Temperature correction method and device and storage medium

Abstract

The invention discloses a temperature correction method and device and a storage medium, and the method is applied to an infrared temperature measurement device, and the method comprises the steps: obtaining the temperature state data of the infrared temperature measurement device, and enabling the temperature state data to be obtained through the temperature difference values corresponding to a plurality of regional environments of the infrared temperature measurement device, the temperature difference value corresponding to the regional environment is the difference value between the real-time temperature of the regional environment and the zeroing temperature of the regional environment at the zeroing moment; based on the temperature state data and a correction reference factor, the reference temperature of the infrared temperature measurement equipment is corrected, and the correction reference factor comprises the current environment temperature sensitivity of the infrared temperature measurement equipment; the environment temperature sensitivity represents the change condition of temperature related data detected by the infrared temperature measurement equipment along with the temperature of the reference area environment of the infrared temperature measurement equipment; and calculating to obtain a temperature measurement value of the infrared temperature measurement equipment by using the corrected reference temperature. In this way, the temperature measurement precision of the equipment can be improved.

Description

Technical Field

[0001] The present application relates to the field of infrared temperature measurement technology, and in particular to a temperature correction method, device and storage medium. Background Art

[0002] With the rapid development of infrared imaging technology, infrared temperature measurement equipment is increasingly being used in industrial inspection, public health, and other fields. In some areas, infrared temperature measurement equipment is prone to low temperature measurement accuracy due to the complex environments it operates in, particularly in the field of drones. In recent years, the integration of infrared temperature measurement equipment with drone platforms has become a hot topic in the industry, demonstrating its efficient and flexible monitoring advantages in scenarios such as power inspections and forest fire prevention. However, the complex operating environments of drones pose significant challenges to temperature measurement accuracy.

[0003] Due to factors such as the complex and changing operating environments of drones, limited flight time, and internal temperature fluctuations during startup, the temperature measurement accuracy of infrared temperature measurement devices currently integrated with drones is low. Therefore, improving the temperature measurement accuracy of infrared temperature measurement equipment has become an urgent issue. Summary of the Invention

[0004] In order to solve the above technical problems, the technical solution adopted in this application is: to provide a temperature correction method, device and storage medium to at least solve the problem of low temperature measurement accuracy of infrared temperature measurement equipment.

[0005] According to one embodiment of the present invention, a temperature correction method is provided, which is applied to an infrared temperature measurement device, comprising:

[0006] Obtaining temperature status data of the infrared temperature measuring device, wherein the temperature status data is obtained by using temperature differences corresponding to a plurality of regional environments of the infrared temperature measuring device, wherein the temperature differences corresponding to the regional environments are the differences between the real-time temperature of the regional environments and the zeroing temperature of the regional environments at the zeroing time;

[0007] Based on the temperature state data and the correction reference factor, the reference temperature of the infrared temperature measuring device is corrected, wherein the correction reference factor includes the current ambient temperature sensitivity of the infrared temperature measuring device, and the ambient temperature sensitivity represents the change of the temperature-related data detected by the infrared temperature measuring device with the temperature of the reference area environment of the infrared temperature measuring device;

[0008] The corrected reference temperature is used to calculate the temperature measurement value of the infrared temperature measuring device.

[0009] To solve the above technical problems, a technical solution adopted in this application is: to provide an electronic device, including a memory and a processor, wherein the memory is used to store a computer program, and when the computer program is executed by the processor, it is used to implement the temperature correction method in the above technical solution.

[0010] To solve the above technical problems, a technical solution adopted in this application is: providing a computer-readable storage medium, which is used to store a computer program. When the computer program is executed by a processor, it is used to implement the temperature correction method in the above technical solution.

[0011] Through the above scheme, the temperature correction method provided by the present application obtains the temperature status data of the infrared temperature measuring device by calculating the difference between the real-time temperature corresponding to several regional environments of the infrared temperature measuring device and the zeroing temperature at the zeroing time, and corrects the reference temperature of the infrared temperature measuring device based on the temperature status data and the correction reference factor. The temperature measurement value of the infrared temperature measuring device is obtained by calculating the corrected reference temperature, wherein the correction reference factor includes the current ambient temperature sensitivity of the infrared temperature measuring device, and the ambient temperature sensitivity characterizes the change of the temperature-related data detected by the infrared temperature measuring device with the temperature of the reference area environment of the infrared temperature measuring device; in this way, in the temperature measurement process of the infrared temperature measuring device, the change of the detected temperature-related data with the ambient temperature of the reference area is taken into account, and the reference temperature of the infrared temperature measuring device is corrected by correcting the reference factor to improve the temperature measurement accuracy of the infrared temperature measuring device. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without inventive efforts. Among them:

[0013] Figure 1 This is a flow chart of an embodiment of a temperature correction method provided by the present application;

[0014] Figure 2 is a flow chart of another embodiment of the temperature correction method provided by the present application;

[0015] Figure 3 This is a structural diagram of an embodiment of an electronic device provided by the present application;

[0016] Figure 4 It is a structural diagram of an embodiment of a computer-readable storage medium provided by this application. DETAILED DESCRIPTION

[0017] The present application will be further described in detail below in conjunction with the accompanying drawings and examples. It is particularly noted that the following examples are only intended to illustrate the present application and are not intended to limit the scope of the present application. Similarly, the following examples are only some examples of the present application and not all examples. All other examples obtained by those of ordinary skill in the art without creative work are intended to fall within the scope of protection of this application.

[0018] References to "embodiments" in this application mean that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0019] It should be noted that the terms "first", "second", etc. in this application are only used for descriptive purposes and cannot be understood as indicating or suggesting relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first", "second", etc. may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units that are not listed, or optionally also includes other steps or units inherent to these processes, methods, products or devices.

[0020] The present application provides a temperature correction method, which confirms the position of the tracking target by using the Hadamard product to fuse the response maps output by multiple different semantic levels, which can effectively suppress the interference of similar targets in the background and achieve more stable tracking.

[0021] See also Figure 1 , Figure 1 It is a flow chart of an embodiment of the temperature correction method provided by this application. It should be noted that if there are substantially the same results, this embodiment does not Figure 1 The process sequence shown is limited. Figure 1 As shown, this embodiment includes:

[0022] S110: Acquire temperature status data of the infrared temperature measuring device.

[0023] The temperature status data is used to characterize the temperature status of several regional environments of the infrared temperature measuring device. It can be the temperature difference corresponding to several regional environments, or it can be a real-time temperature status indicator calculated from the temperature difference corresponding to several regional environments.

[0024] In one embodiment, the temperature status data is obtained by using the temperature differences corresponding to several regional environments of the infrared temperature measuring device. The temperature differences corresponding to the regional environments are the difference between the real-time temperature of the regional environment and the zero-setting temperature of the regional environment at the zero-setting time. The zero-setting time is a specific point in time during the operation of the infrared temperature measuring device when zero point calibration is performed to eliminate initial deviations or environmental interference. The real-time temperature of each regional environment detected at the zero-setting time is the zero-setting temperature.

[0025] In one embodiment, the plurality of regional environments may include a first regional environment, a second regional environment, and a third regional environment, each representing a different region of the infrared thermometer device. The temperature differences corresponding to the first regional environment, the second regional environment, and the third regional environment are a first temperature difference, a second temperature difference, and a third temperature difference, respectively. The first regional environment may be the external area of the infrared thermometer device. The temperature of the first regional environment is used to represent the external environmental temperature of the infrared thermometer device. This temperature is detected by a temperature sensor on a surface of a firmware component within a lens of the infrared thermometer device. The third regional environment may be the detector of the infrared thermometer device. The temperature of the third regional environment is used to represent the ambient temperature of the detector within the infrared thermometer device. This temperature is detected by a temperature sensor within the detector of the infrared thermometer device. The second regional environment is located between the first and third regional environments, such as the internal cavity of the infrared thermometer device, i.e., the cavity between the device lens and the detector of the infrared thermometer device. The temperature of the second regional environment represents the ambient temperature of the internal cavity of the infrared thermometer device. This temperature is detected by a temperature sensor within the internal cavity of the infrared thermometer device.

[0026] In one embodiment, the temperature status data is a real-time temperature status indicator calculated using the temperature differences corresponding to the respective regional environments. In one implementation, the sum of the fourth product value, the fifth product value, and the sixth product value is used as the real-time temperature status indicator. Specifically, the difference between the first temperature difference value and the third temperature difference value is calculated to obtain a fourth temperature difference value, the product between the fourth temperature difference value and the sixth model parameter is calculated to obtain a fourth product value; the product between the second temperature difference value and the seventh model parameter is calculated to obtain a fifth product value; the product between the second temperature difference value, the fourth temperature difference value, and the eighth model parameter is calculated to obtain a sixth product value; and finally, the sum of the fourth product value, the fifth product value, and the sixth product value is calculated to obtain the real-time temperature status indicator, i.e., the temperature status data of the infrared temperature measuring device.

[0027] S120: Correcting the reference temperature of the infrared temperature measuring device based on the temperature status data and the correction reference factor.

[0028] Correction reference factors are various relevant factors used as a basis for correcting measurement data. Since the performance of infrared temperature measurement equipment is extremely susceptible to ambient temperature fluctuations, for example, when the ambient temperature rises, the thermal noise of the electronic components inside the detector increases, and its response characteristics to the infrared radiation of the target object change, resulting in deviations in the actual temperature corresponding to the detected grayscale value. For example, during the flight of a drone, if the ambient temperature in the reference area rises from 20°C to 30°C, the grayscale value originally corresponding to a certain temperature may drift due to changes in the detector sensitivity, causing errors in the target temperature calculated based on that grayscale value.

[0029] In this embodiment, the correction reference factor includes the current ambient temperature sensitivity of the infrared thermometer device, taking into account the deviation of the actual temperature corresponding to the detected grayscale value caused by changes in ambient temperature. Ambient temperature changes include, but are not limited to, situations where the device's external ambient temperature is stable while the internal ambient temperature varies, where the instrument's external ambient temperature varies while the internal ambient temperature is stable, and where the instrument's external ambient temperature varies while the internal ambient temperature varies. The ambient temperature sensitivity characterizes how the temperature-related data detected by the infrared thermometer device changes with the temperature of the infrared thermometer's reference area. For example, the ambient temperature sensitivity is the change in temperature-related data corresponding to a unit change in the reference ambient temperature, where the reference ambient temperature is the real-time temperature of the reference area. Exemplarily, the temperature-related data can be a grayscale value. The reference area includes the infrared thermometer's internal cavity, which is the cavity between the infrared thermometer's lens and detector. In this case, the ambient temperature sensitivity represents the grayscale value corresponding to a 1°C change in the infrared thermometer's internal cavity. It is a key indicator of the infrared thermometer's ability to adapt to different external environments.

[0030] In one embodiment, the correction reference factor also includes the number of zeroing cycles of the infrared temperature measurement device. This number of zeroing cycles reflects the frequency of adjustments to the measurement baseline during device operation. By using the temperature at the time of zeroing as the standard for compensation and replacing the power-on time with the number of zeroing cycles, the device can be guaranteed to meet temperature measurement accuracy requirements immediately during both cold startup and hot restart, eliminating any temperature measurement delays. Based on the temperature status data and the correction reference factor, a reference temperature correction value for the infrared temperature measurement device is calculated, and the reference temperature is corrected using this reference temperature correction value.

[0031] The reference temperature is a key indicator used by the infrared temperature measurement algorithm to calculate the target temperature. Whether it's internal environmental changes caused by heating and aging of electronic components within the device, or external environmental changes such as fluctuations in ambient temperature, humidity, and air pressure, these changes significantly impact the reference temperature, in turn having a knock-on effect on the device's temperature measurement accuracy. For example, when a device operates for extended periods, internal components continue to heat up, causing the internal temperature field to rise. This directly affects the detector's operating state, altering its response to infrared radiation and causing the reference temperature to shift. A sudden drop in ambient temperature can alter the sensitivity of the infrared detector, similarly interfering with the accuracy of the reference temperature. This deviation in the reference temperature can significantly reduce the device's temperature measurement accuracy and potentially lead to misjudgment of the target temperature.

[0032] The reference temperature correction value is a corrector for accurate infrared temperature measurement. It is specifically used to correct the current reference temperature. In actual applications, this correction value is calculated by combining real-time data collected from various temperature-related data, such as ambient temperature, temperature of key internal components of the device, and detector operating parameters, with a pre-established mathematical model.

[0033] This embodiment considers the impact of environmental factors (represented by ambient temperature sensitivity) and changes in the device's own state (represented by the number of zero adjustments) on the measurement results, ultimately resulting in a more accurate reference temperature correction value. This correction is used to improve the temperature measurement accuracy of the infrared temperature measurement device. When the number of zero adjustments is less than a preset value, the first correction model can be used for calculation; when the number of zero adjustments is greater than or equal to the preset value, the second correction model can be used for calculation; preferably, the preset value can be 10 times.

[0034] In one embodiment, in response to the number of zero adjustments being less than a preset value, the temperature state data and the correction reference factor are substituted into a first correction model to calculate a reference temperature correction value. For example, the sum of the first product value, the second product value, and the first model parameter is calculated as the first operation value, and the product of the first operation value, the real-time temperature state index, and the ambient temperature sensitivity is calculated to obtain the reference temperature correction value output by the first correction model. The first product value is the product of the real-time temperature state index and the second model parameter, and the second product value is the product of the absolute value of the real-time temperature state index and the third model parameter. The first, second, and third model parameters are all preset model parameters and can be set according to actual needs.

[0035] In another embodiment, in response to the number of zero adjustments exceeding a preset value, the temperature status data and the correction reference factor are substituted into a second correction model to calculate a reference temperature correction value. For example, the sum of the third product value and the fourth model parameter is calculated as the second calculated value. The product of the second calculated value, the real-time temperature status indicator, and the ambient temperature sensitivity is calculated to obtain the reference temperature correction value output by the second correction model. The third product value is the product of the absolute value of the real-time temperature status indicator and the fifth model parameter. The fourth model parameter is a preset model parameter that can be set according to actual needs.

[0036] When the infrared temperature measuring device performs temperature detection, the current reference temperature correction value is calculated based on the current zeroing times and reference temperature of the infrared temperature measuring device using the corresponding correction model, and the corrected reference temperature is obtained by using the sum of the reference temperature before correction and the reference temperature correction value.

[0037] S130: Calculate the temperature measurement value of the infrared temperature measuring device using the corrected reference temperature.

[0038] After calculating the corrected reference temperature in step S120, the infrared temperature measuring device determines the temperature value currently converted by the infrared temperature measuring device based on the relationship model between temperature and radiation intensity, and further calculates the sum of the currently converted temperature value and the corrected reference temperature to obtain a corrected reference temperature that is closer to the actual situation, thereby effectively improving the temperature measurement accuracy of the infrared temperature measuring device in complex environments, ensuring that the temperature data it outputs is reliable, and meeting the stringent requirements for high-precision temperature measurement in various fields.

[0039] See also Figure 2 , Figure 2 It is a flow chart of another embodiment of the temperature correction method provided by this application. It should be noted that if there is substantially the same result, this embodiment is not used. Figure 2 The process sequence shown is limited. Figure 2 As shown, this embodiment includes:

[0040] S201: Acquire the temperature value of the temperature sensor of the infrared temperature measuring device series.

[0041] Temperature sensors in infrared thermometers are pre-installed in the device, including but not limited to external ambient temperature sensors, intermediate cavity temperature sensors, and internal detector temperature sensors. The external ambient temperature sensor, located on the surface of the lens's internal fixture, measures the ambient temperature of the infrared thermometer during use. The intermediate cavity temperature sensor, located in the cavity between the device's lens and detector, measures the cavity temperature. The internal detector temperature sensor, located at the edge of the detector's infrared focal plane, measures the detector's temperature.

[0042] The temperature values obtained for infrared temperature measurement equipment include the real-time temperature value and the temperature value at the time of zeroing. The real-time temperature value of the device series temperature sensor is the temperature sensed by each temperature sensor in real time. For example, if the temperature of an infrared temperature measurement device is calculated every 0.5 seconds, the real-time temperature value is the value read by the temperature sensor every 0.5 seconds, including the real-time external environment temperature Tch1, the real-time cavity temperature Tch2, and the real-time detector temperature Tch3.

[0043] In this embodiment, the zeroing moment is the moment the shutter closes. The zeroing temperature value of the device series temperature sensor is the temperature value read by the temperature sensor at the moment the shutter closes, including the external ambient temperature Tch1_zero, the cavity temperature Tch2_zero, and the detector temperature Tch3_zero. The shutter is a required firmware component of the infrared temperature measurement device, located between the device cavity and the detector. The closing of the shutter primarily serves to regularly calibrate the temperature measurement accuracy of the infrared temperature measurement device.

[0044] S202: Based on the temperature values of the series of temperature sensors, calculate the temperature difference between the real-time temperature value of the series of temperature sensors and the temperature value at the zeroing time.

[0045] After obtaining the real-time temperature values and temperature values at the time of zeroing of the series of temperature sensors, calculate the temperature difference corresponding to each temperature sensor, including the difference between the real-time external ambient temperature value and the external ambient temperature value at the time of zeroing (ΔTch1 = Tch1 – Tch1_zero), the difference between the real-time cavity temperature value and the cavity temperature value at the time of zeroing (ΔTch2 = Tch2 – Tch2_zero), and the difference between the real-time detector temperature value and the detector temperature value at the time of zeroing (ΔTch3 = Tch3 – Tch3_zero).

[0046] S203: Build a device temperature status perception model based on the temperature difference and output a real-time temperature status indicator.

[0047] By combining the temperature values read by the external ambient temperature sensor, the intermediate cavity temperature sensor, and the internal detector temperature sensor, that is, the temperature difference corresponding to each temperature sensor, a temperature state perception model capable of characterizing the environment in which the entire device is located is established, thereby outputting a real-time temperature state indicator ΔTch. For example, the abstract model of the real-time temperature state indicator is the following formula (1), and the specific model is the following formula (2).

[0048] ΔTch=f(ΔTch1, ΔTch2, ΔTch3) (1)

[0049] ΔTch=k1×(ΔTch3-ΔTch1)+k2×ΔTch2+k3×(ΔTch3-ΔTch1)×ΔTch2(2)

[0050] Among them, ΔTch1 is the difference between the real-time external ambient temperature value and the external ambient temperature value at the time of zeroing; ΔTch2 is the difference between the real-time cavity temperature value and the cavity temperature value at the time of zeroing; ΔTch3 is the difference between the real-time detector temperature value and the detector temperature value at the time of zeroing; k1, k2, and k3 are preset model parameters; ΔTch is the real-time temperature status indicator.

[0051] S204: Establishing a reference temperature correction value model based on the temperature state index, and outputting a reference temperature correction value.

[0052] Combined with the real-time temperature status index obtained in step S203, the current zeroing times of the infrared temperature measuring device, and the ambient temperature sensitivity, a model for calculating the reference temperature correction value Tcorr is established. The abstract model of the reference temperature correction value model is as shown in the following formula (3), and the specific model is as shown in the following formula (4).

[0053] Tcorr=f(ΔTch,n,dG / dTch2) (3)

[0054]

[0055] Where Tcorr is the correction value of the current reference temperature, ΔTch is the real-time temperature status indicator, n is the number of zero adjustments, dG / dTch2 is the ambient temperature sensitivity, which indicates the grayscale value corresponding to each 1°C change in the real-time temperature of the infrared temperature measurement device cavity, k4-k8 are preset model parameters, and Nc is the preset value of the number of zero adjustments, which is a preset parameter of the model.

[0056] S205: Based on the reference temperature correction value, a corrected reference temperature is calculated and used to correct the final measured temperature of the device.

[0057] According to the reference temperature correction value Tcorr output by the reference temperature correction value model and the original reference temperature Tbase, the corrected reference temperature Tbase_corr = Tbase + Tcorr is calculated, and then the final measurement value of the infrared temperature measuring device is corrected to obtain the device corrected temperature measurement value Tfinal = f(Tbase_corr, ...).

[0058] The temperature correction method provided in this embodiment comprehensively analyzes the temperature sensing change rules and is applicable to various types of equipment, various types of detectors, and various types of lenses. It does not require factory data collection and can ensure high temperature measurement accuracy when the device changes in different external environmental temperatures.

[0059] See also Figure 3 , Figure 3 This is a structural diagram of an embodiment of an electronic device provided in the present application. The electronic device 60 includes a memory 61 and a processor 62 connected to each other. The memory 61 is used to store a computer program. When the computer program is executed by the processor 62, it is used to implement the temperature correction method in the above embodiment.

[0060] The method of the above embodiment may exist in the form of a computer program, so the present application proposes a computer readable storage medium, see Figure 4 , Figure 4 8 is a structural diagram of an embodiment of a computer-readable storage medium provided in the present application. The computer-readable storage medium 80 is used to store a computer program 81, which can be executed to implement the temperature correction method in the above embodiment.

[0061] The computer-readable storage medium 80 can be a server, a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc., which can store program codes.

[0062] The above description is merely an embodiment of the present application and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A temperature correction method, characterized in that: The temperature correction method is applied to an infrared temperature measuring device, and the method comprises: Obtaining temperature status data of the infrared temperature measuring device, wherein the temperature status data is obtained by using temperature differences corresponding to a plurality of regional environments of the infrared temperature measuring device, wherein the temperature differences corresponding to the regional environments are the differences between the real-time temperature of the regional environments and the zeroing temperature of the regional environments at the zeroing time; Based on the temperature state data and the correction reference factor, the reference temperature of the infrared temperature measuring device is corrected, wherein the correction reference factor includes the current ambient temperature sensitivity of the infrared temperature measuring device, and the ambient temperature sensitivity represents the change of the temperature-related data detected by the infrared temperature measuring device with the temperature of the reference area environment of the infrared temperature measuring device; The corrected reference temperature is used to calculate the temperature measurement value of the infrared temperature measuring device.

2. The method according to claim 1, characterized in that The reference area environment includes the internal cavity of the infrared temperature measuring device, and the internal cavity is the cavity between the device lens and the detector of the infrared temperature measuring device; And / or, the temperature-related data is a grayscale value; And / or, the ambient temperature sensitivity is the amount of change in temperature-related data corresponding to each unit change in the reference ambient temperature, and the reference ambient temperature is the real-time temperature of the reference area environment; And / or, the correction reference factor also includes the number of zeroing times of the infrared temperature measuring device.

3. The method according to claim 1, characterized in that The step of correcting the reference temperature of the infrared temperature measuring device based on the temperature state data and the correction reference factor includes: Based on the temperature state data and the correction reference factor, a reference temperature correction value of the infrared temperature measuring device is calculated; The reference temperature is corrected using the reference temperature correction value.

4. The method according to claim 3, characterized in that The correction reference factor also includes the number of zeroing times of the infrared temperature measuring device; The step of calculating a reference temperature correction value of the infrared temperature measuring device based on the temperature state data and the correction reference factor includes: In response to the number of zero adjustments being less than a preset value, substituting the temperature state data and the correction reference factor into a first correction model to calculate the reference temperature correction value; In response to the number of zero adjustments exceeding the preset value, substituting the temperature state data and the correction reference factor into a second correction model to calculate the reference temperature correction value; And / or, using the reference temperature correction value to correct the reference temperature includes: The sum of the reference temperature before correction and the reference temperature correction value is used as the reference temperature after correction.

5. The method according to claim 4, characterized in that The temperature status data is a real-time temperature status indicator calculated using the temperature differences corresponding to the several regional environments; Substituting the temperature state data and the correction reference factor into a first correction model to calculate the reference temperature correction value includes: Calculating a sum of a first product value, a second product value, and a first model parameter as a first operation value, wherein the first product value is the product of the real-time temperature state index and the second model parameter, and the second product value is the product of the absolute value of the real-time temperature state index and the third model parameter; taking the product of the first operation value, the real-time temperature status index and the ambient temperature sensitivity as the reference temperature correction value; And / or, substituting the temperature state data and the correction reference factor into a second correction model to calculate the reference temperature correction value includes: Calculating a sum of a third product value and a fourth model parameter as a second operation value, wherein the third product value is the product of the absolute value of the real-time temperature state indicator and the fifth model parameter; The product of the second operation value, the real-time temperature status index and the ambient temperature sensitivity is used as the reference temperature correction value.

6. The method according to claim 1, characterized in that The temperature state data is the temperature difference values corresponding to the several regional environments respectively; Alternatively, the temperature status data is a real-time temperature status indicator calculated using the temperature differences corresponding to the several regional environments.

7. The method according to claim 1, characterized in that The several regional environments include a first regional environment, a second regional environment and a third regional environment, wherein the temperature of the first regional environment represents the external environmental temperature of the infrared temperature measuring device, the temperature of the third regional environment represents the detector environmental temperature inside the infrared temperature measuring device, and the second regional environment is located between the first regional environment and the third regional environment.

8. The method according to claim 7, characterized in that The temperature of the first area environment is detected by a temperature sensor on a surface of a firmware inside a lens of the infrared temperature measuring device, the temperature of the second area environment is detected by a temperature sensor in an internal cavity of the infrared temperature measuring device, and the temperature of the third area environment is detected by a temperature sensor of a detector of the infrared temperature measuring device; And / or, the temperature differences corresponding to the first regional environment, the second regional environment, and the third regional environment are respectively the first temperature difference, the second temperature difference, and the third temperature difference, and the temperature state data is a real-time temperature state indicator calculated using the temperature differences corresponding to the plurality of regional environments; The step of obtaining the real-time temperature status indicator includes: The sum of the fourth product value, the fifth product value and the sixth product value is used as the real-time temperature status indicator, wherein the difference between the first temperature difference and the third temperature difference is the fourth temperature difference, the fourth product value is the product between the fourth temperature difference and the sixth model parameter, the fifth product value is the product between the second temperature difference and the seventh model parameter, and the sixth product value is the product between the second temperature difference, the fourth temperature difference and the eighth model parameter.

9. An electronic device, characterized in that: The electronic device includes a processor and a memory, wherein the processor is coupled to the memory, and the processor is configured to execute one or more steps of the temperature correction method according to any one of claims 1 to 8 based on instructions stored in the memory.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps of the temperature correction method according to any one of claims 1 to 8.

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