Storage device parameter configuration method, test method, electronic equipment and test equipment

Abstract

The invention discloses a storage device parameter configuration method, a test method, electronic equipment and test equipment. The method is applied to a controller, the controller is connected with a test mainboard, and the test mainboard is used for testing a storage device to be tested. The method comprises the following steps: in response to an acquired parameter configuration instruction, sending a first instruction to a test mainboard to control the test mainboard to enter a basic output-input system; and sending a second instruction to the test mainboard based on the preset parameter configuration file to enable the test mainboard to set corresponding storage device configuration parameters in the basic output and input system based on the second instruction, wherein the storage device configuration parameters are used for testing the to-be-tested storage device. In this way, the test efficiency of the storage device can be improved.

Description

Technical Field

[0001] This application relates to the field of storage, and particularly to a method for configuring storage device parameters, a testing method, an electronic device, and a testing device. Background Art

[0002] DIMM (Dual Inline Memory Modules), that is, the commonly referred to memory module. It is specifically divided into UDIMM (Unbuffered DIMM, usually used in ordinary commercial / home hosts) and RDIMM (Registered DIMM, usually used in servers).

[0003] In general memory testing, for different die resources and product requirements, it is necessary to modify test parameters such as timing, voltage, and frequency to screen out defective products or select better products. However, the setting of these parameters usually needs to be done manually according to the memory to be tested. When dealing with different multiple products or having different product requirements, the testing efficiency of this method is very low. Summary of the Invention

[0004] The main purpose of this application is to provide a method for configuring storage device parameters, a testing method, an electronic device, and a testing device, which can solve the technical problem of low testing efficiency of storage devices.

[0005] To solve the above technical problem, the first technical solution adopted by this application is: to provide a method for configuring storage device parameters. This method is applied to a controller, and the controller is connected to a test mainboard for testing a storage device to be tested. The method includes: in response to obtaining a parameter configuration instruction, sending a first instruction to the test mainboard to control the test mainboard to enter the basic input / output system; sending a second instruction to the test mainboard based on a preset parameter configuration file so that the test mainboard sets corresponding storage device configuration parameters in the basic input / output system, and the storage device configuration parameters are used to test the storage device to be tested.

[0006] To solve the above technical problem, the second technical solution adopted by this application is: to provide a method for testing a storage device. This method is applied to a testing device, and the testing device includes a controller and a test mainboard. The controller is connected to the test mainboard, and the test mainboard is used to test a storage device to be tested. The method includes: the controller sets storage device configuration parameters in the basic input / output system of the test mainboard based on the storage device parameter configuration method described in the first technical solution; the test mainboard tests the storage device to be tested based on the storage device configuration parameters.

[0007] To solve the above technical problems, the third technical solution adopted by this application is: to provide an electronic device. The electronic device includes a memory and a processor. The memory is used to store program data, and the program data can be executed by the processor to implement the method described in the first technical solution.

[0008] To solve the above technical problems, the fourth technical solution adopted by this application is: to provide a test device. The test device includes a controller and a test main board. The controller is connected to the test main board, and the test main board is used to test the storage device to be tested. The controller and the test main board jointly implement the storage device test method described in the second technical solution.

[0009] The beneficial effect of this application is: when parameter configuration is required, the controller sends a first instruction to the test main board to control the test main board to enter the basic input / output system, and then continues to send a second instruction to the test main board, so that the test main board operates based on the second instruction in the basic input / output system. The second instruction is obtained by the controller based on a preset parameter configuration file, and the configuration parameters in the preset parameter configuration file are relevant parameters required for the test main board to test the storage device to be tested. Therefore, the test main board performs corresponding operation settings according to the second instruction in the basic input / output system to set the configuration parameters of the corresponding storage device for subsequent testing. By controlling the test main board through the controller, entering the basic input / output system and setting the configuration parameters, the setting and modification of the configuration parameters are made more convenient and rapid, greatly improving the configuration efficiency of the storage device configuration parameters, and thus improving the test efficiency of the storage device. Description of the Drawings

[0010] To more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0011] Figure 1 It is a schematic flowchart of the first embodiment of the storage device parameter configuration method of this application;

[0012] Figure 2 It is a schematic flowchart of the second embodiment of the storage device parameter configuration method of this application;

[0013] Figure 3 It is a schematic flowchart of the third embodiment of the storage device parameter configuration method of this application;

[0014] Figure 4 It is a schematic flowchart of the fourth embodiment of the storage device parameter configuration method of this application;

[0015] Figure 5 It is a schematic flowchart of the fifth embodiment of the method for configuring storage device parameters in this application;

[0016] Figure 6 It is a schematic flowchart of the first embodiment of the method for testing a storage device in this application;

[0017] Figure 7 It is a schematic structural diagram of an embodiment of an electronic device in this application;

[0018] Figure 8 It is a schematic structural diagram of an embodiment of a test device in this application. Detailed implementation manners

[0019] Next, the technical solutions in the embodiments of this application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of this application.

[0020] The terms "first", "second", etc. in this application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, methods, products, or devices.

[0021] Referring to "embodiment" in this context means that a specific feature, structure, or characteristic described in conjunction with the embodiment may be included in at least one embodiment of this application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art explicitly and implicitly understand that the embodiments described herein may be combined with other embodiments.

[0022] In conventional memory testing, the testing of storage products, such as DIMM and other storage products, is usually based on a test motherboard, such as X86, etc. The conventional practice is to manually set parameters in the test motherboard. However, this practice is very error-prone when there are many parameters, and when testing different products, manual re-setting is also required, reducing the testing efficiency.

[0023] This application proposes the methods described in the following embodiments to solve the problems of easy error and low efficiency in the testing of storage products.

[0024] Refer toFigure 1 , Figure 1 is a schematic flowchart of the first embodiment of the parameter configuration method for the storage device of this application. This method is applied to a controller, which is connected to a test mainboard for testing a storage device to be tested. The method includes the following steps:

[0025] S11: In response to obtaining a parameter configuration instruction, send a first instruction to the test mainboard to control the test mainboard to enter the Basic Input Output System.

[0026] After obtaining the parameter configuration instruction, the controller starts to configure the parameters of the storage device in the test mainboard. In order to configure the parameters, it is first necessary to enter the Basic Input Output System. The Basic Input Output System, also known as BIOS. Usually, the method to enter BIOS is for a person to input corresponding instructions through a USB HID device (such as a keyboard) connected to the test mainboard to enter BIOS. In this application, by connecting the controller to the test mainboard, the controller is used to simulate a USB HID device to send a first instruction to the test mainboard to enter BIOS. For example, when entering BIOS through a USB HID device, it is entered by pressing the "F2" key. When simulating a USB HID device, the controller sends a first instruction to the test mainboard to simulate the signal of pressing the "F2" key, so as to enter BIOS.

[0027] S12: Based on a preset parameter configuration file, send a second instruction to the test mainboard so that the test mainboard sets corresponding storage device configuration parameters in the Basic Input Output System according to the second instruction, and the storage device configuration parameters are used to test the storage device to be tested.

[0028] After entering BIOS, the controller determines the second instruction according to the preset parameter configuration file, and then sends the second instruction to the test mainboard to configure parameters in BIOS. The preset parameter configuration file includes the configuration parameters required for testing the storage device, and the second instruction is simulated according to these storage device configuration parameters. The controller sends the second instruction to the test mainboard to simulate the key sequence for configuring these storage device parameters, so as to set parameters in BIOS, so that finally the test mainboard can test the storage device according to the storage device configuration parameters.

[0029] In this embodiment, when parameter configuration is required, a first instruction is sent to the test main board through the controller to control the test main board to enter the basic input / output system, and then a second instruction is sent to the test main board, so that the test main board operates in the basic input / output system based on the second instruction. The second instruction is obtained by the controller based on a preset parameter configuration file, and the configuration parameters in the preset parameter configuration file are relevant parameters required for the test main board to test the storage device to be tested. Therefore, the test main board performs corresponding operation settings in the basic input / output system according to the second instruction to set the storage device configuration parameters of the corresponding storage device for subsequent testing. By using the controller to control the test main board to enter the basic input / output system and set the configuration parameters, the setting and modification of the configuration parameters are made more convenient and rapid, greatly improving the configuration efficiency of the storage device configuration parameters.

[0030] Referring to Figure 2 , Figure 2 is a schematic flowchart of the second embodiment of the method for configuring storage device parameters of the present application. It includes the following steps:

[0031] S21: Obtain the target device type of the storage device to be tested.

[0032] Before sending the second instruction to the test main board based on the preset parameter configuration file, it is necessary to determine the corresponding configuration file according to the device type of the storage device to be tested. During testing, each storage device corresponds to at least one set of storage device configuration parameters for testing it. A set of storage device configuration parameters constitutes a configuration file. The preset parameter configuration file includes at least one configuration file, and each configuration file corresponds to at least one device type of the storage device. The information of the device type of the storage device is also included in the preset parameter configuration file and corresponds to the configuration file. It can be stored in the configuration file or correspond to the configuration file as the attribute information of the configuration file.

[0033] S22: Select the corresponding target configuration file in the preset parameter configuration file according to the target device type.

[0034] After obtaining the target device type, determine the corresponding configuration file according to the target device type as the target configuration file.

[0035] S23: Obtain the second instruction for configuring the storage device configuration parameters according to the target configuration file.

[0036] The second instruction is obtained by the controller based on the target parameter configuration file. Therefore, the test main board performs corresponding operations in the basic input / output system according to the second instruction to set the storage device configuration parameters of the corresponding storage device to be tested.

[0037] In one embodiment, when sending a second instruction to the test main board based on a preset parameter profile, if there is no target profile corresponding to the target device type in the preset parameter profile, the second instruction is obtained according to the basic profile, or an error prompt is given.

[0038] The basic profile is a profile determined in advance by the user that can be used for all storage devices. The basic profile does not correspond to any device type, so this basic profile is not considered when looking for a profile corresponding to the device type in the preset parameter profile. When there is no profile corresponding to the device type in the preset parameter profile, this basic profile is used as the target profile. Alternatively, the parameter configuration process is terminated, the test process is aborted, and an error is reported to the user.

[0039] Refer to Figure 3 , Figure 3 which is a schematic flowchart of the third embodiment of the method for configuring storage device parameters in this application. This method is a further extension of the above embodiment and includes the following steps:

[0040] S31: Select at least two corresponding profiles in the preset parameter profile according to the target device type.

[0041] When there is at least one device type corresponding to at least two profiles, when selecting the corresponding target profile in the preset parameter profile according to the target device type, at least two corresponding profiles can be determined according to the target device type.

[0042] S32: Based on the priority order of the at least two profiles, determine the profile with the highest priority as the target profile.

[0043] In order to determine the profile to be used for testing from the at least two profiles, a priority order corresponding to the target device type is set for these at least two profiles. The one with the highest priority is used as the target profile for testing.

[0044] Refer to Figure 4 , Figure 4 which is a schematic flowchart of the fourth embodiment of the method for configuring storage device parameters in this application. This method is a further extension based on the fourth embodiment and includes the following steps:

[0045] S41: In response to the completion of the test of the storage device to be tested by the test main board, remove the profile that has completed the test from the priority order to obtain a new priority order.

[0046] After determining the configuration file with the highest priority from at least two configuration files as the target configuration file, and sending a second instruction to the test main board based on the target configuration file to enable the test main board to set the corresponding storage device configuration parameters in the basic input / output system, the test main board starts testing based on the second instruction. In this embodiment, the test is completed, including passing the test or failing the test.

[0047] After the test is completed, the controller continues to test the storage device in response to the completion of the test by the test main board. The configuration file that has completed the test is removed from the priority order to obtain a new priority order.

[0048] S42: Based on the new priority order, determine the configuration file with the highest priority as the new target configuration file.

[0049] S43: Obtain a new second instruction for configuring the storage device configuration parameters according to the new target configuration file.

[0050] S44: Send a new second instruction to the test main board to enable the test main board to set the corresponding storage device configuration parameters in the basic input / output system based on the new second instruction.

[0051] According to the new priority order, select the configuration file with the highest priority as the new target configuration file again to obtain a new second instruction, and send the new second instruction to the test main board for parameter configuration.

[0052] Through the combination of the third embodiment and the fourth embodiment, the present application can set at least two corresponding configuration files for a storage device type, first test the configuration file with the highest priority, and after the test is completed, continue to select the configuration file with the highest priority for testing according to the new priority order. Through multi-level testing, the performance grading discrimination of the storage device is realized, and storage devices with different levels of performance are selected. When the configuration file with the highest performance standard test is used as the highest priority in the order of performance from high to low, when the test fails, continue to select the configuration file for testing. When the configuration file with the lowest performance standard test is used as the highest priority in the order of performance from high to low, when the test passes, continue to select the configuration file for testing.

[0053] Refer to Figure 5 , Figure 5 which is a schematic flowchart of the fifth embodiment of the method for configuring storage device parameters of the present application. This method is a further extension based on the fifth embodiment, and it includes the following steps:

[0054] S51: Determine whether a continue testing instruction is obtained.

[0055] Before removing the configured file that has completed testing from the priority order to obtain a new priority order, it is determined whether a continue testing instruction is obtained. After the test motherboard completes the test, if the continue testing instruction is not obtained, the testing is not performed. If the continue testing instruction is obtained, step S52 is executed.

[0056] S52: Based on the continue testing instruction, remove the configured file that has completed testing from the priority order to obtain a new priority order.

[0057] Start determining a new priority order, so as to determine a new target configured file for testing.

[0058] In one embodiment, the test motherboard is further provided with a display, and the display is used to display the interface of the basic input / output system. The user can observe whether the configuration of the storage device configuration parameters is accurate through the display.

[0059] When the user finds that there is a problem with the parameter configuration, a stop testing instruction can be input to the controller, and the controller responds to the stop testing instruction to stop the parameter configuration and control the test motherboard to stop testing.

[0060] Refer to Figure 6 , Figure 6 is a schematic flowchart of the first embodiment of the method for testing storage device parameters of the present application. This method is applied to a test device, and the test device includes a controller and a test motherboard. The controller is connected to the test motherboard, and the test motherboard is used to test the storage device to be tested. The method includes the following steps:

[0061] S61: The controller sets the storage device configuration parameters in the basic input / output system of the test motherboard based on the storage device parameter configuration method.

[0062] Wherein the storage device parameter configuration method is the method provided by any embodiment and possible combinations of the above storage device configuration methods of the present application.

[0063] S62: The test motherboard tests the storage device to be tested based on the storage device configuration parameters.

[0064] After the controller sets the storage device configuration parameters, save the configuration parameters. Control the test motherboard to power on again and start testing according to the storage device configuration parameters.

[0065] In one embodiment, the test motherboard is provided with a display, and the display is used to display the interface of the basic input / output system. When the user discovers a problem during the parameter configuration process through the display, a stop testing instruction can be input to the controller, and the controller responds to the stop testing instruction to stop the parameter configuration and control the test motherboard to stop testing.

[0066] As Figure 7 shown,Figure 7 This is a schematic structural diagram of an embodiment of the electronic device of the present application.

[0067] The electronic device includes a processor 110 and a memory 120.

[0068] The processor 110 controls the operation of the electronic device. The processor 110 can also be referred to as a CPU (Central Processing Unit). The processor 110 may be an integrated circuit chip with the ability to process signal sequences. The processor 110 can also be a general-purpose processor, a digital signal sequence processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.

[0069] The memory 120 stores the instructions and program data required for the operation of the processor 110.

[0070] The processor 110 is used to execute instructions to implement the method provided by any embodiment and possible combinations in the foregoing storage device parameter configuration method of the present application.

[0071] As Figure 8 shown, Figure 8 This is a schematic structural diagram of an embodiment of the test device of the present application.

[0072] The test device includes a controller 210 and a test main board 220. The controller 210 is connected to the test main board 220 to implement the method provided by any embodiment and possible combinations in the storage device test method of the present application.

[0073] The controller 210 can be referred to as a CPU (Central Processing Unit). The controller 210 may be an integrated circuit chip with the ability to process signal sequences. The controller 210 can also be a general-purpose processor, a digital signal sequence processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.

[0074] The test main board 220 is any main board capable of testing a storage device, such as an X86 main board, etc.

[0075] In summary, when parameter configuration is required in this application, the controller sends a first instruction to the test main board to control the test main board to enter the basic input / output system, and then continues to send a second instruction to the test main board, so that the test main board operates in the basic input / output system based on the second instruction. The second instruction is obtained by the controller based on a preset parameter configuration file, and the configuration parameters in the preset parameter configuration file are relevant parameters required for the test main board to test the storage device to be tested. Therefore, the test main board sets the corresponding storage device configuration parameters according to the second instruction in the basic input / output system for subsequent testing. By using the controller to control the test main board to enter the basic input / output system and set the configuration parameters, the setting and modification of the configuration parameters are made more convenient and rapid, greatly improving the configuration efficiency of the storage device configuration parameters.

[0076] In several embodiments provided by this application, it should be understood that the disclosed method and device can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0077] The units described as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0078] In addition, in each embodiment of this application, the functional units can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0079] If the integrated units in the above-mentioned other embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor to execute all or part of the steps of the methods described in various embodiments of the present application. The foregoing storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical discs.

[0080] The above are only the embodiments of the present application, and do not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present application, or directly or indirectly applied in other related technical fields, shall be equally included in the patent protection scope of the present application.

Claims

1. A method for configuring storage device parameters, characterized in that, Applied to a controller, the controller is connected to a test main board, and the test main board is used to test a storage device to be tested. The method includes: In response to obtaining a parameter configuration instruction, send a first instruction to the test main board to control the test main board to enter the basic input / output system; Based on a preset parameter configuration file, send a second instruction to the test main board so that the test main board sets corresponding storage device configuration parameters in the basic input / output system based on the second instruction, and the storage device configuration parameters are used to test the storage device to be tested.

2. The method according to claim 1, characterized in that The preset parameter configuration file includes at least one configuration file, and each configuration file corresponds to at least one device type of the storage device. Before sending the second instruction to the test main board based on the preset parameter configuration file, it includes: Obtain the target device type of the storage device to be tested; Sending the second instruction to the test main board based on the preset parameter configuration file includes: Select a corresponding target configuration file in the preset parameter configuration file according to the target device type; Obtain the second instruction for configuring the storage device configuration parameters according to the target configuration file.

3. The method according to claim 2, wherein The preset parameter configuration file also includes a basic configuration file. Sending the second instruction to the test main board based on the preset parameter configuration file includes: In response to the non-existence of the target configuration file corresponding to the target device type in the preset parameter configuration file, obtain the second instruction according to the basic configuration file, or give an error prompt.

4. The method according to claim 2, wherein There is at least one device type corresponding to at least two configuration files. Selecting the corresponding target configuration file in the preset parameter configuration file according to the target device type includes: Select the corresponding at least two configuration files in the preset parameter configuration file according to the target device type; Based on the priority order of the at least two configuration files, determine the configuration file with the highest priority as the target configuration file.

5. The method according to claim 4, wherein After sending the second instruction to the test main board based on the preset parameter configuration file so that the test main board sets corresponding storage device configuration parameters in the basic input / output system based on the second instruction, it includes: In response to the completion of the test of the storage device to be tested by the test main board, remove the configured file that has completed the test from the priority order to obtain a new priority order; Based on the new priority order, determine the configuration file with the highest priority as the new target configuration file; Obtain a new second instruction for configuring the storage device configuration parameters according to the new target configuration file; Send the new second instruction to the test main board so that the test main board sets corresponding storage device configuration parameters in the basic input / output system based on the new second instruction.

6. The method according to claim 5, characterized in that Before removing the configured file that has completed the test from the priority order to obtain a new priority order, it includes: Determine whether a continue test instruction is obtained; If so, remove the configured file that has completed the test from the priority order based on the continue test instruction to obtain a new priority order.

7. A method for testing a storage device, characterized in that, Applied to a test device, the test device includes a controller and a test main board, the controller is connected to the test main board, and the test main board is used to test a storage device to be tested. The method includes: The controller sets storage device configuration parameters in the basic input / output system of the test main board based on the storage device parameter configuration method according to any one of claims 1-6; The test main board tests the storage device to be tested based on the storage device configuration parameters.

8. The method according to claim 7, characterized in that, The test main board is provided with a display, and the display is used to display the interface of the basic input / output system.

9. An electronic device, characterized in that, Including a memory and a processor, the memory is used to store program data, and the program data can be executed by the processor to implement the method according to any one of claims 1-6.

10. A test device, characterized in that, The test device includes a controller and a test main board, the controller is connected to the test main board, the test main board is used to test a storage device to be tested, and the controller implements the storage device parameter configuration method according to any one of claims 1-6, so as to jointly implement the storage device test method according to any one of claims 7-8 with the test main board.

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