Intelligent detection device and method for device status and experimental wiring of electrical experiment bench

Abstract

The present invention provides an intelligent detection device and method for device status and experimental wiring of an electrical test bench. The device and method include a microprocessor, an impedance measurement module, and multiple sets of solid-state relay control modules. Each set of solid-state relay control modules includes two normally open contact solid-state relays. The input ends of the two solid-state relays are connected to the microprocessor. Each terminal of the test bench is connected to the input and output ends of the impedance measurement module via the normally open contacts of the two solid-state relays of the solid-state relay control module. The impedance measurement module is used to measure the impedance value between the two terminals. The microprocessor compares the measured impedance value between the two terminals with the normal impedance value of the device or the impedance value between the terminals when the connection is correct. Based on the comparison result, the device status and experimental wiring are determined to be incorrect. The present invention can be used for intelligent detection of device status and experimental wiring, improving experimental efficiency and preventing short-circuit accidents.

Description

Technical Field

[0001] The present invention relates to the technical field of electrician test benches, and in particular to an intelligent detection device and method for detecting device states and experimental wiring of an electrician test bench. Background Art

[0002] Electrical lab benches operate at 220V / 380V and are used to conduct lab projects in electrical engineering courses. They are widely used in various universities and colleges across China. Due to their high operating voltage, these lab benches present significant safety risks, necessitating special precautions for personal safety. Furthermore, if the lab operator makes a wiring error, it can easily lead to a short circuit, a major cause of safety hazards such as shortened lab equipment lifespan, component damage, and electric shock. These not only threaten personal safety but also increase the cost of lab materials and repairs, hindering lab progress, reducing efficiency, and placing a heavy psychological burden on both teachers and students. Traditionally, students are responsible for wiring the lab, and after completion, the teacher conducts a check before powering on the lab. If the lab is powered on without checking, short circuits are highly likely to occur. This approach increases teacher workload and reduces efficiency, and it also makes it difficult for teachers to ensure 100% accuracy in their checks.

[0003] The patent number is 202210617504.2, and the invention name is "An electrical experimental device with intelligent detection of experimental circuits and its detection method". The patent proposes a new configuration of electrical experimental device with intelligent detection of experimental circuits and its detection method. It has certain innovations, but requires a complete update of the experimental equipment, especially it cannot be achieved through modification on the traditional electrical laboratory bench, and it cannot detect the status of the devices on the laboratory bench. Summary of the Invention

[0004] In order to solve the above technical problems, the present invention provides an intelligent detection device and method for the status of components and experimental wiring of an electrical experiment bench, which can be modified on the basis of a traditional electrical experiment bench, thereby realizing intelligent self-inspection of the status of components on the experiment bench and intelligent detection of experimental circuit connections, greatly improving experimental efficiency and safety. At the same time, the modification investment cost is low, the economic and technical aspects are more reasonable, and it is suitable for popularization and application in colleges and universities.

[0005] The technical solution of the present invention includes a microprocessor, an impedance measurement module, and multiple groups of solid-state relay control modules. Each group of solid-state relay control modules includes two solid-state relays. The input terminals of the two solid-state relays in the same group of solid-state relay control modules are connected to the microprocessor. Each terminal on the experimental platform is connected to the input and output terminals of the impedance measurement module via the normally open contacts of the two solid-state relays in the group of solid-state relay control modules. The impedance measurement module is used to measure the impedance value between the two terminals. The microprocessor compares the measured impedance value between the two terminals with the normal impedance value of the device or the impedance value between the terminals when the device is correctly connected. Based on the comparison results, it determines whether the device status and experimental wiring are incorrect.

[0006] Furthermore, it also includes a locking circuit module, which is connected to the microprocessor and protects the circuit. The locking circuit module includes a locking relay, a transistor, a three-phase contactor and a start button. The transistor is connected to the microprocessor and the locking relay respectively, and the locking relay is connected to the three-phase contactor. The locking relay includes a relay coil and a power-on locking contact. The relay coil is connected to the transistor, and the power-on locking contact is connected to the three-phase contactor. The power-on locking contact is connected according to the Whether the relay coil has current to open or close, the start button is connected to the three-phase contactor to control the opening or closing of the three-phase contactor. When the microprocessor power-on control port outputs a low level, the transistor is cut off, and the locking relay coil has no current, so that the power-on locking contact remains normally open, preventing the start button from controlling the three-phase contactor to close. When the microprocessor power-on control port outputs a high level, the transistor is turned on, and the locking relay coil has current, so that the power-on locking contact remains closed, and the start button controls the three-phase contactor to close.

[0007] Furthermore, an emergency stop button is provided on the three-phase contactor to enable rapid power off in the event of an accident.

[0008] Furthermore, it also includes control buttons and a liquid crystal display module, both of which are connected to the microprocessor. The control buttons control the operation of the microprocessor, and the liquid crystal display module displays the experimental project selection menu, device status and information on whether the experimental wiring is correct.

[0009] The present invention also provides a method for detecting the device status and experimental wiring of an electrical experiment bench, comprising the following steps:

[0010] S100: The power-on control port of the microprocessor outputs a low level to control the power-on locking contact of the locking circuit module to be in a normally open state.

[0011] S200: Detecting device status. The impedance measurement module measures the impedance values ​​of several devices under test respectively, compares the measurement results with the normal impedance values ​​of the corresponding devices, and determines whether the corresponding devices are normal based on the comparison results.

[0012] S300: Wiring detection of experimental items. After all the devices to be tested are detected to be normal and the wiring of the experimental items is completed in step S200, the experimental items are selected on the liquid crystal display module through the control button, and the impedance values ​​between the various wiring terminals in the measured experimental items are compared with the normal impedance values ​​when the selected experimental items are correctly wired to determine whether the experimental wiring is correct.

[0013] S400: After the device status and experimental wiring detection are all correct, the microprocessor power-on control port outputs a high level, controlling the power-on locking contact of the locking circuit module to be in a closed state. At this time, the start button is pressed, the main contacts of the three-phase contactor are closed, the experimental circuit is powered on, and the experiment begins.

[0014] Furthermore, in step S100, the microprocessor power-on control port outputs a low level, the transistor of the locking circuit module is cut off, the relay coil of the locking relay has no current, the power-on locking contact is in a normally open state, the start button cannot control the three-phase contactor to close, the experimental circuit is in an open state, and the experiment cannot be carried out.

[0015] Furthermore, in step S200, the microprocessor controls the closure of the normally open contacts of the solid-state relay corresponding to the two wiring terminals of the device under test through the I / O control port, so that the two wiring terminals of the device under test are respectively connected to the input end and the output end of the impedance measurement module, thereby measuring the impedance value of the device, comparing the measured impedance value of the device with the normal impedance value of the device, and judging whether the corresponding device is normal or faulty based on the comparison result. If a fault exists, the faulty device information is displayed on the liquid crystal display module.

[0016] The technical solution provided by the embodiment of the present invention has the following advantages compared with the existing technology:

[0017] Each terminal of the device under test is connected to the input and output of an impedance measurement module via the normally open contacts of two solid-state relays of a solid-state relay control module. When detecting the device status, a microprocessor controls a solid-state relay of the solid-state relay control module at one terminal of the device to connect to the input of the impedance measurement module, and controls a solid-state relay of the solid-state relay control module at another terminal of the device to connect to the output of the impedance measurement module. The impedance measurement module then measures the impedance value between the two terminals of the device under test. The microprocessor compares the measurement result with the normal impedance value of the device and determines whether the corresponding device is normal based on the comparison result. After the normal detection, the impedance value between each terminal in the experimental item is detected and compared with the impedance value between the terminals when the selected experimental item is correctly wired. Based on the comparison result, it is determined whether the experimental wiring is correct. Compared with the existing technology, the present invention is applied to a traditional electrical test bench and detects the status of each device and the correctness of the connections between each device before the experiment begins. This can prevent experimental accidents caused by device problems or wiring errors during the experiment, reduce the impact and damage of short circuits on devices and power supply lines, extend the service life of the facility, and reduce experimental equipment consumption and maintenance costs.

[0018] Other advantages, objectives and features of the present invention will be reflected in part from the following description and will be understood by those skilled in the art through study and practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0020] Figure 1 This is a schematic diagram of the overall circuit layout of a detection device according to one embodiment of the present invention;

[0021] Figure 2 This is a schematic diagram of the overall circuit structure of a detection device according to one embodiment of the present invention;

[0022] Figure 3 This is a diagram of the control buttons and liquid crystal display module panel of one embodiment of the present invention;

[0023] Figure 4 This is a schematic diagram of the wiring detection connection of an experimental item in one embodiment of the present invention.

[0024] Reference numerals:

[0025] 1. First connecting terminal; 2. Second connecting terminal; 3. Third connecting terminal; 4. Fourth connecting terminal; 5. Fifth connecting terminal; 6. Sixth connecting terminal; 7. Seventh connecting terminal; 8. Eighth connecting terminal. DETAILED DESCRIPTION

[0026] A specific embodiment of the present invention is described in detail below with reference to the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiment.

[0027] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the technical solutions of the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0028] In the description of the embodiments of the present invention, unless otherwise specified, “a plurality of” means two or more.

[0029] In the description of the embodiments of the present invention, each device under test has two connection terminals.

[0030] like Figure 1 and Figure 2 As shown, Figure 2 Where K represents a solid-state relay, A represents the input terminal of the solid-state relay, and B and C represent the two ends of the normally open contact of the solid-state relay. The present invention provides an intelligent detection device for device status and experimental wiring of an electrical test bench, comprising a microprocessor, an impedance measurement module, and multiple groups of solid-state relay control modules. Each group of solid-state relay control modules includes two solid-state relays. The input terminals of the two solid-state relays in the same group of solid-state relay control modules are connected to the microprocessor. Each terminal of the test bench is connected to the input and output terminals of the impedance measurement module via the normally open contacts of the two solid-state relays in the group of solid-state relay control modules. The impedance measurement module is used to measure the impedance value between the two terminals. The microprocessor compares the measured impedance value between the two terminals with the normal impedance value of the device or the impedance value between the terminals when the device is correctly connected. Based on the comparison result, it is determined whether the device status and experimental wiring are incorrect.

[0031] Each terminal of the device under test is connected to the input and output of an impedance measurement module via the normally open contacts of two solid-state relays of a solid-state relay control module. When detecting the device status, a microprocessor controls a solid-state relay of the solid-state relay control module at one terminal of the device to connect to the input of the impedance measurement module, and controls a solid-state relay of the solid-state relay control module at another terminal of the device to connect to the output of the impedance measurement module. The impedance measurement module then measures the impedance value between the two terminals of the device under test. The microprocessor compares the measurement result with the normal impedance value of the device and determines whether the corresponding device is normal based on the comparison result. After the normal detection, the impedance value between each terminal in the experimental item is detected and compared with the impedance value between the terminals when the selected experimental item is correctly wired. Based on the comparison result, it is determined whether the experimental wiring is correct. Compared with the existing technology, the present invention is applied on a traditional electrical test bench. Before the experiment begins, the status of each device and the connection between each device are detected in advance to determine whether the connection is correct. This can prevent and avoid experimental accidents caused by device problems or wiring errors during the experiment, reduce the impact and damage of short circuits on devices and power supply lines, extend the service life of the facility, and reduce experimental equipment consumption and maintenance costs.

[0032] Furthermore, in the same group of solid-state relay control modules, the normally open contact C end of one solid-state relay is connected to the input end of the impedance measurement module through impedance measurement line 1, and the normally open contact C end of another solid-state relay is connected to the output end of the impedance measurement module through impedance measurement line 2.

[0033] Furthermore, in the same set of solid-state relay control modules, the normally open contact B ends of the two solid-state relays are both connected to the wiring terminals, and the wiring terminals are connected to the device under test.

[0034] When measuring impedance values, each device can be equivalent to an impedance element. Under normal circumstances, the equivalent impedance value of a device is relatively stable, such as the internal impedance of a voltmeter, the internal impedance of an ammeter, the motor winding impedance, the fluorescent lamp filament impedance, the coil impedance of a contactor, etc. Some devices themselves are resistors, inductors, and capacitors with certain parameters. Therefore, by actually measuring the inter-terminal impedance of each device in the batch of test benches in good condition, the arithmetic average value of the impedance of each device is obtained as the standard impedance of the device, and the maximum error of the measured results of the impedance value of each terminal is used as the allowable deviation threshold. The normal impedance value and the allowable deviation threshold between the terminals of each device on the test bench are stored in the memory unit of the microprocessor for subsequent comparison after detecting the impedance value of the device to determine whether it is normal.

[0035] In the embodiment provided by the present invention, a latching circuit module is further included. The latching circuit module is connected to the microprocessor and is used to protect the circuit. The latching circuit module includes a latching relay, a transistor, a three-phase contactor, and a start button. The transistor is connected to the microprocessor and the latching relay respectively. The latching relay is connected to the three-phase contactor. The latching relay includes a relay coil and a power-on latching contact. The relay coil is connected to the transistor. The power-on latching contact is connected to the three-phase contactor. The power-on latching contact opens or closes depending on whether the relay coil has current. The start button is connected to the three-phase contactor to control the opening or closing of the three-phase contactor. When the power-on control port of the microprocessor outputs a low level, the transistor is turned off, the latching relay coil has no current, and the power-on latching contact is in a normally open state. At this time, even if the start button is pressed, the three-phase contactor cannot be closed. When the power-on control port of the microprocessor outputs a high level, the transistor is turned on, the latching relay coil has current, and the power-on latching contact remains closed. At this time, pressing the start button can control the closing of the three-phase contactor.

[0036] In the embodiment provided by the present invention, an emergency stop button is provided on the three-phase contactor to enable rapid power off in the event of an accident.

[0037] In the embodiments provided by the present invention, Figure 3 As shown, it also includes a control button and a liquid crystal display module, which are connected to the liquid crystal display module and the microprocessor. The control button controls the operation of the microprocessor, and the liquid crystal display module displays the experimental project selection menu, device status and information on whether the experimental wiring is correct.

[0038] The present invention also provides a method for detecting the device status and experimental wiring of an electrical experiment bench, comprising the following steps:

[0039] S100: The microprocessor power-on control port outputs a low level, and the power-on locking contact of the control locking circuit module is in a normally open state.

[0040] S200: Detecting device status, measuring the impedance values ​​of several devices under test, comparing the measurement results with the normal impedance values ​​of the devices, and determining whether the corresponding devices are normal.

[0041] S300: Wiring test of experimental items. After all the devices to be tested are tested to be normal and the wiring of the experimental items is completed in step S200, the experimental items are selected on the control button and the LCD module. The impedance values ​​between the wiring terminals in the measured experimental items are compared with the impedance values ​​between the terminals when the selected experimental items are correctly wired to determine whether the experimental wiring is correct.

[0042] S400: After the device status and experimental wiring are all checked correctly, the microprocessor power-on control port outputs a high level, and the power-on lock contact of the control lock circuit module is in a closed state. At this time, press the start button, the main contacts of the three-phase contactor are closed, and the experimental circuit is powered on, and the experiment can begin.

[0043] In the embodiment provided by the present invention, in step S100, the microprocessor power-on control port outputs a low level, the transistor of the locking circuit module is cut off, the relay coil of the locking relay has no current, and the power-on locking contact is in a normally open state. At this time, even if the start button is pressed, the three-phase contactor cannot be controlled to close, causing the experimental circuit to be in an open state and the experiment cannot be carried out.

[0044] In the embodiment provided by the present invention, in step S200, the impedance value between the two terminals of the device in a normal state is basically stable, and the microprocessor controls the normally open contacts of the solid-state relay corresponding to the two terminals of the device under test to close through the I / O control port, so that the two terminals of the device under test are connected to the impedance measurement line 1 and the impedance measurement line 2 respectively, thereby measuring the impedance value of the corresponding device, comparing the measured impedance value of the device with the normal impedance value of the device, and determining whether the corresponding device is normal or faulty. If a fault exists, the faulty device information is displayed on the liquid crystal display module.

[0045] Specifically, when the impedance of a device needs to be measured, the two terminals of the device are numbered i and j. The microprocessor sends a control level through the I / O control port to make the solid-state relay A 2i-1 If the port is high, the solid-state relay K 2i-1 The normally open contact of the solid-state relay A is closed, and the terminal i is connected to the impedance measurement line 1; the microprocessor continues to send control levels through the I / O control port to make the solid-state relay A 2j If the port is high, the solid-state relay K 2j The normally open contact of is closed, terminal j is connected to impedance measurement line 2, and terminals i and j of the test bench are connected to two impedance measurement lines respectively. The impedance measurement chip automatically completes the impedance measurement between terminals ij. The microprocessor reads the measured impedance value between the two terminals and compares it with the normal impedance value of the device. If the deviation is within the set allowable deviation threshold, the device is "intact"; if it exceeds the threshold, it is marked as "faulty"; the impedance measurement and judgment methods between the terminals of other devices are similar.

[0046] In the embodiment provided by the present invention, in step S300, the impedance value between any two wiring terminals in the experimental project is measured, and the measurement result is compared with the impedance value between the two wiring terminals when the selected experimental project is correctly wired, so as to determine whether the wiring between several devices is correct or incorrect. If there is an error, the error device information is displayed on the liquid crystal display module.

[0047] Specifically, each experimental project has a specific experimental wiring. When the wiring is correct, the several wiring terminals connected by wires between the experimental devices are short-circuited by the wires, and the impedance measured between these terminals is approximately zero. The terminals without wires connecting between the devices are open-circuited, and the impedance measured between these terminals is approximately infinite. The impedance between the terminals of the experimental device itself will also change due to the line connection impedance.

[0048] like Figure 1 、 Figure 2 and Figure 4 As shown, Figure 4 The numbers in the figure represent the terminal numbers. During testing, the microprocessor sends a control level through the I / O control port, sequentially closing the normally open contacts of the solid-state relays at each experimental terminal. First, the impedance between the first terminal 1 and the second terminal 2 is measured. The microprocessor sends a control level through the I / O control port, causing port A1 to be high. This closes the normally open contact of solid-state relay K1, connecting the first terminal 1 to impedance measurement line 1. The microprocessor then sends a control level through the I / O control port, causing port A4 to be high. This closes the normally open contact of solid-state relay K4, connecting the second terminal 2 to impedance measurement line 2. This connects the first and second terminals 1 and 2 of the device to two impedance measurement lines, respectively. The impedance measurement module automatically completes the impedance measurement between the first and second terminals 1 and 2. The microprocessor reads the impedance value between the first and second terminals 1 and 2 and compares it with the normal impedance value between the first and second terminals 1 and 2 when the connection is correct. If the deviation is within the set threshold, the connection is considered "correct"; if it exceeds the threshold, it is marked as "incorrect."

[0049] For example, the device between the second terminal 2 and the third terminal 3 is an incandescent lamp, the device between the fourth terminal 4 and the fifth terminal 5 is a voltmeter, and the device between the sixth terminal 6 and the seventh terminal 7 is an ammeter. Among them, the first terminal 1 and the second terminal 2, the second terminal 2 and the fourth terminal 4, the third terminal 3 and the fifth terminal 5, the third terminal 3 and the sixth terminal 6, and the seventh terminal 7 and the eighth terminal 8 are the correct experimental wiring.

[0050] By controlling the relay to be turned on, the first terminal 1 and the second terminal 2, the first terminal 1 and the third terminal 3, the first terminal 1 and the fourth terminal 4, the first terminal 1 and the fifth terminal 5, the first terminal 1 and the sixth terminal 6, the first terminal 1 and the seventh terminal 7, the first terminal 1 and the eighth terminal 8, the second terminal 2 and the third terminal 3, the second terminal 2 and the fourth terminal 4, the second terminal 2 and the fifth terminal 5, the second terminal 2 and the sixth terminal 6, the second terminal 2 and the seventh terminal 7, the second terminal 2 and the eighth terminal 8, the third terminal 3 and the fourth terminal 4, the The impedances between the third terminal 3 and the fifth terminal 5, the third terminal 3 and the sixth terminal 6, the third terminal 3 and the seventh terminal 7, the third terminal 3 and the eighth terminal 8, the fourth terminal 4 and the fifth terminal 5, the fourth terminal 4 and the sixth terminal 6, the fourth terminal 4 and the seventh terminal 7, the fourth terminal 4 and the eighth terminal 8, the fifth terminal 5 and the sixth terminal 6, the fifth terminal 5 and the seventh terminal 7, the fifth terminal 5 and the eighth terminal 8, the sixth terminal 6 and the seventh terminal 7, the sixth terminal 6 and the eighth terminal 8, and the seventh terminal 7 and the eighth terminal 8 are measured to obtain impedance values.

[0051] Obviously, when the wiring is correct, the impedance between the first terminal 1 and the second terminal 2, the first terminal 1 and the fourth terminal 4, the second terminal 2 and the fourth terminal 4, the third terminal 3 and the fifth terminal 5, the third terminal 3 and the sixth terminal 6, the fifth terminal 5 and the sixth terminal 6, the seventh terminal 7 and the eighth terminal 8 is only the impedance of the experimental wire, and the normal impedance value is between 0.1 ohm and 1 ohm. When the measured impedance between these terminals is set to exceed 2 ohms, it is judged that there is a problem of no connection, broken wire or poor contact in the wiring.

[0052] The impedances between the first terminal 1 and the third terminal 3, the first terminal 1 and the fifth terminal 5, the first terminal 1 and the sixth terminal 6, the first terminal 1 and the seventh terminal 7, the first terminal 1 and the eighth terminal 8, the second terminal 2 and the third terminal 3, the second terminal 2 and the fifth terminal 5, the second terminal 2 and the sixth terminal 6, the second terminal 2 and the seventh terminal 7, the second terminal 2 and the eighth terminal 8, the third terminal 3 and the fourth terminal 4, the fourth terminal 4 and the sixth terminal 6, the fourth terminal 4 and the seventh terminal 7, and the fourth terminal 4 and the eighth terminal 8 are mainly the impedances of incandescent lamps. Assuming that the internal resistance of an incandescent lamp is normally 10 ohms, if the measured impedance between these terminals exceeds 12 ohms, it is determined that there is a disconnection, a break, or poor contact problem in the wiring. If the measured impedance between these terminals is less than 9 ohms, it is determined that there is a wiring error.

[0053] The impedance of the sixth and seventh terminals 6 and 7, and the sixth and eighth terminals 6 and 8, primarily represents the impedance of the ammeter. Assuming the ammeter's internal resistance is normally 0.5 ohms, a measured impedance between these terminals exceeding 2 ohms indicates a missing connection, a broken wire, or poor contact. A measured impedance between these terminals less than 0.4 ohms indicates a wiring error. Wiring errors primarily involve short circuits. Impedances for missing or broken wires typically exceed 50,000 ohms, while poor contact typically ranges from several ohms to several thousand ohms above normal.

[0054] During testing, the microprocessor sends a control level through the I / O control port, sequentially closing the normally open contacts of the solid-state relays at each experimental terminal. The impedance between the first terminal 1 and the second terminal 2 is first measured. The microprocessor sends a control level through the I / O control port, causing port A1 to be high. This closes the normally open contact of solid-state relay K1, connecting first terminal 1 to impedance measurement line 1. The microprocessor then sends a control level through the I / O control port, causing port A4 to be high. This closes the normally open contact of solid-state relay K4, connecting second terminal 2 to impedance measurement line 2. This connects the first and second terminals 1 and 2 of the device to two impedance measurement lines, respectively. The impedance measurement module automatically completes the impedance measurement between the first and second terminals 1 and 2. The microprocessor reads the impedance value between the first and second terminals 1 and 2 and compares it to the normal impedance value between the first and second terminals 1 and 2 when the connection is correct. If the deviation is within the set threshold, the connection is considered "correct"; if it exceeds the threshold, it is marked as "incorrect."

[0055] Following the previous method, continue measuring and determining the impedance between the terminals for all combinations of the first terminal 1 and the third terminal 3, the first terminal 1 and the fourth terminal 4, ..., the first terminal 1 and the terminal, the second terminal 2 and the third terminal 3, the second terminal 2 and the fourth terminal 4, ..., the second terminal 2 and the terminal n.

[0056] In the embodiment provided by the present invention, in step S400, the power-on control port of the microprocessor outputs a high level, the transistor of the locking circuit module is turned on, the relay coil of the locking relay has current, so that the power-on locking contact is closed, and the start button is pressed to control the main contacts of the three-phase contactor to close. The experimental circuit has power and the experiment can start. At the same time, the self-protection contacts of the three-phase contactor are closed, so that the locking circuit module is in a conductive state.

[0057] Specifically, the impedance measurement and judgment between all the terminals are completed. If the wiring of all the terminals is judged to be "correct", the LCD screen displays "wiring is correct, and the experiment can be carried out", and the microprocessor P1.2 power-on control port outputs a high level to control the locking relay to be turned on, so that the "power-on locking contact" is closed, and the power-on lock is released. The experimenter can press the "start button" of the locking circuit, the three-phase contactor is closed, and the experimental circuit is in the power-on state, and the experimental project can be carried out. When the experimental circuit is in the power-on state, the intelligent detection program is prohibited from running; if the experimental wiring is judged to be "wrong", the "wrong" terminal information is displayed on the LCD display module, and the power-on circuit is kept locked. The experimenter pressing the "start button" of the experimental device is invalid and the power-on experiment cannot be started; the experimenter can press the "confirm" key to run the intelligent wiring test again after correcting the wrong experimental wiring according to the error diagnosis information prompted by the LCD screen until the test passes.

[0058] Press the "Reset" button at any time to reset and restart the intelligent detection device. At this time, the experimental circuit will automatically power off and restart the detection.

[0059] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or apparatus comprising the element.

[0060] Although the embodiments of the present invention have been disclosed above, they are not limited to the applications listed in the specification and exemplary embodiments. They can be applied to a variety of fields suitable for the present invention. Further modifications will be readily apparent to those skilled in the art. Therefore, the present invention is not limited to the specific details and illustrations shown and described herein without departing from the general concept defined by the claims and their equivalents.

Claims

1. Intelligent detection device for device status and experimental wiring of electrical experiment bench, characterized by: It includes a microprocessor, an impedance measurement module and multiple solid-state relay control modules; Each group of solid-state relay control modules includes two solid-state relays, and the input ends of the two solid-state relays in the same group of solid-state relay control modules are connected to the microprocessor. Each terminal of the experimental platform is connected to the input end and the output end of the impedance measurement module through the normally open contacts of the two solid-state relays of a group of solid-state relay control modules; The impedance measurement module is used to measure the impedance value between the two wiring terminals. The microprocessor compares the measured impedance value between the two wiring terminals with the normal impedance value of the device or the impedance value between the terminals when the connection is correct, and determines whether the device status and experimental wiring are incorrect based on the comparison result.

2. The device for intelligently detecting the device status and experimental wiring of an electrical test bench according to claim 1, characterized in that: It also includes a locking circuit module, which is connected to the microprocessor and protects the circuit; The locking circuit module includes a locking relay, a transistor, a three-phase contactor, and a start button. The transistor is respectively connected to the microprocessor and the locking relay, the locking relay is connected to the three-phase contactor, the locking relay includes a relay coil and a power-on locking contact, the relay coil is connected to the transistor, the power-on locking contact is connected to the three-phase contactor, the power-on locking contact is opened or closed according to whether the relay coil has current, and the start button is connected to the three-phase contactor to control the opening or closing of the three-phase contactor; When the microprocessor power-on control port outputs a low level, the transistor is turned off, the locking relay coil has no current, so that the power-on locking contact remains normally open, preventing the start button from controlling the three-phase contactor to close. When the microprocessor power-on control port outputs a high level, the transistor is turned on, the locking relay coil has current, so that the power-on locking contact remains closed, and the start button controls the three-phase contactor to close.

3. The device for intelligently detecting the device status and experimental wiring of an electrical experiment bench according to claim 2, characterized in that: The three-phase contactor is provided with an emergency stop button so that power can be quickly cut off in the event of an accident.

4. The device for intelligently detecting the device status and experimental wiring of an electrical experiment bench according to claim 2, characterized in that: It also includes a control button and a liquid crystal display module, both of which are connected to the microprocessor. The control button controls the operation of the microprocessor, and the liquid crystal display module displays the experimental project selection menu, device status and information on whether the experimental wiring is correct.

5. A method for detecting the device status and experimental wiring of an electrical test bench, using the intelligent detection device for the device status and experimental wiring of an electrical test bench as claimed in claim 4, characterized in that: The following steps are involved: S100: The power-on control port of the microprocessor outputs a low level, controlling the power-on locking contact of the locking circuit module to be in a normally open state; S200: Device status detection: the impedance measurement module measures the impedance values ​​of several devices under test respectively, compares the measurement results with the normal impedance values ​​of the corresponding devices, and determines whether the corresponding devices are normal based on the comparison results; S300: Detecting experimental project wiring. After all the devices under test are detected to be normal and the experimental project wiring is completed in step S200, the experimental project is selected on the liquid crystal display module through the control button, and the impedance value between each wiring terminal in the experimental project is measured and compared with the normal impedance value when the selected experimental project is correctly wired to determine whether the experimental wiring is correct; S400: After the device status and experimental wiring detection are all correct, the microprocessor power-on control port outputs a high level, controlling the power-on locking contact of the locking circuit module to be in a closed state. At this time, the start button is pressed, the main contacts of the three-phase contactor are closed, the experimental circuit is powered on, and the experiment begins.

6. The method for detecting the device status and experimental wiring of an electrical test bench according to claim 5, wherein: In step S100, the microprocessor power-on control port outputs a low level, the transistor of the locking circuit module is cut off, the relay coil of the locking relay has no current, the power-on locking contact is in a normally open state, the start button cannot control the three-phase contactor to close, the experimental circuit is in an open state, and the experiment cannot be performed.

7. The method for detecting the device status and experimental wiring of an electrical test bench according to claim 5, wherein: In step S200, the microprocessor controls the closing of the normally open contacts of the solid-state relay corresponding to the two wiring terminals of the device under test through the I / O control port, so that the two wiring terminals of the device under test are respectively connected to the input end and the output end of the impedance measurement module, thereby measuring the impedance value of the device, comparing the measured impedance value of the device with the normal impedance value of the device, and judging whether the corresponding device is normal or faulty based on the comparison result. If a fault exists, information about the faulty device is displayed on the liquid crystal display module.

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