Temperature drift calibration method and device, electronic equipment, storage medium and program product

Abstract

The embodiment of the invention provides a temperature drift calibration method and device, electronic equipment, a storage medium and a program product, and the method comprises the steps: determining a target gain error corresponding to an analog-to-digital converter according to the output data of the analog-to-digital converter working at a first temperature and a second temperature, the target gain error is the gain error when the analog-to-digital converter in the target state works at the second temperature; the target state is used for indicating that the analog-to-digital converter is in a differential input mode, the first input end of the analog-to-digital converter receives a constant reference voltage signal, and the second input end of the analog-to-digital converter receives any analog voltage signal; and when the analog-to-digital converter in the target state works at the second temperature, determining the input voltage difference of the two input ends of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter. According to the scheme, the accuracy of signal detection through the analog-to-digital converter is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of data processing, and in particular, to a temperature drift calibration method, apparatus, electronic device, storage medium, and program product. Background Art

[0002] An analog-to-digital converter (ADC) is an electronic component that can convert an analog signal into a digital signal. In practical applications, signal detection can be performed through an analog-to-digital converter.

[0003] During the process of using an analog-to-digital converter for signal detection, the analog-to-digital converter can be adjusted to the differential input mode first, and then an arbitrary first voltage signal and a second voltage signal with a relatively constant voltage value are respectively input to the two input terminals of the analog-to-digital converter (both the first voltage signal and the second voltage signal are analog voltage signals), and the output value of the analog-to-digital converter is obtained. Then, based on the linear relationship between the voltage difference between the two voltage signals input to the analog-to-digital converter and the output data of the analog-to-digital converter, and the above output value, the voltage difference between the first voltage signal and the second voltage signal is determined, so as to obtain more information according to this voltage difference. For example, if the first voltage signal and the second voltage signal are respectively two voltage signals generated by a blood oxygen monitoring device, after obtaining the voltage difference between these two voltage signals, the monitoring result of blood glucose monitoring can be obtained according to this voltage difference.

[0004] However, the above linear relationship is generally obtained by sampling the input and output of the analog-to-digital converter at a certain temperature and then fitting the sampled data. The ambient temperature when the analog-to-digital converter is actually used is likely to be different from the ambient temperature when data sampling is performed on the analog-to-digital converter, which will cause temperature drift in the analog-to-digital converter, and further cause a large error between the voltage difference between the first voltage signal and the second voltage signal determined according to the above linear relationship and the actual voltage difference between the first voltage signal and the second voltage signal, resulting in low accuracy of signal detection through the analog-to-digital converter. Summary of the Invention

[0005] In view of this, the embodiments of the present application provide a temperature drift calibration method, apparatus, electronic device, storage medium, and program product to at least partially solve the above problems.

[0006] According to the first aspect of the embodiments of the present application, a temperature drift calibration method is provided, including: determining a target gain error corresponding to the analog-to-digital converter according to the output data of the analog-to-digital converter when operating at a first temperature and the output data of the analog-to-digital converter when operating at a second temperature, where the first temperature is different from the second temperature, and the target gain error is the gain error of the analog-to-digital converter in the target state when operating at the second temperature, and the target state is used to indicate that the analog-to-digital converter is in a differential input mode, a constant reference voltage signal is received at a first input terminal of the analog-to-digital converter, and an arbitrary analog voltage signal is received at a second input terminal of the analog-to-digital converter; during the process of the analog-to-digital converter in the target state operating at the second temperature, determining an input voltage difference between the two input terminals of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter.

[0007] According to the second aspect of the embodiments of the present application, a temperature drift calibration device is provided, including: a calibration unit configured to determine a target gain error corresponding to the analog-to-digital converter according to the output data of the analog-to-digital converter when operating at a first temperature and the output data of the analog-to-digital converter when operating at a second temperature, where the first temperature is different from the second temperature, and the target gain error is the gain error of the analog-to-digital converter in the target state when operating at the second temperature, and the target state is used to indicate that the analog-to-digital converter is in a differential input mode, a constant reference voltage signal is received at a first input terminal of the analog-to-digital converter, and an arbitrary analog voltage signal is received at a second input terminal of the analog-to-digital converter; a determination unit configured to determine an input voltage difference between the two input terminals of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter during the process of the analog-to-digital converter in the target state operating at the second temperature.

[0008] According to the third aspect of the embodiments of the present application, an electronic device is provided, including: a processor, a memory, a communication interface, and a communication bus, where the processor, the memory, and the communication interface complete communication with each other through the communication bus; the memory is used to store at least one executable instruction, and the executable instruction causes the processor to perform the operations corresponding to the method in the first aspect above.

[0009] According to the fourth aspect of the embodiments of the present application, a computer storage medium is provided, on which a computer program is stored, and the program is executed by the processor to perform the method in the first aspect above.

[0010] According to the fifth aspect of the embodiments of the present application, a computer program product is provided, including computer instructions, and the computer instructions instruct a computing device to perform the method in the first aspect above.

[0011] According to the temperature drift calibration scheme provided by the embodiments of the present application, the target gain error corresponding to the analog-to-digital converter can be determined based on the output data of the analog-to-digital converter when it operates at the first temperature and the output data of the analog-to-digital converter when it operates at the second temperature. Then, during the process of the analog-to-digital converter in the target state operating at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter can be determined based on the target gain error and the output data of the analog-to-digital converter. Thus, compared with directly determining the input voltage difference between the two input terminals of the current analog-to-digital converter according to the gain error of the analog-to-digital converter at any temperature, in the present application, the target gain error is determined based on the output data of the analog-to-digital converter when it operates at two different temperatures, realizing the calibration of the temperature drift of the analog-to-digital converter, so that during the process of the analog-to-digital converter in the target state operating at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter determined based on the target gain error is more accurate, improving the accuracy of signal detection through the analog-to-digital converter. Description of the Drawings

[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present application. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings.

[0013] Figure 1 is the circuit diagram of a blood glucose monitoring device according to an embodiment of the present application;

[0014] Figure 2 is the flowchart of a temperature drift calibration method according to an embodiment of the present application;

[0015] Figure 3 is the structural schematic diagram of an analog-to-digital converter according to an embodiment of the present application;

[0016] Figure 4 is the result schematic diagram of obtaining the input voltage difference of the analog-to-digital converter according to an embodiment of the present application;

[0017] Figure 5 is the result schematic diagram of obtaining the input voltage difference of the analog-to-digital converter according to another embodiment of the present application;

[0018] Figure 6 is the result schematic diagram of obtaining the input voltage difference of the analog-to-digital converter according to still another embodiment of the present application;

[0019] Figure 7 is the schematic diagram of a temperature drift calibration device according to an embodiment of the present application;

[0020] Figure 8Schematic diagram of an electronic device according to an embodiment of the present application. Detailed implementation manners

[0021] Application environment of this application

[0022] An embodiment of the present application proposes a temperature drift calibration solution. The entire temperature drift calibration solution is relatively general and can be used for signal detection through an analog-to-digital converter. For example, it can be used to detect the voltage difference between two voltage signals generated by a blood glucose monitoring device through an analog-to-digital converter. Specifically as follows:

[0023] Figure 1 Circuit diagram of a blood glucose monitoring device according to an embodiment of the present application. As Figure 1 shown, the blood glucose monitoring device includes a voltage source V0, a first operational amplifier OPA1, a second operational amplifier OPA2, a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a feedback resistor Rf, an analog-to-digital converter ADC, a first electrochemical probe WE, a second electrochemical probe RE, and a third electrochemical probe CE. The positive input terminal of the ADC is used to receive the first signal with a constant voltage value of v1 provided by V0 to the ADC, and the negative input terminal of the ADC is used to receive the second signal output from OPA1 to the ADC. Both the first signal and the second signal are analog voltage signals. When using the blood glucose monitoring device, the ADC is adjusted to the differential input mode (the differential input mode is specifically introduced below and will not be elaborated here). At this time, according to the temperature drift calibration solution in the present application, the difference between the current voltage value v2 of the second signal and the voltage value v1 of the first signal can be determined based on the value output by the ADC, realizing the voltage difference detection of the two voltage signals generated by the blood glucose monitoring device through the ADC.

[0024] In the above example, after determining v2 - v1 based on the temperature drift calibration solution in the present application, blood glucose monitoring can be realized according to v2 - v1. Specifically, when using the blood glucose monitoring device, WE, RE, and CE are in contact with three positions of the monitoring object, so that the equivalent impedance R01 between WE and RE and the equivalent impedance R02 between RE and CE are both large enough. Furthermore, the current Im flowing through the wire connected to WE8 is approximately equal to the current Is between WE and CE. Based on this, Is≈Im = (v2 - v1) / rf. Since rf (rf is the resistance value of Rf) is known, and it has been recorded above that v2 - v1 can be determined through the temperature drift calibration solution of the present application, Is can be determined, that is, the parameters related to blood glucose are determined, realizing blood glucose monitoring.

[0025] It should be noted that the above voltage difference detection of the two voltage signals generated by the blood glucose monitoring device through the analog-to-digital converter is only an example of the application of the temperature drift calibration scheme, and the application scenario of the temperature drift calibration scheme in the embodiments of the present application is not limited; moreover, this temperature drift calibration scheme can be executed by a data center, a server, a personal computer, an Internet of Things (IoT) device, an embedded device, etc., and the temperature drift calibration scheme has nothing to do with the hardware deployed by the computing device that executes this scheme.

[0026] Temperature drift calibration method

[0027] The embodiments of the present application provide a temperature drift calibration method, and the following will elaborate on this temperature drift calibration method through multiple embodiments.

[0028] Figure 2 is a flowchart of the temperature drift calibration method according to an embodiment of the present application. As Figure 2 shown, this temperature drift calibration method includes the following steps:

[0029] Step 201: Determine the target gain error corresponding to the analog-to-digital converter according to the output data of the analog-to-digital converter when it works at the first temperature and the output data of the analog-to-digital converter when it works at the second temperature.

[0030] Among them, the first temperature is different from the second temperature, and the target gain error is the gain error of the analog-to-digital converter when it works at the second temperature in the target state, and the target state is used to indicate that the analog-to-digital converter is in the differential input mode, the first input terminal of the analog-to-digital converter receives a constant reference voltage signal, and the second input terminal of the analog-to-digital converter receives an arbitrary analog voltage signal.

[0031] The differential input mode is a working mode of the analog-to-digital converter. When the analog-to-digital converter is in the differential input mode, the voltage difference between the voltage signals received by the two input terminals of the analog-to-digital converter and the value output by the analog-to-digital converter basically satisfy a linear relationship: Code1 = ΔV * k1 + b1, where Code1 is the value output by the analog-to-digital converter in the differential input mode, ΔV is the voltage difference between the voltage signals received by the two input terminals of the analog-to-digital converter, k1 is the gain error of the analog-to-digital converter at this time, and b1 is the offset error of the analog-to-digital converter at this time.

[0032] Optionally, the analog-to-digital converter may also have a working mode of single-ended input mode. When the analog-to-digital converter is in the single-ended input mode, one input terminal of the analog-to-digital converter is in a state of receiving a reference voltage signal generated inside the analog-to-digital converter, and the voltage of the voltage signal received by the other input terminal of the analog-to-digital converter and the value output by the analog-to-digital converter basically satisfy a linear relationship: Code2 = Vp * k2 + b2, where Code2 is the value output by the analog-to-digital converter in the single-ended input mode, Vp is the voltage of the voltage signal received by the other input terminal of the analog-to-digital converter, k2 is the gain error of the analog-to-digital converter at this time, and b2 is the offset error of the analog-to-digital converter at this time.

[0033] The reference voltage signal is the voltage signal output by the bandgap reference voltage source BG included in the analog-to-digital converter. In an ideal situation, the voltage value of the reference voltage signal generated by the analog-to-digital converter in the differential input mode is greater than or equal to the voltage value of the reference voltage signal generated by the analog-to-digital converter in the single-ended input mode, and the voltage value of the reference voltage signal generated by the analog-to-digital converter in the differential input mode is an integer multiple of the voltage value of the reference voltage signal generated by the analog-to-digital converter in the single-ended input mode.

[0034] When actually using the analog-to-digital converter, whether the analog-to-digital converter works in the differential input mode or the single-ended input mode, the temperature change in the working environment of the analog-to-digital converter will basically cause changes in the gain error and offset error of the analog-to-digital converter, and will also cause a deviation of the voltage value of the reference voltage signal from the ideal voltage value, that is, the analog-to-digital converter will have a temperature drift.

[0035] In a specific embodiment, the first temperature may be room temperature, and the second temperature is a temperature different from room temperature. Based on this, before the analog-to-digital converter in the target state works at the second temperature to detect the input voltage difference between the two input terminals of the analog-to-digital converter, the target gain error of the analog-to-digital converter in the target state when working at the second temperature may be determined according to the output data of the analog-to-digital converter when working at the first temperature and the output data of the analog-to-digital converter when working at the second temperature.

[0036] It should be noted that both the reference voltage signal and the analog voltage signal are voltage signals input from outside the analog-to-digital converter, and both the reference voltage signal and the analog voltage signal are analog voltage signals; the reference voltage signal can be a voltage signal input from a voltage source outside the analog-to-digital converter, and this voltage source can be a high-precision low-temperature-drift reference voltage source, which is used to provide a stable power supply voltage that hardly changes with temperature. For example, a voltage source with a temperature drift not exceeding 30 ppm / °C can be used. Based on this, the voltage of the reference voltage signal hardly changes with temperature and is approximately a voltage signal with a constant voltage value. The analog voltage signal can be any voltage signal input from any interface or component outside the analog-to-digital converter; for example, the reference voltage signal can be the first signal in the foregoing example, and the analog voltage signal can be the second signal in the foregoing example. The embodiments of the present application do not limit the reference voltage signal and the analog voltage signal.

[0037] Step 202, during the operation of the analog-to-digital converter in the target state at the second temperature, determine the input voltage difference between the two input terminals of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter.

[0038] In a specific embodiment, before the analog-to-digital converter in the target state operates at the second temperature, a relational expression between the input voltage difference between the two input terminals of the analog-to-digital converter in the target state during operation at the second temperature and the output data of the analog-to-digital converter can be determined according to the target gain error. Then, during the operation of the analog-to-digital converter in the target state at the second temperature, the current output data of the analog-to-digital converter can be substituted into the relational expression to determine the current input voltage difference between the two input terminals of the analog-to-digital converter. This input voltage difference is the difference between the current voltage value of the reference voltage signal and the current voltage value of the analog voltage signal. For example, when the first input terminal of the analog-to-digital converter is the negative input terminal and the second input terminal of the analog-to-digital converter is the positive input terminal, this input voltage difference is VOUT - VM, where VOUT is the current voltage value of the analog voltage signal and VM is the current voltage value of the reference voltage signal. When the first input terminal of the analog-to-digital converter is the positive input terminal and the second input terminal of the analog-to-digital converter is the negative input terminal, this input voltage difference is VM - VOUT.

[0039] In an embodiment of the present application, the target gain error corresponding to the analog-to-digital converter can be determined based on the output data of the analog-to-digital converter when it operates at a first temperature and the output data of the analog-to-digital converter when it operates at a second temperature. Then, during the operation of the analog-to-digital converter in the target state at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter can be determined based on the target gain error and the output data of the analog-to-digital converter. Thus, compared with directly determining the input voltage difference between the two input terminals of the current analog-to-digital converter according to the gain error of the analog-to-digital converter at any temperature, in the present application, the target gain error is determined based on the output data of the analog-to-digital converter when it operates at two different temperatures, realizing the calibration of the temperature drift of the analog-to-digital converter, so that during the operation of the analog-to-digital converter in the target state at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter determined based on the target gain error is more accurate, improving the accuracy of signal detection by the analog-to-digital converter.

[0040] Optionally, the switching of the working mode of the analog-to-digital converter can be implemented by a mode instruction. For example, the working mode of the analog-to-digital converter can be controlled to switch to the differential input mode by a first control instruction corresponding to the differential input mode, or the working mode of the analog-to-digital converter can be controlled to switch to the single-ended input mode by a second control instruction corresponding to the single-ended input mode.

[0041] Optionally, the analog-to-digital converter can be adjusted to the target state in the following way: adjust the working mode of the analog-to-digital converter to the differential input mode, switch the first input terminal of the analog-to-digital converter to the state of receiving the reference voltage signal, and switch the second input terminal of the analog-to-digital converter to the state of receiving the analog voltage signal. For example, the schematic structural diagram of the analog-to-digital converter can be as Figure 3 shown, Figure 3 in which VCN is the first input terminal of the analog-to-digital converter, VCP is the second input terminal of the analog-to-digital converter, COMP is the comparator, Vin_N is the port of the analog-to-digital converter for receiving the reference voltage signal, Vin_P is the port of the analog-to-digital converter for receiving the analog voltage signal, and Vref is the reference voltage signal. Based on this, when adjusting the analog-to-digital converter to the target state, the analog-to-digital converter can be switched to the differential input mode, and VCN can also be connected to Vin_N, and VCP can be connected to Vin_P, so that VCN receives the reference voltage signal and VCP receives the analog voltage signal, realizing that the analog-to-digital converter is in the target state.

[0042] The above step 201 has at least the following two implementation manners:

[0043] In the first possible implementation manner, the above step 201 includes the following specific processing:

[0044] Obtain a first value output when an analog-to-digital converter in a first state operates at a first temperature, where the first state is used to indicate that the analog-to-digital converter is in a single-ended input mode, and both input terminals of the analog-to-digital converter receive a reference voltage signal generated by the analog-to-digital converter;

[0045] Obtain a second value output when an analog-to-digital converter in a second state operates at a first temperature, where the second state is used to indicate that the analog-to-digital converter is in a single-ended input mode, the first input terminal of the analog-to-digital converter receives a reference voltage signal, and the second input terminal of the analog-to-digital converter receives a reference voltage signal;

[0046] Obtain a third value output when an analog-to-digital converter in the first state operates at a second temperature;

[0047] Obtain a fourth value output when an analog-to-digital converter in the second state operates at a second temperature;

[0048] Determine a target gain error according to the first value, the second value, the third value, and the fourth value.

[0049] In one example, as Figure 3 shown, when determining the target gain error corresponding to the analog-to-digital converter according to the output data of the analog-to-digital converter when operating at a first temperature and the output data of the analog-to-digital converter when operating at a second temperature, the ambient temperature of the analog-to-digital converter can be adjusted to the first temperature, then the analog-to-digital converter is adjusted to the single-ended input mode, VCN is connected to the port for outputting Vref, and VCP is connected to the port for outputting Vref, so that the analog-to-digital converter is in the first state, and the first value is obtained. Then, the analog-to-digital converter is adjusted to the single-ended input mode, VCN is connected to Vin_N, and VCP is connected to the port for outputting Vref, so that the analog-to-digital converter is in the second state, and the third value is obtained. Then, after adjusting the ambient temperature of the analog-to-digital converter to the second temperature, the analog-to-digital converter is adjusted to the first state, and the third value is obtained. Then, the analog-to-digital converter is adjusted to the second state, and the fourth value is obtained. Finally, the target gain error can be determined according to the first value, the second value, the third value, and the fourth value.

[0050] It should be noted that if the first temperature is normal temperature, when the analog-to-digital converter leaves the factory, the above first value and / or second value can be known parameters of the analog-to-digital converter, so that the first value and / or second value can also be directly obtained. Therefore, the specific acquisition methods of the first value and the second value in the embodiments of the present application are not limited.

[0051] Therefore, the target gain error can be determined based on the output data of the analog-to-digital converter (ADC) in different states. Compared with determining the target gain error based on the output data of the ADC in a single state, in this application, the target gain error can be determined based on the output data of the ADC in more states, so that the determined target gain error is more accurate.

[0052] Optionally, the first input terminal of the ADC is the negative input terminal of the ADC, and the second input terminal of the ADC is the positive input terminal of the ADC. Based on this:

[0053] The formula for determining the target gain error according to the first value, the second value, the third value, and the fourth value is as follows:

[0054] kHT = -n * kht; (Formula 1)

[0055] kht = {Dout_VM_TS_S - [Dout_Offset_CAL_S + (Dout_Offset_TS_S - Dout_Offset_TC_S)]} / VM; (Formula 2)

[0056] Where kHT is the target gain error, n is the ratio of the first voltage value to the second voltage value (n is generally a positive integer, such as n = 1 or 2, etc.). The first voltage value is the ideal voltage value of the reference voltage signal generated when the ADC in differential input mode operates at the first temperature, and the second voltage value is the ideal voltage value of the reference voltage signal generated when the ADC in single-ended input mode operates at the first temperature. kht is the gain error of the ADC in the second state when it operates at the second temperature. Dout_VM_TS_S is the fourth value, Dout_Offset_CAL_S is the second value, Dout_Offset_TS_S is the third value, Dout_Offset_TC_S is the first value, and VM is the voltage value of the reference voltage signal.

[0057] The Dout_Offset_TS_S - Dout_Offset_TC_S in Equation 2 is equivalent to the change in offset error of the analog-to-digital converter in the first state when operating at the second temperature relative to when operating at the first temperature. This change in offset error is equivalent to the change in offset error of the analog-to-digital converter in single-ended input mode with the reference voltage signal received at the first input terminal when operating at the second temperature relative to when operating at the first temperature. Dout_Offset_CAL_S is the second value output by the analog-to-digital converter in the second state when operating at the first temperature, which is equivalent to the offset error of the analog-to-digital converter in single-ended input mode with the reference voltage signal received at the first input terminal when operating at the first temperature. By calibrating Dout_Offset_CAL_S with Dout_Offset_TS_S - Dout_Offset_TC_S, the resulting Dout_Offset_CAL_S + (Dout_Offset_TS_S - Dout_Offset_TC_S) is equivalent to the offset error of the analog-to-digital converter in single-ended input mode with the reference voltage signal received at the first input terminal when operating at the second temperature. Therefore, it can be concluded that Dout_VM_TS_S = kht * VM + [Dout_Offset_CAL_S + (Dout_Offset_TS_S - Dout_Offset_TC_S)], and then Equation 2 can be obtained.

[0058] kht is the gain error of the analog-to-digital converter in the second state when operating at the second temperature, that is, kht is the gain error of the analog-to-digital converter in single-ended input mode, with the reference voltage signal received at the first input terminal and the reference voltage signal received at the second input terminal when operating at the second temperature. kHT is the gain error of the analog-to-digital converter in the target state when operating at the second temperature, that is, kHT is the gain error of the analog-to-digital converter in differential input mode, with the reference voltage signal received at the first input terminal and an arbitrary analog voltage signal received at the second input terminal when operating at the second temperature. And considering that the first input terminal of the analog-to-digital converter is the negative input terminal of the analog-to-digital converter, Equation 1 can be obtained.

[0059] Thus, through the above Equation 1 and Equation 2, a relatively fast and accurate determination of the target gain error can be achieved.

[0060] Optionally, the temperature drift calibration method further includes the following specific processing: obtaining a fifth value output by the analog-to-digital converter in the third state when operating at the second temperature, where the third state is used to indicate that the analog-to-digital converter is in differential input mode and both input terminals of the analog-to-digital converter receive reference voltage signals. Based on this, step 202 includes:

[0061] During the operation of the analog-to-digital converter in the target state at the second temperature, obtain the target value output by the analog-to-digital converter; determine the input voltage difference between the two input terminals of the analog-to-digital converter according to the difference between the target value and the fifth value, and the target gain error.

[0062] In one example, as Figure 3 shown, before the above step 202, the ambient temperature of the analog-to-digital converter can be adjusted to the second temperature, then the analog-to-digital converter can be adjusted to the differential input mode, connect VCN to the port for outputting Vref, and connect VCP to the port for outputting Vref, so that the analog-to-digital converter is in the third state, and obtain the fifth value, so that during the operation of the analog-to-digital converter in the target state at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter can be determined according to the difference between the target value output by the analog-to-digital converter and the fifth value, and the target gain error.

[0063] Optionally, based on that the first input terminal of the analog-to-digital converter is the negative input terminal of the analog-to-digital converter, and the second input terminal of the analog-to-digital converter is the positive input terminal of the analog-to-digital converter, the formula for determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the difference between the target value and the fifth value, and the target gain error is as follows:

[0064] SDV_TS = (Dout_SDV_TS_D - Dout_OFFSET_TS_D) / kHT; (Formula 3)

[0065] Wherein, SDV_TS is the input voltage difference between the two input terminals of the analog-to-digital converter, Dout_SDV_TS_D is the target value, Dout_OFFSET_TS_D is the fifth value, and kHT is the target gain error.

[0066] Thus, through the above Formula 3, during the operation of the analog-to-digital converter in the target state at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter can be determined more quickly and accurately.

[0067] Adopting the above first possible implementation manner can calibrate the measurement error caused by the temperature drift of the analog-to-digital converter, and moreover, since the offset error and the gain error can be calibrated in the first possible implementation manner, the measurement error caused by the temperature drift of the analog-to-digital converter can be corrected more accurately.

[0068] In the second possible implementation manner, the above step 201 includes the following specific processing:

[0069] Obtain a sixth value output when an analog-to-digital converter in a fourth state operates at a first temperature, where the fourth state is used to indicate that the analog-to-digital converter is in a differential input mode, a reference voltage signal is received at a first input terminal of the analog-to-digital converter, and a reference voltage signal generated by the analog-to-digital converter is received at a second input terminal of the analog-to-digital converter;

[0070] Obtain a seventh value output when the analog-to-digital converter in the fourth state operates at a second temperature;

[0071] Determine a target gain error according to the sixth value and the seventh value.

[0072] In one example, as Figure 3 shown, when determining the target gain error corresponding to the analog-to-digital converter according to the output data of the analog-to-digital converter when it operates at a first temperature and the output data of the analog-to-digital converter when it operates at a second temperature, the ambient temperature of the analog-to-digital converter can be adjusted to the first temperature, then the analog-to-digital converter is adjusted to the differential input mode, VCN is connected to Vin_N, and VCP is connected to the port for outputting Vref, so that the analog-to-digital converter is in the fourth state, and the sixth value is obtained. Then, after adjusting the ambient temperature of the analog-to-digital converter to the second temperature, the seventh value is obtained. Finally, the target gain error can be determined according to the sixth value and the seventh value.

[0073] Therefore, compared with determining the target gain error in the first implementation manner of step 201 above, fewer values need to be measured to determine the target gain error in the second implementation manner of step 201 above, making the temperature drift calibration of the analog-to-digital converter more convenient and efficient.

[0074] Optionally, based on that the first input terminal of the analog-to-digital converter is the negative input terminal of the analog-to-digital converter and the second input terminal of the analog-to-digital converter is the positive input terminal of the analog-to-digital converter, the formula for determining the target gain error according to the sixth value and the seventh value is as follows:

[0075] kHT = {kRT * [CM_HT - bHT - (FS - bHT) / 2]} / [CM_RT - bRT - (FS - bRT) / 2]; (Formula 4)

[0076] bHT = Dout_OFFSET_TS_D - FS / 2; (Formula 5)

[0077] Wherein, kHT is the target gain error, kRT is the gain error of the analog-to-digital converter in the fourth state when operating at the first temperature, CM_HT is the seventh value, bHT is the offset error of the analog-to-digital converter in the fourth state when operating at the second temperature, FS is the maximum output value of the analog-to-digital converter, CM_RT is the sixth value, and bRT is the offset error of the analog-to-digital converter in the fourth state when operating at the first temperature; Dout_OFFSET_TS_D is the value output by the analog-to-digital converter in the third state when operating at the second temperature, wherein the third state is used to indicate that the analog-to-digital converter is in the differential input mode, and reference voltage signals are received at both input terminals of the analog-to-digital converter.

[0078] Formula 4 can be obtained through the following formula (by subtracting Formula 4-1 and Formula 4-3 and simplifying after substituting Formula 4-2 and Formula 4-4):

[0079] (CM_RT - bRT) / kRT = VREF_RT - VM; (Formula 4-1)

[0080] 2*VREF_RT = (FS - bRT) / kRT; (Formula 4-2)

[0081] (CM_HT - bHT) / kHT = VREF_HT - VM; (Formula 4-3)

[0082] 2*VREF_HT = (FS - bHT) / kHT; (Formula 4-4)

[0083] Wherein, VREF_RT is the voltage value of the reference voltage signal of the analog-to-digital converter in the differential input mode when operating at the first temperature, VREF_HT is the voltage value of the reference voltage signal of the analog-to-digital converter in the differential input mode when operating at the second temperature. Considering that the range of the input voltage difference between the two input terminals of the analog-to-digital converter in the differential input mode is -VREF_RT to VREF_RT, and the minimum value output by the analog-to-digital converter is 0, the above Formula 4-2 is obtained based on the formula VREF_RT = (FS - bRT) / kRT and the fact that the analog-to-digital converter outputs 0 when the above input voltage difference is -VREF_RT. The above Formula 4-4 is obtained based on the formula VREF_HT = (FS - bHT / kHT and the fact that the analog-to-digital converter outputs 0 when the above input voltage difference is -VREF_RT.

[0084] Optionally, the above step 202 includes the following specific processing:

[0085] During the process of the analog-to-digital converter in the target state working at the second temperature, a target value of the analog-to-digital converter output is obtained; based on the target value, the offset error and the target gain error of the analog-to-digital converter in the fourth state when working at the second temperature, the input voltage difference between the two input terminals of the analog-to-digital converter is determined.

[0086] The offset error of the analog-to-digital converter in the fourth state when operating at the second temperature is the above-mentioned bHT, that is, the offset error can be obtained according to the above-mentioned formula 5.

[0087] Optionally, based on the first input terminal of the analog-to-digital converter being the negative input terminal of the analog-to-digital converter, and the second input terminal of the analog-to-digital converter being the positive input terminal of the analog-to-digital converter, the formula for determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the target value, the offset error of the analog-to-digital converter in the fourth state when operating at the second temperature, and the target gain error is as follows:

[0088] SDV_TS=(Dout_SDV_TS_D-bHT) / kHT; (Formula 6)

[0089] Wherein, SDV_TS is the input voltage difference between the two input terminals of the analog-to-digital converter, Dout_SDV_TS_D is the target value, bHT is the offset error of the analog-to-digital converter in the fourth state when operating at the second temperature, and kHT is the target gain error.

[0090] Therefore, through the above formula 6, the input voltage difference between the two input terminals of the analog-to-digital converter can be determined relatively quickly and accurately during the process in which the analog-to-digital converter in the target state operates at the second temperature.

[0091] Figure 4 This is a schematic diagram of the result of obtaining the input voltage difference of the analog-to-digital converter without using the temperature drift calibration method. Figure 5 This is a schematic diagram of the result of not performing temperature drift calibration and obtaining the input voltage difference of the analog-to-digital converter using the first implementation method mentioned above. Figure 6 This is a schematic diagram of the result of using the second implementation method to perform temperature drift calibration and obtain the input voltage difference of the analog-to-digital converter. Figure 4 , Figure 5 and Figure 6 The horizontal axis in the figure is used to represent the input voltage difference of the analog-to-digital converter detected in the target state, and the vertical axis is used to represent the difference between the input voltage difference of the analog-to-digital converter detected in the target state and the actual input voltage difference of the analog-to-digital converter in the target state. Figure 4 Delta meas N40C, Figure 5 deltacomp1 N40C and Figure 6The delta comp2 N40C in it is used to indicate that the ambient temperature of the analog-to-digital converter is 40 degrees Celsius. Figure 4 The delta meas N20C in Figure 5 the delta comp1 N20C in Figure 6 and the delta comp2 N20C in it are all used to indicate that the ambient temperature of the analog-to-digital converter is 20 degrees Celsius. Figure 4 The delta meas N0C in Figure 5 the delta comp1N0C in Figure 6 and the delta comp2 N0C in it are all used to indicate that the ambient temperature of the analog-to-digital converter is 0 degrees Celsius. Figure 4 The delta meas N50C in Figure 5 the delta comp1 N50C in Figure 6 and the delta comp2 N50C in it are all used to indicate that the ambient temperature of the analog-to-digital converter is 50 degrees Celsius. Figure 4 The delta meas N85C in Figure 5 the delta comp1 N85C in Figure 6 and the delta comp2N85C in it are all used to indicate that the ambient temperature of the analog-to-digital converter is 85 degrees Celsius. Figure 4 The deltameas N105C in Figure 5 the delta comp1 105C in Figure 6 and the delta comp2 N105C in it are all used to indicate that the ambient temperature of the analog-to-digital converter is 105 degrees Celsius. Combined with Figure 4 、 Figure 5 and Figure 6 it can be known that:

[0092] Both of the above two implementation methods can calibrate the measurement error caused by the temperature drift of the analog-to-digital converter. The first implementation method considers the influence of temperature drift on the offset error and gain error of the analog-to-digital converter, and can correct the measurement error caused by the temperature drift of the analog-to-digital converter more accurately. However, it needs to be configured to input reference voltage signals to both input terminals in the single-ended input mode of the analog-to-digital converter, which puts forward requirements for the channel design of the analog-to-digital converter. The second implementation method considers the influence of temperature drift on the gain error of the analog-to-digital converter, and can also greatly correct the measurement error caused by temperature drift. It is completely calibrated in the differential input mode of the analog-to-digital converter, which is more rapid and convenient. However, it also requires that one end of the differential input of the analog-to-digital converter can be configured to come from the internal reference voltage signal in the differential input mode. Both of the above two implementation methods put forward certain design requirements for the channels of the analog-to-digital converter, and a suitable method can be selected according to the actual application.

[0093] Temperature drift calibration device

[0094] Corresponding to the foregoing method embodiments, Figure 7 FIG. shows a schematic diagram of a temperature drift calibration device according to an embodiment of the present application, as Figure 7 shown, the temperature drift calibration device 700 includes:

[0095] A calibration unit 701, configured to determine a target gain error corresponding to an analog-to-digital converter according to output data of the analog-to-digital converter when operating at a first temperature and output data of the analog-to-digital converter when operating at a second temperature, where the first temperature is different from the second temperature, and the target gain error is a gain error of the analog-to-digital converter when operating at the second temperature in a target state, and the target state is used to indicate that the analog-to-digital converter is in a differential input mode, a constant reference voltage signal is received at a first input terminal of the analog-to-digital converter, and an arbitrary analog voltage signal is received at a second input terminal of the analog-to-digital converter;

[0096] A determination unit 702, configured to determine an input voltage difference between two input terminals of the analog-to-digital converter according to the target gain error and output data of the analog-to-digital converter during the process of the analog-to-digital converter in the target state operating at the second temperature.

[0097] It should be noted that the temperature drift calibration device in this embodiment is used to implement the corresponding temperature drift calibration method in the foregoing method embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated herein.

[0098] Electronic device

[0099] Figure 8 is a schematic block diagram of an electronic device provided by an embodiment of the present application. The specific implementation of the electronic device is not limited in the specific embodiments of the present application. As Figure 8 shown, the electronic device may include: a processor 802, a communication interface 804, a memory 806, and a communication bus 808. Among them:

[0100] The processor 802, the communication interface 804, and the memory 806 communicate with each other through the communication bus 808.

[0101] The communication interface 804 is configured to communicate with other electronic devices or servers.

[0102] The processor 802 is configured to execute a program 810, and specifically may execute relevant steps in any of the foregoing temperature drift calibration method embodiments.

[0103] Specifically, the program 810 may include program code, which includes computer operation instructions.

[0104] The processor 802 may be a CPU, or a specific integrated circuit ASIC (Application Specific Integrated Circuit), or one or more integrated circuits configured to implement the embodiments of the present application. One or more processors included in the intelligent device may be of the same type of processor, such as one or more CPUs; or may be of different types of processors, such as one or more CPUs and one or more ASICs.

[0105] RISC-V is an open-source instruction set architecture based on the principle of reduced instruction set (RISC). It can be applied to various aspects such as microcontrollers and FPGA chips, and can be specifically applied in fields such as Internet of Things security, industrial control, mobile phones, and personal computers. Moreover, due to the consideration of small size, fast speed, and low power consumption in its design, it is particularly suitable for modern computing devices such as warehouse-scale cloud computers, high-end mobile phones, and tiny embedded systems. With the rise of artificial intelligence Internet of Things (AIoT), the RISC-V instruction set architecture has received increasing attention and support, and is expected to become the next-generation CPU architecture widely used.

[0106] The computer operation instructions in the embodiments of the present application may be computer operation instructions based on the RISC-V instruction set architecture. Correspondingly, the processor 802 may be designed based on the RISC-V instruction set. Specifically, the chip of the processor in the electronic device provided in the embodiments of the present application may be a chip designed using the RISC-V instruction set. This chip can execute executable code based on the configured instructions, thereby implementing the temperature drift calibration method in the above embodiments.

[0107] The memory 806 is used to store the program 810. The memory 806 may include high-speed RAM memory, and may also include non-volatile memory, such as at least one disk memory.

[0108] The program 810 is specifically configured to cause the processor 802 to execute the temperature drift calibration method in any of the foregoing embodiments.

[0109] For the specific implementation of each step in the program 810, reference may be made to the corresponding steps and units in any of the foregoing temperature drift calibration method embodiments, which will not be elaborated herein. Those skilled in the art can clearly understand that for the convenience and conciseness of description, the specific working processes of the devices and modules described above can refer to the corresponding process descriptions in the foregoing method embodiments, which will not be repeated herein.

[0110] Computer storage medium

[0111] The present application also provides a computer-readable storage medium storing instructions for causing a machine to execute the temperature drift calibration method as described herein. Specifically, a system or device equipped with the storage medium can be provided, on which software program codes for implementing the functions of any one of the above-described embodiments are stored, and the computer (or CPU or MPU) of the system or device is caused to read and execute the program codes stored in the storage medium.

[0112] In this case, the program code read from the storage medium itself can implement the functions of any one of the above-described embodiments. Therefore, the program code and the storage medium storing the program code constitute a part of the present application.

[0113] Examples of the storage medium for providing the program code include floppy disks, hard disks, magneto-optical disks, optical disks (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), magnetic tapes, non-volatile memory cards, and ROMs. Optionally, the program code can be downloaded from a server computer via a communication network.

[0114] Computer program product

[0115] The embodiments of the present application also provide a computer program product including computer instructions, which direct a computing device to perform any corresponding operation in the above-described multiple method embodiments.

[0117] It should be noted that, according to the needs of implementation, the various components / steps described in the embodiments of the present application can be split into more components / steps, or two or more components / steps or partial operations of the components / steps can be combined into new components / steps to achieve the objectives of the embodiments of the present application.

[0118] The method according to the embodiments of the present application can be implemented in hardware, firmware, or as software or computer code that can be stored in a recording medium (such as a CD ROM, RAM, floppy disk, hard disk, or magneto-optical disk), or as computer code originally stored in a remote recording medium or a non-transitory machine-readable medium and downloaded through a network and to be stored in a local recording medium, so that the method described herein can be stored in such software processing on a recording medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware (such as an ASIC or FPGA). It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component (such as RAM, ROM, flash memory, etc.) that can store or receive software or computer code, and when the software or computer code is accessed and executed by the computer, the processor, or the hardware, the method described herein is implemented. In addition, when a general-purpose computer accesses the code for implementing the method shown herein, the execution of the code converts the general-purpose computer into a dedicated computer for executing the method shown herein.

[0119] It should be noted that the information related to users (including but not limited to user device information, user personal information, etc.) and data (including but not limited to sample data for training a model, data for analysis, stored data, displayed data, etc.) involved in the embodiments of the present application are all information and data that have been authorized by the users or fully authorized by all parties, and the collection, use, and processing of the relevant data need to comply with the relevant laws, regulations, and standards of the relevant countries and regions, and corresponding operation entrances are provided for users to select authorization or rejection.

[0120] Those of ordinary skill in the art can realize that the units and method steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or by a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for a specific application, but such implementation should not be considered to exceed the scope of the embodiments of the present application.

[0121] The above embodiments are only used to illustrate the embodiments of the present application, rather than to limit the embodiments of the present application. Those of ordinary skill in the relevant technical fields can make various changes and modifications without departing from the spirit and scope of the embodiments of the present application. Therefore, all equivalent technical solutions also belong to the scope of the embodiments of the present application, and the patent protection scope of the embodiments of the present application shall be defined by the claims.

Claims

1. A temperature drift calibration method, characterized in that, Including: Determine a target gain error corresponding to the analog-to-digital converter according to output data of the analog-to-digital converter when operating at a first temperature and output data of the analog-to-digital converter when operating at a second temperature, where the first temperature is different from the second temperature, and the target gain error is a gain error of the analog-to-digital converter in the target state when operating at the second temperature, and the target state is used to indicate that the analog-to-digital converter is in a differential input mode, a first input terminal of the analog-to-digital converter receives a constant reference voltage signal, and a second input terminal of the analog-to-digital converter receives an arbitrary analog voltage signal; During the process of the analog-to-digital converter in the target state operating at the second temperature, determine an input voltage difference between two input terminals of the analog-to-digital converter according to the target gain error and output data of the analog-to-digital converter.

2. The method according to claim 1, characterized in that, The determining the target gain error corresponding to the analog-to-digital converter according to output data of the analog-to-digital converter when operating at a first temperature and output data of the analog-to-digital converter when operating at a second temperature includes: Obtain a first value output by the analog-to-digital converter in a first state when operating at a first temperature, where the first state is used to indicate that the analog-to-digital converter is in a single-ended input mode, and both input terminals of the analog-to-digital converter receive a reference voltage signal generated by the analog-to-digital converter; Obtain a second value output by the analog-to-digital converter in a second state when operating at a first temperature, where the second state is used to indicate that the analog-to-digital converter is in the single-ended input mode, a first input terminal of the analog-to-digital converter receives the reference voltage signal, and a second input terminal of the analog-to-digital converter receives the reference voltage signal; Obtain a third value output by the analog-to-digital converter in the first state when operating at the second temperature; Obtain a fourth value output by the analog-to-digital converter in the second state when operating at the second temperature; Determine the target gain error according to the first value, the second value, the third value, and the fourth value.

3. The method according to claim 2, wherein A first input terminal of the analog-to-digital converter is a negative input terminal of the analog-to-digital converter, and a second input terminal of the analog-to-digital converter is a positive input terminal of the analog-to-digital converter; The formula for determining the target gain error according to the first value, the second value, the third value, and the fourth value is as follows: kHT = -n * kht; kht = {Dout_VM_TS_S - [Dout_Offset_CAL_S + (Dout_Offset_TS_S - Dout_Offset_TC_S)]} / VM; Wherein, kHT is the target gain error, n is the ratio of the first voltage value to the second voltage value. The first voltage value is the ideal voltage value of the reference voltage signal generated when the analog-to-digital converter in the differential input mode operates at the first temperature. The second voltage value is the ideal voltage value of the reference voltage signal generated when the analog-to-digital converter in the single-ended input mode operates at the first temperature. kht is the gain error of the analog-to-digital converter in the second state when it operates at the second temperature. Dout_VM_TS_S is the fourth value, Dout_Offset_CAL_S is the second value, Dout_Offset_TS_S is the third value, Dout_Offset_TC_S is the first value, and VM is the voltage value of the reference voltage signal.

4. The method according to claim 2 or 3, characterized in that The method further includes: obtaining a fifth value output by the analog-to-digital converter in the third state when it operates at the second temperature, wherein the third state is used to indicate that the analog-to-digital converter is in the differential input mode, and both input terminals of the analog-to-digital converter receive the reference voltage signal; During the process that the analog-to-digital converter in the target state operates at the second temperature, determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter, includes: During the process that the analog-to-digital converter in the target state operates at the second temperature, obtaining the target value output by the analog-to-digital converter; Determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the difference between the target value and the fifth value, and the target gain error.

5. The method according to claim 4, characterized in that, The first input terminal of the analog-to-digital converter is the negative input terminal of the analog-to-digital converter, and the second input terminal of the analog-to-digital converter is the positive input terminal of the analog-to-digital converter; The formula for determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the difference between the target value and the fifth value, and the target gain error is as follows: SDV_TS = (Dout_SDV_TS_D - Dout_OFFSET_TS_D) / kHT; Wherein, SDV_TS is the input voltage difference between the two input terminals of the analog-to-digital converter, Dout_SDV_TS_D is the target value, Dout_OFFSET_TS_D is the fifth value, and kHT is the target gain error.

6. The method according to claim 1, wherein Determining the target gain error corresponding to the analog-to-digital converter according to the output data of the analog-to-digital converter when it operates at the first temperature and the output data of the analog-to-digital converter when it operates at the second temperature, includes: Obtain the sixth value output when the analog-to-digital converter in the fourth state operates at the first temperature, where the fourth state is used to indicate that the analog-to-digital converter is in a differential input mode, the first input terminal of the analog-to-digital converter receives the reference voltage signal, and the second input terminal of the analog-to-digital converter receives the reference voltage signal generated by the analog-to-digital converter; Obtain the seventh value output when the analog-to-digital converter in the fourth state operates at the second temperature; Determine the target gain error according to the sixth value and the seventh value.

7. The method according to claim 6, wherein The first input terminal of the analog-to-digital converter is the negative input terminal of the analog-to-digital converter, and the second input terminal of the analog-to-digital converter is the positive input terminal of the analog-to-digital converter; The formula for determining the target gain error according to the sixth value and the seventh value is as follows: kHT = {kRT * [CM_HT - bHT - (FS - bHT) / 2]} / [CM_RT - bRT - (FS - bRT) / 2]; bHT = Dout_OFFSET_TS_D - FS / 2; Where, kHT is the target gain error, kRT is the gain error when the analog-to-digital converter in the fourth state operates at the first temperature, CM_HT is the seventh value, bHT is the offset error when the analog-to-digital converter in the fourth state operates at the second temperature, FS is the maximum output value of the analog-to-digital converter, CM_RT is the sixth value, bRT is the offset error when the analog-to-digital converter in the fourth state operates at the first temperature; Dout_OFFSET_TS_D is the value output when the analog-to-digital converter in the third state operates at the second temperature, where the third state is used to indicate that the analog-to-digital converter is in the differential input mode, and both input terminals of the analog-to-digital converter receive the reference voltage signal.

8. The method according to claim 6 or 7, characterized in that, During the process of the analog-to-digital converter in the target state operating at the second temperature, determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter includes: During the process of the analog-to-digital converter in the target state operating at the second temperature, obtain the target value output by the analog-to-digital converter; Determine the input voltage difference between the two input terminals of the analog-to-digital converter according to the target value, the offset error when the analog-to-digital converter in the fourth state operates at the second temperature, and the target gain error.

9. The method according to claim 8, characterized in that, The first input terminal of the analog-to-digital converter is the negative input terminal of the analog-to-digital converter, and the second input terminal of the analog-to-digital converter is the positive input terminal of the analog-to-digital converter; The formula for determining the input voltage difference between the two input terminals of the analog-to-digital converter according to the target value, the offset error when the analog-to-digital converter in the fourth state operates at the second temperature, and the target gain error is as follows: SDV_TS = (Dout_SDV_TS_D - bHT) / kHT; Wherein, SDV_TS is the input voltage difference between the two input terminals of the analog-to-digital converter, Dout_SDV_TS_D is the target value, bHT is the offset error when the analog-to-digital converter in the fourth state operates at the second temperature, and kHT is the target gain error.

10. A temperature drift calibration device, characterized in that, Comprising: A calibration unit, configured to determine the target gain error corresponding to the analog-to-digital converter according to the output data when the analog-to-digital converter operates at a first temperature and the output data when the analog-to-digital converter operates at a second temperature, wherein the first temperature is different from the second temperature, and the target gain error is the gain error when the analog-to-digital converter in the target state operates at the second temperature, and the target state is used to indicate that the analog-to-digital converter is in a differential input mode, a constant reference voltage signal is received at the first input terminal of the analog-to-digital converter, and an arbitrary analog voltage signal is received at the second input terminal of the analog-to-digital converter; A determination unit, configured to determine the input voltage difference between the two input terminals of the analog-to-digital converter according to the target gain error and the output data of the analog-to-digital converter during the operation of the analog-to-digital converter in the target state at the second temperature.

11. An electronic device, characterized in that, Comprising: A processor, a memory, a communication interface, and a communication bus, and the processor, the memory, and the communication interface complete communication with each other through the communication bus; The memory is used to store at least one executable instruction, and the executable instruction causes the processor to execute the operations corresponding to the method according to any one of claims 1-9.

12. A computer storage medium, characterized in that, A computer program is stored thereon, and when the program is executed by the processor, the method according to any one of claims 1-9 is implemented.

13. A computer program product, characterized in that, Comprising computer instructions, and the computer instructions instruct a computing device to execute the method according to any one of claims 1-9.

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