Xenon lamp type ultramicro photometer with adjustable assembly structure

Abstract

The invention discloses a xenon lamp type ultramicro photometer with an adjustable assembly structure, and belongs to the technical field of photometers, the xenon lamp type ultramicro photometer comprises a shell and a touch screen installed on the shell, a spectrograph is installed in the shell, a xenon lamp is connected to the spectrograph, SMA optical fibers are connected to the spectrograph and the xenon lamp, and the SMA optical fibers are connected to the shell. A test base is further arranged on the upper surface of the shell, the test base is connected with the test arm through an adjustable assembling assembly, a gas hood dust blocking assembly is further arranged on the test base, and an SMA optical fiber connected with the spectrograph penetrates through the upper surface of the test base. According to the invention, the rotating structure connected with the test base and the test arm can be adjusted, so that the rotating structure can be conveniently adjusted after being abraded, the magnetic steel and the positioning spherical surface are prevented from being greatly abraded, in addition, a gas hood can be formed on the outer side of the end part of the SMA optical fiber connected with the spectrograph, the possibility that external dust is adsorbed on a sample to be tested is reduced, and the test efficiency is improved. Therefore, the accuracy of the measurement result can be improved.

Description

Technical Field

[0001] The invention relates to the technical field of photometers, in particular to a xenon lamp type ultra-micro photometer with an adjustable assembly structure. Background Art

[0002] Xenon lamp ultra-micro photometer is a precision instrument used to detect the optical properties of trace samples. It is widely used in biochemistry, molecular biology, drug analysis and other fields. In the prior art, in order to ensure the alignment of the test base and the test arm, a magnetic steel and a positioning spherical surface are provided. However, the magnetic steel and the positioning spherical surface will produce a certain amount of wear during long-term use, which will cause the test base and the test arm to lose stable alignment. For example, the xenon lamp type ultra-micro photometer device disclosed in Publication No. CN111624167B uses a fixed shaft and bearings to rotate the test base and the test arm. This rotating connection structure cannot be adjusted. As a result, the rotating structure will cause the test base and the test arm to lose stable alignment after wear. In this case, relying solely on the magnetic steel and the positioning spherical surface for limiting the position will cause significant wear of the magnetic steel and the positioning spherical surface. In this case, if only the magnetic steel and the positioning spherical surface are replaced, the replacement cycle of the magnetic steel and the positioning spherical surface will be greatly reduced, which is not conducive to long-term stable use. In addition, when using a xenon lamp ultra-microphotometer, 0.3-2ul of the sample to be tested is dropped onto the optical fiber receiving surface of the spectrometer through a pipette. During this process, external dust is easily adsorbed into the sample to be tested, which is not conducive to ensuring the accuracy of the measurement results. Therefore, a xenon lamp type ultra-microphotometer with an adjustable assembly structure is needed to solve the above problems. Summary of the Invention

[0003] The purpose of the present invention is to provide a xenon lamp type ultra-micro photometer with an adjustable assembly structure to solve the problems raised in the above background technology that the existing xenon lamp type ultra-micro photometer cannot adjust the rotating connection structure and cannot prevent external dust from being adsorbed on the sample to be tested.

[0004] To achieve the above object, the present invention provides the following technical solutions: A xenon lamp-type ultra-microphotometer with an adjustable assembly structure comprises a housing and a touch screen mounted thereon, a spectrometer mounted inside the housing, the spectrometer being connected to a xenon lamp, both the spectrometer and the xenon lamp being connected to SMA optical fibers, a test base being further provided on the upper surface of the housing, the test base being connected to a test arm via an adjustable assembly component, an air hood dust blocking component being further provided on the test base, the SMA optical fiber connected to the spectrometer extending through the upper surface of the test base, and the SMA optical fiber connected to the xenon lamp extending through the lower surface of the test arm.

[0005] Preferably, the adjustable assembly component includes a support base arranged on the upper surface of the test base, and the front and rear ends of the support base are provided with strip grooves running through the inside and outside of the support base, the front side of the support base is provided with an inward groove, and one end of the adjusting rod is provided in the inward groove, and the other end of the adjusting rod is movable through the interior of the support base.

[0006] Preferably, the internal bearing of the support seat is connected to one end of the screw rod, and the other end of the screw rod is provided with a linkage groove, the other end of the adjusting rod is movably extended into the linkage groove, and the adjusting rod is fixedly connected to a limit block coaxial with it at the position inside the support seat, a limit groove is provided at the position corresponding to the position of the inner recessed groove in the support seat, and the limit groove is movably penetrated by the adjusting rod, the limit block on the adjusting rod is coaxially arranged with the limit groove, and a spring is provided between the middle part of the adjusting rod in the support seat and the other end of the screw rod.

[0007] Preferably, the linkage groove and the portion where the adjustment rod extends into the linkage groove are prismatic in shape that match each other, and the adjustment rod is a T-shaped structure.

[0008] Preferably, the limiting groove and the limiting block are both truncated cone structures, and the slope inside the limiting groove is smaller than the slope outside the limiting block.

[0009] Preferably, the adjustable assembly component also includes two sliding blocks threadedly connected to the outside of the screw rod, a shaft sleeve seat is slidably connected in the support seat, and a slide groove is provided at the position of the shaft sleeve seat facing the screw rod, and two sections of threads are provided on the screw rod with opposite thread directions, and the two sections of threads are threadedly connected to the two sliding blocks respectively, and the ends of the two sliding blocks close to the shaft sleeve seat slide into the slide groove, and the ends of the sliding blocks in the slide groove are provided with an oblique groove, a guide rod is movably passed through the oblique groove, and the two ends of the guide rod are respectively fixedly connected to the inner top and inner bottom ends of the slide groove, an axis core rod is passed through the bearing on the shaft sleeve seat, and the two ends of the axis core rod are respectively passed through the corresponding strip grooves and connected to the test arm.

[0010] Preferably, the axis of the screw rod is arranged parallel to the sliding groove, and the inclined groove is arranged obliquely to the axis of the screw rod.

[0011] Preferably, the air hood dust blocking assembly includes an annular groove arranged inside the test base, and the axis of the annular groove is collinear with the end axis of the SMA optical fiber connected to the spectrometer that passes through the test base, and the annular groove is provided with jet holes distributed at equal angles, and the jet holes are arranged to pass through the upper surface of the test base, and the jet holes are inclined toward the end axis of the SMA optical fiber connected to the spectrometer that passes through the test base.

[0012] Preferably, the air hood dust-blocking assembly also includes a cavity tube arranged on the test arm, and the lower end of the cavity tube is flush with the lower surface of the test arm, the upper end of the piston rod is seamlessly slidably connected in the cavity tube, and the lower end axis of the piston rod is connected to the upper surface of the test base, the middle part of the piston rod seamlessly slides through the lower end of the cavity tube, and the positions on both sides of the upper end of the piston rod in the cavity tube are connected with one-way exhaust pipes, the two one-way exhaust pipes are connected by an air collecting pipe, and the air collecting pipes are connected to the annular groove through the air guide pipe, and one-way air inlet holes are provided in the cavity tube at both sides of the upper end of the piston rod, and a hole passing through the outside of the test arm is provided, and the hole is connected to the one-way air inlet hole at the lower position on the cavity tube through an air supply pipe, and a groove is provided at the lower end of the cavity tube, and the diameter of the groove is larger than the maximum length of the connection structure between the lower end of the piston rod and the test base axis.

[0013] Preferably, an alignment bar is provided on the upper surface of the test base, and an alignment groove is provided on the lower surface of the test arm, and the alignment groove is provided corresponding to the alignment bar.

[0014] Compared with the prior art, the present invention has the following beneficial effects: the xenon lamp-type ultra-micro photometer with an adjustable assembly structure can adjust the rotating structure connecting the test base and the test arm, and thus can be adjusted after the rotating structure is worn, thereby avoiding significant wear of the magnetic steel and the positioning sphere. In addition, an air shield can be formed on the outer side of the SMA optical fiber end connected to the spectrometer, reducing the possibility of external dust adsorbed on the sample to be tested, thereby helping to improve the accuracy of the measurement results: 1. By internally pressing the adjusting rod, the limit block on the adjusting rod is separated from the limit groove. At this time, rotating the adjusting rod again can make the screw rotate with it. At this time, the two sliding blocks will move closer to or away from each other, which will cause the shaft sleeve seat to move closer to or away from the screw rod. When the adjusting rod is released, the limit block and the limit groove will be squeezed against each other under the action of the spring, thereby preventing the screw rod from rotating arbitrarily. By adjusting the position of the shaft sleeve seat, the rotating structure connecting the test base and the test arm can be adjusted, ensuring that when wear occurs, it can be adjusted relatively simply, avoiding the need to replace only the magnetic steel and the positioning sphere, resulting in a shortened replacement cycle of the magnetic steel and the positioning sphere; 2. During the rotation of the test arm, the piston rod may move in the cavity tube, and then the gas may be continuously ejected from the air jet hole through the one-way exhaust pipe, one-way air inlet hole, air guide pipe and annular groove, thereby forming an air cover, reducing the possibility of dust in the outside air coming into contact with the sample to be tested, thereby avoiding contamination of the sample to be tested and helping to improve the accuracy of the measurement results. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a rear view structural diagram of the present invention; Figure 2 This is a schematic diagram of the main structure of the present invention; Figure 3 This is a schematic diagram of the connection structure between the housing and the test arm of the present invention; Figure 4 This is a schematic diagram of a partial cross-sectional structure of the test arm of the present invention; Figure 5 For the present invention Figure 4 A schematic diagram of the enlarged structure of point A; Figure 6 This is a schematic diagram of a partial cross-sectional structure of a test base of the present invention; Figure 7 This is a schematic diagram of the connection structure between the test base and the support base of the present invention; Figure 8 For the present invention Figure 7 A schematic diagram of the enlarged structure of point B; Figure 9 This is a schematic diagram of the connection structure between the test base and the alignment bar of the present invention; Figure 10 For the present invention Figure 9 Schematic diagram of the enlarged structure of point C in the middle; Figure 11 This is a schematic cross-sectional structural diagram of the support base of the present invention; Figure 12 For the present invention Figure 11 Schematic diagram of the enlarged structure at point D.

[0016] In the figure: 1. Shell; 2. Touch screen; 3. Test base; 4. Test arm; 5. Cavity; 6. One-way air inlet; 7. Xenon lamp; 8. Air guide tube; 9. Piston rod; 10. One-way exhaust pipe; 11. SMA optical fiber; 12. Ring groove; 13. Jet hole; 14. Gas collecting pipe; 15. Support seat; 16. Recessed groove; 17. Strip groove; 18. Shaft core rod; 19. Alignment groove; 20. Alignment strip; 21. Sleeve seat; 22. Sliding block; 23. Screw; 24. Bevel groove; 25. Guide rod; 26. Linkage groove; 27. Adjustment rod; 28. Spring; 29. Limit groove; 30. Limit block; 31. Spectrometer. DETAILED DESCRIPTION

[0017] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0018] See also Figures 1-12 , the present invention provides the following technical solutions: Embodiment 1: In order to solve the problem that the rotating structure is difficult to adjust after wear, the following technical solution is provided, specifically, a xenon lamp type ultra-micro photometer with an adjustable assembly structure, including a housing 1 and a touch screen 2 installed thereon, a spectrometer 31 is installed inside the housing 1, and the spectrometer 31 is connected to a xenon lamp 7, and both the spectrometer 31 and the xenon lamp 7 are connected to an SMA optical fiber 11, and a test base 3 is further provided on the upper surface of the housing 1, and the test base 3 is connected to the test arm 4 through an adjustable assembly component.

[0019] The adjustable assembly component includes a support base 15 arranged on the upper surface of the test base 3, and the front and rear ends of the support base 15 are provided with a strip groove 17 running through the inside and outside thereof, the front side of the support base 15 is provided with a sunken groove 16, and one end of an adjusting rod 27 is provided in the sunken groove 16, and the other end of the adjusting rod 27 is movable through the interior of the support base 15, the internal bearing of the support base 15 is connected to one end of a screw rod 23, and the other end of the screw rod 23 is provided with a linkage groove 26, the linkage groove 26 is movably extended with the other end of the adjusting rod 27, and the adjusting rod 27 is at A limit block 30 coaxial with the support seat 15 is fixedly connected to the position inside the support seat 15, and a limit groove 29 is provided at the position corresponding to the position of the inward groove 16 in the support seat 15, and the limit groove 29 is movably penetrated by the adjusting rod 27. The limit block 30 on the adjusting rod 27 is coaxial with the limit groove 29, and the adjusting rod 27 is located in the middle of the support seat 15 and a spring 28 is provided between the other end of the screw rod 23. The linkage groove 26 and the portion where the adjusting rod 27 extends into the linkage groove 26 are prismatic and match each other, and the adjusting rod 27 is a T-shaped structure. The limit groove 29 and the limit groove 29 are coaxial with each other. The blocks 30 are all truncated cone-shaped structures, and the slope in the limit groove 29 is smaller than the slope outside the limit block 30. The adjustable assembly component also includes two sliding blocks 22 threadedly connected to the outside of the screw rod 23. The support seat 15 is slidably connected to the shaft sleeve seat 21, and the shaft sleeve seat 21 is provided with a slide groove toward the position of the screw rod 23. The screw rod 23 is provided with two sections of threads with opposite rotation directions. The two sections of threads are respectively threadedly connected to the two sliding blocks 22. The ends of the two sliding blocks 22 close to the shaft sleeve seat 21 are slid into the slide groove, and the ends of the sliding blocks 22 are in the slide groove. An inclined slot 24 is provided, and a guide rod 25 is movably passed through the inclined slot 24, and the two ends of the guide rod 25 are respectively fixedly connected to the inner top and inner bottom ends of the slide slot. The bearing on the sleeve seat 21 is passed through the shaft core rod 18, and the two ends of the shaft core rod 18 are respectively passed through the corresponding strip grooves 17 and connected to the test arm 4. The axis of the screw rod 23 is arranged parallel to the slide slot, and the inclined slot 24 is arranged obliquely to the axis of the screw rod 23. An alignment bar 20 is provided on the upper surface of the test base 3, and an alignment groove 19 is provided on the lower surface of the test arm 4. The alignment groove 19 is arranged corresponding to the alignment bar 20.

[0020] according to Figures 9-12, use a screwdriver to press the adjusting rod 27, so that the spring 28 is compressed, and the limit groove 29 and the limit block 30 are separated. Thereafter, the adjusting rod 27 is rotated by the screwdriver. Due to the setting of the linkage groove 26, the screw rod 23 will rotate with it, and the two sliding blocks 22 can be moved closer to or away from each other, so that the sleeve seat 21 is close to or away from the screw rod 23, thereby adjusting the position of the sleeve seat 21 and the shaft core rod 18, so as to achieve the purpose of adjusting the position of the test arm 4 relative to the test base 3, so that the rotating connection structure between the two can be adjusted to ensure that the two can be aligned, avoid large wear of the magnet and the positioning sphere due to wear, and reduce the replacement cycle of the two.

[0021] Example 2: In order to solve the problem that the sample to be tested is easily adsorbed by dust in the air, which easily leads to contamination of the sample to be tested and inaccurate measurement results, the following technical solution is provided. Specifically, an air cover dust blocking component is also provided on the test base 3, and the SMA optical fiber 11 connected to the spectrometer 31 passes through the upper surface of the test base 3, and the SMA optical fiber 11 connected to the xenon lamp 7 passes through the lower surface of the test arm 4.

[0022] The air hood dust-blocking assembly includes an annular groove 12 arranged inside the test base 3, and the axis of the annular groove 12 is collinear with the end axis of the SMA optical fiber 11 connected to the spectrometer 31 and passing through the test base 3. There are jet holes 13 distributed at equal angles on the annular groove 12, and the jet holes 13 are arranged to pass through the upper surface of the test base 3. The jet holes 13 are inclined toward the end axis of the SMA optical fiber 11 connected to the spectrometer 31 and passing through the test base 3. The air hood dust-blocking assembly also includes a cavity tube 5 arranged on the test arm 4, and the lower end of the cavity tube 5 is flush with the lower surface of the test arm 4. The upper end of the piston rod 9 is seamlessly slidably connected in the cavity tube 5, and the lower end axis of the piston rod 9 is connected to the test base 3. The upper surface of the piston rod 9 is seamlessly slid through the middle part of the piston rod 9 to pass through the lower end of the cavity tube 5, and the positions on both sides of the upper end of the piston rod 9 in the cavity tube 5 are connected with one-way exhaust pipes 10, and the two one-way exhaust pipes 10 are connected by a collecting pipe 14, and the collecting pipe 14 is connected to the annular groove 12 through the air guide pipe 8. One-way air inlet holes 6 are provided in the cavity tube 5 at both sides of the upper end of the piston rod 9, and a hole passing through the outside of the test arm 4 is provided. The hole is connected to the one-way air inlet hole 6 at the lower position on the cavity tube 5 through an air supply pipe. A groove is provided at the lower end of the cavity tube 5, and the diameter of the groove is greater than the maximum length of the axial connection structure between the lower end of the piston rod 9 and the test base 3.

[0023] according to Figure 4-Figure 8When the test arm 4 rotates relative to the test base 3, the piston rod 9 will move in the cavity 5. Since the cavity 5 positions on both sides of the end portion where the piston rod 9 is seamlessly slidably connected to the cavity 5 are provided with a one-way air inlet 6, a one-way exhaust pipe 10, a gas collecting pipe 14 and an air guide pipe 8, the gas in the cavity 5 can be transported to the annular groove 12 and ejected through the air jet hole 13. The gas ejected from the air jet hole 13 will form an air cover, thereby preventing the dust contained in the external gas from contacting the sample to be tested squeezed out of the pipette, thereby preventing the sample to be tested from being contaminated, and helping to improve the accuracy of the measurement results.

[0024] The contents not described in detail in this specification belong to the prior art known to those skilled in the art.

[0025] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.

Claims

1. A xenon lamp type ultra-microphotometer with an adjustable assembly structure, comprising a housing (1) and a touch screen (2) mounted thereon, characterized in that: A spectrometer (31) is installed inside the housing (1), and a xenon lamp (7) is connected to the spectrometer (31). Both the spectrometer (31) and the xenon lamp (7) are connected to an SMA optical fiber (11). A test base (3) is also provided on the upper surface of the housing (1), and the test base (3) is connected to the test arm (4) through an adjustable assembly component. An air hood dust blocking component is also provided on the test base (3), and the SMA optical fiber (11) connected to the spectrometer (31) passes through the upper surface of the test base (3), and the SMA optical fiber (11) connected to the xenon lamp (7) passes through the lower surface of the test arm (4).

2. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 1, characterized in that: The adjustable assembly component includes a support base (15) arranged on the upper surface of the test base (3), and the front and rear ends of the support base (15) are both provided with strip grooves (17) passing through the inner and outer sides thereof, the front side of the support base (15) is provided with an inward groove (16), and one end of an adjusting rod (27) is provided in the inward groove (16), and the other end of the adjusting rod (27) is movably passed through the interior of the support base (15).

3. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 2, characterized in that: The internal bearing of the support seat (15) is connected to one end of the screw rod (23), and the other end of the screw rod (23) is provided with a linkage groove (26), the other end of the adjusting rod (27) is movably inserted into the linkage groove (26), and the adjusting rod (27) is fixedly connected to a coaxial limiting block (30) at a position inside the support seat (15), a limiting groove (29) is provided at a position inside the support seat (15) corresponding to the position of the sunken groove (16), and the limiting groove (29) is movably penetrated by the adjusting rod (27), the limiting block (30) on the adjusting rod (27) is coaxially arranged with the limiting groove (29), and a spring (28) is provided between the middle part of the adjusting rod (27) inside the support seat (15) and the other end of the screw rod (23).

4. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 3, characterized in that: The linkage groove (26) and the portion where the regulating rod (27) extends into the linkage groove (26) are prismatic and coincide with each other, and the regulating rod (27) is a T-shaped structure.

5. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 4, characterized in that: The limiting groove (29) and the limiting block (30) are both truncated cone structures, and the slope inside the limiting groove (29) is smaller than the slope outside the limiting block (30).

6. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 5, characterized in that: The adjustable assembly component also includes two sliding blocks (22) threadedly connected to the outside of the screw rod (23), the support seat (15) is slidably connected to the sleeve seat (21), and the sleeve seat (21) is provided with a slide groove facing the screw rod (23), the screw rod (23) is provided with two sections of threads with opposite screw directions, and the two sections of threads are respectively threadedly connected to the two sliding blocks (22), the ends of the two sliding blocks (22) close to the sleeve seat (21) are slid into the slide groove, and the ends of the sliding blocks (22) in the slide groove are provided with an inclined groove (24), a guide rod (25) is movably passed through the inclined groove (24), and the two ends of the guide rod (25) are respectively fixedly connected to the inner top and inner bottom ends of the slide groove, the bearing on the sleeve seat (21) is passed through the shaft core rod (18), and the two ends of the shaft core rod (18) are respectively passed through the corresponding strip groove (17) and connected to the test arm (4).

7. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 6, characterized in that: The axis of the screw rod (23) is arranged parallel to the slide groove, and the inclined groove (24) is arranged obliquely to the axis of the screw rod (23).

8. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 7, characterized in that: The air hood dust blocking assembly includes an annular groove (12) arranged inside the test base (3), and the axis of the annular groove (12) is collinear with the axis of the end of the SMA optical fiber (11) connected to the spectrometer (31) and penetrating the test base (3), and the annular groove (12) is provided with air jet holes (13) distributed at equal angles, and the air jet holes (13) are arranged to penetrate the upper surface of the test base (3), and the air jet holes (13) are inclined toward the axis of the end of the SMA optical fiber (11) connected to the spectrometer (31) and penetrating the test base (3).

9. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 8, characterized in that: The air hood dust blocking assembly also includes a cavity tube (5) arranged on the test arm (4), and the lower end of the cavity tube (5) is flush with the lower surface of the test arm (4), the upper end of the piston rod (9) is seamlessly slidably connected in the cavity tube (5), and the lower end axis of the piston rod (9) is connected to the upper surface of the test base (3), the middle part of the piston rod (9) seamlessly slides through the lower end of the cavity tube (5), and the positions on both sides of the upper end of the piston rod (9) in the cavity tube (5) are connected with a one-way exhaust pipe (10), and the two one-way exhaust pipes (10) are connected to each other. The two chambers are connected by an air collecting pipe (14), and the air collecting pipe (14) is connected to the annular groove (12) through the air guide pipe (8). One-way air inlet holes (6) are provided at positions on both sides of the upper end of the piston rod (9) in the chamber tube (5). The test arm (4) is provided with a hole that passes through the outside thereof, and the hole is connected to the one-way air inlet hole (6) at the lower position on the chamber tube (5) through an air supply pipe. A groove is provided at the lower end of the chamber tube (5), and the diameter of the groove is greater than the maximum length of the axial connection structure between the lower end of the piston rod (9) and the test base (3).

10. The xenon lamp type ultra-microphotometer with an adjustable assembly structure according to claim 9, characterized in that: An alignment bar (20) is provided on the upper surface of the test base (3), and an alignment groove (19) is provided on the lower surface of the test arm (4), wherein the alignment groove (19) and the alignment bar (20) are provided correspondingly.

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