Method for measuring product deformation before MLCC cutting

Abstract

The invention relates to the field of MLCC production, in particular to a method for measuring product deformation before MLCC cutting, and the method comprises the following steps: obtaining cut blocks, and forming a block array which is composed of M rows and N columns of capacitor green bodies; selecting m rows of capacitor green bodies from the M rows in the block array to form a transition array with m rows and N columns, and selecting n columns of capacitor green bodies from the N columns in the transition array to form an array to be detected with m rows and n columns; measuring the width of a non-effective electrode part of each capacitor green body in the array to be measured; calculating the center value of each capacitor green body; in each row of the m rows in the array to be tested, the deformation of each capacitor green body in the row is calculated, the method is more in line with the actual cutting condition, the deformation of the product during cutting is simulated, the product characteristics can be intuitively reflected, and datamation is achieved.

Description

Technical Field

[0001] The present invention relates to the field of MLCC production, and particularly to a method for measuring the deformation amount of products before MLCC cutting. Background Art

[0002] As the size of MLCCs becomes smaller and smaller, the capacitance becomes higher and higher, the design margin of products becomes smaller and smaller, and the left and right gap margins of products also become smaller and smaller, and the requirements for the cutting process become increasingly higher. Due to the deformation of products before cutting, the cutting yield of MLCCs is low. It is crucial to confirm the deformation amount of products for cutting. Currently, the conventional method is to indirectly reflect whether the product has deformation by statistically analyzing the small gap defect rate in the cutting defect rate of products. Among them, gap refers to the non-effective electrode part of multi-layer ceramic capacitors; gap amount refers to the length of the non-effective electrode part of multi-layer ceramic capacitors after cutting, and the unit is generally um; small gap defective products refer to products with a gap amount less than the specified value; the small gap defect rate is equal to the number of small gap defective products / the total number of cut products * 100%. Judging the deformation amount of products through the small gap defect rate cannot directly determine whether the defect is caused by the deformation amount of the product. The influencing factors of the small gap defect rate are not only related to the deformation amount of the product, but also related to the adjustment of the cutting equipment by operators, the method of judging defective products, and the hardness of the cutting tool, which affect the cutting perpendicularity of the product from the upper side to the lower side of the cutting. It is equivalent to inferring one of the influencing factors from the result of multiple influencing factors. It is inferring the cause from the result, which is not conducive to evaluating the deformation amount of the product itself. Therefore, how to directly measure the deformation amount of products, intuitively reflect the product characteristics, and digitalize them so that technicians can quantitatively analyze and evaluate the products is an urgent problem to be solved. Summary of the Invention

[0003] In view of this, the purpose of the present invention is to propose a method for measuring the deformation amount of products before MLCC cutting to solve the above technical problems.

[0004] Based on the above purpose, the present invention provides a method for measuring the deformation amount of products before MLCC cutting, and the measurement method includes the following steps:

[0005] Obtain the cut blocks to form a block array, and the block array is composed of capacitor green bodies in M rows and N columns;

[0006] Select m rows of capacitor green bodies from the M rows in the block array to form a transition array of m rows and N columns, and then select n columns of capacitor green bodies from the N columns in the transition array to form a measurement array of m rows and n columns;

[0007] Measure the width of the non-effective electrode part of each green capacitor in the array to be measured, which is denoted as the gap amount of the product. The gap amount of the product includes the width of the non-effective electrode part above the electrode region and the width of the non-effective electrode part below the electrode region. Among them, the width of the non-effective electrode part above the electrode region is denoted as the upper gap amount of the product, and the width of the non-effective electrode part below the electrode region is denoted as the lower gap amount of the product;

[0008] Calculate the central value of each green capacitor from the upper gap amount and the lower gap amount of the product;

[0009] In each row of the m rows in the array to be measured, taking the average value of the central value of the first green capacitor and the central value of the last green capacitor as the base point, calculate in this row, except for the first green capacitor and the last green capacitor.

[0010] Furthermore, the measurement of the width of the non-effective electrode part of each green capacitor in the array to be measured includes the following steps:

[0011] Take the row direction of each row in the array to be measured as the horizontal axis and the total direction of each column as the vertical axis;

[0012] Taking each horizontal axis as the rotation center, rotate each row in the array to be measured 90 degrees in the same direction as the corresponding horizontal axis; then taking each vertical axis as the rotation center, rotate each column in the array to be measured 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the green capacitor facing upward is the cutting surface;

[0013] Measure the width of the non-effective electrode part on the cutting surface of each capacitor.

[0014] Furthermore, in the calculation of the central value of each green capacitor from the upper gap amount and the lower gap amount of the product, the central value is calculated by the following formula:

[0015] The central value of the green capacitor = (the upper gap amount of the product - the lower gap amount of the product) / 2.

[0016] Furthermore, in each row of the m rows in the array to be measured, taking the average value of the central value of the first green capacitor and the central value of the last green capacitor as the base point, calculate in this row, except for the first green capacitor and the last green capacitor, the deformation amount of the green capacitor is calculated by the following formula:

[0017] The deformation amount of the xth green capacitor = the central value of the xth green capacitor - 0.5 * (the central value of the first green capacitor + the central value of the nth green capacitor);

[0018] Where x represents the position of the green body of the capacitor to be measured in a certain row of the array to be measured.

[0019] Further, after the deformation of each green body of the capacitor in each row is measured, the deformation of all the green bodies of the capacitor in the array to be measured is graphically represented.

[0020] Advantages of the present invention: By using the method for measuring the deformation of the product before cutting of the present invention, after the bar block is cut, a part of it is selected to restore the deformation measurement of the product in a simple and effective manner, which is more in line with the actual cutting situation, simulates the deformation of the product during cutting, can intuitively reflect the product characteristics, and is digitalized, facilitating technicians to quantitatively analyze and evaluate the product. Description of the Drawings

[0021] Figure 1 Is the bar block after cutting in the present invention;

[0022] Figure 2 Is the selected bar block array;

[0023] Figure 3 Is the gap measurement diagram of each green body of the capacitor;

[0024] Figure 4 Is the shape of the bar block after cutting;

[0025] Figure 5 Is the product center value one of the present invention;

[0026] Figure 6 Is the deformation one of the present invention;

[0027] Figure 7 Is the table one of the deformation of the present invention plus a fixed value;

[0028] Figure 8 Is the visualization graph one of the present invention;

[0029] Figure 9 Is the product center value two of the present invention;

[0030] Figure 10 Is the deformation two of the present invention;

[0031] Figure 11 Is the table two of the deformation of the present invention plus a fixed value;

[0032] Figure 12 Is the visualization graph two of the present invention. Detailed Embodiments

[0033] To make the objectives, technical solutions and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below in conjunction with specific embodiments.

[0034] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the present invention shall have the ordinary meanings understood by those with ordinary skills in the field to which the present invention pertains. The "first", "second" and similar terms used in the present invention do not denote any order, quantity or importance, but are only used to distinguish different components. Words such as "comprising" or "including" mean that the elements or objects appearing before this word cover the elements or objects listed after this word and their equivalents, without excluding other elements or objects. Words such as "connected" or "coupled" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Upper", "lower", "left", "right", etc. are only used to represent relative positional relationships, and when the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0035] Embodiment 1:

[0036] A method for measuring the deformation amount of the product before MLCC cutting is proposed, and the method includes the following steps:

[0037] The measurement method includes the following steps:

[0038] Obtain the cut bar blocks to form a bar block array, and the bar block array is composed of green capacitor blanks with M rows and N columns;

[0039] Select m rows of green capacitor blanks from the M rows in the bar block array to form a transition array with m rows and N columns, and then select n columns of green capacitor blanks from the N columns in the transition array to form a measurement array with m rows and n columns;

[0040] Measure the width of the non-effective electrode part of each green capacitor blank in the measurement array, which is denoted as the gap amount of the product. The gap amount of the product includes the width of the non-effective electrode part above the electrode area and the width of the non-effective electrode part below the electrode area. Among them, the width of the non-effective electrode part above the electrode area is denoted as the upper gap amount of the product, and the width of the non-effective electrode part below the electrode area is denoted as the lower gap amount of the product;

[0041] Calculate the center value of each green capacitor blank from the upper gap amount and the lower gap amount of the product;

[0042] In each row of the m rows in the measurement array, taking the average value of the center value of the first green capacitor blank and the center value of the last green capacitor blank as the base point, calculate the values in this row except for the first green capacitor blank and the last green capacitor blank.

[0043] Here, measuring the width of the non-effective electrode part of each green capacitor blank in the measurement array includes the following steps:

[0044] Taking the row direction of each row in the array to be measured as the horizontal axis and the total direction of each column as the vertical axis;

[0045] Taking each horizontal axis as the rotation center, so that each row in the array to be measured rotates 90 degrees in the same direction as the corresponding horizontal axis; then taking each vertical axis as the rotation center, so that each column in the array to be measured rotates 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the green capacitor facing upward is the cutting surface;

[0046] Measure the width of the non-effective electrode part on the cutting surface of each capacitor.

[0047] From the upper gap amount of the product and the lower gap amount of the product, calculate the center value of each green capacitor. The center value is calculated by the following formula:

[0048] Center value of the green capacitor = (Upper gap amount of the product - Lower gap amount of the product) / 2.

[0049] In each row of the m rows in the array to be measured, taking the average value of the center value of the first green capacitor and the center value of the last green capacitor as the base point, calculate the deformation amount of the green capacitors in this row except the first and the last green capacitors. The deformation amount is calculated by the following formula:

[0050] Deformation amount of the x-th green capacitor = Center value of the x-th green capacitor - 0.5*(Center value of the 1st green capacitor + Center value of the n-th green capacitor);

[0051] Where x represents the position of the green capacitor to be measured in a certain row of the array to be measured.

[0052] After measuring the deformation amount of each green capacitor in each row, graph the deformation amount of all the green capacitors in the array to be measured.

[0053] After the bar block is cut, select a part of it and, in a simple and effective way, restore the deformation amount measurement of the product as much as possible, which is more in line with the actual cutting situation, simulate the deformation amount of the product during cutting, can intuitively reflect the product characteristics, and is digitalized, facilitating technicians to conduct quantitative analysis and evaluation of the product.

[0054] Example 2:

[0055] Taking the 0603 / X5R / 106 product as an example, as Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 shown, a method for measuring the deformation amount of the product before MLCC cutting is proposed. The method includes the following steps:

[0056] Obtain the cut bar pieces to form a bar piece array, which is composed of green capacitor blanks arranged in M rows and N columns;

[0057] Select 3 rows of green capacitor blanks from the M rows in the bar piece array to form a transition array with 3 rows and N columns, and then select 3 columns of green capacitor blanks from the N columns in the transition array to form a test array with 3 rows and 3 columns;

[0058] Measure the width of the non-effective electrode part of each green capacitor blank in the test array, which is denoted as the gap value of the product. The gap value of the product includes the width of the non-effective electrode part above the electrode region and the width of the non-effective electrode part below the electrode region. Among them, the width of the non-effective electrode part above the electrode region is denoted as the upper gap value of the product, and the width of the non-effective electrode part below the electrode region is denoted as the lower gap value of the product; Here, measuring the width of the non-effective electrode part of each green capacitor blank in the test array includes the following steps:

[0059] Take the row direction of each row in the test array as the horizontal axis and the column direction of each column as the vertical axis;

[0060] Take each horizontal axis as the rotation center, so that each row in the test array rotates 90 degrees in the same direction as the corresponding horizontal axis; Then take each vertical axis as the rotation center, so that each column in the test array rotates 90 degrees in the same direction as the corresponding vertical axis; To make the surface of the green capacitor blank facing up the cutting surface;

[0061] Measure the width of the non-effective electrode part on the cutting surface of each capacitor.

[0062] Through the above measurement, the gap values are shown in the following table:

[0063]

[0064] Then, from the upper gap value and the lower gap value of the product, calculate the center value of each green capacitor blank;

[0065] When calculating the center value of each green capacitor blank from the upper gap value and the lower gap value of the product, the center value is calculated by the following formula:

[0066] Center value of the green capacitor blank = (upper gap value of the product - lower gap value of the product) / 2;

[0067] After calculation, the center values are as Figure 5 shown.

[0068] Finally, in each row of the m rows in the test array, taking the average value of the center value of the first green capacitor blank and the center value of the last green capacitor blank as the base point, calculate the deformation amount of each green capacitor blank in this row.

[0069] Among them, in each of the m rows of the array to be measured, taking the average value of the central value of the first green capacitor blank and the central value of the last green capacitor blank as the base point, the deformation amount of the green capacitor blanks in this row, except for the first and the last green capacitor blanks, is calculated by the following formula:

[0070] The deformation amount of the x-th green capacitor blank = the central value of the x-th green capacitor blank - 0.5 * (the central value of the first green capacitor blank + the central value of the n-th green capacitor blank);

[0071] Where x represents the position of the green capacitor blank to be measured in a certain row of the array to be measured.

[0072] After calculation, the deformation amount is as Figure 6 shown.

[0073] Preferably, after the deformation amounts of the green capacitor blanks in each row are measured, the deformation amounts of all the green capacitor blanks in the array to be measured are graphically represented.

[0074] Specifically, taking the deformation amount values of the green capacitor blanks in the bottommost row as the reference, in the adjacent upper rows, the deformation amount values of the green capacitor blanks in the upper rows are added with a fixed value on the basis of the deformation amount values of the green capacitor blanks in the lower rows. This fixed value should be greater than the maximum deformation amount. Here, the fixed value is set to 50, and the following Figure 7 shown table is obtained.

[0075] Furthermore, the following Figure 8 shown graph is obtained to achieve the purpose of visualization.

[0076] Embodiment 3

[0077] Taking the 0603 / X5R / 5106 product as an example, a method for measuring the deformation amount of the product before MLCC cutting is proposed. The method includes the following steps:

[0078] Obtain the cut bar blocks to form a bar block array, which is composed of green capacitor blanks with M rows and N columns;

[0079] Select 4 rows of green capacitor blanks from the M rows in the bar block array to form a transition array with 4 rows and N columns, and then select 3 columns of green capacitor blanks from the N columns in the transition array to form a test array with 4 rows and 3 columns;

[0080] Measure the width of the non-effective electrode portion of each green capacitor in the array to be measured, which is denoted as the gap value of the product. The gap value of the product includes the width of the non-effective electrode portion above the electrode region and the width of the non-effective electrode portion below the electrode region. Among them, the width of the non-effective electrode portion above the electrode region is denoted as the upper gap value of the product, and the width of the non-effective electrode portion below the electrode region is denoted as the lower gap value of the product. Here, measuring the width of the non-effective electrode portion of each green capacitor in the array to be measured includes the following steps:

[0081] Take the row direction of each row in the array to be measured as the horizontal axis and the total direction of each column as the vertical axis;

[0082] Take each horizontal axis as the rotation center, so that each row in the array to be measured rotates 90 degrees in the same direction as the corresponding horizontal axis; then take each vertical axis as the rotation center, so that each column in the array to be measured rotates 90 degrees in the same direction as the corresponding vertical axis; so that the upward-facing surface of the green capacitor is the cutting surface;

[0083] Measure the width of the non-effective electrode portion on the cutting surface of each capacitor.

[0084] Through the above measurement, the gap values are shown in the following table:

[0085] Upper gap

[0086] 86.5 92.5 106.8 100.2 110.5 82.1 78.8 93.5 95.6 102.3 75.6 60.2 69.8 80.3 80.6

[0087] Lower gap

[0088] 72.6 97.5 80.5 70.6 100.9 97.8 98.6 90.3 82.5 90.8 100.6 111.5 105.6 74.8 96.6

[0089] Then, calculate the central value of each green capacitor from the upper gap value and the lower gap value of the product;

[0090] When calculating the central value of each green capacitor from the upper gap value and the lower gap value of the product, the central value is calculated by the following formula:

[0091] Central value of the green capacitor = (Upper gap value of the product - Lower gap value of the product) / 2;

[0092] After calculation, the central values are as Figure 9 shown.

[0093] Finally, in each of the m rows in the array to be measured, taking the average value of the central value of the first green capacitor and the central value of the last green capacitor as the base point, calculate the deformation amount of each green capacitor in this row.

[0094] Among them, in each of the m rows of the array to be measured, taking the average value of the central value of the first green capacitor blank and the central value of the last green capacitor blank as the base point, in this row, except for the first green capacitor blank and the last green capacitor blank, here, because the first green capacitor blank and the last green capacitor blank are at the outermost sides of a row and will not be cut themselves, so they will not be deformed. The deformation amount of the green capacitor blank is calculated by the following formula:

[0095] The deformation amount of the x-th green capacitor blank = the central value of the x-th green capacitor blank - 0.5 * (the central value of the first green capacitor blank + the central value of the n-th green capacitor blank);

[0096] Where x represents the position of the green capacitor blank to be measured in a certain row of the array to be measured.

[0097] After calculation, the deformation amounts are as Figure 10 shown.

[0098] Preferably, after the deformation amounts of each green capacitor blank in each row are measured, the deformation amounts of all green capacitor blanks in the array to be measured are graphically represented.

[0099] Specifically, taking the deformation amount values of each green capacitor blank in the bottommost row as the reference, in the adjacent rows, the deformation amount values of each green capacitor blank in the upper row are added with a fixed value on the basis of the deformation amount values of each green capacitor blank in the lower row. This fixed value needs to be greater than the maximum deformation amount. Here, the fixed value is set to 50, and the table as Figure 11 shown is obtained.

[0100] Furthermore, the following figure is obtained to achieve the purpose of visualization.

[0101] Those of ordinary skill in the art should understand that: the discussion of any of the above embodiments is only exemplary and is not intended to imply that the scope of the present invention (including the claims) is limited to these examples; under the concept of the present invention, the technical features in the above embodiments or different embodiments can also be combined, and the steps can be implemented in any order, and there are many other variations in different aspects of the present invention as described above, which are not provided in detail for the sake of brevity.

[0102] The present invention is intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Claims

1. A method for measuring the deformation amount of an MLCC product before cutting, characterized in that, The measurement method includes the following steps: Obtain the diced bar pieces to form a bar piece array, where the bar piece array is composed of green capacitors in M rows and N columns; Select m rows of green capacitors from the M rows in the bar piece array to form a transition array of m rows and N columns, and then select n columns of green capacitors from the N columns in the transition array to form a measurement array of m rows and n columns; Measure the width of the non-effective electrode part of each green capacitor in the measurement array, denoted as the gap amount of the product. The gap amount of the product includes the width of the non-effective electrode part above the electrode region and the width of the non-effective electrode part below the electrode region. Among them, the width of the non-effective electrode part above the electrode region is denoted as the upper gap amount of the product, and the width of the non-effective electrode part below the electrode region is denoted as the lower gap amount of the product; Calculate the center value of each green capacitor based on the upper gap amount and the lower gap amount of the product; In each of the m rows in the measurement array, taking the average value of the center value of the first green capacitor and the center value of the last green capacitor as the base point, calculate the deformation amount of each green capacitor in this row except the first and the last green capacitors; 2. The method for measuring the deformation amount of the MLCC product before cutting according to claim 1, characterized in that, The step of measuring the width of the non-effective electrode part of each green capacitor in the measurement array includes the following steps: Take the row direction of each row in the measurement array as the horizontal axis and the total direction of each column as the vertical axis; Taking each horizontal axis as the rotation center, rotate each row in the measurement array 90 degrees in the same direction as the corresponding horizontal axis; then taking each vertical axis as the rotation center, rotate each column in the measurement array 90 degrees in the same direction as the corresponding vertical axis; so that the upward surface of the green capacitor is the cutting surface; Measure the width of the non-effective electrode part on the cutting surface of each capacitor; 3. A method for measuring the deformation amount of an MLCC product before cutting according to claim 2, characterized in that, In the step of calculating the center value of each green capacitor based on the upper gap amount and the lower gap amount of the product, the center value is calculated by the following formula: Center value of the green capacitor = (Upper gap amount of the product - Lower gap amount of the product) / 2; 4. A method for measuring the deformation amount of an MLCC product before cutting according to claim 3, characterized in that In each of the m rows in the measurement array, taking the average value of the center value of the first green capacitor and the center value of the last green capacitor as the base point, the deformation amount of the green capacitor in this row except the first and the last green capacitors is calculated by the following formula: Deformation amount of the x-th green capacitor = Center value of the x-th green capacitor - 0.5 * (Center value of the first green capacitor + Center value of the n-th green capacitor); Where x represents the position of the green capacitor to be measured in a certain row of the measurement array; 5. A method for measuring the deformation amount of an MLCC product before cutting according to claim 1, characterized in that After the deformation amount of each green capacitor in each row is measured, graphically represent the deformation amounts of all the green capacitors in the measurement array.

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