Transient current measurement method and device of circuit board, electronic equipment and storage medium

Abstract

The invention discloses a transient current measurement method and device of a circuit board, electronic equipment and a storage medium, the circuit board comprises a first probe module and a measured object, the first probe module is used for measuring the current of the measured object, the first probe module is connected with first recording equipment, and the method is applied to the probe module. The method comprises the steps that a first voltage and a transfer function are obtained, and the first voltage is obtained based on a first recording device; and obtaining a target current based on the transfer function and the first voltage. The first probe module is fixed in the circuit board, that is, the measurement distance and angle are fixed, the measurement method is simple and efficient, the stability of the measurement result is better, and the device is used for monitoring the transient overcurrent of the circuit board.

Description

Technical Field

[0001] The present application relates to technical fields such as printed circuit boards, and in particular to a method, device, electronic device, and storage medium for measuring transient current of a circuit board. Background Art

[0002] In power applications, the internal boards of secondary equipment are exposed to electromagnetic interference (EMI). This interference, in the form of transient overcurrent, flows through PCB (Printed Circuit Board) traces into components and chips, severely impacting the lifespan of the boards. Measuring transient interference currents on PCB traces during normal data communication is challenging, and using any series current monitoring method will alter the original line impedance, disrupting line communication and data transmission.

[0003] In related technologies, the non-contact measurement method of transient current generally uses a current probe. However, most commercial current probes are handheld, and the test circuit or path needs to pass through the inside of the probe. The test probe cannot be fixed and is unstable. Any change in angle or distance will cause deviation in the test results. The test results have poor repeatability and are not suitable for PCB-level testing. Summary of the Invention

[0004] To this end, the purpose of the embodiments of the present application is to propose a method, device, electronic device, storage medium and computer program product for measuring transient current of a circuit board, which are used to monitor the transient current on the critical path within the circuit board. The first probe module is fixed in the circuit board, that is, the measurement distance and angle are fixed, the measurement method is simple and efficient, and the measurement results are more stable.

[0005] An embodiment of the present application provides a current measurement method for a circuit board, wherein the circuit board includes a first probe module and an object to be measured, the first probe module is used to measure the current of the object to be measured, the first probe module is connected to a first recording device, and the method is applied to the probe module, the method including: obtaining a first voltage and a transfer function, wherein the first voltage is obtained based on the first recording device; obtaining a target current based on the transfer function and the first voltage; the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is mutually coupled with the object to be measured, the first recording device is connected to the first probe module via the first port, and obtaining the first voltage based on the first recording device includes: obtaining the first voltage of the first port based on the first recording device.

[0006] Exemplarily, the circuit board includes a calibration board, the calibration board includes a second probe module, the second probe module includes a first port and a second port, the second port is set on the target trace, the calibration board is connected to a second recording device, the second recording device is connected to the second probe module through the first port, and the second recording device is connected to the target trace through the second port, and obtaining the transfer function includes: obtaining the transfer function between the first port and the second port based on the second recording device.

[0007] Exemplarily, obtaining the transfer function based on the transfer function parameters includes: obtaining the transfer function between the first port and the second port based on the second recording device, including: obtaining a measurement result between the first port and the second port based on the second recording device; multiplying the measurement result by the characteristic impedance of the target trace to obtain the transfer function, wherein the transfer function indicates the ratio of the voltage signal of the first port to the current signal of the second port in the frequency domain.

[0008] Exemplarily, obtaining the target current based on the transfer function and the first voltage includes: performing a discrete Fourier transform on the first voltage to obtain a second voltage; obtaining a first current based on the second voltage and the transfer function; and obtaining the target current based on the first current.

[0009] Exemplarily, obtaining the first current based on the second voltage and the transfer function includes: dividing the second voltage by the transfer function to obtain the first current.

[0010] Exemplarily, obtaining the target current based on the first current includes: performing an inverse discrete Fourier transform on the first current to obtain the target current.

[0011] Exemplarily, the circuit board further includes an alarm module, and the method further includes: controlling the alarm module to sound an alarm when the target current is greater than a preset current.

[0012] Another embodiment of the present application provides a current measuring device, which is applied to a circuit board. The circuit board includes a first probe module and an object to be measured. The first probe module is used to measure the current of the object to be measured. The current measuring device is connected to a first recording device. The device includes: an acquisition module, used to obtain a first voltage and a transfer function, wherein the first voltage is obtained based on the first recording device; an acquisition module, used to obtain a target current based on the transfer function and the first voltage; the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object to be measured, the first recording device is connected to the first probe module through the first port, and the acquisition module is also used to obtain the first voltage of the first port based on the first recording device.

[0013] Another embodiment of the present application provides a circuit board, which is used to implement the steps of the above method; wherein, the circuit board includes a first probe module fixed on the circuit board, the first probe module is connected to a first recording device, the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object under test, and the first recording device is connected to the first probe module through the first port.

[0014] Another embodiment of the present application provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the method of any of the above embodiments when executing the computer program.

[0015] Another embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the method of any of the above embodiments are implemented.

[0016] Another embodiment of the present application provides a computer program product, which includes instructions. When the instructions are executed by a processor of a computer device, the computer device is enabled to perform the steps of the method of any of the above embodiments.

[0017] In the above embodiment, the circuit board includes a first probe module and an object to be measured. The first probe module is used to measure the current of the object to be measured. The first probe module is connected to a first recording device. The method is applied to the probe module, and the method includes: obtaining a first voltage and a transfer function, wherein the first voltage is obtained based on the first recording device; and obtaining a target current based on the transfer function and the first voltage. The first probe module of the present invention is fixed to the circuit board, i.e., the measurement distance and angle are fixed. The measurement method is simple and efficient, and the measurement results are more stable. It is used to monitor transient overcurrents on the circuit board. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A flow chart of a method for measuring current of a circuit board provided in an embodiment of the present application;

[0019] Figure 2 A schematic diagram of a circuit board provided in an embodiment of the present application;

[0020] Figure 3 A schematic diagram of a calibration plate provided in accordance with an embodiment of the present application;

[0021] Figure 4 A schematic diagram of an equivalent circuit of a current probe provided in an embodiment of the present application;

[0022] Figure 5 A flow chart of obtaining a target current based on a transfer function and a first voltage provided in an embodiment of the present application;

[0023] Figure 6 A schematic diagram of a process for reconstructing a target current provided in an embodiment of the present application;

[0024] Figure 7 Schematic diagram of the measured waveform of the current probe reconstructed waveform and the source waveform provided in the embodiment of the present application;

[0025] Figure 8 A schematic diagram of a current measuring device provided in an embodiment of the present application;

[0026] Figure 9 A block diagram of an electronic device provided in accordance with an embodiment of the present application. DETAILED DESCRIPTION

[0027] The following describes in detail embodiments of the present application. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0028] In power applications, the internal boards of secondary equipment are exposed to electromagnetic interference. This interference, in the form of current, flows into components and chips through PCB (Printed Circuit Board) traces, severely impacting the lifespan of the boards. Measuring transient interference currents on PCB traces during normal data communication is challenging, and using any series current monitoring method will alter the original line impedance, disrupting line communication and data transmission.

[0029] In some examples, non-contact measurement of transient current generally uses a current probe. However, most commercial current probes are handheld, and the test circuit or path needs to pass through the inside of the probe. The test probe cannot be fixed and is unstable. Any change in angle or distance will cause deviation in the test results. The test results have poor repeatability and are not suitable for PCB-level testing.

[0030] Based on this, the present invention proposes a current probe that can be embedded within a PCB circuit board to measure transient currents on the PCB traces. Combined with a software program, it provides a board overcurrent warning mechanism. By combining frequency domain reconstruction methods with a high-speed sampling chip, the current probe's bandwidth can be extended to cover the entire frequency range, effectively measuring transient currents in the desired frequency band.

[0031] Figure 1 Schematic diagram of a method for measuring current of a circuit board according to an embodiment of the present application.

[0032] As an example, Figure 1 As shown, the current measurement method of the circuit board includes:

[0033] S101 : Acquire a first voltage and a transfer function, wherein the first voltage is obtained based on a first recording device.

[0034] S102 : Obtain a target current based on the transfer function and the first voltage.

[0035] For example, Figure 2 As shown, the circuit board includes a first probe module and a measured object. It should be noted that the first probe module is welded on the circuit board, and the measured object can be a trace. The first probe module is used to measure the current of the measured trace. Figure 2 As shown, the first probe module consists of a magnetic flux surface with a side length of a surrounded by a certain line width, a first port, and four parallel load resistors between the inner core of the first port and the ground. The first port can be an SMA interface. Figure 2 The middle interface shown is the first port, and the four surrounding interfaces are grounding interfaces. The magnetic flux plane can be composed of three coils, with one side grounded. The first probe module is set near the measured trace at a fixed distance d. The side length a of the magnetic flux plane can be set to 4 mm, and the distance d from the measured trace can be 1 mm. The impedance of the measured trace can be 50Ω. The load resistor ( Figure 2 For R in ( ), a chip resistor with good high-frequency performance can be selected. The parallel connection of four load resistors can effectively reduce the parasitic inductance of the resistor and increase the upper frequency limit of the current probe bandwidth.

[0036] Exemplarily, the first probe module is connected to a first recording device, which can be an oscilloscope. When measuring the current of the measured trace, a first voltage and a transfer function are first obtained. The first voltage can be obtained based on the oscilloscope, and the oscilloscope can be used to display the waveform of the first voltage. The transfer function is pre-acquired on a calibration board. It can be understood that the calibration board is used to obtain the transfer function of the first probe module. In actual application, the probe module only needs to be placed at the same distance d on the side of the measured object. In this way, the transfer function is the same as the transfer function measured in advance, and there is no need to measure the transfer function again. The transfer function is used as a known quantity, which improves the efficiency of current measurement. The target current is obtained based on the transfer function and the first voltage. The target current is the measurement result of the current on the measured object.

[0037] The first probe module of the present application is fixed in the circuit board, that is, the measuring distance and angle are fixed, the current measurement method is simple and efficient, and the measurement result is more stable.

[0038] As an example, Figure 2 As shown, the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure and the object under test are coupled to each other, the first recording device is connected to the first probe module through the first port, and the first voltage is obtained based on the first recording device, including: obtaining the first voltage of the first port based on the first recording device.

[0039] For example, Figure 2 As shown, the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, and the coil structure is coupled to the object to be measured. When a transient interference current is generated on the object to be measured, it causes a change in the magnetic flux surface of the coil, so that a first voltage is generated at the first port. A first recording device, such as an oscilloscope, can be connected to the first port to record the first voltage. It can be understood that the first voltage is the voltage at the first port.

[0040] As an example, Figure 3 A schematic diagram of a calibration board is shown, wherein the circuit board includes a calibration board, the calibration board includes a second probe module, the second probe module includes a first port and a second port, the second port is set on the target trace, the calibration board is connected to a second recording device, the second recording device is connected to the second probe module through the first port, and the second recording device is connected to the target trace through the second port, and the transfer function is obtained, including: obtaining the transfer function between the first port and the second port based on the second recording device.

[0041] For example, Figure 3As shown, the calibration board includes a second probe module and a target trace, which can be a 50-ohm trace. The second probe module consists of a magnetic flux plane with a side length a defined by a certain width, a first port, and four parallel load resistors connected between the inner core of the first port and ground. The first port can be an SMA connector. It should be noted that the first port and coil structure of the second probe module are identical to those of the first probe module, but the second probe module has an additional second port. A second port can be provided on the target trace, which can also be an SMA connector. The second recording device can be a vector network analyzer, which is connected simultaneously to the first and second ports to obtain the transfer function parameters between the first and second ports. It should be noted that the sensitivity of the probe is strongly correlated with the spacing d and the area of the magnetic flux plane. When the spacing d and the area of the magnetic flux plane are fixed, the transfer function between the first and second ports is also fixed. That is, the transfer function parameters between the first and second ports only need to be measured once to obtain the transfer function between the first and second ports. It can be understood that in actual application, it is only necessary to place the probe module at the same distance d on the object to be measured. In this way, the transfer function is the same as the transfer function measured in advance. There is no need to measure the transfer function again. The transfer function is used as a known quantity to improve the efficiency of measuring current.

[0042] Figure 4 Schematic diagram of an equivalent circuit of a current probe according to an embodiment of the present application.

[0043] like Figure 4 As shown, L1 is the parasitic inductance of the probe module, L2 is the parasitic inductance of the coupling area, M is the mutual inductance, RL is the equivalent resistance of the four parallel load resistors, u(t) is the signal measured by the first recording device, and I(t) is the signal of the target current. It can be understood that this application reconstructs the current waveform I(t) through the known u(t).

[0044] As an example, obtaining a transfer function between a first port and a second port based on a second recording device includes: obtaining a measurement result between the first port and the second port based on the second recording device; and multiplying the measurement result by a characteristic impedance of a target trace to obtain a transfer function, wherein the transfer function indicates a ratio of a voltage signal of the first port to a current signal of the second port in the frequency domain.

[0045] For example, the characteristic impedance of the target trace may be 50Ω. The measurement result directly measured by the second recording device is denoted as S(1,2). The transfer function is denoted as T(ω). The calculation formula of the transfer function is shown in the following formula. Substituting the measurement result S(1,2) into the formula, the transfer function is obtained.

[0046]

[0047] Where V2 is the voltage signal at the first port, I1 is the input current signal at the second port, and the transfer function indicates the ratio of the voltage signal at the first port to the current signal at the second port in the frequency domain. The transfer function is obtained based on experimental measurements.

[0048] As an example, Figure 5 As shown, obtaining the target current based on the transfer function and the first voltage includes:

[0049] S501 , performing discrete Fourier transform on the first voltage to obtain a second voltage.

[0050] S502 : Obtain a first current based on the second voltage and a transfer function.

[0051] S503: Obtain a target current based on the first current.

[0052] Exemplarily, the first voltage is denoted as u(t), and a discrete Fourier transform is performed on the first voltage to obtain a second voltage, which is denoted as U(ω). It can be understood that the first voltage u(t) is a time domain voltage, and the second voltage U(ω) is the representation of the first voltage in the discrete domain. The first voltage is discretely Fourier transformed. Specifically, the first voltage can be low-pass filtered by software to remove high-frequency components outside the measurement frequency band, and then discrete Fourier transform FFT is performed to obtain the second voltage U(ω). The transfer function T(ω) indicates the ratio of the voltage of the first port in the discrete domain to the current of the second port. The first current in the discrete domain is obtained according to the second voltage U(ω) and the transfer function T(ω). The first current is denoted as I(ω), and the target current is obtained according to the first current.

[0053] As an example, obtaining the first current based on the second voltage and the transfer function includes: dividing the second voltage by the transfer function to obtain the first current.

[0054] Exemplarily, because the transfer function indicates the ratio of the voltage at the first port to the current at the second port in the discrete domain, the second voltage U(ω) is divided by the transfer function T(ω) to obtain the first current I(ω).

[0055] It should be noted that the current recovery accuracy is highly positively correlated with the sampling rate and storage depth of the measuring instrument. The sampling rates of U(ω) and T(ω) remain consistent. The more sampling frequencies there are, the higher the probe accuracy.

[0056] As an example, obtaining the target current based on the first current includes: performing an inverse discrete Fourier transform on the first current to obtain the target current.

[0057] Exemplarily, I(ω) is subjected to an inverse discrete Fourier transform (IFFT) to obtain I(t), where I(t) is the target current.

[0058] Figure 6 FIG. 4 is a flow chart of reconstructing the target current I(t) according to an embodiment of the present application.

[0059] First, the measured first voltage u(t) is low-pass filtered to remove high-frequency components outside the probe bandwidth, and then a discrete Fourier transform (FFT) is performed to obtain the second voltage U(ω). Connect the vector network analyzer to the first and second ports respectively, and measure the transfer function parameters S(1,2). Substitute the measured S(1,2) parameters into the formula The transfer function T(ω) is obtained. Dividing T(ω) by U(ω) yields I(ω), and performing an inverse discrete Fourier transform on I(ω) yields I(t).

[0060] As an example, the circuit board further includes an alarm module, and the current measurement method further includes: when the target current is greater than a preset current, controlling the alarm module to issue an alarm.

[0061] For example, an alarm module may be provided on the circuit board. When the target current is greater than the preset current, it indicates that the instantaneous interference current on the measured trace is large. At this time, the alarm module may be controlled to sound an alarm.

[0062] The current probe designed in this application has a simple and stable structure and can be embedded inside a circuit board to measure transient currents on the traces inside the circuit board. Combined with the circuit reconstruction method and the selection of high-speed measurement equipment, the current probe bandwidth can cover high and low frequencies, effectively recovering the current in the required frequency band and improving the test accuracy.

[0063] This application also verifies the accuracy of the above method.

[0064] As an example, Figure 3 As shown, the second port can be connected to a standard pulse source, which can be set as a double exponential source to give the object under test a transient current, and the current of the object under test can be measured using the above current measurement method to verify the accuracy of the current measurement method. Figure 7 3 is a schematic diagram comparing the reconstructed waveform and the source waveform of the current probe according to an embodiment of the present application. It can be seen that this current probe and the current measurement method can better restore the original current waveform.

[0065] The present application also provides a current measuring device.

[0066] As an example, Figure 8As shown, a current measuring device is applied to a circuit board, the circuit board includes a first probe module and an object to be measured, the first probe module is used to measure the current of the object to be measured, the current measuring device is connected to a first recording device, and the current measuring device includes: an acquisition module 801, used to obtain a first voltage and a transfer function, wherein the first voltage is obtained based on the first recording device; an acquisition module 802, used to obtain a target current based on the transfer function and the first voltage; the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object to be measured, the first recording device is connected to the first probe module through the first port, and the acquisition module 801 is further used to obtain a first voltage of the first port based on the first recording device.

[0067] The present application also provides a circuit board.

[0068] As an example, Figure 2 As shown, the circuit board is used to implement the steps of the above-mentioned current measurement method; wherein, the circuit board includes a first probe module fixed on the circuit board, the first probe module is connected to the first recording device, the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object to be measured, and the first recording device is connected to the first probe module through the first port.

[0069] The present application also proposes a computer-readable storage medium.

[0070] In this embodiment, a computer program is stored on a computer-readable storage medium, and when the computer program is executed by a processor, the steps of the above-mentioned circuit board current measurement method are implemented.

[0071] Figure 9 A block diagram of an electronic device provided in accordance with an embodiment of the present application.

[0072] An embodiment of the present application provides an electronic device including a memory and a processor, wherein the memory stores a computer program, and the processor implements the current measurement method of the above-mentioned circuit board when executing the computer program.

[0073] like Figure 9 As shown, for ease of understanding, the embodiment of the present application shows a specific electronic device.

[0074] Electronic device is intended to refer to various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic device may also refer to various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are intended to be examples only and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0075] like Figure 9 As shown, the device includes a computing unit 901, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 902 or a computer program loaded from a storage unit 908 into a random access memory (RAM) 903. Various programs and data required for the operation of the electronic device can also be stored in the RAM 903. The computing unit 901, ROM 902, and RAM 903 are connected to each other via a bus 904. An input / output (I / O) interface 905 is also connected to the bus 904.

[0076] Multiple components in the electronic device are connected to the I / O interface 905, including an input unit 906, such as a keyboard, a mouse, etc.; an output unit 907, such as various types of displays, speakers, etc.; a storage unit 908, such as a magnetic disk, an optical disk, etc.; and a communication unit 909, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 909 allows the electronic device to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0077] The computing unit 901 can be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the computing unit 901 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various computing units that run machine learning model algorithms, digital signal processors (DSPs), and any appropriate processors, controllers, microcontrollers, etc. The computing unit 901 performs the various methods described above, such as the circuit board current measurement method. For example, in some embodiments, the circuit board current measurement method can be implemented as a computer software program, which is tangibly contained in a machine-readable medium, such as a storage unit 908. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device via the ROM 902 and / or the communication unit 909. When the computer program is loaded into the RAM 903 and executed by the computing unit 901, the circuit board current measurement method described above can be executed. Alternatively, in other embodiments, the computing unit 901 can be configured to perform the circuit board current measurement method by any other appropriate means (e.g., by means of firmware).

[0078] It should be noted that the logic and / or steps represented in the flowcharts or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing the logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device, or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device, or apparatus and execute the instructions), or in conjunction with such instruction execution systems, devices, or apparatuses. For purposes of this application, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transmit a program for use by an instruction execution system, device, or apparatus, or in conjunction with such instruction execution systems, devices, or apparatuses. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection portion having one or more wires (electronic device), a portable computer disk cartridge (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disc read-only memory (CDROM). Furthermore, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or otherwise processing it in a suitable manner if necessary, and then storing it in a computer memory.

[0079] It should be understood that various parts of the present application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented using software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented using hardware, as in another embodiment, any one of the following technologies known in the art or a combination thereof can be used to implement: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application-specific integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0080] In the description of this application, reference to the terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of this application. In this application, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples.

[0081] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0082] In addition, the terms "first" and "second" used in the embodiments of the present application are for descriptive purposes only and should not be understood as indicating or implying relative importance, or implicitly indicating the number of technical features indicated in the embodiments. Therefore, the features defined in the embodiments of the present application by terms such as "first" and "second" can explicitly or implicitly indicate that at least one of the features is included in the embodiment. In the description of the present application, the word "multiple" means at least two or two or more, such as two, three, four, etc., unless otherwise clearly and specifically defined in the embodiments.

[0083] In this application, unless otherwise specified or limited in the embodiments, the terms "installed", "connected", "connected", and "fixed" appearing in the embodiments should be understood in a broad sense. For example, the connection can be a fixed connection, a detachable connection, or an integral connection. It can also be a mechanical connection, an electrical connection, etc.; of course, it can also be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal communication between two elements, or the interaction between two elements. For those skilled in the art, the specific meanings of the above terms in this application can be understood based on the specific implementation.

[0084] In this application, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0085] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A method for measuring current of a circuit board, characterized in that: The circuit board includes a first probe module and an object to be measured, the first probe module is used to measure the current of the object to be measured, the first probe module is connected to a first recording device, and the method is applied to the probe module, the method including: obtaining a first voltage and a transfer function, wherein the first voltage is obtained based on the first recording device; obtaining a target current based on the transfer function and the first voltage; The first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object under test, the first recording device is connected to the first probe module through the first port, and obtaining the first voltage based on the first recording device includes: A first voltage of the first port is acquired based on the first recording device.

2. The method for measuring current of a circuit board according to claim 1, wherein: The circuit board includes a calibration board, the calibration board includes a second probe module, the second probe module includes a first port and a second port, the second port is set on the target line, the calibration board is connected to a second recording device, the second recording device is connected to the second probe module through the first port, and the second recording device is connected to the target line through the second port, and obtaining the transfer function includes: A transfer function between the first port and the second port is acquired based on the second recording device.

3. The method for measuring current of a circuit board according to claim 2, wherein: The acquiring the transfer function between the first port and the second port based on the second recording device includes: obtaining a measurement result between the first port and the second port based on the second recording device; The transfer function is obtained by multiplying the measurement result by the characteristic impedance of the target trace, wherein the transfer function indicates a ratio of a voltage signal at the first port to a current signal at the second port in the frequency domain.

4. The method for measuring current of a circuit board according to claim 1, wherein: The obtaining a target current based on the transfer function and the first voltage includes: Performing a discrete Fourier transform on the first voltage to obtain a second voltage; obtaining a first current based on the second voltage and the transfer function; The target current is obtained based on the first current.

5. The method for measuring current of a circuit board according to claim 4, wherein: The obtaining of the first current based on the second voltage and the transfer function includes: The first current is obtained by dividing the second voltage by the transfer function.

6. The method for measuring current of a circuit board according to claim 4, wherein: The obtaining the target current based on the first current includes: Performing an inverse discrete Fourier transform on the first current to obtain the target current.

7. The method for measuring current of a circuit board according to claim 1, wherein: The circuit board further includes an alarm module, and the method further includes: When the target current is greater than a preset current, the alarm module is controlled to generate an alarm.

8. A current measuring device, characterized in that: The current measuring device is applied to a circuit board, the circuit board includes a first probe module and an object to be measured, the first probe module is used to measure the current of the object to be measured, the current measuring device is connected to a first recording device, and the device includes: an acquisition module, configured to acquire a first voltage and a transfer function, wherein the first voltage is obtained based on the first recording device; an obtaining module, configured to obtain a target current based on the transfer function and the first voltage; The first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object under test, the first recording device is connected to the first probe module through the first port, and the acquisition module is further used to obtain a first voltage of the first port based on the first recording device.

9. A circuit board, characterized in that: The circuit board is used to implement the steps of the method described in any one of claims 1 to 7; The circuit board includes a first probe module fixed on the circuit board, the first probe module is connected to the first recording device, the first probe module includes a first port and a coil structure, the coil structure is connected to the first port, the coil structure is coupled to the object under test, and the first recording device is connected to the first probe module through the first port.

10. An electronic device, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program, and is characterized in that when the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

11. A computer-readable storage medium, characterized in that A computer program is stored thereon, and when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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