A test block for testing and adjusting the performance of an ultrasonic testing instrument and a probe combination

Abstract

The present invention belongs to the field of ultrasonic testing technology and discloses a test block for testing and adjusting the performance of an ultrasonic testing instrument and a probe combination. The test block includes a first plane, a second plane, a third plane, a fourth plane, a fifth plane, a sixth plane, a seventh plane, a ninth plane, an eighth plane, a tenth plane, an eleventh plane, a twelfth plane, a thirteenth plane, a fourteenth plane, a fifteenth plane, a sixteenth plane, a seventeenth plane, and an eighteenth plane connected in sequence, with the eighteenth plane further connected to the first plane; the test block is provided with a first transverse hole, a second transverse hole, a third transverse through hole, a fourth transverse through hole, a fifth transverse through hole, a sixth transverse through hole, a seventh transverse through hole, and an eighth transverse through hole. The present invention can be used for testing and adjusting the performance of an ultrasonic testing instrument and a probe combination. It is small in size and easy to carry, and can meet the needs of daily testing.

Description

Technical Field

[0001] The invention belongs to the technical field of ultrasonic detection, and in particular relates to a test block used for performance testing and adjustment of an ultrasonic detection instrument and a probe combination. Background Art

[0002] Ultrasonic testing is mainly based on the propagation characteristics of ultrasonic waves in workpieces. Its working principle is: the sound source generates ultrasonic waves, which are allowed to enter the workpiece in a certain way. The ultrasonic waves propagate in the workpiece and interact with the workpiece material and the defects therein, causing its propagation direction or characteristics to be changed. The changed ultrasonic waves are received by the detection equipment and can be processed and analyzed. Based on the characteristics of the received ultrasonic waves, the presence of defects in the workpiece itself and its interior and the characteristics of the defects are evaluated.

[0003] Ultrasonic testing offers high defect detection rates, quantitative positioning capabilities, and high efficiency. Because it is highly sensitive to hazardous defects such as weld cracks and lack of fusion, and has minimal requirements for the testing environment, it is often used as a key tool for welding quality inspection and control.

[0004] When testing and calibrating the performance of ultrasonic testing instruments and probes, it is essential to select the correct testing equipment to ensure the reliability of test results and the quality of ultrasonic testing. Comparison blocks used in weld testing include general-purpose and specialized blocks. These blocks should have acoustic properties similar to those of the test piece or material being tested, contain a meaningful reference reflector, and are used to adjust the ultrasonic detector's amplitude and / or time baseline to compare the detected discontinuity signal (i.e., defect signal) with the signal generated by the reference reflector. The pulse reflection method is commonly used to test and calibrate the performance of ultrasonic testing instruments and probes. This requires the use of various sizes of circular arcs, bosses, circular holes, and transverse through-holes of varying depths on the test block as reflectors. This complicates the fabrication of the test blocks, and the resulting large blocks are difficult to carry to on-site testing. Placing these reflectors on the same test block is even more difficult, necessitating the production of multiple test blocks. Summary of the Invention

[0005] The purpose of the present invention is to provide a test block for testing and adjusting the performance of an ultrasonic detection instrument and a probe combination. The pulse reflection method and the end point diffraction method are used to test and calibrate the performance of the ultrasonic detection instrument and the probe, so as to produce a test block that is small in size, easy to carry, and meets the necessary functions for daily detection. The test block can be used for adjusting the time base line, testing the incident point (or leading edge), refraction angle (or K value), acoustic axis deflection angle, and resolution of an oblique probe, testing the blind area and resolution of a straight probe, and producing distance-amplitude curves for straight and oblique probes.

[0006] To achieve the above-mentioned object, the present invention provides the following technical solution: a test block for performance testing and adjustment of an ultrasonic detection instrument and a probe combination, the test block comprising a first plane, a second plane, a third plane, a fourth plane, a fifth plane, a sixth plane, a seventh plane, a ninth plane, an eighth plane, a tenth plane, an eleventh plane, a twelfth plane, a thirteenth plane, a fourteenth plane, a fifteenth plane, a sixteenth plane, a seventeenth plane, and an eighteenth plane connected in sequence, the eighteenth plane being further connected to the first plane;

[0007] The test block is provided with a first transverse hole, a second transverse hole, a third transverse through hole, a fourth transverse through hole, a fifth transverse through hole, a sixth transverse through hole, a seventh transverse through hole and an eighth transverse through hole; the first transverse hole and the second transverse hole constitute stepped transverse holes of different diameters, the same length and concentricity, and are arranged near the intersection of the first plane and the second plane; the fourth transverse through hole, the fifth transverse through hole, the sixth transverse through hole, the seventh transverse through hole and the eighth transverse through hole are arranged in sequence and are arranged near the third plane; the third transverse through hole is arranged near the tenth plane.

[0008] Furthermore, the test block has a length of 150 mm, a width of 100 mm, and a thickness of 40 mm; the length of the first plane is 100 mm, the length of the second plane is 150 mm, the length of the third plane is 100 mm, the length of the fourth plane is 80 mm, the width of the fifth plane is 9 mm, the width of the sixth plane is 10 mm, the width of the seventh plane is 6 mm, the width of the eighth plane is 15 mm, the width of the ninth plane is 2 mm, the width of the tenth plane is 28 mm, the width of the eleventh plane is 10 mm, and the width of the twelfth plane is 10 mm. m, the width of the thirteenth plane is 5mm, the width of the fourteenth plane is 10mm, the width of the fifteenth plane is 5mm, the width of the sixteenth plane is 5mm, the width of the seventeenth plane is 20mm, and the width of the eighteenth plane is 5mm; the diameter of the first transverse hole is 6mm and the length is 20mm, the diameter of the second transverse hole is 10mm and the length is 20mm; the diameter of the third transverse through hole, the fourth transverse through hole, the fifth transverse through hole, the sixth transverse through hole, the seventh transverse through hole and the eighth transverse through hole are all 3mm and the length are all 40mm; in the test block, two adjacent planes are perpendicular to each other.

[0009] Furthermore, the end angle of the intersection of the eleventh plane and the twelfth plane, the end angle of the intersection of the thirteenth plane and the fourteenth plane, and the end angle of the intersection of the fifteenth plane and the sixteenth plane are used to determine the incident point (or front) of the oblique probe, the refraction angle (or K value), the instrument time baseline and the acoustic axis deviation angle; the incident point (or front), the refraction angle (or K value), the instrument time baseline and the acoustic axis deviation angle of the oblique probe are determined using the end point diffraction wave method.

[0010] Furthermore, the pulse echo signal generated by the intersection angle of the sixteenth plane and the seventeenth plane is used to adjust the sensitivity of the instrument so as to be able to find the diffraction wave signals at the intersection angle of the eleventh plane and the twelfth plane, the intersection angle of the thirteenth plane and the fourteenth plane, and the intersection angle of the fifteenth plane and the sixteenth plane;

[0011] The diffraction wave signal amplitudes generated by the intersection angles of the eleventh and twelfth planes, the intersection angles of the thirteenth and fourteenth planes, and the intersection angles of the fifteenth and sixteenth planes are used to determine the sensitivity of defect height measurement to avoid diffraction waves that cannot find defects due to excessively high or low sensitivity.

[0012] Furthermore, the first plane, the eighteenth plane and the seventeenth plane form a flange, which can avoid the influence of surface waves on endpoint diffraction waves during the testing of the incident point (or front) of the oblique probe, the refraction angle (or K value), the instrument time baseline and the acoustic axis deviation angle.

[0013] Furthermore, the second plane and the fourth plane are used to adjust the time base of the straight probe, the sixth plane, the ninth plane and the tenth plane are used to measure the resolution of the straight probe, and the first transverse hole and the second transverse hole are used to measure the blind area of ​​the straight probe.

[0014] Furthermore, the first transverse hole, the second transverse hole, the third transverse through hole, the fourth transverse through hole, the fifth transverse through hole, the sixth transverse through hole, the seventh transverse through hole and the eighth transverse through hole are parallel to the first plane, the second plane, the third plane and the fourth plane.

[0015] Furthermore, the first transverse hole and the second transverse hole are used to measure the resolution of the angle probe.

[0016] Furthermore, probes can be placed on the first plane, second plane, third plane and fourth plane of the test block. Probes at different angles placed on different planes can obtain reflected echoes of the third transverse through hole, fourth transverse through hole, fifth transverse through hole, sixth transverse through hole, seventh transverse through hole and eighth transverse through hole of different depths; the third transverse through hole, fourth transverse through hole, fifth transverse through hole, sixth transverse through hole, seventh transverse through hole and eighth transverse through hole are used to produce distance-amplitude curves of oblique probes and straight probes.

[0017] Furthermore, the flatness error of the test block does not exceed ±0.03mm, the parallelism error of the test block does not exceed ±0.03mm, the surface roughness of each plane and transverse through hole of the test block is not greater than 3.2 μm, and the dimensional deviation of each plane and transverse through hole of the test block is not greater than ±0.05mm.

[0018] The present invention has the following advantages:

[0019] 1. The method adopted by the present invention for measuring the incident point (or leading edge), refraction angle (or K value), instrument time baseline and acoustic axis deflection angle of the angle probe is the endpoint diffraction wave method. It is applicable to angle probes of different angles and does not require the provision of arc surfaces, bosses, circular holes of various specifications and sizes, and transverse through holes of different depths as reflectors. It only needs to measure the horizontal distance from the front end of the probe to the left side of the test block. The incident point (or leading edge), refraction angle (or K value), sound velocity and time delay of the angle probe can be obtained through calculation, making the processing and manufacture of the test block simple and convenient.

[0020] 2. The flange set on the test block can avoid the influence of surface waves on the endpoint diffraction waves, and can quickly, clearly and accurately identify the diffraction wave signal;

[0021] 3. When using diffraction waves to measure probe performance, the diffraction wave signal generated by the step end angle is used. When the probe moves within a small range on the test block, the diffraction wave signal can change significantly, and the fluctuation of the wave height can be clearly observed. The accuracy of finding the highest wave is higher, so the measurement result is more accurate than that using the pulse echo method;

[0022] 4. The amplitude of the pulse reflection echo signal at the upper end point of the step can be used to determine the sensitivity of finding the diffraction wave signal at the lower end point of the step. The amplitude of the pulse reflection echo signal at the upper end point of the step and the diffraction wave signal at the lower end point can be used to determine the sensitivity of defect height measurement to avoid the inability to find the diffraction wave of the defect due to too high or too low sensitivity.

[0023] 5. It can be used to test the resolution of oblique probes, the blind area of ​​straight probes, the resolution, and to create distance-amplitude curves of straight and oblique probes;

[0024] 6. Small size, easy to carry, meeting the needs of daily testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 It is a structural schematic diagram of the present invention;

[0026] Figure 2 and Figure 3 This is a schematic diagram of the test of sound velocity, delay, K value, leading edge, and acoustic axis deflection angle of the oblique probe;

[0027] Figure 4 This is a schematic diagram of the resolution test of the oblique probe;

[0028] Figure 5 Make a schematic diagram of the distance-amplitude curve of the oblique probe;

[0029] Figure 6 This is a schematic diagram of the straight probe sound velocity, delay, resolution, and blind spot test;

[0030] Figure 7Make a schematic diagram of the distance-amplitude curve of the straight probe;

[0031] Figure 8 Schematic diagram of the test block size. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0033] Those skilled in the art will understand that the following examples are intended to illustrate the present invention only and should not be construed as limiting the scope of the present invention. Where specific techniques, connections, or conditions are not specified in the examples, the techniques, connections, and conditions described in the literature in the art or in accordance with the product specifications were used. Materials, instruments, or equipment used, where the manufacturer is not specified, are all commercially available conventional products.

[0034] like Figure 1 As shown, the present invention provides a test block for performance testing and adjustment of an ultrasonic detection instrument and a probe combination, comprising a first plane 1, a second plane 2, a third plane 3, a fourth plane 4, a fifth plane 5, a sixth plane 6, a seventh plane 7, a ninth plane 9, an eighth plane 8, a tenth plane 10, an eleventh plane 11, a twelfth plane 12, a thirteenth plane 13, a fourteenth plane 14, a fifteenth plane 15, a sixteenth plane 16, a seventeenth plane 17, and an eighteenth plane 18 connected in sequence, and the eighteenth plane 18 is further connected to the first plane 1; the eighteen planes form a flange, a step, and a rectangular groove on the test block;

[0035] The test block is provided with a first transverse hole 20, a second transverse hole 21, a third transverse through hole 22, a fourth transverse through hole 23, a fifth transverse through hole 24, a sixth transverse through hole 25, a seventh transverse through hole 26, and an eighth transverse through hole 27. The first transverse hole 20 and the second transverse hole 21 constitute stepped transverse holes of different diameters, the same length, and are concentric, and are located near the intersection of the first plane 1 and the second plane 2. The fourth transverse through hole 23, the fifth transverse through hole 24, the sixth transverse through hole 25, the seventh transverse through hole 26, and the eighth transverse through hole 27 are arranged in sequence from right to left and are located near the third plane 3. The third transverse through hole 22 is located near the tenth plane 10. The first transverse hole 20, the second transverse hole 21, the third transverse through hole 22, the fourth transverse through hole 23, the fifth transverse through hole 24, the sixth transverse through hole 25, the seventh transverse through hole 26, and the eighth transverse through hole 27 are all parallel to the first plane 1, the second plane 2, the third plane 3, and the fourth plane 4.

[0036] Specifically, the test block has a length of 150 mm, a width of 100 mm, and a thickness of 40 mm; the length of the first plane 1 is 100 mm, the length of the second plane 2 is 150 mm, the length of the third plane 3 is 100 mm, the length of the fourth plane 4 is 80 mm, the width of the fifth plane 5 is 9 mm, the width of the sixth plane 6 is 10 mm, the width of the seventh plane 7 is 6 mm, the width of the eighth plane 8 is 15 mm, the width of the ninth plane 9 is 2 mm, the width of the tenth plane 10 is 28 mm, the width of the eleventh plane 11 is 10 mm, the width of the twelfth plane 12 is 10 mm, the width of the thirteenth plane 13 is 5 mm, and the width of the fourteenth plane 14 is 10 mm. mm, the width of the fifteenth plane 15 is 5 mm, the width of the sixteenth plane 16 is 5 mm, the width of the seventeenth plane 17 is 20 mm, and the width of the eighteenth plane 18 is 5 mm; the diameter of the first transverse hole 20 is 6 mm and the length is 20 mm, the diameter of the second transverse hole 21 is 10 mm and the length is 20 mm; the diameter of the third transverse through hole 22, the fourth transverse through hole 23, the fifth transverse through hole 24, the sixth transverse through hole 25, the seventh transverse through hole 26, and the eighth transverse through hole 27 are all 3 mm in diameter and 40 mm in length; the flatness error of the test block does not exceed ±0.03 mm, the parallelism error of the test block does not exceed ±0.03 mm, the surface roughness of each plane and transverse through hole of the test block is not greater than 3.2 μm, and the dimensional deviation of each plane and transverse through hole of the test block is not greater than ±0.05 mm.

[0037] In the test block, any two adjacent planes are perpendicular to each other, that is, the first plane 1 of the test block is perpendicular to the second plane 2, the second plane 2 and the third plane 3, the third plane 3 and the fourth plane 4, the fourth plane 4 and the fifth plane 5, the fifth plane 5 and the sixth plane 6, the sixth plane 6 and the seventh plane 7, the seventh plane 7 and the ninth plane 9, the ninth plane 9 and the eighth plane 8, the eighth plane 8 and the tenth plane 10, the tenth plane 10 and the eleventh plane 11, the eleventh plane 11 and the twelfth plane 12, the twelfth plane 12 and the thirteenth plane 13, the thirteenth plane 13 and the fourteenth plane 14, the fourteenth plane 14 and the fifteenth plane 15, the fifteenth plane 15 and the sixteenth plane 16, the sixteenth plane 16 and the seventeenth plane 17, the seventeenth plane 17 and the eighteenth plane 18, and the eighteenth plane 18 is perpendicular to the first plane 1. The first plane 1, the eighteenth plane 18 and the seventeenth plane 17 form a flange, which can avoid the influence of the surface wave on the endpoint diffraction wave during the test of the incident point (or front) of the oblique probe, the refraction angle (or K value), the instrument time baseline and the acoustic axis deviation angle of the oblique probe.

[0038] To further optimize the solution, the end angle of the intersection of the eleventh plane 11 and the twelfth plane 12, the end angle of the intersection of the thirteenth plane 13 and the fourteenth plane 14, and the end angle of the intersection of the fifteenth plane 15 and the sixteenth plane 16 are used to determine the incident point (or front), refraction angle (or K value), instrument time baseline and acoustic axis deviation angle of the oblique probe; the incident point (or front), refraction angle (or K value), instrument time baseline and acoustic axis deviation angle of the oblique probe use end point diffraction waves, which is suitable for oblique probes at different angles.

[0039] A further optimization scheme is adopted in which the pulse echo signal generated by the intersection angle of the sixteenth plane 16 and the seventeenth plane 17 is used to adjust the sensitivity of the instrument so as to quickly find the diffraction wave signals at the intersection angle of the eleventh plane 11 and the twelfth plane 12, the intersection angle of the thirteenth plane 13 and the fourteenth plane 14, and the intersection angle of the fifteenth plane 15 and the sixteenth plane 16; the amplitude of the diffraction wave signal generated by the intersection angle of the eleventh plane 11 and the twelfth plane 12, the intersection angle of the thirteenth plane 13 and the fourteenth plane 14, and the intersection angle of the fifteenth plane 15 and the sixteenth plane 16 is used to determine the sensitivity of the defect height measurement to avoid the inability to find the diffraction wave of the defect due to too high or too low sensitivity.

[0040] To further optimize the solution, the second plane 2 and the fourth plane 4 are used to adjust the time baseline of the straight probe, the sixth plane 6, the ninth plane 9, and the tenth plane 10 are used to measure the resolution of the straight probe, and the first transverse hole 20 and the second transverse hole 21 are used to measure the blind area of ​​the straight probe. Probes can be placed on the first plane 1, the second plane 2, the third plane 3, and the fourth plane 4 of the test block. Probes at different angles placed on different planes can obtain reflected echoes of the third transverse through hole 22, the fourth transverse through hole 23, the fifth transverse through hole 24, the sixth transverse through hole 25, the seventh transverse through hole 26, and the eighth transverse through hole 27 of different depths; the third transverse through hole 22, the fourth transverse through hole 23, the fifth transverse through hole 24, the sixth transverse through hole 25, the seventh transverse through hole 26, and the eighth transverse through hole 27 are used to produce distance-amplitude curves for the oblique probe and the straight probe. Example 1

[0041] like Figure 8 As shown, a test block for performance testing and adjustment of an ultrasonic detection instrument and a probe combination includes a test block body and a flange, a step, a rectangular groove, a stepped horizontal hole, and a horizontal through hole arranged on the test block body.

[0042] The flange, step and rectangular groove on the test block body are formed by a series of planes on the left side intersecting vertically.

[0043] The stepped horizontal hole on the right side of the test block is formed by the intersection of two concentric horizontal holes of different diameters and the same length.

[0044] The test block is provided with 6 transverse through holes of different depths relative to the upper, lower, left and right sides; among them, the center of the third transverse through hole 22 is 40 mm away from the first plane and 30 mm away from the tenth plane; the center of the fourth transverse through hole 23 is 5 mm away from the second plane; the center of the fifth transverse through hole 24 is 20 mm away from the second plane; the center of the sixth transverse through hole 25 is 40 mm away from the second plane; the center of the seventh transverse through hole 26 is 60 mm away from the second plane; the center of the eighth transverse through hole 27 is 90 mm away from the second plane.

[0045] Figure 8 In the figure, 19a=15, 19b=10, 19c=150, 19d=5, 19e=20, 19f=40, 19g=60, 19h=90, 19i=100, 19j=80, 19k=9, 19m=10, 19n=2, 19p=15, 19q=40, 19r=30, 19s=20, 19t=10, 19u=5, 19v=10, 19w=15, 19x=20, 19y=30. Unit: mm.

[0046] The height, width and thickness of the test block body are 150 mm, 100 mm and 40 mm respectively. The depth of the lower end angle where the eleventh plane 11 and the twelfth plane 12 intersect relative to the first plane 1 is 30 mm.

[0047] The depth of the lower end angle where the thirteenth plane 13 intersects the fourteenth plane 14 relative to the first plane 1 is 20 mm, the depth of the lower end angle where the fifteenth plane 15 intersects the sixteenth plane 16 relative to the first plane 1 is 10 mm, and the depth of the upper end angle where the sixteenth plane 16 intersects the seventeenth plane 17 relative to the first plane 1 is 5 mm. According to the angle of the oblique probe and the size of the chip, any two end angles of different depths can be selected for testing to avoid testing within the 2 times near field area.

[0048] Place the angle probe in the Figure 2 At position A shown in the figure, find the highest diffraction echo at the lower end angle where the fifteenth plane 15 and the sixteenth plane 16 intersect, and use a ruler to measure the horizontal distance L1 from the front end of the probe to the eighteenth plane 18 on the left side of the flange; place the oblique probe as shown in the figure. Figure 2 At position B shown, find the diffraction echo at the lower end angle where the eleventh plane 11 and the twelfth plane 12 intersect. Measure the horizontal distance L2 from the front end of the probe to the eighteenth plane 18 on the left side of the flange with a ruler. This allows you to calculate the leading edge length L0 of the probe, the refraction angle (or K value) of the probe, and the acoustic paths S1 and S2. This allows you to calculate the sound velocity in the test block, the time delay of the angle probe, and the acoustic axis deflection angle of the angle probe. Figure 3 In the equation, the angle β is the angle between the acoustic axis S2 and the normal, that is, the angle of the probe, K=tanβ.

[0049] Place the angle probe in the Figure 2 、 Figure 3 On the first plane 1 shown, find the highest diffraction echo at the lower end angle where the fifteenth plane 15 intersects the sixteenth plane 16, find the highest diffraction echo at the lower end angle where the thirteenth plane 13 intersects the fourteenth plane 14, find the diffraction echo at the lower end angle where the eleventh plane 11 intersects the twelfth plane 12, and compare the diffraction wave heights at different depths with the distance amplitude curves made by the transverse holes of the same depth to determine the sensitivity setting value of the instrument when measuring the defect height.

[0050] Place the angle probe in the Figure 4 At position C shown, the highest reflected echo from the first and second transverse holes 20 and 21 is found to determine the resolution of a 45° angle probe. Similarly, by placing the probe on the first plane 1, the second plane 2, or the fourth plane 4, and finding the highest reflected echo from the first and second transverse holes 20 and 21, the resolution of angle probes at other angles can be determined.

[0051] Place the angle probe in the Figure 5 On the second plane 2 shown, move the probe left and right, and use the direct wave and the primary reflected wave to find the highest reflected echo of the fourth transverse hole 23, the fifth transverse hole 24, the sixth transverse hole 25, the seventh transverse hole 26 and the eighth transverse hole 27 as needed, so as to produce the distance amplitude curve of the oblique probe.

[0052] Place the straight probe in the Figure 6 Position D shown can be used for sound velocity and time delay testing during straight probe detection.

[0053] Place the straight probe in the Figure 6 At the position E shown, the distance between the sixth plane 6 and the second plane 2 is 91 mm, the distance between the ninth plane 9 and the second plane 2 is 85 mm, and the distance between the tenth plane 10 and the second plane 2 is 100 mm. By finding the reflected echoes of the ninth plane 9, the sixth plane 6, and the tenth plane 10 at the same time, the resolution of the straight probe can be measured.

[0054] Place the straight probe in the Figure 6 Positions F and G shown can be used for blind spot testing of straight probes.

[0055] Place the straight probe in the Figure 7 At positions H, I, J, K, and L shown, the highest reflected echoes of the eighth transverse through hole 27, the seventh transverse through hole 26, the third transverse through hole 22, and the sixth transverse through hole 25 can be found respectively as needed to produce the distance amplitude curve of the straight probe.

[0056] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any minor modifications, equivalent replacements, and improvements made to the above embodiments based on the technical essence of the present invention shall be included in the scope of protection of the technical solution of the present invention.

Claims

1. A test block for testing and adjusting the performance of an ultrasonic testing instrument and a probe combination, characterized in that: The test block comprises a first plane (1), a second plane (2), a third plane (3), a fourth plane (4), a fifth plane (5), a sixth plane (6), a seventh plane (7), a ninth plane (9), an eighth plane (8), a tenth plane (10), an eleventh plane (11), a twelfth plane (12), a thirteenth plane (13), a fourteenth plane (14), a fifteenth plane (15), a sixteenth plane (16), a seventeenth plane (17) and an eighteenth plane (18) connected in sequence, and the eighteenth plane (18) is further connected to the first plane (1); The test block is provided with a first transverse hole (20), a second transverse hole (21), a third transverse through hole (22), a fourth transverse through hole (23), a fifth transverse through hole (24), a sixth transverse through hole (25), a seventh transverse through hole (26) and an eighth transverse through hole (27); the first transverse hole (20) and the second transverse hole (21) constitute stepped transverse holes of different diameters, the same length and concentricity, and are arranged near the intersection of the first plane (1) and the second plane (2); the fourth transverse through hole (23), the fifth transverse through hole (24), the sixth transverse through hole (25), the seventh transverse through hole (26) and the eighth transverse through hole (27) are arranged in sequence and are arranged near the third plane (3); the third transverse through hole (22) is arranged near the tenth plane (10); The test block has a length of 150 mm, a width of 100 mm, and a thickness of 40 mm; the length of the first plane (1) is 100 mm, the length of the second plane (2) is 150 mm, the length of the third plane (3) is 100 mm, the length of the fourth plane (4) is 80 mm, the width of the fifth plane (5) is 9 mm, the width of the sixth plane (6) is 10 mm, the width of the seventh plane (7) is 6 mm, the width of the eighth plane (8) is 15 mm, the width of the ninth plane (9) is 2 mm, the width of the tenth plane (10) is 28 mm, the width of the eleventh plane (11) is 10 mm, the width of the twelfth plane (12) is 10 mm, and the width of the thirteenth plane (13) is 28 mm. The width of the fourteenth plane (14) is 5 mm, the width of the fifteenth plane (15) is 5 mm, the width of the sixteenth plane (16) is 5 mm, the width of the seventeenth plane (17) is 20 mm, and the width of the eighteenth plane (18) is 5 mm; the diameter of the first transverse hole (20) is 6 mm and the length is 20 mm, the diameter of the second transverse hole (21) is 10 mm and the length is 20 mm; the diameter of the third transverse through hole (22), the fourth transverse through hole (23), the fifth transverse through hole (24), the sixth transverse through hole (25), the seventh transverse through hole (26), and the eighth transverse through hole (27) are all 3 mm and 40 mm in length; in the test block, two adjacent planes are perpendicular to each other.

2. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The end angle at which the eleventh plane (11) intersects the twelfth plane (12), the end angle at which the thirteenth plane (13) intersects the fourteenth plane (14), and the end angle at which the fifteenth plane (15) intersects the sixteenth plane (16) are used to determine the incident point or front edge of the oblique probe, the refraction angle or K value, the instrument time baseline, and the acoustic axis deflection angle; the incident point or front edge of the oblique probe, the refraction angle or K value, the instrument time baseline, and the acoustic axis deflection angle adopt the end point diffraction wave method.

3. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The first transverse hole (20) and the second transverse hole (21) are used to measure the resolution of the angle probe.

4. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The pulse reflection echo signal generated by the intersection angle of the sixteenth plane (16) and the seventeenth plane (17) is used to adjust the sensitivity of the instrument so as to be able to find the diffraction wave signals at the intersection angle of the eleventh plane (11) and the twelfth plane (12), the intersection angle of the thirteenth plane (13) and the fourteenth plane (14), and the intersection angle of the fifteenth plane (15) and the sixteenth plane (16); The diffraction wave signal amplitudes generated by the intersection angles of the eleventh plane (11) and the twelfth plane (12), the intersection angles of the thirteenth plane (13) and the fourteenth plane (14), and the intersection angles of the fifteenth plane (15) and the sixteenth plane (16) are used to determine the sensitivity of defect height measurement to avoid the inability to find the end point diffraction wave of the defect due to excessively high or low sensitivity.

5. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The first plane (1), the eighteenth plane (18) and the seventeenth plane (17) form a flange, which can avoid the influence of the surface wave on the endpoint diffraction wave during the test of the incident point or front of the oblique probe, the refraction angle or K value, the instrument time baseline and the acoustic axis deviation angle.

6. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The second plane (2) and the fourth plane (4) are used to adjust the time base of the straight probe, the sixth plane (6), the ninth plane (9) and the tenth plane (10) are used to measure the resolution of the straight probe, and the first transverse hole (20) and the second transverse hole (21) are used to measure the blind area of ​​the straight probe.

7. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The first transverse hole (20), the second transverse hole (21), the third transverse through hole (22), the fourth transverse through hole (23), the fifth transverse through hole (24), the sixth transverse through hole (25), the seventh transverse through hole (26) and the eighth transverse through hole (27) are all parallel to the first plane (1), the second plane (2), the third plane (3) and the fourth plane (4).

8. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: Probes can be placed on the first plane (1), the second plane (2), the third plane (3) and the fourth plane (4) of the test block. Probes at different angles placed on different planes can obtain reflected echoes of the third transverse through hole (22), the fourth transverse through hole (23), the fifth transverse through hole (24), the sixth transverse through hole (25), the seventh transverse through hole (26) and the eighth transverse through hole (27) of different depths; the third transverse through hole (22), the fourth transverse through hole (23), the fifth transverse through hole (24), the sixth transverse through hole (25), the seventh transverse through hole (26) and the eighth transverse through hole (27) are used to produce a distance-amplitude curve.

9. The test block for performance testing and adjustment of an ultrasonic testing instrument and a probe combination according to claim 1, characterized in that: The flatness error of the test block shall not exceed ±0.03mm, the parallelism error of the test block shall not exceed ±0.03mm, the surface roughness of each plane and transverse through hole of the test block shall not exceed 3.2 μm, and the dimensional deviation of each plane and transverse through hole of the test block shall not exceed ±0.05mm.

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