Test fixture and test equipment

Abstract

The invention provides a test fixture and test equipment, belongs to the technical field of display, and can solve the problem that an existing test fixture is high in cost. The test fixture disclosed by the invention is used for carrying out a lighting test on the liquid crystal display panel, and the liquid crystal display panel comprises a substrate and a plurality of test bonding pads located on the substrate; the test fixture comprises a plurality of test probes arranged in one-to-one correspondence with the test pads; the plurality of test probes are arranged in multiple rows, and the adjacent test probes in different rows are arranged in a staggered manner.

Description

Technical Field

[0001] The present disclosure belongs to the technical field of display, and particularly relates to a test fixture and a test device. Background Art

[0002] With the continuous development of display technology, liquid crystal display panels (LCDs) have been widely used in various consumer electronic products such as mobile phones, TVs, personal digital assistants, digital cameras, laptops, and desktop computers due to their advantages of low power consumption, eye protection, thin and light design, and high cost performance, and have become the mainstream in display products.

[0003] A liquid crystal display panel generally consists of an array substrate, a color filter (CF) substrate, a liquid crystal layer sandwiched between the array substrate and the color filter (CF) substrate, and a sealant frame. Its forming process generally includes multiple process steps such as the front-end array process (thin film, yellow light, etching, and stripping), the middle-end cell process (bonding the array substrate and the CF substrate), and the back-end module assembly process (pressing the driving chip and the printed circuit board).

[0004] During the production process of display panels, multiple test links are usually set up to ensure the quality of liquid crystal display panels and improve production efficiency. The lighting test is one of the common test links, which is particularly important for the quality control of liquid crystal display panels. In the lighting test stage, it can be detected whether there are defective pixels (such as bright pixels or dark pixels, etc.) in the liquid crystal display panel, so that users can intercept defective display panels in time, avoid wasting resources, and enable users to improve the process as early as possible. Summary of the Invention

[0005] The present disclosure aims to solve at least one of the technical problems existing in the prior art, and provides a test fixture and a test device.

[0006] In a first aspect, an embodiment of the present disclosure provides a test fixture for performing a lighting test on a liquid crystal display panel. The liquid crystal display panel includes: a substrate substrate, and a plurality of test pads located on the substrate substrate. The test fixture includes: a plurality of test probes arranged in one-to-one correspondence with the test pads.

[0007] The plurality of test probes are arranged in multiple rows, and adjacent test probes in different rows are staggered.

[0008] In some embodiments, the test probe includes: a needle body, and needle shafts connected to both ends of the needle body; the diameter of the needle body is greater than the diameter of the needle shaft.

[0009] Among the test probes described in the same row, the gap between the shanks of adjacent test probes is greater than or equal to the diameter of the shank.

[0010] In some embodiments, among the test probes in different rows, the gap between the shanks of adjacent test probes is greater than or equal to the radius of the shank.

[0011] In some embodiments, the orthographic projection of the shank on the substrate is partially overlapped with the orthographic projection of the test pad on the substrate, and the orthographic projection of the gap between the shank and the adjacent test pad on the substrate is partially overlapped.

[0012] In some embodiments, the orthographic projection of the needle shaft on the substrate falls within the orthographic projection of the test pad on the substrate.

[0013] In some embodiments, the shank, the needle shaft and the test pad are all plated with a coating, and the coating materials of the three are the same.

[0014] In some embodiments, the needle shaft is conical or blade-shaped.

[0015] In some embodiments, the test fixture further includes: a power supply main board, a connector located on the power supply main board, a transfer flexible circuit board and a press head;

[0016] One end of the transfer flexible circuit board is electrically connected to the power supply main board through the connector;

[0017] The other end of the transfer flexible circuit board is electrically connected to the needle shaft at one end of the test probe;

[0018] The needle shaft at the other end of the test probe is installed in the press head.

[0019] In some embodiments, the test fixture further includes: a support structure; the support structure is configured to support the liquid crystal display panel to be tested, and the size of the support structure is the same as the size of the liquid crystal display panel to be tested.

[0020] In a second aspect, an embodiment of the present disclosure provides a test device, and the test device includes the test fixture provided in the first aspect. Description of the Drawings

[0021] Figure 1 It is a schematic structural diagram of an exemplary liquid crystal display panel.

[0022] Figure 2 It is a schematic layout diagram of an exemplary test pad.

[0023] Figure 3 It is a schematic layout diagram of another exemplary test pad.

[0024] Figure 4 It is a schematic structural diagram of a test fixture provided by an embodiment of the present disclosure.

[0025] Figure 5 For Figure 4 It is an enlarged schematic diagram of the arrangement of test probes in the test fixture shown.

[0026] Figure 6 For Figure 4 It is an enlarged schematic diagram of the structure of test probes in the test fixture shown. Detailed implementation manners

[0027] To make the objectives, technical solutions, and advantages of the embodiments of the present disclosure clearer, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present disclosure. Apparently, the described embodiments are only a part rather than all of the embodiments of the present disclosure. Components of the embodiments of the present disclosure generally described and illustrated in the accompanying drawings here may be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present disclosure provided in the accompanying drawings is not intended to limit the scope of the present disclosure required to be protected, but merely represents selected embodiments of the present disclosure. All other embodiments obtained by those skilled in the art based on the embodiments of the present disclosure without creative efforts fall within the scope of protection of the present disclosure. Without conflict, the various embodiments of the present disclosure and the various features in the embodiments may be combined with each other.

[0028] Unless otherwise defined, the technical terms or scientific terms used in the present disclosure should have the ordinary meanings understood by those of ordinary skill in the field to which the present disclosure belongs. The "first", "second", and similar terms used in the present disclosure do not denote any order, quantity, or importance, but are only used to distinguish different components. Similarly, terms such as "a", "an", or "the" do not denote a quantity limitation, but mean that there is at least one. Terms such as "include" or "comprise" mean that the elements or items appearing before the term cover the elements or items listed after the term and their equivalents, without excluding other elements or items.

[0029] As used in the present disclosure, "a plurality or several" means two or more. "And / or" describes the associated relationship of associated objects and indicates that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects before and after.

[0030] Figure 1 It is a schematic structural diagram of an exemplary liquid crystal display panel. As Figure 1 shown, the liquid crystal display panel includes: an array substrate 101 and a color filter substrate 102 which are arranged in a cell structure, a liquid crystal layer 103 sandwiched between the array substrate 101 and the color filter substrate 102, and a sealant frame 104. Among them, multiple gate lines and data lines are provided in the array substrate 101, and the intersection of the gate lines and the data lines defines multiple pixel units, and a pixel driving circuit is provided in each pixel unit; the gate of the thin film transistor in the pixel driving circuit can be connected to the gate line, the source can be connected to the data line, and the drain can be connected to the pixel electrode.

[0031] A gate driving circuit, a source driving chip, and a common electrode are also provided in the array substrate 101; the gate driving circuit is connected to each gate line to provide a gate scanning signal to each gate line. The source driving chip is connected to each data line to provide a data signal to each data line. When the gate driving circuit transmits a scanning signal to the gate line, the thin film transistor in the pixel driving circuit is turned on, and the data signal provided by the source driving chip is transmitted to the pixel electrode through the data line. At this time, an electric field is formed between the pixel electrode and the common electrode, which can drive the liquid crystal molecules in the liquid crystal layer 103 to deflect, so that the light provided by the backlight module can pass through the liquid crystal layer 103 and the color filter substrate 102 to achieve the display function.

[0032] In the middle-stage cell process (the bonding of the array substrate and the CF substrate), it is necessary to perform a lighting test on the liquid crystal display panel (liquid crystal cell). Since the source driving chip is not bound to the data line during the lighting test stage, it is necessary to use a test fixture to provide a data signal to each data line to perform a lighting test on the liquid crystal display panel.

[0033] To facilitate the lighting test, test pads are also provided in the array substrate 101, and the test pads are connected to the data lines. These test pads can input corresponding signals through a test fixture to light up the display panel. The process of the lighting test of the display panel is usually as follows: first, place the display panel on the support structure of the test fixture, then press the head with a test probe or a flexible printed circuit board onto the display panel so that the test probe or the flexible printed circuit board contacts the test pad, transmit the test signal to the inside of the display panel to light up the display panel, then the operator observes the display screen of the display panel to determine whether there are any defects in the display panel, marks the defective positions, and then records the coordinate information of the defective positions.

[0034] Currently, generally, a test fixture with test probes or a test fixture with a flexible printed circuit board is selected according to the gap between adjacent test pads. For example, when the gap between adjacent test pads is greater than 0.4 millimeters (mm), a test fixture with test probes (cost: 3,000 yuan) is selected; when the gap between adjacent test pads is less than 0.1 mm, a test fixture with a flexible printed circuit board (cost: 6,000 - 12,000 yuan) is selected. The design differences between the two types of test fixtures are significant, resulting in significant differences in cost. Moreover, to meet the ultimate experience of users, liquid crystal display panels are also developing in the direction of continuously pursuing extremely narrow borders, and the gap between adjacent test pads in future liquid crystal display panels will become smaller and smaller.

[0035] Figure 2 It is a schematic layout diagram of an exemplary test pad, as Figure 2 shown, the gap between adjacent test pads 201 is greater than 0.4 mm. Similarly, the gap between adjacent test probes 301 is also relatively large, generally greater than 0.4 mm. When performing the lighting test, adjacent test probes 301 do not affect each other and can be freely pressed down onto the test pads 201 to transmit test signals to the test pads 201.

[0036] Figure 3 It is another schematic layout diagram of an exemplary test pad, as Figure 3 shown, the gap between adjacent test pads 201 is less than 0.1 mm. Similarly, the gap between adjacent test probes 301 is also relatively small, generally less than 0.1 mm. When performing the lighting test, adjacent test probes 301 are prone to short - circuit problems due to the close distance, affecting the lighting test effect. At the same time, adjacent test probes 301 restrict each other and cannot be pressed down onto the test pads 201, further affecting the lighting test effect. Therefore, when performing a lighting test on a display panel with a small gap between adjacent test pads 201, a test fixture with a flexible printed circuit board is generally selected, and a test fixture with test probes 301 cannot be selected.

[0037] To solve one of the above - mentioned technical problems, the embodiments of the present disclosure provide a test fixture and a test device. Below, in combination with the accompanying drawings and specific embodiments, the test fixture and the test device provided by the embodiments of the present disclosure will be further described in detail.

[0038] In the first aspect, the embodiments of the present disclosure provide a test fixture. Figure 4 It is a schematic structural diagram of a test fixture provided by an embodiment of the present disclosure, as Figure 4 shown, the test fixture includes: a plurality of test probes 301. Figure 5 For Figure 4Schematic enlarged view of the arrangement of the test probes in the shown test fixture. The test probes 301 can be arranged in one-to-one correspondence with the test pads 201 on the substrate 200. Multiple test probes 301 are arranged in multiple rows, and the adjacent test probes 301 in different rows are staggered.

[0039] Here, it should be noted that multiple test probes 301 can be arranged in multiple rows. For example, two rows, three rows, four rows, etc. The number of rows of the test probes 301 can be set according to actual needs. The more rows of the test probes 301 in the test fixture, the larger the border of the liquid crystal display panel it occupies. To meet the need for an extremely narrow border of the liquid crystal display panel, the test probes 301 in the test fixture can be set to two rows. Hereinafter, an example in which there are two rows of test probes 301 in the test fixture will be used for illustration.

[0040] In the test fixture provided by the implementation of the present disclosure, multiple rows of test probes 301 are arranged in multiple rows, and the adjacent test probes in different rows are staggered. Compared with the existing test fixture, the gap (much larger than 0.1 mm) between adjacent test probes 301 in the same row can be significantly increased, and the gap (much larger than 0.1 mm) between adjacent test probes 301 in different rows can also be significantly increased. In this way, even if the gap (less than 0.1 mm) between adjacent test pads 201 in the liquid crystal display panel is small, a test fixture with test probes 301 can be used to perform a lighting test on the liquid crystal display panel. Therefore, the cost of the lighting test on the liquid crystal display panel can be saved. At the same time, since the gap between adjacent test probes 301 is significantly increased, during the lighting test of the liquid crystal display panel, the adjacent test probes 301 in the test fixture do not affect each other. Therefore, the short-circuit problem between adjacent test probes 301 can be avoided, thereby improving the accuracy of the lighting test and further enhancing the efficiency of the lighting test.

[0041] In some embodiments, Figure 6 For Figure 4 Schematic enlarged view of the structure of the test probes in the shown test fixture. As Figure 6 shown, the test probe 301 includes: a probe body 3011 and a probe shaft 3012 connected to both ends of the probe body 3011; the diameter of the probe body 3011 is greater than the diameter of the probe shaft 3012.

[0042] As Figure 6As shown, in practical applications, the test probe 301 is usually a double-headed probe. Here, A is the diameter of the probe body 3011, which is usually divided into 0.26 mm, 0.31 mm, and 0.38 mm. B and C are the diameters of the two end probe shafts 3012, corresponding to 0.1 mm, 0.15 mm, and 0.2 mm respectively. D is the length of the probe body 3011, corresponding to 4 mm, 4 mm, and 8 mm. E is the stroke of one end probe shaft 3012, corresponding to 1.1 mm, 1.1 mm, and 1.5 mm. F is the stroke of the other end probe shaft 3012, corresponding to 0.6 mm, 0.6 mm, and 1.0 mm. L is the total length of the test probe 301, corresponding to 5.7 mm, 5.7 mm, and 10.5 mm. Among them, the diameter of the probe body 3011 is greater than the diameter of the probe shaft 3012. One end of the probe shaft 3012 can contact the test pad 201 and insert into the test pad 201, and the other end of the probe shaft 3012 can be connected to other components in the test fixture to transmit test signals and achieve the lighting test.

[0043] Referring again to Figure 5 , taking two rows of test probes 301 as an example, in the same row of test probes 301, the gap between two adjacent test probes 301 is relatively large. For example, in the same row of test probes 301, the gap between the probe bodies 3011 of two adjacent test probes 301 is greater than or equal to the diameter of the probe body 3011. In this way, the gap (far greater than 0.1 mm) between two adjacent test probes 301 in the same row can be significantly increased. Even if the gap (less than 0.1 mm) between two adjacent test pads 201 in the liquid crystal display panel is small, a test fixture with test probes 301 can still be used to perform the lighting test on the liquid crystal display panel. Therefore, the cost of the lighting test on the liquid crystal display panel can be saved. At the same time, because the gap between two adjacent test probes 301 in the same row of test probes 301 is significantly increased, when performing the lighting test on the liquid crystal display panel, the adjacent test probes 301 in the same row of test probes 301 in the test fixture do not affect each other. Therefore, the short-circuit problem between two adjacent test probes 301 in the same row of test probes 301 can be avoided, thereby improving the accuracy of the lighting test and further enhancing the efficiency of the lighting test.

[0044] Continuing to refer to Figure 5, taking the two rows of test probes 301 as an example, in different rows of test probes 301, the gap between two adjacent test probes 301 is relatively large. For example, in different rows of test probes 301, the gap between the shanks 3011 of adjacent test probes 301 is greater than or equal to the radius of the shank 3011. In this way, the gap (much larger than 0.1 mm) between adjacent test probes 301 in different rows can be significantly increased. Even if the gap (less than 0.1 mm) between adjacent test pads 201 in the liquid crystal display panel is small, a test fixture with test probes 301 can be used to perform the lighting test on the liquid crystal display panel. Therefore, the cost of the lighting test on the liquid crystal display panel can be saved. At the same time, since the gap between adjacent test probes 301 in different rows of test probes 301 is significantly increased, when the liquid crystal display panel is subjected to the lighting test, the adjacent test probes 301 in different rows of the test fixture do not affect each other. Therefore, the short-circuit problem between adjacent test probes 301 in the same row of test probes 301 can be avoided, thereby improving the accuracy of the lighting test and further enhancing the efficiency of the lighting test.

[0045] In practical applications, the minimum gap between adjacent test pads 201 is usually selected according to the diameters of different shanks 3011. After actual tests, when the lighting test is performed using the test fixture provided in the embodiment of the present disclosure, the minimum gap between adjacent test pads 201 corresponding to the test probe 301 with a shank 3011 diameter of 0.26 mm can be 0.07 mm, the minimum gap between adjacent test pads 201 corresponding to the test probe 301 with a shank 3011 diameter of 0.31 mm can be 0.08 mm, and the minimum gap between adjacent test pads 201 corresponding to the test probe 301 with a shank 3011 diameter of 0.38 mm can be 0.10 mm.

[0046] In some embodiments, as Figure 5 shown, the orthographic projection of the shank 3011 on the substrate 200 overlaps partially with the orthographic projection of the test pad 201 on the substrate 200, and the orthographic projection of the gap between the shank 3011 and the adjacent test pad 201 on the substrate 200 also overlaps partially. The orthographic projection of the needle shaft 3012 on the substrate 200 falls within the orthographic projection of the test pad 201 on the substrate 200.

[0047] During the lighting test, the needle shaft 3012 of the test probe 301 contacts the test pad 201 and inserts into the test pad 201, while the needle body 3011 of the test probe 301 remains outside the test pad 201. Among them, the orthographic projection of the needle shaft 3012 on the substrate 200 falls within the orthographic projection of the test pad 201 on the substrate 200, so as to ensure that the needle shaft 3012 can be aligned with the test pad 201 and make effective contact with the test pad 201, thereby ensuring the effective transmission of the test signal. The orthographic projection of the needle body 3011 on the substrate 200 overlaps with the orthographic projection of the test pad 201 on the substrate 200, and the orthographic projection of the gap between the needle body 3011 and the adjacent test pad 201 overlaps with the orthographic projection of the test pad 201 on the substrate 200, which can ensure that there is enough gap between adjacent test pads 201, while avoiding the influence of the test probe 301 on other test pads 301, improving the accuracy of the lighting test, and further improving the efficiency of the lighting test.

[0048] In some embodiments, the needle body 3011, the needle shaft 3012, and the test pad 201 are all plated with a coating, and the coating materials of the three are the same.

[0049] The test probe 301 has high electrical conductivity, elasticity, and wear resistance. It usually adopts a structure of a substrate plus a surface coating. The substrate can be made of beryllium copper (BeCu), phosphor bronze (Phosphor Bronze), or stainless steel (StainlessSteel), and the coating can be made of gold plating (Gold Plating), nickel plating (Nickel Plating), or palladium plating (Palladium). The needle body 3011 and the needle shaft 3012 of the test probe 301 adopt an integrally formed structure, that is, the substrates of the two use the same material, and the coatings also use the same material.

[0050] As the metal contact of the test probe 301, the test pad 201 needs to meet high weldability, electrical conductivity, and oxidation resistance. It also adopts a structure of a substrate plus a surface coating. The substrate can be made of copper (Copper), and the coating can be made of tin plating (Tin), electroless nickel immersion gold (ENIG / sink gold), or silver plating (Silver).

[0051] In practical applications, the coating materials of the needle body 3011, the needle shaft 3012, and the test pad 201 are the same. For example, the coatings of the three all adopt tin plating (Tin), which can ensure the effective contact between the needle shaft 3012 of the test probe 301 and the test pad 201, reduce the contact resistance, and improve the transmission effect of the test signal.

[0052] In some embodiments, the needle shaft 3012 is conical or blade-shaped.

[0053] The needle shaft 3012 is conical, gradually narrowing to a sharp point. The tip can penetrate the oxide layer or dirt on the test pad 201 and precisely contact the test pad 301 with a small size. The needle shaft is in the shape of a blade, with a flat or wedge-shaped tip, and the contact surface is linear or narrow-band. The linear or narrow-band contact surface reduces the pressure per unit area, reduces damage to the test pad 201 being tested, and ensures the effective transmission of test signals.

[0054] In some embodiments, as Figure 4 shown, the test fixture further includes: a power supply main board 302, a connector 303 located on the power supply main board 302, a flexible transfer circuit board 304, and a pressing head 305; one end of the flexible transfer circuit board 304 is electrically connected to the power supply main board 302 through the connector 303; the other end of the flexible transfer circuit board 304 is electrically connected to the needle shaft 3012 at one end of the test probe 301; the needle shaft 3012 at the other end of the test probe 301 is installed in the pressing head 305.

[0055] The power supply main board 302 can provide power for the entire test fixture. The connector 303 can specifically be a Zero Insertion Force (ZIF) socket. The power supply main board 302 can be electrically connected to the needle shaft 3012 at one end of the test probe 301 through the connector 303 and the flexible transfer circuit board 304 to provide an electrical signal for the test probe 301. The needle shaft 3012 at the other end of the test probe 301 is installed in the pressing head 305. The pressing head 305 can apply precise pressure to the test probe 301 mechanically, pneumatically, or electrically to ensure that the needle shaft 3012 of the test probe 305 is in full contact with the test pad 201 and ensure the effective transmission of test signals.

[0056] In some embodiments, as Figure 4 shown, the test fixture further includes: a support structure 306; the support structure 306 is configured to support the liquid crystal display panel to be tested, and the size of the support structure 306 is the same as the size of the liquid crystal display panel to be tested.

[0057] The support structure 306 can effectively support the liquid crystal display panel to be tested. Its size is the same as the size of the liquid crystal display panel to be tested, and it can also position the liquid crystal display panel to be tested to ensure that the needle shaft 3012 of the test probe 301 is precisely aligned with the test pad 201 in the liquid crystal display panel to be tested, thereby ensuring the effective transmission of test signals and avoiding poor contact or test errors caused by the offset between the needle shaft 3012 of the test probe 301 and the test pad 201 in the liquid crystal display panel to be tested.

[0058] In a second aspect, embodiments of the present disclosure provide a testing device, which includes the testing fixture provided in any of the above embodiments. The implementation principle and beneficial effects of this testing device are the same as those of the above testing fixture, and thus will not be elaborated herein.

[0059] It should be noted that in the drawings, the sizes of layers and regions may be exaggerated for clarity of illustration. Also, it can be understood that when an element or layer is referred to as being "on" another element or layer, it can be directly on the other element, or there may be an intermediate layer. Additionally, it can be understood that when an element or layer is referred to as being "under" another element or layer, it can be directly under the other element, or there may be more than one intermediate layer or element. Further, it can also be understood that when a layer or element is referred to as being "between" two layers or two elements, it can be the only layer between the two layers or two elements, or there may be more than one intermediate layer or element. Like reference numerals throughout indicate like elements.

[0060] In several embodiments provided by the embodiments of the present disclosure, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the positions of the components shown are only a logical functional position, and there may be other position arrangements in actual implementation.

[0061] It can be understood that the above embodiments are merely exemplary embodiments adopted to illustrate the principle of the present disclosure. However, the present disclosure is not limited thereto. For those of ordinary skill in the art, various modifications and improvements can be made without departing from the spirit and essence of the present disclosure, and these modifications and improvements are also considered within the protection scope of the present disclosure.

Claims

1. A test fixture for performing a lighting test on a liquid crystal display panel, the liquid crystal display panel comprising: A substrate substrate, and a plurality of test pads located on the substrate substrate; characterized in that the test fixture includes: a plurality of test probes arranged in one-to-one correspondence with the test pads; The plurality of test probes are arranged in multiple rows, and adjacent test probes in different rows are staggered.

2. The test fixture according to claim 1, wherein, The test probe includes: a needle body, and needle shafts connected to both ends of the needle body; the diameter of the needle body is greater than the diameter of the needle shaft; In the same row of test probes, the gap between the needle bodies of adjacent test probes is greater than or equal to the diameter of the needle body.

3. The test fixture according to claim 2, characterized in that, In different rows of test probes, the gap between the needle bodies of adjacent test probes is greater than or equal to the radius of the needle body.

4. The test fixture according to claim 2, wherein The orthographic projection of the needle body on the substrate substrate overlaps partially with the orthographic projection of the test pad on the substrate substrate, and the orthographic projection of the gap between the needle body and the adjacent test pad also overlaps partially.

5. The test fixture according to claim 2, wherein The orthographic projection of the needle shaft on the substrate substrate falls within the orthographic projection of the test pad on the substrate substrate.

6. The test fixture according to claim 2, characterized in that, The needle body, the needle shaft, and the test pad are all plated with a coating, and the coating materials of the three are the same.

7. The test fixture according to claim 2, characterized in that, The needle shaft is conical or blade-shaped.

8. The test fixture according to claim 2, wherein The test fixture further includes: a power supply main board, a connector located on the power supply main board, a transfer flexible circuit board, and a pressing head; One end of the transfer flexible circuit board is electrically connected to the power supply main board through the connector; The other end of the transfer flexible circuit board is electrically connected to the needle shaft at one end of the test probe; The needle shaft at the other end of the test probe is installed in the pressing head.

9. The test fixture according to claim 8, wherein, The test fixture further includes: a support structure; the support structure is configured to support the liquid crystal display panel to be tested, and the size of the support structure is the same as the size of the liquid crystal display panel to be tested.

10. A testing device, characterized in that, The test device includes the test fixture according to any one of claims 1 to 9.

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