Production test performance management method of photovoltaic inverter and related product

Abstract

The invention relates to a production test performance management method of a photovoltaic inverter and a computer program product. The test method comprises the following steps: determining configuration information of a photovoltaic inverter of a test target; determining a device needing aging test in the photovoltaic inverter according to the configuration information as a target device; and obtaining the aging requirement of the test target. The aging test requirement of the test target is obtained, so that the aging test can be performed according to the aging requirement of the test target device when the aging test scheme is generated; and generating an aging test scheme according to the aging test requirements, and carrying out aging test on the photovoltaic inverter according to the aging test scheme. According to the method, the corresponding aging test scheme is generated according to the aging test requirements of the test target device, and the key detection object in the photovoltaic inverter can be subjected to the aging test, so that the aging test result is more accurate. And the performance management of the production test can be adjusted according to the result data of the aging test.

Description

Technical Field

[0001] The present invention relates to the field of electrical performance testing, and in particular to a production test performance management method in the production process of a photovoltaic inverter. Background Art

[0002] An intelligent factory is a modern production site integrating advanced technologies and innovative management models. Among them, the inverter intelligent factory aims to produce photovoltaic inverters efficiently and with high quality to meet the growing demand of the clean energy market. In terms of hardware facilities, the intelligent factory is equipped with automated production equipment, such as high-precision chip mounters, advanced welding robots, intelligent material flow systems, intelligent test systems, etc. The intelligent factory deploys an advanced digital manufacturing management platform, which comprehensively covers production planning, logistics scheduling, real-time production monitoring, product quality inspection, and finished product tracking. Intelligent product testing is also an important part of the intelligent factory.

[0003] As the core device in a solar photovoltaic power generation system, a photovoltaic inverter is used to convert the direct current generated by solar panels into alternating current so that it can be connected to the power grid or used by a load. Its performance and stability are directly related to the power generation efficiency and operation reliability of the entire photovoltaic power generation system. In the production process of a photovoltaic inverter, aging testing is a key link to ensure its quality and stability. The purpose of aging testing is to simulate various complex environments and working conditions that a photovoltaic inverter may encounter during actual operation, expose potential defects and faults in advance, and thus improve the reliability and stability of the product.

[0004] However, there are some deficiencies in the current aging testing methods for photovoltaic inverters. On the one hand, due to differences in configuration information, the devices that need to be aged tested inside different photovoltaic inverters are also different. Existing aging testing methods often lack sufficient consideration of the inverter configuration information and adopt a unified aging testing scheme, which may lead to insufficient aging testing of some devices and unable to effectively expose potential problems. On the other hand, even if aging testing schemes are developed for different devices, the comprehensive aging testing scheme for multiple devices to be tested is not scientific and reasonable enough. Existing aging testing does not fully consider the differences in aging conditions and aging durations of different devices, and there may be a situation where some devices are over-aged while some devices are under-aged, which not only wastes testing resources but also cannot guarantee the testing effect. Summary of the Invention

[0005] An object of the present invention is to overcome at least one defect in the prior art, and provide a production test performance management method, a computer program product, a computer-readable storage medium, and a computer device for a photovoltaic inverter.

[0006] A further object of the present invention is to generate an aging test plan for a photovoltaic inverter according to different configuration information and their respective aging test requirements.

[0007] Another further object of the present invention is to determine more accurate aging test conditions and aging test duration for aging the photovoltaic inverter according to the aging conditions and aging duration of the compensation test device, so as to reduce the energy consumption of the aging test while improving the aging test efficiency.

[0008] In particular, the present invention provides a production test performance management method for a photovoltaic inverter, including: determining the configuration information of the photovoltaic inverter with the test target; determining the devices in the photovoltaic inverter that need to be subjected to aging tests according to the configuration information as the test target devices; obtaining the aging test requirements of the test target devices; generating an aging test plan according to the aging test requirements, and aging the photovoltaic inverter according to the aging test plan; storing the result data of the aging test as the basis for production test performance management.

[0009] Optionally, there are multiple test target devices; and the step of obtaining the aging test requirements of the test target devices includes: determining the operating environment of the photovoltaic inverter according to the configuration information; obtaining one by one the aging test requirements of multiple devices corresponding to the operating environment, and the aging test requirements include: aging conditions and aging duration.

[0010] Optionally, the step of generating an aging test plan according to the aging test requirements includes: selecting the device with the most extreme aging conditions from multiple test target devices as the reference test device; generating a reference aging plan according to the aging test requirements of the reference test device.

[0011] Optionally, after the step of generating a reference aging plan according to the aging test requirements of the reference test device, it further includes: determining the device with the longest aging duration from the other test target devices except the reference test device as the compensation test device; determining the aging test requirements of the compensation test device; correcting the aging duration of the reference aging plan to the equivalent aging duration under the aging conditions of the reference test device; comparing the aging duration of the compensation test device and the equivalent aging duration; in the case where the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, taking the reference aging plan as the aging test plan.

[0012] Optionally, in the case where the equivalent aging duration is less than the aging duration of the compensation test device, it further includes: generating a compensation aging plan according to the aging test requirements of the compensation test device; integrating the reference aging plan and the compensation aging plan to obtain an aging test plan.

[0013] Optionally, the step of integrating the reference aging scheme and the compensation aging scheme includes: taking the compensation aging scheme as the front section of the aging test scheme; and taking the reference aging scheme as the rear section of the aging test scheme, so that when the aging test scheme is executed, after the compensation aging scheme is executed, the reference aging scheme is executed.

[0014] Optionally, the step of integrating the reference aging scheme and the compensation aging scheme includes: splitting the compensation aging scheme into an initial aging sub-scheme and an end aging sub-scheme, and executing them respectively before and after the execution of the reference aging scheme, so that when the aging test scheme is executed, first the initial aging sub-scheme is executed, then the reference aging scheme is executed, and finally the end aging sub-scheme is executed.

[0015] Optionally, the step of generating the compensation aging scheme according to the aging test requirements of the compensation test device includes: taking the aging conditions of the compensation test device as the aging conditions of the compensation aging scheme; and subtracting the equivalent aging duration from the aging duration of the compensation test device to obtain the aging duration of the compensation aging scheme.

[0016] Optionally, the step of selecting the device with the most extreme aging conditions from multiple test target devices includes: obtaining the aging conditions of the test target devices one by one, and the aging conditions include: aging temperature, aging humidity, and aging load state; and obtaining the device with the most extreme aging conditions by comparing the aging conditions.

[0017] Optionally, the step of determining the configuration information of the photovoltaic inverter to be tested includes: determining the device information of the photovoltaic inverter and determining the device detection items of the photovoltaic inverter; the device information includes the device model, production batch, and serial number of the test target device; and the device detection items include high-temperature test, damp heat test, and high-altitude test.

[0018] According to another aspect of the present invention, there is also provided a computer program product, and when the computer program is executed by a processor, it implements the steps of the production test performance management method of the photovoltaic inverter according to any one of the above.

[0019] According to still another aspect of the present invention, there is also provided a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, it implements the steps of the production test performance management method of the photovoltaic inverter according to any one of the above.

[0020] According to yet another aspect of the present invention, there is also provided a computer device, including a memory, a processor, and a computer program stored on the memory, and the processor executes the computer program to implement the steps of the production test performance management method of the photovoltaic inverter according to any one of the above.

[0021] The production test performance management method for a photovoltaic inverter provided by the present invention first determines the configuration information of the photovoltaic inverter with the test target; determines the devices in the photovoltaic inverter that need to undergo aging tests according to the configuration information as the test target devices; obtains the aging test requirements of the test target devices; generates an aging test plan according to the aging test requirements, and conducts an aging test on the photovoltaic inverter according to the aging test plan. Finally, the result data of the aging test is stored as the basis for production test performance management. By obtaining the aging requirements of the devices that need to undergo aging tests and generating an aging test plan based on these requirements, the aging plan for the photovoltaic inverter is more targeted, making the results of the aging test more accurate, more in line with the automated production and strict detection processes of an intelligent factory, enabling the intelligent factory to achieve refined management, accurately control material consumption and production costs, and improve economic benefits. Moreover, by storing the result data of the aging test, it can be used as the basis for performance management during the production test process. The design scheme or control method of the photovoltaic inverter can be optimized based on the result data, and potential quality problems of the photovoltaic inverter can be accurately located.

[0022] Further, for the production test performance management method of the photovoltaic inverter of the present invention, the device with the most extreme aging conditions is selected from multiple test target devices as the reference test device; a reference aging plan is generated according to the aging test requirements of the reference test device. By this method, the photovoltaic inverter can be aged under the most stringent conditions, imitating the conditions of extreme working conditions, so as to accelerate the exposure of potential defects of the photovoltaic inverter.

[0023] Further, for the production test performance management method of the photovoltaic inverter of the present invention, the differences in test requirements between other test target devices and the reference test device are also considered. It is evaluated whether the reference aging plan can meet the test requirements of other test target devices. If not, a compensation aging plan is further generated to further supplement the aging of other test target devices, achieving a comprehensive test of the photovoltaic inverter, further reducing the risk of early failure of the devices, and improving the reliability of the photovoltaic inverter.

[0024] Those skilled in the art will understand the above and other objects, advantages and features of the present invention more clearly according to the following detailed description of specific embodiments of the present invention in conjunction with the accompanying drawings. Description of the Drawings

[0025] Some specific embodiments of the present invention will be described in detail hereinafter with reference to the accompanying drawings in an exemplary and non-limiting manner. The same reference numerals in the drawings denote the same or similar components or parts. Those skilled in the art should understand that these drawings are not necessarily drawn to scale. In the drawings:

[0026] Figure 1It is a schematic flowchart of a production test performance management method for a photovoltaic inverter according to an embodiment of the present invention;

[0027] Figure 2 It is a schematic flowchart of generating an aging test plan in the production test performance management method for a photovoltaic inverter according to an embodiment of the present invention;

[0028] Figure 3 It is a schematic flowchart of generating an aging test plan in the production test performance management method for a photovoltaic inverter according to another embodiment of the present invention;

[0029] Figure 4 It is a schematic flowchart of a production test performance management method for a photovoltaic inverter according to another embodiment of the present invention;

[0030] Figure 5 It is a schematic diagram of a computer program product according to an embodiment of the present invention;

[0031] Figure 6 It is a schematic diagram of a computer-readable storage medium according to an embodiment of the present invention; and

[0032] Figure 7 It is a schematic diagram of a computer device according to an embodiment of the present invention. Detailed implementation manners

[0033] Those skilled in the art should understand that the embodiments described below are only a part of the embodiments of the present invention, rather than all the embodiments of the present invention. This part of the embodiments is intended to explain the technical principles of the present invention, rather than to limit the protection scope of the present invention. Based on the embodiments provided by the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts should still fall within the protection scope of the present invention.

[0034] It should be noted that the logic and / or steps represented in the flowchart or described in other ways herein can be considered as a definite sequence list of executable instructions for implementing logical functions, which can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or in combination with these instruction execution systems, apparatus, or devices.

[0035] The present invention provides a production test performance management method for a photovoltaic inverter, Figure 1 It is a schematic flowchart of a production test performance management method for a photovoltaic inverter according to an embodiment of the present invention, as Figure 1As shown, the production test performance management method of the photovoltaic inverter at least includes the following steps S101 to S105.

[0036] Step S101, determine the configuration information of the photovoltaic inverter whose test target is. Among them, the configuration information of the photovoltaic inverter includes the specifications, models, device information, operating environment of the photovoltaic inverter, and device detection items of the photovoltaic inverter. There are many types of photovoltaic inverters, mainly divided into centralized inverters, string inverters, micro-inverters, and decentralized inverters. Among them, the devices of each type of inverter are not completely the same. Correspondingly, the test requirements for each type of inverter are also different.

[0037] In the field of production testing of photovoltaic inverters, the test devices of photovoltaic inverters mainly include power devices, energy storage devices, and circuit boards and their connecting devices. Among them, power devices mainly include: IGBT (Insulated Gate Bipolar Transistor), MOSFET (Metal Oxide Semiconductor Field Effect Transistor), etc. Energy storage devices mainly include: capacitors, inductors and other devices. Circuit boards and their connecting devices mainly include solder joints, connectors, and integrated circuit devices such as processors of various devices on the circuit board.

[0038] Step S102, determine the devices that need to be aged in the photovoltaic inverter according to the configuration information as target devices. The target devices in the aging process of the photovoltaic inverter can accurately locate the objects that need to be key detected. In the aging process, devices with faster performance decline and higher potential failure risks are used as target devices for aging, so that the test method can more accurately identify the devices that need to be key tested. For example, the key test devices in the aging process of the photovoltaic inverter mainly include: IGBT, capacitors, and circuit boards. These key test devices are easy to identify early failure situations through aging tests, thus ensuring the reliability of the long-term use of the photovoltaic inverter. Among them, IGBT is the core power device of the inverter, controlling the conversion and transmission of electrical energy.

[0039] Step S103, obtain the aging requirements of the test target devices. Obtaining the aging test requirements of the test target devices can enable the generation of an aging test plan to conduct aging tests according to the aging requirements of the test target devices. The aging requirements of the test target devices are generally set according to the performance, failure types, functions and other characteristics of the test target. The aging requirements of different types of test target devices are also different.

[0040] Step S104: Generate an aging test plan according to the aging test requirements, and conduct an aging test on the PV inverter according to the aging test plan. The PV inverter can generate a corresponding aging test plan according to the aging test requirements of the target device to be tested. By conducting an aging test on the PV inverter according to the obtained aging test plan, the key detection objects in the PV inverter can be aged tested, making the results of the aging test more accurate. For example, devices with relatively fast performance degradation or high potential failure risks can be used as the target devices to be tested. When these devices can pass the aging test, it can be considered that all devices in the PV inverter can meet the requirements of the aging test. This makes the aging test more targeted and can effectively improve the efficiency and accuracy of the aging test.

[0041] Step S105: Store the result data of the aging test as the basis for production test performance management. By analyzing the result data of the aging test, production personnel can quickly understand the quality status of the PV inverter and optimize performance management according to the analysis results. Production test performance management combines production management with test activities, aiming to optimize test efficiency, ensure product quality, and reduce production risks through quantitative indicators. Production test performance management takes the result data of the aging test as one of the evaluation bases, such as determining the defect ratio found in the aging test and the effective rate of the test. If the defect ratio found in the aging test is less than the preset minimum threshold, it is necessary to evaluate whether all products in the same batch still need to continue with the aging test. If the evaluation result is that there is no need to continue with all tests, sampling tests can be adopted instead. If the defect ratio found in the aging test is greater than the preset maximum threshold, it is necessary to evaluate whether there are problems with the production quality or design scheme of products in the same batch, so as to conduct quality traceability.

[0042] For example, production managers can learn about the product qualification rate of PV inverters during a certain period through the aging test results of PV inverters, and optimize and improve the production design scheme of PV inverters or the steps of the aging test accordingly.

[0043] In some alternative embodiments, there can be multiple target devices to be tested, and the aging test requirements for each target device need to be obtained when acquiring the aging test requirements for the target devices to be tested. For example, during the aging process of a PV inverter, it is mainly necessary to conduct aging tests on the IGBT of the power device, the capacitor of the energy storage device, and other devices (such as the solder joints of the circuit board) in the PV inverter. In the step of obtaining the aging test requirements for the target devices to be tested in the above steps, it includes determining the operating environment of the PV inverter according to the configuration information and obtaining the test requirements of each device corresponding to the operating environment one by one. The most important parameters in these aging test requirements are the aging conditions and aging duration of each device under various environmental conditions. The aging conditions can include temperature, environmental humidity, output load, and other conditions.

[0044] In some other preferred embodiments, the step of generating an aging test plan according to the aging test requirements includes selecting the device with the most extreme aging conditions from a variety of test target devices as the reference test device. The inventor realizes that taking the device with the most extreme aging conditions as the reference can ensure that the test covers the harshest working conditions that all devices may face. And the most extreme aging conditions can be understood as the most demanding aging conditions among various aging conditions. For example, the most extreme aging conditions can be the condition with the highest test temperature, or the condition with the highest input voltage, or the condition with the largest output load. As long as the PV inverter can operate normally under such extreme conditions, then under other relatively mild conditions, other devices are more likely to work stably, thus ensuring the reliability of the entire product under various actual use scenarios. Further, determining a reference test device and formulating a unified test plan based on its aging conditions avoids the cumbersome process of setting test conditions for each device separately. This simplifies the test process and enables effective testing of multiple devices under a relatively unified and strict set of conditions, greatly improving the efficiency of the aging test. In addition, the inventor also realizes that if a unique test plan is formulated for each device, more test equipment, time, and labor costs need to be invested, which will affect the overall production efficiency. However, testing according to the aging conditions of the reference test device reduces unnecessary resource consumption and lowers the overall test cost while ensuring the test effect.

[0045] Generally speaking, there are various test target devices in the PV inverter. Figure 2 It is a schematic flowchart of generating an aging test plan in the production test performance management method of a PV inverter according to an embodiment of the present invention; in this process, the step of obtaining the aging test requirements of the test target device in step S103 above can further include:

[0046] Step S201, determining the operating environment of the PV inverter according to the configuration information. Different operating environments have different requirements for the PV inverter. For example, a humid and hot environment has higher temperature and humidity requirements for the PV inverter, while a dry and cold operating environment has relatively lower temperature and humidity requirements for the PV inverter. Therefore, the solution of this embodiment will also pre-configure different aging test requirements for different devices according to different operating environments. For example, appropriately increase the aging temperature of the test target device of the PV inverter to be installed in a high-temperature and high-humidity environment in the future. In the order of the smart factory, the configuration information of the PV inverter generally also includes the operating environment requirements. The corresponding aging test requirements can be matched from the pre-configured aging test requirements through the operating environment of the PV inverter.

[0047] Step S202, obtaining the aging test requirements of various devices corresponding to the operating environment one by one.

[0048] The step of generating the aging test plan according to the aging test requirements in the above step S104 may further include:

[0049] Step S203, select the device with the most extreme aging conditions from multiple test target devices as the reference test device.

[0050] Step S204, generate a reference aging plan according to the aging test requirements of the reference test device.

[0051] Step S205, use the reference aging plan as the aging test plan.

[0052] For example, the test target devices determined in the above steps include: IGBT, capacitor, circuit board. The aging test requirements configured for these test target devices in a certain operating environment are: the aging temperature of the capacitor is 50 °C and the aging duration is 24 h; the aging temperature of the circuit board is 65 °C and the aging duration is 12 h; the aging temperature of the IGBT is 100 °C and the aging duration is 6 h. Taking the temperature as the comparison condition for the aging condition, among the three devices, the aging test temperature of the IGBT is the highest. Therefore, the IGBT is used as the device with the most extreme aging conditions. That is to say, the aging temperature of the generated reference aging plan is 100 °C and the aging duration is 6 h. The specific values in the above example are only for illustration. Those skilled in the art can configure the specific aging test requirements according to the specific specifications and models of the photovoltaic inverter, the operating environment, and the performance of the devices. Therefore, the above specific device types and the test parameters of their aging test requirements do not limit the solution of the present invention.

[0053] Among them, the step of obtaining the aging test requirements of the test target device may further include: when obtaining the aging test requirements of the test target device, it is necessary to obtain the aging test requirements of each test target device. In the step of obtaining the aging test requirements of the test target device in the above steps, it includes determining the operating environment of the photovoltaic inverter according to the configuration information and obtaining the test requirements of the device corresponding to the operating environment one by one. And the most important parameters in these aging test requirements are the aging conditions and aging duration of each device under various environmental conditions.

[0054] Based on the above steps, the step of generating the aging test plan according to the aging test requirements may further include: select the device with the most extreme aging conditions from multiple test target devices as the reference test device. And generate a reference aging plan according to the aging test requirements of the reference test device, and use the reference aging plan as the aging test plan. The device with the most extreme aging conditions can be understood as the most demanding aging condition among various aging conditions. For example, the most extreme aging condition can be the condition with the highest test temperature, or the condition with the highest test humidity, or the condition with the largest output load.

[0055] In addition, in some other embodiments, considering that the aging conditions and durations of different devices vary greatly, there may be a problem of incomplete aging when only using the benchmark aging scheme. For example, the aging test time of capacitors and pads may be significantly longer than that of IGBTs, which have the most stringent aging test requirements. If only IGBTs are used as the benchmark test devices to generate the benchmark aging scheme and conduct the aging test, it may result in insufficient aging duration for other devices. Therefore, the method of this embodiment can further optimize the aging scheme. Figure 3 FIG. Figure 3 is a schematic flowchart of generating an aging test scheme in the production test performance management method of a photovoltaic inverter according to another embodiment of the present invention; in this process, further steps S301 to S306 are included in generating the benchmark aging scheme:

[0056] Step S301: Determine the device with the longest aging duration among other test target devices except the benchmark test device as the compensation test device.

[0057] Step S302: Determine the aging test requirements of the compensation test device.

[0058] Step S303: Modify the aging duration of the benchmark aging scheme to the equivalent aging duration under the aging conditions of the compensation test device.

[0059] Step S304: Determine whether the equivalent aging duration is greater than or equal to the aging duration of the compensation test device.

[0060] Step S305: When the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, use the benchmark aging scheme as the aging test scheme.

[0061] Step S306: When the equivalent aging duration is less than the aging duration of the compensation test device, generate a compensation aging scheme according to the aging test requirements of the compensation test device, and integrate the benchmark aging scheme and the compensation aging scheme to obtain the aging test scheme.

[0062] Still taking the test conditions where the aging temperature of the capacitor is 50 °C and the aging duration is 24 h; the aging temperature of the circuit board is 65 °C and the aging duration is 12 h; the aging temperature of the IGBT is 100 °C and the aging duration is 6 h as an example. As can be seen from the foregoing, the IGBT is the benchmark test device, and among the remaining devices, the device with the longest aging duration is the capacitor, with an aging duration of 24 h. Then the capacitor can be determined as the compensation test device. Modify the aging duration of the IGBT to the equivalent aging duration under the aging conditions of 50 °C. If the equivalent aging duration is greater than or equal to 24 h, use the benchmark aging scheme as the aging test scheme, that is, use 100 °C and 6 h as the aging test scheme. If the equivalent aging duration is less than 24 h, it is necessary to integrate the benchmark aging scheme and the compensation aging scheme to obtain a new aging test scheme.

[0063] Find the device with the longest aging duration among other test target devices except the benchmark test device as the compensation test device, which can make the aging test more sufficient. For example, during the aging process of a photovoltaic inverter, the benchmark test device is determined to be an IGBT. Except for the IGBT, other main test target devices include capacitors and circuit boards. Find the device with the longest aging duration among them as the compensation test device. During the process of finding the device with the longest aging duration, the aging durations of the devices under the conditions of their respective operating environments can be directly compared, or the devices can be made to be under the same aging conditions for comparison.

[0064] Still taking the test conditions where the aging temperature of the capacitor is 50°C and the aging duration is 24 h; the aging temperature of the circuit board is 65°C and the aging duration is 12 h; the aging temperature of the IGBT is 100°C and the aging duration is 6 h as an example. The aging durations of the devices under the conditions of their respective operating environments can be directly compared, that is, using 24 h, 12 h, and 6 h for comparison; or the devices can be made to be under the same aging conditions for comparison. For example: first determine the aging temperature conversion coefficients of the devices, and then convert the aging durations of all devices into the aging durations under the same temperature condition through the temperature conversion coefficients for comparison. The conversion steps can include: obtaining the aging temperature conversion coefficient according to the formula {1 + (the aging temperature of the device itself - the aging temperature under the same aging condition) / the aging temperature under the same aging condition}, that is, if all devices are aged at a temperature of 50°C, the temperature conversion coefficient of the IGBT is {1 + (100°C - 50°C) / 50°C} = 2, and the temperature conversion coefficient of the circuit board is {1 + (65°C - 50°C) / 50°C} = 1.1. The converted duration is the product of the aging duration and the temperature conversion coefficient calculated above.

[0065] Another conversion step is to pre-configure the aging temperature conversion coefficients corresponding to each device in each temperature range to compare the aging durations of each device under the same temperature condition. A specific example of the configuration of the aging temperature conversion coefficients is shown in Table 1.

[0066] Table 1

[0067] 100℃ 65℃ 50℃ 100℃ 1 1.6 2 65℃ 0.6 1 1.2 50℃ 2.1 1.3 1

[0068] As can be seen from the table, the conversion coefficient of the aging temperature of 100°C corresponding to the aging temperature of 65°C is 1.6; the conversion coefficient of the aging temperature of 100°C corresponding to the aging temperature of 50°C is 2. The converted duration is the product of the aging duration and the temperature conversion coefficient calculated above. It should be noted that the specific values in the above examples are only for illustration, and those skilled in the art can configure the specific aging test requirements according to the specific specifications and models of the photovoltaic inverter, the operating environment, and the performance of the devices. Therefore, the test parameters of the above specific device types and their aging test requirements do not limit the solution of the present invention.

[0069] Thereby, the aging test requirements of the compensation test device are determined. Key consideration can be given to the device with the longest aging duration, avoiding product failures due to aging of such devices in actual use caused by neglecting the aging requirements of some special devices, thereby improving the pertinence of the test and making the test more in line with the actual application situation. The above life calculation formula can be set according to the proportional relationship of different aging temperatures.

[0070] Further, the aging duration of the reference aging plan is corrected to the equivalent aging duration under the aging conditions of the compensation test device, and it is judged whether the equivalent aging duration is greater than or equal to the aging duration of the compensation test device. When the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, the reference aging plan is used as the aging test plan.

[0071] For example: According to the previous example, first determine the aging temperature conversion coefficients of each device. The equivalent aging duration is the product of the aging duration of the reference aging plan and the corresponding aging temperature conversion coefficient. The method for determining the aging temperature conversion coefficient can be the same as the example of comparing each device under the same aging conditions in the above steps. For example, if the IGBT is used as the reference test device and the capacitor is used as the compensation test device, the aging temperature conversion coefficient of 100°C corresponding to 50°C is 2. Then, if the aging duration of the IGBT at 100°C is 6h, the calculated equivalent aging duration is 6h×2 = 12h.

[0072] It can be understood that when the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, the aging duration of the reference test device under the aging conditions corrected to the compensation test device is greater than or equal to the aging duration of the compensation test device. This is equivalent to the fact that the aging duration required for the reference test device in this case is longer. Using the reference aging plan as the aging test plan comprehensively considers the aging conditions and duration factors of different devices, making the test plan more scientific. It not only meets the aging requirements of different devices but also can be carried out under a unified test framework, ensuring that the test is comprehensive and reasonable.

[0073] In contrast, when the equivalent aging duration is less than the aging duration of the compensation test device, the inventors realized that more aging processes and aging time are required to fully discover potential problems that may exist during the aging process. When the equivalent aging duration is insufficient, generating a compensation aging plan and integrating it with the baseline aging plan can ensure that the device can undergo an aging test for a sufficient period of time, avoid missing potential hazards due to insufficient test duration, and guarantee the reliability of the entire photovoltaic inverter. By integrating the aging plans in combination with the characteristics of different devices, it is possible to flexibly adjust according to the aging requirements of different devices, making the test plan more scientific and reasonable. It not only meets the extreme condition tests of the baseline test device but also takes into account the duration requirements of the compensation test device, covering all factors that may affect product quality in the aging test.

[0074] Furthermore, by determining the relationship between the equivalent aging duration and the aging duration of the compensation test device, it is decided whether to adopt the baseline aging plan. If the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, the baseline aging plan is directly adopted without the need to formulate an additional complex integrated plan, reducing the complexity and resource consumption of the test, improving the test efficiency, and reducing the test cost. In the case where the equivalent aging duration is less than the aging duration of the compensation test device, a compensation aging plan is generated according to the aging test requirements of the compensation test device, and the baseline aging plan and the compensation aging plan are integrated to obtain an aging test plan. Through this integrated method, various key devices in the photovoltaic inverter can undergo appropriate and comprehensive aging tests, which helps to discover and solve potential problems during the production process, reduce the failure probability of the product during actual use, thereby improving the overall quality of the product and extending the service life of the product.

[0075] In some alternative embodiments, the step of integrating the baseline aging plan and the compensation aging plan includes: taking the compensation aging plan as the front section of the aging test plan; and taking the baseline aging plan as the rear section of the aging test plan. Thus, when executing the aging test plan, after the compensation aging plan is executed, the baseline aging plan is executed. That is, when it is necessary to integrate the baseline aging plan and the compensation aging plan to obtain an aging test plan in the case where the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, aging is first carried out with the compensation aging plan, and then aging is carried out with the baseline aging plan. By this method, key devices can be given priority to undergo sufficient tests under the most suitable aging conditions for themselves, meeting their own characteristic requirements. Then, by carrying out the baseline aging plan, the entire photovoltaic inverter can undergo aging under the most extreme aging conditions, comprehensively covering the characteristic requirements of different devices. Moreover, adopting this sequential execution plan can avoid the complex operations and resource conflicts brought about by the simultaneous execution of the two plans. Conducting the aging test sequentially, the equipment adjustment and parameter setting are relatively simple, which can effectively improve the test efficiency and reduce the test time and cost.

[0076] In some other alternative embodiments, the step of integrating the reference aging scheme and the compensation aging scheme further includes: splitting the compensation aging scheme into an initial aging sub-scheme and an end aging sub-scheme, and executing them before and after the execution of the reference aging scheme respectively. Thus, when executing the aging test scheme, first execute the initial aging sub-scheme, then execute the reference aging scheme, and finally execute the end aging sub-scheme.

[0077] Still taking the test conditions where the aging temperature of the capacitor is 50°C, the aging duration is 24h, the aging temperature of the circuit board is 65°C, the aging duration is 12h, and the aging temperature of the IGBT is 100°C, and the aging duration is 6h as an example. As mentioned above, if the equivalent aging duration is less than 24h, it is necessary to integrate the reference aging scheme and the compensation aging scheme to obtain a new aging test scheme. Assuming that the equivalent aging duration obtained by aging the IGBT at 50°C is 30h, and the aging duration of the compensation test device is 6h, then the initial aging sub-scheme and the end aging sub-scheme can be set to an aging duration of 3h and an aging temperature of 50°C respectively. That is, the entire aging process is to age at 50°C for 3h first, then age at 100°C for 6h, and finally age at 50°C for 3h.

[0078] This is because the inventors have recognized that generally, the aging conditions of the reference aging scheme are more stringent than those of the compensation aging scheme, specifically manifested as the aging temperature of the reference aging scheme being higher than that of the compensation aging scheme. Reasonably inserting the conditions of the reference aging scheme into the compensation aging scheme can maintain the aging temperature at a certain level before entering the reference aging conditions. After completing the reference aging scheme, the aging temperature can naturally cool down to match the temperature of the compensation aging scheme. This method can reduce the occupation time of the aging equipment and the energy consumption of aging, thereby reducing the test cost. In addition, this staged aging test can more comprehensively expose product problems, helping R & D personnel to timely discover weak links in product design, material selection or production process, and make improvements and optimizations. This can reduce the failure rate and recall risk during the actual use of the product, ensure the performance of the product throughout its life cycle, and improve user satisfaction.

[0079] Correspondingly, those skilled in the art should also be able to think of using humidity or a combination of temperature and humidity as the test parameter for selecting the most extreme aging conditions, and generating an aging test scheme according to the foregoing method.

[0080] In some other alternative embodiments, during the process of generating an aging test plan according to the aging test requirements of the compensation test device, the aging conditions of the compensation test device are used as the aging conditions of the compensation aging test plan, and the aging duration of the compensation aging test plan is obtained by subtracting the equivalent aging duration from the aging duration of the compensation test device. Among them, using the aging conditions of the compensation test device as the aging conditions of the compensation aging test plan can ensure that the test environment highly adapts to the actual needs of the compensation test device. This not only lays a stable and reliable foundation for subsequent tests, but more importantly, guarantees the accuracy and consistency of test data. A stable and compliant test environment can avoid test errors caused by environmental factors, enabling each test result to truly reflect the device performance, greatly improving the credibility and effectiveness of the test, and providing solid data support for product quality assessment. Further, obtaining the aging duration of the compensation aging test plan by subtracting the equivalent aging duration from the aging duration of the compensation test device is a comprehensive consideration of the influencing factors of the aging effect. This can accurately determine the most appropriate aging duration, avoiding insufficient aging of the device due to too short aging time, which affects the later use stability of the product; and preventing waste of resources and extension of the production cycle due to too long aging time. The accurate setting of the aging duration can effectively improve production efficiency, reduce production costs, and enhance the competitiveness of the product in the market while ensuring product quality. At the same time, a scientific and reasonable aging plan helps to reduce the defective product rate caused by aging problems, further ensuring the production quality and reliability of the product.

[0081] In some optional embodiments, the step of selecting the device with the most extreme aging condition from a plurality of test target devices includes obtaining the aging conditions of the test target devices one by one, and the aging conditions include aging temperature, aging humidity and aging load state. By comparing the aging conditions, the device with the most extreme aging condition is obtained. In the process of selecting the device with the most extreme aging condition from a plurality of test target devices, the step of obtaining the aging conditions of the test target device one by one (covering aging temperature, aging humidity and aging load state) and comparing them has many significant advantages. From the perspective of test efficiency, by focusing on the device with the most extreme aging condition, the test resources can be concentrated and the cumbersome process of comprehensive testing of all devices can be avoided, thereby greatly shortening the test cycle. For example, if a batch of electronic components containing different types are subjected to aging tests, it may take a very long time to comprehensively test the aging of each component; while first finding the component with the most extreme aging condition for key testing can quickly locate the key problem, and then conduct targeted evaluation of other components based on its test results, which greatly improves the overall test efficiency. In terms of ensuring product quality, the device with the most extreme aging condition often has the greatest impact on product quality and stability. By giving priority to testing such devices, potential risks and problems can be discovered in advance, providing key improvement directions for product design and production. For example, in the production of electronic products, if the aging temperature requirements of a chip are extremely high, once problems are found during testing under such extreme conditions, the chip's heat dissipation design or material selection can be optimized in a timely manner, thereby effectively improving the overall quality of the product and reducing the risk of product failure due to device aging problems. From a resource utilization perspective, accurately locating devices with the most extreme aging conditions can avoid excessive consumption of resources on testing ordinary devices. Concentrating limited human, material and time resources on testing key components can not only improve resource utilization efficiency, but also reduce testing costs. This can save a lot of unnecessary expenses in large-scale production and testing scenarios, allowing resources to be allocated more reasonably and efficiently.

[0082] In other optional embodiments, the step of determining the configuration information of the photovoltaic inverter of the test target includes determining the device information of the photovoltaic inverter and determining the device detection items of the photovoltaic inverter. Among them, the device information includes the device model, production batch and serial number of the test target device; the device detection items include high temperature test, damp heat test and high altitude test. Determining the configuration information of the photovoltaic inverter of the test target, that is, determining its device information and device detection items, has many important significances. In terms of ensuring product quality, clarifying the device model, production batch and serial number in the device information can accurately grasp the details of each component of the photovoltaic inverter. Different models of devices have different performance and parameters. Understanding these can ensure that the device matches the overall design of the inverter. Knowing the production batch and serial number makes it easy to track the source of device production. Once a quality problem occurs, the root cause of the problem can be quickly located, and the relevant batches of products can be recalled or improved in time. The device testing projects include high temperature testing, damp heat testing and high altitude testing, simulating a variety of extreme environments to test the inverter, which can detect potential quality risks in advance, such as whether the inverter will fail to overheat protection in a high temperature environment, whether there will be a short circuit risk in a damp heat environment, etc., thereby improving the stability and reliability of the product in different usage scenarios. From the perspective of improving detection efficiency, clear device information can help testers quickly obtain the required information, prepare corresponding testing tools and equipment, and reduce the preparation time before testing. For example, according to the device model, the corresponding testing standards and operating procedures can be quickly found. By determining the device testing projects in advance, a detailed testing plan can be formulated, the testing process can be reasonably arranged, and repeated testing or missing important testing links can be avoided, which greatly improves the testing efficiency and shortens the product launch cycle. In terms of facilitating quality traceability, complete device information and test project records provide a detailed basis for subsequent quality problem investigation. When a product fails on the market, the serial number and production batch can be used to find information such as the production process of the inverter and the source of the devices used. Combined with the test project results, it can accurately analyze whether the cause of the failure is a problem in the production link or an omission in the testing link, so as to take targeted improvement measures and improve the quality management level.

[0083] Figure 4 FIG. 1 is a flow chart of a method for managing production test performance of a photovoltaic inverter according to another embodiment of the present invention. Figure 4 As shown, the production test performance management method of the photovoltaic inverter includes at least the following steps S401 to S409.

[0084] Step S401, determining configuration information of a photovoltaic inverter of a test target.

[0085] Step S402: Determine, according to the configuration information, the device in the photovoltaic inverter that needs to be subjected to an aging test as the test target device.

[0086] Step S403: Determine the operating environment of the PV inverter according to the configuration information, and obtain the aging test requirements of various devices corresponding to the operating environment one by one.

[0087] Step S404: Select the device with the most extreme aging conditions from various test target devices as the reference test device.

[0088] Step S405: Determine the device with the longest aging duration from other test targets except the reference test device as the compensation test device.

[0089] Step S406: Determine the aging test requirements of the compensation test device, and correct the aging duration of the reference aging scheme to the equivalent aging duration under the aging conditions of the reference test device.

[0090] Step S407: Determine whether the equivalent aging duration is greater than or equal to the aging duration of the compensation test device.

[0091] If the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, execute Step S408 and use the reference aging scheme as the aging test scheme.

[0092] If the equivalent aging duration is less than the aging duration of the compensation test device, execute Step S409, generate an aging test scheme according to the aging test requirements of the compensation test device, and synthesize the reference aging scheme and the compensation aging scheme to obtain the aging test scheme.

[0093] The flowchart provided in this embodiment is not intended to indicate that the operations of the method will be executed in any specific order, or that all operations of the method are included in every case. In addition, the method may include additional operations. Within the scope of the technical concept provided by the method of this embodiment, additional changes can be made to the above method.

[0094] It should be understood that in some embodiments, each part can be implemented by hardware, software, firmware, or a combination thereof. In the above embodiment, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system.

[0095] This embodiment also provides a computer program product 10, a computer-readable storage medium 20, and a computer device 30. Figure 5 It is a schematic diagram of the computer program product 10 according to an embodiment of the present invention. Figure 6 It is a schematic diagram of the computer-readable storage medium 20 according to an embodiment of the present invention. Figure 7It is a schematic diagram of a computer device 30 according to an embodiment of the present invention. The computer program product 10 includes a computer program 11, and when the computer program 11 is executed by the processor 32, it implements the steps of any of the above photovoltaic inverter production test performance management methods. The computer-readable storage medium 20 stores the above computer program 11, and when the computer program 11 is executed by the processor 32, it implements the steps of any of the above photovoltaic inverter production test performance management methods. The computer device 30 may include a memory 31, a processor 32, and a computer program 11 stored on the memory 31 and running on the processor 32.

[0096] The computer program 11 for performing the operations of the present invention may be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-related instructions, microcode, firmware instructions, status setting data, configuration data of an integrated circuit, or source code or object code written in any combination of one or more programming languages and procedural programming languages. The computer program 11 may be executed entirely on the user's computer, partially on the user's computer, executed as a stand-alone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the latter case, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., using an Internet service provider via the Internet). In some embodiments, to perform aspects of the present invention, an electronic circuit, including for example a programmable logic circuit, a field-programmable gate array (FPGA), or a programmable logic array (PLA), may execute computer-readable program instructions by utilizing the status information of the computer-readable program instructions to personalize the electronic circuit.

[0097] For the purposes of the description of this embodiment, the computer program product 10 is a related product that includes the computer program 11. For the purposes of the description of this embodiment, the computer-readable storage medium 20 is a tangible device capable of retaining and storing the computer program 11, which can be any device that can contain, store, communicate, propagate, or transport the program 11 for use by or in connection with an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable storage medium 20 include the following: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), portable compact disc read-only memory (CD-ROM), digital versatile discs (DVDs), memory sticks, floppy disks, mechanically encoded devices, and any suitable combination of the foregoing.

[0098] The computer device 30 can be, for example, a server, a desktop computer, a laptop computer, a tablet computer, or a smartphone. In some examples, the computer device 30 can be a cloud computing node. The computer device 30 can be described in the general context of computer system-executable instructions, such as program modules, executed by a computer system. Generally, program modules can include routines, programs, object programs, components, logic, data structures, etc., that perform particular tasks or implement particular abstract data types. The computer device 30 can be implemented in a distributed cloud computing environment where tasks are performed by remote processing devices linked through a communication network. In a distributed cloud computing environment, program modules can be located on local or remote computing system storage media including storage devices.

[0099] The computer device 30 can include a processor 32 adapted to execute stored instructions and a memory 31 that provides temporary storage space for the operation of the instructions during operation. The processor 32 can be a single-core processor, a multi-core processor, a computing cluster, or any number of other configurations. The memory 31 can include random access memory (RAM), read-only memory, flash memory, or any other suitable storage system.

[0100] The computer device 30 can also include a network adapter / interface and an input / output (I / O) interface. The I / O interface allows data to be input and output with external devices that can be connected to the computer device. The network adapter / interface can provide communication between the computer device and a network, which is typically shown as a communication network.

[0101] At this point, those skilled in the art should recognize that although numerous exemplary embodiments of the present invention have been shown and described in detail herein, many other variations or modifications that conform to the principles of the present invention can still be directly determined or derived from the disclosed content of the present invention without departing from the spirit and scope of the present invention. Therefore, the scope of the present invention should be understood and recognized as covering all such other variations or modifications.

Claims

1. A production test performance management method for a photovoltaic inverter, characterized in that Including: Determine the configuration information of the PV inverter for the test objective; Determine the devices in the PV inverter that need to undergo aging tests according to the configuration information, and use them as test target devices; Obtain the aging test requirements of the test target devices; Generate an aging test plan according to the aging test requirements, and perform an aging test on the PV inverter according to the aging test plan; Store the result data of the aging test as a basis for production test performance management.

2. The production test performance management method according to claim 1, characterized in that There are multiple types of the test target devices; and The step of obtaining the aging test requirements of the test target devices includes: Determine the operating environment of the PV inverter according to the configuration information; Obtain the aging test requirements corresponding to the operating environment for each of the multiple devices one by one. The aging test requirements include aging conditions and aging duration.

3. The production test performance management method according to claim 2, characterized in that The step of generating an aging test plan according to the aging test requirements includes: Select the device with the most extreme aging conditions from the multiple test target devices as the reference test device; Generate a reference aging plan according to the aging test requirements of the reference test device.

4. The production test performance management method according to claim 3, characterized in that After the step of generating a reference aging plan according to the aging test requirements of the reference test device, it further includes: Determine the device with the longest aging duration from the other test target devices except the reference test device as the compensation test device; Determine the aging test requirements of the compensation test device; Modify the aging duration of the reference aging plan to the equivalent aging duration under the aging conditions of the compensation test device; Compare the aging duration of the compensation test device and the equivalent aging duration; In the case where the equivalent aging duration is greater than or equal to the aging duration of the compensation test device, use the reference aging plan as the aging test plan.

5. The production test performance management method according to claim 4, characterized in that, In the case where the equivalent aging duration is less than the aging duration of the compensation test device, it further includes: Generate a compensation aging plan according to the aging test requirements of the compensation test device; Integrate the reference aging plan and the compensation aging plan to obtain the aging test plan.

6. The production test performance management method according to claim 5, characterized in that The step of integrating the reference aging plan and the compensation aging plan includes: Use the compensation aging plan as the front section of the aging test plan; and use the reference aging plan as the rear section of the aging test plan, so that when the aging test plan is executed, after the compensation aging plan is executed, the reference aging plan is executed.

7. The production test performance management method according to claim 5, characterized in that The step of integrating the reference aging plan and the compensation aging plan includes: Split the compensation aging plan into an initial aging sub-plan and an end aging sub-plan, and execute them before and after the execution of the reference aging plan respectively, so that when the aging test plan is executed, first execute the initial aging sub-plan, then execute the reference aging plan, and finally execute the end aging sub-plan.

8. The production test performance management method according to claim 5, wherein The step of generating a compensation aging plan according to the aging test requirements of the compensation test device includes: Using the aging conditions of the compensation test device as the aging conditions of the compensation aging plan; Subtracting the equivalent aging duration from the aging duration of the compensation test device to obtain the aging duration of the compensation aging plan.

9. The production test performance management method according to claim 3, wherein The step of selecting the device with the most extreme aging conditions from multiple test target devices includes: Obtaining the aging conditions of the test target devices one by one, where the aging conditions include: aging temperature, aging humidity, and aging load state; By comparing the aging conditions, obtaining the device with the most extreme aging conditions.

10. The production test performance management method according to claim 1, characterized in that The step of determining the configuration information of the photovoltaic inverter as the test target includes: Determining the device information of the photovoltaic inverter and determining the device detection items of the photovoltaic inverter; The device information includes the device model, production batch, and serial number of the test target device; The device detection items include high-temperature test, damp heat test, and high-altitude test.

11. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the production test performance management method of the photovoltaic inverter according to any one of claims 1 to 10.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that When the computer program is executed by a processor, it implements the steps of the production test performance management method of the photovoltaic inverter according to any one of claims 1 to 10.

13. A computer device, comprising a memory, a processor, and a computer program stored on the memory, characterized in that, The processor executes the computer program to implement the steps of the production test performance management method of the photovoltaic inverter according to any one of claims 1 to 10.

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