4. The reliability evaluation and verification device according to claim 1, wherein The bottom of the cabinet of the automated test equipment (1) is equipped with rollers for easy movement, and the front two wheels are equipped with brakes and locking devices; a cooling fan is installed on the top of the cabinet, and a filter screen is installed at the air outlet.

5. The reliability evaluation and verification device according to claim 1, wherein When conducting reliability evaluation tests of power management devices in high and low temperature environments, a transfer motherboard (3) and a verification daughter board (4) are arranged in the high and low temperature test chamber (5); among them, The transfer motherboard (3) is connected to the automated test equipment and the verification daughter board through various types of connectors, and undertakes the functions of transmitting and exciting two-way test signals between the automated test equipment and the verification daughter board; The verification daughter board (4) is adapted to the device under test, is designed according to the characteristics of devices of different specifications and models, and uses interchangeable connectors and adapters to achieve reliable connection with devices of different models, supports expanding test compatibility through partial replacement, and has high versatility; The design of the verification daughter board (4) can develop an actual working condition load circuit for each device; when the electronic load cannot fully cover the actual load working conditions, the actual load is used to replace the traditional electronic load to improve the accuracy of reliability assessment; The transfer motherboard (3) and the verification daughter board (4) form a test tooling through a standardized motherboard-daughter board hierarchical structure, establish a unified test interface and program framework, replace the traditional customized development mode for a single device, significantly improve the test efficiency and support multi-task fast switching.

6. The reliability evaluation and verification device according to claim 5, characterized in that The test tooling adopts a modular design and consists of a transfer motherboard (3), a verification daughter board (4) and a test fixing box; among them, The test tooling has two working modes: during the test of conventional electrical performance parameters, it is integrally integrated into the drawer-type structure of the cabinet of the automated test equipment (1); during the high and low temperature environment test, the test tooling can be integrally transferred into the high and low temperature test chamber (5) for testing; All signal test points of the test tooling are concentrated in the signal box of the automated test equipment (1). The signal box integrates circuits such as relay switches, power supply control, and signal conditioning, and leads out the test signals of the test tooling from the panel and accesses them to instruments such as data acquisition instruments, thermal imagers, and electronic loads for testing; The test fixing box is placed in the drawer. When in use, the drawer can be pulled out to insert and unplug the cables, and closing the drawer does not affect the normal use of the cabinet; The test fixing box can fix the verification daughter board and the heat dissipation strengthening board; the fixing position of the daughter board is unique, which is convenient for replacing other daughter boards. A heat dissipation metal plate is designed under the power supply chip of the daughter board to strengthen the heat dissipation of the chip.

7. The reliability evaluation and verification device according to claim 6, wherein The materials used in the fixing box include PF, ABS, and aluminum alloy, all of which have good high and low temperature resistance and meet the test conditions in high and low temperature environments; the plug-in fixing terminals of the daughter board have a certain elasticity to ensure the stability after the daughter board is pressed in, and at the same time, it is also convenient for replacement, that is, the daughter board is inserted into the fixing box and locked firmly, and it is easy to operate when pulled out for replacement.

8. The reliability evaluation and verification device according to claim 3, wherein The upper computer module operated by the test computer includes: a main control module, a self-check module, a test control module, and a data management module; among them, The main control module is responsible for the configuration, scheduling, and management of system software and hardware resources, provides a user interaction interface, and calls the self-check module at startup. It controls the task execution permissions according to the self-check results and allows users to view historical data in case of device failures. The self-check module realizes the detection of hardware status, communication lines, and power supply voltage, feeds back the results to the main control module, and displays fault information. The test control module is independently designed for each functional module, with independent functions and no mutual influence. The data management module includes a data storage and output sub-module. The storage module realizes the functions of temporary caching and hard disk storage. The output module provides data chart display, playback, and customized report generation, and supports operations such as saving, printing, and exporting documents.

9. The reliability evaluation and verification device according to claim 1, wherein, The screen display of the automated test equipment includes a menu bar, a device management area, and a test area; among them, The menu bar includes: a test management unit, a data recording unit, an instrument maintenance unit, a start and stop unit, and a user management unit; the device management area displays the information of the samples to be tested; the test area displays all test items and test results: The test management unit adds and deletes existing devices under test according to model number, batch number, and serial number to facilitate the selection of devices under test during testing, and also supports batch file import. The test management unit sets parameters for test items such as "start-up characteristics", "power output", "power output", "protection circuit", "inrush current", "auxiliary function", and multiple power-on and power-off for power management devices, and views the test results. The test management unit sets up the automated test process; an automated test sequence loads and configures any test items, and also supports changing the order of test items. The data recording unit includes three functions: viewing test results, exporting data records, and generating test reports; the data records are exported in the format required by the user, supporting.txt,.csv, and excel formats; the test reports are also exported in word or PDF mode according to the established requirements of the user; SQL Server 2008 database is used for data management to record test data and provides a query function to compare and display test data at different stages of the same product. The instrument maintenance unit involves all measurement devices used in this system, including the connection status and setting parameters of each device. The user management unit divides users into two categories, one is an administrator user and the other is a test user; the administrator user has the highest system authority and is responsible for user account management, test parameter configuration, system setting modification, and access and export of all test data; the test user has limited permissions and can only execute the preset test process, view the current test data, and generate test reports.

10. An evaluation and verification method for a reliability evaluation and verification device applied to any one of claims 1-9, characterized in that, Including the steps: Step (1): Determine the test plan for the reliability assessment test of the power management device to be tested; the specific design is as follows: Step 11): The test duration is 2000 hours, and the test temperature point is 85 °C. Step 12): The test points are selected for testing every 400 hours (0h, 400h, 800h, 1200h, 1600h, 2000h). Step 13) Test the thermal stress conditions until the case temperature of the device under test reaches the maximum rated operating temperature of 85°C. Step 14) For the performance parameter test method, test each performance parameter in accordance with standards such as QJ 10006-2008, GJB 7400-2011, and GJB 548C-2021. Step (2): After installing the device under test on the verification daughter board, place the test fixture into the drawer of the automated test equipment. Step (3): Conduct an initial electrical parameter test on the device at room temperature. Step (4): Place the test tooling in a high and low temperature test chamber and heat it to make the internal environment reach 85°C. Keep it for 10 minutes to remove the water vapor and other gases adsorbed by the device under test, and then evacuate the chamber; then introduce nitrogen gas into the high and low temperature test chamber until the internal pressure of the chamber returns to 1.1×10 5 Pa, slightly higher than the external air pressure; Step (5): The test motherboard provides dynamic electrical stress to the device under test, and real-time performance parameter testing is performed by the host computer software platform. Step (6): After the test time reaches the test point of the life reliability assessment test, take the device under test out of the high and low temperature test chamber and cool it down to the room temperature environment, and conduct performance parameter testing at room temperature. Step (8): After the test is completed, record the parameters, and pay particular attention to the degree of drift of each performance parameter from the initial value. After the recording is completed, repeat Steps 2-6 until the degree of drift of a certain performance parameter has reached the device failure standard or the test time has reached the duration of the reliability assessment test. After the testing and recording are completed, the life enhancement test ends. Step (9): If all the performance parameters of the device under test are qualified at the end of the life enhancement test, the reliability assessment test of the device passes.

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