Test method and device of integrated circuit, electronic equipment and storage medium

Abstract

The invention provides a test method and device of an integrated circuit, electronic equipment and a storage medium. The test method comprises the steps of obtaining work order information of the integrated circuit and hardware information for testing the integrated circuit; checking the work order information and the hardware information; under the condition that the work order information and the hardware information pass verification, determining a test program and test parameters of a tester based on the work order information and the hardware information; and controlling the tester to test the integrated circuit based on the test program and the test parameters, so that the integrated circuit can be automatically tested, and the risk of operation errors is reduced.

Description

Technical Field

[0001] This application belongs to the technical field of integrated circuit testing, and particularly relates to a testing method, device, electronic device, and storage medium for integrated circuits. Background Art

[0002] During the processing of integrated circuits (ICs), several testing procedures are generally carried out. To ensure quality, a wafer test (CP, Chip Probing) is usually performed before packaging. After packaging and before the finished products are shipped, a final test (FT, Final Test) is also required. In related technologies, when testing an IC through a tester, usually an operator opens the parameter setting interface, establishes a communication connection between the tester and the CP or FT device, sets the operating mode and product information, then finds the test program corresponding to the product and loads it onto the tester, and finally starts the test. It can be seen that in related technologies, there are a large number of actions to be performed and information to be entered during the entire testing process, all of which require professional personnel to operate. The educational background and operating experience requirements for production operators are very high, and it is extremely easy to make mistakes. Once a mistake is made, serious irreversible consequences such as chip damage will occur. Summary of the Invention

[0003] Embodiments of this application provide a testing method, device, electronic device, and storage medium for integrated circuits, which can automatically test integrated circuits and reduce the risk of operation errors.

[0004] In a first aspect, embodiments of this application provide a testing method for integrated circuits, including:

[0005] Obtain the work order information of the integrated circuit and the hardware information for testing the integrated circuit;

[0006] Verify the work order information and the hardware information;

[0007] When the work order information and the hardware information pass the verification, determine the test program and test parameters of the tester based on the work order information and the hardware information;

[0008] Control the tester to test the integrated circuit based on the test program and the test parameters.

[0009] In some embodiments, the determining the test program and test parameters of the tester based on the work order information and the hardware information includes:

[0010] Obtain the product information of the integrated circuit from the production system based on the work order information;

[0011] Determine the test program based on the product information and the hardware information;

[0012] Determine the test parameters based on at least the product information and the hardware information.

[0013] In some embodiments, the determining the test parameters based on at least the product information and the hardware information includes:

[0014] Determine the hardware compensation parameters based on the hardware information;

[0015] Determine the basic parameters based on the product information;

[0016] Compensate the basic parameters by applying the hardware compensation parameters to obtain the test parameters.

[0017] In some embodiments, the verifying the work order information and the hardware information includes:

[0018] Verify the work order status and process matching of the work order information based on the production system;

[0019] Verify the matching of the work order information and the hardware information. Wherein, when the work order status and process matching verification pass and the matching verification between the work order information and the hardware information passes, it is determined that the work order information and the hardware information verification pass.

[0020] In some embodiments, the method further includes:

[0021] Obtain the account information input by the user through the tester;

[0022] Verify the account information based on the human resources system;

[0023] When the account information verification passes, output a prompt message for prompting the user to enter the work order information and the hardware information.

[0024] In some embodiments, the controlling the tester to test the integrated circuit based on the test program and the test parameters includes:

[0025] Import the test program into the tester and load it, import the test parameters into the tester, and load them. When the test program and the test parameters are loaded, control the tester to test the integrated circuit.

[0026] In some embodiments, the method further includes:

[0027] Obtain the test data of the tester when testing the integrated circuit;

[0028] Determine whether there is an abnormality in the integrated circuit based on the test data;

[0029] When there is an abnormality in the integrated circuit, control the tester to stop.

[0030] In a second aspect, an embodiment of the present application provides a test device for an integrated circuit, including:

[0031] An acquisition module, configured to acquire work order information of the integrated circuit and hardware information for testing the integrated circuit;

[0032] A verification module, configured to verify the work order information and the hardware information;

[0033] A determination module, configured to determine a test program and test parameters of the tester based on the work order information and the hardware information when the work order information and the hardware information pass the verification;

[0034] A test module, configured to control the tester to test the integrated circuit based on the test program and the test parameters.

[0035] In a third aspect, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the method described in any one of the above is implemented.

[0036] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the method described in any one of the above is implemented.

[0037] In a fifth aspect, an embodiment of the present application provides a computer program product, which, when running on a terminal device, enables an electronic device to execute the method described in any one of the above.

[0038] The beneficial effects of the embodiments of the present application compared with the prior art are:

[0039] A test method for an integrated circuit provided by an embodiment of the present application can automatically test the integrated circuit and reduce the risk of operation errors by acquiring work order information of the integrated circuit and hardware information for testing the integrated circuit; verifying the work order information and the hardware information; determining a test program and test parameters of the tester based on the work order information and the hardware information when the work order information and the hardware information pass the verification; and controlling the tester to test the integrated circuit based on the test program and the test parameters. Description of the Drawings

[0040] To more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0041] Figure 1 Schematic diagram of the implementation process of a test method for an integrated circuit provided for the implementation of the present application;

[0042] Figure 2 Schematic diagram of the implementation process of a test method for an integrated circuit provided for the implementation of the present application;

[0043] Figure 3 Schematic diagram of the structure of a test device for an integrated circuit provided for the embodiments of the present application;

[0044] Figure 4 Schematic diagram of the structure of a control system provided for the embodiments of the present application;

[0045] Figure 5 Schematic diagram of the structure of an electronic device provided for the embodiments of the present application. Detailed implementation manners

[0046] In the following description, for the purpose of illustration rather than limitation, specific details such as specific system structures and technologies are presented to thoroughly understand the embodiments of the present application. However, those skilled in the art should clearly understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present application.

[0047] It should be understood that when used in the specification of the present application and the appended claims, the term "comprising" indicates the presence of the described features, wholes, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.

[0048] It should also be understood that the term " / and" as used in the specification of the present application and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0049] As used in the specification and claims of this application, the term "if" may be construed, depending on the context, as "when", "once", "in response to determining", or "in response to detecting". Similarly, the phrases "if determined" or "if detected" may be construed, depending on the context, to mean "once determined", "in response to determining", "once detected", or "in response to detecting".

[0050] In addition, in the description of the specification and claims of this application, the terms "first", "second", "third", etc. are used only for distinguishing descriptions and cannot be construed as indicating or implying relative importance.

[0051] Reference to "an embodiment" or "some embodiments" or the like described in the specification of this application means that a specific feature, structure, or characteristic described in connection with that embodiment is included in one or more embodiments of this application. Thus, statements such as "in an embodiment", "in some embodiments", "in other some embodiments", "in still other embodiments", etc. that appear in different places in this specification do not necessarily all refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in some other way.

[0052] Before introducing the embodiments of this application, a brief introduction to the related art is given.

[0053] An integrated circuit (IC) is a microelectronic device or component. Using a certain process, transistors, resistors, capacitors, inductors, and other electronic components required in a circuit are interconnected and fabricated on a small piece or several small pieces of semiconductor wafers or dielectric substrates, and then encapsulated in a plastic package to form a unit module with the required circuit functions. Since all the components in the integrated circuit have been integrated into a whole in terms of structure, the electronic components have made a great leap forward in the direction of miniaturization, low power consumption, intelligence, and high reliability, so it is widely used in the electronic field. In the process of integrated circuit production, it generally goes through several testing processes. To ensure quality, a wafer test (CP, Chip Probing) is usually carried out before encapsulation. After encapsulation and before the finished product is shipped, a final test (FT, Final Test) is also required. There are differences and similarities between CP and FT tests. The difference lies in the equipment used. Since CP is still in the bare wafer stage, it has higher requirements for the accuracy of the equipment's movement and the cleanliness of the workshop environment. When conducting FT tests, the encapsulation process has been completed, and the requirements for the cleanliness of the workshop environment are not as high. However, the common point of CP and FT tests is that the same integrated circuit tester can be used.

[0054] An integrated circuit tester is a dedicated instrument for testing integrated circuits and is one of the key means to ensure the performance and quality of integrated circuits. In related technologies, when testing through a tester, usually an operator opens the parameter setting interface, establishes a communication connection between the tester and a CP or FT device, sets the operating mode and product information, then finds the test program corresponding to the product and loads it onto the tester, and finally starts the test. It can be seen that in related technologies, there are a very large number of actions to be performed and information to be entered during the entire test process, all of which require professional personnel to operate. The educational background and operating experience requirements for production operators are very high, and it is extremely easy to make mistakes. Once a mistake occurs, it will cause irreversible serious consequences such as chip damage.

[0055] Based on the problems in related technologies, the embodiments of the present application provide a test method for an integrated circuit that can be applied to an electronic device. The electronic device may include: mobile phones, tablet computers, wearable devices, augmented reality (AR) / virtual reality (VR) devices, laptop computers, ultra-mobile personal computers (UMPCs), netbooks, personal digital assistants (PDAs), etc. In the embodiments of the present application, the electronic device may be a control center of a control system, a controller of a tester, etc. Figure 1 The following is a schematic flowchart of the implementation of a test method for an integrated circuit provided by the embodiments of the present application, as Figure 1 shown, the test method for an integrated circuit includes:

[0056] Step S101, obtain the work order information of the integrated circuit and the hardware information for testing the integrated circuit.

[0057] In the embodiments of the present application, the work order information refers to the detailed information about the integrated circuit test task. The work order information is an important basis during the test process to ensure that each task can be carried out according to the predetermined requirements. The hardware information refers to the detailed information of the hardware device used to test the integrated circuit, including the model, specifications, fixtures, etc. of the tester. The hardware information is the basis for ensuring that the tester can correctly and effectively test the integrated circuit.

[0058] In the embodiments of the present application, the work order information can be obtained by scanning the two-dimensional code on the work order through a scanning instrument, and the hardware information for testing the integrated circuit can be obtained by scanning the two-dimensional code on the hardware device.

[0059] Step S102, verify the work order information and the hardware information.

[0060] In the embodiments of the present application, verification refers to the process of verifying and checking the work order information and hardware information to ensure the accuracy and consistency of the information. Verification may include: work order status verification, process matching verification, and information matching verification. Work order status verification is to check whether the work order is in a valid state, such as whether it has been approved, whether it has been assigned, etc. Process matching verification is to verify whether the process information in the work order matches the current production process. Information matching verification: Check whether the work order information is consistent with the hardware information, such as whether the tester model conforms to the work order requirements. Verification is a key step to ensure the smooth progress of the test process and avoid test failures or misjudgments caused by incorrect information.

[0061] In the embodiments of the present application, the work order status can be checked through the production management system to ensure that the work order is in a valid state. When performing process matching verification, the process information in the work order can be verified against the current production process through the process database. Information matching verification is to ensure the consistency of the work order information and the hardware information by comparing them.

[0062] In the embodiments of the present application, by verifying the work order information and the hardware information, the accuracy and reliability of the test process are ensured, and test failures caused by incorrect information are avoided.

[0063] Step S103, when the verification of the work order information and the hardware information passes, determine the test program and test parameters of the tester based on the work order information and the hardware information.

[0064] In the embodiments of the present application, the test program refers to the specific steps and instruction set for the tester to execute the test task. The test program includes: test steps, test conditions, and test algorithms. The test steps include initialization, execution of test items, result recording, etc. The test conditions include: test voltage, test temperature, test time, etc. The test algorithms include: scan test, boundary test, functional test, etc. The test program is the basis for the tester to execute the test task and ensures that the test is carried out according to the predetermined steps and conditions. The test parameters refer to the specific values and settings required for the tester to execute the test task. The test parameters include: basic parameters, supplementary parameters, and environmental parameters, etc. The basic parameters can be test voltage, test frequency, test time, etc. The compensation parameter is the compensation value determined according to the hardware information and is used to correct the test parameters. The environmental parameters are environmental conditions such as test temperature and humidity. The test parameters are the key factors to ensure the accuracy and reliability of the test results.

[0065] In the embodiments of the present application, product information can be obtained from the production system based on work order information, and test items and steps can be determined. The specific implementation of the test program can be determined according to the model and configuration of the tester. Basic parameters such as test voltage and test frequency can be determined based on the product information. Compensation parameters such as hardware calibration values and environmental compensation values are determined based on the hardware information, and the basic parameters and compensation parameters are combined to obtain the final test parameters.

[0066] Step S104, control the tester to test the integrated circuit based on the test program and the test parameters.

[0067] In the embodiments of the present application, the test program can be imported into the tester and loaded, and the test parameters can be imported into the tester and loaded. When the test program and the test parameters are loaded, control the tester to test the integrated circuit.

[0068] The method provided by the embodiments of the present application obtains the work order information of the integrated circuit and the hardware information for testing the integrated circuit; verifies the work order information and the hardware information; when the work order information and the hardware information pass the verification, determines the test program and test parameters of the tester based on the work order information and the hardware information; controls the tester to test the integrated circuit based on the test program and the test parameters, and can automatically test the integrated circuit, reducing the risk of operation errors.

[0069] The method provided by the embodiments of the present application reduces manual intervention through an automated process, improving test efficiency. Through the matching verification of work order and hardware information, the reliability of the test process is ensured.

[0070] In some embodiments, step S103 can be implemented through the following steps:

[0071] Step S1031, obtain the product information of the integrated circuit from the production system based on the work order information.

[0072] In the embodiments of the present application, product information refers to the detailed specification parameters of the integrated circuit, including model, function, electrical characteristics, package form, etc. The product information of the integrated circuit corresponding to the work order can be queried through the API interface provided by the manufacturing execution system (MES) or the enterprise resource planning system (ERP). In some embodiments, the product specification parameters associated with the work order can be read from the production database.

[0073] Step S1032, determine the test program based on the product information and the hardware information.

[0074] In the embodiments of the present application, the product information may include the product model. According to the product model, the corresponding test program template is selected from the test program library. According to the hardware information of the tester (such as interface type, measurement range), the test program template is adjusted to ensure compatibility with the hardware, thereby obtaining the post-test program. For special requirements, the test program is dynamically generated through scripts or rule engines.

[0075] Step S1033, determine the test parameters based on at least the product information and the hardware information.

[0076] In the embodiments of the present application, the base value of the test parameters can be determined based on the product information, and then the base value is adjusted based on the hardware information, thereby obtaining the test parameters.

[0077] In some embodiments, the base value of the test parameters can be determined based on the product information, then the base value is adjusted based on the hardware information, and the base value is adjusted based on the environmental information (such as temperature and humidity), thereby obtaining the test parameters.

[0078] In some embodiments, the machine learning algorithm can also be trained based on historical data, and the product information and hardware information are input into the machine learning algorithm, thereby obtaining the test parameters.

[0079] In the embodiments of the present application, step S1033 can be implemented through the following steps:

[0080] Step S331, determine the hardware compensation parameters based on the hardware information.

[0081] In the embodiments of the present application, the hardware information may include: calibration status. For example, obtain the calibration date, validity period, and calibration deviation value of the hardware (such as voltage measurement error ±0.5%). The hardware compensation parameters can be generated based on the calibration deviation value. In some embodiments, the hardware information may further include: interface type, and corresponding hardware compensation parameters can be added for the transmission delay and noise of different interfaces.

[0082] Step S332, determine the base parameters based on the product information.

[0083] In the embodiments of the present application, the detailed specifications (such as the rated voltage, current, and frequency range of the chip) can be obtained by querying the product database through the product model. The process node and package type of the product can be obtained to determine the test sensitivity, and the corresponding test items (such as linearity, accuracy, read and write speed) can be selected according to the product function. Then, the base parameters can be obtained through the detailed specifications, test sensitivity, and test items.

[0084] Step S333, compensate the base parameters with the hardware compensation parameters to obtain the test parameters.

[0085] In the embodiments of the present application, a mapping relationship between basic parameters and hardware compensation parameters can be established (for example, the basic parameters of voltage testing need to be associated with the voltage calibration compensation factor). After obtaining the compensation parameters, the basic parameters can be compensated based on the supplementary parameters. For quantifiable compensation (such as voltage deviation), the compensation value is directly added or subtracted. For non-linear compensation (such as the influence of temperature on resistance), a formula or a look-up table method is used to calculate the compensation value.

[0086] In the embodiments of the present application, after compensation, it is also necessary to ensure that the compensated parameters are within the range allowed by the hardware (for example, the test voltage does not exceed the maximum output capacity of the hardware). The compensated parameters can be converted into a format recognizable by the tester (such as SCPI commands or binary instructions).

[0087] In some embodiments, a parameter configuration interface can be provided to allow test engineers to manually adjust the compensation parameters and basic parameters. The parameter comparison before and after compensation is displayed in real time to support the quick verification of parameters.

[0088] The method provided by the embodiments of the present application can significantly improve the accuracy and adaptability of test parameters by processing the hardware compensation parameters and product basic parameters step by step.

[0089] In some embodiments, when performing step S331, it further includes: obtaining environmental data, determining environmental compensation parameters based on the environmental data, and compensating the basic parameters based on the hardware compensation parameters and the environmental compensation parameters to obtain test parameters.

[0090] In some embodiments, step S102 can be implemented through the following steps:

[0091] Step S1021, performing a verification of the work order status and process compatibility on the work order information based on the production system.

[0092] In the embodiments of the present application, the production system needs to pre-store a series of work order status rules and process capability information in advance. The work order status rules define the conversion conditions between different work order statuses and the allowed operations, and the process capability information includes various process methods, processing parameters, quality standards, etc. supported by the production system. When the work order information is obtained, the current status of the work order can be extracted and compared with the preset work order status rules in the production system to determine whether the status is legal and whether it meets the requirements of the current production process. Then, the process requirements specified by the work order are obtained and matched with the process capability information to check whether the ability to execute the process is available, including whether the equipment meets the requirements and whether the personnel have the corresponding skills, etc.

[0093] In the embodiments of the present application, if both the work order status and the process matching check pass, a check passed flag is generated; otherwise, specific error messages will be returned, such as the work order status being illegal, the process not matching, etc., so that relevant personnel can handle them.

[0094] Step S1022: Perform a matching check on the work order information and the hardware information. Among them, when the work order status, the process matching check pass, and the matching check between the work order information and the hardware information passes, it is determined that the work order information and the hardware information pass the check.

[0095] In the embodiments of the present application, the electronic device verifies whether the work order matches the hardware. If it does not match, the verification fails. If it matches, it is necessary to combine the work order status and the process matching to make a judgment.

[0096] In the embodiments of the present application, after completing the work order status and process matching check and the matching check between the work order information and the hardware information, a comprehensive judgment will be made according to the results of the two checks. Only when the work order status and the process matching check pass, and the matching check between the work order information and the hardware information also passes, is it determined that the work order information and the hardware information pass the check. If any verification fails, the check of the work order information and the hardware information fails.

[0097] In the embodiments of the present application, when the check passes, step S103 is executed. When the check fails, corresponding processing can be performed according to specific error messages, such as pausing the execution of the work order, notifying relevant personnel to conduct problem troubleshooting and resolution, etc.

[0098] The method provided by the embodiments of the present application can ensure the accuracy and matching of the work order information and the hardware information.

[0099] In some embodiments, before step S101, the method further includes:

[0100] Step S1011: Obtain the account information input by the user through the tester.

[0101] In the embodiments of the present application, the account information is the credential for the user to log in to the tester or perform specific operations. By verifying the correctness of the account information, it is determined whether the user has the permission to perform subsequent operations, such as entering work order information and hardware information.

[0102] In the embodiments of the present application, the user can input the account information into the tester by operating the buttons, touch screen or other input methods on the tester, and the tester transmits the account information (account, password, etc.) input by the user to the electronic device through the interface. The transmission method can be a direct connection (such as connecting to a computer via USB) or a wireless connection (such as Bluetooth, Wi-Fi). During the transmission process, data needs to be encrypted to prevent the leakage of account information.

[0103] Step S1012, verify the account information based on the human resources system.

[0104] In the embodiments of the present application, the human resources system serves as the source of account verification basis and stores legal account information. By comparing the account information input by the user with the accounts stored in the human resources system, the legitimacy and validity of the account are verified.

[0105] In the embodiments of the present application, the electronic device establishes a data interaction interface with the human resources system and can obtain the account information in the human resources system through an API (Application Programming Interface) or database query method. For example, the electronic device sends the account and password information to the API of the human resources system, and the API returns the verification result. The verification process includes account existence verification (checking whether the account exists in the human resources system database) and password correctness verification (checking whether the password is consistent with the password stored in the database). If the verification passes, the user is allowed to continue the operation; if the verification fails, the user is prompted to re-enter or contact the administrator.

[0106] Step S1013, when the account information is verified, output a prompt message for prompting the user to enter the work order information and the hardware information.

[0107] In the embodiments of the present application, the prompt message is guiding text or a message output to the user for informing the user of the next operation or providing relevant information. The prompt message can be presented in the form of a pop-up window, text display, voice prompt, etc. After the account information is verified, a prompt message is output to guide the user to enter the work order information and the hardware information to ensure that the user is clear about the subsequent operation steps.

[0108] The method provided by the embodiments of the present application can ensure the security verification of the user account information and the accurate entry of subsequent work orders and hardware information, providing strong support for production or services.

[0109] In some embodiments, after step S104, the method further includes:

[0110] Step S105, obtain the test data of the tester for testing the integrated circuit.

[0111] In the embodiments of the present application, during testing, an electrical connection can be established between the tester and the integrated circuit to be tested. According to the preset test procedures and parameters, various test signals are applied to the integrated circuit, and the response signals of the integrated circuit are collected, thereby obtaining test data. The test data are various information collected by the tester during the testing process of the integrated circuit, including but not limited to the parameters of the input signals (such as voltage, current, frequency, etc.), the parameters of the output signals, logic levels, timing relationships, etc. The test data are an important basis for determining whether there are abnormalities in the integrated circuit. By analyzing and processing the test data, the performance of the integrated circuit under different working conditions can be understood, so as to determine whether it meets the design requirements.

[0112] Step S106, determining whether there are abnormalities in the integrated circuit based on the test data.

[0113] In the embodiments of the present application, an abnormality refers to a phenomenon or characteristic that the integrated circuit shows during testing and does not conform to the normal working state. These abnormalities may be caused by design defects of the integrated circuit, manufacturing process problems, usage environment factors, etc. By comparing the test data with the preset normal working parameter ranges, logic rules, etc., if the test data exceeds the normal range or violates the logic rules, it is determined that there are abnormalities in the integrated circuit.

[0114] In the embodiments of the present application, the collected test data can be preprocessed, including data cleaning (removing noise, outliers, etc.), data format conversion, etc., for subsequent analysis. Feature parameters that can reflect the performance and functions of the integrated circuit, such as voltage, current, frequency, logic level, timing relationship, etc., are extracted from the preprocessed test data. The extracted feature parameters are compared with the preset normal working parameter ranges, logic rules, etc. If the feature parameters exceed the normal range or violate the logic rules, it is determined that there are abnormalities in the integrated circuit. Abnormality judgment can adopt methods such as threshold comparison, pattern recognition, statistical analysis, etc. The results of the abnormality judgment are output in an intuitive way, such as displaying abnormality information on a computer screen, generating an abnormality report, etc.

[0115] Step S107, when there are abnormalities in the integrated circuit, controlling the tester to stop.

[0116] In the embodiments of the present application, stopping refers to controlling the tester to stop the test operation on the integrated circuit, so that the tester enters a non-working state. When it is detected that there are abnormalities in the integrated circuit, timely controlling the tester to stop can avoid further testing of the abnormal integrated circuit and prevent damage to the tester or inaccurate test results caused by abnormal situations.

[0117] In an embodiment of the present application, when it is determined that there is an abnormality in the integrated circuit, the electronic device generates a shutdown control signal and transmits the shutdown control signal to the tester. The signal transmission can be achieved through the communication interface with the tester. After receiving the shutdown control signal, the tester immediately stops the test operation on the integrated circuit, turns off the test signal generator, data acquisition module, etc., and makes the tester enter the shutdown state.

[0118] The method provided by the embodiment of the present application should promptly control the tester to shut down when detecting an abnormality in the integrated circuit, so as to avoid further damage to the tester and the integrated circuit.

[0119] In some embodiments, the method further includes:

[0120] Storing the test data.

[0121] In an embodiment of the present application, after the tester tests the chip, a large amount of test data will be generated. These data must be saved well. When the product is shipped, it will be automatically sent to the customer, and the production data must ensure storage security. According to different product requirements, the production data needs to be saved for 3 - 10 years. Therefore, the test data must be stored. The test data can be stored in the server.

[0122] In some embodiments, the operation and running process of the tester are complex. Once an abnormality occurs, the abnormal point should be accurately traced and located. Therefore, during the operation process, all operation records of the tester should be saved for later tracing.

[0123] Based on the foregoing various embodiments, the embodiment of the present application further provides a method for testing an integrated circuit. In this method, the operator only needs to use a barcode scanner or PDA to scan and enter the work order information and the hardware information of the relevant hardware devices, and then the tester can be automatically started. Figure 2 Schematic diagram of the implementation process of a method for testing an integrated circuit provided by an embodiment of the present application, as Figure 2As shown in the figure, each process in semiconductor integrated circuit production is a very complex process. Therefore, operators will receive pre-job training, and only those who have obtained the job qualification certificate can operate the equipment for the corresponding process. So after the system is turned on, employee login needs to be carried out first. The login information is verified in the human resources system to determine whether the current person is qualified to operate the equipment for the current process. After passing the verification through the human resources system, a work order entry interface will be prompted and popped up. At this time, the operator uses a PDA to scan the QR code information of the work order, the hardware information such as the equipment number and the LB fixture number. Then, according to the scanned basic information, information verification is carried out with the information on the MES production system and the ERP material system through the unique work order ID. After the information verification is qualified, the test program is downloaded and the test parameters are downloaded. Then, the data is imported into the tester through an automatic control algorithm. After all data processing is completed, the control system automatically starts the tester to conduct product testing. When the tester enters the automatic test mode, the test process is monitored, and at the same time, it maintains real-time communication with the MES production system. When receiving a production exception instruction, it can stop the machine in time. After the test is completed, the system calls the automatic data processing module to generate data and automatically save it into the system for production traceability. During the entire operation process, the operator only needs to scan the key QR code information to start the tester for product testing, and the rest of the operations are automatically completed by the control system.

[0124] The method provided by the embodiment of the present application has a high degree of automation and simple operation. The test process of the tester realizes automated operation, that is, automatically downloading the test program, automatically loading the test program, automatically reading data, automatically generating data, automatically uploading data, etc. The staff only needs to scan the QR code of the work order and the hardware information of the equipment to start the test.

[0125] The method provided by the embodiment of the present application can effectively reduce the operation risk, reduce the risk of manual operation, and is reliable, efficient and the quality is guaranteed.

[0126] The method provided by the embodiment of the present application can realize automatic linkage control through the operation mode of linking with the production system, and realizes real-time monitoring with the production system. When production anomalies occur, the current online products can be intercepted in time to reduce losses.

[0127] The method provided by the embodiment of the present application can realize production traceability, save the operation log on the server for later data traceability.

[0128] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0129] According to the foregoing embodiments, an embodiment of the present application provides a test device for an integrated circuit. Each module included in the device, as well as each unit included in each module, can be implemented by a processor in a computer device; of course, it can also be implemented by specific logic circuits. During implementation, the processor can be a central processing unit (CPU, Central Processing Unit), a microprocessor (MPU, Microprocessor Unit), a digital signal processor (DSP, Digital Signal Processing), or a field programmable gate array (FPGA, Field Programmable Gate Array), etc.

[0130] An embodiment of the present application provides a test device for an integrated circuit. Figure 3 It is a schematic structural diagram of a test device for an integrated circuit provided by an embodiment of the present application. As Figure 3 shown, the test device 300 for an integrated circuit includes:

[0131] An acquisition module 301, configured to acquire work order information of the integrated circuit and hardware information for testing the integrated circuit;

[0132] A verification module 302, configured to verify the work order information and the hardware information;

[0133] A determination module 303, configured to determine a test program and test parameters of a tester based on the work order information and the hardware information when the work order information and the hardware information pass the verification;

[0134] A test module 304, configured to control the tester to test the integrated circuit based on the test program and the test parameters.

[0135] In some embodiments, the determination module 303 includes:

[0136] An acquisition unit, configured to acquire product information of the integrated circuit from a production system based on the work order information;

[0137] A first determination unit, configured to determine the test program based on the product information and the hardware information;

[0138] A second determination unit, configured to determine the test parameters based on at least the product information and the hardware information.

[0139] In some embodiments, the second determination unit includes:

[0140] A first determination subunit, configured to determine hardware compensation parameters based on the hardware information;

[0141] A second determination subunit, configured to determine basic parameters based on the product information;

[0142] A compensation subunit, configured to apply the hardware compensation parameters to the basic parameters for compensation to obtain test parameters.

[0143] In some embodiments, the verification module 302 includes:

[0144] A first verification unit, configured to verify the work order status and process compatibility of the work order information based on the production system;

[0145] A second verification unit, configured to perform a matching verification on the work order information and the hardware information. Wherein, when the work order status and process compatibility verification are passed and the matching verification between the work order information and the hardware information is passed, it is determined that the work order information and the hardware information pass the verification.

[0146] In some embodiments, the integrated circuit testing apparatus 300 further includes:

[0147] An account acquisition module, configured to acquire the account information input by the user through the tester;

[0148] A verification module, configured to verify the account information based on the human resource system;

[0149] An output module, configured to output a prompt message when the account information is verified, where the prompt message is used to prompt the user to enter the work order information and the hardware information.

[0150] In some embodiments, the testing module is configured to:

[0151] Import the test program into the tester and load it, import the test parameters into the tester, and load them. When the test program and the test parameters are loaded, control the tester to test the integrated circuit.

[0152] In some embodiments, the integrated circuit testing apparatus 300 further includes:

[0153] A test data acquisition module, configured to acquire the test data of the tester when testing the integrated circuit;

[0154] A judgment module, configured to determine whether the integrated circuit is abnormal based on the test data;

[0155] A shutdown module, configured to control the tester to shut down when the integrated circuit is abnormal.

[0156] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiments of this application. For their specific functions and the technical effects brought about, please refer to the method embodiment section for details, and will not be elaborated here.

[0157] Based on the aforementioned integrated circuit testing device, an embodiment of the present application further provides a control system. Figure 4 As shown in the structural schematic diagram of a control system provided by an embodiment of the present application, Figure 4 it includes:

[0158] The control system includes: an automatic control system background, an automatic control center, a system exchange interface, a test program control module, a test parameter control module, a test monitoring module, a data processing module, a PDA scanning module, etc. Among them, the automatic control center is the core part of the entire system, responsible for integrating the resources of each module, and sending out linkage scheduling signals according to the set program, so as to control each module to execute in an orderly and efficient manner.

[0159] The specific working principles of each module of the system are as follows:

[0160] The system data exchange interface module is the main channel for the control system to interact data information with external auxiliary systems. The auxiliary systems related to the control system mainly include the MES system (responsible for production work order management), the ERP system (responsible for production material management), and the HR human resources system (responsible for personnel position qualification management). The data access of these auxiliary systems mainly realizes the functions of information transmission and verification. For example, the MES system can read the station of the current process and the equipment hardware number used in the production plan through the unique work order ID; the ERP system can read the corresponding product material number; the HR system can effectively verify the qualifications of the operating personnel to ensure that the current operating personnel have passed the on-the-job training and obtained the work permit.

[0161] The automatic control system background runs on the server and includes: a system data exchange interface, a test program server, and a data server, etc. It is mainly responsible for receiving the instructions from the automatic control center and completing the corresponding data exchange process according to the instructions. At the same time, the system background can monitor the running status of all testers, which is convenient for managers to quickly understand the real-time running status of each tester. Among them, the test program server is mainly used to manage test programs, and all test programs are stored on the server and stored in a strictly regulated format; the data server stores two types of data, one is the tester running data, including tester running parameters, running records, etc., and the other is the data of the tested products. The above servers can only be accessed through the system background to ensure data security.

[0162] The automatic control center is the core component of the system, responsible for the automatic control calls and resource coordination of each functional module. Depending on the function, the automatic control center mainly consists of four parts: data input, automatic control, data monitoring, and data processing. The automatic control process is subdivided into various sub-modules for execution. For example, the automatic entry of operating parameters, automatic downloading of test programs, automatic loading, and automatic startup are all integrated into the parameter control module and program control module respectively. Unlike the automatic control system background, there is only one system background, but each tester has a corresponding automatic control center. All control centers are centrally managed by the system background, thus realizing the automatic control of each tester and the unified management of all testers.

[0163] The PDA scanning module is primarily used for data entry, such as scanning and entering work order IDs, equipment numbers, and material numbers. A single PDA can connect to multiple automation centers. The system backend automatically distributes the scanned data to the corresponding automation center based on the device number, enabling automatic data entry.

[0164] The test parameter control module primarily consists of a parameter download module and a parameter loading module. The download module automatically downloads the required operating parameters from the data server to the corresponding device according to the control center's instructions. The parameter loading module then automatically enters all parameters into the tester. This process is a key step in replacing manual labor. The control center automatically loads all parameters into the tester software interface through the tester's developed system interface or underlying software interface. The entire process is completed automatically by the control center, reducing the risk of manual intervention.

[0165] The test program control module mainly includes the program download module, the program loading module, and the automatic start module. The download module will automatically download the test program of the current product to the corresponding tester on the program server according to the instructions of the control center. This process is relatively complicated because products may have different test programs or different program versions. The download module must make a comprehensive judgment based on product information and MES information to ensure that the correct test program is downloaded. If this link is downloaded manually, the risk of selecting the wrong one is high and it cannot be effectively controlled. After the test program is downloaded to the tester, the program loading module will load the program onto the tester operating system. Finally, the automatic start module will start the tester to the test state. After the test is completed, this module will also automatically shut down the test function.

[0166] The test monitoring module is mainly responsible for monitoring the operating status of the tester. For example, when it monitors that the product test yield is abnormal, the monitoring module will automatically trigger a shutdown command for the automatic control center to stop the current production. At the same time, it will also remind the abnormal point on the interface to facilitate the engineering staff to quickly handle the abnormality.

[0167] The data processing module mainly processes production data and operation records. After the tester tests the chips, a large amount of test data will be generated. These data must be saved well. When the product is shipped, it will be automatically sent to the customer. And the production data must ensure storage security. According to different product requirements, the production data needs to be saved for 3 - 10 years. Therefore, it must be effectively controlled through the system. In addition, the operation and running process of the tester is complex. Once an abnormality occurs, it is necessary to accurately trace and locate the abnormal point. Therefore, during the operation process, all operation records should be saved for later traceability.

[0168] In addition, the above - mentioned test device or control system of the integrated circuit can be a software unit, a hardware unit, or a unit combining software and hardware. It can also be integrated into the electronic device as an independent pendant, or exist as an independent terminal device.

[0169] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the above - mentioned division of each functional unit and module is used as an example. In actual applications, the above - mentioned functions can be allocated to different functional units and modules according to needs, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiment can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above - mentioned integrated unit can be implemented in the form of hardware or in the form of a software functional unit. In addition, the specific names of each functional unit and module are only for the convenience of mutual distinction and do not limit the protection scope of the present application. The specific working process of the units and modules in the above - mentioned system can refer to the corresponding process in the foregoing method embodiments and will not be elaborated here.

[0170] Figure 5 This is a schematic structural diagram of the electronic device provided by the embodiment of the present application. As Figure 5 shown, the electronic device 3 of this embodiment may include: at least one processor 30 ( Figure 5 only one processor 30 is shown in

[0171] Exemplarily, the computer program 32 can be divided into one or more modules / units. One or more modules / units are stored in the memory 31 and executed by the processor 30 to complete the present application. One or more modules / units can be a series of computer program 32 instruction segments capable of completing specific functions, and these instruction segments are used to describe the execution process of the computer program 32 in the electronic device 3.

[0172] The embodiment of the present application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program 32, and when the computer program 32 is executed by the processor 30, it can implement the steps in the above-mentioned various method embodiments.

[0173] The embodiment of the present application provides a computer program product. When the computer program product runs on an electronic device, it enables the electronic device to execute and implement the steps in the above-mentioned various method embodiments.

[0174] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, to implement all or part of the processes in the above-mentioned embodiment methods of the present application, it can be completed by instructing relevant hardware through the computer program 32. The computer program 32 can be stored in a computer-readable storage medium. When the computer program is executed by the processor 30, it can implement the steps in the above-mentioned various method embodiments. Among them, the computer program 32 includes computer program code, and the computer program code can be in the form of source code, object code, executable file or some intermediate form, etc. The computer-readable medium can at least include: any entity or device capable of carrying the computer program code to the terminal, recording medium, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electrical carrier signal, telecommunication signal, and software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disc, etc. In some jurisdictions, according to legislation and patent practice, the computer-readable medium cannot be an electrical carrier signal and a telecommunication signal.

[0175] In the above embodiments, the descriptions of the various embodiments have their own focuses. For the parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0176] Those of ordinary skill in the art will realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. A professional technician can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of this application.

[0177] In the embodiments provided in this application, it should be understood that the disclosed device / network device and method can be implemented in other ways. For example, the device / network device embodiments described above are merely illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of the device or unit can be in electrical, mechanical or other forms.

[0178] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0179] The above-described embodiments are only used to illustrate the technical solutions of this application, rather than to limit them; although this application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. A testing method for an integrated circuit, characterized in that, Including: Obtain the work order information of the integrated circuit and the hardware information for testing the integrated circuit; Verify the work order information and the hardware information; When the work order information and the hardware information pass the verification, determine the test program and test parameters of the tester based on the work order information and the hardware information; Control the tester to test the integrated circuit based on the test program and the test parameters.

2. The method according to claim 1, characterized in that The determining the test program and test parameters of the tester based on the work order information and the hardware information includes: Obtain the product information of the integrated circuit from the production system based on the work order information; Determine the test program based on the product information and the hardware information; Determine the test parameters based on at least the product information and the hardware information.

3. The method according to claim 2, wherein The determining the test parameters based on at least the product information and the hardware information includes: Determine the hardware compensation parameters based on the hardware information; Determine the basic parameters based on the product information; Compensate the basic parameters with the hardware compensation parameters to obtain the test parameters.

4. The method according to claim 1, wherein The verifying the work order information and the hardware information includes: Verify the work order status and process matching of the work order information based on the production system; Perform a matching verification on the work order information and the hardware information. Wherein, when the work order status and process matching verification pass and the matching verification between the work order information and the hardware information passes, it is determined that the work order information and the hardware information pass the verification.

5. The method according to claim 1, wherein The method further includes: Obtain the account information input by the user through the tester; Verify the account information based on the human resources system; When the account information passes the verification, output a prompt message for prompting the user to enter the work order information and the hardware information.

6. The method according to claim 1, characterized in that, The controlling the tester to test the integrated circuit based on the test program and the test parameters includes: Import the test program into the tester and load it, import the test parameters into the tester, and load them. When the test program and the test parameters are loaded, control the tester to test the integrated circuit.

7. The method according to claim 1, characterized in that, The method further includes: Obtain the test data of the tester when testing the integrated circuit; Determine whether there is an abnormality in the integrated circuit based on the test data; When there is an abnormality in the integrated circuit, control the tester to stop.

8. A test device for an integrated circuit, characterized in that, Including: An obtaining module, configured to obtain the work order information of the integrated circuit and the hardware information for testing the integrated circuit; A verifying module, configured to verify the work order information and the hardware information; A determining module, configured to, when the work order information and the hardware information pass the verification, determine the test program and test parameters of the tester based on the work order information and the hardware information; A testing module, configured to control the tester to test the integrated circuit based on the test program and the test parameters.

9. An electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, the method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the method according to any one of claims 1 to 7.

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