Detection method of material content detection device, program product, electronic equipment and storage medium
Through the combination of optical fiber, light source and spectrometer, the refractive index is calculated using interference spectrum, and the problem of low accuracy of material component detection in the prior art is solved, and non-destructive and efficient material component detection is achieved.
Patent Information
- Application Number
- CN202510651046.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-20
- Publication Date
- 2025-08-08
AI Technical Summary
When detecting material component content, the prior art is affected by interference factors, the measurement accuracy is not high and requires destructive sample treatment.
Using a combination of optical fiber, light source and spectrometer, the thickness and interference spectrum of the material to be tested are obtained, its refractive index is calculated, and the content of the material component is not destructively detected using the pre-established content-refractive index calibration relationship.
It improves the accuracy and efficiency of material composition detection, reduces the complexity and error of manual operation, and achieves high resolution and high sensitivity detection.
Smart Images
Figure CN120446028A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of material detection, and in particular to a detection method, program product, electronic device and storage medium for a material content detection device. Background Art
[0002] The current method for detecting the content of components in materials is usually to use the physical or chemical reaction of the material to convert the component to be tested into a measurable signal, and then conduct qualitative and quantitative analysis of the component to be tested. It is affected by many interference factors and the measurement accuracy is not high. For example, the silicon content of silicon-carbon materials is mainly determined by carbon-sulfur test. This method has many interfering factors during the sample preparation process, such as the sample weight, the amount of solvent added and the stacking order, which will affect the accuracy and stability of the test results. Incomplete combustion of the sample during the test will also affect the test results, and other components in the sample (such as moisture, oxides, etc.) may also interfere with the analysis results, resulting in errors. Summary of the Invention
[0003] The purpose of the embodiments of the present application is to provide a detection method for a material content detection device, so as to reduce the difficulty of material content detection and improve the accuracy of material content detection.
[0004] In a first aspect, the present application provides a detection method for a material content detection device, wherein the material content detection device includes an optical fiber, a light source, a spectrometer, and a processor, wherein the light source and the spectrometer are connected to the head end of the optical fiber, and the end of the optical fiber is used to connect to a material structure to be tested having two parallel end faces; the method is applied to the processor, and the method includes: obtaining the thickness of the material structure to be tested and the corresponding interference spectrum; determining the refractive index of the material to be tested based on the thickness of the material structure to be tested and the corresponding interference spectrum; and determining the content of the target component in the material to be tested based on the refractive index.
[0005] In the above scheme, the material to be tested is connected to the end of the optical fiber, and there is no need to destructively process the material. The detection process is highly automated. The coordinated work of the light source, spectrometer and processor reduces the complexity and error of manual operation. The operation is simple and easy to implement. In addition, the interference spectrum has the characteristics of high resolution and high sensitivity, and can accurately detect tiny changes in refractive index, and thus can accurately detect the content of the target component with high detection accuracy.
[0006] As an optional method, determining the content of the target component in the material to be tested based on the refractive index includes: determining the content of the target component based on the refractive index and the content-refractive index calibration relationship corresponding to the material to be tested, wherein the content-refractive index calibration relationship is the correspondence between the target component content and the refractive index of the material to be tested.
[0007] In the above scheme, by pre-establishing the content-refractive index calibration relationship, the change in refractive index can be accurately corresponded to the change in the target component content. The use of the calibration relationship can effectively reduce the interference of other interference factors on the test results, thereby improving the detection accuracy.
[0008] As an optional method, determining the refractive index of the material to be tested based on the thickness of the material structure to be tested and the corresponding interference spectrum includes: determining the refractive index based on the wavelength shift of the interference spectrum and the optical path difference of the material structure to be tested, wherein the optical path difference is determined by the thickness and the refractive index.
[0009] In the above scheme, the wavelength shift of the interference spectrum can be quickly measured by a spectrometer without the need for complex experimental operations or long-term data collection, thereby improving detection efficiency.
[0010] As an optional manner, the material structure to be measured is connected to the end of the optical fiber through a sleeve.
[0011] In the above solution, the sleeve can fix and support the structure of the material to be tested, thereby improving the stability and reliability of the detection device.
[0012] As an optional manner, the method of connecting the material structure to be tested to the end of the optical fiber through a sleeve includes: sleeve-mounting and fixing the sleeve on the end of the optical fiber, the sleeve extending a preset distance along the axis of the optical fiber to form a dielectric cavity; filling the dielectric cavity with the material to be tested, and extruding it to form a material structure to be tested having two parallel end faces.
[0013] In the above scheme, the design of the sleeve makes the filling process of the material to be tested simpler. The material only needs to be filled into the medium cavity without complicated alignment or fixing operations. During the filling and extrusion process, the material can be evenly processed to ensure the uniformity and consistency of the material, providing a good foundation for subsequent testing.
[0014] As an optional method, the sleeve is a transparent sleeve; the sleeve is sleeved and fixed on the end of the optical fiber, including: applying ultraviolet optical glue on the end of the optical fiber; sleeved on the end of the optical fiber; and irradiating the end of the optical fiber and the transparent sleeve with a UV lamp to fix the transparent sleeve on the end of the optical fiber.
[0015] In the above solution, the cured UV optical adhesive has high strength and can firmly fix the transparent sleeve to the end of the optical fiber, ensuring the stability of the connection during the detection process.
[0016] As an optional manner, the light source is connected to the head end of the optical fiber via a first connecting optical fiber, and the spectrometer is connected to the head end of the optical fiber via a second connecting optical fiber.
[0017] In a second aspect, the present application provides a computer program product, comprising computer program instructions, which, when read and executed by a processor, execute the method steps of the first aspect.
[0018] In a third aspect, the present application provides an electronic device comprising: a processor, a memory and a bus, wherein the processor and the memory communicate with each other through the bus; the memory stores program instructions that can be executed by the processor, and the processor calls the program instructions to execute the method steps of the first aspect.
[0019] In a fourth aspect, the present application provides a computer-readable storage medium, comprising: the computer-readable storage medium stores computer instructions, and the computer instructions enable the computer to execute the method steps of the first aspect.
[0020] Other features and advantages of the present application will be described in the subsequent description, and in part will become apparent from the description, or will be understood by practicing the embodiments of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments of the present application. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without creative work.
[0022] Figure 1 A schematic flow chart of a detection method for a material content detection device provided in an embodiment of the present application;
[0023] Figure 2 A schematic diagram of an assembly of a material to be tested provided in an embodiment of the present application;
[0024] Figure 3 A partial schematic diagram of a material content detection device provided in an embodiment of the present application;
[0025] Figure 4 A schematic diagram of the electronic device structure provided in an embodiment of the present application. DETAILED DESCRIPTION
[0026] The following embodiments of the technical solution of the present application will be described in detail with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application and are therefore only examples and are not intended to limit the scope of protection of the present application.
[0027] It should be noted that all technical and scientific terms used herein have the same meanings as those commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.
[0028] In the description of the embodiments of this application, the technical terms "first" and "second" are used only to distinguish different objects and should not be understood to indicate or imply relative importance or implicitly specify the quantity, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.
[0029] It can be understood that the detection method of the material content detection device provided in the embodiment of the present application can be applied to terminal devices (also referred to as electronic devices) and servers; the terminal devices can specifically be smart phones, tablet computers, computers, personal digital assistants (PDAs), etc.; the servers can specifically be application servers or web servers.
[0030] To facilitate understanding of the technical solution provided in the embodiment of the present application, the application scenario of the detection method of the material content detection device provided in the embodiment of the present application is introduced below, taking the terminal device as the execution subject as an example.
[0031] Reference Figure 1 , Figure 1 A schematic flow chart of a detection method for a material content detection device provided in an embodiment of the present application, wherein the material content detection device includes an optical fiber, a light source, a spectrometer, and a processor, wherein the light source and the spectrometer are connected to the head end of the optical fiber, and the end of the optical fiber is used to connect to a material structure to be tested having two parallel end faces.
[0032] The method is applied to a processor and includes the following steps:
[0033] Step S10: Obtain the thickness of the material structure to be measured and the corresponding interference spectrum.
[0034] The material structure to be tested is a solid material with a stable shape composed of the material to be tested, and the material structure to be tested only contains two components to be tested. A parallel end face of the material to be tested is adjacent to the end of the optical fiber, and the thickness of the material structure to be tested refers to the distance between the two parallel end faces.
[0035] In an embodiment of the present application, the material to be tested can be either a powdery solid or a plastic solid material. If the material to be tested is a powdery solid, an external firmware or support can be used to form a material structure to be tested and fix the material structure to be tested at the end of the optical fiber. If the material to be tested is a plastic solid material, the material to be tested is shaped into a material structure to be tested having two parallel end faces.
[0036] A light source provides incident light, which is then transmitted by optical fiber to the material structure under test. Because a Fabry-Perot cavity is formed between the two parallel end faces of the material structure under test, the light is reflected once at each of the two parallel end faces. Because the two reflected beams have the same frequency and a constant phase difference, interference occurs. A spectrometer can record the interference spectrum, which consists of a series of peaks and troughs.
[0037] The processor is connected to the spectrometer and can obtain the interference spectrum generated by the spectrometer.
[0038] Step S20: determining the refractive index of the material to be measured according to the thickness of the material structure to be measured and the corresponding interference spectrum.
[0039] The interference equation of the double-beam interference of the incident light in the material structure to be measured is as follows:
[0040]
[0041] Where, I is the intensity of the interference signal light, I1 and I2 are the reflected light intensities of the double-beam interference, λ is the wavelength of the incident light, n is the refractive index of the material structure to be measured, and d is the thickness of the material structure to be measured. It represents the initial phase of the incident light when it enters the material structure to be measured.
[0042] When the phase difference between I1 and I2 meets the phase matching requirement, a phase dissipation interference spectrum with peaks and valleys will be generated. In the interference spectrum, a series of concave wavelengths λ m It can be predicted as:
[0043]
[0044] According to formula (2), the refractive index of the material structure to be tested can be determined.
[0045] Step S30: determining the content of the target component in the material to be tested according to the refractive index.
[0046] When the content of the target component in the material to be tested changes, the refractive index will also change, resulting in a redshift or blueshift of the wavelength in the interference spectrum. Slight changes in wavelength can reflect slight changes in the refractive index, and slight changes in the refractive index can reflect slight changes in the content of the target component. Therefore, the refractive index calculated by interference spectroscopy can be used to determine the content of the target component in the material to be tested.
[0047] In the above scheme, the material to be tested is connected to the end of the optical fiber, and there is no need to destructively process the material. The detection process is highly automated. The coordinated work of the light source, spectrometer and processor reduces the complexity and error of manual operation. The operation is simple and easy to implement. In addition, the interference spectrum has the characteristics of high resolution and high sensitivity, and can accurately detect tiny changes in refractive index, and thus can accurately detect the content of the target component with high detection accuracy.
[0048] In some embodiments, step S30 includes:
[0049] The content of the target component is determined based on the refractive index and the content-refractive index calibration relationship corresponding to the material to be measured, wherein the content-refractive index calibration relationship is the corresponding relationship between the target component content and the refractive index of the material to be measured.
[0050] The content-refractive index calibration relationship is determined by measuring the refractive index of a test material with a known target component content. It can be presented in a table, calibration curve, or other format. If the content-refractive index calibration relationship is in table form, the gradient between the progressive values in the table can be set according to actual needs and accuracy requirements. For example, if the gradient is 5%, the table contents will show the corresponding refractive indices for 0%, 5%, 10%, 15%, 20%, and so on, of the target component in the test material. When testing the target component content in the test material, the calculated refractive index is compared with the table contents to determine the target component content. If the content-refractive index calibration relationship is in the form of a calibration curve, it is plotted by measuring the refractive index of a sufficient number of test materials with known target component content. When testing the target component content in the test material, the calculated refractive index is found in the content-refractive index calibration curve to determine the target component content.
[0051] It should be noted that the compaction density of the material to be tested may affect the detection of the refractive index. In order to ensure the reliability of the measurement results, the method of controlling variables is used to control the consistency of the compaction density. The specific approach is to control the compaction density during the test to be the same as the compaction density under the calibration conditions of the content-refractive index calibration relationship. Maintaining the same compaction density can be achieved by controlling the same amount of material to be tested and the same thickness of the material structure to be tested.
[0052] In the above scheme, by pre-establishing the content-refractive index calibration relationship, the change in refractive index can be accurately corresponded to the change in the target component content. The use of the calibration relationship can effectively reduce the interference of other interference factors on the test results, thereby improving the detection accuracy.
[0053] In some embodiments, step S20 includes:
[0054] The refractive index is determined based on the wavelength shift of the interference spectrum and the optical path difference of the structure of the material to be measured, wherein the optical path difference is determined by the thickness and the refractive index.
[0055] The sum of the resonance order of the wavelength is a non-negative integer. According to formula (2), the optical path difference of the material structure to be measured, which is defined by the product of the refractive index and the thickness of the material structure to be measured, can be expressed as:
[0056]
[0057] From formula (3), we can see that the wavelength λ of a series of depressions m It is only affected by the optical path difference nd. When the change of the measured conditions causes the change of n or d, the interference spectrum will shift in wavelength. When the thickness of the material structure to be measured remains unchanged, the wavelength shift is only related to the change of the refractive index, that is:
[0058]
[0059] Therefore, the refractive index determined by the wavelength shift of the interference spectrum can uniquely reflect the change in the refractive index of the structure of the material to be measured.
[0060] In the above scheme, the wavelength shift of the interference spectrum can be quickly measured by a spectrometer without the need for complex experimental operations or long-term data collection, thereby improving detection efficiency.
[0061] In some embodiments, the material structure to be measured is connected to the end of the optical fiber through a sleeve.
[0062] After the material to be tested is filled into the cannula, it not only secures the material to the optical fiber but also shapes the material to form the structure. The cannula, attached to the outside of the optical fiber, determines the shape of the material to be tested, which can be cylindrical, prism, or other cylindrical shapes.
[0063] In the above solution, the sleeve can fix and support the structure of the material to be tested, thereby improving the stability and reliability of the detection device.
[0064] In some embodiments, a method for connecting a material structure to be tested to an end of an optical fiber via a sleeve includes:
[0065] The sleeve is placed and fixed on the end of the optical fiber, and the sleeve extends a preset distance along the axis of the optical fiber to form a dielectric cavity.
[0066] The medium cavity is filled with the material to be tested and extruded to form a material structure to be tested having two parallel end surfaces.
[0067] The sleeve is placed on the end of the optical fiber, so that the diameter of the formed medium cavity is consistent with the size of the optical fiber, so that the structure of the material to be tested filled therein is consistent with the size of the optical fiber.
[0068] The preset distance that the sleeve extends along the optical fiber needs to be determined based on actual needs to ensure that the material structure to be tested can be completely filled into the sleeve. Therefore, the preset distance needs to be no less than the thickness of the material structure to be tested.
[0069] After the test material is filled into the cannula, there are still large gaps between the test materials. To achieve a uniform distribution of the test material structure, the test material can be filled again after filling. As an implementation method, an additional optical fiber is used in conjunction with a clamp. The clamp is clamped on the optical fiber and the test material in the cannula is squeezed firmly until the test material structure is tight and stable.
[0070] In the above scheme, the design of the sleeve makes the filling process of the material to be tested simpler. The material only needs to be filled into the medium cavity without complicated alignment or fixing operations. During the filling and extrusion process, the material can be evenly processed to ensure the uniformity and consistency of the material, providing a good foundation for subsequent testing.
[0071] In some embodiments, the sleeve is a transparent sleeve; and the sleeve is sleeved and fixed on the end of the optical fiber, comprising:
[0072] Apply UV optical glue to the end of the optical fiber.
[0073] A transparent sleeve is placed on the end of the optical fiber.
[0074] The end of the optical fiber and the transparent sleeve are illuminated by a UV lamp to fix the transparent sleeve on the end of the optical fiber.
[0075] The transparent sleeve can be a glass sleeve, a plastic sleeve, a quartz sleeve, etc. UV optical adhesive is a special adhesive that can be quickly cured within a few seconds to tens of seconds under the irradiation of ultraviolet light (usually with a wavelength of 365 nanometers to 405 nanometers).
[0076] Reference Figure 2 , Figure 2A schematic diagram illustrating the assembly of a material to be tested, according to an embodiment of the present application. UV optical adhesive 20 is applied to the end of an optical fiber 10, a transparent sleeve 30 is placed over the optical fiber 10, and a predetermined distance of the transparent sleeve 30 is cut at position 40. A UV lamp is then used to illuminate the transparent sleeve 30 to cure it. Finally, a fixture 50 is used in conjunction with an additional section of optical fiber 10 to squeeze the material to be tested 60 until the material to be tested is formed into a structure.
[0077] In the above solution, the cured UV optical adhesive has high strength and can firmly fix the transparent sleeve to the end of the optical fiber, ensuring the stability of the connection during the detection process.
[0078] In some embodiments, the light source is connected to the head end of the optical fiber through a first connecting optical fiber, and the spectrometer is connected to the head end of the optical fiber through a second connecting optical fiber.
[0079] Reference Figure 3 , Figure 3 This is a partial schematic diagram of a material content detection device provided in an embodiment of the present application. Figure 3 The light source 100 is connected to the head end of the optical fiber via the first connecting optical fiber 200, and the spectrometer 300 is connected to the head end of the optical fiber via the second connecting optical fiber 400. Figure 3 The enlarged part in the middle circle is a schematic diagram of the structure of the optical fiber end.
[0080] The material content detection device can also meet the needs of high-throughput detection. Optionally, high-density fiber array technology is used to construct parallel detection units and build a multi-channel parallel detection system. By integrating wavelength division multiplexing (WDM) modules and time division multiplexing (TDM) technology, multi-wavelength optical signals can be transmitted simultaneously in a single optical fiber. Combined with microfluidic chips or arrayed sample fixtures, a single detection process of dozens to hundreds of materials to be tested can be achieved. The system separates multi-channel interference spectral signals into independent spectrometer channels through spectroscopic modules such as spectroscopic prisms and diffraction gratings, and cooperates with a synchronous trigger controller to ensure the phase consistency of signal acquisition in each channel. For example, a 1×16 fiber optic beam splitter is used to divide the light source output into 16 channels, each corresponding to an independent sample detection unit, and time division multiplexing technology is used to achieve parallel data acquisition of thousands of times per second.
[0081] Alternatively, a modular, scalable architecture can be employed, with core detection components (such as light sources and spectrometers) designed as standardized modules. These modules are plug-and-play compatible via the PXIe bus or Industrial Ethernet, and support dynamic expansion of the number of detection channels. For example, with a basic 8-channel configuration, users can gradually upgrade to 64 channels or higher by adding fiber optic expansion cards and sample fixture modules. Each module has a built-in independent FPGA controller for distributed data preprocessing, reducing the load on the central processing unit. This architecture supports hot-swappable maintenance, ensuring that a single module failure does not affect the operation of other channels. It is also compatible with fiber optic interfaces of different specifications (such as FC / APC and LC / UPC), adapting to diverse sample detection needs.
[0082] The present application provides a computer program product, including computer program instructions. When the computer program instructions are read and executed by a processor, the methods provided by the above-mentioned method embodiments are executed.
[0083] The present application provides a computer-readable storage medium, including: a computer-readable storage medium storing computer instructions, wherein the computer instructions enable a computer to execute the methods provided by the above-mentioned method embodiments.
[0084] Figure 4 This is a schematic diagram of the electronic device structure provided in the embodiment of the present application, such as Figure 4 As shown, the electronic device includes: a processor 401, a memory 402 and a bus 403; wherein, the processor 401 and the memory 402 communicate with each other through the bus 403; the memory 402 stores program instructions that can be executed by the processor 401, and the processor 401 calls the program instructions to execute the methods provided by the above-mentioned method embodiments.
[0085] The processor 401 includes one or more (only one is shown in the figure), which can be an integrated circuit chip with signal processing capabilities. The above-mentioned processor 401 can be a general-purpose processor, including a central processing unit (CPU), a micro control unit (MCU), a network processor (NP) or other conventional processors; it can also be a special-purpose processor, including a neural network processor (NPU), a graphics processing unit (GPU), a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. In addition, when there are multiple processors 401, some of them can be general-purpose processors and the other part can be special-purpose processors.
[0086] The memory 402 includes one or more (only one is shown in the figure), which may be, but is not limited to, a random access memory (RAM), a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), etc. The processor 401 and other possible components can access the memory 402 and read and / or write data therein.
[0087] In particular, one or more computer program instructions may be stored in the memory 402 , and the processor 401 may read and execute these computer program instructions to implement the weak password scanning behavior identification method provided in the embodiment of the present application.
[0088] Bus 403 includes one or more (only one is shown in the figure) and can be used to communicate directly or indirectly with other devices to exchange data. Bus 403 may include devices for wired and wireless communication, such as optical fibers, serial peripheral interface (SPI) modules, integrated circuit buses (I2C), etc., and may also include devices for wireless communication, such as Bluetooth modules, Wi-Fi modules, mobile communication modules (such as 4G, 4G modules), etc.
[0089] Understandably, Figure 4 The structure shown is only for illustration, and the electronic device may also include Figure 4 More or fewer components than shown, or with Figure 4 Different structures are shown. Figure 4 Each component shown in the figure can be implemented using hardware, software, or a combination thereof. The electronic device may be a physical device, such as a switch, router, server, or PC, or a virtual device, such as a virtual machine or virtualized container. Furthermore, the electronic device is not limited to a single device but may also be a combination of multiple devices or an integrated environment consisting of a large number of devices.
[0090] In the embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interface, the indirect coupling or communication connection of the device or unit can be electrical, mechanical or other forms.
[0091] In addition, the units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0092] Furthermore, the functional modules in each embodiment of the present application can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.
[0093] The above are merely examples of the present application and are not intended to limit the scope of protection of the present application. Those skilled in the art will appreciate that various modifications and variations are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present application shall be included within the scope of protection of the present application.
Claims
1. A detection method for a material content detection device, characterized in that: The material content detection device includes an optical fiber, a light source, a spectrometer and a processor, wherein the light source and the spectrometer are connected to the head end of the optical fiber, and the tail end of the optical fiber is used to connect to a material structure to be tested having two parallel end faces; The method is applied to a processor, and the method includes: Obtaining the thickness of the material structure to be measured and the corresponding interference spectrum; Determining the refractive index of the material to be measured based on the thickness of the material structure to be measured and the corresponding interference spectrum; The content of the target component in the material to be tested is determined according to the refractive index.
2. The detection method according to claim 1, characterized in that Determining the content of the target component in the material to be tested according to the refractive index includes: The content of the target component is determined according to the refractive index and the content-refractive index calibration relationship corresponding to the material to be measured, wherein the content-refractive index calibration relationship is the corresponding relationship between the target component content and the refractive index of the material to be measured.
3. The detection method according to claim 1, wherein Determining the refractive index of the material to be measured based on the thickness of the material structure to be measured and the corresponding interference spectrum includes: The refractive index is determined according to the wavelength shift of the interference spectrum and the optical path difference of the structure of the material to be measured, wherein the optical path difference is determined by the thickness and the refractive index.
4. The detection method according to claim 1, wherein The material structure to be tested is connected to the end of the optical fiber through a sleeve.
5. The detection method according to claim 4, characterized in that The method for connecting the material structure to be tested to the end of the optical fiber through a sleeve comprises: The sleeve is placed on and fixed to the end of the optical fiber, and the sleeve extends a preset distance along the axis of the optical fiber to form a dielectric cavity; The material to be tested is filled into the medium cavity and extruded to form a material to be tested structure having two parallel end surfaces.
6. The detection method according to claim 4, characterized in that The sleeve is a transparent sleeve; The step of sleeve-fitting and fixing the sleeve on the end of the optical fiber comprises: Applying ultraviolet optical glue to the end of the optical fiber; Sleeving the transparent sleeve on the end of the optical fiber; The end of the optical fiber and the transparent sleeve are irradiated with a violet light so that the transparent sleeve is fixed to the end of the optical fiber.
7. The detection method according to any one of claims 1 to 6, characterized in that The light source is connected to the head end of the optical fiber via a first connecting optical fiber, and the spectrometer is connected to the head end of the optical fiber via a second connecting optical fiber.
8. A computer program product, characterized in that The method comprises computer program instructions, and when the computer program instructions are read and executed by a processor, the method according to any one of claims 1 to 7 is executed.
9. An electronic device, characterized in that: include: A processor, a memory, and a bus, wherein the processor and the memory communicate with each other via the bus; The memory stores program instructions that can be executed by the processor, and the processor can execute the method according to any one of claims 1 to 7 by calling the program instructions.
10. A computer-readable storage medium, characterized in that include: The computer-readable storage medium stores computer instructions, and the computer instructions enable the computer to execute the method according to any one of claims 1 to 7.