Clamp structure for high-temperature creep test of plate-shaped sample

Abstract

The invention relates to the field of mechanical property testing, and particularly discloses a plate-shaped sample high-temperature creep test clamp structure which comprises a limiting frame assembly, the limiting frame assembly comprises a limiting frame piece, one side of the limiting frame piece is fixedly connected with a threaded rod, a limiting groove is formed in the limiting frame piece, and the threaded rod is fixedly connected with the limiting frame piece. The middle position of the upper side of the limiting frame piece is further fixedly connected with a fixing pin column. The limiting groove is used for containing one end of a sample, and the fixing pin column is used for fixing the sample; according to the invention, through the cooperation of the limiting groove and the fixed pin column, the end part of the sample can be effectively prevented from being broken, and meanwhile, the sample can be firmly clamped, so that a test error caused by the movement or deformation of the sample in a test process is avoided; through cooperation of the driving assembly and the clamping assembly, rapid fixing and releasing of a sample are achieved, a worker only needs to simply press a limiting ring, limiting of the sample can be relieved, and the sample can be conveniently placed and taken out.

Description

Technical Field

[0001] The invention belongs to the field of mechanical property testing, in particular to a fixture structure for a plate-shaped sample high-temperature creep test. Background Art

[0002] Creep and rupture properties are used to describe the performance of metal materials when subjected to long-term, constant loads at elevated temperatures. To determine these properties, materials are processed into rupture and creep specimens and tested using rupture and creep testing machines. This testing process is crucial for assessing the long-term stability, durability, and performance of metal materials in high-temperature environments.

[0003] When conducting endurance and creep tests, it is essential to equip the specimen with appropriate fixtures. The design and selection of fixtures directly impact the accuracy and reliability of the test results. Currently, common endurance and creep specimens are mainly divided into two types: cylindrical specimens and plate specimens.

[0004] When testing traditional plate specimens, the pin holes at the clamping end of the specimens are easily broken by the fixture. Summary of the Invention

[0005] In order to solve the above technical problems, the present invention provides a plate specimen high temperature creep test fixture structure to solve the problem in the prior art that the pin hole position of the specimen clamping end is easily broken by the fixture during the test of the traditional plate specimen.

[0006] A plate-shaped specimen high-temperature creep test fixture structure includes a limit frame assembly, the limit frame assembly includes a limit frame member, a threaded rod is fixedly connected to one side of the limit frame member, a limit slot is provided on the limit frame member, and a fixing pin is fixedly connected to the middle position of the upper side of the limit frame member; The limiting groove is used to accommodate one end of the sample, the fixing pin is used to fix the sample, and the threaded rod is used to be connected to the test equipment.

[0007] Preferably, a group of clamping components are symmetrically slidably provided inside the limiting frame component, and a driving component is slidably provided on the lower side of the limiting frame component; A set of the clamping assemblies is used to limit the sample, and the upward movement of the driving assembly drives the clamping assembly to move outward to release the limit on the sample.

[0008] Preferably, the limiting frame member includes a limiting frame body, a set of movable grooves symmetrically opened on the upper side of the limiting frame body, and a guide rod 1 fixedly connected to the upper side of the limiting frame body in the movable groove 1; The clamping assembly includes an L-shaped bracket, and a spring 1 is fixedly connected to one side of the L-shaped bracket; The L-shaped bracket and the first spring are both limited and slidably clamped on the outer side of the first guide rod. The L-shaped bracket is limited and slidably clamped in the first moving groove. The first spring drives the L-shaped bracket to move towards the fixed pin column, thereby limiting the specimen.

[0009] Preferably, the driving assembly includes a connecting rod. The upper end of the connecting rod is fixedly connected with a pushing block, and the lower end of the connecting rod is fixedly connected with a limiting ring. One side of the lower end of the L-shaped bracket is also fixedly connected with an inclined block. The bottom of the limiting frame body is also provided with a second moving groove. The pushing block is limited and slidably clamped inside the second moving groove. When the limiting ring is pushed to move the connecting rod and the pushing block upward, the pushing block will drive the inclined block to move horizontally, thereby driving the L-shaped bracket to move and releasing the limitation on the specimen.

[0010] Preferably, the driving assembly further includes a second spring sleeved on the outer side of the connecting rod. The second spring is located between the bottom surface of the limiting frame part and the limiting ring, and the second spring drives the limiting ring to move downward.

[0011] Preferably, a limiting assembly is also slidably clamped inside the limiting frame part. The limiting assembly includes a connecting plate and a third spring. The lower end of the outer side of the connecting plate is also fixedly connected with a first limiting plate. The limiting frame body is also provided with a third moving groove, and a second guide rod is fixedly connected inside the limiting frame body in the third moving groove. Both the connecting plate and the third spring are limited and slidably clamped on the outer side of the second guide rod. The third spring drives the connecting plate to move, thereby enabling the first limiting plate to limit the limiting ring.

[0012] Preferably, the upper end of the outer side of the connecting plate is also fixedly connected with a second limiting plate. The third spring drives the connecting plate to move, thereby enabling the second limiting plate to limit the specimen.

[0013] Preferably, the second limiting plate is also provided with an inclined surface.

[0014] Compared with the prior art, the present invention has the following beneficial effects: Through the cooperation of the limiting groove and the fixed pin column, the situation that the end pin hole position of the specimen breaks can be effectively prevented. At the same time, the specimen can be firmly clamped, avoiding test errors caused by the movement or deformation of the specimen during the test. Through the cooperation of the driving component and the clamping component, the rapid fixation and release of the specimen are realized. The staff only needs to simply press the limit ring to release the limit on the specimen, which is convenient for the placement and removal of the specimen. After releasing the limit ring, the acting force of the spring will automatically reset the clamping component to complete the firm fixation of the specimen, greatly improving the convenience and efficiency of specimen fixation. An inclined surface is provided on the L-shaped bracket to facilitate the embedding of the specimen into the limit groove; Through the limitation of the limit ring by the limit plate one and the limitation of the specimen by the limit plate two, accidental pressing of the limit ring is avoided, and at the same time, the specimen is further limited. Brief Description of the Drawings

[0015] Figure 1 It is a schematic diagram of the overall structure of the present invention; Figure 2 It is a schematic diagram of the exploded structure of the present invention; Figure 3 It is a schematic diagram of the structure of the limit frame assembly of the present invention; Figure 4 It is a schematic diagram of the structure of the limit frame member of the present invention; Figure 5 It is a schematic diagram of the structure of the clamping component of the present invention; Figure 6 It is a schematic diagram of the structure of the driving component of the present invention; Figure 7 It is a sectional view of the driving component of the present invention; Figure 8 It is a schematic diagram of the structure of the limit component of the present invention; Figure 9 It is a sectional view of the limit component of the present invention.

[0016] In the figure: 11, limit frame assembly; 111, limit frame member; 1111, limit frame body; 1112, first movable groove; 1113, first guide rod; 1114, second movable groove; 1115, third movable groove; 1116, second guide rod; 112, threaded rod; 113, limit groove; 114, fixed pin column; 12, clamping component; 121, L-shaped bracket; 122, first spring; 123, inclined block; 13, driving component; 131, connecting rod; 132, pushing block; 133, limit ring; 134, second spring; 14, limit component; 141, connecting plate; 142, third spring; 143, first limit plate; 144, second limit plate; 145, inclined surface; 21, specimen; 22, pin hole. Detailed Description of the Invention

[0017] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0018] As Figures 1 to 3 shown: Embodiment 1: The present invention provides a high-temperature creep test fixture structure for plate-shaped specimens, including a limit frame assembly 11. The limit frame assembly 11 includes a limit frame member 111. One side of the limit frame member 111 is fixedly connected to a threaded rod 112. A limit groove 113 is provided on the limit frame member 111. A fixed pin 114 is also fixedly connected to the middle position on the upper side of the limit frame member 111. The limit groove 113 is used to accommodate one end of the specimen. The fixed pin 114 is used to fix the specimen. The threaded rod 112 is used to connect with the test equipment.

[0019] As can be seen from the above, during operation, the two ends of the plate-shaped specimen are respectively placed in the limit grooves 113 of the corresponding limit frame members 111, and the specimen is limited and fixed by the fixed pin 114. Then, the threaded rod 112 is connected to the test equipment for high-temperature creep test.

[0020] As Figures 4 to 7 shown: Embodiment 2: This embodiment is basically the same as the previous embodiment, except that a set of clamping components 12 are symmetrically and slidably arranged inside the limit frame member 111, and a driving component 13 is arranged in a limit sliding manner on the lower side of the limit frame assembly 11. A set of clamping components 12 are used to limit the specimen. When the driving component 13 moves upward, it will drive the clamping components 12 to move outward to release the limit on the specimen.

[0021] Specifically, the limit frame member 111 includes a limit frame body 1111. A set of movable grooves 1112 are symmetrically provided on the upper side of the limit frame body 1111. A guide rod 1113 is fixedly connected inside the movable grooves 1112 on the upper side of the limit frame body 1111. The clamping component 12 includes an L-shaped bracket 121. One side of the L-shaped bracket 121 is fixedly connected to a spring 122. Both the L-shaped bracket 121 and the spring 122 are limited and slidably clamped outside the guide rod 1113. The L-shaped bracket 121 is limited and slidably clamped inside the movable groove 1112. The spring 122 drives the L-shaped bracket 121 to move towards the fixed pin 114 to limit the specimen. Preferably, the L-shaped bracket 121 is provided with an inclined surface facilitating the embedding of the specimen 21 into the limiting groove 113, thereby facilitating the quick fixation of the specimen 21 by the staff.

[0022] Specifically, the driving assembly 13 includes a connecting rod 131. The upper end of the connecting rod 131 is fixedly connected with a pushing block 132, and the lower end of the connecting rod 131 is fixedly connected with a limiting ring 133. One side of the lower end of the L-shaped bracket 121 is also fixedly connected with an inclined block 123. The bottom of the limiting frame body 1111 is also provided with a second movable groove 1114. The pushing block 132 is limited and slidably engaged inside the second movable groove 1114. When the limiting ring 133 is pushed to move the connecting rod 131 and the pushing block 132 upward, the pushing block 132 will drive the inclined block 123 to move horizontally, thereby driving the L-shaped bracket 121 to move and releasing the limitation on the specimen.

[0023] Specifically, the driving assembly 13 further includes a second spring 134 sleeved outside the connecting rod 131. The second spring 134 is located between the bottom surface of the limiting frame member 111 and the limiting ring 133, and the second spring 134 drives the limiting ring 133 to move downward.

[0024] As can be seen from the above, during use, the limiting ring 133 is pressed to move the connecting rod 131 and the pushing block 132 upward and compress the second spring 134. When the pushing block 132 moves upward, it will drive the inclined block 123 to move horizontally. When the inclined block 123 moves horizontally, the L-shaped bracket 121 will move and compress the first spring 122. At this time, the staff can engage the pin hole 22 at one end of the specimen 21 with the fixed pin 114. After releasing the limiting ring 133, the reset of the second spring 134 will cause the limiting ring 133 to drive the connecting rod 131 and the pushing block 132 to move downward. After the pushing block 132 moves downward, the reset of the first spring 122 will cause the L-shaped bracket 121 to move and thus limit the specimen 21.

[0025] Such as Figures 1 to 3 、 Figure 8 and Figure 9 shown: Embodiment 3: This embodiment is basically the same as the previous embodiment, except that a limiting component 14 is also slidably engaged inside the limiting frame member 111. The limiting component 14 includes a connecting plate 141 and a third spring 142. The lower end of the outer side of the connecting plate 141 is also fixedly connected with a first limiting plate 143. The limiting frame body 1111 is also provided with a third movable groove 1115, and a second guiding rod 1116 is fixedly connected inside the limiting frame body 1111 within the third movable groove 1115. The connecting plate 141 and the spring three 142 are both limited and slidably embedded on the outer side of the guide rod two 1116 , and the spring three 142 drives the connecting plate 141 to move so that the limiting plate one 143 limits the limiting ring 133 .

[0026] Specifically, the upper end of the outer side of the connecting plate 141 is also fixedly connected to the second limiting plate 144; The third spring 142 drives the connecting plate 141 to move so that the second limiting plate 144 limits the sample.

[0027] Specifically, the second limiting plate 144 is further provided with an inclined surface 145 .

[0028] As can be seen from the above, during operation, the spring 3 142 drives the connecting plate 141 to move, so that the limiting plate 143 at the lower end of the outer side of the connecting plate 141 limits the limiting ring 133, thereby limiting its upward movement. At the same time, the limiting plate 2 144 at the upper end of the outer side of the connecting plate 141 also limits the specimen, thereby further limiting the specimen 21. The inclined surface 145 on the second limiting plate 144 facilitates the rapid placement of the specimen; The connecting plate 141 and the spring three 142 are both limitedly slidably embedded on the outer side of the guide rod two 1116 on the limiting frame body 1111 and move through the movable slot three 1115.

[0029] All standard parts used in the present invention can be purchased commercially, and special-shaped parts can be customized according to the description in the specification and drawings. The specific connection methods of each part adopt conventional means such as bolts, rivets, welding, etc. that are mature in the prior art. The machinery, parts and equipment all adopt conventional models in the prior art. In addition, the circuit connections adopt conventional connection methods in the prior art and will not be described in detail here. Any matters not described in detail in this specification belong to the prior art known to professionals in this field.

[0030] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include one or more of such features. "Multiple" means two or more, unless otherwise specifically defined.

[0031] In the present invention, unless otherwise clearly defined or limited, terms such as "installed", "connected", "joined", "fixed", etc. shall be construed in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral one; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0032] In the present invention, unless otherwise clearly defined or limited, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may be that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "underneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.

[0033] In the description of this specification, the description with reference to terms such as "one embodiment", "some embodiments", "example", "specific example" or "some examples", etc. means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in a suitable manner in any one or more embodiments or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

[0034] In the drawings of the disclosed embodiments of the present invention, only the structures related to the disclosed embodiments are involved, and other structures can refer to the general design. Without conflict, the same embodiment and different embodiments of the present invention can be combined with each other.

[0035] Although the present invention has been described in detail with reference to the foregoing embodiments, for those skilled in the art, they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A fixture structure for high-temperature creep test of plate-shaped specimens, characterized in that, It includes a limit frame assembly (11), the limit frame assembly (11) includes a limit frame member (111), one side of the limit frame member (111) is fixedly connected with a threaded rod (112), a limit groove (113) is opened on the limit frame member (111), and a fixed pin (114) is also fixedly connected to the middle position on the upper side of the limit frame member (111); The limit groove (113) is used to accommodate one end of the specimen, the fixed pin (114) is used to fix the specimen, and the threaded rod (112) is used to connect with the test equipment; A set of clamping assemblies (12) are symmetrically and slidably arranged inside the limit frame member (111), and a driving assembly (13) is limit slidably arranged on the lower side of the limit frame assembly (11); A set of the clamping assemblies (12) are used to limit the specimen, and when the driving assembly (13) moves upward, it will drive the clamping assemblies (12) to move outward to release the limit on the specimen; The limit frame member (111) includes a limit frame body (1111), a set of first movable grooves (1112) are symmetrically opened on the upper side of the limit frame body (1111), and a first guide rod (1113) is fixedly connected inside the first movable grooves (1112) on the upper side of the limit frame body (1111); The clamping assembly (12) includes an L-shaped bracket (121), and a first spring (122) is fixedly connected to one side of the L-shaped bracket (121); Both the L-shaped bracket (121) and the first spring (122) are limit slidably clamped on the outer side of the first guide rod (1113), the L-shaped bracket (121) is limit slidably clamped inside the first movable groove (1112), and the first spring (122) drives the L-shaped bracket (121) to move towards the fixed pin (114) to limit the specimen.

2. The structure of the high-temperature creep test fixture for a plate-shaped specimen according to claim 1, wherein, The driving assembly (13) includes a connecting rod (131), a push block (132) is fixedly connected to the upper end of the connecting rod (131), and a limit ring (133) is fixedly connected to the lower end of the connecting rod (131); A slant block (123) is also fixedly connected to the lower end of one side of the L-shaped bracket (121); A second movable groove (1114) is also opened at the bottom of the limit frame body (1111); The push block (132) is limit slidably clamped inside the second movable groove (1114). When the limit ring (133) is pushed to move the connecting rod (131) and the push block (132) upward, the push block (132) will drive the slant block (123) to move horizontally, and then drive the L-shaped bracket (121) to move to release the limit on the specimen.

3. The structure of a high-temperature creep test fixture for a plate-shaped specimen according to claim 2, characterized in that The driving assembly (13) further includes a second spring (134) sleeved on the outer side of the connecting rod (131); The second spring (134) is located between the bottom surface of the limit frame member (111) and the limit ring (133), and the second spring (134) drives the limit ring (133) to move downward.

4. The structure of a high-temperature creep test fixture for a plate-shaped specimen as described in claim 3, characterized in that, A limit assembly (14) is also slidably clamped inside the limit frame member (111); The limiting component (14) includes a connecting plate (141) and a third spring (142), and a first limiting plate (143) is further fixedly connected to the lower end of the outer side of the connecting plate (141); A third moving groove (1115) is further formed in the limiting frame body (1111), and a second guiding rod (1116) is further fixedly connected to the limiting frame body (1111) and located in the third moving groove (1115); Both the connecting plate (141) and the third spring (142) are limited and slidably engaged with the outer side of the second guiding rod (1116), and the third spring (142) drives the connecting plate (141) to move so that the first limiting plate (143) limits the limiting ring (133).

5. The structure of a high-temperature creep test fixture for a plate-shaped specimen according to claim 4, wherein A second limiting plate (144) is further fixedly connected to the upper end of the outer side of the connecting plate (141); The third spring (142) drives the connecting plate (141) to move so that the second limiting plate (144) limits the specimen.

6. The structure of a high-temperature creep test fixture for a plate-shaped specimen according to claim 5, characterized in that, An inclined surface (145) is further formed in the second limiting plate (144).

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