Method and system for testing abnormal working condition protection characteristics of intelligent power distribution safety switch

Abstract

The invention relates to a method and a system for testing abnormal working condition protection characteristics of an intelligent power distribution safety switch, the intelligent power distribution safety switch and a solid-state power controller are crucial in the fields of aerospace and the like, but an existing testing system is difficult to meet strict requirements of the intelligent power distribution safety switch and the solid-state power controller. The invention provides a test method and system, and aims to solve the problems. The test system comprises a plurality of modules, such as a test management and control system, a power supply module, a signal source and control module, a switch and signal control module and the like, and complex functions of the test system can be realized. The test method comprises an over-current protection test. And short-circuit protection testing and the like. The method is flexible in configuration, comprehensive in test and high in data analysis precision, can improve the safety and stability of equipment in aerospace and other high-requirement fields, is verified by strict tests, is reliable in hardware and mature in software algorithm, and can provide powerful technical support for quality assurance of intelligent power distribution equipment.

Description

Technical Field

[0002] The present invention relates to the technical field of testing intelligent distribution safety switches and solid-state power controller devices, and particularly to the detection technology for the functions and performances of these devices under abnormal working conditions such as short-circuit protection, over-current protection, inverse-time protection, and capacitive load protection. Background Art

[0003] Intelligent distribution safety switches and solid-state power controllers play an important role in high-reliability fields such as aerospace, and are responsible for power distribution and protection work. Compared with traditional mechanical circuit breakers, they have the advantages of fast response speed, high reliability, small volume, and light weight. However, abnormal working conditions such as short circuits, overcurrents, and overvoltages that often occur in power systems require these devices to quickly respond and cut off abnormal currents within milliseconds to ensure the safety of the system and load.

[0004] Existing test systems have problems such as limited test scope, complex operation, and insufficient test accuracy when dealing with abnormal working condition tests, and it is difficult to meet the strict requirements of modern high-reliability power systems. Therefore, it is particularly urgent to develop a method and system that can comprehensively and efficiently test intelligent distribution safety switches and solid-state power controllers under abnormal working conditions. Summary of the Invention

[0005] 1. Composition of the Test System

[0006] Test Management and Control System: As the core control hub of the entire test system, the test control computer works in coordination with the test management software. It interacts with other modules through various communication interfaces to precisely control the test process, including operations such as start, pause, and stop. The management software has a highly flexible configuration ability, and users can conveniently select test items and precisely set parameters such as voltage, current, and test duration according to different test requirements.

[0007] Power Supply Module: It consists of a bias power supply, a control power supply, and a power supply. The bias power supply provides the basic DC voltage for the device to ensure the basic conditions for its normal operation; the control power supply ensures stable power supply for the switch and control unit to maintain its normal working state; the power supply can simulate the large-power load situation in actual use to provide reliable guarantee for the electrical stress test under abnormal working conditions.

[0008] Signal Source and Control Module: It has the ability to provide various types of test signals, such as pulse signals, DC signals, and abnormal signals simulating overcurrent and short circuit. This module provides precise trigger signals for the test working conditions and cooperates with the switch matrix to achieve flexible signal switching and precise control.

[0009] Switch and Signal Control Module: It includes a switch matrix from K1 to K8. Its main function is to control different test modes and implement signal switching, ensuring that the tests of the device under various abnormal working conditions can be automated. In addition, protection modules (such as over-current protection OCP and time-current protection I 2 T) can effectively prevent device damage under extreme conditions and ensure the safety of the test process.

[0010] Load and Measuring Equipment Module: It mainly includes a programmable electronic load, an oscilloscope, an LCR meter, a multimeter, etc. The programmable electronic load can accurately simulate various load states during actual operation; the oscilloscope is used to record voltage and current waveforms in real time to help monitor the response of the device during the test; the LCR meter can accurately measure the characteristics of inductance, capacitance and resistance to ensure that the parameters of the device under test meet the relevant standards.

[0011] Isolation and Protection Circuit: The main function of this module is to ensure electrical isolation between the test equipment and the device under test (DUT), effectively avoiding the impact of high voltage on the low-voltage system, thereby protecting the safety of the test equipment. At the same time, the isolation capacitor and the capacitor array self-test module can also complete self-diagnosis and calibration of the measurement, significantly improving the accuracy of the data.

[0012] Data Acquisition and Analysis Module: This module is responsible for recording and deeply analyzing key data such as voltage, current, and temperature collected during the test process, and evaluating the device performance by detecting whether each test index meets the design requirements. The data analysis software also has the function of generating charts, which can help engineers intuitively judge the performance of the device under abnormal working conditions.

[0013] 2. Test Methods

[0014] Over-Current Protection Test: The purpose is to verify the protection response ability of the device under over-current conditions. The specific method is to gradually increase the output current of the power supply so that it exceeds the rated current of the device. During this process, closely observe whether the device can trigger over-current protection within the specified response time. At the same time, accurately record the tripping time point and the triggered current value to evaluate the over-current protection ability and reliability of the device.

[0015] Short-Circuit Protection Test: It aims to test the response ability of the device under short-circuit conditions and prevent the device from being damaged in a severe fault state. During the test, introduce a short-circuit load when the device is in normal operation, monitor the surge of current in real time, and record the time point when the device triggers short-circuit protection and the peak short-circuit current value, so as to confirm whether the device has the ability to quickly cut off the current under short-circuit conditions.

[0016] Inverse time protection test: mainly evaluate the protection mechanism of the device when the load gradually increases, and verify its response ability to temperature rise or current change. By gradually increasing the load current, simulate the long-term overload state of the device, and carefully observe whether the device triggers protection in time when the temperature or current reaches the inverse time protection threshold. Record the temperature rise trigger threshold and protection response time to ensure the protection ability of the device under continuous overload conditions.

[0017] Capacitive load protection test: First, select the capacitive load protection test item, and then connect a large-capacity capacitor to the device. During the charging process, closely monitor the current change, observe the protection trigger situation of the device when the capacitive load is overcurrent, and the software records relevant data and deeply analyzes the protection ability of the device under high-capacitance load.

[0018] Short-circuit and make protection time test

[0019] Short-circuit protection time test after making: Measure the short-circuit response time of the device after making. The specific operation is to apply short-circuit conditions and record the time from normal making to protection trigger of the device to ensure that its response speed meets the design requirements.

[0020] Make protection time test after short-circuit: Measure the time required for the device to return to the normal working state after the short-circuit is removed, so as to verify its fast recovery ability after the fault is removed.

[0021] Trip recovery time test: Evaluate the restart ability of the device after the abnormal working condition is eliminated, and ensure that it can stably recover after the fault is removed. After the device triggers a trip, make it return to the normal state and record the time when the device resumes power supply, so as to verify its stable operation ability after recovery.

[0022] Insulation performance test: Select the insulation performance test item in the software and set the appropriate insulation test voltage. Apply the voltage to the high-voltage end of the device, measure and record the insulation resistance value, and the software analyzes and judges whether the insulation performance meets the standard.

[0023] Test system composition

[0024] The test system of the present invention includes the following main modules:

[0025] 1. Test management and control system

[0026] This module is the core control part of this test system, including a test control computer and test management software. The control system communicates with other test modules through interfaces such as RS-232, RS-485, and LXI to control operations such as starting, pausing, and stopping the test process. The management software has a flexible configuration function, allowing users to select different test items and set parameters such as voltage, current, and test duration to meet various test requirements.

[0027] 2. Power module

[0028] It includes bias power supply, control power supply and power supply. The bias power supply provides basic DC voltage to support the normal operation of the equipment; the control power supply is responsible for the stable power supply of switches and control units; the power supply provides high-power load conditions for the equipment, simulates the load conditions in actual use, and ensures the reliability of electrical stress testing under abnormal working conditions.

[0029] 3.Signal source and control module

[0030] The module can provide a variety of test signals, such as pulse signals, DC signals, and abnormal signals such as simulated overcurrent and short circuit. The signal source and control module provides accurate trigger signals for test conditions and realizes signal switching and control together with the switch matrix.

[0031] 4.Switch and signal control module

[0032] The switch matrix including K1 to K8 is responsible for controlling different test modes and switching signals to ensure that the test of the device under various abnormal working conditions can be carried out automatically. Protection modules (such as overcurrent protection OCP and time current protection I 2 T) Prevent equipment damage under extreme conditions and ensure test safety.

[0033] 5. Load and measurement equipment module

[0034] Including programmable electronic load, oscilloscope, LCR meter and multimeter, etc. The programmable load can simulate various load conditions in actual operation; the oscilloscope is used to record voltage and current waveforms to help monitor the response of the equipment; the LCR meter measures the inductance, capacitance and resistance characteristics to ensure that the parameters of the tested equipment meet the standards.

[0035] 6. Isolation and protection circuit

[0036] This module ensures electrical isolation between the test equipment and the device under test (DUT), avoids the impact of high voltage on the low voltage system, and protects the safety of the test equipment. The isolation capacitor and capacitor array self-test module can also complete self-diagnosis and calibration of the measurement to improve data accuracy.

[0037] 7. Data collection and analysis module

[0038] Record and analyze key data such as voltage, current, temperature, etc. collected during the test to detect whether each test indicator meets the design requirements. The data analysis software can also generate charts to help engineers intuitively judge the performance of the equipment under abnormal conditions.

[0040] Main test methods

[0041] Overcurrent protection test

[0042] Purpose: To verify the protection response of the device under over-current conditions and ensure that it can respond quickly and protect the circuit when the current exceeds the rated value.

[0043] Method: Gradually increase the output current of the power supply beyond the rated current of the device and observe whether the device triggers over-current protection within the specified response time. Record the tripping time point and the triggered current value to evaluate the over-current protection ability and reliability of the device.

[0044] Short-circuit protection test

[0045] Purpose: To test the response ability of the device under short-circuit conditions to prevent the device from being damaged under severe fault conditions.

[0046] Method: Introduce a short-circuit load during the normal operation of the device, monitor the surge in current, and record the time point when the device triggers short-circuit protection and the peak short-circuit current value to confirm that it can quickly cut off the current under short-circuit conditions.

[0047] Inverse-time protection test

[0048] Purpose: To evaluate the protection mechanism of the device when the load gradually increases and verify its response ability to temperature rise or current change.

[0049] Method: Gradually increase the load current to simulate the long-term overload state of the device and observe whether the device triggers protection in a timely manner when the temperature or current reaches the inverse-time protection threshold. Record the temperature rise trigger threshold and the protection response time to ensure the protection ability of the device under continuous overload conditions.

[0050] Capacitive load protection test

[0051] Select the capacitive load protection test item and connect a large-capacity capacitor to the device.

[0052] Monitor the current change during the charging process and observe the protection trigger of the device when the capacitive load is over-current.

[0053] The software records relevant data and analyzes the protection ability of the device under high-capacitance loads.

[0054] Short-circuit and make protection time test

[0055] Short-circuit protection time after making: Measure the short-circuit response time of the device after making. By applying short-circuit conditions, record the time from normal making to protection trigger of the device to ensure that its response speed meets the design requirements.

[0056] Make protection time after short-circuit: Measure the time required for the device to return to the normal working state after the short-circuit is removed to verify its fast recovery ability after the fault is removed.

[0057] Tripping Recovery Time Test

[0058] Evaluate the restart ability of the equipment after the abnormal conditions are eliminated to ensure its stable recovery after the fault is removed.

[0059] After the equipment trips, restore it to the normal state and record the time when the equipment resumes power supply to verify its stable operation ability after recovery.

[0060] Insulation Performance Test

[0061] Select the insulation performance test item in the software and set the insulation test voltage.

[0062] Apply voltage to the high-voltage end of the equipment, measure and record the insulation resistance value, and the software analyzes whether the insulation performance meets the standard. Description of the Drawings

[0063] Figure 1 : Schematic diagram of the structure of the intelligent distribution safety switch, introducing the connection and working principle between each module of the intelligent distribution safety switch. Figure 2 : Overall block diagram of the ATE for the electronic switch circuit - tooling and voltage diagram, mainly introducing the interface between the pre-amplified signal conditioning device and the device under test and the test tooling in the electronic switch circuit. And an example of a voltage diagram under high voltage is shown. Figure 3 : Test circuit diagram of the test system. Figure 4 : Overall control diagram of the ATE for the electronic switch circuit. It details the overall layout and circuit principle of the electronic switch circuit. Detailed Implementation Manner

[0065] The intelligent distribution safety switch abnormal condition characteristic test system provided by the present invention realizes the efficient verification of the equipment under various abnormal conditions through flexible configuration, comprehensive test methods and high-precision data analysis. This system has wide applicability and can be used for the test of distribution equipment in high-requirement fields such as aerospace, helping to improve the safety and stability of the equipment. From the perspective of reliability, this system has also been strictly tested and verified. Its hardware components are selected from high-quality and high-reliability materials and devices, and can maintain stable operation during long-term and high-intensity test work. The software part adopts mature and reliable algorithms and programming architectures, effectively avoiding problems such as data errors or test interruptions caused by software failures.

[0066] Through the above specific implementation manners, it is possible to accurately and efficiently conduct a comprehensive abnormal condition protection characteristic test on the intelligent power distribution safety switch, providing solid and reliable technical support for the quality assurance of intelligent power distribution equipment and ensuring the safety and reliability of the equipment in actual applications. In summary, the abnormal condition characteristic test system for the intelligent power distribution safety switch provided by the present invention plays an indispensable role in improving the safety and stability of power distribution equipment with its excellent performance and characteristics, and especially shows its unique value and advantages in high-demand fields such as aerospace.

Claims

1. An intelligent distribution safety switch abnormal condition protection characteristic test system, including the following modules: The test management and control system, which includes a test control computer and test management software, communicates with other test modules through interfaces such as RS-232, RS-485, and LXI, and is used to control the start, pause, and stop operations of the test process. The management software has a flexible configuration function, and can select different test items and set parameters such as voltage, current, and test duration; The power supply module, including a bias power supply, a control power supply, and a power supply, the bias power supply provides basic DC voltage to support the normal operation of the equipment, the control power supply is responsible for the stable power supply of the switch and the control unit, and the power supply provides high-power load conditions for the equipment; The signal source and control module can provide a variety of test signals, including pulse signals, DC signals, and abnormal signals such as simulated overcurrent and short circuit, and jointly with the switch matrix, realizes signal switching and control; The switch and signal control module includes a switch matrix from K1 to K8, which is used to control different test modes and switch signals, and its protection module prevents equipment damage under extreme conditions; The load and measurement equipment module includes a programmable electronic load, an oscilloscope, an LCR meter, and a multimeter. The programmable load simulates the actual load state, the oscilloscope records the voltage and current waveforms, and the LCR meter measures the characteristics of inductance, capacitance, and resistance; The isolation and protection circuit ensures electrical isolation between the test equipment and the equipment under test. Its isolation capacitor and capacitor array complete self-diagnosis and calibration of the measurement by the test module; The data acquisition and analysis module records and analyzes key data such as voltage, current, and temperature during the test process, detects whether the test indicators meet the design requirements, and generates charts to assist in judging the performance of the equipment.

2. According to the test system required in claim 1, the test management software can flexibly combine each module according to the test requirements to adapt to the tests of different types and specifications of intelligent distribution devices.

3. A test method for the abnormal condition protection characteristics of an intelligent distribution safety switch, characterized in that, Including the following steps: Overcurrent protection test: Gradually increase the output current of the power supply until it exceeds the rated current of the equipment, observe whether the equipment triggers overcurrent protection within the specified response time, record the tripping time point and the trigger current value, and evaluate the overcurrent protection ability and reliability; Short-circuit protection test: Introduce a short-circuit load when the equipment is operating normally, monitor the surge of current, record the time point when the equipment triggers short-circuit protection and the peak short-circuit current, and confirm the ability to quickly cut off the current during short-circuit; Inverse time protection test: Gradually increase the load current to simulate a long-term overload state, observe whether the equipment triggers protection in time when the temperature or current reaches the inverse time protection threshold, record the temperature rise trigger threshold and the protection response time, and ensure the protection ability during continuous overload; Capacitive load protection test: Connect a large-capacity capacitor to the equipment, monitor the change of current during the charging process, observe the protection trigger situation when the capacitive load is overcurrent, and analyze the protection ability of the equipment under high-capacity load; Short - circuit and turn - on protection time test: For the short - circuit protection time test after turn - on, apply short - circuit conditions and record the time from normal turn - on to protection trigger of the device to ensure that the response speed meets the design requirements; for the turn - on protection time test after short - circuit, measure the time required for the device to return to the normal working state after short - circuit removal and verify the quick recovery ability after fault removal. Trip recovery time test: After the device triggers a trip, restore it to the normal state and record the power - on recovery time to evaluate the restart ability after the elimination of abnormal working conditions.

4. The test method according to claim 3, characterized in that, In each test step, the data acquisition and analysis module collects key data in real - time and analyzes it to generate charts to assist engineers in judging the device performance.

5. The test system according to claim 1, characterized in that The hardware components are selected from high - quality and highly reliable materials and devices to ensure stable operation during long - term and high - intensity test work.

6. The test system according to claim 1, wherein The software part adopts mature and reliable algorithms and programming architectures to avoid data errors or test interruptions caused by software failures.

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