Waveform measuring device and program
By introducing a control unit that automatically performs serial bus setting in the waveform measurer, and using the previously acquired waveform data for setting processing, the problem of limited reference range of waveform data in the prior art is solved, and a more flexible and efficient serial bus setting is achieved.
Patent Information
- Application Number
- CN202380085172.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2022-12-26
- Filing Date
- 2023-10-18
- Publication Date
- 2025-07-18
AI Technical Summary
When the existing waveform measuring device automatically performs serial bus settings, the reference range of waveform data is limited, and it is impossible to effectively use the previously acquired waveform data for setting processing.
A waveform measuring device is designed, and includes a control unit that automatically performs serial bus setting processing. It can automatically perform serial bus setting processing based on any of the previously acquired waveform data, currently displayed waveform data, stored waveform data, or calculated waveform data, including calculating parameters such as voltage threshold, bit rate, and recessive potential.
The waveform data range that can be referenced when automatically performing serial bus settings is expanded, the flexibility and efficiency of setting processing is improved, and the serial bus setting can be automatically completed under various signal conditions.
Smart Images
Figure CN120344862A_ABST
Abstract
Citation Information
Patent Citations
Waveform-measuring instrument
JP2009085710A