A method for measuring deformation of an MLCC pre-cut product

Abstract

The present application relates to the field of MLCC production, and particularly relates to a method for measuring deformation of MLCC product before cutting, which comprises the following steps: obtaining cut Ba blocks, forming a Ba block array, and the Ba block array is composed of M rows and N columns of capacitor green bodies; selecting m rows of capacitor green bodies in M rows in the Ba block array, forming a transition array of m rows and N columns, and then selecting n columns of capacitor green bodies in N columns in the transition array, forming a to-be-measured array of m rows and n columns; measuring the width of the non-effective electrode part of each capacitor green body in the to-be-measured array; calculating the center value of each capacitor green body; and calculating the deformation of each capacitor green body in each row of the m rows in the to-be-measured array. The method is more in line with the actual cutting condition, simulates the deformation of the product during cutting, and can intuitively reflect the product characteristics and data.

Description

Technical Field

[0001] This invention relates to the field of MLCC production, and more particularly to a method for measuring the deformation of MLCC products before cutting. Background Technology

[0002] As MLCCs become smaller and their capacitance increases, product design margins become smaller, resulting in smaller lateral gap margins and increasingly stringent requirements for the cutting process. Pre-cutting deformation of MLCCs leads to low cutting yields, making the determination of deformation crucial. Currently, the conventional method is to indirectly reflect product deformation by statistically analyzing the gap defect rate within the overall cutting defect rate. Here, gap refers to the non-effective electrode portion of the multilayer ceramic capacitor; gap amount refers to the length of the non-effective electrode portion after cutting, typically measured in micrometers (µm); small gap defects are products with a gap amount less than the specified value; and the small gap defect rate equals small gap defects / total number of cut products * 100%. However, using the small gap defect rate to determine product deformation does not directly determine whether deformation is the cause of the defect. Factors influencing the small gap defect rate include not only product deformation but also operator adjustments to the cutting equipment, defect judgment methods, and the cutting blade's hardness, which affects the perpendicularity of the cut from the top to the bottom. Essentially, it's using the result of multiple influencing factors to infer one of the influencing factors. Inferring causes from results is not conducive to assessing the deformation of the product itself. Therefore, how to directly measure the deformation of a product, intuitively reflecting its characteristics, and quantify the data to facilitate quantitative analysis and evaluation by technicians is an urgent problem to be solved. Summary of the Invention

[0003] In view of this, the purpose of this invention is to provide a method for measuring the deformation of MLCC products before cutting, so as to solve the above-mentioned technical problems.

[0004] To achieve the above objectives, the present invention provides a method for measuring the deformation of MLCC products before cutting, the method comprising the following steps:

[0005] Obtain the cut blocks to form a block array, the block array being composed of M rows and N columns of capacitor blanks;

[0006] In the block array, select m rows of capacitor blanks from M rows to form a transition array of m rows and N columns. Then, select n columns of capacitor blanks from the transition array of N columns to form a test array of m rows and n columns.

[0007] The width of the non-effective electrode portion of each capacitor blank in the array under test is measured and recorded as the gap amount of the product. The gap amount of the product includes the width of the non-effective electrode portion above the electrode area and the width of the non-effective electrode portion below the electrode area. The width of the non-effective electrode portion above the electrode area is recorded as the upper gap amount of the product, and the width of the non-effective electrode portion below the electrode area is recorded as the lower gap amount of the product.

[0008] The center value of each capacitor blank is calculated from the upper gap and lower gap of the product.

[0009] In each of the m rows of the array under test, using the average of the center values ​​of the first and last capacitor blanks as the base point, calculate the values ​​of the first and last capacitor blanks in that row.

[0010] Furthermore, measuring the width of the non-effective electrode portion of each capacitor blank in the array under test includes the following steps:

[0011] The row direction of each row in the array under test is taken as the horizontal axis, and the total direction of each column is taken as the vertical axis;

[0012] Using each horizontal axis as the center of rotation, each row in the array under test is rotated 90 degrees in the same direction as the corresponding horizontal axis; then using each vertical axis as the center of rotation, each column in the array under test is rotated 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the capacitor blank facing upwards is the cutting surface.

[0013] Measure the width of the non-effective electrode portion on the cut surface of each capacitor.

[0014] Furthermore, in calculating the center value of each capacitor blank from the upper gap amount and the lower gap amount of the product, the center value is calculated using the following formula:

[0015] The center value of the capacitor blank = (the upper gap of the product - the lower gap of the product) / 2.

[0016] Furthermore, in each of the m rows of the array under test, using the average of the center values ​​of the first and last capacitor blanks as the base point, the deformation of the capacitor blanks in that row, excluding the first and last capacitor blanks, is calculated using the following formula:

[0017] The deformation of the xth capacitor blank = the center value of the xth capacitor blank - 0.5 * (the center value of the 1st capacitor blank + the center value of the nth capacitor blank);

[0018] Where x represents the position of the green capacitor blank to be measured in a certain row of the array to be tested.

[0019] Furthermore, after measuring the deformation of each capacitor blank in each row, the deformation of all capacitor blanks in the array under test is graphically represented.

[0020] The beneficial effects of this invention are as follows: By adopting the method for measuring the deformation of MLCC products before cutting, after the blocks are cut, a portion of them is selected to measure the deformation of the product in a simple and effective way, which is more in line with the actual cutting conditions and simulates the deformation of the product during cutting. This method can intuitively reflect the product characteristics and quantify the data, making it convenient for technicians to perform quantitative analysis and evaluation of the product. Attached Figure Description

[0021] Figure 1 This refers to the cut block in this invention;

[0022] Figure 2 The selected block array;

[0023] Figure 3 Gap measurement plots for each capacitor blank;

[0024] Figure 4 The shape of the cut block;

[0025] Figure 5 The product center value of this invention is one;

[0026] Figure 6 The deformation amount of this invention is one;

[0027] Figure 7 Table 1 shows the addition of fixed values ​​to the deformation amount of the present invention;

[0028] Figure 8 This is a visual graphic of the present invention;

[0029] Figure 9 The product center value of this invention is two;

[0030] Figure 10 This is the second deformation amount of the present invention;

[0031] Figure 11 Table 2 shows the deformation amount of the present invention plus a fixed value;

[0032] Figure 12 This is the second visual graphic of the present invention. Detailed Implementation

[0033] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to specific embodiments.

[0034] It should be noted that, unless otherwise defined, the technical or scientific terms used in this invention should have the ordinary meaning understood by one of ordinary skill in the art to which this invention pertains. The terms "first," "second," and similar terms used in this invention do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are used only to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0035] Example 1:

[0036] A method for measuring the deformation of MLCC products before cutting is proposed. The method includes the following steps:

[0037] The measurement method includes the following steps:

[0038] Obtain the cut blocks to form a block array, which consists of M rows and N columns of capacitor blanks;

[0039] Select m rows of capacitor blanks from M rows in the block array to form an m-row N-column transition array. Then select n columns of capacitor blanks from N columns in the transition array to form an m-row n-column test array.

[0040] The width of the non-effective electrode portion of each capacitor blank in the array under test is measured and recorded as the product gap amount. The product gap amount includes the width of the non-effective electrode portion above the electrode area and the width of the non-effective electrode portion below the electrode area. The width of the non-effective electrode portion above the electrode area is recorded as the upper gap amount of the product, and the width of the non-effective electrode portion below the electrode area is recorded as the lower gap amount of the product.

[0041] Calculate the center value of each capacitor blank based on the upper gap and lower gap of the product;

[0042] In each of the m rows of the array under test, using the average of the center values ​​of the first and last capacitor blanks as the base point, calculate the values ​​of the first and last capacitor blanks in that row.

[0043] Here, measuring the width of the non-effective electrode portion of each capacitor blank in the array under test includes the following steps:

[0044] The row direction of each row in the array under test is taken as the horizontal axis, and the total direction of each column is taken as the vertical axis;

[0045] Using each horizontal axis as the center of rotation, each row in the array under test is rotated 90 degrees in the same direction as the corresponding horizontal axis; then using each vertical axis as the center of rotation, each column in the array under test is rotated 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the capacitor blank facing upwards is the cutting surface.

[0046] Measure the width of the non-effective electrode portion on the cut surface of each capacitor.

[0047] The center value of each capacitor blank is calculated from the upper gap and lower gap of the product using the following formula:

[0048] The center value of the capacitor blank = (the upper gap of the product - the lower gap of the product) / 2.

[0049] In each of the m rows of the array under test, taking the average of the center values ​​of the first and last capacitor blanks as the base point, the deformation of the capacitor blanks in that row, excluding the first and last capacitor blanks, is calculated using the following formula:

[0050] The deformation of the xth capacitor blank = the center value of the xth capacitor blank - 0.5 * (the center value of the 1st capacitor blank + the center value of the nth capacitor blank);

[0051] Where x represents the position of the green capacitor blank to be measured in a certain row of the array to be tested.

[0052] After measuring the deformation of each capacitor blank in each row, the deformation of all capacitor blanks in the array under test is graphically represented.

[0053] After the block is cut, a portion is selected and the deformation of the product is measured in a simple and effective way to better reflect the actual cutting situation. This simulates the deformation of the product during cutting, which can intuitively reflect the product characteristics and is quantified, making it easier for technicians to conduct quantitative analysis and evaluation of the product.

[0054] Example 2:

[0055] Taking the 0603 / X5R / 106 product as an example, such as Figure 1 , Figure 2 , Figure 3 , Figure 4 As shown, a method for measuring the deformation of MLCC products before cutting is proposed. The method includes the following steps:

[0056] Obtain the cut blocks to form a block array, which consists of M rows and N columns of capacitor blanks;

[0057] Three rows of capacitor blanks are selected from the M rows in the block array to form a 3-row N-column transition array. Then, three columns of capacitor blanks are selected from the N columns in the transition array to form a 3-row 3-column test array.

[0058] The width of the ineffective electrode portion of each capacitor blank in the array under test is measured and denoted as the product gap. The product gap includes the width of the ineffective electrode portion above the electrode area and the width of the ineffective electrode portion below the electrode area. The width of the ineffective electrode portion above the electrode area is denoted as the upper gap, and the width of the ineffective electrode portion below the electrode area is denoted as the lower gap. Here, measuring the width of the ineffective electrode portion of each capacitor blank in the array under test includes the following steps:

[0059] The row direction of each row in the array under test is taken as the horizontal axis, and the total direction of each column is taken as the vertical axis;

[0060] Using each horizontal axis as the center of rotation, each row in the array under test is rotated 90 degrees in the same direction as the corresponding horizontal axis; then using each vertical axis as the center of rotation, each column in the array under test is rotated 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the capacitor blank facing upwards is the cutting surface.

[0061] Measure the width of the non-effective electrode portion on the cut surface of each capacitor.

[0062] Based on the above measurements, the gap amount is shown in the table below:

[0063]

[0064] Then, the center value of each capacitor blank is calculated based on the upper gap and lower gap of the product.

[0065] The center value of each capacitor blank is calculated from the upper gap and lower gap of the product using the following formula:

[0066] Center value of capacitor blank = (upper gap of product - lower gap of product) / 2;

[0067] After calculation, the central value is as follows: Figure 5 As shown.

[0068] Finally, in each of the m rows of the array under test, the deformation of each capacitor blank in that row is calculated using the average of the center values ​​of the first and last capacitor blanks as the base point.

[0069] In each of the m rows of the array under test, taking the average of the center values ​​of the first and last capacitor blanks as the base point, the deformation of the capacitor blanks in that row, excluding the first and last capacitor blanks, is calculated using the following formula:

[0070] The deformation of the xth capacitor blank = the center value of the xth capacitor blank - 0.5 * (the center value of the 1st capacitor blank + the center value of the nth capacitor blank);

[0071] Where x represents the position of the green capacitor blank to be measured in a certain row of the array to be tested.

[0072] After calculation, the deformation amount is as follows: Figure 6 As shown.

[0073] Ideally, after measuring the deformation of each capacitor blank in each row, the deformation of all capacitor blanks in the array under test should be graphically represented.

[0074] Specifically, taking the deformation values ​​of each capacitor blank in the bottom row as a benchmark, in adjacent rows, the deformation values ​​of each capacitor blank in the upper row are increased by a fixed value based on the deformation values ​​of each capacitor blank in the lower row. This fixed value must be greater than the maximum deformation value; here, the fixed value is set to 50, resulting in the following... Figure 7 The table shown.

[0075] Thus, we can obtain the following: Figure 8 The graphic shown achieves the purpose of visualization.

[0076] Example 3

[0077] Taking the 0603 / X5R / 5106 product as an example, a method for measuring the deformation of MLCC products before cutting is proposed. The method includes the following steps:

[0078] Obtain the cut blocks to form a block array, which consists of M rows and N columns of capacitor blanks;

[0079] Four rows of capacitor blanks are selected from the M rows in the block array to form a 4-row N-column transition array. Then, three columns of capacitor blanks are selected from the N columns in the transition array to form a 4-row 3-column test array.

[0080] The width of the ineffective electrode portion of each capacitor blank in the array under test is measured and denoted as the product gap. The product gap includes the width of the ineffective electrode portion above the electrode area and the width of the ineffective electrode portion below the electrode area. The width of the ineffective electrode portion above the electrode area is denoted as the upper gap, and the width of the ineffective electrode portion below the electrode area is denoted as the lower gap. Here, measuring the width of the ineffective electrode portion of each capacitor blank in the array under test includes the following steps:

[0081] The row direction of each row in the array under test is taken as the horizontal axis, and the total direction of each column is taken as the vertical axis;

[0082] Using each horizontal axis as the center of rotation, each row in the array under test is rotated 90 degrees in the same direction as the corresponding horizontal axis; then using each vertical axis as the center of rotation, each column in the array under test is rotated 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the capacitor blank facing upwards is the cutting surface.

[0083] Measure the width of the non-effective electrode portion on the cut surface of each capacitor.

[0084] Based on the above measurements, the gap amount is shown in the table below:

[0085] Up Gap

[0086] 86.5 92.5 106.8 100.2 110.5 82.1 78.8 93.5 95.6 102.3 75.6 60.2 69.8 80.3 80.6

[0087] Download Gap

[0088] 72.6 97.5 80.5 70.6 100.9 97.8 98.6 90.3 82.5 90.8 100.6 111.5 105.6 74.8 96.6

[0089] Then, the center value of each capacitor blank is calculated based on the upper gap and lower gap of the product.

[0090] The center value of each capacitor blank is calculated from the upper gap and lower gap of the product using the following formula:

[0091] Center value of capacitor blank = (upper gap of product - lower gap of product) / 2;

[0092] After calculation, the central value is as follows: Figure 9 As shown.

[0093] Finally, in each of the m rows of the array under test, the deformation of each capacitor blank in that row is calculated using the average of the center values ​​of the first and last capacitor blanks as the base point.

[0094] In each of the m rows of the array under test, using the average of the center values ​​of the first and last capacitor blanks as the base point, the deformation of the capacitor blanks in that row, excluding the first and last ones (since the first and last capacitor blanks are on the outermost edge of the row and are not cut, thus not deformed), is calculated using the following formula:

[0095] The deformation of the xth capacitor blank = the center value of the xth capacitor blank - 0.5 * (the center value of the 1st capacitor blank + the center value of the nth capacitor blank);

[0096] Where x represents the position of the green capacitor blank to be measured in a certain row of the array to be tested.

[0097] After calculation, the deformation amount is as follows: Figure 10 As shown.

[0098] Ideally, after measuring the deformation of each capacitor blank in each row, the deformation of all capacitor blanks in the array under test should be graphically represented.

[0099] Specifically, taking the deformation values ​​of each capacitor blank in the bottom row as a benchmark, in adjacent rows, the deformation values ​​of each capacitor blank in the upper row are increased by a fixed value based on the deformation values ​​of each capacitor blank in the lower row. This fixed value must be greater than the maximum deformation value; here, the fixed value is set to 50, resulting in the following... Figure 11 The table shown.

[0100] This results in the graphic shown below, achieving the purpose of visualization.

[0101] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of the invention (including the claims) is limited to these examples; within the framework of the invention, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in the details for the sake of brevity.

[0102] This invention is intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for measuring the deformation of MLCC products before cutting, characterized in that, The measurement method includes the following steps: Obtain the cut blocks to form a block array, the block array being composed of M rows and N columns of capacitor blanks; In the block array, select m rows of capacitor blanks from M rows to form a transition array of m rows and N columns. Then, select n columns of capacitor blanks from the transition array of N columns to form a test array of m rows and n columns. The width of the non-effective electrode portion of each capacitor blank in the array under test is measured and recorded as the gap amount of the product. The gap amount of the product includes the width of the non-effective electrode portion above the electrode area and the width of the non-effective electrode portion below the electrode area. The width of the non-effective electrode portion above the electrode area is recorded as the upper gap amount of the product, and the width of the non-effective electrode portion below the electrode area is recorded as the lower gap amount of the product. The center value of each capacitor blank is calculated from the upper gap and lower gap of the product. In each of the m rows of the array under test, using the average of the center values ​​of the first and last capacitor blanks as the base point, calculate the deformation of each capacitor blank in that row, excluding the first and last capacitor blanks. Measuring the width of the non-effective electrode portion of each capacitor blank in the array under test includes the following steps: The horizontal axis is the row direction of each row in the array under test, and the vertical axis is the total direction of each column. Using each horizontal axis as the center of rotation, each row in the array under test is rotated 90 degrees in the same direction as the corresponding horizontal axis; then using each vertical axis as the center of rotation, each column in the array under test is rotated 90 degrees in the same direction as the corresponding vertical axis; so that the surface of the capacitor blank facing upwards is the cutting surface. Measure the width of the non-effective electrode portion on the cut surface of each capacitor.

2. The method for measuring the deformation of an MLCC product before cutting according to claim 1, characterized in that, In the calculation of the center value of each capacitor blank based on the upper gap and lower gap of the product, the center value is calculated using the following formula: The center value of the capacitor blank = (the upper gap of the product - the lower gap of the product) / 2.

3. The method for measuring the deformation of an MLCC product before cutting according to claim 2, characterized in that, In each of the m rows of the array under test, taking the average of the center values ​​of the first and last capacitor blanks as the base point, the deformation of the capacitor blanks in that row, excluding the first and last capacitor blanks, is calculated using the following formula: The deformation of the xth capacitor blank = the center value of the xth capacitor blank - 0.5 * (the center value of the 1st capacitor blank + the center value of the nth capacitor blank); Where x represents the position of the capacitor blank to be measured in a certain row of the array under test.

4. The method for measuring the deformation of an MLCC product before cutting according to claim 1, characterized in that, After measuring the deformation of each capacitor blank in each row, the deformation of all capacitor blanks in the array under test is graphically represented.

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