Electrical test wire clamp mechanism with scratch-proof structure
By using ball conversion surface contact as point contact, scraper and rubber plate self-cleaning function, as well as guidance and extrusion mechanism in the electrical test wire clip, the scratching problem of electrical equipment by the electrical test wire clip structure is solved, achieving higher test safety and wire protection.
Patent Information
- Application Number
- CN202510603963.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-12
- Publication Date
- 2025-07-25
- Estimated Expiration
- 2045-05-12
AI Technical Summary
Early electrical test wire clamp structures are prone to scratch the electrical surface of the equipment when they come into contact with electrical equipment, resulting in test errors and equipment performance degradation.
An electrical test wire clamp mechanism with anti-scratch structure is designed, using ball conversion surface contact as point contact, combining the self-cleaning function of scraper and rubber plate, reducing friction and removing impurities, setting guide parts and extrusion mechanisms to standardize wire wiring, avoiding wire damage.
It effectively prevents scratches from test parts, reduces test errors, improves test safety and reliability, extends the service life of the conductor, and ensures the stability and safety of electrical connections.
Smart Images

Figure CN120369998A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of electrical testing, and specifically to an electrical test line clamp mechanism with an anti-scratch structure. Background Art
[0002] With the continuous development of the power industry, the application of electrical equipment is becoming increasingly widespread, and the requirements for the performance and safety of electrical equipment are also getting higher and higher. In order to ensure the reliable operation of electrical equipment, various electrical tests need to be carried out regularly, such as insulation resistance testing, withstand voltage testing, winding resistance measurement, etc. These tests require the use of specialized testing equipment and tools, and the electrical test line clamp mechanism is an important one of them, which is used to achieve a reliable connection between the testing equipment and the electrical equipment.
[0003] The structure of the early electrical test line clamp was relatively simple. Usually, the electrical connection was achieved by using the end clamping part to contact the equipment. In order to ensure good contact, the clamping part was mostly designed to be serrated, which was easy to scratch the conductive surface of the testing equipment when accessing the conductor surface of the testing electrical equipment. Summary of the Invention
[0004] To achieve the above objectives, the present invention is realized through the following technical solutions: an electrical test line clamp mechanism with an anti-scratch structure, comprising: A connection end, on the side of which a guiding component is fixedly connected, and a connecting wire is installed inside the guiding component; A clamping component, which is used for clamping the detection component. The clamping component is arranged on both sides of the connection end, and the inner side of the clamping component is rotatably connected to the side of the connection end. A spring rod is fixedly connected between the two clamping components; The clamping component includes a line clamp. The inner side of the line clamp is rotatably connected to the side of the connection end. Both sides of the two line clamps are fixedly connected to the two ends of the spring rod. Installation grooves are evenly opened on the inner side of the line clamp, a sliding groove is opened on the side of the line clamp, and moving grooves are evenly opened on the side of the sliding groove away from the installation groove. A connection mechanism is slidably connected inside the installation groove; By pressing the line clamps on both sides of the connection end and simultaneously squeezing the spring rod, the testing component is clamped by the line clamps. When the line clamps clamp the testing component, the connection mechanism is subjected to a squeezing force and moves in the sliding groove and the moving groove on the line clamp; Preferably, the connecting mechanism includes a connecting shaft. One end of the connecting shaft is slidably connected to the inner side of the installation groove. A first spring is sleeved on the connecting shaft. One end of the first spring is fixedly connected to the side surface of the connecting block, and the other end of the first spring is fixedly connected to the inner wall of the installation groove. The other end of the connecting shaft is fixedly connected to a connecting block. Rotating wheels are rotatably connected to both sides of the connecting block. Ball bearings are rollingly connected to the inner sides of the rotating wheels. A contact assembly is fixedly connected to the inner side of the connecting block; Preferably, when the wire clamp makes compressive contact with the test component, the connecting block will drive the rotating wheel to abut against the test component. The ball bearings evenly arranged on the side surface of the rotating wheel play a key role. They convert the original surface contact into point contact, reducing the friction between the test component and the sliding groove inside the wire clamp. During the process of the test component abutting against the sliding groove, the ball bearings can roll flexibly, avoiding hard friction between the two, thus effectively preventing scratches on the side surface of the test component, ensuring the integrity of the test component, reducing test errors or equipment performance degradation caused by surface damage, and improving the safety and reliability of the test process; Preferably, the contact assembly includes a contact block. The side surface of the contact block is fixedly connected to the inner side of the connecting block. A contact shaft is slidably connected to the side surface of the contact block. The other end of the contact shaft is fixedly connected to a contact plate. A scraper is fixedly connected to one side of the contact plate. A rubber plate is fixedly connected to the side of the contact plate away from the scraper. A second spring is sleeved on the contact shaft. One end of the second spring is fixedly connected to the side surface of the contact block, and the other end of the second spring is fixedly connected to the side surface of the contact plate; Preferably, when pressing the wire clamps on both sides of the connection end, the wire clamps exert a squeezing effect on the spring rod, causing the wire clamps to disengage from the detection component. At the same time, under the driving of the reset elastic force of the first spring, the connecting block generates a displacement in the moving groove and synchronously moves towards the sliding groove. The connecting block drives the contact plate, making the scraper and the rubber plate closely adhere to and slide along the inner walls of the moving groove and the sliding groove. Among them, due to its hard characteristics, the scraper can efficiently scrape off stubborn impurities such as metal debris and dried stains attached to the groove wall; while the rubber plate, by virtue of its soft and elastic nature, further adsorbs dust and fills the tiny gaps that the scraper fails to reach; Preferably, the bending angle of the rubber plate is specifically designed to be greater than that of the scraper, so that the scraper and the rubber plate can form complementary coverage during the cleaning process. After the scraper completes the preliminary impurity scraping, the rubber plate, with a larger bending arc, penetrates into the corners and depressions that are difficult for the scraper to reach, achieving a full - range and dead - angle - free cleaning of the inner walls of the moving groove and the sliding groove, significantly improving the cleaning effect, ensuring the cleanliness inside the wire clamp, and reducing problems such as poor electrical contact and component jamming caused by impurity accumulation; Preferably, the guide component comprises an upper guide sleeve, the upper guide sleeve and the lower guide sleeve have the same shape, the top of the upper guide sleeve is fixedly connected with a guide tube, the inner side of the guide tube is in contact with the connecting wire, the top of the guide tube is fixedly connected with a connecting plate, the side of the connecting plate away from the upper guide sleeve is fixedly connected with the inner side of the connecting end, the bottom of the upper guide sleeve is fixedly connected with a telescopic rod, the bottom of the telescopic rod is fixedly connected with the side of the lower guide sleeve, the upper sleeve of the telescopic rod is provided with a third spring, the top of the third spring is fixedly connected with the bottom of the upper guide sleeve, the bottom of the third spring is fixedly connected with the top of the lower guide sleeve, the other side of the bottom of the upper guide sleeve away from the telescopic rod is fixedly connected with an adjusting rod, the bottom of the adjusting rod is fixedly connected with the side of the lower guide sleeve, and the bottom of the telescopic rod is fixedly connected with a squeezing mechanism; Preferably, when installing the connecting wire, it is passed through the upper guide sleeve, the guide tube and the extrusion mechanism in sequence. The upper guide sleeve and the guide tube form a guide channel, which can regulate the routing direction of the connecting wire, keep it neat and orderly, and avoid the wire from being damaged due to arbitrary bending and winding. The extrusion mechanism can appropriately clamp the connecting wire, which ensures that the wire is stable without damaging the insulation layer. Preferably, the potential risks caused by the excessive length of the connecting wire harness when the wire clamp clamps the test component are effectively avoided; the excessively long wire harness is not only easy to get tangled during operation, but is also likely to be squeezed when clamping the test component, resulting in damage to the wire insulation layer or even wire core breakage, while the coordinated action of the upper guide sleeve, the guide tube and the squeezing mechanism ensures that the wire is always in a reasonable position and state, effectively preventing squeezing damage, ensuring the stability and safety of the electrical connection, reducing the probability of failure caused by wire problems during the test, reducing test interruptions and repeated operations, and extending the service life of the connecting wire; Preferably, the extrusion mechanism comprises a lower guide sleeve, the side surface of the lower guide sleeve is evenly provided with clearance grooves, and the inner side of the clearance groove is rotatably connected with a rotating shaft.
[0005] The present invention provides an electrical test wire clamp mechanism with an anti-scratch structure. It has the following beneficial effects: 1. The electrical test wire clamp mechanism with an anti-scratch structure is provided with a connecting mechanism. When the wire clamp is in squeeze contact with the test component, the connecting block will drive the rotating wheel to abut against the test component. The balls evenly arranged on the side of the rotating wheel play a key role. They convert the original surface contact into point contact, reducing the friction between the test component and the inner sliding groove of the wire clamp. In the process of the test component abutting against the sliding groove, the balls can roll flexibly to avoid hard friction between the two, thereby effectively preventing scratches on the side of the test component, ensuring the integrity of the test component, reducing test errors or equipment performance degradation caused by surface damage, and improving the safety and reliability of the test process.
[0006] 2. The electrical test wire clamp mechanism with an anti-scratch structure is provided with a contact component. When the wire clamps on both sides of the connection end are pressed, the wire clamps exert a squeezing effect on the spring rod, causing the wire clamps to disengage from the detection component. At the same time, under the driving of the reset elastic force of the first spring, the connecting block generates a displacement in the moving groove and moves synchronously towards the sliding groove direction. The connecting block drives the contact plate, making the scraping plate and the rubber plate closely adhere to and slide along the inner walls of the moving groove and the sliding groove. Among them, due to its hard characteristics, the scraping plate can efficiently scrape off stubborn impurities such as metal debris and dried stains attached to the groove wall; while the rubber plate, by virtue of its soft and elastic nature, further adsorbs dust and fills the tiny gaps that the scraping plate fails to reach.
[0007] 3. The electrical test wire clamp mechanism with an anti-scratch structure is provided with a guiding component. When installing and connecting the wire, it is passed through the upper guiding sleeve, the guiding tube, and the squeezing mechanism in sequence. The upper guiding sleeve and the guiding tube form a guiding channel, which can standardize the routing direction of the connecting wire, keep it neat and orderly, and avoid the internal wire core of the wire from being damaged due to random bending and winding. The squeezing mechanism can moderately clamp the connecting wire, ensuring the stability of the wire without damaging the insulation layer.
[0008] 4. The electrical test wire clamp mechanism with an anti-scratch structure is provided with a squeezing mechanism. The relief grooves opened on the sides of the lower guiding sleeve and the upper guiding sleeve and the built-in rotating shaft provide protection for the connecting wire. When the connecting wire moves inside the upper and lower guiding sleeves, the rotating shaft will form a rolling contact with the wire. This rolling friction, compared with the traditional sliding friction, greatly reduces the frictional force, effectively avoiding the frictional damage to the side of the connecting wire caused by excessive frictional force. This not only protects the insulation layer and the internal wire core of the wire, extends the service life of the wire, but also ensures the stability of the electrical connection, reduces the test failures caused by wire damage, and provides a reliable guarantee for the efficient and safe conduct of electrical tests. BRIEF DESCRIPTION OF THE DRAWINGS
[0009] Figure 1 is a schematic structural diagram of the electrical test wire clamp mechanism with an anti-scratch structure of the present invention; Figure 2 is an axonometric view of the present invention; Figure 3 is a schematic structural diagram of the connection end of the present invention; Figure 4 is a schematic structural diagram of the clamping component of the present invention; Figure 5 is a schematic structural diagram of the installation groove of the present invention; Figure 6 is a schematic structural diagram of the connection mechanism of the present invention; Figure 7Schematic structural diagram of the contact component of the present invention; Figure 8 Schematic structural diagram of the guiding component of the present invention; Figure 9 Schematic structural diagram of the upper guiding sleeve of the present invention; Figure 10 Schematic structural diagram of the extrusion mechanism of the present invention.
[0010] In the figure: 1. Connection end; 2. Clamping component; 21. Wire clamp; 22. Connection mechanism; 221. Connection shaft; 222. Connection block; 223. Runner; 224. Ball; 225. First spring; 226. Contact component; 2261. Contact block; 2262. Contact shaft; 2263. Second spring; 2264. Contact plate; 2265. Scraper; 2266. Rubber plate; 23. Moving groove; 24. Sliding groove; 25. Installation groove; 3. Guiding component; 31. Upper guiding sleeve; 32. Connection plate; 33. Extrusion mechanism; 331. Lower guiding sleeve; 332. Relief groove; 333. Rotating shaft; 34. Guiding tube; 35. Adjusting rod; 36. Telescopic rod; 37. Third spring; 4. Connecting wire; 5. Spring rod. Detailed implementation manners
[0011] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.
[0012] Please refer to Figures 1 - 4 , the present invention provides a technical solution: an electrical test wire clamp mechanism with an anti-scratching structure, including: Connection end 1, a guiding component 3 is fixedly connected to the side of the connection end 1, and a connecting wire 4 is installed inside the guiding component 3; Clamping component 2, which is used for clamping the detection component. The clamping component 2 is arranged on both sides of the connection end 1. The inner side of the clamping component 2 is rotatably connected to the side of the connection end 1, and a spring rod 5 is fixedly connected between the two clamping components 2; Please refer to Figures 1 - 5 , the clamping component 2 includes a wire clamp 21. The inner side of the wire clamp 21 is rotatably connected to the side of the connection end 1. Both sides of the two wire clamps 21 are fixedly connected to both ends of the spring rod 5. Installation grooves 25 are evenly opened on the inner side of the wire clamp 21. A sliding groove 24 is opened on the side of the wire clamp 21. Moving grooves 23 are evenly opened on one side of the sliding groove 24 away from the installation groove 25. A connection mechanism 22 is slidably connected inside the installation groove 25; By pressing the wire clips 21 on both sides of the connection end 1 and simultaneously squeezing the spring rod 5, the test component is clamped by the wire clips 21. When the wire clips 21 clamp the test component, the connection mechanism 22 is subjected to a squeezing force and moves in the sliding groove 24 and the moving groove 23 on the wire clip 21; Please refer to Figures 1 - 6 , the connection mechanism 22 includes a connection shaft 221. One end of the connection shaft 221 is slidably connected to the inner side of the installation groove 25. A first spring 225 is sleeved on the connection shaft 221. One end of the first spring 225 is fixedly connected to the side surface of the connection block 222, and the other end of the first spring 225 is fixedly connected to the inner wall of the installation groove 25. The other end of the connection shaft 221 is fixedly connected to a connection block 222. Rotating wheels 223 are rotatably connected to both sides of the connection block 222. Ball bearings 224 are rollingly connected to the inner sides of the rotating wheels 223. A contact component 226 is fixedly connected to the inner side of the connection block 222; When the wire clip 21 makes compressive contact with the test component, the connection block 222 will drive the rotating wheel 223 to abut against the test component. The ball bearings 224 uniformly arranged on the side surface of the rotating wheel 223 play a key role. They convert the original surface contact into point contact, reducing the friction between the test component and the inner sliding groove 24 of the wire clip 21. During the process of the test component abutting against the sliding groove 24, the ball bearings 224 can roll flexibly, avoiding hard friction between the two, thus effectively preventing scratches on the side surface of the test component, ensuring the integrity of the test component, reducing test errors or equipment performance degradation caused by surface damage, and improving the safety and reliability of the test process; At the same time, contact components 226 are arranged on both sides of the connection block 222. In the initial state, the contact components 226 are in a compressed state due to the squeezing force of the detection component on the connection block 222. When the wire clip 21 contacts and clamps the test component, the squeezing force of the detection component on the connection block 222 disappears, and it moves and resets in the sliding groove 24 and the moving groove 23. During the reset process, the contact components 226 can be in close contact with the inner sides of the sliding groove 24 and the moving groove 23, and clean impurities such as dust and metal chips attached to the inner wall of the groove by scraping, effectively avoiding the accumulation of impurities from affecting the normal use and electrical connection performance of the wire clip 21. This self-cleaning function not only reduces the manual maintenance cost, but also ensures the long-term stable operation of the wire clip 21, improving the service life and use efficiency of the wire clip 21; Please refer to Figures 1 - 7, the contact component 226 includes a contact block 2261. The side surface of the contact block 2261 is fixedly connected to the inner side of the connection block 222. A contact shaft 2262 is slidably connected to the side surface of the contact block 2261. The other end of the contact shaft 2262 is fixedly connected to a contact plate 2264. A scraping plate 2265 is fixedly connected to one side of the contact plate 2264. A rubber plate 2266 is fixedly connected to the side of the contact plate 2264 away from the scraping plate 2265. A second spring 2263 is sleeved on the contact shaft 2262. One end of the second spring 2263 is fixedly connected to the side surface of the contact block 2261, and the other end of the second spring 2263 is fixedly connected to the side surface of the contact plate 2264; When pressing the wire clamps 21 on both sides of the connection end 1, the wire clamps 21 exert an extrusion effect on the spring rod 5, prompting the wire clamps 21 to disengage from the detection component. At the same time, under the driving of the reset elastic force of the first spring 225, the connection block 222 generates a displacement in the moving groove 23 and moves synchronously towards the sliding groove 24. The connection block 222 drives the contact plate 2264, causing the scraping plate 2265 and the rubber plate 2266 to closely adhere to and slide along the inner walls of the moving groove 23 and the sliding groove 24. Among them, due to its hard characteristics, the scraping plate 2265 can efficiently scrape stubborn impurities such as metal debris and dried stains attached to the groove wall; while the rubber plate 2266 utilizes its own soft and elastic characteristics to further adsorb dust and fill the tiny gaps that the scraping plate 2265 fails to reach; The bending angle of the rubber plate 2266 is deliberately designed to be greater than that of the scraping plate 2265, so that the scraping plate 2265 and the rubber plate 2266 can form complementary coverage during the cleaning process. After the scraping plate 2265 completes the preliminary impurity scraping, the rubber plate 2266, with a larger bending arc, penetrates into the corners and depressions that the scraping plate 2265 is difficult to reach, realizing a full - range and dead - angle - free cleaning of the inner walls of the moving groove 23 and the sliding groove 24, significantly improving the cleaning effect, ensuring the cleanliness inside the wire clamp, and reducing problems such as poor electrical contact and component jamming caused by impurity accumulation; When the extrusion force generated by the scraping plate 2265 against the groove wall during the cleaning process exceeds the tensile force of the second spring 2263, the second spring 2263 will undergo compressive deformation, and then pull the contact plate 2264 to move towards the inner side of the connection block 222, which can automatically adjust the extrusion force of the scraping plate 2265, avoid scratching and damaging the groove wall due to long - term excessive extrusion force, effectively extend the service life of the internal structure of the wire clamp, and ensure that the wire clamp can still maintain good performance and stability after multiple uses.
[0013] Please refer to Figures 1 - 9, the present invention provides a technical solution: The guiding component 3 includes an upper guiding sleeve 31. The upper guiding sleeve 31 has the same shape as the lower guiding sleeve 331. A guiding tube 34 is fixedly connected to the top of the upper guiding sleeve 31. The inner side of the guiding tube 34 is in contact with the connecting wire 4. A connecting plate 32 is fixedly connected to the top of the guiding tube 34. One side of the connecting plate 32 away from the upper guiding sleeve 31 is fixedly connected to the inner side of the connecting end 1. A telescopic rod 36 is fixedly connected to the bottom of the upper guiding sleeve 31. The bottom of the telescopic rod 36 is fixedly connected to the side of the lower guiding sleeve 331. A third spring 37 is sleeved on the telescopic rod 36. The top of the third spring 37 is fixedly connected to the bottom of the upper guiding sleeve 31. The bottom of the third spring 37 is fixedly connected to the top of the lower guiding sleeve 331. A regulating rod 35 is fixedly connected to the other side of the bottom of the upper guiding sleeve 31 away from the telescopic rod 36. The bottom of the regulating rod 35 is fixedly connected to the side of the lower guiding sleeve 331. A squeezing mechanism 33 is fixedly connected to the bottom of the telescopic rod 36; When installing the connecting wire 4, it is passed through the upper guiding sleeve 31, the guiding tube 34 and the squeezing mechanism 33 in sequence. The upper guiding sleeve 31 and the guiding tube 34 form a guiding channel, which can standardize the routing direction of the connecting wire 4, keep it neat and orderly, and avoid the situation that the internal wire core is damaged due to random bending and winding of the wire. The squeezing mechanism 33 can moderately clamp the connecting wire 4, ensuring both the stability of the wire and no damage to the insulating layer; Effectively avoids the potential risks caused by the overly long connecting wire 4 harness when the wire clamp 21 clamps the test component; The overly long harness is not only prone to winding during operation, but may also be squeezed when clamping the test component, resulting in damage to the wire insulating layer or even fracture of the wire core. Through the coordinated action of the upper guiding sleeve 31, the guiding tube 34 and the squeezing mechanism 33, it ensures that the wire is always in a reasonable position and state, effectively prevents extrusion damage, guarantees the stability and safety of the electrical connection, reduces the failure probability caused by wire problems during the test, reduces the situation of test interruption and repeated operation, and can also extend the service life of the connecting wire 4; When installing the connecting wire 4, it is passed through the lower guiding sleeve 331, the upper guiding sleeve 31 and the guiding tube 34 in sequence. According to the actual length of the connecting wire 4, the lower guiding sleeve 331 can be flexibly pulled downward. The movement of the lower guiding sleeve 331 will drive the telescopic rod 36 and the third spring 37 to move downward synchronously, which can quickly adapt to wires of different lengths. At the same time, the regulating rod 35 limits and fixes the distance between the upper guiding sleeve 31 and the lower guiding sleeve 331. After determining the positions of the upper guiding sleeve 31 and the lower guiding sleeve 331, Push the adjustment rod 35. The adjustment rod 35 is usually designed with a buckle structure. The adjustment rod 35 is engaged with the card slot through the buckle. The locking mechanism of the buckle is used to fix the position of the upper and lower guide sleeves 331, ensuring that the distance between the upper and lower guide sleeves 331 is stable, so that the connecting wire 4 is kept in an ideal routing state, avoiding the influence of the clamping operation of the wire clamp 21 on the detection component due to the improper position of the wire; Ensure that the wires are routed within a reasonable space, avoid the excessively long or messy connecting wires 4 interfering with the clamping work of the wire clamp 21 on the detection component, prevent the inconvenience of operation or test errors caused by the winding and obstruction of the wires, and significantly improve the fluency and accuracy of the test operation; See also Figures 1 - 10 The extrusion mechanism 33 includes a lower guide sleeve 331, and the side of the lower guide sleeve 331 is evenly provided with a clearance groove 332, and the inner side of the clearance groove 332 is rotatably connected with a rotating shaft 333; The clearance grooves 332 opened on the sides of the lower guide sleeve 331 and the upper guide sleeve 31 and the built-in rotating shaft 333 provide protection for the connecting wire 4. When the connecting wire 4 moves inside the upper and lower guide sleeves 331, the rotating shaft 333 will form a rolling contact with the wire. Compared with traditional sliding friction, this rolling friction greatly reduces the friction force and effectively avoids friction damage to the side of the connecting wire 4 caused by excessive friction. This not only protects the insulation layer and the internal wire core of the wire and extends the service life of the wire, but also ensures the stability of the electrical connection, reduces test failures caused by damaged wires, and provides reliable guarantee for the efficient and safe implementation of electrical tests.
[0014] Specific workflow: According to the type of electrical test, the specifications and shape of the equipment under test, select the electrical test clamp 21 of the corresponding model and size; Connect the connecting wire 4 of the test instrument to the connecting terminal 1 of the wire clamp 21, ensuring a tight connection to prevent looseness during the test and resulting in poor contact; According to the test procedure, the corresponding test signal is applied to the device under test through the test instrument. The test signal is transmitted to the wire clamp 21 through the connecting wire 4, and then transmitted to the device under test by the wire clamp 21. During the process of applying the signal, the wire clamp 21 must maintain a stable electrical connection to ensure the accuracy and stability of signal transmission; During the test, the test instrument measures various electrical parameters of the device under test, and the wire clamp 21 transmits the electrical signal fed back by the device under test back to the test instrument, which analyzes and processes it, and displays and records the corresponding data; After the test is completed, first cut off the power supply of the test instrument, then loosen the clamping claws of the wire clamp 21, and remove the wire clamp 21 from the device under test. When removing the wire clamp 21, be careful to avoid the clamping claws scratching the surface of the device under test.
[0015] Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all embodiments. All other embodiments obtained by those of ordinary skill in the art and related fields based on the embodiments of the present invention without creative efforts shall fall within the scope of protection of the present invention. Structures, devices, and operation methods not specifically described and explained in the present invention shall be implemented by conventional means in the art unless otherwise specified and limited.
Claims
1. An electrical test wire clamp mechanism with an anti-scratch structure, characterized in that, Comprising: A connection end (1), a guiding component (3) is fixedly connected to the side of the connection end (1), and a connecting wire (4) is installed inside the guiding component (3); A clamping component (2) for clamping a detection component. The clamping component (2) is arranged on both sides of the connection end (1), the inner side of the clamping component (2) is rotatably connected to the side of the connection end (1), and a spring rod (5) is fixedly connected between the two clamping components (2); The clamping component (2) includes a wire clamp (21). The inner side of the wire clamp (21) is rotatably connected to the side of the connection end (1). Both sides of the wire clamp (21) are fixedly connected to the two ends of the spring rod (5). Installation grooves (25) are evenly formed inside the wire clamp (21). A sliding groove (24) is formed on the side of the wire clamp (21), and moving grooves (23) are evenly formed on one side of the sliding groove (24) away from the installation groove (25). A connection mechanism (22) is slidably connected inside the installation groove (25).
2. The electrical test line clamp mechanism with an anti-scratch structure according to claim 1, characterized in that: The connection mechanism (22) includes a connection shaft (221). One end of the connection shaft (221) is slidably connected to the inside of the installation groove (25). A first spring (225) is sleeved on the connection shaft (221). The other end of the connection shaft (221) is fixedly connected to a connection block (222). Rotating wheels (223) are rotatably connected to both sides of the connection block (222). A ball (224) is rollingly connected to the inside of the rotating wheel (223). A contact component (226) is fixedly connected to the inside of the connection block (222).
3. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 2, characterized in that: One end of the first spring (225) is fixedly connected to the side of the connection block (222), and the other end of the first spring (225) is fixedly connected to the inner wall of the installation groove (25).
4. The electrical test line clamp mechanism with an anti-scratch structure according to claim 2, characterized in that: The contact component (226) includes a contact block (2261). A contact shaft (2262) is slidably connected to the side of the contact block (2261). The other end of the contact shaft (2262) is fixedly connected to a contact plate (2264). A scraping plate (2265) is fixedly connected to one side of the contact plate (2264). A rubber plate (2266) is fixedly connected to the side of the contact plate (2264) away from the scraping plate (2265). A second spring (2263) is sleeved on the contact shaft (2262).
5. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 4, characterized in that: The side of the contact block (2261) is fixedly connected to the inside of the connection block (222). One end of the second spring (2263) is fixedly connected to the side of the contact block (2261), and the other end of the second spring (2263) is fixedly connected to the side of the contact plate (2264).
6. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 1, characterized in that: The guiding component (3) includes an upper guiding sleeve (31). A guiding tube (34) is fixedly connected to the top of the upper guiding sleeve (31). A connecting plate (32) is fixedly connected to the top of the guiding tube (34). A telescopic rod (36) is fixedly connected to the bottom of the upper guiding sleeve (31). A third spring (37) is sleeved on the telescopic rod (36). On the other side of the bottom of the upper guiding sleeve (31) away from the telescopic rod (36), an adjusting rod (35) is fixedly connected. The bottom of the telescopic rod (36) is fixedly connected to an extrusion mechanism (33).
7. The electrical test line clamp mechanism with an anti-scratch structure according to claim 6, characterized in that: The extrusion mechanism (33) includes a lower guiding sleeve (331). Yielding grooves (332) are evenly formed in the side surface of the lower guiding sleeve (331). A rotating shaft (333) is rotatably connected to the inner side of the yielding groove (332).
8. The electrical test wire clamp mechanism with an anti-scratch structure according to claim 7, wherein: The top of the third spring (37) is fixedly connected to the bottom of the upper guiding sleeve (31). The bottom of the third spring (37) is fixedly connected to the top of the lower guiding sleeve (331). One side of the connecting plate (32) away from the upper guiding sleeve (31) is fixedly connected to the inner side of the connecting end (1). The inner side of the guiding tube (34) is in contact with the connecting wire (4).
9. The electrical test line clamp mechanism with an anti-scratch structure according to claim 8, characterized in that: The upper guiding sleeve (31) and the lower guiding sleeve (331) have the same shape. The bottom of the telescopic rod (36) is fixedly connected to the side surface of the lower guiding sleeve (331). The bottom of the adjusting rod (35) is fixedly connected to the side surface of the lower guiding sleeve (331).
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